TWI685043B - Chip pressing device - Google Patents
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Description
本發明涉及一種晶片抵壓裝置及晶片抵壓裝置套件,特別是一種手動式的晶片抵壓裝置及晶片抵壓裝置套件。The invention relates to a wafer pressing device and a wafer pressing device kit, in particular to a manual type wafer pressing device and a wafer pressing device kit.
一般來說,晶片的研發人員,在開發晶片的過程中,必需時常對晶片進行上機測試,以驗證其開發結果。上機測試的方式,大致為:研發人員先將晶片設置於一電連接座(socket)上,而後研發人員會利用相對應的抵壓組件,抵壓在晶片上,據以確保晶片在檢測過程中,能夠穩固地與晶片承載裝置連接。Generally speaking, in the process of developing a wafer, the R&D personnel of the wafer must always carry out on-board testing of the wafer to verify the development result. The method of on-board testing is roughly as follows: the R&D personnel first set the chip on an electrical socket (socket), and then the R&D personnel will use the corresponding pressure component to press against the chip to ensure that the chip is in the inspection process It can be firmly connected to the wafer carrier.
對晶片的研發人員而言,在開發不同尺寸的晶片時,必需購買相對應尺寸的電連接座及相對應的抵壓組件,而不同尺寸的晶片並無法共用相同的電連接座或是抵壓組件,為此提升了研發成本。對於電連接座及抵壓組件的生產廠商而言,因應不同尺寸晶片的測試需求,生產廠商必需重新設計相對應的電連接座及抵壓組件,為此提升了生產成本。For the R&D personnel of the chip, when developing chips of different sizes, it is necessary to purchase the corresponding size of the electrical connection seat and the corresponding pressure component, and the chips of different sizes cannot share the same electrical connection seat or the pressure Components, which increases R&D costs. For manufacturers of electrical connection bases and pressure-resistant components, in response to the testing needs of wafers of different sizes, manufacturers must redesign the corresponding electrical connection bases and voltage-resistant components, thereby increasing production costs.
本發明的晶片抵壓裝置及晶片抵壓裝置套件,用以改善現有生產廠商必需依據不同客戶的需求,客製不同的電連接座及抵壓組件(俗稱手測蓋組件),從而導致生產成本提升的問題;本發明的晶片抵壓裝置及晶片抵壓裝置套件也可以改善研發人員在測試不同尺寸的晶片時,必需購買不同的電連接座及其抵壓組件,從而導致研發成本提升的問題。The chip pressing device and the chip pressing device kit of the present invention are used to improve the existing manufacturers must customize different electrical connection seats and pressing components (commonly known as hand measuring cover components) according to the needs of different customers, resulting in production costs The problem of lifting; the chip pressing device and the chip pressing device kit of the present invention can also improve R&D personnel must purchase different electrical connection seats and their pressing components when testing chips of different sizes, which leads to the problem of increased research and development costs .
本發明實施例公開一種晶片抵壓裝置,其用以固定設置於一晶片承載裝置上,以抵壓設置於晶片承載裝置上的一晶片,晶片抵壓裝置包含:一本體、一抵壓單元及一卡合組件。本體的一側設置有至少一第一連接組件。抵壓單元抵壓單元可拆卸地設置於本體,且抵壓單元設置有一第二連接組件,第二連接組件可拆卸地與第一連接組件相連接,抵壓單元還具有一接觸結構;其中,當第二連接組件與第一連接組件相互連接時,抵壓單元則固定設置於本體。卡合組件設置於本體,卡合組件能被操作而與晶片承載裝置相互卡合。其中,當卡合組件與晶片承載裝置相互卡合,而晶片抵壓裝置固定設置於晶片承載裝置設置有晶片的位置上方時,接觸結構能對應抵壓晶片相反於晶片承載裝置的一側。An embodiment of the present invention discloses a chip pressing device, which is used to be fixedly arranged on a chip carrying device to press a chip arranged on the chip carrying device. The chip pressing device comprises: a body, a pressing unit and One snap assembly. At least one first connection component is provided on one side of the body. The pressing unit is detachably disposed on the body, and the pressing unit is provided with a second connection component, the second connection component is detachably connected to the first connection component, and the pressing unit also has a contact structure; wherein, When the second connection component and the first connection component are connected to each other, the pressing unit is fixedly disposed on the body. The engaging component is disposed on the body, and the engaging component can be operated to engage with the wafer carrying device. Wherein, when the clamping component and the wafer carrying device are engaged with each other, and the wafer pressing device is fixedly disposed above the position where the wafer is provided with the wafer, the contact structure can correspond to the side of the pressing wafer opposite to the wafer carrying device.
本發明實施例也公開一種晶片抵壓裝置套件,其包含:一晶片抵壓裝置及多個抵壓單元。晶片抵壓裝置用以固定設置於一晶片承載裝置上,以抵壓設置於晶片承載裝置上的一晶片,晶片抵壓裝置包含:一本體及一卡合組件。本體的一側設置有至少一第一連接組件。卡合組件設置於本體,卡合組件能被操作而與晶片承載裝置相互卡合,各個抵壓單元可拆卸地設置於本體,且各個抵壓單元設置有一第二連接組件,各個第二連接組件可拆卸地與第一連接組件相連接;各個抵壓單元還具有一接觸結構,且多個抵壓單元分別具有不同外型的接觸結構;其中,當各個抵壓單元的第二連接組件與第一連接組件相互連接時,各個抵壓單元則固定設置於本體。其中,任一抵壓單元的卡合組件與晶片承載裝置相互卡合,而晶片抵壓裝置固定設置於晶片承載裝置設置有晶片的位置上方時,抵壓單元的接觸結構能對應抵壓晶片相反於晶片承載裝置的一側。The embodiment of the invention also discloses a chip pressing device kit, which comprises: a chip pressing device and a plurality of pressing units. The chip pressing device is used for fixing on a chip carrying device to press a chip arranged on the chip carrying device. The chip pressing device comprises: a body and a clamping component. At least one first connection component is provided on one side of the body. The engaging component is disposed on the body, and the engaging component can be operated to be engaged with the wafer carrying device. Each pressing unit is detachably disposed on the body, and each pressing unit is provided with a second connecting component, and each second connecting component Detachably connected with the first connection component; each pressing unit also has a contact structure, and the plurality of pressing units have different appearance contact structures; wherein, when the second connection component of each pressing unit is connected to the first When a connecting component is connected to each other, each pressing unit is fixedly disposed on the body. Wherein, the clamping component of any pressing unit and the wafer carrier are engaged with each other, and when the wafer pressing device is fixedly disposed above the position where the wafer is mounted on the wafer carrier, the contact structure of the pressing unit can correspond to the opposite of pressing the wafer On one side of the wafer carrier.
綜上所述,本發明的晶片抵壓裝置及晶片抵壓裝置套件由於抵壓單元可以依據需求更換,因此,可以降低電連接座生產廠商的生產成本,且亦可降低晶片研發人員的研發成本。In summary, the chip pressing device and the chip pressing device kit of the present invention can be replaced according to demand, so the production cost of the electrical connector manufacturer can be reduced, and the research and development cost of the chip R&D personnel can also be reduced .
為能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,但是此等說明與附圖僅用來說明本發明,而非對本發明的保護範圍作任何的限制。In order to understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, not to make any protection to the scope of the present invention. limit.
於以下說明中,如有記載請參閱特定圖式或是如特定圖式所示,其僅是用以強調於後續說明中,所述及的相關內容大部份出現於該特定圖式中,但不限制該後續說明中僅可參考所述特定圖式。In the following description, if there is a record, please refer to the specific drawing or as shown in the specific drawing, which is only used to emphasize in the subsequent description, most of the related content mentioned in the specific drawing, However, it does not limit that only specific patterns can be referred to in the subsequent description.
請一併參閱圖1至圖6,圖1及圖2顯示為本發明的晶片抵壓裝置的組裝示意圖;圖3顯示為本發明的晶片抵壓裝置的抵壓單元與本體相互分離的示意圖;圖4顯示為本發明的晶片抵壓裝置固定設置於晶片承載裝置上的示意圖;圖5及圖6為本發明的晶片抵壓裝置的分解示意圖。如圖所示,晶片抵壓裝置1包含一本體10、一抵壓單元20及一卡合組件30。Please refer to FIGS. 1 to 6 together. FIGS. 1 and 2 show schematic assembly diagrams of the wafer pressing device of the present invention; FIG. 3 shows a schematic diagram of the separation of the pressing unit and the body of the wafer pressing device of the present invention; 4 is a schematic view of the wafer pressing device of the present invention fixedly mounted on the wafer carrier; FIGS. 5 and 6 are exploded schematic views of the wafer pressing device of the present invention. As shown in the figure, the wafer pressing
如圖1至圖3所示,本體10的一側設置有至少一第一連接組件11。抵壓單元20設置有一第二連接組件21,且抵壓單元20可拆卸地設置於本體10設置有第一連接組件11的一側。第二連接組件21能與第一連接組件11相連接,而抵壓單元20能透過第二連接組件21與第一連接組件11相連接,據以固定於本體10的一側。抵壓單元20具有一接觸結構201,用以抵壓設置於晶片承載裝置A上的晶片B。卡合組件30設置於本體10。卡合組件30能被操作,而使晶片抵壓裝置1與晶片承載裝置A相互卡合或相互分離,亦即本體10可以是透過卡合組件30,以固定設置於晶片承載裝置A設置有晶片B的位置的上方。As shown in FIGS. 1 to 3, at least one first connecting
如圖4所示,當抵壓單元20固定設置於本體10的一側,且本體10透過卡合組件30固定於晶片承載裝置A的上方時,抵壓單元20的接觸結構201將對應抵壓晶片B相反於晶片承載裝置A的一側;此時,相關人員即可通過晶片承載裝置A對晶片B進行相關檢測作業。在實際應用中,晶片承載裝置A可以是各式用來與晶片B連接的電連接座(socket),而晶片B的形式亦可依據需求變化。As shown in FIG. 4, when the
依上所述,以下將舉出一個實際例子,以詳細說明上述本體10、第一連接組件11、抵壓單元20、第二連接組件21及卡合組件30可能的具體實施方式。如圖6所示,本體10的一側可以是內凹形成有一卡合槽12。上述第一連接組件11可以是包含有四個第一磁吸構件111,而多個第一磁吸構件111設置於本體10,且多個第一磁吸構件111對應位於卡合槽12中。Based on the above, a practical example will be given below to explain in detail the possible specific implementations of the
如圖2至圖6所示,抵壓單元20可以是具有一卡合結構202,卡合結構202的一側向外凸出形成有接觸結構201。卡合結構202的外型對應於卡合槽12的外型,而卡合結構202能對應卡合設置於卡合槽12中;當卡合結構202固定設置於卡合槽12中時,接觸結構201將對應露出於本體10的一側。As shown in FIGS. 2 to 6, the
第二連接組件21可以是包含有四個第二磁吸構件211,各個第二磁吸構件211能與各個第一磁吸構件111相互吸引,舉例來說,各個第一磁吸構件111及各個第二磁吸構件211可以為相異極性的磁鐵,或者,第一磁吸構件111及第二磁吸構件211的其中一者為磁鐵,另一者則為可被磁鐵吸附的構件。當卡合結構202卡合固定設置於卡合槽12中時,各個第一磁吸構件111將與各個第二磁吸構件211相互吸引,而抵壓單元20將對應固定設置於本體10的一側。The
關於第一磁吸構件111及第二磁吸構件211的外型、尺寸、數量等可依據需求變化,不以圖中所示為限。關於第一連接組件11及第二連接組件21相互連接的方式,不以上述磁吸的方式為限,只要第一連接組件11及第二連接組件21能相互連接而相互固定,且第一連接組件11及第二連接組件21能被人工手動的方式直接分離,皆屬於本實施例所涵蓋的範圍。舉例來說,第一連接組件11可以是不具有上述第一磁吸構件111,第二連接組件21可以是不具有上述第二磁吸構件211,而第一連接組件11及第二連接組件21即分別為卡合槽12與卡合結構202,亦即,第一連接組件11及第二連接組件21也可以是直接透過相互卡合的方式來連接。The shape, size, number, etc. of the first
依上所述,由於抵壓單元20可以被輕易地從本體10上拆卸下來,因此,使用者可以是依據其所欲抵壓的晶片B外型、尺寸的不同,而更換具有相對應外型、尺寸的接觸結構201的抵壓單元20。具體來說,在兩個尺寸不同個晶片B分別設置於兩個尺寸相同的晶片承載裝置A上的情況,使用者可以是簡單地透過更換不同的抵壓單元20,即可使本體10透過卡合組件30先後與相同尺寸的晶片承載裝置A相互卡合,而可先後利用不同的抵壓單元20抵壓不同尺寸的晶片B。As mentioned above, since the
如圖3、圖5及圖6所示,值得一提的是,在實際應用中,本體10還可以是具有一第一防呆結構13,抵壓單元20還具有一第二防呆結構22。當第一連接組件11與第二連接組件21相互連接,而抵壓單元20固定於本體10時,第一防呆結構13將與第二防呆結構22相互固定。具體來說,本體10鄰近於卡合槽12的位置可以是內凹形成有一凹槽,凹槽與卡合槽12相連通,而凹槽即可作為第一防呆結構13。第二防呆結構22則可以是由卡合結構202相外延伸形成的凸出結構。如此,使用者在將卡合結構202固定於卡合槽12時,使用者必需使第二防呆結構22與第一防呆結構13相對應,才可使卡合結構202順利地卡合設置於卡合槽12中,從而可避免發生使用者不正確地安裝抵壓單元20,而導致接觸結構201不正確地抵壓晶片B的問題。當然,第一防呆結構13及第二防呆結構22的外型及其設置位置可以是依據需求變化,圖中所示僅為其中一示範態樣。As shown in FIGS. 3, 5 and 6, it is worth mentioning that, in practical applications, the
如圖4至圖6所示,本體10彼此相反的兩側壁可以是分別內凹形成有一操作槽14。卡合組件30可以是包含兩個卡扣件31及兩個彈性件32。各個卡扣件31可以是設置有一樞接軸33而樞接於本體10的樞接孔15。兩個卡扣件31可以是對應位於兩個操作槽14中。各個卡扣件31的一端及晶片承載裝置A可以是分別具有能彼此相互卡合的一扣合結構311、A1。兩個彈性件32對應設置於兩個卡扣件31與本體10之間。各個彈性件32的一端固定於本體10,彈性件32的另一端則是固定於卡扣件31。關於各個彈性件32的兩端分別與卡扣件31及本體10相固定的方式,例如可以是圖中所示於卡扣件31及本體10分別形成有相對應嵌槽,而彈性件32的各端是對應卡合設置於嵌槽中,但不以此為限。As shown in FIGS. 4 to 6, two opposite side walls of the
如圖7所示,各個卡扣件31被操作而相對於本體10旋轉時,位於各個卡扣件31及本體10之間的各個彈性件32將被擠壓而對應產生彈性回復力,使用者在圖7的狀態,將可使兩個卡扣件31夾持於晶片承載裝置A。如圖4所示,當卡扣件31的扣合結構311對應與晶片承載裝置A的扣合結構A1相互卡合時,各個彈性件32所產生的彈性回復力可以是使各卡扣件31的扣合結構311,更穩固地夾持晶片承載裝置A的扣合結構A1。As shown in FIG. 7, when each
於本實施例中是以卡合組件30具有兩個卡扣件31,而本體10透過兩個卡扣件31以夾持晶片承載裝置A,據以固定設置於晶片承載裝置A的上方為例,但卡合組件30所包含的構件不以此為限。卡合組件30只要可以使本體10可拆卸地固定於晶片承載裝置A,卡合組件30可以是任何結構或是可以是包含有任何構件。In this embodiment, the
值得一提的是,在不同的應用中,晶片抵壓裝置1還可以是包含有一樞接組件(圖未示),樞接組件固定設置於本體10,而晶片抵壓裝置1的樞接組件能與晶片承載裝置A上相對應的樞接組件(圖未示)相互樞接,藉此,晶片抵壓裝置1能被操作而相對於晶片承載裝置A旋轉。當使用者操作晶片抵壓裝置1,而使晶片抵壓裝置1向晶片承載裝置A旋轉,並據以使晶片抵壓裝置1位於晶片承載裝置A的正上方時,使用者可以再利用卡合組件30,而使晶片抵壓裝置1與晶片承載裝置A相互卡合,據以使晶片抵壓裝置1固定設置於晶片承載裝置A的正上方。It is worth mentioning that in different applications, the chip
請參閱圖8,其顯示為本發明的晶片抵壓裝置套件2的分解示意圖。如圖所示,晶片抵壓裝置套件2包含有一晶片抵壓裝置1及多個抵壓單元20A、20B。晶片抵壓裝置1包含有一本體10及一卡合組件30。本體10設置有一第一連接組件11。各個抵壓單元20A(20B)具有一卡合結構202、一接觸結構201及一第二連接組件21。關於本體10、卡合組件30、各個抵壓單元20的第一連接組件11、卡合結構202、接觸結構201及第二連接組件21的詳細說明,請參閱前述說明,於此不再贅述。Please refer to FIG. 8, which is an exploded view of the chip
綜上所述,本發明的晶片抵壓裝置1及晶片抵壓裝置套件2,可以讓使用者依據不同的晶片B的尺寸,而對應更換具有不同接觸結構201的抵壓單元20,藉此,使用者可以利用相同的本體10及不同的抵壓單元20,來抵壓設置於相同尺寸的晶片承載裝置上但具有不同尺寸的晶片B,而使用者不需要購買兩組晶片抵壓裝置1,進而可降低相關研發人員的研發成本。相對地,對於晶片抵壓裝置1的生產廠商而言,針對同一尺寸的晶片承載裝置A,生產廠商可以是僅開發生產不同的抵壓單元20,無需重新設計整個晶片抵壓裝置1,從而可降低其生產成本及研發費用。In summary, the wafer
以上所述僅為本發明的較佳可行實施例,非因此侷限本發明的專利範圍,故舉凡運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的保護範圍內。The above are only the preferred and feasible embodiments of the present invention, and do not limit the patent scope of the present invention. Therefore, equivalent technical changes made by using the description and drawings of the present invention are included in the protection scope of the present invention. .
1‧‧‧晶片抵壓裝置
2‧‧‧晶片抵壓裝置套件
10‧‧‧本體
11‧‧‧第一連接組件
111‧‧‧第一磁吸構件
12‧‧‧卡合槽
13‧‧‧第一防呆結構
14‧‧‧操作槽
15‧‧‧樞接孔
20、20A、20B‧‧‧抵壓單元
201‧‧‧接觸結構
202‧‧‧卡合結構
21‧‧‧第二連接組件
211‧‧‧第二磁吸構件
22‧‧‧第二防呆結構
30‧‧‧卡合組件
31‧‧‧卡扣件
311‧‧‧扣合結構
32‧‧‧彈性件
33‧‧‧樞接軸
A‧‧‧晶片承載裝置
A1‧‧‧扣合結構
B‧‧‧晶片1‧‧‧
圖1為本發明的晶片抵壓裝置的組裝示意圖。FIG. 1 is an assembly diagram of a wafer pressing device of the present invention.
圖2為本發明的晶片抵壓裝置的另一視角的組裝示意圖。2 is an assembly diagram of the wafer pressing device of the present invention from another perspective.
圖3為本發明的晶片抵壓裝置的抵壓單元與本體的分解示意圖。3 is an exploded schematic view of the pressing unit and the body of the wafer pressing device of the present invention.
圖4為本發明的晶片抵壓裝置固定設置於晶片承載裝置的上的側視示意圖。4 is a schematic side view of the wafer pressing device of the present invention fixedly disposed on the wafer carrier.
圖5為本發明的晶片抵壓裝置的分解示意圖。FIG. 5 is an exploded schematic view of the wafer pressing device of the present invention.
圖6為本發明的晶片抵壓裝置的另一視角的分解示意圖。6 is an exploded schematic view of the wafer pressing device of the present invention from another perspective.
圖7為本發明的晶片抵壓裝置的作動側視示意圖。7 is a schematic side view of the operation of the wafer pressing device of the present invention.
圖8為本發明的晶片抵壓裝置套件的分解示意圖。FIG. 8 is an exploded schematic view of the wafer pressing device kit of the present invention.
1‧‧‧晶片抵壓裝置 1‧‧‧chip pressure device
10‧‧‧本體 10‧‧‧Body
11‧‧‧第一連接組件 11‧‧‧The first connection assembly
111‧‧‧第一磁吸構件 111‧‧‧The first magnetic member
12‧‧‧卡合槽 12‧‧‧Snap slot
13‧‧‧第一防呆結構 13‧‧‧The first foolproof structure
20‧‧‧抵壓單元 20‧‧‧Pressure unit
201‧‧‧接觸結構 201‧‧‧Contact structure
202‧‧‧卡合結構 202‧‧‧Snap-in structure
21‧‧‧第二連接組件 21‧‧‧Second connection assembly
211‧‧‧第二磁吸構件 211‧‧‧Second magnetic member
22‧‧‧第二防呆結構 22‧‧‧The second foolproof structure
30‧‧‧卡合組件 30‧‧‧Snap-in components
31‧‧‧卡扣件 31‧‧‧Snap fastener
311‧‧‧扣合結構 311‧‧‧buckle structure
Claims (10)
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TW108111255A TWI685043B (en) | 2019-03-29 | 2019-03-29 | Chip pressing device |
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Application Number | Priority Date | Filing Date | Title |
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TW108111255A TWI685043B (en) | 2019-03-29 | 2019-03-29 | Chip pressing device |
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Publication Number | Publication Date |
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TWI685043B true TWI685043B (en) | 2020-02-11 |
TW202036742A TW202036742A (en) | 2020-10-01 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI809938B (en) * | 2022-06-17 | 2023-07-21 | 吳俊杰 | Chip pressing device |
Citations (4)
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US20050245119A1 (en) * | 2004-04-30 | 2005-11-03 | Tsai Chou H | Chip connector that can be in sliding contact with a chip |
TWM423838U (en) * | 2011-11-08 | 2012-03-01 | Chip Guard Co Ltd | Inspection apparatus for integrated circuit chip |
EP3101400A1 (en) * | 2014-01-30 | 2016-12-07 | Hitachi Automotive Systems, Ltd. | Mechanical quantity measuring device and sensor unit |
TWM549875U (en) * | 2017-05-26 | 2017-10-01 | Kita Sensor Tech Co Ltd | Sensor and sensing device comprising the same |
-
2019
- 2019-03-29 TW TW108111255A patent/TWI685043B/en active
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050245119A1 (en) * | 2004-04-30 | 2005-11-03 | Tsai Chou H | Chip connector that can be in sliding contact with a chip |
TWM423838U (en) * | 2011-11-08 | 2012-03-01 | Chip Guard Co Ltd | Inspection apparatus for integrated circuit chip |
EP3101400A1 (en) * | 2014-01-30 | 2016-12-07 | Hitachi Automotive Systems, Ltd. | Mechanical quantity measuring device and sensor unit |
TWM549875U (en) * | 2017-05-26 | 2017-10-01 | Kita Sensor Tech Co Ltd | Sensor and sensing device comprising the same |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI809938B (en) * | 2022-06-17 | 2023-07-21 | 吳俊杰 | Chip pressing device |
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