[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

TWI564555B - Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method - Google Patents

Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method Download PDF

Info

Publication number
TWI564555B
TWI564555B TW103145945A TW103145945A TWI564555B TW I564555 B TWI564555 B TW I564555B TW 103145945 A TW103145945 A TW 103145945A TW 103145945 A TW103145945 A TW 103145945A TW I564555 B TWI564555 B TW I564555B
Authority
TW
Taiwan
Prior art keywords
full
circumference
tested
image
annular
Prior art date
Application number
TW103145945A
Other languages
Chinese (zh)
Other versions
TW201623940A (en
Inventor
謝伯璜
黃一萍
林依禾
林長民
Original Assignee
財團法人工業技術研究院
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 財團法人工業技術研究院 filed Critical 財團法人工業技術研究院
Priority to TW103145945A priority Critical patent/TWI564555B/en
Publication of TW201623940A publication Critical patent/TW201623940A/en
Application granted granted Critical
Publication of TWI564555B publication Critical patent/TWI564555B/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

全周反射取像模組與全周反射取像方法 Full-circumference reflection imaging module and full-circumferential reflection imaging method

本發明是有關於一種反射取像模組與反射取像方法,且特別是有關於一種全周反射取像模組與全周反射取像方法。 The invention relates to a reflection imaging module and a reflection imaging method, and in particular to a full-circumference reflection imaging module and a full-circumference reflection imaging method.

近年來,針對產品外觀的檢測方式,例如是檢測果實的成熟度或者檢測工件的瑕疵,許多藉由取像元件(例如是照相機)對產品進行取像並用於檢測產品外觀的裝置及方法越來越普及,以取代以人眼檢測產品外觀的技術,而提高檢測的準確性。舉例而言,藉由取像元件對產品取像,可得知產品的局部或整體的影像,進而可藉由處理單元或相關軟體執行所需分析,進而判斷產品的外觀是否具有瑕疵。 In recent years, for the detection method of the appearance of the product, for example, detecting the maturity of the fruit or detecting the flaw of the workpiece, many devices and methods for taking the image by the image taking component (for example, a camera) and detecting the appearance of the product are increasingly The more popular, the technology to detect the appearance of the product by the human eye, and improve the accuracy of detection. For example, by taking an image of the product by the image capturing component, a partial or overall image of the product can be known, and then the processing unit or the related software can perform the required analysis to determine whether the appearance of the product is flawed.

為了取得產品的整體影像來判斷待測物的整體外觀,通常作法是採用單一取像單元與產品的其中一者相對於另一者移動,使單一取像單元可從多個不同方向逐次對產品進行取像。或 者,目前也有作法是直接採用多個取像單元從產品的多個方向同時對產品進行取像。此外,目前亦有作法是使產品產生滾動(例如將果實放置在輸送帶上)而自行調整角度,並使取像單元逐次對產品的多個局部進行取像。然而,上述作法通常需將產品放置在平台上,使得產品的局部受到遮蔽,進而影響取像元件所取得的產品影像的完整度。此外,在使產品產生滾動而進行取像的作法中,產品容易因滾動而在取像過程中產生損傷。 In order to obtain an overall image of the product to determine the overall appearance of the object to be tested, it is common practice to use one of the single image capturing unit and the product to move relative to the other, so that the single image capturing unit can successively access the product from a plurality of different directions. Take the image. or At present, there is also a practice of directly taking images from multiple directions of the product by using multiple image capturing units. In addition, it is currently practiced to make the product roll (for example, placing the fruit on a conveyor belt) and adjust the angle by itself, and the image taking unit to image multiple parts of the product one by one. However, the above practice usually requires placing the product on the platform so that the product is partially shielded, thereby affecting the integrity of the product image obtained by the image taking component. Further, in the practice of causing the product to roll and take an image, the product is liable to be damaged during the image capturing process due to rolling.

本發明提供一種全周反射取像模組與全周反射取像方法,其適於在不接觸待測物的情況下取得待測物的全周影像,以避免待測物在取像過程中產生損傷,亦可避免待測物的局部受到遮蔽而影響全周影像的完整度。 The invention provides a full-circumference reflection imaging module and a full-circumference reflection imaging method, which is suitable for obtaining a full-circumference image of an object to be tested without contacting the object to be tested, so as to prevent the object to be tested from being in the image capturing process. Damage is generated, and the locality of the object to be tested is prevented from being obscured to affect the integrity of the image of the whole week.

本發明的全周反射取像模組適於取得一待測物的一全周影像。全周反射取像模組包括一全周反射鏡組以及一取像單元。全周反射鏡組具有一環狀反射區域。全周反射鏡組與待測物適於相對移動,使待測物通過環狀反射區域,而全周反射鏡組反射待測物對應於環狀反射區域的外觀。取像單元配置於全周反射鏡組的一側,並適於從待測物的下方取得藉由全周反射鏡組反射待測物對應於環狀反射區域的外觀而得的一全周影像。 The full-circumference reflection imaging module of the present invention is adapted to obtain a full-circumference image of an object to be tested. The full-circumference reflection imaging module includes a full-circumference mirror group and an image capturing unit. The full perimeter mirror set has an annular reflective area. The full-circumference mirror group and the object to be tested are adapted to move relative to each other, so that the object to be tested passes through the annular reflection area, and the entire circumference mirror group reflects the appearance of the object to be tested corresponding to the annular reflection area. The image capturing unit is disposed on one side of the full-circumference mirror group, and is adapted to obtain a full-circumferential image obtained by reflecting the appearance of the object to be tested corresponding to the annular reflection region by the entire peripheral mirror group from below the object to be tested. .

本發明的全周反射取像方法適於取得一待測物的一全周影像。全周反射取像方法包括下列步驟:相對移動一全周反射鏡 組與待測物,使待測物通過全周反射鏡組的一環狀反射區域,並藉由全周反射鏡組反射待測物對應於環狀反射區域的外觀。藉由一取像單元從待測物的下方取得藉由全周反射鏡組反射待測物對應於環狀反射區域的外觀而得的一全周影像。 The full-circumferential reflection imaging method of the present invention is suitable for obtaining a full-circumference image of a test object. The full-circumferential reflection imaging method includes the following steps: relatively moving a full-circumference mirror The group and the object to be tested pass the object to be tested through an annular reflection area of the full-circumference mirror group, and reflect the appearance of the object to be tested corresponding to the annular reflection area by the full-circumference mirror group. A full-circumference image obtained by reflecting the appearance of the object to be tested corresponding to the annular reflection region by the entire peripheral mirror group is obtained from the lower side of the object to be tested by an image capturing unit.

基於上述,在本發明的全周反射取像模組與全周取像方法中,全周反射鏡組與待測物適於相對移動,使待測物通過全周反射鏡組的環狀反射區域,而全周反射鏡組藉此反射待測物對應於環狀反射區域的外觀。之後,取像單元適於從待測物的下方取得藉由全周反射鏡組反射待測物對應於環狀反射區域的外觀而得的全周影像。據此,本發明的全周反射取像模組與全周取像方法適於在不接觸待測物的情況下取得待測物的全周影像,以避免待測物在取像過程中產生損傷,亦可避免待測物的局部受到遮蔽而影響全周影像的完整度。 Based on the above, in the full-circumference reflection imaging module and the full-circumference imaging method of the present invention, the whole-peripheral mirror group and the object to be tested are adapted to be relatively moved, so that the object to be tested passes through the annular reflection of the full-circumference mirror group. The region, and the full-circumference mirror group thereby reflects the appearance of the object to be tested corresponding to the annular reflective region. Thereafter, the image capturing unit is adapted to obtain, from the lower side of the object to be tested, a full-circumferential image obtained by reflecting the appearance of the object to be tested corresponding to the annular reflection region by the entire peripheral mirror group. Accordingly, the full-circumference reflection imaging module and the full-circumference imaging method of the present invention are suitable for obtaining a full-circumference image of the object to be tested without contacting the object to be tested, so as to prevent the object to be detected from being generated during the image capturing process. Damage can also prevent the locality of the object to be tested from being obscured and affecting the integrity of the image throughout the week.

為讓本發明的上述特徵能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 In order to make the above-described features of the present invention more comprehensible, the following detailed description of the embodiments will be described in detail below.

50、50a‧‧‧待測物 50, 50a‧‧‧Test objects

100、100a‧‧‧全周反射取像模組 100, 100a‧‧‧ full-circumference reflex imaging module

110‧‧‧全周反射鏡組 110‧‧‧Full-Circumference Mirror Set

112‧‧‧環狀反射區域 112‧‧‧Circular reflection area

114‧‧‧環狀反射鏡 114‧‧‧ annular mirror

114a‧‧‧反射面 114a‧‧‧reflecting surface

120‧‧‧取像單元 120‧‧‧Image capture unit

130‧‧‧處理單元 130‧‧‧Processing unit

140、140a‧‧‧移動單元 140, 140a‧‧‧ mobile unit

150‧‧‧輔助光源 150‧‧‧Auxiliary light source

A、A1至A6‧‧‧全周影像 A, A1 to A6‧‧‧ full week images

B‧‧‧底部影像 B‧‧‧Bottom image

D‧‧‧法線方向 D‧‧‧ normal direction

D1、D2‧‧‧黑點 D1, D2‧‧‧ black spots

P1至P6‧‧‧取像位置 P1 to P6‧‧‧ image taking position

θ‧‧‧傾斜角 θ‧‧‧Tilt angle

圖1是本發明一實施例的全周反射取像模組的立體圖。 1 is a perspective view of a full-circumference reflection imaging module according to an embodiment of the present invention.

圖2是圖1的全周反射取像模組的側視示意圖。 2 is a side elevational view of the full-circumference reflection imaging module of FIG. 1.

圖3是圖1的全周反射鏡組的示意圖。 3 is a schematic view of the full-circumference mirror assembly of FIG. 1.

圖4是圖1的全周反射取像模組所取得的全周影像的示意圖。 4 is a schematic diagram of a full-circumference image acquired by the full-circumference reflection imaging module of FIG. 1.

圖5是本發明另一實施例的全周反射取像模組的側視示意圖。 FIG. 5 is a side elevational view of a full-circumference reflection imaging module according to another embodiment of the present invention.

圖6是本發明一實施例的全周反射取像方法的流程圖。 6 is a flow chart of a full-circumference reflection imaging method according to an embodiment of the present invention.

圖7是本發明另一實施例的全周反射取像方法的流程圖。 7 is a flow chart of a full-circumference reflection imaging method according to another embodiment of the present invention.

圖8是圖7的全周反射取像方法所取得的多段全周影像的示意圖。 FIG. 8 is a schematic diagram of a multi-segment full-circle image obtained by the full-circumference reflection imaging method of FIG. 7. FIG.

圖9是圖8的多段全周影像經由二值化的展開示意圖。 FIG. 9 is a schematic exploded view of the multi-segment full-circumference image of FIG. 8 via binarization.

圖1是本發明一實施例的全周反射取像模組的立體圖。圖2是圖1的全周反射取像模組的側視示意圖。圖3是圖1的全周反射鏡組的示意圖。圖4是圖1的全周反射取像模組所取得的全周影像的示意圖。請參考圖1至圖4,在本實施例中,全周反射取像模組100適於取得待測物50(繪示於圖2)的全周影像A(繪示於圖4)。其中,全周反射取像模組100包括全周反射鏡組110、取像單元120以及處理單元130。全周反射鏡組110具有環狀反射區域112。全周反射鏡組110與待測物50適於相對移動,使待測物50通過環狀反射區域112,而全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀。取像單元120配置於全周反射鏡組110的一側,並適於從待測物50的下方取得藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀而得的全周影像A。處理單元130電性連接至取像單元120,以依據全周影像 A檢測待測物50對應於環狀反射區域112的外觀。 1 is a perspective view of a full-circumference reflection imaging module according to an embodiment of the present invention. 2 is a side elevational view of the full-circumference reflection imaging module of FIG. 1. 3 is a schematic view of the full-circumference mirror assembly of FIG. 1. 4 is a schematic diagram of a full-circumference image acquired by the full-circumference reflection imaging module of FIG. 1. Referring to FIG. 1 to FIG. 4 , in the embodiment, the full-circumference reflection imaging module 100 is adapted to obtain the full-circumference image A of the object to be tested 50 (shown in FIG. 2 ) (shown in FIG. 4 ). The full-circumference reflection imaging module 100 includes a full-circumference mirror group 110, an image capturing unit 120, and a processing unit 130. The full perimeter mirror set 110 has an annular reflective region 112. The full-circumference mirror group 110 and the object to be tested 50 are adapted to move relative to each other, so that the object to be tested 50 passes through the annular reflection region 112, and the entire circumference mirror group 110 reflects the appearance of the object to be tested 50 corresponding to the annular reflection region 112. The image capturing unit 120 is disposed on one side of the full-circumference mirror group 110, and is adapted to obtain, from the lower side of the object to be tested 50, the appearance of the object to be tested 50 reflected by the full-circumference mirror group 110 corresponding to the appearance of the annular reflection region 112. The full week image A obtained. The processing unit 130 is electrically connected to the image capturing unit 120 to be based on the full-circumference image. A detecting the object to be tested 50 corresponds to the appearance of the annular reflection region 112.

具體而言,在本實施例中,全周反射鏡組110包括環狀反射鏡114。環狀反射鏡114為環狀且具有連續的反射面114a,以構成環狀反射區域112。然而,在其他未繪示的實施例中,全周反射鏡組也可以採用多個反射鏡彼此緊密排列構成環狀反射區域112,以反射待測物50對應於環狀反射區域112的外觀,本發明並不限制構成環狀反射區域112的構件。再者,所述反射面114a朝向取像單元120傾斜,例如是反射面114a與未繪示的水平基準面之間的傾斜角θ介於10度至80度之間,但本發明不以此為限制。如此,環狀反射鏡114可藉由反射面114a將待測物50對應於環狀反射區域112的外觀反射至取像單元120。由此可知,藉由環狀反射區域112的設置,當全周反射鏡組110與待測物50相對移動時,待測物50可通過環狀反射區域112,而使全周反射鏡組110藉此反射待測物50對應於環狀反射區域112的外觀。其中,在本實施例中,待測物50不與全周反射鏡組110接觸。亦即,當全周反射鏡組110與待測物50相對移動,而使待測物50通過環狀反射區域112時,待測物50不接觸構成環狀反射區域112的環狀反射鏡114,以使環狀反射鏡114可反射待測物50對應於環狀反射區域112的外觀。此外,在本實施例中,取像單元120例如是電荷耦合元件(charge coupled device,CCD)照相機或其他適用的照相機,以用於取得全周反射鏡組110所反射而得的影像,但本發明不限制取像單元120的種類。當全周反射鏡組110藉由 環狀反射鏡114將待測物50對應於環狀反射區域112的外觀反射至取像單元120之後,取像單元120可從待測物50的下方取得待測物50的全周影像A。 Specifically, in the present embodiment, the full-circumferance mirror group 110 includes an annular mirror 114. The annular mirror 114 is annular and has a continuous reflecting surface 114a to constitute an annular reflecting region 112. However, in other embodiments not shown, the full-circumference mirror group may also adopt a plurality of mirrors arranged closely to each other to form an annular reflection region 112 to reflect the appearance of the object to be tested 50 corresponding to the annular reflection region 112. The invention does not limit the components that make up the annular reflective region 112. Furthermore, the reflecting surface 114a is inclined toward the image capturing unit 120, for example, the inclination angle θ between the reflecting surface 114a and the horizontal reference surface not shown is between 10 degrees and 80 degrees, but the present invention does not For the limit. As such, the annular mirror 114 can reflect the appearance of the object to be tested 50 corresponding to the annular reflection region 112 to the image capturing unit 120 by the reflecting surface 114a. It can be seen that, by the arrangement of the annular reflection area 112, when the whole-circumference mirror group 110 and the object to be tested 50 relatively move, the object to be tested 50 can pass through the annular reflection area 112, so that the whole-circumferential mirror group 110 Thereby, the reflection object 50 corresponds to the appearance of the annular reflection region 112. Wherein, in the embodiment, the object to be tested 50 is not in contact with the full-circumference mirror group 110. That is, when the whole-peripheral mirror group 110 and the object to be tested 50 are relatively moved, and the object to be tested 50 passes through the annular reflection region 112, the object to be tested 50 does not contact the annular mirror 114 constituting the annular reflection region 112. So that the annular mirror 114 can reflect the appearance of the object to be tested 50 corresponding to the annular reflective region 112. In addition, in this embodiment, the image capturing unit 120 is, for example, a charge coupled device (CCD) camera or other suitable camera for obtaining an image reflected by the entire peripheral mirror group 110, but The invention does not limit the kind of the image capturing unit 120. When the full perimeter mirror set 110 is used After the annular mirror 114 reflects the appearance of the object to be tested 50 corresponding to the annular reflection region 112 to the image capturing unit 120, the image capturing unit 120 can obtain the full-circumference image A of the object to be tested 50 from below the object to be tested 50.

更進一步地說,當待測物50與全周反射鏡組110相對移動,而使待測物50通過環狀反射區域112時(如圖2所示),取像單元120可直接從待測物50的下方取得待測物50的底部影像B,並可藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀而取得待測物50的全周影像A(如圖4所示)。所述底部影像B即是待測物50的底部外觀轉換而成的影像,其係藉由取像單元120直接從待測物50的下方取得。藉此,底部影像B可用於計算待測物50的外徑、尺寸或相關參數,以進行待測物50的分級或分類。再者,所述全周影像A即是待測物50對應於環狀反射區域112的外觀轉換而成的影像。由於環狀反射區域112在待測物50通過時環繞在待測物50的周圍,故取像單元120所取得的全周影像A即為待測物50對應於環狀反射區域112的360度外觀。此外,在本實施例中,待測物50大致上呈現特定顏色。在取像單元120從待測物50的下方取得待測物50的全周影像A之後,處理單元130藉由判斷特定顏色在全周影像A中所佔比例而檢測待測物50對應於環狀反射區域112的外觀,例如是藉由判斷特定顏色在全周影像A中所佔比例是否符合預定值,即可得知特定顏色在全周影像A中的均勻性,亦可更進一步判斷特定顏色在全周影像A中是否具有色差。 Further, when the object to be tested 50 moves relative to the full-circumference mirror group 110 and the object to be tested 50 passes through the annular reflection region 112 (as shown in FIG. 2), the image capturing unit 120 can directly measure from the object to be tested. The bottom image B of the object to be tested 50 is obtained under the object 50, and the full-circumference image A of the object to be tested 50 is obtained by reflecting the appearance of the object to be tested 50 corresponding to the annular reflection region 112 by the full-circumference mirror group 110 ( As shown in Figure 4). The bottom image B is an image obtained by converting the bottom appearance of the object to be tested 50, and is taken directly from the bottom of the object to be tested 50 by the image capturing unit 120. Thereby, the bottom image B can be used to calculate the outer diameter, size or related parameters of the object to be tested 50 for classification or classification of the object to be tested 50. Furthermore, the full-circumference image A is an image in which the object to be tested 50 is converted corresponding to the appearance of the annular reflection region 112. Since the annular reflection area 112 surrounds the object to be tested 50 when the object to be tested 50 passes, the full-circumference image A obtained by the image capturing unit 120 is 360 degrees of the object to be tested 50 corresponding to the annular reflection area 112. Exterior. Further, in the present embodiment, the object to be tested 50 substantially presents a specific color. After the image capturing unit 120 obtains the full-circumference image A of the object to be tested 50 from the lower side of the object to be tested 50, the processing unit 130 detects that the object to be tested 50 corresponds to the ring by determining the proportion of the specific color in the full-circumference image A. The appearance of the reflective region 112 is, for example, determined whether the proportion of the specific color in the full-circumference image A satisfies a predetermined value, and the uniformity of the specific color in the full-circumference image A can be known, and the specificity can be further determined. Whether the color has a color difference in the entire week image A.

以果實,例如是草莓,作為待測物50為例,所述特定顏色例如是紅色。藉此,在取像單元120從作為待測物50的草莓的下方取得其底部影像B與全周影像A之後,處理單元130藉由底部影像B計算作為待測物50的草莓的外徑、尺寸或相關參數,並依據所得結果進行草莓的大小分級。再者,處理單元130藉由判斷紅色在全周影像A中所佔比例是否符合預定值,而得知紅色在全周影像A中的均勻性,進而得知果實的成熟度,亦可更進一步判斷紅色在全周影像A中是否具有色差,而得知果實在外觀上是否具有瑕疵(例如是凹痕),以藉此檢測果實的全周外觀,並依據所得結果進行草莓的成熟度分類。 Taking the fruit, for example, a strawberry, as the sample to be tested 50, the specific color is, for example, red. Therefore, after the image capturing unit 120 obtains the bottom image B and the full-circumference image A from the bottom of the strawberry as the object to be tested 50, the processing unit 130 calculates the outer diameter of the strawberry as the object to be tested 50 by the bottom image B, Size or related parameters, and based on the results obtained, the size of the strawberry is graded. Furthermore, the processing unit 130 can determine the uniformity of red in the full-circumference image A by judging whether the proportion of red in the full-period image A meets a predetermined value, and further know the maturity of the fruit, and can further It is judged whether or not the red color has a chromatic aberration in the full-circumference image A, and it is known whether the fruit has a flaw (for example, a dent) in appearance, thereby detecting the whole-week appearance of the fruit, and classifying the maturity of the strawberry based on the obtained result.

然而,本發明並不限制待測物50的種類。舉例而言,在其他未繪示的實施例中,待測物亦可為工件(例如是螺絲或者為烤漆物),其亦大致上呈現特定顏色(例如是鐵灰色)。藉此,在取像單元120從工件的下方取得其底部影像與全周影像之後,處理單元130藉由底部影像計算作為待測物的工件的外徑、尺寸或相關參數,並依據所得結果進行工件的大小分級。再者,處理單元130藉由判斷鐵灰色在全周影像中所佔比例是否符合預定值,即可得知鐵灰色在全周影像中的均勻性,進而得知工件是否褪色或烤漆不均勻,亦可更進一步判斷鐵灰色在全周影像中是否具有色差,而得知工件在外觀上是否具有瑕疵(例如是鏽蝕或刮痕),以藉此檢測工件的全周外觀,或更進一步依據所得結果進行工件的分類。由此可知,本實施例的全周反射取像模組100適用於各 種類型的待測物,且待測物只要通過全周反射取像模組100的環狀反射區域112即可藉由取像單元120取得其全周影像,進而應用在相關檢測中。 However, the present invention does not limit the kind of the object to be tested 50. For example, in other embodiments not shown, the object to be tested may also be a workpiece (for example, a screw or a lacquer), which also presents a specific color (for example, iron gray). Therefore, after the image capturing unit 120 obtains the bottom image and the full-circumference image from the bottom of the workpiece, the processing unit 130 calculates the outer diameter, the size, or the related parameter of the workpiece as the object to be tested by the bottom image, and according to the obtained result. The size of the workpiece is graded. Furthermore, the processing unit 130 can determine whether the iron gray is uniform in the full-circumference image by judging whether the proportion of the iron gray in the full-circumference image meets a predetermined value, and further whether the workpiece is faded or the paint is uneven. It is also possible to further determine whether the iron-gray has a chromatic aberration in the full-circumference image, and whether the workpiece has flaws in appearance (for example, rust or scratches), thereby detecting the full-circumference appearance of the workpiece, or further depending on the The result is the classification of the workpiece. Therefore, the full-circumference reflection imaging module 100 of the embodiment is applicable to each The type of the object to be tested, and the object to be tested can obtain the full-circumference image by the image capturing unit 120 through the annular reflection area 112 of the image capturing module 100, and then applied to the correlation detection.

再者,請參考圖2,在本實施例中,所述相對移動係指全周反射鏡組110相對於靜止不動的待測物50移動,使待測物50藉由全周反射鏡組110的移動而相對通過環狀反射區域112。具體而言,在本實施例中,全周反射取像模組100更包括移動單元140。所述移動單元140例如是機械手臂或其他適用的構件,而全周反射鏡組110與取像單元120配置於移動單元140上,以藉由移動單元140相對於待測物50移動。更進一步地說,全周反射鏡組110與取像單元120可藉由移動單元140可從待測物50下方沿環狀反射區域112的法線方向D相對於待測物50往上移動,直至待測物50通過環狀反射區域112,使全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀,且取像單元120從待測物50的下方取得待測物50對應於環狀反射區域112的全周影像A。藉此,本實施例的待測物50可以是果實(例如是草莓),且較佳地是活體作物(未從植株上採下),使待測物50處於吊掛狀態,而藉由全周反射鏡組110的移動通過環狀反射區域112。此外,當待測物為前述的工件(例如是螺絲或者為烤漆物)時,其亦可採用上述方法使全周反射鏡組110相對於待測物移動,本發明並不限制待測物50的種類,其可依據需求調整。 Furthermore, referring to FIG. 2, in the embodiment, the relative movement refers to the movement of the whole-circumference mirror group 110 relative to the stationary object 50, so that the object to be tested 50 is supported by the full-circumference mirror group 110. The movement moves relatively through the annular reflective region 112. Specifically, in the embodiment, the full-circumference reflection imaging module 100 further includes a moving unit 140. The moving unit 140 is, for example, a robot arm or other suitable component, and the full-circumference mirror group 110 and the image capturing unit 120 are disposed on the moving unit 140 to move relative to the object to be tested 50 by the moving unit 140. Further, the full-circumference mirror group 110 and the image capturing unit 120 can be moved upward from the object under test 50 in the normal direction D of the annular reflection region 112 relative to the object to be tested 50 by the moving unit 140. Until the object to be tested 50 passes through the annular reflection area 112, the whole-circumference mirror group 110 reflects the appearance of the object to be tested 50 corresponding to the annular reflection area 112, and the image capturing unit 120 obtains the object to be tested from below the object to be tested 50. 50 corresponds to the full-circumference image A of the annular reflection region 112. Thereby, the object to be tested 50 of the present embodiment may be a fruit (for example, a strawberry), and is preferably a living crop (not taken from the plant), so that the object to be tested 50 is in a hanging state, and The movement of the circumferential mirror group 110 passes through the annular reflective region 112. In addition, when the object to be tested is the aforementioned workpiece (for example, a screw or a lacquer), the whole-peripheral mirror group 110 can also be moved relative to the object to be tested by the above method, and the present invention does not limit the object to be tested 50. The type, which can be adjusted according to needs.

另外,在本實施例中,全周反射取像模組100亦可依據 需求配置輔助光源150。輔助光源150配置於全周反射鏡組110與取像單元120之間,例如是固定在取像單元120的周圍(如圖2),或固定在環狀反射鏡114的下方,並適於從待測物50的下方提供光線。然而,本發明不限制輔助光源150的位置以及配置與否,其可依據需求調整。舉例而言,當全周反射取像模組100在光線不充足的地方進行操作時,可藉由輔助光源150提供光線使背景環境變亮。然而,當全周反射取像模組100應用於光線充足的地方時,由於背景環境的亮度已符合需求,故亦可省略輔助光源150的使用,本發明不以此為限制。 In addition, in this embodiment, the full-circumference reflection imaging module 100 can also be based on The auxiliary light source 150 is configured as required. The auxiliary light source 150 is disposed between the full-circumference mirror group 110 and the image capturing unit 120, for example, fixed around the image capturing unit 120 (as shown in FIG. 2), or fixed under the annular mirror 114, and is adapted to be Light is provided below the object to be tested 50. However, the present invention does not limit the position and configuration of the auxiliary light source 150, which can be adjusted as needed. For example, when the full-circumference reflection image capturing module 100 is operated in a place where the light is insufficient, the background light can be brightened by the auxiliary light source 150 providing light. However, when the full-circumference reflection image capturing module 100 is applied to a place with sufficient light, since the brightness of the background environment has met the requirements, the use of the auxiliary light source 150 may be omitted, and the present invention is not limited thereto.

圖5是本發明另一實施例的全周反射取像模組的側視示意圖。請參考圖5,在本實施例中,所述相對移動係指待測物50a相對於靜止不動的全周反射鏡組110a移動,使待測物50a通過環狀反射區域112。具體而言,在本實施例中,全周反射取像模組100a更包括移動單元140a,配置於全周反射鏡組110的一側,並適於相對於全周反射鏡組110移動,以帶動待測物50a相對於全周反射鏡組110移動而通過環狀反射區域112。更進一步地說,移動單元140a例如是夾具,可夾持待測物50a從全周反射鏡組110上方沿環狀反射區域112的法線方向D往下移動,直至待測物50a通過環狀反射區域112,而全周反射鏡組110反射待測物50a對應於環狀反射區域112的外觀,使取像單元120從待測物50a的下方取得待測物50對應於環狀反射區域112的全周影像A。此外,在其他實施例中,所述相對移動亦可為全周反射鏡組110與待測 物50或50a都產生移動。本發明不限制全周反射鏡組110與待測物50或50a中何者產生移動,只要待測物50或50a可據此通過環狀反射區域112即可。 FIG. 5 is a side elevational view of a full-circumference reflection imaging module according to another embodiment of the present invention. Referring to FIG. 5, in the embodiment, the relative movement means that the object to be tested 50a moves relative to the stationary full-circumference mirror group 110a, so that the object to be tested 50a passes through the annular reflection area 112. Specifically, in the embodiment, the full-circumference reflection imaging module 100a further includes a moving unit 140a disposed on one side of the full-circumference mirror group 110 and adapted to move relative to the full-circumference mirror group 110. The test object 50a is moved relative to the full-circumferance mirror group 110 to pass through the annular reflection region 112. Further, the moving unit 140a is, for example, a clamp that can move the object to be tested 50a from above the full-circumference mirror group 110 in the normal direction D of the annular reflection region 112 until the object to be tested 50a passes through the ring. The reflection region 112, and the entire circumference mirror group 110 reflects the appearance of the object to be tested 50a corresponding to the annular reflection region 112, so that the image capturing unit 120 obtains the object to be tested 50 from below the object to be tested 50a corresponding to the annular reflection region 112. Full-circle image A. In addition, in other embodiments, the relative movement may also be the full-circumference mirror group 110 and the measured Both the object 50 or 50a produces a movement. The present invention does not limit which of the whole-peripheral mirror group 110 and the object to be tested 50 or 50a is moved, as long as the object to be tested 50 or 50a can pass through the annular reflection region 112.

藉此,本實施例的全周反射取像模組100可藉由全周反射鏡組110與待測物50的相對移動(可為兩者中的其中一者相對於另一者移動,亦可為兩者均產生移動)而使待測物50通過全周反射鏡組110的環狀反射區域112,並使取像單元1120從待測物50的下方取得藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀而得的全周影像A,並藉由處理單元130進一步判斷特定顏色在全周影像A中所佔比例而檢測待測物50對應於環狀反射區域112的外觀。據此,本發明的全周反射取像模組100可在不接觸待測物50的情況下取得待測物50的全周影像,以避免待測物50在取像過程中產生損傷(例如可避免作為待測物50的果實藉由額外的治具夾持或滾動而受到損傷),亦可避免待測物50的局部受到遮蔽而影響全周影像A的完整度(例如可避免將待測物50放置在額外的平台上而遮蔽其局部外觀)。 Therefore, the full-circumference reflection imaging module 100 of the embodiment can move relative to the object to be tested 50 by the whole-peripheral mirror group 110 (may be one of the two moves relative to the other, The object to be tested 50 can pass through the annular reflection region 112 of the full-circumference mirror group 110, and the image capturing unit 1120 can be taken from the lower side of the object to be tested 50 by the entire circumference mirror group 110. The reflected object 50 corresponds to the full-circumference image A obtained by the appearance of the annular reflection region 112, and the processing unit 130 further determines the proportion of the specific color in the full-circumference image A to detect that the object to be tested 50 corresponds to the ring. The appearance of the reflective region 112. Accordingly, the full-circumference reflection imaging module 100 of the present invention can obtain the full-circumference image of the object to be tested 50 without contacting the object to be tested 50, so as to prevent the object 50 from being damaged during the image capturing process (for example, It can be avoided that the fruit as the object to be tested 50 is damaged by clamping or rolling with an additional jig), and the partiality of the object to be tested 50 can be prevented from being obscured to affect the integrity of the image A of the whole week (for example, it can be avoided) The test object 50 is placed on an additional platform to obscure its partial appearance).

圖6是本發明一實施例的全周反射取像方法的流程圖。請參考圖2、圖4與圖6,在本實施例中,全周反射取像方法適於取得待測物50(如圖2所示)的全周影像A(如圖4所示)。全周反射取像方法包括下列步驟。 6 is a flow chart of a full-circumference reflection imaging method according to an embodiment of the present invention. Referring to FIG. 2, FIG. 4 and FIG. 6, in the embodiment, the full-circumference reflection imaging method is adapted to obtain the full-circumference image A of the object to be tested 50 (shown in FIG. 2) (as shown in FIG. 4). The full-circumferential reflection imaging method includes the following steps.

首先,在步驟S110中,相對移動全周反射鏡組110與待測物50,使待測物50通過全周反射鏡組110的環狀反射區域112, 並藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀。有關全周反射鏡組110以及所述相對移動的說明可參考前述內容,在此不多加贅述。藉此,藉由全周反射鏡組110與待測物50的相對移動,待測物50可通過全周反射鏡組110的環狀反射區域112,並藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀。換言之,藉由環狀反射區域112的設計,可在相對移動全周反射鏡組110與待測物50的步驟(步驟S110)中反射待測物50對應於環狀反射區域112的360度外觀。 First, in step S110, the whole-peripheral mirror group 110 and the object to be tested 50 are relatively moved, so that the object to be tested 50 passes through the annular reflection region 112 of the full-circumference mirror group 110, The appearance of the object to be tested 50 corresponding to the annular reflection region 112 is reflected by the full-circumference mirror group 110. For a description of the full-circumference mirror group 110 and the relative movement, reference may be made to the foregoing, and no further details are provided herein. Thereby, the object to be tested 50 can pass through the annular reflection area 112 of the full-circumference mirror group 110 by the relative movement of the full-circumference mirror group 110 and the object to be tested 50, and is reflected by the entire-circumferential mirror group 110. The object 50 corresponds to the appearance of the annular reflection region 112. In other words, by the design of the annular reflection region 112, the 360-degree appearance of the object to be tested 50 corresponding to the annular reflection region 112 can be reflected in the step of relatively moving the entire circumference mirror group 110 and the object to be tested 50 (step S110). .

之後,在步驟S120中,藉由取像單元120從待測物50的下方取得待測物50的底部影像B,並藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的外觀而取得待測物50的全周影像A。換言之,全周反射鏡組110將待測物50對應於環狀反射區域112的360度外觀反射至取像單元120之後,取像單元120可藉此取得待測物50對應於環狀反射區域112的全周影像A(如圖4所示)。所述全周影像A即為取像單元120藉由全周反射鏡組110反射待測物50對應於環狀反射區域112的360度外觀所取得的影像。同時,取像單元120亦可直接從待測物50的下方取得待測物50的底部影像B。有關取像單元120的說明可參考前述內容,在此不多加贅述。 Then, in step S120, the bottom image B of the object to be tested 50 is obtained from the bottom of the object to be tested 50 by the image capturing unit 120, and the object to be tested 50 is reflected by the full-circumference mirror group 110 corresponding to the annular reflection region. The entire circumference image A of the object to be tested 50 is obtained by the appearance of 112. In other words, after the full-circumference mirror group 110 reflects the 360-degree appearance of the object to be tested 50 corresponding to the annular reflection region 112 to the image capturing unit 120, the image capturing unit 120 can thereby obtain the object to be tested 50 corresponding to the annular reflection region. The full-circumference image A of 112 (shown in Figure 4). The full-circumference image A is an image obtained by the image capturing unit 120 reflecting the 360-degree appearance of the object to be tested 50 corresponding to the annular reflection region 112 by the full-circumference mirror group 110. At the same time, the image capturing unit 120 can also directly obtain the bottom image B of the object to be tested 50 from below the object to be tested 50. For the description of the image capturing unit 120, reference may be made to the foregoing content, and details are not described herein.

最後,在步驟S130中,藉由處理單元130判斷特定顏色在全周影像A中所佔比例,以檢測待測物50對應於環狀反射區域112的外觀。換言之,在本實施例中,待測物50大致上呈現特定 顏色。以前述的果實(例如是草莓)作為待測物50為例,所述特定顏色例如為紅色。據此,在取像單元120取得待測物50對應於環狀反射區域112的全周影像A的步驟(步驟S120)之後,可進一步藉由處理單元130判斷特定顏色在全周影像A中所佔比例,以檢測待測物50對應於環狀反射區域112的外觀。類似地,在前述藉由取像單元120取得的底部影像B之後,處理單元130亦可藉由底部影像B計算待測物50的外徑、尺寸或相關參數,並依據所得結果進行待測物50的分級或分類。有關處理單元130的說明可參考前述內容,在此不多加贅述。 Finally, in step S130, the processing unit 130 determines the proportion of the specific color in the full-circumference image A to detect the appearance of the object to be tested 50 corresponding to the annular reflection region 112. In other words, in the present embodiment, the object to be tested 50 is substantially presented with a specific colour. Taking the aforementioned fruit (for example, strawberry) as an example of the object to be tested 50, the specific color is, for example, red. Accordingly, after the image capturing unit 120 obtains the step (step S120) that the object to be tested 50 corresponds to the full-circumference image A of the annular reflection region 112, the processing unit 130 may further determine that the specific color is in the full-circumference image A. The ratio is measured to detect the appearance of the object to be tested 50 corresponding to the annular reflection region 112. Similarly, after the bottom image B obtained by the image capturing unit 120, the processing unit 130 may calculate the outer diameter, the size, or the related parameter of the object to be tested 50 by using the bottom image B, and perform the object to be tested according to the obtained result. Classification or classification of 50. For a description of the processing unit 130, reference may be made to the foregoing content, and details are not described herein.

由此可知,藉由本實施例的全周反射取像方法,可在不接觸待測物50的情況下取得待測物50對應於環狀反射區域112的全周影像A,以避免待測物50在取像過程中產生損傷,亦可避免待測物50的局部受到遮蔽而影響全周影像A的完整度。此外,由於上述方法可取得待測物50對應於環狀反射區域112的全周影像A,故當環狀反射區域112的高度範圍可涵蓋到大部分的待測物50時,全周反射取像模組100(繪示於圖2)可藉由上述方法一次取得對應於待測物50整體的全周影像。 Therefore, the full-circumference image capturing method of the present embodiment can obtain the full-circumference image A of the object to be tested 50 corresponding to the annular reflection region 112 without contacting the object to be tested 50, so as to avoid the object to be tested. 50 damage is generated during the image capturing process, and the partiality of the object to be tested 50 is prevented from being obscured to affect the integrity of the image A of the whole week. In addition, since the above method can obtain the full-circumference image A of the object to be tested 50 corresponding to the annular reflection region 112, when the height range of the annular reflection region 112 can cover most of the object to be tested 50, the whole-peripheral reflection is taken. The image module 100 (shown in FIG. 2) can obtain a full-circumference image corresponding to the entire object 50 to be tested at a time by the above method.

圖7是本發明另一實施例的全周反射取像方法的流程圖。圖8是圖7的全周反射取像方法所取得的多段全周影像的示意圖。圖9是圖8的多段全周影像經由二值化的展開示意圖。請參考圖2、圖7與圖8,在本實施例中,全周反射取像方法包括下列步驟。以下將以文字搭配圖式說明全周反射取像方法的步驟, 其中圖8繪示圖7的全周反射取像方法所取得的多段全周影像的示意圖,並搭配全周反射鏡組110與待測物50的相對位置,以使說明更為清楚易懂。此外,圖9繪示圖8的多段全周影像經由二值化的展開示意圖。所述全周影像通常為彩色,以顯示出前述的特定顏色。經由二值化而成為黑白狀態,有助於判斷特定顏色在全周影像中所佔比例,但本發明不限制處理單元130需將全周影像二值化後進行判斷,其可依據需求調整。 7 is a flow chart of a full-circumference reflection imaging method according to another embodiment of the present invention. FIG. 8 is a schematic diagram of a multi-segment full-circle image obtained by the full-circumference reflection imaging method of FIG. 7. FIG. FIG. 9 is a schematic exploded view of the multi-segment full-circumference image of FIG. 8 via binarization. Referring to FIG. 2, FIG. 7, and FIG. 8, in the embodiment, the full-circumference reflection imaging method includes the following steps. The following is a description of the steps of the full-circumference reflection method in a textual diagram. FIG. 8 is a schematic diagram of a multi-segment full-circumference image obtained by the full-circumference reflection imaging method of FIG. 7 , and is matched with the relative positions of the full-circumference mirror group 110 and the object to be tested 50 to make the description clearer and easier to understand. In addition, FIG. 9 is a schematic diagram showing the expansion of the multi-segment full-circumference image of FIG. 8 via binarization. The full-circumference image is typically colored to show the aforementioned particular color. The black-and-white state through binarization helps to determine the proportion of a particular color in the full-circle image. However, the present invention does not limit the processing unit 130 to binarize the full-circumference image, which can be adjusted according to requirements.

首先,請參考圖2、圖7與圖8的(a)處,在步驟S210中,相對移動全周反射鏡組110與待測物50至取像位置P1,並藉由取像單元120取得全周影像A1。有關全周反射鏡組110與所述相對移動的說明可參考前述內容,在此不多加贅述。 First, referring to FIG. 2, FIG. 7 and FIG. 8(a), in step S210, the whole-peripheral mirror group 110 and the object to be tested 50 are relatively moved to the image capturing position P1, and obtained by the image capturing unit 120. Full-circle image A1. For a description of the full-circumference mirror group 110 and the relative movement, reference may be made to the foregoing, and no further details are provided herein.

接著,請參考圖7、圖8的(a)處與圖9的(a)處,在相對移動全周反射鏡組110與待測物50,並藉由取像單元120取得全周影像A1的步驟(步驟S110)之後,在步驟S220中,依據全周影像A1判斷待測物50是否進入環狀反射區域112。具體而言,判斷待測物50是否進入環狀反射區域112的步驟包括判斷特定顏色在全周影像A1中所佔比例是否大於一預定值。舉例而言,以果實(例如是草莓)作為待測物50為例,其大致上具有特定顏色為紅色,故在取像單元120取得全周影像A1(如圖8的(a)處)之後,可藉由處理單元130(繪示於圖2)進一步將全周影像A1二值化成黑白狀態(如圖9的(a)處),藉此判斷紅色(對應於二值化後的白色區域)在全周影像A1中所佔比例是否大於預定值。所述預定 值在本實施例中為10%,亦即若判斷全周影像A1二值化後的白色區域在全周影像A1中所佔比例大於10%,即可視為待測物50已進入環狀反射區域112。若否,則代表待測物50尚未進入環狀反射區域112,需重複步驟S210至S220使待測物50與全周反射鏡組110相對移動而重新取像並判斷。 Next, referring to FIG. 7 , FIG. 8( a ) and FIG. 9( a ), the full-circumference mirror group 110 and the object to be tested 50 are relatively moved, and the full-circle image A1 is obtained by the image capturing unit 120 . After the step (step S110), in step S220, it is determined whether the object to be tested 50 enters the annular reflection region 112 based on the full-circumference image A1. Specifically, the step of determining whether the object to be tested 50 enters the annular reflection region 112 includes determining whether the proportion of the specific color in the full-circumference image A1 is greater than a predetermined value. For example, taking the fruit (for example, strawberry) as the sample to be tested 50 as an example, which has a specific color in a red color, after the image capturing unit 120 obtains the full-circumference image A1 (as shown in (a) of FIG. 8 ) The full-cycle image A1 can be further binarized into a black-and-white state by the processing unit 130 (shown in FIG. 2) (as shown in FIG. 9(a)), thereby determining red (corresponding to the binarized white region). Whether the proportion in the full-circumference image A1 is greater than a predetermined value. The reservation The value is 10% in this embodiment, that is, if it is judged that the white area after binarization of the full-circumference image A1 accounts for more than 10% in the full-circumference image A1, it can be regarded that the object to be tested 50 has entered the ring reflection. Area 112. If not, it means that the object to be tested 50 has not entered the annular reflection area 112, and steps S210 to S220 are repeated to move the object to be tested 50 relative to the entire circumference mirror group 110 to re-image and judge.

接著,請參考圖7與圖8的(a)處,以前述取得全周影像A1的判斷結果為待測物50已進入環狀反射區域112為例,在待測物50進入環狀反射區域112之後,在步驟S230中,以待測物50與全周反射鏡組110的相對位置(即取像位置P1)作為起始取像位置,持續相對移動全周反射鏡組110與待測物50至另一取像位置P2,並藉由取像單元120取得待測物50對應於環狀反射區域112的另一全周影像A2(如圖8的(b)處)。 Next, referring to FIG. 7 and FIG. 8( a ), the determination result of obtaining the full-circumference image A1 is that the object to be tested 50 has entered the annular reflection region 112 as an example, and the object to be tested 50 enters the annular reflection region. After 112, in step S230, the relative position of the object to be tested 50 and the full-circumference mirror group 110 (ie, the image capturing position P1) is taken as the initial image capturing position, and the relative-moving full-circumference mirror group 110 and the object to be tested are continuously moved. 50 to another image capturing position P2, and the image capturing unit 120 obtains another full-circumference image A2 of the object to be tested 50 corresponding to the annular reflection region 112 (as shown in (b) of FIG. 8).

接著,請參考圖7、圖8的(b)處與圖9的(b)處,在藉由取像單元120取得待測物50的全周影像A2的步驟(步驟S230)之後,在步驟S240中,依據全周影像A2判斷待測物50是否移出環狀反射區域112。具體而言,判斷待測物50是否移出環狀反射區域112的步驟包括判斷特定顏色在全周影像A2中所佔比例是否小於一預定值。舉例而言,作為待測物50的果實(例如是草莓)具有特定顏色為紅色,故在取像單元120取得全周影像A2(如圖8的(b)處)並二值化成黑白狀態(如圖9的(b)處)之後,處理單元130可藉此判斷紅色(對應於二值化後的白色區域)在全周影像A2中所佔比例是否小於預定值。所述預定值在本實施例中為 40%,亦即在判斷全周影像A2二值化後的白色區域在全周影像A2中所佔比例小於40%。或者,亦可反向判斷全周影像A2二值化後的黑色區域(即二值化前的其他顏色區域,例如是果實的葉子或者是背景環境)在全周影像A2中所佔比例大於60%,即可視為待測物50已移出環狀反射區域112。上述比例僅用於舉例說明,非用於限定本發明。若否,則代表待測物50尚未移出環狀反射區域112,需重複步驟S230至S240使待測物50與全周反射鏡組110相對移動而重新取像並判斷。 Next, referring to FIG. 7 , FIG. 8( b ) and FIG. 9( b ), after the step of acquiring the full-circumference image A2 of the object to be tested 50 by the image capturing unit 120 (step S230 ), in the step In S240, it is determined whether the object to be tested 50 moves out of the annular reflection area 112 according to the full-circumference image A2. Specifically, the step of determining whether the object to be tested 50 moves out of the annular reflection area 112 includes determining whether the proportion of the specific color in the full-circumference image A2 is less than a predetermined value. For example, the fruit (for example, strawberry) as the object to be tested 50 has a specific color of red, so that the image capturing unit 120 obtains the full-circumference image A2 (as shown in (b) of FIG. 8 ) and binarizes it into a black-and-white state ( After (b) of FIG. 9 , the processing unit 130 can thereby determine whether the proportion of red (corresponding to the binarized white area) in the full-circumference image A2 is less than a predetermined value. The predetermined value is in this embodiment 40%, that is, the white area after the second-degree image A2 binarization is judged to be less than 40% in the full-circumference image A2. Alternatively, it is also possible to reversely determine the black area after binarization of the full-circumference image A2 (ie, other color areas before binarization, such as the leaves of the fruit or the background environment), and the proportion in the full-circumference image A2 is greater than 60. %, it can be considered that the object to be tested 50 has been removed from the annular reflection region 112. The above ratios are for illustrative purposes only and are not intended to limit the invention. If not, it means that the object to be tested 50 has not been removed from the annular reflection area 112, and steps S230 to S240 are repeated to move the object to be tested 50 relative to the entire circumference mirror group 110 to re-image and judge.

舉例而言,當處理單元130判斷特定顏色在全周影像A2中所佔比例未小於預定值,即位在取像位置P2的待測物50尚未移出環狀反射區域112,則需重新執行步驟S230至S240,持續相對移動全周反射鏡組110與待測物50至另一取像位置P3,並藉由取像單元120取得待測物50對應於環狀反射區域112的另一全周影像A3(如圖8的(c)處)。之後,依據全周影像A3判斷待測物50是否移出環狀反射區域112(例如藉由圖9的(c)處的二值化結果判斷特定顏色在全周影像A3所佔比例)。若位在取像位置P3的待測物50經判斷仍未移出環狀反射區域112,則更重新執行步驟S230至S240,例如依序在取像位置P4至P6取得全周影像A4至A6(如圖8的(d)至(f)處),之後依據全周影像A4至A6依序判斷待測物50是否移出環狀反射區域112(例如藉由圖9的(d)至(f)處的二值化結果判斷特定顏色在全周影像A4至A6所佔比例)。在本實施例中,各取像位置P1至P6之間的距離為8毫米 (millimeter,mm)至10毫米,但本發明不以此為限制,其可依據需求調整。 For example, when the processing unit 130 determines that the proportion of the specific color in the full-circle image A2 is not less than a predetermined value, that is, the object to be tested 50 at the image capturing position P2 has not moved out of the annular reflection region 112, step S230 needs to be performed again. Up to S240, the whole-peripheral mirror group 110 and the object to be tested 50 are continuously moved to another image capturing position P3, and another full-circumference image of the object to be tested 50 corresponding to the annular reflection region 112 is obtained by the image capturing unit 120. A3 (as in (c) of Fig. 8). Thereafter, it is judged based on the full-circumference image A3 whether or not the object 50 is moved out of the annular reflection region 112 (for example, by the binarization result at (c) of FIG. 9 , the ratio of the specific color in the full-circumference image A3 is determined). If the object to be tested 50 at the image capturing position P3 is judged that the annular reflection region 112 has not been removed, the steps S230 to S240 are further performed, for example, the full-cycle images A4 to A6 are sequentially acquired at the image capturing positions P4 to P6 ( As shown in (d) to (f) of FIG. 8 , it is sequentially determined whether the object to be tested 50 moves out of the annular reflection region 112 according to the full-circumference images A4 to A6 (for example, by (d) to (f) of FIG. 9 . The binarization result determines the proportion of a particular color in the full-circumference image A4 to A6). In this embodiment, the distance between each of the image taking positions P1 to P6 is 8 mm. (millimeter, mm) to 10 mm, but the invention is not limited thereto, and it can be adjusted according to requirements.

接著,請參考圖7與圖8的(f)處,以前述取得全周影像A6的判斷結果為待測物50已移出環狀反射區域112為例,在待測物50移出環狀反射區域112之後,在步驟S250中,以待測物50與全周反射鏡組110的相對位置(即取像位置P6)作為最終取像位置,停止相對移動全周反射鏡組110與待測物50。換言之,藉由全周反射取像模組100進行全周反射與取像的動作至此為止。待測物50經由上述步驟通過環狀反射區域112,並藉由取像單元120分段取得多個全周影像A1至A6,故可藉由全周影像A1至A6得知待測物50的多個局部的360度外觀,進而可組合得知待測物50的整體的360度外觀。 Next, referring to FIG. 7 and FIG. 8(f), taking the above-mentioned determination result of the full-circumference image A6 as an example, the object to be tested 50 has been removed from the annular reflection region 112, and the object to be tested 50 is removed from the annular reflection region. After 112, in step S250, the relative position of the object to be tested 50 and the full-circumferance mirror group 110 (ie, the image capturing position P6) is taken as the final image capturing position, and the relative movement of the entire circumference of the mirror group 110 and the object to be tested is stopped. . In other words, the full-circumference reflection and image capturing operation by the full-circumference reflection imaging module 100 is performed up to this point. The object to be tested 50 passes through the annular reflection area 112 through the above steps, and the plurality of full-circumference images A1 to A6 are obtained by the image capturing unit 120. Therefore, the object 50 can be known by the full-circumference images A1 to A6. A plurality of partial 360-degree appearances, in turn, can be combined to obtain an overall 360-degree appearance of the object to be tested 50.

此外,在待測物50移出環狀反射區域112而完成一連串的全周取像動作之後,請參考圖2、圖7至圖9,在步驟S260中,依據全周影像A1至A6進行色差判斷。所述色差判斷包括判斷特定顏色在各全周影像A1至A6中所佔比例,以檢測特定顏色的均勻性,及/或判斷特定顏色在各全周影像A1至A6中的不同區域的色差,以檢測待測物的瑕疵。舉例而言,以果實(例如是草莓)作為待測物50進行說明,所述色差判斷包括判斷特定顏色(例如是紅色)在各全周影像A1至A6中所佔比例,以檢測特定顏色的均勻性,進而可對照處理單元130內建的資料庫(未繪示)得知作為待測物50的果實的成熟度。或者,所述色差判斷亦可為判斷 特定顏色(例如是紅色)在各全周影像A1至A6中的不同區域的色差,以檢測作為待測物的果實的瑕疵。 In addition, after the object to be tested 50 moves out of the annular reflection area 112 to complete a series of full-cycle image capturing operations, please refer to FIG. 2, FIG. 7 to FIG. 9. In step S260, color difference determination is performed according to the full-circumference images A1 to A6. . The color difference determination includes determining a proportion of a specific color in each of the full-circumference images A1 to A6 to detect uniformity of a specific color, and/or determining a color difference of a specific color in a different region of each of the full-circumference images A1 to A6, To detect the flaw of the analyte. For example, a fruit (for example, a strawberry) is described as the object to be tested 50, and the color difference determination includes determining a proportion of a specific color (for example, red) in each of the full-length images A1 to A6 to detect a specific color. The uniformity, and thus the maturity of the fruit as the test object 50 can be known against the database (not shown) built in the processing unit 130. Alternatively, the color difference judgment may also be judged The color difference of a specific color (for example, red) in different regions of each of the entire week images A1 to A6 to detect the flaw of the fruit as the object to be tested.

更進一步地說,處理單元130內建的資料庫可事先內建作為待測物50的果實的特定顏色在各種成熟度時的比例/均勻性。舉例而言,當作為待測物50的果實整體均為紅色時(紅色佔各全周影像A1至A6的比例為100%),可視為其成熟度為100%。相對地,當待測物50僅有局部為紅色時(紅色在各全周影像A1至A6所佔比例均為60%,或者紅色在其中部分全周影像A1與A6所佔比例僅為60%),則可視為其成熟度僅有60%。上述判斷方式與判斷數值僅用於舉例說明,並非用以限定本發明。類似地,所述色差判斷亦可為判斷特定顏色在各全周影像A1至A6中所佔比例。舉例而言,當圖8的全周影像A1至A6經由二值化而得到如圖9所示的黑白狀態時,白色部分大致上對應於待測物50的特定顏色(例如是紅色),而黑色部分大致上對應於特定顏色之外的其他顏色(例如是果實的葉子或是背景環境)。藉此,若特定顏色二值化為白色區域之後具有黑點,例如是圖9的(b)處的黑點D1與D2,其代表特定顏色所對應的區域具有其他顏色。藉此,形成黑點D1與D2之處即為特定顏色在全周影像A2中具有色差之處,進而可得知作為待測物50的果實在取像位置P2時對應於環狀反射區域112之處具有瑕疵,例如是位在果實表面的凹痕或蛀孔。 Furthermore, the database built in the processing unit 130 can be built in advance as a ratio/uniformity of the specific color of the fruit of the object to be tested 50 at various maturity levels. For example, when the whole fruit as the object to be tested 50 is red (the ratio of red to the full-circumference images A1 to A6 is 100%), it can be regarded as the maturity of 100%. In contrast, when the object to be tested 50 is only partially red (the proportion of red in each full-peripheral image A1 to A6 is 60%, or the proportion of red in some of the full-circumference images A1 and A6 is only 60%). ), it can be seen as only 60% of its maturity. The above judgment manners and judgment values are for illustrative purposes only and are not intended to limit the present invention. Similarly, the color difference determination may also determine the proportion of a particular color in each of the full-circumference images A1 to A6. For example, when the full-circumference images A1 to A6 of FIG. 8 are obtained by binarization to obtain a black-and-white state as shown in FIG. 9, the white portion substantially corresponds to a specific color (for example, red) of the object 50 to be tested, and The black portion generally corresponds to a color other than a specific color (for example, a fruit leaf or a background environment). Thereby, if the specific color is binarized to have a black dot after the white region, for example, the black dots D1 and D2 at (b) of FIG. 9 , the region corresponding to the specific color has other colors. Thereby, the black spots D1 and D2 are formed, that is, the specific color has a color difference in the full-circumference image A2, and it is further known that the fruit as the object to be tested 50 corresponds to the annular reflection area 112 at the image capturing position P2. There are defects, such as dents or pupils on the surface of the fruit.

類似地,藉由上述方法,亦可分次取得作為待測物的工件(例如是螺絲或是烤漆物)的多個全周影像,並藉由判斷特定 顏色(例如是鐵灰色)在各全周影像中的均勻性而得知作為待測物的工件是否產生褪色或烤漆不均勻,或者判斷特定顏色在各全周影像中是否具有色差而得知作為待測物的工件是否具有瑕疵(例如是鏽蝕或刮傷)。由此可知,上述的全周反射取像模組100與全周反射取像方法適用於各種可通過環狀反射區域112的待測物,本發明不限制待測物的種類。 Similarly, by the above method, a plurality of full-circumference images of the workpiece (for example, a screw or a lacquer) as the object to be tested can be obtained in stages, and by determining the specificity The color (for example, iron gray) is uniform in each full-circumference image to know whether the workpiece as the object to be tested is discolored or unevenly painted, or whether a specific color has a color difference in each full-length image. Whether the workpiece of the object to be tested has flaws (for example, rust or scratch). Therefore, the above-described full-circumference reflection imaging module 100 and the full-circumference reflection imaging method are applicable to various objects that can pass through the annular reflection region 112, and the present invention does not limit the type of the object to be tested.

綜上所述,在本發明的全周反射取像模組與全周取像方法中,全周反射鏡組與待測物適於相對移動,使待測物通過全周反射鏡組的環狀反射區域,而全周反射鏡組藉此反射待測物對應於環狀反射區域的外觀。之後,取像單元適於從待測物的下方取得藉由全周反射鏡組反射待測物對應於環狀反射區域的外觀而得的全周影像。再者,處理單元適於依據全周影像檢測待測物的外觀,例如是判斷待測物的特定顏色在全周影像中所佔比例,而判斷待測物的特定顏色的均勻性或判斷是否色差。據此,本發明的全周反射取像模組與全周取像方法適於在不接觸待測物的情況下取得待測物的全周影像,以避免待測物在取像過程中產生損傷,亦可避免待測物的局部受到遮蔽而影響全周影像的完整度。 In summary, in the full-circumference reflection imaging module and the full-circumference imaging method of the present invention, the whole-peripheral mirror group and the object to be tested are adapted to move relative to each other, so that the object to be tested passes through the ring of the full-circumference mirror group. The reflective region, and the full-circumferential mirror group thereby reflects the appearance of the object to be tested corresponding to the annular reflective region. Thereafter, the image capturing unit is adapted to obtain, from the lower side of the object to be tested, a full-circumferential image obtained by reflecting the appearance of the object to be tested corresponding to the annular reflection region by the entire peripheral mirror group. Furthermore, the processing unit is adapted to detect the appearance of the object to be tested according to the full-circumference image, for example, to determine the proportion of the specific color of the object to be tested in the image of the whole week, and to determine the uniformity of the specific color of the object to be tested or to determine whether Color difference. Accordingly, the full-circumference reflection imaging module and the full-circumference imaging method of the present invention are suitable for obtaining a full-circumference image of the object to be tested without contacting the object to be tested, so as to prevent the object to be detected from being generated during the image capturing process. Damage can also prevent the locality of the object to be tested from being obscured and affecting the integrity of the image throughout the week.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

50‧‧‧待測物 50‧‧‧Test object

100‧‧‧全周反射取像模組 100‧‧‧Full-cycle reflection imaging module

110‧‧‧全周反射鏡組 110‧‧‧Full-Circumference Mirror Set

112‧‧‧環狀反射區域 112‧‧‧Circular reflection area

114‧‧‧環狀反射鏡 114‧‧‧ annular mirror

114a‧‧‧反射面 114a‧‧‧reflecting surface

120‧‧‧取像單元 120‧‧‧Image capture unit

130‧‧‧處理單元 130‧‧‧Processing unit

140‧‧‧移動單元 140‧‧‧Mobile unit

150‧‧‧輔助光源 150‧‧‧Auxiliary light source

D‧‧‧法線方向 D‧‧‧ normal direction

θ‧‧‧傾斜角 θ‧‧‧Tilt angle

Claims (20)

一種全周反射取像模組,適於取得一待測物的一全周影像,該全周反射取像模組包括:一全周反射鏡組,具有一環狀反射區域,該全周反射鏡組與該待測物適於相對移動,使該待測物通過該環狀反射區域,而該全周反射鏡組反射該待測物對應於該環狀反射區域的外觀;以及一取像單元,配置於該全周反射鏡組的一側,並適於從該待測物的下方取得藉由該全周反射鏡組反射該待測物對應於該環狀反射區域的外觀而得的一全周影像。 A full-circumference reflection imaging module is adapted to obtain a full-circumference image of a test object, the full-circumference reflection image capturing module comprising: a full-circumference mirror group having an annular reflection region, the full-circumference reflection The mirror group and the object to be tested are adapted to move relative to each other, so that the object to be tested passes through the annular reflection region, and the full-circumference mirror group reflects the appearance of the object to be tested corresponding to the annular reflection region; The unit is disposed on one side of the full-circumference mirror group, and is adapted to obtain, from the bottom of the object to be tested, the appearance of the object to be tested corresponding to the annular reflection region by the full-circumference mirror group A full week image. 如申請專利範圍第1項所述的全周反射取像模組,其中該全周反射鏡組包括一環狀反射鏡,該環狀反射鏡構成該環狀反射區域,以反射該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging module of claim 1, wherein the full-circumference mirror group comprises an annular mirror, the annular mirror forming the annular reflection area to reflect the object to be tested Corresponds to the appearance of the annular reflective area. 如申請專利範圍第2項所述的全周反射取像模組,其中該環狀反射鏡具有一反射面,該反射面朝向該取像單元傾斜。 The full-circumference reflection imaging module of claim 2, wherein the annular mirror has a reflecting surface that is inclined toward the image capturing unit. 如申請專利範圍第3項所述的全周反射取像模組,其中該反射面與一水平基準面之間的一傾斜角介於10度至80度之間。 The full-circumference reflection imaging module of claim 3, wherein an inclination angle between the reflective surface and a horizontal reference surface is between 10 degrees and 80 degrees. 如申請專利範圍第1項所述的全周反射取像模組,其中該全周反射鏡組包括多個反射鏡,彼此緊密排列構成該環狀反射區域,以反射該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging module of claim 1, wherein the full-circumference mirror group comprises a plurality of mirrors arranged closely to each other to form the annular reflection region to reflect the object to be tested corresponding to the The appearance of the annular reflection area. 如申請專利範圍第1項所述的全周反射取像模組,更包括:一輔助光源,配置於該全周反射鏡組與該取像單元之間,並 適於從該待測物的下方提供一光線。 The full-circumference reflection imaging module of claim 1, further comprising: an auxiliary light source disposed between the full-circumference mirror group and the image capturing unit, and Suitable for providing a light from below the object to be tested. 如申請專利範圍第1項所述的全周反射取像模組,更包括:一移動單元,該全周反射鏡組配置於該移動單元上,以藉由該移動單元相對於該待測物移動。 The full-circumference reflection imaging module of claim 1, further comprising: a mobile unit, wherein the full-circumference mirror group is disposed on the mobile unit, by the mobile unit relative to the object to be tested mobile. 如申請專利範圍第1項所述的全周反射取像模組,更包括:一移動單元,配置於該全周反射鏡組的一側,並適於相對於該全周反射鏡組移動,以帶動該待測物相對於該全周反射鏡組移動而通過該環狀反射區域。 The full-circumference reflection imaging module of claim 1, further comprising: a moving unit disposed on one side of the full-circumference mirror group and adapted to move relative to the full-circumference mirror group, The object to be tested is moved relative to the entire peripheral mirror group to pass through the annular reflective region. 如申請專利範圍第1項所述的全周反射取像模組,更包括:一處理單元,電性連接至該取像單元,以依據該全周影像檢測該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging module of claim 1, further comprising: a processing unit electrically connected to the image capturing unit to detect that the object to be tested corresponds to the ring according to the full-circle image The appearance of the reflective area. 如申請專利範圍第9項所述的全周反射取像模組,其中該待測物大致上呈現一特定顏色,該處理單元藉由判斷該特定顏色在該全周影像中所佔比例而檢測該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging module of claim 9, wherein the object to be tested substantially presents a specific color, and the processing unit detects by determining a proportion of the specific color in the full-circle image. The object to be tested corresponds to the appearance of the annular reflection region. 一種全周反射取像方法,適於取得一待測物的一全周影像,該全周反射取像方法包括:相對移動一全周反射鏡組與該待測物,使該待測物通過該全周反射鏡組的一環狀反射區域,並藉由該全周反射鏡組反射該待測物對應於該環狀反射區域的外觀;以及藉由一取像單元從該待測物的下方取得藉由該全周反射鏡組反射該待測物對應於該環狀反射區域的外觀而得的一全周影像。 A full-circumference reflection imaging method is adapted to obtain a full-circumference image of a test object, wherein the full-circumferential reflection image capturing method comprises: relatively moving a full-circumference mirror group and the object to be tested, so that the object to be tested passes An annular reflection region of the total circumference mirror group, and the external reflection mirror group reflects an appearance of the object to be tested corresponding to the annular reflection region; and an image capturing unit from the object to be tested A full-circumference image obtained by reflecting the appearance of the object to be tested corresponding to the annular reflection region by the full-circumference mirror group is obtained below. 如申請專利範圍第11項所述的全周反射取像方法,其中該全周反射鏡組包括一環狀反射鏡,該環狀反射鏡構成該環狀反射區域,以在相對移動該全周反射鏡組與該待測物的步驟中反射該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging method of claim 11, wherein the full-circumference mirror group comprises an annular mirror, the annular mirror forming the annular reflection area to relatively move the whole circumference The step of reflecting the object to be tested in the step of reflecting the object corresponds to the appearance of the annular reflection region. 如申請專利範圍第11項所述的全周反射取像方法,其中該全周反射鏡組包括多個反射鏡,彼此緊密排列構成該環狀反射區域,以在相對移動該全周反射鏡組與該待測物的步驟中反射該待測物對應於該環狀反射區域的外觀。 The full-circumference reflection imaging method of claim 11, wherein the full-circumference mirror group comprises a plurality of mirrors arranged closely to each other to form the annular reflection region to relatively move the full-circumference mirror group Reflecting the object to be tested in the step of the object to be tested corresponds to the appearance of the annular reflection region. 如申請專利範圍第11項所述的全周反射取像方法,其中該待測物大致上呈現一特定顏色,而在藉由該取像單元取得該全周影像的步驟之後,藉由一處理單元判斷該特定顏色在該全周影像中所佔比例,以檢測該待測物對應於該環狀反射區域的外觀。 The method of claim 11, wherein the object to be tested substantially presents a specific color, and after the step of obtaining the full-circle image by the image capturing unit, by a process The unit determines a proportion of the specific color in the full-circle image to detect an appearance of the object to be tested corresponding to the annular reflection region. 如申請專利範圍第14項所述的全周反射取像方法,更包括:在相對移動該全周反射鏡組與該待測物至一取像位置,並藉由該取像單元取得該全周影像的步驟之後,依據該全周影像判斷該待測物是否進入該環狀反射區域,而判斷該待測物是否進入該環狀反射區域的步驟包括判斷該特定顏色在該全周影像中所佔比例是否大於一預定值。 The full-circumference reflection imaging method of claim 14, further comprising: relatively moving the whole-peripheral mirror group and the object to be tested to an image capturing position, and obtaining the whole by the image capturing unit After the step of the weekly image, determining whether the object to be tested enters the annular reflection area according to the full-circle image, and determining whether the object to be tested enters the annular reflection area comprises determining that the specific color is in the full-circle image Whether the proportion is greater than a predetermined value. 如申請專利範圍第15項所述的全周反射取像方法,更包括:在該待測物進入該環狀反射區域之後,以該待測物與該全周 反射鏡組的相對位置作為一起始取像位置,持續相對移動該全周反射鏡組與該待測物至另一取像位置,並藉由該取像單元取得該待測物對應於該環狀反射區域的另一全周影像。 The method for all-round reflection imaging according to claim 15 further includes: after the object to be tested enters the annular reflection region, the object to be tested and the whole week The relative position of the mirror group is used as an initial image capturing position, and the total length of the mirror group and the object to be tested are continuously moved to another image capturing position, and the object to be tested is obtained by the image capturing unit corresponding to the ring. Another full-circumference image of the reflective area. 如申請專利範圍第16項所述的全周反射取像方法,更包括:在藉由該取像單元取得該待測物的該全周影像的步驟之後,依據該全周影像判斷該待測物是否移出該環狀反射區域,而判斷該待測物是否移出該環狀反射區域的步驟包括判斷該特定顏色在該全周影像中所佔比例是否小於一預定值。 The method of the full-circumference reflection imaging method of claim 16, further comprising: determining, by the image capturing unit, the full-circumference image of the object to be tested, determining the to-be-tested according to the full-circumference image Whether the object moves out of the annular reflection area, and determining whether the object to be tested moves out of the annular reflection area comprises determining whether a proportion of the specific color in the full-circumference image is less than a predetermined value. 如申請專利範圍第17項所述的全周反射取像方法,更包括:在該待測物移出該環狀反射區域之後,以該待測物與該全周反射鏡組的相對位置作為一最終取像位置,停止相對移動該全周反射鏡組與該待測物。 The method of claim 17, wherein the method further comprises: after the object to be tested is removed from the annular reflective region, the relative position of the object to be tested and the total array of mirrors is used as a Finally, the image taking position stops the relative movement of the full-circumference mirror group and the object to be tested. 如申請專利範圍第17項所述的全周反射取像方法,更包括:在該待測物移出該環狀反射區域之後,依據該些全周影像進行色差判斷,其中所述色差判斷包括判斷該特定顏色在各該全周影像中所佔比例,以檢測該特定顏色的均勻性,及/或判斷該特定顏色在各該全周影像中的不同區域的色差,以檢測該待測物的瑕疵。 The full-resection reflection imaging method of claim 17, further comprising: performing color difference determination according to the full-circumference images after the object to be tested moves out of the annular reflection area, wherein the color difference determination includes determining a ratio of the specific color in each of the full-circle images to detect uniformity of the specific color, and/or determine a color difference of a different region of the specific color in each of the full-circumference images to detect the object to be tested defect. 如申請專利範圍第19項所述的全周反射取像方法,其中 該待測物包括一果實,而所述色差判斷包括判斷該特定顏色在各該全周影像中所佔比例,以檢測該特定顏色的均勻性而對照一資料庫得知該果實的成熟度,及/或判斷該特定顏色在各該全周影像中的不同區域的色差,以檢測該果實的瑕疵。 A full-circumferential reflection imaging method as described in claim 19, wherein The test object includes a fruit, and the color difference determination includes determining a proportion of the specific color in each of the full-circle images to detect the uniformity of the specific color and learning the maturity of the fruit against a database. And/or determining the color difference of the different regions of the particular color in each of the full-circle images to detect defects in the fruit.
TW103145945A 2014-12-27 2014-12-27 Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method TWI564555B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103145945A TWI564555B (en) 2014-12-27 2014-12-27 Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103145945A TWI564555B (en) 2014-12-27 2014-12-27 Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method

Publications (2)

Publication Number Publication Date
TW201623940A TW201623940A (en) 2016-07-01
TWI564555B true TWI564555B (en) 2017-01-01

Family

ID=56984661

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103145945A TWI564555B (en) 2014-12-27 2014-12-27 Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method

Country Status (1)

Country Link
TW (1) TWI564555B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5009498A (en) * 1990-03-20 1991-04-23 Computed Anatomy Inc. Interchangeable keratoscope device
TW200514132A (en) * 2003-06-19 2005-04-16 Nippon Kogaku Kk Exposure equipment, and component manufacture method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5009498A (en) * 1990-03-20 1991-04-23 Computed Anatomy Inc. Interchangeable keratoscope device
TW200514132A (en) * 2003-06-19 2005-04-16 Nippon Kogaku Kk Exposure equipment, and component manufacture method

Also Published As

Publication number Publication date
TW201623940A (en) 2016-07-01

Similar Documents

Publication Publication Date Title
JP6945245B2 (en) Visual inspection equipment
CN108445007B (en) Detection method and detection device based on image fusion
KR100777547B1 (en) Defect inspection method and defect inspection apparatus using the same
US8532364B2 (en) Apparatus and method for detecting defects in wafer manufacturing
CN107796825B (en) Device detection method
US10261024B2 (en) Visual inspection device and visual inspection method
KR20190101857A (en) Visual inspection device and illumination condition setting method of visual inspection device
KR20160090359A (en) Surface defect detection method and surface defect detection device
JP4739044B2 (en) Appearance inspection device
US20170053394A1 (en) Inspection apparatus, inspection method, and article manufacturing method
JP2007523333A (en) Surface inspection method and system
JP2011027734A (en) Device for inspection of textured surface
JP2019045470A (en) Visual inspection device and method therefor
TWI495867B (en) Application of repeated exposure to multiple exposure image blending detection method
JP2009097977A (en) Visual inspection device
CN111879789A (en) Metal surface defect detection method and system
JP2011208941A (en) Flaw inspection device and flaw inspection method
WO2022030325A1 (en) Inspection device, inspection method, and piston manufacturing method
JP4652024B2 (en) Surface inspection method and apparatus
TWI564555B (en) Omnidirectional reflecting and image capturing module and omnidirectional reflecting and image capturing method
KR101030451B1 (en) Tube and washer inspecting apparatus of cylinder type rechargeable battery
JP2007271510A (en) Visual inspection method and visual inspection device
JPH0862155A (en) Object 0bserving apparatus
JPH04194701A (en) Picture image inputting method and apparatus and appearance inspecting instrument
JP4269423B2 (en) Surface inspection apparatus and surface inspection method