TWI632695B - Lighting elements - Google Patents
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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Abstract
本發明實施例包含發光元件,此發光元件包含多邊形晶粒,此多邊形晶粒包含複數個發光二極體,每個發光二極體包含複數個磊晶層,這些磊晶層含有p型層、n型層以及多重量子井設置於p型層與n型層之間,每個發光二極體包含p型電極和n型電極分別電性耦接至p型層和n型層,多邊形晶粒也包含底座,每個發光二極體耦接至此底座,p型電極和n型電極位於底座與磊晶層之間,底座含有複數個導電部件將這些發光二極體的至少一部份發光二極體以串聯方式電性耦接。 The embodiment of the present invention includes a light emitting element, which includes a polygonal crystal grain, the polygonal crystal grain includes a plurality of light emitting diodes, each light emitting diode includes a plurality of epitaxial layers, and the epitaxial layers include a p-type layer, The n-type layer and multiple quantum wells are disposed between the p-type layer and the n-type layer. Each light emitting diode includes a p-type electrode and an n-type electrode, which are electrically coupled to the p-type layer and the n-type layer, respectively. A base is also included, and each light emitting diode is coupled to the base. The p-type electrode and the n-type electrode are located between the base and the epitaxial layer. The base contains a plurality of conductive components to lighten at least a part of the light-emitting diodes. The pole bodies are electrically coupled in series.
Description
本發明實施例係有關於發光元件,特別有關於包含高壓發光二極體的發光元件,其具有改善的散熱效率、更有效率的光萃取率及更佳的電性連接。 The embodiment of the present invention relates to a light-emitting element, and more particularly to a light-emitting element including a high-voltage light-emitting diode, which has improved heat dissipation efficiency, more efficient light extraction rate, and better electrical connection.
發光二極體(light-emitting diodes;LEDs)為當電壓施加時可以發出光的半導體光電元件,由於發光二極體具有一些有利的特性,例如元件尺寸小、壽命長、能量消耗有效率,以及優異的耐久性和可靠度,使得發光二極體越來越普及。近年來,發光二極體已經在各種應用中發展,包含指示器、光感應器、交通號誌燈、寬頻數據傳輸、液晶顯示器的背光源單元,以及其他合適的照明裝置,例如,發光二極體通常用在照明裝置中,以取代傳統的白熱燈泡,例如用在典型燈具中的發光二極體。 Light-emitting diodes (LEDs) are semiconductor optoelectronic components that emit light when a voltage is applied. Because light-emitting diodes have some advantageous characteristics, such as small component size, long life, efficient energy consumption, and Excellent durability and reliability make LEDs more and more popular. In recent years, light-emitting diodes have been developed in various applications, including indicators, light sensors, traffic lights, broadband data transmission, backlight units for liquid crystal displays, and other suitable lighting devices, such as light-emitting diodes. They are often used in lighting devices to replace traditional incandescent light bulbs, such as light emitting diodes used in typical lamps.
然而,現行的發光二極體仍有一些缺點,例如,傳統的高壓發光二極體雖然可處理高電壓(如數百伏特),但是這些傳統的高壓發光二極體仍可能會遭遇一些問題,例如散熱效率較差以及電性失效較頻繁。相較於傳統的高壓發光二極體,傳統的覆晶發光二極體(flip chip LEDs)可能具有較佳的散熱效率,但是傳統的覆晶發光二極體仍無法處理高電壓,而且其光萃取率較差。此外,針對上述討論的一些問題,其他類型 的發光二極體所需要的切割製程可能也比較困難。 However, the current light-emitting diodes still have some disadvantages. For example, although traditional high-voltage light-emitting diodes can handle high voltages (such as hundreds of volts), these traditional high-voltage light-emitting diodes may still encounter some problems. For example, poor heat dissipation efficiency and frequent electrical failures. Compared with traditional high-voltage light-emitting diodes, traditional flip-chip LEDs may have better heat dissipation efficiency, but traditional flip-chip light-emitting diodes still cannot handle high voltages, and their light The extraction rate is poor. In addition, to some of the issues discussed above, other types The cutting process required for the light emitting diode may also be difficult.
因此,雖然現行的發光二極體已經普遍地能滿足其預期的目的之需求,但是現行的發光二極體仍無法完全地滿足每一個方面的需求,而具有較佳散熱效率、更有效率的光萃取率(light extraction),以及更堅固耐用的電性連接之高壓發光二極體仍在持續地尋找中。 Therefore, although the current light-emitting diodes have generally been able to meet the needs of their intended purposes, the current light-emitting diodes cannot fully meet the needs of every aspect, and have better heat dissipation efficiency and more efficient High-voltage light-emitting diodes with light extraction and more rugged electrical connections are still being sought.
本發明實施例在一觀點中涉及發光元件,此發光元件包含基板,第一發光二極體形成於基板上並具有第一平台結構,第一發光二極體包括兩個電極位於相對於基板的一上表面。此發光元件還包含第二發光二極體,其具有第二平台結構,並與第一發光二極體相鄰地形成於基板上,其中第一平台結構與第二平台結構具有相同的俯視形狀以及相異的擺放方向,或是第一平台結構與第二平台結構具有相異的俯視形狀,且第一平台結構與第二平台結構共同地形成第一俯視幾何圖形,第一俯視幾何圖形與第一平台結構、第二平台結構、或第一平台結構和第二平台結構這二者的俯視形狀相異。 An embodiment of the present invention relates to a light emitting element in one aspect. The light emitting element includes a substrate. A first light emitting diode is formed on the substrate and has a first platform structure. The first light emitting diode includes two electrodes located opposite to the substrate. One on the surface. This light-emitting element further includes a second light-emitting diode, which has a second platform structure and is formed on the substrate adjacent to the first light-emitting diode, wherein the first platform structure and the second platform structure have the same plan view shape. And different placement directions, or the first platform structure and the second platform structure have different top-view shapes, and the first platform structure and the second platform structure jointly form a first top-view geometry and a first top-view geometry It is different from the first platform structure, the second platform structure, or both of the first platform structure and the second platform structure in a plan view shape.
在一些實施例中,第一平台結構與第二平台結構的俯視形狀為非矩形。 In some embodiments, the planar shapes of the first platform structure and the second platform structure are non-rectangular.
在一些實施例中,第一平台結構與第二平台結構具有相異的非矩形俯視形狀。 In some embodiments, the first platform structure and the second platform structure have different non-rectangular top shapes.
在一些實施例中,基板具有一外輪廓與第一俯視幾何圖形相似。 In some embodiments, the substrate has an outer contour similar to the first top-view geometry.
在一些實施例中,第一平台結構具有第一側邊, 第二平台結構具有第二側邊,第一側邊與第二側邊平行。 In some embodiments, the first platform structure has a first side, The second platform structure has a second side edge, and the first side edge is parallel to the second side edge.
在一些實施例中,第一平台結構具有第一側邊,第二平台結構具有第二側邊,第一側邊與第二側邊具有相似的長度。 In some embodiments, the first platform structure has a first side edge, the second platform structure has a second side edge, and the first side edge and the second side edge have a similar length.
在一些實施例中,上述基板為成長基板。 In some embodiments, the substrate is a growth substrate.
在一些實施例中,上述基板為減薄基板。 In some embodiments, the substrate is a thinned substrate.
在一些實施例中,上述發光元件更包含第三發光二極體形成於基板上,其中,第一發光二極體與第二發光二極體間的距離小於第一發光二極體與第三發光二極體間的距離。 In some embodiments, the light-emitting element further includes a third light-emitting diode formed on the substrate, wherein a distance between the first light-emitting diode and the second light-emitting diode is smaller than that between the first light-emitting diode and the third Distance between light-emitting diodes.
在一些實施例中,上述發光元件更包含第三發光二極體,第三發光二極體具有第三平台結構,第三平台結構與第一平台結構以及第二平台結構共同地形成第二俯視幾何圖形,第二俯視幾何圖形與第一平台結構、第二平台結構、第三平台結構、或者第一、第二和第三平台結構這三者的俯視形狀相異。 In some embodiments, the light-emitting element further includes a third light-emitting diode, and the third light-emitting diode has a third platform structure, and the third platform structure and the first platform structure and the second platform structure jointly form a second plan view. The geometric shapes, the second top-view geometric shapes are different from the top-view shapes of the first platform structure, the second platform structure, the third platform structure, or the first, second, and third platform structures.
本發明實施例在一觀點中涉及照明裝置,此照明裝置包含:多邊形晶粒,其包含複數個發光二極體,且其中每一個發光二極體包含:複數個磊晶層,這些磊晶層含有p型層、n型層和多重量子井設置在p型層與n型層之間;以及p型電極和n型電極分別電性耦接至p型層和n型層。此照明裝置也包含底座,每一個發光二極體耦接至此底座,其中p型電極和n型電極位於底座與磊晶層之間,且其中底座含有複數個導電部件,這些導電部件將這些發光二極體的至少一部份發光二極體以串聯方式電性耦接,且其中這些發光二極體的至少一些發光二極 體具有非矩形的俯視形狀。 An embodiment of the present invention relates to a lighting device in one aspect. The lighting device includes a polygonal crystal grain including a plurality of light-emitting diodes, and each of the light-emitting diodes includes a plurality of epitaxial layers. A p-type layer, an n-type layer, and a multiple quantum well are disposed between the p-type layer and the n-type layer; and the p-type electrode and the n-type electrode are electrically coupled to the p-type layer and the n-type layer, respectively. The lighting device also includes a base, each light-emitting diode is coupled to the base, wherein the p-type electrode and the n-type electrode are located between the base and the epitaxial layer, and the base contains a plurality of conductive parts, and these conductive parts emit light At least a part of the light emitting diodes of the diodes are electrically coupled in series, and at least some of the light emitting diodes of the light emitting diodes are coupled in series. The body has a non-rectangular plan shape.
在一些實施例中,這些發光二極體的至少一些發光二極體具有與這些發光二極體的其餘發光二極體不同的俯視形狀。 In some embodiments, at least some of the light-emitting diodes have a different top-view shape from the remaining light-emitting diodes of the light-emitting diodes.
在一些實施例中,這些發光二極體的至少一些發光二極體具有非矩形的多邊形俯視形狀。 In some embodiments, at least some of the light emitting diodes have a non-rectangular polygonal top view shape.
在一些實施例中,這些發光二極體的至少一些發光二極體在俯視圖中具有一些彎曲的邊。 In some embodiments, at least some of the light-emitting diodes have curved edges in a top view.
在一些實施例中,將第一子集合的相鄰發光二極體分開的第一距離大於將第二子集合的相鄰發光二極體分開的第二距離。 In some embodiments, the first distance separating adjacent light emitting diodes of the first subset is greater than the second distance separating adjacent light emitting diodes of the second subset.
在一些實施例中,此照明裝置包含複數個多邊形晶粒。 In some embodiments, the lighting device includes a plurality of polygonal grains.
在一些實施例中,底座包含下列其中之一:以金屬為基礎的材料、絕緣體上的矽材料、矽底座、陶瓷底座,或金屬核心的印刷電路板底座。在一些實施例中,上述導電部件的至少一些導電部件包含:形成在矽底座之上的內連線層的金屬線,或形成在金屬核心的印刷電路板底座之上的金屬導線。 In some embodiments, the base includes one of the following: a metal-based material, a silicon material on an insulator, a silicon base, a ceramic base, or a metal core printed circuit board base. In some embodiments, at least some of the above-mentioned conductive components include: a metal wire of an interconnect layer formed on a silicon substrate, or a metal wire formed on a printed circuit board substrate of a metal core.
在一些實施例中,這些發光二極體包含數量為X的發光二極體,其中數量X的選擇係使得當此數量X的發光二極體以串聯方式電性耦接在一起時,會具有大於約170伏特的最大操作電壓。 In some embodiments, the light-emitting diodes include a number of light-emitting diodes of X, and the number of X-rays is selected such that when the number of X-light-emitting diodes is electrically coupled together in series, Greater than about 170 volts maximum operating voltage.
本發明實施例在一觀點中涉及照明裝置,此照明裝置包含:晶粒,其包含複數個發光二極體,且其中每一個發 光二極體包含:複數個磊晶層,這些磊晶層含有p摻雜的III-V族化合物層、n摻雜的III-V族化合物層和多重量子井設置在p摻雜的III-V族化合物層與n摻雜的III-V族化合物層之間;以及第一電極和第二電極分別電性耦接至p摻雜的III-V族化合物層和n摻雜的III-V族化合物層。此照明裝置也包含底座,其接合至晶粒,其中第一電極和第二電極位於底座與磊晶層之間,且下列敘述中至少一個為真:這些發光二極體的一些發光二極體在俯視圖中具有與其他發光二極體不同的圖案;這些發光二極體的一些發光二極體在俯視圖中具有非矩形的多邊形圖案;以及這些發光二極體的一些發光二極體在俯視圖中具有一個或一個以上彎曲的邊。 An embodiment of the present invention relates to a lighting device in one aspect. The lighting device includes: a crystal grain, which includes a plurality of light emitting diodes, and each of them emits light. The photodiode includes: a plurality of epitaxial layers, these epitaxial layers contain a p-doped III-V compound layer, an n-doped III-V compound layer, and a multiple quantum well disposed in the p-doped III-V Between the group compound layer and the n-doped group III-V compound layer; and the first electrode and the second electrode are electrically coupled to the p-doped group III-V compound layer and the n-doped group III-V, respectively. Compound layer. This lighting device also includes a base, which is bonded to the die, wherein the first electrode and the second electrode are located between the base and the epitaxial layer, and at least one of the following is true: some of these light-emitting diodes In the top view, there are different patterns from other light-emitting diodes; some of these light-emitting diodes have a non-rectangular polygonal pattern in the top view; and some of the light-emitting diodes in the top view Has one or more curved edges.
在一些實施例中,底座含有複數個導電部件,這些導電部件將這些發光二極體的至少一子集合以串聯方式電性耦接在一起。 In some embodiments, the base contains a plurality of conductive components, and these conductive components electrically couple together at least a subset of the light emitting diodes in series.
在一些實施例中,此照明裝置包含複數個多邊形晶粒,上述晶粒為這些多邊形晶粒中的一個。 In some embodiments, the lighting device includes a plurality of polygonal crystal grains, and the crystal grain is one of the polygonal crystal grains.
在一些實施例中,底座包含下列其中之一:以金屬為基礎的材料、絕緣體上的矽材料、矽底座、陶瓷底座,或金屬核心的印刷電路板底座。在一些實施例中,這些導電部件的至少一些導電部件包含:形成在矽底座之上的內連線層的金屬線,或形成在金屬核心的印刷電路板底座之上的金屬導線。 In some embodiments, the base includes one of the following: a metal-based material, a silicon material on an insulator, a silicon base, a ceramic base, or a metal core printed circuit board base. In some embodiments, at least some of the conductive components include metal wires formed in an interconnect layer on a silicon substrate, or metal wires formed on a printed circuit board substrate with a metal core.
本發明實施例在另一觀點中涉及高壓發光二極體裝置的製造方法,此方法包含:在一個或一個以上的磊晶製程中,於生長基底之上成長複數個磊晶層,其中這些磊晶層包含 p摻雜的III-V族化合物層、n摻雜的III-V族化合物層,以及多重量子井設置在p摻雜的III-V族化合物層與n摻雜的III-V族化合物層之間;依據一微影圖案,藉由蝕刻方式移除生長基底之上的這些磊晶層的一部份,以形成複數條分隔道在分開的發光二極體之間,上述圖案包含非矩形的發光二極體;在每一個發光二極體之上形成p型電極和n型電極,其中p型電極電性耦接至p摻雜的III-V族化合物層,且n型電極電性耦接至n摻雜的III-V族化合物層;將這些發光二極體接合至底座,使得p型電極和n型電極在接合步驟之後位於底座與磊晶層之間;以及之後將生長基底薄化或移除。 In another aspect, the embodiment of the present invention relates to a method for manufacturing a high-voltage light-emitting diode device. The method includes: growing a plurality of epitaxial layers on a growth substrate in one or more epitaxial processes, wherein Crystal layer contains A p-doped III-V compound layer, an n-doped III-V compound layer, and a multiple quantum well are disposed between the p-doped III-V compound layer and the n-doped III-V compound layer. According to a lithographic pattern, a part of these epitaxial layers on the growth substrate is removed by etching to form a plurality of divided channels between the separated light emitting diodes. The above pattern includes non-rectangular A light-emitting diode; a p-type electrode and an n-type electrode are formed on each of the light-emitting diodes, wherein the p-type electrode is electrically coupled to the p-doped III-V compound layer, and the n-type electrode is electrically coupled Connected to the n-doped III-V compound layer; bonding these light emitting diodes to the base so that the p-type electrode and the n-type electrode are located between the base and the epitaxial layer after the bonding step; and then the growth substrate is thin Change or remove.
在一些實施例中,將磊晶層轉變成複數個分開的發光二極體之進行使得下列敘述中至少一個為真:這些發光二極體的至少一些發光二極體在俯視圖中具有與這些發光二極體的其餘發光二極體不同的圖案;這些發光二極體的至少一些發光二極體在俯視圖中具有非矩形的多邊形圖案;以及這些發光二極體的至少一些發光二極體在俯視圖中具有一個或一個以上彎曲的邊。 In some embodiments, the conversion of the epitaxial layer into a plurality of separate light emitting diodes is performed such that at least one of the following is true: at least some of the light emitting diodes have a Different patterns of the remaining light-emitting diodes of the diode; at least some of the light-emitting diodes have a non-rectangular polygonal pattern in a plan view; and at least some of the light-emitting diodes of the light-emitting diodes in a top view Has one or more curved edges in it.
在一些實施例中,生長基底包含藍寶石材料,而底座則包含下列其中之一:以金屬為基礎的材料、絕緣體上的矽材料、矽底座、陶瓷底座,或金屬核心的印刷電路板底座,底座含有複數個導電部件,並且接合步驟的進行使得這些發光二極體的至少一子集合藉由這些導電部件而以串聯方式電性耦接。 In some embodiments, the growth substrate comprises a sapphire material, and the base comprises one of the following: a metal-based material, a silicon material on an insulator, a silicon base, a ceramic base, or a metal core printed circuit board base, the base A plurality of conductive members are included, and the bonding step is performed such that at least a subset of the light emitting diodes are electrically coupled in series through the conductive members.
在一些實施例中,這些分開的發光二極體為多邊 形晶粒的一部份。 In some embodiments, these separate light emitting diodes are polygonal Part of the shaped grain.
在一些實施例中,接合步驟包括晶圓級接合製程。 In some embodiments, the bonding step includes a wafer-level bonding process.
在一些實施例中,接合步驟包括晶粒級接合製程。 In some embodiments, the bonding step includes a die-level bonding process.
20‧‧‧高壓發光二極體晶粒 20‧‧‧High-voltage light-emitting diode grains
25‧‧‧發光二極體 25‧‧‧light-emitting diode
30‧‧‧藍寶石基底 30‧‧‧ sapphire substrate
35‧‧‧電性導體 35‧‧‧electrical conductor
40‧‧‧晶圓 40‧‧‧ wafer
45‧‧‧晶粒 45‧‧‧ Grain
50‧‧‧生長基底 50‧‧‧ growth substrate
60‧‧‧磊晶層 60‧‧‧Epitaxial layer
60A、60B、60C‧‧‧發光二極體(平台結構) 60A, 60B, 60C‧‧‧Light-emitting diodes (platform structure)
70A、70B、70C‧‧‧鏡面層 70A, 70B, 70C‧‧‧Mirror layer
75A、75B、75C‧‧‧p型電極 75A, 75B, 75C‧‧‧p-type electrode
80A、80B、80C‧‧‧n型電極 80A, 80B, 80C‧‧‧n electrode
85A、85B、85C‧‧‧鈍態層 85A, 85B, 85C‧‧‧ passivation layer
90A、90B、90C‧‧‧p型接合金屬 90A, 90B, 90C‧‧‧p-type bonding metal
95A、95B、95C‧‧‧n型接合金屬 95A, 95B, 95C‧‧‧n type bonding metal
100‧‧‧底座 100‧‧‧ base
105‧‧‧底座基板 105‧‧‧ base substrate
110‧‧‧焊接部件 110‧‧‧welded parts
115‧‧‧底座金屬 115‧‧‧ base metal
120‧‧‧電路 120‧‧‧circuit
125‧‧‧絕緣材料 125‧‧‧Insulation material
150‧‧‧散熱路徑 150‧‧‧cooling path
155‧‧‧光傳播路徑 155‧‧‧Light propagation path
160‧‧‧導電路徑 160‧‧‧ conductive path
300‧‧‧照明設備 300‧‧‧Lighting equipment
320‧‧‧照明設備底座 320‧‧‧Lighting equipment base
350‧‧‧擴散罩 350‧‧‧ diffuser
360‧‧‧發光二極體與擴散罩之間的空間 360‧‧‧ Space between light-emitting diode and diffuser
370‧‧‧反射結構 370‧‧‧Reflective structure
380‧‧‧散熱結構 380‧‧‧Heat dissipation structure
390‧‧‧散熱器鰭片 390‧‧‧ Radiator Fin
400‧‧‧照明模組 400‧‧‧lighting module
410‧‧‧照明模組的基座 410‧‧‧Base of lighting module
420‧‧‧照明模組的主體 420‧‧‧ The main body of the lighting module
430‧‧‧照明模組的燈 430‧‧‧lighting lamp
440‧‧‧照明模組的光束 440‧‧‧ Beam of lighting module
500‧‧‧製造高壓發光二極體裝置的方法 500‧‧‧ Method for manufacturing high-voltage light-emitting diode device
510、520、530、540、550‧‧‧方法的各步驟 Steps of the 510, 520, 530, 540, 550‧‧‧ method
為了讓本發明實施例之目的、特徵、及優點能更明顯易懂,配合所附圖式作詳細說明如下,在此要強調的是,圖式中的各種特徵可以不需要按照半導體工業中的標準常規繪製,事實上,各種特徵的尺寸可以任意地擴大或縮減,以使得以下討論可以更清楚地顯示:第1圖為高壓發光二極體的概略俯視圖;第2圖為依據本發明實施例的各種觀點,含有複數個晶粒的晶圓之俯視圖;第3-7圖為依據本發明實施例的各種觀點,含有複數個發光二極體的晶粒之概略局部剖面側視圖;第8圖為依據本發明實施例的各種觀點,含有複數個發光二極體的示範晶粒之概略俯視圖;第9圖為包含複數個晶粒的晶圓之示範形狀的概略俯視圖,包含複數個發光二極體的這些晶粒中的一個晶粒之示範形狀的概略俯視圖,以及這些發光二極體中的一個發光二極體之示範形狀的概略俯視圖;第10圖為依據本發明實施例的各種觀點,包含第3-7圖的晶粒之發光模組的概略剖面側視圖;第11圖為依據本發明實施例的各種觀點,包含第10圖的 發光二極體發光模組之照明裝置的概略圖;以及第12圖為依據本發明實施例的各種觀點,製造高壓發光二極體發光裝置的方法之流程圖。 In order to make the objects, features, and advantages of the embodiments of the present invention more comprehensible, the following detailed description is given in conjunction with the accompanying drawings. It is emphasized here that the various features in the drawings may not need to be in accordance with the semiconductor industry. Standard conventional drawing. In fact, the dimensions of various features can be arbitrarily expanded or reduced, so that the following discussion can be more clearly shown: Figure 1 is a schematic top view of a high-voltage light-emitting diode; Figure 2 is an embodiment according to the present invention Top view of a wafer containing a plurality of dies from various viewpoints; FIGS. 3-7 are schematic partial cross-sectional side views of a die containing a plurality of light emitting diodes according to various viewpoints of embodiments of the present invention; FIG. 8 In accordance with various viewpoints of the embodiments of the present invention, a schematic top view of an exemplary die including a plurality of light emitting diodes is shown. FIG. 9 is a schematic top view of an exemplary shape of a wafer including a plurality of die, including a plurality of light emitting diodes. A schematic top view of an exemplary shape of one of these crystal grains of the body, and a schematic top view of an exemplary shape of one of these light emitting diodes. Figure 10 is a schematic cross-sectional side view of a light emitting module including the crystal grains of Figures 3-7 according to various views of the embodiment of the present invention; Figure 11 is a view of various views according to the embodiment of the present invention, including Figure 10 of A schematic diagram of a lighting device of a light-emitting diode light-emitting module; and FIG. 12 is a flowchart of a method for manufacturing a high-voltage light-emitting diode light-emitting device according to various viewpoints of embodiments of the present invention.
後續的內容提供許多不同的實施例或例子,藉此實行各種實施例的不同部件,以下描述的部件和排列方式的特定例子係用於簡化本發明實施例的說明,這些特定例子僅作為示範用,並非用於限定本發明實施例。例如,在以下描述中提及形成第一部件在第二部件上或上方可包含形成第一部件和第二部件直接接觸的實施例,並且也可包含形成額外的部件在第一部件與第二部件之間的實施例,使得第一部件和第二部件可以不直接接觸。此外,”頂部”、”底部”、”下方”、”上方”,以及其他類似的用語係為了方便說明,並非用於將實施例的範圍限定在任何特殊方向。此外,各種部件也可用不同的尺寸規格任意繪製,以達到簡化與清楚之目的。另外,本發明實施例在各種例子中可重複使用參考標號以及/或符號,此重複使用係為了達到簡化與清楚之作用,並非用於指定各種實施例以及/或所討論的狀態之間的關係。 The following content provides many different embodiments or examples to implement different components of various embodiments. The specific examples of the components and arrangements described below are used to simplify the description of the embodiment of the present invention. These specific examples are only for demonstration purposes. Is not intended to limit the embodiments of the present invention. For example, it is mentioned in the following description that forming a first component on or above a second component may include forming an embodiment where the first component and the second component are in direct contact, and may also include forming an additional component between the first component and the second component. The embodiment between the components makes the first component and the second component not in direct contact. In addition, "top", "bottom", "below", "above", and other similar terms are used for convenience of description, and are not intended to limit the scope of the embodiment to any particular direction. In addition, various components can also be arbitrarily drawn with different size specifications to achieve the purpose of simplicity and clarity. In addition, the embodiments of the present invention may repeatedly use reference numerals and / or symbols in various examples. This reuse is for simplicity and clarity, and is not intended to specify the relationship between the various embodiments and / or the states in question. .
半導體元件可用於製造各種光電元件,例如發光二極體(LEDs),當開啟元件時,發光二極體可發出光,例如在可見光之光譜內不同顏色的光,以及具有紫外線或紅外線波長的光。相較於傳統的光源(例如白熱的燈泡),使用發光二極體作為光源的照明設備能提供一些優點,例如較小的尺寸、較低的能量耗損、較長的使用壽命、各種可用的顏色,以及較優異 的耐久性和可靠度,這些優點如同在發光二極體之製造技術上的進展一樣,使得發光二極體更便宜且更堅固耐用,因此在近年來增加了以發光二極體為基礎的照明設備之成長普及率。 Semiconductor elements can be used to make various optoelectronic elements, such as light emitting diodes (LEDs). When the element is turned on, the light emitting diodes can emit light, such as light of different colors in the visible light spectrum, and light with ultraviolet or infrared wavelengths. . Compared with traditional light sources (such as incandescent light bulbs), lighting devices using light emitting diodes as the light source can provide some advantages, such as smaller size, lower energy consumption, longer service life, and various available colors , And better These advantages are the same as the progress in the manufacturing technology of light-emitting diodes, which makes them cheaper and more durable. Therefore, in recent years, light-emitting diode-based lighting has been added. Growth and penetration of equipment.
然而,現行的發光二極體仍有一些缺點,例如,參閱第1圖,其顯示高壓發光二極體(high voltage LED;HVLED)晶粒20的俯視圖,高壓發光二極體晶粒20包含複數個發光二極體25設置在藍寶石基底30上。高壓發光二極體晶粒20係配置成可處理高電壓,例如超過12伏特的電壓,藉由將這些發光二極體25以串聯方式電性耦接在一起(例如藉由電性導體35),實現了高壓發光二極體晶粒20,此方式可讓高電壓分散,並且讓每一個發光二極體承受分散的電壓。然而,高壓發光二極體晶粒20的散熱效率較差,熱的傳導路徑係從發光二極體25往下傳送至藍寶石基底30下方,藍寶石基底的熱傳導性能不佳,並且通常非常厚,例如為100至200微米(μm),由於熱傳導性能不佳,而且熱傳導的路徑相對地較長,高壓發光二極體晶粒可能很容易有過熱現象發生。此外,藉由電性導體35的方式進行電性耦接並不是非常的堅固耐用,這些電性導體35可能很容易斷開,並且單一的電性導體斷開可能會使得整個晶粒20有缺陷產生,因為全部的發光二極體25都串聯耦接在一起。 However, the current light-emitting diodes still have some disadvantages. For example, referring to FIG. 1, which shows a top view of a high-voltage light-emitting diode (HVLED) die 20. The high-voltage light-emitting diode die 20 includes a plurality of Each light emitting diode 25 is disposed on a sapphire substrate 30. The high-voltage light-emitting diode grains 20 are configured to handle high voltages, such as voltages exceeding 12 volts, and these light-emitting diodes 25 are electrically coupled together in series (for example, through the electrical conductor 35). The high-voltage light-emitting diode grains 20 are realized. This method can disperse the high voltage and allow each light-emitting diode to withstand the dispersed voltage. However, the heat dissipation efficiency of the high-voltage light-emitting diode die 20 is poor, and the heat conduction path is transmitted from the light-emitting diode 25 down to the sapphire substrate 30. The sapphire substrate has poor thermal conductivity and is usually very thick, such as From 100 to 200 micrometers (μm), due to poor thermal conduction performance and relatively long thermal conduction paths, high-voltage light-emitting diode grains can easily be overheated. In addition, the electrical coupling by means of electrical conductors 35 is not very durable. These electrical conductors 35 may be easily disconnected, and the disconnection of a single electrical conductor may make the entire grain 20 defective. It occurs because all the light emitting diodes 25 are coupled in series.
相較於上述討論的高壓發光二極體20,覆晶發光二極體(flip chip LED)可具有較佳的散熱特性,然而,覆晶發光二極體仍可能會有其他缺點,其中一個缺點為覆晶發光二極體因為電流聚集(current crowding)問題而容易導致光萃取率 不佳,覆晶發光二極體的另一缺點為電性連接的執行有困難。 Compared to the high voltage light emitting diode 20 discussed above, flip chip LEDs can have better heat dissipation characteristics. However, flip chip light emitting diodes may still have other disadvantages, one of which is Due to the current crowding problem, flip-chip light-emitting diodes easily lead to light extraction rate. Poor, another disadvantage of flip chip light emitting diodes is the difficulty in performing electrical connection.
依據本發明的實施例,揭示了改善的高壓發光二極體照明裝置,其提供良好的散熱效率、改善的光萃取率,同時具有堅固耐用且容易實行的電性耦接架構。依據一些實施例,用於製造高壓發光二極體的製程將參閱第1-9圖討論如下,在本發明實施例中這些圖式已經被簡化。 According to the embodiments of the present invention, an improved high-voltage light-emitting diode lighting device is disclosed, which provides good heat dissipation efficiency, improved light extraction rate, and has a durable and easy-to-implement electrical coupling structure. According to some embodiments, the process for manufacturing a high-voltage light-emitting diode will be discussed below with reference to FIGS. 1-9, which have been simplified in the embodiments of the present invention.
參閱第2圖,其顯示晶圓40的俯視圖(或平面圖),在一些實施例中,晶圓40包含適合用於磊晶成長III-V族化合物材料在其上的藍寶石材料,III-V族化合物含有來自週期表第III族的元素,以及來自週期表第V族的另一個元素,例如,第III族的元素可包含硼、鋁、鎵、銦和鈦,並且第V族的元素可包含氮、磷、砷、銻和鉍。 Referring to FIG. 2, which shows a top view (or plan view) of wafer 40. In some embodiments, wafer 40 includes a sapphire material suitable for epitaxial growth of Group III-V compound materials thereon, Group III-V The compound contains an element from group III of the periodic table and another element from group V of the periodic table, for example, an element of group III may include boron, aluminum, gallium, indium, and titanium, and an element of group V may include Nitrogen, phosphorus, arsenic, antimony and bismuth.
晶圓40包含複數個晶粒(die)45(或稱晶粒區,因為在第2圖所示之製造階段,III-V族化合物磊晶層並未成長在晶圓40上),繪出晶粒45的目的是為了提供例子,晶粒45的實際形狀和尺寸可以變化,例如,雖然晶粒45的形狀顯示為矩形(在俯視圖中),在各種實施例中,晶粒45實際上可具有其他多邊形的形狀,例如三角形或六邊形。依據本發明實施例的各種觀點,複數個發光二極體將形成在每一個晶粒45上,為了簡化,第3-7圖僅顯示出單一晶粒45在各種製造階段中的簡化剖面側視圖,可以理解的是,其他晶粒45也可經歷相同的製造製程。 The wafer 40 includes a plurality of dies 45 (or grain regions, because the III-V compound epitaxial layer has not grown on the wafer 40 during the manufacturing stage shown in FIG. 2). The purpose of the die 45 is to provide an example. The actual shape and size of the die 45 may vary. For example, although the shape of the die 45 is shown as a rectangle (in a top view), in various embodiments, the die 45 may actually be Shapes with other polygons, such as triangles or hexagons. According to various viewpoints of the embodiments of the present invention, a plurality of light-emitting diodes will be formed on each die 45. For simplicity, FIGS. 3-7 only show simplified cross-sectional side views of a single die 45 in various manufacturing stages. It can be understood that other dies 45 may also undergo the same manufacturing process.
參閱第3圖,晶粒45包含生長基底(growth substrate)50,如上述討論,生長基底50可包含藍寶石材料, 其適用於磊晶成長III-V族化合物在其上,例如氮化鎵,基底50的厚度範圍可從約50μm至約1000μm。在一些實施例中,低溫緩衝膜可形成在基底50之上,然而,為了簡化,在此未繪出低溫緩衝膜。 Referring to FIG. 3, the die 45 includes a growth substrate 50. As discussed above, the growth substrate 50 may include a sapphire material. It is suitable for epitaxial growth of Group III-V compounds, such as gallium nitride, and the thickness of the substrate 50 may range from about 50 μm to about 1000 μm. In some embodiments, a low-temperature buffer film may be formed on the substrate 50, however, for simplicity, the low-temperature buffer film is not shown here.
在一個或多個磊晶製程中,複數個磊晶層60成長在生長基底50之上,磊晶層60的各種層將討輪如下。 In one or more epitaxial processes, a plurality of epitaxial layers 60 are grown on the growth substrate 50. Various layers of the epitaxial layer 60 will be discussed as follows.
磊晶層60可包含形成在基底50之上的未摻雜的半導體層,未摻雜的半導體層不具有p型摻雜物或n型摻雜物,在一些實施例中,未摻雜的半導體層包含化合物,其含有來自週期表第III族的元素,以及來自週期表第V族的另一個元素,例如未摻雜的氮化鎵(GaN)材料。未摻雜的半導體層可作為基底50與後續將形成在未摻雜的半導體層之上的其他層之間的緩衝層(例如可降低應力),為了有效地執行其作為緩衝層的功能,未摻雜的半導體層具有較少的錯位缺陷(dislocation defects)以及良好的晶格結構品質,在一些實施例中,未摻雜的半導體層之厚度範圍從約1μm至約5μm。 The epitaxial layer 60 may include an undoped semiconductor layer formed on the substrate 50. The undoped semiconductor layer does not have a p-type dopant or an n-type dopant. In some embodiments, the undoped The semiconductor layer contains a compound containing an element from Group III of the periodic table and another element from Group V of the periodic table, such as an undoped gallium nitride (GaN) material. The undoped semiconductor layer can serve as a buffer layer (for example, to reduce stress) between the substrate 50 and other layers that will be subsequently formed on the undoped semiconductor layer. In order to effectively perform its function as a buffer layer, The doped semiconductor layer has fewer dislocation defects and good lattice structure quality. In some embodiments, the thickness of the undoped semiconductor layer ranges from about 1 μm to about 5 μm.
磊晶層60包含形成於未摻雜的半導體層之上的III-V族化合物層,此III-V族化合物層可以用n型摻雜物,例如碳(C)或矽(Si)進行摻雜,在此實施例中,III-V族化合物層包含氮化鎵(GaN),因此可稱為n-GaN層。在一些實施例中,n-GaN層的厚度範圍從約2μm至約6μm。 The epitaxial layer 60 includes a group III-V compound layer formed on an undoped semiconductor layer. The group III-V compound layer may be doped with an n-type dopant such as carbon (C) or silicon (Si). In this embodiment, the III-V compound layer includes gallium nitride (GaN), and thus may be referred to as an n-GaN layer. In some embodiments, the thickness of the n-GaN layer ranges from about 2 μm to about 6 μm.
磊晶層60可包含形成於n-GaN層上的預應變層(pre-strained layer),預應變層可以用n型摻雜物例如矽進行摻雜。在各種實施例中,預應變層可含有複數對(例如20-40對) 交錯的InxGa1-xN次層(sub-layers)和GaN次層,其中x大於或等於0,但小於或等於1。預應變層可用於釋放張力和降低量子侷限史塔克效應(quantum-confined Stark effect;QCSE),量子侷限史塔克效應係描述外加電場施加在量子井層的光吸收光譜上的效應,量子井層係形成在預應變層之上。在一些實施例中,預應變層的總厚度範圍可從約30奈米(nm)到約80nm。 The epitaxial layer 60 may include a pre-strained layer formed on the n-GaN layer. The pre-strained layer may be doped with an n-type dopant such as silicon. In various embodiments, the pre-strained layer may contain a plurality of pairs (eg, 20-40 pairs) of interleaved In x Ga 1-x N sub-layers and GaN sub-layers, where x is greater than or equal to 0, but less than Or equal to 1. The pre-strained layer can be used to release tension and reduce the quantum-confined Stark effect (QCSE). The quantum-confined Stark effect describes the effect of an applied electric field on the light absorption spectrum of a quantum well layer. The layer system is formed on the pre-strained layer. In some embodiments, the total thickness of the pre-strained layer can range from about 30 nanometers (nm) to about 80 nm.
磊晶層60包含形成於預應變層之上的多重量子井(multiple-quantum well;MQW)層,多重量子井層包含複數個交替(或交錯)的主動次層(active sub-layers)和阻障次層(barrier sub-layers),例如,主動次層可包含氮化銦鎵(indium gallium nitride;InxGa1-xN),且阻障次層可包含氮化鎵(gallium nitride;GaN)。在一些實施例中,每一個阻障次層的厚度範圍可從約2nm到約5nm,且每一個主動次層的厚度範圍可從約4nm到約17nm。 The epitaxial layer 60 includes multiple-quantum well (MQW) layers formed on a pre-strained layer. The multiple-quantum well layer includes a plurality of alternating (or staggered) active sub-layers and barriers. Barrier sub-layers. For example, the active sub-layer may include indium gallium nitride (In x Ga 1-x N), and the barrier sub-layer may include gallium nitride (GaN). ). In some embodiments, the thickness of each barrier sublayer can range from about 2 nm to about 5 nm, and the thickness of each active sub layer can range from about 4 nm to about 17 nm.
磊晶層60可選擇性地包含電子阻擋層(electron blocking layer)形成於多重量子井層之上,電子阻擋層有助於限制電子-電洞載體在多重量子井層80內再結合(recombination),藉此可改善多重量子井層的量子效率,並且可降低在不希望的頻寬內的輻射。在一些實施例中,電子阻擋層可包含摻雜的InxAlyGa1-x-yN材料,其中x和y都大於或等於0,但小於或等於1,並且摻雜物可包含p型摻雜物例如鎂,電子阻擋層的厚度範圍可從約7nm到約25nm。 The epitaxial layer 60 may optionally include an electron blocking layer formed on the multiple quantum well layer. The electron blocking layer helps to limit the recombination of the electron-hole carrier in the multiple quantum well layer 80. This can improve the quantum efficiency of the multiple quantum well layers and reduce radiation in undesired bandwidths. In some embodiments, the electron blocking layer may comprise undoped In x Al y Ga 1-xy N , wherein x and y are greater than or equal to 0, but less than or equal to 1, and a p-type dopant may be doped For impurities such as magnesium, the thickness of the electron blocking layer can range from about 7 nm to about 25 nm.
磊晶層60包含III-V族化合物層形成於電子阻擋層之上,此III-V族化合物層可以用p型摻雜物進行摻雜,在 本實施例中,III-V族化合物層包含氮化鎵(GaN),因此可稱為p-GaN層。在一些實施例中,p-GaN層的厚度範圍從約150nm到約200nm。 The epitaxial layer 60 includes a III-V compound layer formed on the electron blocking layer. The III-V compound layer can be doped with a p-type dopant. In this embodiment, the III-V compound layer includes gallium nitride (GaN), and thus may be referred to as a p-GaN layer. In some embodiments, the thickness of the p-GaN layer ranges from about 150 nm to about 200 nm.
這些磊晶層60構成發光二極體的核心部分,當電壓(或電荷)施加在發光二極體的摻雜層(例如p-GaN層和n-GaN層)時,多重量子井層會發射出輻射,例如光,多重量子井層發射出的光顏色對應至輻射的波長,此輻射可以是可見的,例如藍光,或者是不可見的,例如紫外光,光線的波長(以及因此而產生的光顏色)可藉由改變製造多重量子井層的材料之組成和結構而調整。 These epitaxial layers 60 constitute the core part of a light emitting diode. When a voltage (or charge) is applied to a doped layer of the light emitting diode (such as a p-GaN layer and an n-GaN layer), the multiple quantum well layer emits light. Out of the radiation, such as light, the color of the light emitted by the multiple quantum well layer corresponds to the wavelength of the radiation, this radiation can be visible, such as blue light, or invisible, such as ultraviolet light, the wavelength of the light (and the resulting Light color) can be adjusted by changing the composition and structure of the materials from which the multiple quantum well layers are made.
參閱第4圖,藉由微影製程,例如藉由一個或多個蝕刻製程,將磊晶層60圖案化成複數個平台(mesa)結構60A-60C,這些平台結構60A-60C也可稱為發光二極體(LEDs)或發光二極體晶片(LED chips)60A-60C,微影製程的進行使得p-GaN層和n-GaN層都可以用在每一個發光二極體60。此外,雖然在第4圖的剖面圖中未繪出,發光二極體60A-60C的俯視形狀可藉由調整微影製程而具有可變性,例如藉由在微影製程中改變光罩上的圖案。 Referring to FIG. 4, the epitaxial layer 60 is patterned into a plurality of mesa structures 60A-60C by a lithography process, for example, by one or more etching processes. These mesa structures 60A-60C may also be referred to as light-emitting Diodes (LEDs) or light-emitting diode chips (LED chips) 60A-60C, the lithography process is performed so that p-GaN layer and n-GaN layer can be used in each light-emitting diode 60. In addition, although not shown in the cross-sectional view of FIG. 4, the top shape of the light-emitting diodes 60A-60C can be changed by adjusting the lithography process, for example, by changing the photomask on the photomask during the lithography process. pattern.
參閱第5圖,在發光二極體60A-60C上形成額外的元件,使發光二極體60A-60C準備好在以下討論的接合製程中與底座(submount)接合,這些額外的元件包含(但不限於)鏡面層(mirror layers)70A-70C(之後統稱70)、p型電極75A-75C(之後統稱75)、n型電極80A-80C(之後統稱80)、鈍態層(passivation layer)85A-85C(之後統稱85)、p型接合金屬 90A-90C(之後統稱90)以及n型接合金屬95A-95C(之後統稱95)。 Referring to FIG. 5, additional elements are formed on the light-emitting diodes 60A-60C, and the light-emitting diodes 60A-60C are ready to be bonded to the submount in the bonding process discussed below. These additional elements include (but Not limited to: mirror layers 70A-70C (hereinafter collectively referred to as 70), p-type electrodes 75A-75C (hereinafter collectively referred to as 75), n-type electrodes 80A-80C (hereinafter collectively referred to as 80), passivation layer 85A -85C (hereinafter collectively referred to as 85), p-type bonding metal 90A-90C (hereinafter collectively referred to as 90) and n-type bonding metal 95A-95C (hereinafter collectively referred to as 95).
鏡面層70含有反射輻射的材料例如金屬,如鋁或銀,藉此將發光二極體60發射出的光反射回到發光二極體60。 The mirror layer 70 contains a material that reflects radiation, such as a metal, such as aluminum or silver, thereby reflecting the light emitted from the light emitting diode 60 back to the light emitting diode 60.
p型電極75和n型電極80含有導電材料(例如金屬),以分別提供與發光二極體60的p-GaN和n-GaN層的電性連接,雖然第5圖的剖面圖針對每一個發光二極體60僅顯示出單一的p型電極75和單一的n型電極80,可以理解的是,實際上可在每一個發光二極體60上形成超過一個以上的p型電極75或超過一個以上的n型電極80。 The p-type electrode 75 and the n-type electrode 80 contain a conductive material (such as a metal) to provide electrical connection with the p-GaN and n-GaN layers of the light emitting diode 60, respectively, although the cross-sectional view of FIG. 5 is for each The light-emitting diode 60 only shows a single p-type electrode 75 and a single n-type electrode 80. It can be understood that in practice, more than one p-type electrode 75 or more than one p-type electrode 75 can be formed on each light-emitting diode 60. One or more n-type electrodes 80.
鈍態層85係用於保護發光二極體60和p型與n型電極75和80暴露出來的表面,避免其受到污染物例如空氣中的粒子以及/或水氣影響。在一些實施例中,鈍態層85含有介電材料。 The passive layer 85 is used to protect the exposed surfaces of the light emitting diodes 60 and the p-type and n-type electrodes 75 and 80 from being affected by pollutants such as particles in the air and / or water vapor. In some embodiments, the passivation layer 85 contains a dielectric material.
p型接合金屬90和n型接合金屬95含有金屬材料,以幫助p型和n型電極75和80與底座之間的接合,如第6圖所示,其更詳細的討論如下所述。 The p-type bonding metal 90 and the n-type bonding metal 95 contain a metal material to assist the bonding between the p-type and n-type electrodes 75 and 80 and the base, as shown in FIG. 6, and a more detailed discussion thereof is as follows.
參閱第6圖,將晶粒45以上面朝下(upside down)的方式翻轉,在接合製程中接合至底座(submount)100。更詳細的說,在一方法中,晶粒45的發光二極體60A-60C經由焊接部件110接合至底座100,使得p型電極75和n型電極80在接合後設置於底座100與發光二極體60(例如磊晶層)之間。底座100包含底座基板105、焊接部件110、底座金屬115、電路120以及絕緣材料125。在一些實施例中,底座基板105可包 含以金屬為基礎的材料,例如銅或鋁;在其他實施例中,底座基板105也可包含絕緣體上的矽(Silicon-on-Insulator;SOI);在另外的實施例中,底座基板105也可以是矽基板、陶瓷基板或金屬核心的印刷電路板(metal core printed circuit board;MCPCB)基板。 Referring to FIG. 6, the die 45 is turned upside down, and is bonded to the submount 100 in a bonding process. In more detail, in one method, the light-emitting diodes 60A-60C of the crystal grain 45 are bonded to the base 100 via the welding member 110, so that the p-type electrode 75 and the n-type electrode 80 are disposed on the base 100 and the light-emitting diode after bonding. Between polar bodies 60 (e.g. epitaxial layers). The base 100 includes a base substrate 105, a soldering member 110, a base metal 115, a circuit 120, and an insulating material 125. In some embodiments, the base substrate 105 may include Contains metal-based materials, such as copper or aluminum; in other embodiments, the base substrate 105 may also include silicon-on-insulator (SOI); in other embodiments, the base substrate 105 also It can be a silicon substrate, a ceramic substrate, or a metal core printed circuit board (MCPCB) substrate.
絕緣材料125可形成在底座基板105之上,而電路120和底座金屬115則可形成在絕緣材料中,以提供針對發光二極體的電性路線,例如,電路120可以是在內連線結構的一個或多個內連線層中的金屬線,其中內連線結構形成於矽基板之上。在另一例子中,電路120可以是金屬導線(traces),例如銅導線,其形成於印刷電路板(PCB)基板之上。在任何例子中,在底座100與發光二極體60進行接合製程之前,電路120和底座金屬115都已經預先形成在底座100上,於接合製程之後,可以看到發光二極體的p-GaN和n-GaN層經由電極75/80、接合金屬90/95、焊接部件110以及底座金屬115而電性耦接至電路120。 The insulating material 125 may be formed on the base substrate 105, and the circuit 120 and the base metal 115 may be formed in the insulating material to provide an electrical route for the light emitting diode. For example, the circuit 120 may be an interconnect structure The metal lines in one or more interconnect layers, wherein the interconnect structure is formed on the silicon substrate. In another example, the circuit 120 may be metal traces, such as copper wires, formed on a printed circuit board (PCB) substrate. In any example, the circuit 120 and the base metal 115 have been formed on the base 100 before the bonding process of the base 100 and the light emitting diode 60. After the bonding process, the p-GaN of the light emitting diode can be seen The n-GaN layer is electrically coupled to the circuit 120 via the electrodes 75/80, the bonding metal 90/95, the soldering member 110, and the base metal 115.
在一些實施例中,例如在第6圖所示之實施例中,發光二極體以串聯方式電性耦接在一起,亦即一個發光二極體60的p-GaN層電性耦接至相鄰發光二極體60的n-GaN層,反之亦然。在此方式中,高的電壓例如大於約50到100伏特的電壓(例如170伏特)可施加至全體的發光二極體60上,因為發光二極體60的電性耦接以串聯方式進行,每一個發光二極體60僅需承受高電壓的一部份,例如約3到3.5伏特。因此,當較大量的發光二極體以串聯方式電性耦接在一起時,這些發光 二極體就可以共同承受較高的電壓,如此,晶粒45(包含複數個發光二極體60)本身就能夠作為高壓發光二極體(HVLED),例如電壓可高至170伏特,因此,可以說晶粒45具有大於約170伏特的最大操作電壓。 In some embodiments, such as the embodiment shown in FIG. 6, the light emitting diodes are electrically coupled together in series, that is, the p-GaN layer of one light emitting diode 60 is electrically coupled to The n-GaN layers of adjacent light emitting diodes 60 and vice versa. In this manner, a high voltage, for example, a voltage greater than about 50 to 100 volts (for example, 170 volts) can be applied to the entire light emitting diode 60 because the electrical coupling of the light emitting diode 60 is performed in series. Each light emitting diode 60 only needs to withstand a part of the high voltage, such as about 3 to 3.5 volts. Therefore, when a larger number of light emitting diodes are electrically coupled together in series, these light emitting diodes are Diodes can withstand higher voltages together. In this way, the die 45 (including a plurality of light-emitting diodes 60) can be used as a high-voltage light-emitting diode (HVLED). For example, the voltage can be as high as 170 volts. Therefore, It can be said that the die 45 has a maximum operating voltage greater than about 170 volts.
可以看到,在此所揭示的發光二極體60之間的電性連接之建立沒有使用接合打線(bond wires)和圍繞每一個發光二極體形成的導電連接層,在此所揭示的電性連接方式是有利的,因為使用接合打線和導電連接層將導致可靠度問題。在一些例子中,接合打線或導電連接層可能有容易斷裂(特別是在高電流的條件下)或脫落的問題發生,而且因為發光二極體是以串聯方式電性耦接在一起,當接合打線或導電連接層中的單一個發生失效時,將會使得整個高壓發光二極體(HVLED)有缺陷產生,相較而言,在此揭示的電性耦接是經由電路120和底座金屬115完成,在接合製程之前電路120和底座金屬115就已經預先形成在底座100中,因此電路120和底座金屬115在抵抗不利的條件以及高電壓/電流的情況下,具有較佳的可靠度,藉此對發光二極體60提供了較堅固耐用的電性路線架構(electrical routing scheme)。 It can be seen that the electrical connection between the light-emitting diodes 60 disclosed herein is established without the use of bond wires and a conductive connection layer formed around each light-emitting diode. The sexual connection method is advantageous because the use of bonding wires and conductive connection layers will cause reliability problems. In some examples, the bonding wire or the conductive connection layer may be easily broken (especially under the condition of high current) or the problem of falling off occurs, and because the light emitting diodes are electrically coupled together in series, when bonding When a single wire or conductive connection layer fails, the entire high voltage light emitting diode (HVLED) will be defective. In contrast, the electrical coupling disclosed here is via the circuit 120 and the base metal 115 Finished, the circuit 120 and the base metal 115 are already formed in the base 100 before the bonding process. Therefore, the circuit 120 and the base metal 115 have better reliability in the case of resisting adverse conditions and high voltage / current. The pair of light emitting diodes 60 provides a more robust and durable electrical routing scheme.
此外,晶粒45因為其設計而改善了光萃取率,更詳細的說,每一個發光二極體具有相對較小的平台結構,例如,相較於傳統的覆晶發光二極體,此平台結構具有明顯較小的橫向尺寸(寬度),當覆晶發光二極體因為其較大的橫向磊晶層尺寸而容易有電流聚集的問題時,在此揭示的發光二極體之平台結構的較小橫向尺寸大幅地降低了電流聚集現象,取而代 之的是,電流路徑將充分地利用全部的磊晶層區域,接著磊晶層(特別是多重量子井層)將產生更多的光,藉此增加晶粒45的光萃取率。依據本發明實施例的各種觀點,在某種程度上,發光二極體的平台結構可以進一步再被次分割(sub-divided),以進一步增加晶粒45的光萃取率。 In addition, the crystal grain 45 improves the light extraction rate because of its design. In more detail, each light-emitting diode has a relatively small platform structure. For example, compared to a conventional flip-chip light-emitting diode, this platform has a relatively small platform structure. The structure has a significantly smaller lateral size (width). When the flip-chip light-emitting diode is prone to current accumulation due to its large lateral epitaxial layer size, the platform structure of the light-emitting diode disclosed herein Smaller lateral dimensions significantly reduce current accumulation and replace What is more, the current path will make full use of the entire epitaxial layer region, and then the epitaxial layer (especially the multiple quantum well layer) will generate more light, thereby increasing the light extraction rate of the crystal grains 45. According to various viewpoints of the embodiments of the present invention, to some extent, the platform structure of the light emitting diode can be further sub-divided to further increase the light extraction rate of the crystal grains 45.
雖然未特別說明,可以理解的是,將晶粒45接合到底座100可以採用晶圓級或晶粒級的方式進行,在晶圓級的接合製程中,將整個晶圓(例如第2圖所示之晶圓40)接合至底座100,晶圓具有晶粒45和其他類似的晶粒形成於其上,在接合之後可進行晶圓切割及額外的封裝製程。在晶粒級的接合製程中,可將晶圓黏在膠帶上,然後可將晶圓切割,使得每個晶粒45與其相鄰的晶粒分開,每個晶粒各自與底座上其各自的部件接合(此步驟可以同時進行)。 Although not specifically described, it can be understood that the bonding of the die 45 to the base 100 may be performed at a wafer level or a die level. In the wafer-level bonding process, the entire wafer (for example, as shown in FIG. 2) is used. The wafer 40 shown is bonded to the base 100. The wafer has a die 45 and other similar dies formed thereon. After bonding, wafer dicing and additional packaging processes can be performed. In the die-level bonding process, the wafer can be adhered to the tape, and then the wafer can be cut so that each die 45 is separated from its neighboring die, and each die is separately from its own on the base. Part bonding (this step can be performed simultaneously).
參閱第7圖,可以從發光二極體60移除生長基底50,例如採用雷射脫離(laser lift-off)製程進行。在其他的一些實施例中,則可以將生長基底50減薄。為了讓本發明實施例的一些概念可以說明得更好,第7圖也顯示了晶粒45的散熱路徑150、光傳播路徑155以及導電路徑160。 Referring to FIG. 7, the growth substrate 50 can be removed from the light emitting diode 60, for example, by using a laser lift-off process. In other embodiments, the growth substrate 50 can be thinned. In order to better explain some concepts of the embodiments of the present invention, FIG. 7 also shows a heat dissipation path 150, a light propagation path 155, and a conductive path 160 of the die 45.
如散熱路徑150所示,發光二極體60產生的熱向下消散至底座100。由於發光二極體60與底座之間的距離相對地短,並且底座基板105相對地薄,雖然在此未繪出,但是在底座基板105下方可設置散熱器,因此發光二極體60產生的熱在抵達底座基板105之前需要不會傳播得太遠。此外,沿著散熱路徑150的各種材料具有良好的熱傳導性,藉此使得熱消 散更有效率。 As shown by the heat dissipation path 150, the heat generated by the light emitting diode 60 is dissipated downward to the base 100. Because the distance between the light-emitting diode 60 and the base is relatively short, and the base substrate 105 is relatively thin, although not shown here, a heat sink can be provided below the base substrate 105, so the light-emitting diode 60 generates The heat needs not to travel too far before reaching the base substrate 105. In addition, various materials along the heat dissipation path 150 have good thermal conductivity, thereby enabling heat dissipation Dispersion is more efficient.
如光傳播路徑155所示,發光二極體60產生的光會遠離底座100向上傳播,而且不管有多少量的光向下傳播,這些光都會被鏡面層70和電極80反射回來向上。因為光在其傾向的傳播路徑上遇到的障礙物非常少,可以有很好的光輸出,而且如上述討論,發光二極體60的小橫向尺寸降低了電流聚集效應,並且更進一步地改善了發光二極體60的光萃取率。 As shown in the light propagation path 155, the light generated by the light emitting diode 60 will travel upward away from the base 100, and no matter how much light travels downward, these lights will be reflected back upward by the mirror layer 70 and the electrode 80. Because light encounters very few obstacles on its propagating propagation path, it can have a good light output, and as discussed above, the small lateral size of the light emitting diode 60 reduces the current gathering effect and further improves The light extraction rate of the light emitting diode 60 is shown.
如導電路徑160所示,電流流過電路120、底座金屬115、焊接部件110、接合金屬90和95、電極75和80,以及磊晶層60(例如發光二極體),在此方式中,發光二極體以串聯方式電性耦接在一起,而且並沒有使用接合打線或導電層(用於傳統的高壓發光二極體中),藉此使得晶粒45的電性傳導更可靠且更堅固耐用。可以理解的是,在一些實施例中,並非全部的發光二極體都需要以串聯方式電性耦接,取而代之,在一些實施例中,只有在被選擇的子集合(subset)中的發光二極體才會以串聯方式電性耦接。 As shown by the conductive path 160, current flows through the circuit 120, the base metal 115, the soldering member 110, the bonding metals 90 and 95, the electrodes 75 and 80, and the epitaxial layer 60 (such as a light emitting diode). In this manner, The light-emitting diodes are electrically coupled together in series without using bonding wires or conductive layers (used in traditional high-voltage light-emitting diodes), thereby making the electrical conduction of the crystal grains 45 more reliable and more reliable. strong and sturdy. It can be understood that, in some embodiments, not all the light-emitting diodes need to be electrically coupled in series, and instead, in some embodiments, only the light-emitting diodes in the selected subset are used. The pole bodies are electrically coupled in series.
第8圖顯示依據本發明的一些實施例,晶粒45的簡化概略俯視圖,在第8圖所示之實施例中,晶粒45包含18個發光二極體(或發光二極體晶片)60,每個發光二極體60可以與上述討論的發光二極體60A-60C類似,而且可依據相同的製程製造。發光二極體60接合至底座100,底座100包含第6-7圖所示之底座基板105,發光二極體60(或其子集合)使用導電部件,例如底座100中的電路120,以串聯方式電性耦接在一 起,電路120可包含例如內連線層中的金屬線或印刷電路板上的銅導線。 FIG. 8 shows a simplified schematic top view of the die 45 according to some embodiments of the present invention. In the embodiment shown in FIG. 8, the die 45 includes 18 light emitting diodes (or light emitting diode wafers) 60. Each light emitting diode 60 can be similar to the light emitting diodes 60A-60C discussed above, and can be manufactured according to the same process. The light emitting diode 60 is bonded to the base 100. The base 100 includes the base substrate 105 shown in FIGS. 6-7. The light emitting diode 60 (or a subset thereof) uses a conductive member, such as the circuit 120 in the base 100, in series. Electrical coupling Thus, the circuit 120 may include, for example, metal lines in an interconnect layer or copper wires on a printed circuit board.
如第8圖的俯視圖所示,每一個發光二極體60大抵上具有三角形的形狀或圖案,發光二極體60以成對(pairs)的方式排列,在每一對中的發光二極體的位置相較於其他相鄰的發光二極體更靠近其最接近的相鄰發光二極體(亦即同一對的成員),每一對相鄰的發光二極體60共同地形成類似矩形或正方形的俯視圖案,然而,在此所示之排列方式僅作為示範用,在其他實施例中,發光二極體可採用任何形狀或幾何圖形排列,並且這些形狀或幾何圖形適用於晶粒45的俯視圖案。 As shown in the top view of FIG. 8, each light emitting diode 60 has a triangular shape or pattern. The light emitting diodes 60 are arranged in pairs, and the light emitting diodes in each pair are arranged in pairs. Compared with other adjacent light-emitting diodes, its position is closer to its nearest adjacent light-emitting diode (that is, a member of the same pair). Each pair of adjacent light-emitting diodes 60 collectively form a similar rectangle. Or square top view pattern, however, the arrangement shown here is for demonstration purposes only. In other embodiments, the light emitting diodes can be arranged in any shape or geometry, and these shapes or geometry are suitable for the die 45 Top view pattern.
為了讓上述概念說明得更好,第9圖顯示依據本發明的不同實施例,在晶圓級(wafer level)、晶粒級(die level)以及晶片級(chip level)的各種俯視圖中,可以看到在晶圓級的俯視圖中,晶圓包含複數個高壓發光二極體(HVLED)晶粒,每個晶粒可以與上述討論的晶粒45相似。在晶粒級的俯視圖中,每個高壓發光二極體晶粒可包含複數個發光二極體(或發光二極體晶片),在俯視圖中,每個高壓發光二極體晶粒可呈現矩形的形狀、正方形的形狀、鑽石形的形狀、六邊形的形狀,或任何其他合適的多邊形形狀,這些形狀可以適用於目前已知或之後發展的切割技術。 In order to better explain the above concepts, FIG. 9 shows different embodiments according to the present invention. In various top views of wafer level, die level and chip level, It is seen that in a wafer-level top view, the wafer contains a plurality of high-voltage light-emitting diode (HVLED) dies, each of which may be similar to the die 45 discussed above. In a grain-level top view, each high-voltage light-emitting diode die may include a plurality of light-emitting diodes (or light-emitting diode wafers). In a top view, each high-voltage light-emitting diode die may appear rectangular. Shapes, square shapes, diamond shapes, hexagonal shapes, or any other suitable polygonal shapes, these shapes may be suitable for cutting techniques currently known or later developed.
在晶片級(亦即發光二極體級)的俯視圖中,每個發光二極體可具有矩形的形狀、正方形的形狀、鑽石形的形狀、三角形的形狀、六邊形的形狀、任何其他合適的多邊形形狀,或甚至是具有一個或多個彎曲的邊或邊緣的不規則形狀。由於 發光二極體事實上是經由微影製程而圖案化,可經由調整微影製程(例如藉由改變光罩上的圖案)來使得每個發光二極體達到所想要的任何俯視形狀,因此本發明實施例的發光二極體能提供各種不同的俯視形狀。 In a top view of a wafer level (ie, a light emitting diode level), each light emitting diode may have a rectangular shape, a square shape, a diamond shape, a triangular shape, a hexagonal shape, any other suitable Polygonal shapes, or even irregular shapes with one or more curved edges or edges. due to The light-emitting diodes are actually patterned through a lithographic process, and each light-emitting diode can be adjusted to any desired shape by adjusting the lithographic process (for example, by changing the pattern on the photomask). The light-emitting diodes of the embodiments of the present invention can provide various different shapes in plan view.
除了俯視形狀的可變性之外,每一個發光二極體晶粒可以具有與其餘的發光二極體晶粒不同的俯視形狀,例如,在單一晶粒中,一個發光二極體可具有三角形的俯視形狀,另一個發光二極體則可具有矩形的俯視形狀,又另一個發光二極體可具有六邊形的俯視形狀,並且又另一個發光二極體可具有不規則的俯視形狀,此不規則的俯視形狀具有至少一個非直線的邊/邊緣,可以將發光二極體配置成產生任何排列方式的俯視形狀,其係取決於設計需求以及與製造相關的事項。發光二極體或發光二極體晶片的形狀之機動性(flexibility)和多種變化性(versatility)能提供一些好處,例如增加光萃取率、較佳的散熱率等。 In addition to the variability of the top-view shape, each light-emitting diode grain may have a different top-view shape from the rest of the light-emitting diode grains. For example, in a single grain, one light-emitting diode may have a triangular shape. A top view shape, another light emitting diode may have a rectangular top view shape, another light emitting diode may have a hexagonal top view shape, and another light emitting diode may have an irregular top view shape. The irregular top-view shape has at least one non-straight edge / edge, and the light-emitting diodes can be configured to produce a top-view shape of any arrangement, which depends on design requirements and matters related to manufacturing. The flexibility and various versatility of the shape of the light emitting diode or the light emitting diode wafer can provide some benefits, such as increasing light extraction rate, better heat dissipation rate, and the like.
為了完成高壓發光二極體(HVLED)晶粒45的製造,也可進行額外的製程,例如切割、封裝以及測試製程,但是為了簡化,在此並未說明這些製程。 In order to complete the manufacturing of the high-voltage light-emitting diode (HVLED) die 45, additional processes such as cutting, packaging, and testing processes may be performed, but for the sake of simplicity, these processes are not described here.
高壓發光二極體(HVLED)晶粒45可以作為照明裝置(lighting apparatus)的一部份而實施,例如HVLED晶粒45可以作為以發光二極體為基礎的照明設備(lighting instrument)300的一部份而實施。照明設備300的簡化剖面圖如第10圖所示,在第10圖中所示之以發光二極體為基礎的照明設備300的實施例包含HVLED晶粒45的複數個發光二極體 60,其中發光二極體(或發光二極體之選擇的子集合)以串聯方式電性耦接在一起,雖然在第10圖所示之實施例中僅繪出三個發光二極體60,可以理解的是,任何其他數量的發光二極體都可以實施,藉此使得HVLED晶粒可以禁得起高電壓,例如像170伏特一樣高的電壓。 The high-voltage light emitting diode (HVLED) die 45 can be implemented as a part of a lighting apparatus. For example, the HVLED die 45 can be used as a part of a lighting instrument 300 based on a light emitting diode. Partially implemented. A simplified cross-sectional view of the lighting device 300 is shown in FIG. 10. The embodiment of the lighting device 300 based on the light-emitting diode shown in FIG. 10 includes a plurality of light-emitting diodes of the HVLED die 45. 60, wherein the light emitting diodes (or a selected subset of the light emitting diodes) are electrically coupled together in series, although only three light emitting diodes 60 are drawn in the embodiment shown in FIG. 10 It can be understood that any other number of light emitting diodes can be implemented, thereby enabling the HVLED die to withstand high voltages, such as as high as 170 volts.
如上述討論,每一個發光二極體60包含n摻雜的III-V族化合物層、p摻雜的III-V族化合物層,以及多重量子井(MQW)層設置在n摻雜與p摻雜的III-V族化合物層之間。因為發光二極體60的結構如上述討論,在此揭示的高壓發光二極體晶粒的發光二極體60相較於傳統的發光二極體能提供較佳的散熱率、光萃取率及電性傳導的可靠度效能。 As discussed above, each light emitting diode 60 includes an n-doped III-V compound layer, a p-doped III-V compound layer, and a multiple quantum well (MQW) layer disposed between the n-doped and p-doped Between heterogeneous III-V compound layers. Because the structure of the light-emitting diode 60 is as discussed above, the light-emitting diode 60 of the high-voltage light-emitting diode grains disclosed herein can provide better heat dissipation rate, light extraction rate, and electricity than the traditional light-emitting diode. Reliability performance of sexual transmission.
在一些實施例中,每一個發光二極體60具有磷光體層(phosphor layer))塗佈於其上,磷光體層可包含發出磷光的材料以及/或發出螢光的材料。磷光體層可以採用散佈在濃縮的黏滯流體介質中(例如流體膠質)的方式塗佈在發光二極體60的表面上,磷光材料以黏滯的流體狀態或固化狀態成為發光二極體封裝的一部份。在實際的發光二極體之應用上,磷光體層可用於轉變發光二極體60發出的光顏色,例如,磷光體層可以將發光二極體60發出的藍光轉變成不同波長的光,藉由改變磷光體層的材料組成,可以使得發光二極體60發出想要的光顏色。 In some embodiments, each light emitting diode 60 has a phosphor layer applied thereon, and the phosphor layer may include a phosphorescent material and / or a fluorescent material. The phosphor layer can be coated on the surface of the light-emitting diode 60 by being dispersed in a concentrated viscous fluid medium (such as a fluid colloid). The phosphor material becomes a light-emitting diode package in a viscous fluid state or a cured state. a part. In practical applications of the light emitting diode, the phosphor layer can be used to change the color of light emitted by the light emitting diode 60. For example, the phosphor layer can convert blue light emitted by the light emitting diode 60 into light of different wavelengths by changing The material composition of the phosphor layer can make the light emitting diode 60 emit a desired light color.
發光二極體60固著在底座320上,在一些實施例中,底座320與上述討論的底座100相似,例如,底座320可包含金屬核心的印刷電路板(MCPCB),金屬核心的印刷電路板 包含金屬基礎材料,其可由鋁(或鋁的合金)製成,金屬核心的印刷電路板也包含導熱但電性絕緣的介電層設置於金屬基礎材料上,金屬核心的印刷電路板也可包含由銅製成的薄金屬層設置於介電層上。在其他實施例中,底座320可包含其他合適的導熱結構,例如矽底座或陶瓷底座。 The light emitting diode 60 is fixed on the base 320. In some embodiments, the base 320 is similar to the base 100 discussed above. For example, the base 320 may include a metal core printed circuit board (MCPCB), and a metal core printed circuit board. Contains a metal base material, which can be made of aluminum (or an alloy of aluminum). The printed circuit board with a metal core also includes a thermally conductive but electrically insulating dielectric layer disposed on the metal base material. The printed circuit board with a metal core can also include A thin metal layer made of copper is disposed on the dielectric layer. In other embodiments, the base 320 may include other suitable thermally conductive structures, such as a silicon base or a ceramic base.
照明設備300包含擴散罩(diffuser cap)350,擴散罩350可作為其底下的發光二極體60的遮蓋物,以另一種方式說明,發光二極體60被擴散罩350和底座320共同地密封。在一些實施例中,擴散罩350具有彎曲的表面或輪廓,在一些實施例中,此彎曲的表面大抵上可採用半圓形的輪廓,以使得發光二極體60發出的每一束光線可以用大抵上正面的入射角度,例如與90度只差幾度的範圍內,到達擴散罩350的表面,擴散罩350的彎曲形狀有助於降低發光二極體60發出的光之內部全反射(Total Internal Reflection;TIR)。 The lighting device 300 includes a diffuser cap 350, which can be used as a cover for the light emitting diode 60 underneath. In another way, the light emitting diode 60 is sealed by the diffuser cover 350 and the base 320. . In some embodiments, the diffuser cover 350 has a curved surface or profile. In some embodiments, the curved surface can adopt a semi-circular profile, so that each beam of light emitted by the light emitting diode 60 can be With a large incidence angle on the front side, for example, within a few degrees from 90 degrees, it reaches the surface of the diffusion cover 350. The curved shape of the diffusion cover 350 helps reduce the total internal reflection of the light emitted by the light emitting diode 60 (Total Internal Reflection; TIR).
擴散罩350可具有特定結構的表面,例如此特定結構的表面可以是粗糙不平的,或者可含有複數個小圖案,例如多邊形或圓形,此特定結構的表面有助於散射發光二極體60發出的光,以使得光線的分佈更均勻。在一些實施例中,擴散罩350可以用含有擴散粒子的擴散層塗佈。 The diffuser cover 350 may have a surface with a specific structure, for example, the surface of the specific structure may be rough or uneven, or may contain a plurality of small patterns, such as a polygon or a circle. The surface of the specific structure helps to diffuse the light emitting diode 60 The emitted light to make the light distribution more uniform. In some embodiments, the diffusion cover 350 may be coated with a diffusion layer containing diffusion particles.
在一些實施例中,發光二極體60與擴散罩350之間的空間360可以用空氣填充;在其他實施例中,空間360可以用光學等級的聚矽氧烷基黏著材料(optical-grade silicone-based adhesive material)填充,此材料也稱為光學膠(optical gel)。在此實施例中,磷光粒子可以混合在光學膠中, 以使得發光二極體60發出的光更進一步地擴散。 In some embodiments, the space 360 between the light-emitting diode 60 and the diffusion cover 350 may be filled with air; in other embodiments, the space 360 may be made of optical-grade silicone (optical-grade silicone) -based adhesive material). This material is also called optical gel. In this embodiment, the phosphorescent particles can be mixed in an optical glue, Therefore, the light emitted from the light emitting diode 60 is further diffused.
雖然在此說明的實施例中顯示全部的發光二極體60都被密封在單一的擴散罩350內,可以理解的是,在其他實施例中可使用複數個擴散罩,例如每一個發光二極體60可以各自被密封在這些擴散罩的一個擴散罩內。 Although it is shown in the embodiment described here that all the light-emitting diodes 60 are sealed in a single diffuser cover 350, it can be understood that in other embodiments, a plurality of diffuser covers may be used, such as each light-emitting diode The bodies 60 may each be sealed within one of the diffusers.
照明設備300也可以選擇性地包含反射結構370,反射結構370可固著在底座320上,在一些實施例中,反射結構被塑造成類似杯狀物的形狀,因此反射結構也可以被稱為反射杯。從俯視角度觀之,反射結構以360度包圍或圍繞發光二極體60和擴散罩350,從俯視角度觀之,反射結構370可具有圓形的輪廓、像蜂巢的六角形輪廓,或另一種合適的多孔輪廓(cellular profile),以包圍擴散罩350。在一些實施例中,發光二極體60和擴散罩350位於反射結構370的底部附近,換言之,反射結構370的頂部或上面的開口位於發光二極體60和擴散罩350的上方。 The lighting device 300 can also optionally include a reflective structure 370, which can be fixed on the base 320. In some embodiments, the reflective structure is shaped like a cup, so the reflective structure can also be called Reflection cup. Viewed from a top view, the reflective structure surrounds or surrounds the light emitting diode 60 and the diffuser 350 at a 360 degree angle. From a top view, the reflective structure 370 can have a circular outline, a hexagonal outline like a honeycomb, or another type. A suitable cellular profile to surround the diffusion shield 350. In some embodiments, the light emitting diode 60 and the diffusion cover 350 are located near the bottom of the reflective structure 370. In other words, the opening on the top or above of the reflective structure 370 is located above the light emitting diode 60 and the diffusion cover 350.
反射結構370可用於反射從擴散罩350離開而傳播的光,在一些實施例中,反射結構370的內部表面塗佈上反射膜,例如鋁、銀或前述之合金,可以理解的是,在一些實施例中,反射結構370的側壁表面可具有特定結構,其方式與擴散罩350具有的特定結構之表面類似,因此,反射結構370可用於將發光二極體60發出的光更進一步地散射,藉此降低了照明設備300發出的光之眩光(glare),並且使得其發出的光更適合於人眼。在一些實施例中,反射結構370的側壁具有傾斜(sloped)或錐形(tapered)的輪廓,反射結構370的錐形輪廓提升 了反射結構370的光反射效率。 The reflective structure 370 can be used to reflect the light transmitted from the diffuser 350. In some embodiments, the internal surface of the reflective structure 370 is coated with a reflective film, such as aluminum, silver, or the foregoing alloy. It can be understood that In the embodiment, the sidewall surface of the reflective structure 370 may have a specific structure in a manner similar to that of the specific structure of the diffuser cover 350. Therefore, the reflective structure 370 may be used to further scatter the light emitted by the light emitting diode 60. This reduces the glare of light emitted by the lighting device 300 and makes the light emitted by it more suitable for the human eye. In some embodiments, the sidewall of the reflective structure 370 has a sloped or tapered profile, and the tapered profile of the reflective structure 370 is elevated. The light reflection efficiency of the reflective structure 370 is improved.
照明設備300包含散熱結構380,也稱為散熱器(heat sink)380,散熱器380經由底座320熱耦接至發光二極體60(其在操作期間會產生熱),換言之,散熱器380附著至底座320,或者底座320位於散熱器380的表面上。散熱器380係配置成促進熱消散至周遭的空氣中,散熱器380含有導熱材料,例如金屬材料。散熱器380的形狀和幾何圖形係設計成能對常見的燈泡提供骨架(framework),同時將熱從發光二極體60散開或引導開來。為了提高熱轉移,散熱器380可具有複數個鰭片(fins)390,鰭片390從散熱器380的主體向外突出,鰭片390可具有大量的表面積暴露至周遭的空氣,以促進熱轉移。 The lighting device 300 includes a heat dissipation structure 380, also referred to as a heat sink 380. The heat sink 380 is thermally coupled to the light emitting diode 60 (which generates heat during operation) via the base 320. In other words, the heat sink 380 is attached To the base 320, or the base 320 is located on the surface of the heat sink 380. The heat sink 380 is configured to promote heat dissipation to the surrounding air. The heat sink 380 contains a thermally conductive material, such as a metal material. The shape and geometry of the heat sink 380 are designed to provide a framework for common light bulbs, while dissipating or directing heat away from the light emitting diode 60. To improve heat transfer, the heat sink 380 may have a plurality of fins 390 protruding from the body of the heat sink 380, and the fins 390 may have a large surface area exposed to the surrounding air to promote heat transfer .
第11圖顯示照明模組(lighting module)400的簡化概略圖,其包含上述討論的照明設備300的一些實施例,照明模組400具有基座410,主體420附著至基座410,以及燈430附著至主體420。在一些實施例中,燈430為向下的燈(或光向下的照明模組),參閱第10圖,燈430包含上述討論的照明設備300,燈430係用於有效地投射光束440。此外,相較於傳統的白熱燈(incandescent lamps),燈430能提供較好的耐久性和較長的壽命,可以理解的是,其他的照明應用可藉由使用本發明實施例上述討論的發光二極體而獲得好處,例如,本發明實施例的發光二極體可用在一些照明應用上,其包含但不限於,車輛的前照燈或尾燈、車輛的儀表板顯示器、投影機的光源、電子產品例如液晶顯示電視或液晶顯示螢幕、平板電腦、行動電話或筆記型/膝上型電腦的光源。 FIG. 11 shows a simplified schematic diagram of a lighting module 400 including some embodiments of the lighting device 300 discussed above. The lighting module 400 has a base 410, a main body 420 attached to the base 410, and a lamp 430. Attached to the main body 420. In some embodiments, the lamp 430 is a downward lamp (or a light-down lighting module). Referring to FIG. 10, the lamp 430 includes the lighting device 300 discussed above, and the lamp 430 is used to efficiently project the light beam 440. In addition, compared to traditional incandescent lamps, the lamp 430 can provide better durability and longer life. It can be understood that other lighting applications can use the light emission discussed above in the embodiments of the present invention. For example, the light-emitting diodes of the embodiments of the present invention can be used in some lighting applications, including but not limited to, headlights or taillights of vehicles, dashboard displays of vehicles, light sources of projectors, Electronic products such as LCD TVs or LCD monitors, tablets, mobile phones or light sources for laptops / laptops.
第12圖為依據本發明實施例的各種觀點,說明製造高壓發光二極體(HVLED)裝置的簡化方法500之流程圖,此高壓發光二極體裝置可包含一個或多個晶粒,每一個晶粒包含複數個發光二極體。 FIG. 12 is a flowchart illustrating a simplified method 500 for manufacturing a high-voltage light-emitting diode (HVLED) device according to various viewpoints of embodiments of the present invention. The high-voltage light-emitting diode device may include one or more crystal grains, each The die contains a plurality of light emitting diodes.
方法500包含步驟510,在此步驟中,以一個或多個磊晶製程在生長基底之上成長複數個磊晶層。在一些實施例中,生長基底包含藍寶石材料,這些磊晶層包含p摻雜的III-V族化合物層、n摻雜的III-V族化合物層,以及多重量子井(MQW)設置在p摻雜的III-V族化合物層與n摻雜的III-V族化合物層之間。 The method 500 includes a step 510 in which a plurality of epitaxial layers are grown on a growth substrate in one or more epitaxial processes. In some embodiments, the growth substrate comprises a sapphire material, and these epitaxial layers include a p-doped III-V compound layer, an n-doped III-V compound layer, and a multiple quantum well (MQW) set at the p-doped Between the heterogeneous III-V compound layer and the n-doped III-V compound layer.
方法500包含步驟520,在此步驟中,經由微影製程將這些磊晶層轉變成複數個分開的發光二極體,這些分開的發光二極體為多邊形晶粒的一部份。在一些實施例中,於步驟520中進行轉變製程,以使得以下描述中的至少一個為真:這些發光二極體中的至少一些發光二極體在俯視圖中具有相較於其餘的發光二極體不同的形狀;這些發光二極體中的至少一些發光二極體在俯視圖中具有非矩形的多邊形形狀;以及這些發光二極體中的至少一些發光二極體在俯視圖中具有一個或多個彎曲的邊。 The method 500 includes step 520. In this step, the epitaxial layers are transformed into a plurality of separate light-emitting diodes through a lithography process, and the separate light-emitting diodes are part of a polygonal crystal grain. In some embodiments, a conversion process is performed in step 520 so that at least one of the following descriptions is true: At least some of the light-emitting diodes have a light-emitting diode having a light-emitting diode in a top view compared to other light-emitting diodes. Different shapes of the body; at least some of the light-emitting diodes have a non-rectangular polygonal shape in a plan view; and at least some of the light-emitting diodes have one or more in a top view Curved edges.
方法500包含步驟530,在此步驟中,p型電極和n型電極形成在每一個發光二極體之上,p型電極電性耦接至p摻雜的III-V族化合物層,並且n型電極電性耦接至n摻雜的III-V族化合物層。 The method 500 includes step 530. In this step, a p-type electrode and an n-type electrode are formed on each light-emitting diode, the p-type electrode is electrically coupled to the p-doped III-V compound layer, and n The type electrode is electrically coupled to the n-doped III-V compound layer.
方法500包含步驟540,在此步驟中,這些發光二 極體接合至底座,以使得p型電極和n型電極在接合之後位於底座與這些磊晶層之間。在一些實施例中,底座包含以下所列其中之一:以金屬為基礎的材料、絕緣體上的矽材料、矽底座、陶瓷底座、或金屬核心的印刷電路板(MCPCB)底座。在一些實施例中,底座含有複數個導電部件。在一些實施例中,於步驟540中進行接合製程,以使得這些發光二極體的至少一子集合藉由這些導電部件以串聯方式電性耦接。在一些實施例中,步驟540中的接合製程包含晶圓級接合製程。在一些其他實施例中,步驟540中的接合製程包含晶粒級接合製程。 The method 500 includes step 540. In this step, these two The polar body is bonded to the base so that the p-type electrode and the n-type electrode are positioned between the base and these epitaxial layers after bonding. In some embodiments, the base includes one of the following: a metal-based material, a silicon material on an insulator, a silicon base, a ceramic base, or a metal core printed circuit board (MCPCB) base. In some embodiments, the base contains a plurality of conductive components. In some embodiments, a bonding process is performed in step 540, so that at least a subset of the light-emitting diodes are electrically coupled in series by the conductive components. In some embodiments, the bonding process in step 540 includes a wafer-level bonding process. In some other embodiments, the bonding process in step 540 includes a die-level bonding process.
方法500包含步驟550,在此步驟中,於步驟540的接合製程之後,將生長基底薄化或移除。 The method 500 includes a step 550 in which the growth substrate is thinned or removed after the bonding process in step 540.
在此所討論的步驟510-540之前、期間或之後可進行額外的製程,以完成光電元件的製造,為了簡化,這些其他的製程在此並未詳細討論。 Additional processes may be performed before, during, or after the steps 510-540 discussed herein to complete the fabrication of the photovoltaic element. For simplicity, these other processes are not discussed in detail here.
在以上的敘述中已經先概略地描述出一些實施例的特徵,以使得在此技術領域中具有通常知識者可以更瞭解接續的詳細描述。在此技術領域中具有通常知識者可以理解的是,可以使用本發明實施例作為基礎來設計或修改其他製程或結構,藉此達成在此介紹的實施例的一些目的以及/或一些優點。 In the above description, the features of some embodiments have been briefly described, so that those with ordinary knowledge in this technical field can better understand the detailed description of the connection. Those skilled in the art can understand that the embodiments of the present invention can be used as a basis to design or modify other processes or structures, thereby achieving some of the objectives and / or advantages of the embodiments described herein.
雖然本發明已揭示較佳實施例如上,然其並非用以限定本發明,在此技術領域中具有通常知識者當可瞭解,在不脫離本發明之精神和範圍內,當可做些許更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定為準。 Although the preferred embodiments of the present invention have been disclosed above, they are not intended to limit the present invention. Those skilled in the art can understand that without departing from the spirit and scope of the present invention, they can make some changes and Retouch. Therefore, the scope of protection of the present invention shall be determined by the scope of the attached patent application.
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