TWI662459B - Touch panel - Google Patents
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- TWI662459B TWI662459B TW107123379A TW107123379A TWI662459B TW I662459 B TWI662459 B TW I662459B TW 107123379 A TW107123379 A TW 107123379A TW 107123379 A TW107123379 A TW 107123379A TW I662459 B TWI662459 B TW I662459B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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Abstract
一種觸控面板,包括基板、多個電極組、多個第一接墊以及第二接墊。基板具有多個圖標區域和引腳接合區域。多個電極組分別位於多個圖標區域內,其中各電極組包括結構上彼此分離的第一電極及第二電極,多個電極組的第一電極彼此結構上相分離,且多個電極組的第二電極彼此結構上相分離。多個第一接墊位於引腳接合區域內,且分別與多個電極組的第一電極電性連接。第二接墊位於引腳接合區域內,且與多個電極組的第二電極電性連接。A touch panel includes a substrate, a plurality of electrode groups, a plurality of first pads, and a second pad. The substrate has a plurality of icon areas and pin bonding areas. A plurality of electrode groups are respectively located in a plurality of icon areas, wherein each electrode group includes a first electrode and a second electrode that are structurally separated from each other, the first electrodes of the plurality of electrode groups are structurally separated from each other, and The second electrodes are structurally separated from each other. The plurality of first pads are located in the pin bonding area and are electrically connected to the first electrodes of the plurality of electrode groups, respectively. The second pad is located in the pin bonding area and is electrically connected to the second electrodes of the plurality of electrode groups.
Description
本發明是有關於一種感測面板,且特別是有關於一種觸控面板。The invention relates to a sensing panel, and in particular to a touch panel.
為了有效率地製作觸控面板,在現行陣列製程(array process)中通常會先在同一片大片的基板上進行多個陣列觸控元件的製作,並適時地於陣列製程中直接在大片基板上對每一陣列觸控元件作迴路測試後,才經由切割製程以得到各個觸控面板。目前,為了提供固定的按鍵功能,觸控面板中往往會配置有圖標觸控元件。然而,現有的線路布局卻無法使圖標觸控元件在陣列製程階段即在大片基板上進行迴路測試。In order to efficiently produce a touch panel, in the current array process, multiple array touch elements are usually produced on the same large substrate first, and directly on the large substrate in the array process in a timely manner. After a loop test is performed on each array touch element, each touch panel is obtained through a cutting process. At present, in order to provide a fixed key function, an icon touch element is often configured in a touch panel. However, the existing circuit layout cannot enable the icon touch element to perform a loop test on a large substrate during the array process stage.
本發明提供一種觸控面板,其可在切割製程之前於大片基板上對圖標區域內的電極進行阻抗電性測試。The invention provides a touch panel, which can perform impedance electrical test on electrodes in an icon area on a large substrate before the cutting process.
本發明的觸控面板包括基板、多個電極組、多個第一接墊及一第二接墊。基板具有多個圖標區域和引腳接合區域。多個電極組分別位於多個圖標區域內,其中各電極組包括結構上彼此分離的第一電極及第二電極,多個電極組的第一電極彼此結構上相分離,且多個電極組的第二電極彼此結構上相分離。多個第一接墊位於引腳接合區域內,且分別與多個電極組的第一電極電性連接。第二接墊位於引腳接合區域內,且與多個電極組的第二電極電性連接。The touch panel of the present invention includes a substrate, a plurality of electrode groups, a plurality of first pads, and a second pad. The substrate has a plurality of icon areas and pin bonding areas. A plurality of electrode groups are respectively located in a plurality of icon areas, wherein each electrode group includes a first electrode and a second electrode that are structurally separated from each other, the first electrodes of the plurality of electrode groups are structurally separated from each other, and The second electrodes are structurally separated from each other. The plurality of first pads are located in the pin bonding area and are electrically connected to the first electrodes of the plurality of electrode groups, respectively. The second pad is located in the pin bonding area and is electrically connected to the second electrodes of the plurality of electrode groups.
基於上述,本發明的觸控面板透過分別位於多個圖標區域內的多個電極組各自包括結構上彼此分離的第一電極及第二電極,多個電極組中的第一電極彼此結構上相分離,多個電極組中的第一電極分別與多個第一接墊電性連接,多個電極組中的第二電極彼此結構上相分離,且多個電極組中的第二電極電性連接於第二接墊,使得觸控面板可在切割製程之前於大片基板上經由多個第一接墊及第二接墊對圖標區域內的第一電極及第二電極進行阻抗電性測試。Based on the above, the touch panel of the present invention includes a first electrode and a second electrode that are structurally separated from each other through a plurality of electrode groups respectively located in a plurality of icon areas, and the first electrodes in the plurality of electrode groups are structurally opposite to each other. Separated, the first electrodes in the plurality of electrode groups are electrically connected to the plurality of first pads, the second electrodes in the plurality of electrode groups are structurally separated from each other, and the second electrodes in the plurality of electrode groups are electrically connected Connected to the second pad, so that the touch panel can perform impedance electrical test on the first electrode and the second electrode in the icon area on the large substrate through a plurality of first pads and second pads before the cutting process.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施方式,並配合所附圖式作詳細說明如下。In order to make the above features and advantages of the present invention more comprehensible, embodiments are hereinafter described in detail with reference to the accompanying drawings.
在附圖中,為了清楚起見,放大了層、膜、面板、區域等的厚度。在整個說明書中,相同的附圖標記表示相同的元件。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件「上」或「連接到」另一元件時,其可以直接在另一元件上或與另一元件連接,或者中間元件可以也存在。相反,當元件被稱為「直接在另一元件上」或「直接連接到」另一元件時,不存在中間元件。如本文所使用的,「連接」可以指物理及/或電性連接。再者,「電性連接」可為二元件間存在其它元件。In the drawings, the thicknesses of layers, films, panels, regions, etc. are exaggerated for clarity. Throughout the description, the same reference numerals denote the same elements. It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element, or Intermediate elements may also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements present. As used herein, "connected" may refer to a physical and / or electrical connection. Furthermore, "electrically connected" may mean that there are other components between the two components.
圖1是依照本發明的一實施方式的觸控面板的上視示意圖。圖2是圖1中的區域k的放大圖。圖3是圖2中的剖線I-I’及剖線II-II’的剖面示意圖。FIG. 1 is a schematic top view of a touch panel according to an embodiment of the present invention. FIG. 2 is an enlarged view of a region k in FIG. 1. Fig. 3 is a schematic cross-sectional view taken along the line I-I 'and the line II-II' in Fig. 2.
請同時參照圖1、圖2及圖3,觸控面板10可包括基板100、多個電極組110、多個第一接墊120及第二接墊122。在本實施方式中,觸控面板10可選擇性地更包括多個第一檢測墊130、多個第二檢測墊132、多條第一訊號線140以及第二訊號線142。另外,在本實施方式中,觸控面板10可與顯示面板搭配使用而應用於觸控顯示裝置,其中顯示面板可為液晶顯示面板、有機發光顯示面板、電子紙顯示面板、電泳顯示面板、電濕潤顯示面板、雙穩態型顯示面板、電漿顯示面板或所屬技術領域中具有通常知識者所周知的任何種類的顯示面板,且觸控顯示裝置可為整合式(on-cell)觸控顯示裝置、外貼式(out-cell)觸控顯示裝置或內嵌式(in-cell)觸控顯示裝置。Please refer to FIGS. 1, 2 and 3 at the same time. The touch panel 10 may include a substrate 100, a plurality of electrode groups 110, a plurality of first pads 120 and a second pad 122. In this embodiment, the touch panel 10 may optionally further include a plurality of first detection pads 130, a plurality of second detection pads 132, a plurality of first signal lines 140 and a second signal line 142. In addition, in this embodiment, the touch panel 10 can be used in conjunction with a display panel to be applied to a touch display device. The display panel can be a liquid crystal display panel, an organic light emitting display panel, an electronic paper display panel, an electrophoretic display panel, Wet display panel, bistable display panel, plasma display panel or any kind of display panel known to those skilled in the art, and the touch display device can be an on-cell touch display Device, out-cell touch display device or in-cell touch display device.
在本實施方式中,基板100可具有主動區域A、多個圖標區域B和引腳接合區域C。在本實施方式中,多個圖標區域B配置為鄰近主動區域A的側邊A1,而引腳接合區域C配置為鄰近主動區域A的側邊A2,但本發明並不限於此。在另一實施方式中,多個圖標區域B也可以配置為鄰近於主動區域A的側邊A3及側邊A4。在又一實施方式中,多個圖標區域B與引腳接合區域C可配置為鄰近於主動區域A的同一側邊。值得一提的是,當觸控面板10應用於觸控顯示裝置時,基板100的主動區域A會與顯示面板的顯示區域相重疊,而基板100的多個圖標區域B和引腳接合區域C會與顯示面板之位於顯示區域周圍的周邊區域相重疊。In this embodiment, the substrate 100 may have an active area A, a plurality of icon areas B, and a pin bonding area C. In this embodiment, the plurality of icon regions B are disposed adjacent to the side A1 of the active region A, and the pin bonding region C is disposed adjacent to the side A2 of the active region A, but the present invention is not limited thereto. In another embodiment, the plurality of icon regions B may be configured to be adjacent to the side A3 and the side A4 of the active region A. In another embodiment, the multiple icon areas B and the pin bonding areas C may be configured to be adjacent to the same side of the active area A. It is worth mentioning that when the touch panel 10 is applied to a touch display device, the active area A of the substrate 100 overlaps the display area of the display panel, and the multiple icon areas B and the pin bonding areas C of the substrate 100 It will overlap with the surrounding area of the display panel around the display area.
在本實施方式中,基板100的材質例如是玻璃、石英、有機聚合物、金屬或其它合適的材料。另外,在本實施方式中,圖標區域B的數量為兩個,但本發明並不限制圖標區域B的數量,其可視需求調整與變化。In this embodiment, the material of the substrate 100 is, for example, glass, quartz, organic polymer, metal, or other suitable materials. In addition, in this embodiment, the number of the icon areas B is two, but the present invention does not limit the number of the icon areas B, and it can be adjusted and changed as required.
在本實施方式中,多個電極組110分別位於多個圖標區域B內。也就是說,在本實施方式中,多個電極組110中的任一者是以一對一的關係配置於多個圖標區域B中的一者內。在本實施方式中,每一電極組110包括結構上彼此分離的第一電極112及第二電極114。如圖1及圖2所示,在每一電極組110中,第一電極112圍繞第二電極114,且於本實施方式中,第一電極112的面積大於第二電極114的面積。然而,本發明並不限制第一電極112與第二電極114的外型輪廓及配置方式,只要每一電極組110中的第一電極112與第二電極114結構上彼此分離即可。另外,如圖1及圖2所示,多個電極組110中的多個第一電極112彼此之間結構上相分離,且多個第二電極114彼此之間結構上相分離。也就是說,在本實施方式中,多個圖標區域B彼此之間不相重疊。In this embodiment, the plurality of electrode groups 110 are located in the plurality of icon regions B, respectively. That is, in the present embodiment, any one of the plurality of electrode groups 110 is arranged in one of the plurality of icon regions B in a one-to-one relationship. In this embodiment, each electrode group 110 includes a first electrode 112 and a second electrode 114 that are structurally separated from each other. As shown in FIGS. 1 and 2, in each electrode group 110, the first electrode 112 surrounds the second electrode 114. In this embodiment, the area of the first electrode 112 is larger than the area of the second electrode 114. However, the present invention does not limit the outline and configuration of the first electrode 112 and the second electrode 114 as long as the first electrode 112 and the second electrode 114 in each electrode group 110 are structurally separated from each other. In addition, as shown in FIGS. 1 and 2, the plurality of first electrodes 112 in the plurality of electrode groups 110 are structurally separated from each other, and the plurality of second electrodes 114 are structurally separated from each other. That is, in the present embodiment, the plurality of icon regions B do not overlap each other.
另外,在本實施方式中,每一電極組110中的第一電極112以及第二電極114屬於同一膜層,如圖2及圖3所示。也就是說,在本實施方式中,第一電極112與第二電極114可具有實質上相同的材質,以及第一電極112與第二電極114可在同一道光罩製程(photolithography and etching process,PEP)中形成。在本實施方式中,第一電極112以及第二電極114的材質可包括金屬氧化物導電材料,例如銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物、其它合適的氧化物、或者是上述至少二者之堆疊層。In addition, in this embodiment, the first electrode 112 and the second electrode 114 in each electrode group 110 belong to the same film layer, as shown in FIGS. 2 and 3. That is, in this embodiment, the first electrode 112 and the second electrode 114 may have substantially the same material, and the first electrode 112 and the second electrode 114 may be processed in the same photolithography and etching process (PEP). ). In this embodiment, the material of the first electrode 112 and the second electrode 114 may include a metal oxide conductive material, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, and indium gallium zinc oxide. Materials, other suitable oxides, or a stacked layer of at least two of the foregoing.
在本實施方式中,多個第一接墊120與第二接墊122位於引腳接合區域C內。在本實施方式中,多個第一接墊120與第二接墊122可用於使觸控面板10電性連接至外部電路。所述外部電路例如是驅動晶片、控制電路、軟性印刷電路(flexible printed circuit,FPC)或配置有驅動晶片的印刷電路板(printed circuit board,PCB)等。在本實施方式中,多個第一接墊120以及第二接墊122的材質可包括金屬或其他導電材料的組合,所述金屬例如是金、銀、銅或其它合適的導電金屬,所述其他導電材料例如是氧化銦錫、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物、或其它合適的導電材料。In this embodiment, the plurality of first pads 120 and the second pads 122 are located in the pin bonding area C. In this embodiment, the plurality of first pads 120 and the second pads 122 may be used to electrically connect the touch panel 10 to an external circuit. The external circuit is, for example, a driving chip, a control circuit, a flexible printed circuit (FPC), or a printed circuit board (PCB) configured with the driving chip. In this embodiment, the material of the plurality of first pads 120 and the second pads 122 may include a metal or a combination of other conductive materials, such as gold, silver, copper, or other suitable conductive metals. Other conductive materials are, for example, indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide, or other suitable conductive materials.
在本實施方式中,多個第一檢測墊130分別與多個電極組110的第一電極112電性連接。詳細而言,在本實施方式中,多個第一檢測墊130中的任一者是以一對一的關係於結構上直接連接於多個第一電極112中的一者,如圖1及圖2所示。然而,本發明並不限於此。在其他實施方式中,多個第一檢測墊130中的任一者也可以透過連接線以一對一的關係電性連接於多個第一電極112中的一者,亦即多個第一檢測墊130於結構上不直接連接於多個第一電極112。另一方面,在本實施方式中,電極組110中的第一電極112、電極組110中的第二電極114及第一檢測墊130屬於同一膜層,如圖2及圖3所示。也就是說,在本實施方式中,第一電極112、第二電極114與第一檢測墊130可具有實質上相同的材質,以及第一電極112、第二電極114與第一檢測墊130可在同一道光罩製程中形成。在本實施方式中,第一檢測墊130的材質可包括金屬氧化物導電材料,例如銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物、其它合適的氧化物、或者是上述至少二者之堆疊層。In this embodiment, the plurality of first detection pads 130 are electrically connected to the first electrodes 112 of the plurality of electrode groups 110, respectively. In detail, in the present embodiment, any one of the plurality of first detection pads 130 is directly connected to one of the plurality of first electrodes 112 structurally in a one-to-one relationship, as shown in FIGS. 1 and 1. Shown in Figure 2. However, the present invention is not limited to this. In other embodiments, any one of the plurality of first detection pads 130 may also be electrically connected to one of the plurality of first electrodes 112 in a one-to-one relationship through the connection line, that is, the plurality of first The detection pad 130 is not directly connected to the plurality of first electrodes 112 in structure. On the other hand, in this embodiment, the first electrode 112 in the electrode group 110, the second electrode 114 in the electrode group 110, and the first detection pad 130 belong to the same film layer, as shown in FIGS. 2 and 3. That is, in this embodiment, the first electrode 112, the second electrode 114, and the first detection pad 130 may have substantially the same material, and the first electrode 112, the second electrode 114, and the first detection pad 130 may have substantially the same material. Formed in the same mask process. In this embodiment, the material of the first detection pad 130 may include a metal oxide conductive material, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide, or other suitable materials. Oxide, or a stacked layer of at least two of the foregoing.
在本實施方式中,每一第一檢測墊130具有位於第一檢測墊130之輪廓範圍內的第一檢測區域130R。在本實施方式中,第一檢測區域130R為具有邊長a1及邊長b1的矩形,其中邊長a1與邊長b1皆大於或等於50微米。透過邊長a1與邊長b1皆大於或等於50微米,使得第一檢測墊130可用以與探針(probe)直接接觸,以利阻抗電性測試進行。另外,如圖2所示,在本實施方式中,第一檢測區域130R的輪廓範圍與第一檢測墊130的輪廓範圍相同,但本發明並不限於此,只要第一檢測區域130R位於第一檢測墊130的輪廓範圍內即可。也就是說,本發明並不限制第一檢測墊130的外型輪廓為矩形,在其他實施方式中,第一檢測墊130的外型輪廓也可以是圓形或不規則(或稱為異形)形狀。In this embodiment, each of the first detection pads 130 has a first detection area 130R located within a contour range of the first detection pad 130. In this embodiment, the first detection region 130R is a rectangle having a side length a1 and a side length b1, where the side length a1 and the side length b1 are both greater than or equal to 50 microns. Both the side length a1 and the side length b1 are greater than or equal to 50 micrometers, so that the first detection pad 130 can be used to directly contact the probe, so as to facilitate the impedance electrical test. In addition, as shown in FIG. 2, in this embodiment, the contour range of the first detection region 130R is the same as the contour range of the first detection pad 130, but the present invention is not limited thereto, as long as the first detection region 130R is located at the first The detection pad 130 may be within the contour range. That is, the present invention does not limit the outer contour of the first detection pad 130 to be rectangular. In other embodiments, the outer contour of the first detection pad 130 may be circular or irregular (or referred to as a special shape). shape.
在本實施方式中,多個第二檢測墊132分別與多個電極組110的第二電極114電性連接。詳細而言,在本實施方式中,多個第二檢測墊132中的任一者是以一對一的關係透過連接線L電性連接於多個第二電極114中的一者,如圖1及圖2所示。然而,本發明並不限於此。在其他實施方式中,多個第二檢測墊132中的任一者也可以以一對一的關係於結構上直接連接於多個第一電極112中的一者。在本實施方式中,電極組110中的第一電極112、電極組110中的第二電極114及第二檢測墊132屬於同一膜層,如圖2及圖3所示。也就是說,在本實施方式中,第一電極112、第二電極114與第二檢測墊132可具有實質上相同的材質,以及第一電極112、第二電極114與第二檢測墊132可在同一道光罩製程中形成。另外,在本實施方式中,電極組110中的第一電極112、電極組110中的第二電極114、第二檢測墊132及連接線L屬於同一膜層,如圖2及圖3所示。也就是說,在本實施方式中,第一電極112、第二電極114、第二檢測墊132及連接線L可具有實質上相同的材質,以及第一電極112、第二電極114與第二檢測墊132可在同一道光罩製程中形成。In this embodiment, the plurality of second detection pads 132 are electrically connected to the second electrodes 114 of the plurality of electrode groups 110, respectively. In detail, in this embodiment, any one of the plurality of second detection pads 132 is electrically connected to one of the plurality of second electrodes 114 through the connection line L in a one-to-one relationship, as shown in FIG. 1 and Figure 2. However, the present invention is not limited to this. In other embodiments, any one of the plurality of second detection pads 132 may be directly connected to one of the plurality of first electrodes 112 structurally in a one-to-one relationship. In this embodiment, the first electrode 112 in the electrode group 110, the second electrode 114, and the second detection pad 132 in the electrode group 110 belong to the same film layer, as shown in FIGS. 2 and 3. That is, in this embodiment, the first electrode 112, the second electrode 114, and the second detection pad 132 may have substantially the same material, and the first electrode 112, the second electrode 114, and the second detection pad 132 may have substantially the same material. Formed in the same mask process. In addition, in this embodiment, the first electrode 112 in the electrode group 110, the second electrode 114, the second detection pad 132, and the connection line L in the electrode group 110 belong to the same film layer, as shown in FIG. 2 and FIG. 3 . That is, in this embodiment, the first electrode 112, the second electrode 114, the second detection pad 132, and the connection line L may have substantially the same material, and the first electrode 112, the second electrode 114, and the second electrode The detection pad 132 can be formed in the same mask process.
在本實施方式中,第二檢測墊132的材質可包括金屬氧化物導電材料,例如銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物、其它合適的氧化物、或者是上述至少二者之堆疊層。In this embodiment, the material of the second detection pad 132 may include a metal oxide conductive material, such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide, other suitable materials. Oxide, or a stacked layer of at least two of the foregoing.
在本實施方式中,至少一個第二檢測墊132具有位於第二檢測墊132之輪廓範圍內的第二檢測區域132R。在本實施方式中,第二檢測區域132R為具有邊長a2及邊長b2的矩形,其中邊長a2與邊長b2皆大於或等於50微米。透過邊長a2與邊長b2皆大於或等於50微米,使得第二檢測墊132可用以與探針直接接觸,以利阻抗電性測試進行。另外,如圖2所示,在本實施方式中,第二檢測區域132R的輪廓範圍與第二檢測墊132的輪廓範圍相同,但本發明並不限於此,只要第二檢測區域132R位於第二檢測墊132的輪廓範圍內即可。也就是說,本發明並不限制第二檢測墊132的外型輪廓為矩形,在其他實施方式中,第二檢測墊132的外型輪廓也可以是圓形或不規則(或稱為異形)形狀。In this embodiment, at least one second detection pad 132 has a second detection region 132R located within a contour range of the second detection pad 132. In this embodiment, the second detection region 132R is a rectangle having a side length a2 and a side length b2, where the side length a2 and the side length b2 are both greater than or equal to 50 microns. Both the side length a2 and the side length b2 are greater than or equal to 50 micrometers, so that the second detection pad 132 can be used to directly contact the probe for the electrical resistance test. In addition, as shown in FIG. 2, in this embodiment, the contour range of the second detection region 132R is the same as the contour range of the second detection pad 132, but the present invention is not limited thereto, as long as the second detection region 132R is located at the second The detection pad 132 may be within the contour range. That is to say, the present invention does not limit the outline of the second detection pad 132 to a rectangle. In other embodiments, the outline of the second detection pad 132 may be circular or irregular (or called a special shape). shape.
在本實施方式中,多條第一訊號線140分別電性連接多個電極組110的多個第一電極112與多個第一接墊120。也就是說,在本實施方式中,多個第一接墊120分別透過多條第一訊號線140與多個電極組110的多個第一電極112電性連接,但本發明並不限於此,只要多個第一接墊120分別與多個電極組110的多個第一電極112電性連接即可。從另一觀點而言,在本實施方式中,多個第一接墊120中的任一者是以一對一的關係電性連接於多個第一電極112中的一者。In this embodiment, the plurality of first signal lines 140 are respectively electrically connected to the plurality of first electrodes 112 and the plurality of first pads 120 of the plurality of electrode groups 110. That is, in this embodiment, the plurality of first pads 120 are electrically connected to the plurality of first electrodes 112 of the plurality of electrode groups 110 through the plurality of first signal lines 140 respectively, but the present invention is not limited thereto. As long as the plurality of first pads 120 are electrically connected to the plurality of first electrodes 112 of the plurality of electrode groups 110, respectively. From another perspective, in this embodiment, any one of the plurality of first pads 120 is electrically connected to one of the plurality of first electrodes 112 in a one-to-one relationship.
在本實施方式中,多條第一訊號線140的材質可包括金屬或其他導電材料的組合,所述金屬例如是金、銀、銅或其它合適的導電金屬,其他導電材料例如是氧化銦錫、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鍺鋅氧化物、或其它合適的導電材料。In this embodiment, the material of the plurality of first signal lines 140 may include a metal or a combination of other conductive materials, such as gold, silver, copper, or other suitable conductive metals, and other conductive materials such as indium tin oxide. , Indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium germanium zinc oxide, or other suitable conductive materials.
在本實施方式中,第二訊號線142電性連接多個電極組110的多個第二電極114與第二接墊122。也就是說,在本實施方式中,第二接墊122透過一條第二訊號線142而與多個第二電極114電性連接。詳細而言,在本實施方式中,第二訊號線142包括多個分支線段142A以及一個連接線段142B,其中多個分支線段142A分別連接於多個電極組110的多個第二電極114,而連接線段142B連接多個分支線段142A與第二接墊122。雖然圖1中繪示第二接墊122透過包括多個分支線段142A以及一個連接線段142B的第二訊號線142而與多個第二電極114電性連接,但本發明並不限於此,只要第二接墊122能與多個電極組110的多個第二電極114電性連接即可。In this embodiment, the second signal line 142 is electrically connected to the plurality of second electrodes 114 and the second pads 122 of the plurality of electrode groups 110. That is, in this embodiment, the second pad 122 is electrically connected to the plurality of second electrodes 114 through a second signal line 142. In detail, in this embodiment, the second signal line 142 includes a plurality of branch line segments 142A and a connection line segment 142B, wherein the plurality of branch line segments 142A are respectively connected to the plurality of second electrodes 114 of the plurality of electrode groups 110, and The connecting line segment 142B connects the plurality of branch line segments 142A and the second pad 122. Although FIG. 1 illustrates that the second pad 122 is electrically connected to the plurality of second electrodes 114 through the second signal line 142 including a plurality of branch line segments 142A and a connection line segment 142B, the present invention is not limited thereto, as long as The second pads 122 may be electrically connected to the plurality of second electrodes 114 of the plurality of electrode groups 110.
從另一觀點而言,在本實施方式中,一個第二接墊122電性連接於多個第二電極114,因此如前文所述,在多個第二電極114彼此之間結構上相分離的情況下,多個第二電極114係彼此電性連接。From another point of view, in this embodiment, one second pad 122 is electrically connected to the plurality of second electrodes 114. Therefore, as described above, the plurality of second electrodes 114 are structurally separated from each other. In this case, the plurality of second electrodes 114 are electrically connected to each other.
在本實施方式中,第二訊號線142的材質可包括金屬、或其他導電材料的組合,所述金屬例如是金、銀、銅或其它合適的導電金屬,其他導電材料例如是氧化銦錫、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物、或其它合適的導電材料。如前文所述,多個第一接墊120分別與多個第一電極112電性連接,第二接墊122與多個第二電極114電性連接,且多個第一接墊120與第二接墊122可用於使觸控面板10電性連接至外部電路,因此當使用者碰觸感測圖標區域B時,對應的第一電極112及第二電極114會產生觸控訊號,以執行所欲執行的觸控功能。In this embodiment, the material of the second signal line 142 may include a metal, or a combination of other conductive materials. The metal is, for example, gold, silver, copper, or other suitable conductive metals. The other conductive materials are, for example, indium tin oxide, Indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide, or other suitable conductive materials. As described above, the plurality of first pads 120 are electrically connected to the plurality of first electrodes 112, the second pad 122 is electrically connected to the plurality of second electrodes 114, and the plurality of first pads 120 are electrically connected to the first electrodes 120. The two pads 122 can be used to electrically connect the touch panel 10 to an external circuit. Therefore, when a user touches the sensing icon area B, the corresponding first electrode 112 and the second electrode 114 will generate a touch signal to execute The desired touch function.
值得說明的是,在本實施方式中,透過分別位於多個圖標區域B內的多個電極組110各自包括結構上彼此分離的第一電極112及第二電極114,多個電極組110中的多個第一電極112彼此結構上相分離,多個電極組110中的多個第一電極112分別與多個第一接墊120電性連接,多個電極組110中的多個第二電極114彼此電性連接,且多個電極組110中的多個第二電極114電性連接於第二接墊122,使得觸控面板10可在切割製程之前於大片基板上經由多個第一接墊120及第二接墊122對圖標區域B內的第一電極112及第二電極114進行阻抗電性測試。所述阻抗電性測試例如是開路測試或短路測試。It is worth noting that, in this embodiment, each of the plurality of electrode groups 110 includes a first electrode 112 and a second electrode 114 that are structurally separated from each other through the plurality of electrode groups 110 respectively located in the plurality of icon regions B. The plurality of first electrodes 112 are structurally separated from each other, the plurality of first electrodes 112 in the plurality of electrode groups 110 are electrically connected to the plurality of first pads 120 respectively, and the plurality of second electrodes in the plurality of electrode groups 110 114 are electrically connected to each other, and the plurality of second electrodes 114 in the plurality of electrode groups 110 are electrically connected to the second pad 122, so that the touch panel 10 can pass through a plurality of first connections on a large substrate before the cutting process. The pad 120 and the second pad 122 perform an impedance electrical test on the first electrode 112 and the second electrode 114 in the icon area B. The impedance electrical test is, for example, an open circuit test or a short circuit test.
另外,在本實施方式中,觸控面板10可選擇性地更包括分別與多個第一電極112電性連接的多個第一檢測墊130,及分別與多個第二電極114電性連接的多個第二檢測墊132,因此於大片基板上進行阻抗電性測試時,探針可接觸於多個第一檢測墊130中的一者與對應的第一接墊120,以對對應的第一電極112進行檢測,或者探針可接觸於多個第二檢測墊132中的一者與第二接墊122,以對彼此電性連接的第二電極114進行檢測,藉此可避免探針對第一電極112及第二電極114造成破壞。In addition, in this embodiment, the touch panel 10 may optionally further include a plurality of first detection pads 130 electrically connected to the plurality of first electrodes 112 and a plurality of second electrodes 114 respectively. The plurality of second detection pads 132 are provided. Therefore, when the impedance electrical test is performed on a large substrate, the probe can contact one of the plurality of first detection pads 130 and the corresponding first connection pad 120 to match the corresponding The first electrode 112 performs detection, or the probe may contact one of the plurality of second detection pads 132 and the second pad 122 to detect the second electrode 114 electrically connected to each other, thereby avoiding detection. Damage is caused to the first electrode 112 and the second electrode 114.
再者,在本實施方式中,觸控面板10可更包括分別與多個第二電極114電性連接的多個第二檢測墊132,但本發明並不限於此。由於第二電極114係彼此電性連接,因此觸控面板10可選擇性地僅包括一個第二檢測墊132。此時,於大片基板上進行阻抗電性測試時,探針可接觸於所述一個第二檢測墊132與第二接墊122,以對彼此電性連接的第二電極114進行檢測。值得一提的是,雖然第二電極114彼此是電性連接的關係,但透過設置有與圖標區域B相應數量的第二檢測墊132,可使得觸控面板10達成較準確的電性測試。Furthermore, in this embodiment, the touch panel 10 may further include a plurality of second detection pads 132 electrically connected to the plurality of second electrodes 114 respectively, but the present invention is not limited thereto. Since the second electrodes 114 are electrically connected to each other, the touch panel 10 may selectively include only one second detection pad 132. At this time, when performing an impedance electrical test on a large substrate, the probe may contact the one second detection pad 132 and the second connection pad 122 to detect the second electrode 114 electrically connected to each other. It is worth mentioning that although the second electrodes 114 are electrically connected to each other, the touch panel 10 can achieve a more accurate electrical test by providing the second detection pads 132 corresponding to the icon area B.
檢測完成之後,可選擇性地進一步於第一檢測墊130與第二檢測墊132表面進行絕緣處理,例如塗佈絕緣油墨。After the detection is completed, the surfaces of the first detection pad 130 and the second detection pad 132 may be optionally subjected to insulation treatment, such as coating an insulating ink.
另外,本發明的觸控面板10可選擇性地更包括設置在基板100的主動區域A內的觸控電極層TP。在一實施方式中,如圖4A所示,觸控電極層TP包括多個第一觸控串列X以及多個第二觸控串列Y,其中每個第一觸控串列X中的觸控電極圖案與每個第二觸控串列Y中的觸控電極圖案的形狀為菱形,但本發明並不限於此。在另一實施方式中,如圖4B所示,觸控電極層TP包括多個第一觸控串列X以及多個第二觸控串列Y,其中每個第一觸控串列X中的觸控電極圖案與每個第二觸控串列Y中的觸控電極圖案的形狀為長條狀,但本發明並不限於此。也就是說,觸控電極層TP可以是任何所屬技術領域中具有通常知識者所周知的任一種電容式觸控電極層。另外,雖然圖4A及圖4B揭示的觸控電極層TP是以電容式觸控電極層為例,但本發明並不限於此。在其他實施方式中,觸控電極層TP也可以是任何所屬技術領域中具有通常知識者所周知的任一種觸控結構,例如電阻式、光學式、聲波式、電磁式、或其它合適的觸控結構、或上述已提出的任二種觸控結構的組合。In addition, the touch panel 10 of the present invention may optionally further include a touch electrode layer TP disposed in the active area A of the substrate 100. In an embodiment, as shown in FIG. 4A, the touch electrode layer TP includes a plurality of first touch series X and a plurality of second touch series Y, where each of the first touch series X The shapes of the touch electrode patterns and the touch electrode patterns in each of the second touch series Y are diamond-shaped, but the present invention is not limited thereto. In another embodiment, as shown in FIG. 4B, the touch electrode layer TP includes a plurality of first touch series X and a plurality of second touch series Y, wherein each of the first touch series X The shape of the touch electrode pattern and the touch electrode pattern in each second touch series Y are long, but the present invention is not limited thereto. That is, the touch electrode layer TP may be any type of capacitive touch electrode layer known to those having ordinary knowledge in the art. In addition, although the touch electrode layer TP disclosed in FIGS. 4A and 4B is a capacitive touch electrode layer as an example, the present invention is not limited thereto. In other embodiments, the touch electrode layer TP may also be any type of touch structure known to those skilled in the art, such as resistive, optical, acoustic, electromagnetic, or other suitable touch structures. Control structure, or a combination of any two of the above-mentioned touch structures.
如前文所述,觸控面板10可在切割製程之前於大片基板上對圖標區域B內的第一電極112及第二電極114進行阻抗電性測試,因此在觸控面板10更包括觸控電極層TP的實施方式中,主動區域A內的觸控電極層TP與圖標區域B內的第一電極112及第二電極114可在切割製程之前於大片基板上同步進行檢測。As mentioned above, the touch panel 10 can perform an impedance electrical test on the first electrode 112 and the second electrode 114 in the icon area B on the large substrate before the cutting process. Therefore, the touch panel 10 further includes a touch electrode In the embodiment of the layer TP, the touch electrode layer TP in the active area A and the first electrode 112 and the second electrode 114 in the icon area B can be detected on a large substrate before the cutting process.
雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above in the embodiments, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some modifications and retouches without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.
10‧‧‧觸控面板10‧‧‧Touch Panel
100‧‧‧基板100‧‧‧ substrate
110‧‧‧電極組110‧‧‧electrode set
112‧‧‧第一電極112‧‧‧first electrode
114‧‧‧第二電極114‧‧‧Second electrode
120‧‧‧第一接墊120‧‧‧The first pad
122‧‧‧第二接墊122‧‧‧Second pad
130‧‧‧第一檢測墊130‧‧‧The first test pad
130R‧‧‧第一檢測區域130R‧‧‧The first detection area
132‧‧‧第二檢測墊132‧‧‧Second test pad
132R‧‧‧第二檢測區域132R‧‧‧Second detection area
140‧‧‧第一訊號線140‧‧‧The first signal line
142‧‧‧第二訊號線142‧‧‧The second signal line
142A‧‧‧分支線段142A‧‧‧ branch line segment
142B‧‧‧連接線段142B‧‧‧ connecting line segment
a1、b1、a2、b2‧‧‧邊長a1, b1, a2, b2‧‧‧ side length
A‧‧‧主動區域A‧‧‧active area
A1、A2、A3、A4‧‧‧側邊A1, A2, A3, A4‧‧‧
B‧‧‧圖標區域B‧‧‧ icon area
C‧‧‧引腳接合區域 C‧‧‧ lead bonding area
k‧‧‧區域 k‧‧‧area
L‧‧‧連接線 L‧‧‧ cable
TP‧‧‧觸控電極層 TP‧‧‧Touch electrode layer
X‧‧‧第一觸控串列 X‧‧‧The first touch series
Y‧‧‧第二觸控串列 Y‧‧‧Second touch series
圖1是依照本發明的一實施方式的觸控面板的上視示意圖。 圖2是圖1中的區域k的放大圖。 圖3是圖2中的剖線I-I’及剖線II-II’的剖面示意圖。 圖4A和圖4B分別是可配置於主動區域中的觸控電極的上視示意圖。FIG. 1 is a schematic top view of a touch panel according to an embodiment of the present invention. FIG. 2 is an enlarged view of a region k in FIG. 1. Fig. 3 is a schematic cross-sectional view taken along the line I-I 'and the line II-II' in Fig. 2. 4A and 4B are schematic top views of touch electrodes that can be configured in an active area, respectively.
Claims (10)
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Citations (4)
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TWI380034B (en) * | 2008-10-14 | 2012-12-21 | Au Optronics Corp | Capacitive touch panel and inspection method thereof |
CN105183254A (en) * | 2015-08-18 | 2015-12-23 | 南京触宏微电子有限公司 | Touch detection method and apparatus for touch screen and touch screen |
TWI520024B (en) * | 2013-11-22 | 2016-02-01 | Focaltech Systems Ltd | A single layer capacitive touch input device capable of reducing the lead and a driving method thereof |
TWI530693B (en) * | 2013-06-14 | 2016-04-21 | 業成光電(深圳)有限公司 | Test circuit and test method of sensing wires in touch panel |
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TWI647682B (en) * | 2017-09-07 | 2019-01-11 | 友達光電股份有限公司 | Detection method and display panel |
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TWI380034B (en) * | 2008-10-14 | 2012-12-21 | Au Optronics Corp | Capacitive touch panel and inspection method thereof |
TWI530693B (en) * | 2013-06-14 | 2016-04-21 | 業成光電(深圳)有限公司 | Test circuit and test method of sensing wires in touch panel |
TWI520024B (en) * | 2013-11-22 | 2016-02-01 | Focaltech Systems Ltd | A single layer capacitive touch input device capable of reducing the lead and a driving method thereof |
CN105183254A (en) * | 2015-08-18 | 2015-12-23 | 南京触宏微电子有限公司 | Touch detection method and apparatus for touch screen and touch screen |
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