TWI580973B - A global detection method of fingerprint sensor and its testing equipment - Google Patents

Description

Fingerprint sensor global detection method and detection device thereof

The invention relates to a detection method of a fingerprint sensor and a detection device thereof, in particular to a method and a device suitable for fully automatic detection of a fingerprint sensor.

Fingerprint identification is the most common type of biometric identification method. It mainly uses a fingerprint sensor to sense the user's fingerprint and compare it to identify the user's identity.

Moreover, after the fingerprint sensor is manufactured, the more common quality control tests are still mainly performed manually. Further, the detection of the existing common fingerprint sensor is performed in the following manner: First, the tester properly places the fingerprint sensor to be tested in a detection seat, of course, a factory with a higher degree of automation, this step may be The robot is replaced by a robotic arm; then, the inspector presses his or her finger against the fingerprint sensor for detection.

However, this conventional manual detection method is not only difficult to reduce the detection cost due to the high labor cost; moreover, the number of variables generated by the manual operation during the detection process is quite large, for example, the fingerprint sensing is caused by the uneven force of the manual fingerprint pressing. The size of the area is different or the fingerprints are not the same, which will affect the accuracy of the detection.

Moreover, since the artificial fingerprint has its shape limitation, it is difficult to completely cover all the sensing areas on the fingerprint sensor, that is, the entire sensing electrodes on the fingerprint sensor cannot be completely tested. In addition, the conventional manual detection method inevitably causes the fingerprint sensor to be contaminated, or even the sensor is damaged due to human error or improper application.

The main object of the present invention is to provide a global detection method for a fingerprint sensor and a detection device thereof, which can replace the traditional manual detection mode by machine automatic detection, and can completely detect all the sensing areas on the fingerprint sensor. In addition to improving detection efficiency and detection accuracy, it can effectively reduce costs.

To achieve the above objective, a global detecting device for a fingerprint sensor includes: a test stand, a pick and place device, a test arm, and a controller. Wherein, the test socket is used for standing at least one fingerprint sensor, which comprises a plurality of sensing electrodes, and the test arm comprises a conductive component, and the controller is electrically connected to the pick-and-place device and the test arm; in addition, the controller controls the pick and place The device places the fingerprint sensor into the test socket, and controls the test arm to move to approach the test seat, and the conductive element contacts the fingerprint sensor on the test socket to electrically connect the test socket to the fingerprint sensor, and The fingerprint sensor performs detection, and the controller controls the pick and place device to take out the detected fingerprint sensor from the test socket. Accordingly, the present invention utilizes a controller to control the progress of the entire test, and replaces the conventional detection method of manual manual handling and manual detection by the pick and place device and the test arm. In addition, the test arm is simultaneously shouldered to ensure that the test socket is electrically connected to the fingerprint sensor and as a target for inductive detection.

Wherein, when the conductive component contacts the fingerprint sensor on the test socket, the plurality of sensing electrodes respectively output a first measured value signal to the controller, and the controller determines the at least one fingerprint sense according to the first measured value signals The tester is qualified or not. Accordingly, since the conductive element already covers the plurality of sensing electrodes on the fingerprint sensor, under normal circumstances, the first measured value signal output by each sensing electrode should have a small gap and should be within a predetermined range of values. Once the measured first measured value signal exceeds the predetermined range value, it can be easily determined that the sensing electrode has a defect, such as a short circuit or a shape defect, and the detected fingerprint sensor can be judged as a defective product. .

In addition, when the conductive component contacts at least one fingerprint sensor on the test socket, the plurality of sensing electrodes respectively output a first measured value signal to the controller, and the first measured value signal may include a voltage value and a current value. At least one of the controllers, and the controller calculates at least one of each measured voltage value and each current value as a capacitance value, and processes all of the capacitance values to form a sensing pattern of the conductive element. Accordingly, the controller utilizes a known relationship between voltage, current, and capacitance to obtain a capacitance value formed between the sensing electrodes and the conductive element, and process the capacitance values to form a conductive element. Image pattern.

Preferably, the controller of the present invention may include a memory unit that stores a conductive component sensing sample; the controller compares the sensing pattern of the conductive component with the conductive component sensing sample to determine the at least one Whether the fingerprint sensor is qualified or not. Accordingly, the present invention can accurately determine whether the fingerprint sensor is qualified or not by comparing the sensed pattern of the sensed conductive element with the sample pattern. Among them, the conductive element The sensing sample can be taken from a pattern previously generated by sensing the conductive element via the flawless fingerprint sensor.

Moreover, the pick-and-place device of the global detecting device of the fingerprint sensor of the present invention may include a non-conductive nozzle or a conductive nozzle; wherein when the pick-and-place device includes a conductive nozzle, the controller controls the pick-and-place device to sense the fingerprint The detector is statically placed in the test socket, and the test socket is electrically connected to the fingerprint sensor, and the conductive nozzle continuously contacts the fingerprint sensor, and the plurality of sensing electrodes of the fingerprint sensor respectively output a second measured value signal To the controller. The second measured value signal may include at least one of a voltage value and a current value, and the controller calculates at least one of each measured voltage value and each current value as a capacitance value. All of the capacitance values are processed to form a sensing pattern of the conductive nozzle. Accordingly, the controller uses the known relationship between voltage, current, and capacitance to calculate and obtain the capacitance values formed between the sensing electrodes and the conductive nozzles, and process the capacitance values to Forming an image pattern of the conductive nozzle.

Furthermore, the controller of the global detection device of the fingerprint sensor of the present invention can include a memory unit that can store a nozzle sensing sample. The controller may compare the sensing pattern of the conductive nozzle with the nozzle sensing sample to determine whether the at least one fingerprint sensor is qualified or not. Accordingly, the present invention can also perform detection and comparison through the conductive nozzle, thereby improving the accuracy of the detection. However, the nozzle sensing sample can be pre-fetched from the pattern produced by sensing the conductive nozzle via the flawless fingerprint sensor.

In addition, the controller of the global detecting device of the fingerprint sensor of the present invention may include a memory unit that stores a synthesized sample, and the synthesized sample may be synthesized by a nozzle sensing sample and a conductive component sensing sample. And got it. The controller can compare the sensing pattern of the conductive nozzle and the sensing pattern of the conductive component with the synthesized sample to determine whether the at least one fingerprint sensor is qualified or not. Accordingly, the fingerprint sensor can sense the sensing pattern of the conductive nozzle and the sensing pattern of the conductive component respectively, and then compare with the synthesized sample, thereby further improving the accuracy of the detection. .

To achieve the foregoing objective, the present invention provides a global detection method for a fingerprint sensor, which includes the following steps: first, driving a pick and place device to statically place at least one fingerprint sensor on a test socket, at least one fingerprint sensor Including a plurality of sensing electrodes; then, driving a test arm to move toward the test socket, and the test arm includes a conductive component, and the conductive component contacts at least one fingerprint sensor on the test socket to electrically connect at least one fingerprint sensor To the test socket, and the plurality of sensing electrodes on the at least one fingerprint sensor respectively output a first measured value signal to a controller; and further, the controller determines whether the at least one fingerprint sensor is qualified or not; The device removes the fingerprint sensor from the test stand.

In the global detecting method of the fingerprint sensor of the present invention, the controller can directly determine whether at least one fingerprint sensor is qualified according to the first measured value signals. In addition, the first measured value signal may include at least one of a voltage value and a current value, and the controller may calculate at least one of each measured voltage value and each current value as a capacitor. Values, and all capacitance values are processed to form a sensing pattern for the conductive element.

Furthermore, in the global detection method of the fingerprint sensor of the present invention, when the controller performs the determination, the controller may compare the sensed pattern of the obtained conductive component with a conductive component sensing sample to determine the One less fingerprint sensor is qualified or not.

Moreover, the pick-and-place device of the present invention comprises a non-conductive nozzle or a conductive nozzle; when the pick-and-place device comprises a conductive nozzle, when the pick-and-place device places at least one fingerprint sensor in the test seat, the test is performed The seat is electrically connected to the at least one fingerprint sensor, and the conductive nozzle continuously contacts the at least one fingerprint sensor, and the plurality of sensing electrodes of the fingerprint sensor respectively output a second measured value signal to the controller. The second measured value signal may include at least one of a voltage value and a current value, and the controller may calculate each measured voltage value or each current value as a capacitance value, and process all The capacitance value is used to form a sensing pattern of the conductive nozzle.

In addition, in the global detecting method of the fingerprint sensor of the present invention, after the conductive component contacts the fingerprint sensor on the test socket, the controller can sense the conductive nozzle obtained by the fingerprint sensor in the previous step. The measurement pattern is compared with a nozzle sensing sample to determine whether the at least one fingerprint sensor is qualified or not.

Moreover, in the global detection method of the fingerprint sensor of the present invention, after the conductive component contacts the fingerprint sensor on the test socket, the controller can sense the conductive nozzle obtained by the fingerprint sensor in the previous step. The sensing pattern of the pattern and the conductive element is synthesized and compared with a composite sample; wherein the synthesized sample is synthesized by a nozzle sensing sample and a conductive element sensing sample.

2‧‧‧ test seat

20‧‧‧chip storage slot

21‧‧‧ probe

3‧‧‧ pick and place device

31‧‧‧Electrical nozzle

4‧‧‧ test arm

41‧‧‧Conducting components

5‧‧‧ Controller

51‧‧‧ memory unit

510‧‧‧ Fingerprint sample

511‧‧‧ nozzle sensing sample

512‧‧‧Resistance sensing samples

513‧‧‧Synthetic sample

6‧‧‧Transporting shuttle

C‧‧‧Finger sensor

Ca‧‧‧Sensing area

Ce‧‧‧Induction electrode

M _v1 ‧‧‧first measured value signal

M _v2 ‧‧‧second measured value signal

1 is a schematic view of a preferred embodiment of the present invention.

2 is a system architecture diagram of a first embodiment of the present invention.

3A is a schematic view showing the first embodiment of the present invention in which the pick-and-place device places the fingerprint sensor on the test stand.

3B is a schematic view showing the conductive element contacting the fingerprint sensor and sensing in the first embodiment of the present invention.

4 is a system architecture diagram of a second embodiment of the present invention.

Fig. 5A is a schematic view showing a nozzle sensing sample in a third embodiment of the present invention.

Fig. 5B is a schematic view showing a sensing element of a conductive member in a third embodiment of the present invention.

Figure 5C is a schematic illustration of a synthetic sample in a third embodiment of the present invention.

Figure 6 is a system architecture diagram of a third embodiment of the present invention.

Before the present invention is described in detail in the present embodiment, it is to be noted that in the following description, similar elements will be denoted by the same reference numerals. In addition, the drawings of the present invention are merely illustrative, and are not necessarily drawn to scale, and all details are not necessarily shown in the drawings.

Please refer to FIG. 1 , FIG. 2 , FIG. 3A and FIG. 3B , FIG. 1 is a schematic diagram of a preferred embodiment of the present invention, FIG. 2 is a system architecture diagram of a first embodiment of the present invention, and FIG. 3A is a first embodiment of the present invention. In the example, the pick-and-place device places a fingerprint sensor on the test stand. FIG. 3B is a schematic diagram of the conductive element contacting the fingerprint sensor and sensing in the first embodiment of the present invention. As shown in the figures, the embodiment mainly includes a test seat 2, a pick-and-place device 3, a test arm 4, a controller 5, and a transfer shuttle 6. The test socket 2 includes a wafer receiving slot 20 for receiving and fixing the fingerprint sensor C to be tested, and the bottom end surface of the wafer receiving slot 20 is disposed. A plurality of probes 21 for electrically contacting the fingerprint sensor C.

Furthermore, the transfer shuttle 6 of the embodiment is used for transferring the fingerprint sensor C to be tested and completed, and the transfer shuttle 6 is electrically connected to the controller 5 and controlled by the controller 5. . On the other hand, the controller 5 also controls the pick-and-place device 3 to carry the fingerprint sensor C between the transfer shuttle 6 and the test stand 2. That is, in this embodiment, the fingerprint sensor C to be tested and completed is transferred by the transfer shuttle 6, and then the fingerprint sensor is carried by the pick-and-place device 3 between the transfer shuttle 6 and the test seat 2. C, and the transfer shuttle 6 can be moved between a feeding zone and a discharge zone (not shown).

In addition, the lower end surface of the test arm 4 is provided with a conductive member 41, which is made of a conductive material, preferably has an elastic property, so as to absorb the impact force when the object contacts, and the buffering effect can be achieved. The conductive member 41 of this embodiment is made of conductive rubber or conductive foam. Moreover, a type of fingerprint pattern 411 is formed on the surface of the conductive member 41 for contacting the fingerprint sensor C, which is similar to the human finger pattern. Moreover, the fingerprint sensor C of the embodiment includes a sensing area Ca, and the sensing area Ca includes a plurality of sensing electrodes Ce, and the size of the fingerprint-like pattern 411 can completely cover the sensing area Ca to form The global test, that is, all the sensing electrodes Ce on the fingerprint sensor C are detected at one time.

Moreover, the controller 5 is electrically connected to the pick-and-place device 3, the transfer shuttle 6, the test arm 4, and the plurality of probes 21 of the test socket 2; and when the pick-and-place device 3 or the test arm 4 presses the fingerprint sensor C The controller 5 can be electrically connected to the fingerprint sensor C by the plurality of probes 21 . Moreover, the controller 5 includes a memory unit 51, which can be any type of fixed or removable random access memory (RAM), read-only memory. (Read-Only Memory, ROM), Flash memory, hard disk or other similar device or a combination of these devices. The memory unit 51 of the present embodiment stores a fingerprint sample 510 corresponding to the fingerprint-like texture 411, which can be pre-fetched from the sample pattern generated by sensing the fingerprint-like texture 411 via the flawless fingerprint sensor C.

The detection process of the embodiment is as follows: First, the controller 5 controls the transfer shuttle 6 to transfer the fingerprint sensor C to be tested to a specific position from a feeding area (not shown), and the specific The position can be a position adjacent to the test stand 2. Furthermore, the controller 5 controls the pick-and-place device 3 to take out the fingerprint sensor C from the transfer shuttle 6 and place it in the wafer receiving slot 20 of the test socket 2.

Next, the controller 5 controls the test arm 4 to move to approach the test socket 2, and the conductive sensor 41 presses down the fingerprint sensor C on the test socket 2, and continues to press down to make the fingerprint sensor C and the test seat 2 The plurality of probes 21 are electrically connected, and the controller 5 starts the detection, that is, the fingerprint sensor C senses the fingerprint lines 411 on the conductive member 41.

The detection process is further described as follows. When the conductive element 41 contacts the fingerprint sensor C on the test socket 2, the conductive element 41 contacts all the sensing electrodes Ce, and each sensing electrode Ce outputs a first measured value signal M _{v1 .} To controller 5. In this embodiment, the first measured value signal M _v1 is a voltage value, and the controller 5 calculates the capacitance value by passing the measured voltage value through the following relationship, and calculates all the capacitance values. The sensing pattern of the conductive element 41 is constructed according to the geometric positional relationship of the complex sensing electrodes Ce.

Wherein, in the above relation, I is a current flowing through a capacitance formed between the sensing electrode Ce and the conductive element 41, and the unit is ampere; dv/dt is a voltage-to-time differential, the unit is volt/second; C is an induction The capacitance value of the capacitance formed between the electrode Ce and the conductive element 41 is in the Farad.

In addition, after obtaining the image pattern of the conductive element 41, the controller 5 compares the pattern with the fingerprint sample 510 to determine whether the fingerprint sensor C under test is qualified. In addition, the controller 5 controls the pick-and-place device 3 to take out the completed fingerprint sensor C from the wafer receiving slot 20 of the test stand 2 and place it in the transfer shuttle 6. Finally, the controller 5 controls the transfer shuttle 6 to transfer the completed fingerprint sensor C to a discharge zone (not shown).

However, in other embodiments of the invention, it is not necessary to obtain an image pattern of the conductive element 41 and compare it to the fingerprint sample 510. Further, the present invention provides a simpler detection method in which the lower surface of the conductive member 41 is a flat surface, and no fingerprint-like pattern 411 is provided. However, when the plurality of sensing electrodes Ce respectively output a first measured value signal M _v1 (eg, a voltage value or a current value) to the controller 5, the controller 5 can determine the fingerprint according to the first measured value signal M _v1 . The good sensor C.

In other words, since the conductive element 41 has fully covered all the sensing electrodes Ce, and the surface on the conductive element 41 is a flat surface, all the sensing electrodes Ce are outputted in the absence of the fingerprint sensor C. The first measurement signal M _v1 should have a small gap. Once there is a significant difference, it means that the sensing electrode is defective, and it can be easily judged that the detected fingerprint sensor C is a defective product. Accordingly, the present invention can also directly determine a first measurement value signal M _v1 for the plurality of sensing electrodes Ce, so that the program processed by the controller 5 is simpler and can speed up the entire detection process.

Please refer to FIG. 4. FIG. 4 is a system architecture diagram of a second embodiment of the present invention. The main difference between the present embodiment and the foregoing first embodiment is that the pick-and-place device 3 of the present embodiment includes a conductive nozzle 31 made of a conductive material, such as conductive rubber or conductive foam, and the conductive member 41 of the embodiment. The fingerprint-like pattern 411 is not formed on the surface of the contact fingerprint sensor C; of course, in other embodiments, the surface may have a type of fingerprint pattern 411 as in the first embodiment.

In addition, the main feature of the embodiment is that the second detection and the comparison are performed, so that the embodiment can improve the accuracy of the detection compared with the one detection of the first embodiment. Further, the memory unit 51 of the embodiment stores a nozzle sensing sample 511 and a conductive component sensing sample 512; wherein the nozzle sensing sample 511 is pre-fetched without a fingerprint sensor C. The pattern generated by the conductive nozzle 31 is sensed, and the conductive element sensing sample 512 is pre-taken by the flawless fingerprint sensor C to sense the pattern produced by the conductive element 41.

The detection process of this embodiment differs from the first embodiment only in that the conductive element 41 is pressed against the fingerprint sensor C on the test socket 2, and the sensing sensor C is used to obtain the sensing conductive nozzle. The pattern of 31. Further, when the controller 5 controls the pick-and-place device 3 to place the fingerprint sensor C into the test socket 2, the controller 5 controls the fingerprint sensor C to sense the conductive nozzle 31, that is, the fingerprint sensor C. The sensing pattern of the conductive nozzle 31 is sensed.

Here, the manner in which the pattern of the conductive nozzle 31 is obtained in the present embodiment is the same as the manner in which the pattern of the conductive member 41 is obtained in the first embodiment. That is, when the conductive nozzle 31 continuously contacts the fingerprint sensor C, the plurality of sensing electrodes Ce respectively output a second measured value signal M _v2 to the controller 5. In this embodiment, the second measured value signal M _{v2 is} also a voltage value, and the controller 5 calculates the capacitance value by using the measured voltage value through the foregoing relationship, and all the capacitors The value is constructed as an image pattern of the conductive nozzle 31 according to the geometric positional relationship of the complex sensing electrodes Ce.

On the other hand, after the controller 5 obtains the pattern of the conductive element 41 in the same manner, the controller 5 senses the pattern of the conductive nozzle 31 and the pattern of the conductive element 41 and the nozzle sensing sample respectively by the fingerprint sensor C. The 511 and the conductive component sensing sample 512 are compared to determine whether the fingerprint sensor C under test is qualified. Accordingly, the present embodiment senses the conductive nozzle 31 and the conductive element 41 by using the fingerprint sensor C, respectively, and compares the nozzle sensing sample 511 and the conductive element sensing sample 512 to form a secondary detection. The comparison can improve the accuracy of the detection.

Of course, in other implementations, in order to save the detection process and improve the detection efficiency, only the previous stage test of the second embodiment may be performed, that is, the controller 5 only performs the fingerprint sensor C to sense the pattern of the conductive nozzle 31. And comparing it with the nozzle sensing sample 511 stored in the memory unit 51, thereby determining the goodness of the fingerprint sensor C under test. The end surface of the conductive nozzle 31 and the fingerprint sensor C can be specially designed, for example, the surface area of the end face and the addition of fingerprint-like lines. Accordingly, this embodiment integrates the pick-and-place device 3 and the test arm 4, so that the time required for the detection process and the detection can be significantly reduced, and the complexity and hardware cost of the device can be reduced by omitting the test arm 4. The detection area of this embodiment may be limited The pattern of the conductive nozzle 31, for example, the mouth of the nozzle must be hollowed out, and it is impossible to detect all of the sensing electrodes.

5A, FIG. 5B, FIG. 5C and FIG. 6, FIG. 5A is a schematic diagram of a nozzle sensing sample according to a third embodiment of the present invention, and FIG. 5B is a sensing element for sensing a conductive element according to a third embodiment of the present invention. FIG. 5C is a schematic diagram of a synthetic sample in a third embodiment of the present invention, and FIG. 6 is a system architecture diagram of a third embodiment of the present invention. The main difference between the present embodiment and the foregoing second embodiment is that the memory unit 51 of the present embodiment stores a composite sample 513, which is a nozzle sensing sample 511 as shown in FIG. 5A and as shown in FIG. 5B. The conductive element sensing sample 512 is synthesized to form a composite sample 513 as shown in FIG. 5C.

The synthetic sample 513 is formed by removing the pattern of the nozzle sensing sample 511 from the pattern of the conductive element sensing sample 512. In addition, the main difference between the present embodiment and the foregoing second embodiment in the detection method is that the fingerprint sensor C senses the pattern of the conductive nozzle 31 and the pattern of the conductive element 41 and the synthesized sample. 513 for comparison.

The difference between the detection process of this embodiment and the second embodiment is only the comparison step. For other steps, please refer to the first and second embodiments. In this embodiment, after the controller 5 obtains the sensing pattern of the conductive nozzle 31 and the sensing pattern of the conductive element 41, the controller 5 synthesizes the two, and the synthesis method thereof is as described in the foregoing paragraph, and the conductive element 41 is used. The sensing pattern of the absorbing conductive nozzle 31 is removed from the sensing pattern to form a person.

Next, the controller compares the synthesized pattern with the synthesized sample 513 stored in the memory unit 51, thereby determining the measured Whether the fingerprint sensor C is qualified. Accordingly, in the embodiment, the conductive sensor 31 and the conductive element 41 are respectively sensed by the fingerprint sensor C, and the sensed image is synthesized and compared with the synthesized sample 513, so that the detection can be greatly improved. Accuracy.

The above-mentioned embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

2‧‧‧ test seat

3‧‧‧ pick and place device

31‧‧‧Electrical nozzle

4‧‧‧ test arm

41‧‧‧Conducting components

6‧‧‧Transporting shuttle

Claims (14)

A global detecting device for a fingerprint sensor, comprising: a test socket for locating at least one fingerprint sensor, the at least one fingerprint sensor comprising a plurality of sensing electrodes; and a pick and place device comprising a conductive a test arm comprising a conductive element; and a controller electrically connected to the pick and place device and the test arm; the controller controlling the pick and place device to place the at least one fingerprint sensor into the Testing the test stand and controlling the test arm to move toward the test stand, the conductive element contacting the at least one fingerprint sensor on the test stand, electrically connecting the test stand to the at least one fingerprint sensor and Detecting the at least one fingerprint sensor, the controller controlling the pick and place device to take out the detected at least one fingerprint sensor from the test stand; wherein, when the controller controls the pick and place device, the at least When a test sensor is statically placed on the test stand, and the test stand is electrically connected to the at least one fingerprint sensor, the conductive nozzle continuously contacts the at least one fingerprint sensor, the at least one fingerprint sensor The sense of plural Electrode outputs a measured value signal to the controller. The global detecting device of the fingerprint sensor of claim 1, wherein when the conductive element contacts the at least one fingerprint sensor on the test socket, the plurality of sensing electrodes respectively output another measured value signal to the control The controller determines, according to the other measured value signals, whether the at least one fingerprint sensor is qualified or not. The global detecting device of the fingerprint sensor of claim 1, wherein when the conductive element contacts the at least one fingerprint sensor on the test socket, The plurality of sensing electrodes respectively output another measured value signal to the controller, and the other measured value signal includes at least one of a voltage value and a current value, and the controller measures each voltage value measured And at least one of each current value is calculated as a capacitance value, and all of the capacitance values are processed to form a sensing pattern of the conductive element. The global detecting device of the fingerprint sensor of claim 3, wherein the controller comprises a memory unit that stores a conductive component sensing sample; the controller senses the sensing pattern of the conductive component and the conductive component The test samples are compared to determine whether the at least one fingerprint sensor is qualified or not. The global detecting device of the fingerprint sensor of claim 3, wherein the measured value signal comprises at least one of a voltage value and a current value, and the controller measures each voltage value and each measured At least one of the current values is computed as a capacitance value and all of the capacitance values are processed to form a sensing pattern of the conductive nozzle. The global detecting device of the fingerprint sensor of claim 5, wherein the controller comprises a memory unit that stores a nozzle sensing sample; the controller applies the sensing pattern of the conductive nozzle to the nozzle The sensing samples are compared to determine whether the at least one fingerprint sensor is qualified or not. The global detecting device of the fingerprint sensor of claim 5, wherein the controller comprises a memory unit storing a synthesized sample, the synthesized sample being sensed by a nozzle sensing sample and a conductive component sensing sample The controller combines the sensing pattern of the conductive nozzle and the sensing pattern of the conductive element with the synthesized sample to determine whether the at least one fingerprint sensor is qualified or not. A global detection method for a fingerprint sensor includes the following steps: (A) driving a pick and place device to statically place at least one fingerprint sensor on a test socket, the at least one fingerprint sensor comprising a plurality of sensing electrodes (B) driving a test arm to move toward the test socket, the test arm includes a conductive component, the conductive component contacting the at least one fingerprint sensor on the test socket, the at least one fingerprint sensor Electrically connected to the test socket, the plurality of sensing electrodes on the at least one fingerprint sensor respectively output a first measured value signal to a controller; (C). the controller determines that the at least one fingerprint sensor is qualified And (D) driving the pick and place device to take out the at least one fingerprint sensor from the test stand; wherein the pick and place device comprises a conductive nozzle; in the step (A), when the pick and place device When the at least one fingerprint sensor is statically placed in the test socket, the test socket is electrically connected to the at least one fingerprint sensor, and the conductive nozzle continuously contacts the at least one fingerprint sensor, the at least one The plurality of sensing electrodes of the fingerprint sensor respectively output one The second measured signal is sent to the controller. The global detecting method of the fingerprint sensor of claim 8, wherein in the step (C), the controller determines whether the at least one fingerprint sensor is qualified according to the first measured value signals. The global detecting method of the fingerprint sensor of claim 8, wherein in the step (C), the first measured value signal comprises at least one of a voltage value and a current value, and the controller will measure Calculating at least one of each voltage value and each current value is calculated as a capacitance value, and processing all The capacitance value of the portion forms a sensing pattern of the conductive element. The global detection method of the fingerprint sensor of claim 10, wherein in the step (C), the controller compares the obtained sensing pattern of the conductive element with a conductive element sensing sample, To determine whether the at least one fingerprint sensor is qualified or not. The global detection method of the fingerprint sensor of claim 10, wherein in the step (A), the second measurement signal includes at least one of a voltage value and a current value, and the controller will measure At least one of each of the measured voltage values and each current value is calculated as a capacitance value, and all of the capacitance values are processed to form a sensing pattern of the conductive nozzle. The global detection method of the fingerprint sensor of claim 12, wherein in the step (C), the controller will take the sensing pattern of the conductive nozzle and a nozzle obtained in the step (A) The sensing samples are compared to determine whether the at least one fingerprint sensor is qualified or not. The global detection method of the fingerprint sensor of claim 12, wherein in the step (C), the controller will take the sensing pattern of the conductive nozzle obtained in the step (A) and the step (B) synthesizing the sensed pattern of the obtained conductive element and comparing it with a synthetic sample to determine whether the at least one fingerprint sensor is qualified or not; wherein the synthetic sample is sensed by a nozzle The test sample and a conductive component sense sample are synthesized.