TWI628426B - Piezoelectric actuation sampling platform - Google Patents

Abstract

A piezoelectric actuation sampling platform for automatically completing a sampling procedure, a slider device of a piezoelectric actuation sampling platform is disposed on a guiding track, the slider device is configured to carry a sampler, the piezoelectric actuation The slider contacts the slider device to move the slider device along the guiding track, and the sampler samples a sample carried by the carrier, wherein the sensor is configured to sense whether the sampler has sampled the sample Sampling, while the sampler is ready to sample, causes the piezoelectric actuator to push the slider device in the reverse direction, causing the sampler to exit the sample and complete the automated sampling.

Description

Piezoelectric actuation sampling platform

This invention relates to a sampling platform, and more particularly to a piezoelectric actuation sampling platform.

At present, the products produced by nanotechnology have been widely used in life. For example, cutting fluids, grinding fluids, foods and cosmetics are all advertised with nano-particles. However, because nano particles are extremely small and cannot be directly observed, nano-derived A granule detection technique, such as the patent application No. 95145523, "A structure for an electron microscope sample device and a method for fabricating the same", which fills a sample filling region defined by a micro-liquid having nano-particles between two substrates. After that, the sample filling area is sealed, and the nano-particles in the micro-liquid are observed by an electron microscope through the window of the two substrates. At present, the micro-fluid filling can only be performed manually, and the nano-particles are obtained by capillary phenomenon. The microfluid is filled into the sample filling area, but since the average person's hand shaking amplitude is about 700 μm, which is much higher than the capillary filling distance of 200 μm, it is easy to cause the sampler to contact the excessive fluid when filling the microfluid, so that the fluid is dip. The window of the substrate is covered to obscure the observation line of sight.

The main object of the present invention is to provide a piezoelectric actuation sampling platform for driving a slider device in a piezoelectrically actuated manner to drive a sampler to sample a sample and pass through a first sensing portion of a first sensor. It is sensed whether the carrier is filled with the sample.

Another object of the present invention is to provide a piezoelectrically actuated sampling platform, wherein a first sensing portion and a second sensing portion of the first sensor measure an instant at which the sampler samples the sample. At this instant, the piezoelectric actuator can be driven in reverse by piezoelectric actuation, allowing the sampler to stop sampling to avoid excessive sampling of the sampler.

A piezoelectric actuation sampling platform of the present invention comprises a guiding track, a slider device, a piezoelectric actuator, a carrier plate and a first sensor, and the slider device is disposed on the guiding track The slider device is configured to carry a sampler, the piezoelectric actuator contacts the slider device to move the slider device along the guiding track, and the carrier plate is configured to carry a sample, the first sensing The first sensing portion is disposed on the carrier, and the first sensing portion is configured to sense whether the carrier is filled with the sample.

The first sensor of the present invention further has a second sensing portion, the second sensing portion is disposed on the slider device to move synchronously with the slider device, and the first sense of the first sensor The measuring portion and the second sensing portion are configured to sense whether the sampler has sampled the sample.

According to the present invention, the first sensing portion disposed on the carrier senses whether the carrier is filled with the sample, and the piezoelectric actuator contacts the slider device to operate the slider device. The sampler carried by the slider device samples the sample, and senses the instant at which the sampler samples the sample through the first sensor while sampling, so that the sampler can reverse when sampling is completed. The slider device is driven to keep the sampler away from the sample, and an automated sampling procedure can be performed and the sample contamination of the sampler can be avoided.

1 and 2 are a perspective view and an exploded perspective view of a piezoelectric actuation sampling platform 100 having a guiding track 110 and a slider device according to an embodiment of the invention. 120, a piezoelectric actuator 130, a carrier 140, a first sensor 150, a second sensor 160, a back plate 170 and a fixture 180.

Referring to FIGS. 1 and 2, the backplane 170 is disposed on the carrier 140, and the carrier 140 has a recess 141. The recess 141 defines an accommodation space A with the backplane 170. The track 110 is disposed on the back plate 170, and a portion of the guide track 110 extends into the receiving space A. The slider device 120 is disposed on the guiding rail 110, and the slider device 120 is vertically movable along the guiding rail 110, so that a portion of the slider device 120 can be moved into the accommodating space A.

Referring to FIGS. 1 and 2 , the fixing device 180 and the piezoelectric actuator 130 are disposed on the back plate 170 , and the fixing device 180 is configured to fix the piezoelectric actuator 130 such that the piezoelectric actuator 130 Contacting the slider device 120, wherein the piezoelectric actuator 130 is driven by a PWM control signal output by a microprocessor. Referring to FIG. 2, the piezoelectric actuator 130 has a tip end portion 131. The piezoelectric actuator 130 is deformed by the driving of the control signal, so that the tip end portion 131 of the piezoelectric actuator 130 exhibits a motion trajectory in a counterclockwise direction or a clockwise direction. In this embodiment, if the tip end portion 131 of the piezoelectric actuator 130 is in a counterclockwise direction, the slider device 120 can be pushed to move downward along the guiding track 110. The tip end portion 131 of the electric actuator 130 is in a clockwise direction, and the slider device 120 can be pushed to move upward along the guiding track 110, since the piezoelectric actuator 130 can be in a very short time The response is in the middle, and the control of the microstepping action can be achieved.

Referring to FIGS. 3 and 4, the slider device 120 is configured to carry a sampler S. One of the carrier plates 140 carries a recess 142 for carrying a sample O along which the slider device 120 is located. When the 110 moves downward and a portion of the slider device 120 moves into the accommodating space A, the sampler S can be driven to sample the sample O, but as described in the prior art, if the sampler S stays at When the sample O is sampled for a long time, the sample O may contaminate the observation window of the sampler S, causing difficulty in observation. Therefore, the first sensor 150 senses whether the sampler S has sampled the sample O. Preferably, the first sensor 150 has a first sensing portion 152 and a second portion. The first sensing portion 152 is disposed in the slider device 120 and moves in synchronization with the slider device 120 . The first sensing portion 152 is disposed on the carrier 140 , and the first sensing portion 152 is disposed on the carrier device 140 . It is used to sense whether the carrier plate 140 is filled with the sample O.

Referring to FIG. 3 , in the embodiment, the first sensing portion 152 and the second sensing portion 151 of the first sensor 150 are electrically conductive, and the first sensing portion 152 is electrically connected. In the sample O, the first sensing portion 152 and the second sensing portion 151 are both electrically conductive, so that the first sensing portion 152 and the second sensing portion 151 have the ability to store electric charge. a capacitance, therefore, a capacitance value between the first sensing portion 152 and the second sensing portion 151 can be measured by a measuring device, and the calculation value of the capacitance value is: , For the capacitance value, The permittivity of the medium between the first sensing portion 152 and the second sensing portion 151, The area where the first sensing unit 152 and the second sensing unit 151 overlap, For the distance between the first sensing portion 152 and the second sensing portion 151, the overlapping area between the first sensing portion 152 and the second sensing portion 151 is known. And the permittivity of the medium When the piezoelectric actuator 130 drives the slider device 120 to move downward, the distance is constant. Gradually, the capacitance value will gradually rise, and the distance between the sampler S and the sample O can be known by this. Referring to FIG. 4, when the sampler S contacts the sample O and the sample O is filled in the sampler S, the medium between the first sensing portion 152 and the second sensing portion 151 is air. The capacitance is converted to a liquid, and since the capacitance ratio of the liquid is greater than the permittivity of the air, the capacitance between the first sensing portion 152 and the second sensing portion 151 is greatly increased. The sampler S has sampled the sample O. Then, the control signal reversely drives the piezoelectric actuator 130 to reverse, and drives the slider device 120 to move upward to complete automatic sampling, so as to avoid excessive sampling of the sample O by the sampler S, and subsequent The best results are obtained when the sampler S is observed.

Please refer to FIGS. 3 and 4 again, because the distance between the first sensing portion 152 and the second sensing portion 151 The change of the size of the capacitor is not significant. Preferably, please refer to FIGS. 5 and 6. The second sensor 160 senses the distance between the sampler S and the sample O. In the embodiment, the second sensor 160 has a third sensing portion 161 and a fourth sensing portion 162. The third sensing portion 161 is disposed on the slider device 120 and the slider device. The second sensing portion 162 is disposed on the carrier 140. Similarly, the third sensing portion 161 and the fourth sensing portion 162 of the second sensor 160 are an electrical conductor. The third sensing unit 161 and the fourth sensing unit 162 have a capability of storing electric charge to generate a capacitance. Therefore, the first measuring unit 163 can be used to measure the third sensing unit 161 and the capacitor. a capacitance value between the fourth sensing portion 162, wherein when the third sensing portion 161 moves with the slider device 120, a third between the third sensing portion 161 and the fourth sensing portion 162 The overlap area is changed, and the distance between the third sensing portion 161 and the fourth sensing portion 162 is constant, and thus the calculation formula of the capacitance value is: When the distance between the third sensing portion 161 and the fourth sensing portion 162 and the permittivity of the medium are constant, when the piezoelectric actuator 130 drives the slider device 120 to move downward, The overlapping area between the third sensing portion 161 and the fourth sensing portion 162 is increased, and the capacitance value between the third sensing portion 161 and the fourth sensing portion 162 is increased to be known. The distance between the sampler S and the sample O carried by the slider device 120.

However, also because the distance between the sampler S and the sample O is small, the slight movement of the slider device 120 does not allow the third sensing portion 161 and the fourth sensing portion 162 to be between the third sensing portion 161 and the fourth sensing portion 162. The change in the overlap area is quite remarkable, which also makes the change in the capacitance value between the third sensing portion 161 and the fourth sensing portion 162 inconspicuous. Preferably, the present invention senses the distance between the sampler S and the sample O by the second sensor 160 when the slider device 120 is driven to move downward. At this time, the slider device 120 faces The lower moving speed is faster, when the capacitance value between the third sensing portion 161 and the fourth sensing portion 162 is greater than a set value, which is equivalent to when the sampler S is relatively close to the sample O, The change of the control signal slows down the speed of the slider device 120 to move downward, so that the sampler S gradually moves toward the sample O. At this time, the switch is sensed by the first sensor 150 to detect whether the sampler S is Sample O has been sampled. When the capacitance value between the first sensing portion 152 and the second sensing portion 151 is greatly increased, that is, the sampler S is in contact with the sample O and sampling is completed, the control signal drives the signal in reverse. The slider device 120 is raised to cause the sampler S to leave the sample O to complete automated sampling.

Referring to FIGS. 1 and 2, the fixing device 180 has an adjusting member 181, a top abutting member 182 and a limiting member 183. The limiting member 183 is coupled to the abutting member 182, and the limiting member 183 is A limiting space is formed between the abutting members 182, and the piezoelectric actuators 130 are disposed in the limiting space. The adjusting member 181 is disposed in one of the positioning blocks 171 of the back plate 170, and the adjusting member 181 is opposite The positioning block 171 is moved. In the embodiment, the adjusting member 181 is coupled to the positioning block 171 in a screwing manner, and position adjustment is possible.

Referring to FIGS. 1 and 2 , a first positioning protrusion 191 and a second positioning protrusion 192 are disposed on the back plate 170 , and the first positioning protrusion 191 and the second positioning protrusion 192 are formed. There is a positioning space P. The top abutting member 182 of the fixing device 180 is positioned in the positioning space P. When the adjusting member 181 is coupled to the abutting member 182, the top abutting member 182 can be pressed against the piezoelectric body. The actuator 130 presses the tip end portion 131 of the piezoelectric actuator 130 against the slider device 120. Therefore, by adjusting the position of the adjusting member 181, the amount of preload of the tip portion 131 of the piezoelectric actuator 130 to the slider device 120 can be changed to increase the overall efficiency.

Referring to FIGS. 1 and 2, the abutting member 182 has a positioning portion 182a and a top abutting portion 182b. The positioning portion 182a has a guiding groove 182c, and one fixed end of the abutting portion 182b is movably fixed to In the guiding groove 182c, a top end of the abutting portion 182b protrudes from the positioning portion 182a to abut the piezoelectric actuator 130. In the embodiment, the top abutting member 182 has two top portions. The abutting portion 182b and the two abutting portions 182b can respectively control the position of the abutting portion 182b to be fixed to the guiding groove 182c to ensure that the two abutting portions 182b can evenly abut the piezoelectric actuator 130, so that the pressing portion The electric actuator 130 achieves an optimal actuation effect. Preferably, please refer to the second and seventh figures. The back plate 170 is recessed with a guiding slot 172. The positioning portion 182a has a guiding protrusion 182d. The guiding protrusion 182d is limited to the guiding slot 172. Therefore, when the adjusting member 181 performs the adjustment, the positioning portion 182a can linearly move along the limit of the guiding groove 172.

The piezoelectric actuator 130 contacts the slider device 120, and the slider device 130 is operated to allow the sampler S carried by the slider device 120 to sample the sample O, and is sampled. At the same time, the first sensor 150 senses the instant at which the sampler S samples the sample O, so that the slider device 120 can be driven back when the sampler S completes sampling, so that the sampler S is away from the sample O. The automated sampling procedure can be completed and the sample O can be prevented from contaminating the sampler S.

The scope of the present invention is defined by the scope of the appended claims, and any changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention are within the scope of the present invention. .

100‧‧‧ Piezoelectrically actuated sampling platform

110‧‧‧Guided track

120‧‧‧Sliding device

130‧‧‧ Piezoelectric Actuator

131‧‧‧ tip

140‧‧‧ Carrier Board

141‧‧‧ Groove

142‧‧‧ carrying groove

150‧‧‧first sensor

151‧‧‧Second Sensing Department

152‧‧‧First Sensing Department

160‧‧‧Second sensor

161‧‧‧ Third Sensing Department

162‧‧‧ Fourth Sensing Department

170‧‧‧ Backplane

171‧‧‧ Positioning block

172‧‧‧ guiding slot

180‧‧‧Fixed devices

181‧‧‧Adjustment

182‧‧‧Parts

182a‧‧ Positioning Department

182b‧‧‧Abutment

182c‧‧

182d‧‧‧Guiding bumps

183‧‧‧Limited parts

191‧‧‧First positioning bump

192‧‧‧Second positioning bump

S‧‧‧sampler

O‧‧‧ sample

A‧‧‧ accommodating space

P‧‧‧ Positioning space

Figure 1 is a perspective view of a piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention. 2 is an exploded perspective view of the piezoelectric actuation sampling platform in accordance with an embodiment of the present invention. Figure 3: A cross-sectional view of the piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention. Figure 4: A cross-sectional view of the piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention. Figure 5: A partial perspective view of the piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention. Figure 6: A partial perspective view of the piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention. Figure 7: A cross-sectional view of the piezoelectrically actuated sampling platform in accordance with an embodiment of the present invention.

Claims (10)

A piezoelectric actuation sampling platform comprising: a guiding track; a slider device disposed on the guiding track, the slider device for carrying a sampler; and a piezoelectric actuator contacting the sliding a block device for moving the slider device along the guiding track; a carrier for carrying a sample; and a first sensor having a first sensing portion and a second sensing portion, the first a sensing portion is disposed on the carrier, the second sensing portion is disposed on the slider device and moves synchronously with the slider device, and the first sensing portion and the second sensing portion are configured to sense the sampler Whether to fill the sample. The piezoelectric actuation sampling platform of claim 1, wherein the first sensor has a measuring device, and the first sensing portion and the second sensing portion of the first sensor are An electrical conductor, the first sensing portion is electrically connected to the sample, and the measuring device is configured to measure a capacitance value between the first sensing portion and the second sensing portion. The piezoelectric actuation sampling platform of claim 1, further comprising a second sensor, the second sensor having a third sensing portion and a fourth sensing portion, the third The sensing portion is disposed on the slider device to move synchronously with the slider device, and the fourth sensing portion is disposed on the carrier, wherein the first sensor is configured to sense a sample between the sampler and the sample distance. The piezoelectric actuation sampling platform of claim 3, wherein the second sensor has a first measuring device, the third sensing portion of the second sensor, and the fourth sensing The first measuring device is configured to measure a capacitance value between the third sensing portion and the fourth sensing portion, wherein when the third sensing portion moves with the slider device An overlap area between the third sensing portion and the fourth sensing portion is changed to change the capacitance value between the third sensing portion and the fourth sensing portion. The piezoelectric actuation sampling platform of claim 1, further comprising a backing plate and a fixing device, wherein the backing plate is disposed on the carrier, the fixing device and the piezoelectric actuator are disposed on The backing plate is configured to fix the piezoelectric actuator. The piezoelectric actuating sampling platform of claim 5, wherein the backing plate has a positioning block, the fixing device has an adjusting member and a topping member, and the adjusting member is disposed in the positioning block, and The adjusting member is movable relative to the positioning block, and the adjusting member abuts the abutting member to abut the pressing member against the piezoelectric actuator. The piezoelectric actuation sampling platform of claim 6, wherein the abutting member has a positioning portion and a top abutting portion, the positioning portion has a guiding groove, and the top abutting portion is movably fixed to the In the guide groove, the top abutting portion protrudes from the positioning portion to abut the piezoelectric actuator. The piezoelectric actuation sampling platform of claim 7, wherein the back plate has a guiding groove, and the positioning portion has a guiding protrusion, and the guiding protrusion is located in the guiding groove. The piezoelectric actuation sampling platform of claim 6, wherein the fixing device has a limiting member, the limiting member is coupled to the abutting member, and the limiting member and the abutting member are A limit space is formed, and the piezoelectric brake is limited to the limit space. The piezoelectric actuating sampling platform of claim 6, wherein the first positioning protrusion and the second positioning protrusion are disposed on the piezoelectric positioning sampling platform, wherein the first positioning protrusion and the second positioning protrusion are disposed on the piezoelectric positioning sampling platform. A positioning space is formed between the first positioning protrusion and the second positioning protrusion, and the top member of the fixing device is positioned in the positioning space.