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TWI415533B - Apparatus and method for wet process - Google Patents

Apparatus and method for wet process Download PDF

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Publication number
TWI415533B
TWI415533B TW99131121A TW99131121A TWI415533B TW I415533 B TWI415533 B TW I415533B TW 99131121 A TW99131121 A TW 99131121A TW 99131121 A TW99131121 A TW 99131121A TW I415533 B TWI415533 B TW I415533B
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Taiwan
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wet processing
substrate
conveying
rollers
unit
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TW99131121A
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Chinese (zh)
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TW201212752A (en
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Chao Wen Lin
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Zhen Ding Technology Co Ltd
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Priority to TW99131121A priority Critical patent/TWI415533B/en
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Publication of TWI415533B publication Critical patent/TWI415533B/en

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

A wet process apparatus includes a first wet process unit, a second wet process unit, a washing unit, a receiving tank, and a board distributing unit. The washing unit includes a guiding transport and a washing liquid spray mechanism opposite to the guiding transport. The guiding transport is configured for transporting a substrate processed by the first wet process unit to the receiving tank. The washing liquid spray mechanism is used for spraying washing liquid to the substrate transported by the guiding transport. The receiving tank is filled with preservation solution, and is adapted for making the substrate transported by the guiding transport immerged in it. The board distributing unit is opposite to the receiving tank and is adapted for sucking the substrate immerged in the preservation solution and distributing it to the second wet process unit. A method for wet processing a substrate is also provided.

Description

濕處理裝置及濕處理方法 Wet processing device and wet processing method

本發明涉及電路板製作技術領域,尤其涉及一種濕處理裝置及濕處理方法。 The present invention relates to the field of circuit board manufacturing technology, and in particular, to a wet processing apparatus and a wet processing method.

隨著科學技術進步,印刷電路板於數位產品領域得到廣泛應用。關於電路板之應用請參見文獻Takahashi,A.Ooki,N.Nagai,A.Akahoshi,H.Mukoh,A.Wajima,M.Res.Lab,High density multilayer printed circuit board for HITAC M-880,IEEE Trans.on Components,Packaging,and Manufacturing Technology,1992,15(4):418-425。 With the advancement of science and technology, printed circuit boards are widely used in the field of digital products. For application of the circuit board, please refer to the literature Takahashi, A.Ooki, N.Nagai, A.Akahoshi, H.Mukoh, A.Wajima,M.Res.Lab,High density multilayer printed circuit board for HITAC M-880,IEEE Trans .on Components, Packaging, and Manufacturing Technology, 1992, 15(4): 418-425.

濕制程(Wet Process)作為一種常用之電路板製作工序,係利用處理液,如各種化學藥液或水噴灑或噴淋於電路基板表面,以對電路板進行鍍通孔、鍍銅、蝕刻、顯影、剝膜、鍍有機保護膜、表面改性或清洗等處理。生產過程中,電路板會依次送入複數不同濕制程單元進行處理,如,於顯影生產線完成顯影工序後,即被送至蝕刻生產線進行蝕刻。為避免電路板之銅層於送至蝕刻生產線過程中被空氣氧化,通常於顯影生產線,電路板表面噴淋了顯影液與純水之後,還會 依次經歷冷風、熱風及冷風以進行烘乾。藉由中心定位機與收板機將電路板收集於一起後,再輸送至蝕刻生產線。於蝕刻生產線,再次進行水洗。如此,不僅水洗、烘乾、再水洗之過程將造成資源之浪費,烘乾之過程還可能造成電路板之尺寸發生變化,不利於提高產品品質。 Wet Process (Wet Process) is a commonly used circuit board manufacturing process. It is sprayed or sprayed on the surface of a circuit board by using a chemical solution such as various chemical liquids or water to plate through holes, copper plating, etching, and the like. Development, stripping, plating of organic protective film, surface modification or cleaning. During the production process, the circuit board is sequentially fed into a plurality of different wet process units for processing. For example, after the development process is completed on the development line, it is sent to the etching line for etching. In order to prevent the copper layer of the circuit board from being oxidized by air during the process of sending to the etching line, usually after the developing line is sprayed with the developer and pure water on the surface of the board, It is subjected to cold air, hot air and cold air in order to perform drying. The board is collected by the central positioning machine and the take-up machine, and then transported to the etching line. On the etching line, water washing was performed again. In this way, not only the process of washing, drying and re-washing will cause waste of resources, but the process of drying may also cause changes in the size of the circuit board, which is not conducive to improving product quality.

有鑑於此,提供一種濕處理裝置及濕處理方法,以節省資源、提高電路板產品品質實屬必要。 In view of this, it is necessary to provide a wet processing device and a wet processing method to save resources and improve the quality of circuit board products.

一種濕處理裝置,用於對基板進行濕處理。所述濕處理裝置包括第一濕處理單元、第二濕處理單元、清洗單元、收板槽與放板單元。所述清洗單元、收板槽與放板單元均位於所述第一濕處理單元與第二濕處理單元之間。所述第一濕處理單元用於對基板進行第一濕處理,其具有用於儲存第一濕處理液之第一儲存槽。所述第二濕處理單元用於對基板進行第二濕處理,其具有用於儲存第二濕處理液之第二儲存槽。所述清洗單元用於對基板進行清洗,其包括引導傳送機構與清洗液噴淋機構。所述引導傳送機構用於將經所述第一濕處理單元處理後之基板傳送至收板槽。所述引導傳送機構包括相鄰之傳輸部與下板部,所述傳輸部與清洗液噴淋機構相對,所述收板槽靠近所述下板部,所述下板部之傳輸方向與所述傳輸部之傳輸方向成銳角,且向靠近收板槽之方向傾斜,以使自傳輸部傳送至下板部之基板落入收板槽,所述傳輸部與下板部均包括複數根承載傳送滾輪與複數根壓制傳送滾輪,所 述複數根承載傳送滾輪與複數根壓制傳送滾輪相對設置,用於傳送位於複數根承載傳送滾輪與複數根壓制傳送滾輪之間之基板。所述清洗液噴淋機構與所述引導傳送機構相對,用於向所述引導傳送機構傳送之基板噴淋清洗液。所述收板槽內盛有保存液,用於浸置自引導傳送機構傳送之基板。所述放板單元與收板槽相對,用於從所述收板槽之保存液中吸取基板,並將所述基板放置於所述第二濕處理單元以進行第二濕處理。 A wet processing apparatus for wet processing a substrate. The wet processing apparatus includes a first wet processing unit, a second wet processing unit, a cleaning unit, a take-up slot, and a board unit. The cleaning unit, the take-up slot and the release unit are both located between the first wet processing unit and the second wet processing unit. The first wet processing unit is configured to perform a first wet processing on the substrate, and has a first storage tank for storing the first wet processing liquid. The second wet processing unit is configured to perform a second wet processing on the substrate, and has a second storage tank for storing the second wet processing liquid. The cleaning unit is configured to clean the substrate, and includes a guiding conveying mechanism and a cleaning liquid spraying mechanism. The guiding conveyance mechanism is configured to transfer the substrate processed by the first wet processing unit to the take-up slot. The guiding and conveying mechanism includes an adjacent conveying portion and a lower plate portion, the conveying portion is opposite to the cleaning liquid spraying mechanism, the receiving groove is adjacent to the lower plate portion, and the conveying direction of the lower plate portion is The transmission direction of the transmission portion is at an acute angle, and is inclined toward a receiving slot so that the substrate transmitted from the transmitting portion to the lower plate portion falls into the receiving slot, and the transmitting portion and the lower portion each include a plurality of bearers. Transfer roller and a plurality of pressing transfer rollers, The plurality of carrier carrying rollers are disposed opposite to the plurality of pressing transport rollers for transporting the substrate between the plurality of carrying transport rollers and the plurality of pressing transport rollers. The cleaning liquid spray mechanism is opposite to the guide conveyance mechanism and is configured to spray the cleaning liquid onto the substrate conveyed by the guide conveyance mechanism. The receiving tank contains a preserving liquid for immersing the substrate conveyed by the guiding conveying mechanism. The release unit is opposite to the take-up slot for drawing a substrate from the storage solution of the take-up slot, and placing the substrate in the second wet processing unit for performing a second wet process.

一種使用如上所述之濕處理裝置之濕處理方法,包括步驟:提供基板;將所述基板送入所述第一濕處理單元進行第一濕處理;將經所述第一濕處理單元處理後之基板置於所述清洗單元,使所述清洗液噴淋機構對所述引導傳送機構傳送之基板噴淋清洗液以進行清洗,並使清洗後之基板落入所述收板槽內;藉由所述放板單元從所述收板槽之保存液中吸取基板,並將所述基板放置於所述第二濕處理單元以對基板進行第二濕處理。 A wet processing method using the wet processing apparatus as described above, comprising the steps of: providing a substrate; feeding the substrate to the first wet processing unit for performing a first wet processing; after being processed by the first wet processing unit The substrate is placed in the cleaning unit, and the cleaning liquid spraying mechanism sprays the cleaning liquid on the substrate conveyed by the guiding and conveying mechanism to clean the substrate, and the cleaned substrate falls into the receiving groove; The substrate is taken up from the storage solution of the take-up groove by the release unit, and the substrate is placed in the second wet processing unit to perform a second wet processing on the substrate.

本技術方案之濕處理裝置採用盛有保存液之收板槽暫時存放經清洗單元清洗後之基板,一方面可避免基板因摩擦或碰撞產生刮傷,另一方面還可避免複數基板之間因靜電作用而黏附於一起。此外,還可省去清洗後之烘乾過程,避免基板發生變形。收板槽內之基板不必進行清洗即可送入第二濕處理單元進行處理。使用如上所述之濕處理裝置之濕處理方法可減少處理工序、節省大量資源,有利於提高產品品質。 The wet processing device of the technical solution temporarily stores the substrate cleaned by the cleaning unit by using a receiving tank containing the preservation liquid, thereby avoiding scratching of the substrate due to friction or collision, and avoiding the relationship between the plurality of substrates on the other hand. Adhesive and stick together. In addition, the drying process after cleaning can be omitted to avoid deformation of the substrate. The substrate in the tray is sent to the second wet processing unit for processing without being cleaned. The wet processing method using the wet processing apparatus as described above can reduce the number of processing steps, save a lot of resources, and contribute to improvement of product quality.

10‧‧‧濕處理裝置 10‧‧‧ Wet treatment device

11‧‧‧第一濕處理單元 11‧‧‧First Wet Processing Unit

110‧‧‧第一傳送機構 110‧‧‧First transmission agency

111‧‧‧第一儲存槽 111‧‧‧First storage tank

112‧‧‧第一噴淋機構 112‧‧‧First sprinkler

113‧‧‧第一承載傳送輥 113‧‧‧First carrying conveyor roller

114‧‧‧第一壓制傳送輥 114‧‧‧First press transfer roller

115‧‧‧第一噴頭 115‧‧‧First nozzle

12‧‧‧清洗單元 12‧‧‧cleaning unit

120‧‧‧引導傳送機構 120‧‧‧Guided transport agency

121‧‧‧清洗液儲存槽 121‧‧‧cleaning fluid storage tank

122‧‧‧清洗液噴淋機構 122‧‧‧Clean liquid spraying mechanism

123‧‧‧承載傳送滾輪 123‧‧‧ Carrying conveyor wheel

124‧‧‧壓制傳送滾輪 124‧‧‧Repression transfer roller

125‧‧‧傳輸部 125‧‧‧Transportation Department

126‧‧‧下板部 126‧‧‧ Lower Board

127‧‧‧清洗液噴頭 127‧‧‧cleaning liquid spray head

13‧‧‧收板槽 13‧‧‧Receiving slot

130‧‧‧保存液 130‧‧‧Preservation solution

131‧‧‧側壁 131‧‧‧ side wall

132‧‧‧底壁 132‧‧‧ bottom wall

133‧‧‧快拆塞 133‧‧‧ quick release

14‧‧‧放板單元 14‧‧‧Plate unit

140‧‧‧移動臂 140‧‧‧ moving arm

141‧‧‧安裝架 141‧‧‧mounting frame

142‧‧‧吸盤 142‧‧‧Sucker

143‧‧‧第一安裝桿 143‧‧‧First mounting rod

144‧‧‧連接桿 144‧‧‧ Connecting rod

145‧‧‧第二安裝桿 145‧‧‧Second mounting rod

15‧‧‧第二濕處理單元 15‧‧‧Second wet processing unit

150‧‧‧第二傳送機構 150‧‧‧Second transport agency

151‧‧‧第二儲存槽 151‧‧‧Second storage tank

152‧‧‧第二噴淋機構 152‧‧‧Second sprinkler

153‧‧‧第二承載傳送輥 153‧‧‧Second load carrying roller

154‧‧‧第二壓制傳送輥 154‧‧‧Second press transfer roller

155‧‧‧第二噴頭 155‧‧‧second nozzle

100‧‧‧基板 100‧‧‧Substrate

圖1係本技術方案實施例提供之濕處理裝置之結構示意圖。 FIG. 1 is a schematic structural view of a wet processing apparatus provided by an embodiment of the present technical solution.

圖2係本技術方案實施例提供之濕處理裝置之收板槽與放板單元結構示意圖。 2 is a schematic structural view of a receiving groove and a plate discharging unit of the wet processing device provided by the embodiment of the present technical solution.

圖3係使用本技術方案實施例提供之濕處理裝置處理基板之結構示意圖。 FIG. 3 is a schematic structural view of a substrate processed by using the wet processing apparatus provided in the embodiment of the present technical solution.

圖4係本技術方案實施例提供之濕處理裝置之放板單元吸取基板之結構示意圖。 FIG. 4 is a schematic structural view of a substrate for picking up a board of a wet processing apparatus according to an embodiment of the present technical solution.

以下將結合附圖與實施例,對本技術方案提供之濕處理裝置及濕處理方法進行詳細描述。 The wet processing apparatus and the wet processing method provided by the present technical solution will be described in detail below with reference to the accompanying drawings and embodiments.

請一併參閱圖1與圖2,本技術方案實施例提供一種濕處理裝置10,用於對基板進行濕處理。所述濕處理裝置10包括第一濕處理單元11、清洗單元12、收板槽13、放板單元14與第二濕處理單元15。所述清洗單元12、收板槽13與放板單元14均位於所述第一濕處理單元11與第二濕處理單元15之間。 Referring to FIG. 1 and FIG. 2 together, the embodiment of the present invention provides a wet processing apparatus 10 for performing wet processing on a substrate. The wet processing apparatus 10 includes a first wet processing unit 11, a cleaning unit 12, a take-up tank 13, a decking unit 14, and a second wet processing unit 15. The cleaning unit 12, the receiving groove 13 and the placing plate unit 14 are both located between the first wet processing unit 11 and the second wet processing unit 15.

所述第一濕處理單元11用於對基板進行第一濕處理。所述第一濕處理單元11包括第一傳送機構110、第一儲存槽111與第一噴淋機構112。所述第一傳送機構110位於第一儲存槽111與第一噴淋機構112之間,且用於將基板傳送至清洗單元12。所述第一儲存槽111用於儲存第一濕處理液。所述第一噴淋機構112連通於所述第一儲存槽111,用於向第一傳送機構 110傳送之基板噴淋第一濕處理液。所述第一傳送機構110包括複數根第一承載傳送輥113與複數根第一壓制傳送輥114。所述複數根第一承載傳送輥113並排設置,且均靠近所述第一儲存槽111。所述複數根第一壓制傳送輥114並排設置,且均靠近所述第一噴淋機構112。所述複數根第一承載傳送輥113均沿第一方向繞其中心軸轉動,所述複數根第一壓制傳送輥114均沿與第一方向相反之第二方向繞其中心軸轉動,從而帶動位於所述複數根第一承載傳送輥113與複數根第一壓制傳送輥114之間之基板移動。所述第一噴淋機構112包括複數第一噴頭115。所述複數第一噴頭115均與所述複數根第一壓制傳送輥114相對。當然,所述複數第一噴頭115還可於所述第一傳送機構110之兩側均有分佈,如此,可對基板之兩個表面進行同時處理。本實施例中,所述第一濕處理單元11為顯影單元,所述第一儲存槽111內儲存有顯影液,顯影液自第一噴淋機構112噴向基板後,還可流回所述第一儲存槽111內。優選地,所述第一濕處理單元11還包括一第一濕處理液調節器(圖未示),所述第一濕處理液調節器用於監控所述第一儲存槽111內之第一濕處理液之濃度並於該濃度低於預定值時進行補充調節。 The first wet processing unit 11 is configured to perform a first wet processing on the substrate. The first wet processing unit 11 includes a first conveying mechanism 110, a first storage tank 111, and a first shower mechanism 112. The first conveying mechanism 110 is located between the first storage tank 111 and the first shower mechanism 112 and is used for conveying the substrate to the cleaning unit 12 . The first storage tank 111 is configured to store the first wet processing liquid. The first shower mechanism 112 is in communication with the first storage slot 111 for the first conveying mechanism 110 transmits the substrate to spray the first wet processing liquid. The first conveying mechanism 110 includes a plurality of first carrier conveying rollers 113 and a plurality of first pressing conveying rollers 114. The plurality of first carrier transfer rollers 113 are disposed side by side and are both adjacent to the first storage tank 111. The plurality of first pressing conveyance rollers 114 are disposed side by side and are both adjacent to the first shower mechanism 112. The plurality of first carrier conveying rollers 113 are all rotated about a central axis thereof in a first direction, and the plurality of first pressing conveying rollers 114 are all rotated about a central axis thereof in a second direction opposite to the first direction, thereby driving The substrate is moved between the plurality of first carrier transfer rollers 113 and the plurality of first pressure conveyance rollers 114. The first shower mechanism 112 includes a plurality of first showerheads 115. The plurality of first showerheads 115 are opposite to the plurality of first press transport rollers 114. Of course, the plurality of first showerheads 115 can also be distributed on both sides of the first transport mechanism 110, so that the two surfaces of the substrate can be simultaneously processed. In this embodiment, the first wet processing unit 11 is a developing unit, and the first storage tank 111 stores a developing solution. After the developing liquid is sprayed from the first spraying mechanism 112 to the substrate, the developing solution may flow back to the The first storage tank 111 is inside. Preferably, the first wet processing unit 11 further includes a first wet processing liquid regulator (not shown), and the first wet processing liquid regulator is configured to monitor the first wetness in the first storage tank 111. The concentration of the treatment liquid is adjusted and adjusted when the concentration is lower than a predetermined value.

當然,所述第一濕處理單元11還可採用浸泡之方式對基板進行第一濕處理,如此,所述第一濕處理單元11可不具有噴淋機構,僅需將基板置入第一儲存槽111內,使第一濕處理液浸泡所述基板,即可對基板進行第一濕處理。 Of course, the first wet processing unit 11 may also perform the first wet processing on the substrate by means of immersion. Thus, the first wet processing unit 11 may not have a shower mechanism, and only the substrate needs to be placed in the first storage tank. In the 111, the first wet processing liquid is immersed in the substrate to perform the first wet processing on the substrate.

所述清洗單元12與所述第一濕處理單元11相鄰設置,所述清洗單元12用於對基板進行清洗,以去除基板上殘留之第一濕處理液。所述清洗單元12包括引導傳送機構120、清洗液儲存槽121與清洗液噴淋機構122。所述引導傳送機構120連接於所述第一傳送機構110之一端,且位於清洗液儲存槽121與清洗液噴淋機構122之間。所述引導傳送機構120用於將經所述第一濕處理單元11處理後之基板傳送至收板槽13。所述清洗液儲存槽121用於儲存第一濕處理液。所述清洗液噴淋機構122連通於所述清洗液儲存槽121,用於向引導傳送機構120傳送之基板噴淋清洗液。所述引導傳送機構120包括複數根承載傳送滾輪123與複數根壓制傳送滾輪124。所述複數根承載傳送滾輪123均靠近所述清洗液儲存槽121。所述複數根承載傳送滾輪123並排設置,且與所述第一傳送機構110之複數根第一承載傳送輥113相鄰。所述複數根壓制傳送滾輪124均靠近所述清洗液噴淋機構122。所述複數根壓制傳送滾輪124並排設置,且所述第一傳送機構110之複數根第一壓制傳送輥114相鄰。所述複數根承載傳送滾輪123均沿第一方向繞其中心軸轉動,所述複數根壓制傳送滾輪124均沿與第一方向相反之第二方向繞其中心軸轉動,從而帶動位於所述複數根承載傳送滾輪123與複數根壓制傳送滾輪124之間之基板移動。所述引導傳送機構120包括相鄰之傳輸部125與下板部126。所述傳輸部125靠近所述第一濕處理單元11之第一傳送機構110,且與所述清洗液噴淋機構122相對。基板主要於所述傳輸部125接受清洗液之噴淋。所述收板槽13靠近所述下 板部126。所述下板部126之傳輸方向與所述傳輸部125之傳輸方向成銳角,且向靠近收板槽13之方向傾斜,以使自傳輸部125傳送至下板部126之基板落入收板槽13。本實施例中,所述夾角約為30度。所述清洗液噴淋機構122包括複數清洗液噴頭127。所述複數清洗液噴頭127均與所述複數根壓制傳送滾輪124相對。當然,所述複數清洗液噴頭127還可於所述引導傳送機構120之兩側均有分佈,如此,可對基板之兩個表面進行同時處理。本實施例中,所述清洗液儲存槽121內儲存之清洗液為純水。 The cleaning unit 12 is disposed adjacent to the first wet processing unit 11, and the cleaning unit 12 is configured to clean the substrate to remove the first wet processing liquid remaining on the substrate. The cleaning unit 12 includes a guiding conveying mechanism 120, a cleaning liquid storage tank 121, and a cleaning liquid spraying mechanism 122. The guiding and conveying mechanism 120 is connected to one end of the first conveying mechanism 110 and located between the cleaning liquid storage tank 121 and the cleaning liquid spraying mechanism 122. The guiding conveyance mechanism 120 is configured to transfer the substrate processed by the first wet processing unit 11 to the take-up slot 13 . The cleaning liquid storage tank 121 is used to store the first wet processing liquid. The cleaning liquid spray mechanism 122 is in communication with the cleaning liquid storage tank 121 for spraying the cleaning liquid onto the substrate conveyed by the guiding conveyance mechanism 120. The guide transport mechanism 120 includes a plurality of carrier transport rollers 123 and a plurality of press transport rollers 124. The plurality of load carrying rollers 123 are all adjacent to the cleaning liquid storage tank 121. The plurality of carrier carrying rollers 123 are disposed side by side and adjacent to the plurality of first carrier transport rollers 113 of the first transport mechanism 110. The plurality of pressing conveyance rollers 124 are all adjacent to the cleaning liquid spraying mechanism 122. The plurality of pressing conveyance rollers 124 are arranged side by side, and a plurality of first pressing conveyance rollers 114 of the first conveying mechanism 110 are adjacent to each other. The plurality of carrier carrying rollers 123 are all rotated about a central axis thereof in a first direction, and the plurality of pressing transport rollers 124 are all rotated about a central axis thereof in a second direction opposite to the first direction, thereby driving the plurality of The base carries the substrate movement between the transfer roller 123 and the plurality of press transfer rollers 124. The guide transport mechanism 120 includes an adjacent transport portion 125 and a lower plate portion 126. The transfer portion 125 is adjacent to the first transfer mechanism 110 of the first wet processing unit 11 and is opposed to the cleaning liquid shower mechanism 122. The substrate receives the shower of the cleaning liquid mainly at the transfer portion 125. The receiving slot 13 is close to the lower Plate portion 126. The conveying direction of the lower plate portion 126 is at an acute angle to the conveying direction of the conveying portion 125, and is inclined toward the closing groove 13, so that the substrate transferred from the conveying portion 125 to the lower plate portion 126 falls into the closing plate. Slot 13. In this embodiment, the included angle is about 30 degrees. The cleaning liquid spray mechanism 122 includes a plurality of cleaning liquid spray heads 127. The plurality of cleaning liquid spray heads 127 are opposite to the plurality of pressing transfer rollers 124. Of course, the plurality of cleaning liquid nozzles 127 can also be distributed on both sides of the guiding and conveying mechanism 120, so that the two surfaces of the substrate can be simultaneously processed. In this embodiment, the cleaning liquid stored in the cleaning liquid storage tank 121 is pure water.

所述收板槽13內盛有保存液130,用於浸置自所述引導傳送機構120傳送之基板。所述收板槽13位於所述引導傳送機構120之一端,以使得經所述引導傳送機構120傳送之基板落入所述收板槽13內。所述收板槽13靠近所述引導傳送機構120之下板部126。所述收板槽13為一端不封口之長方體形槽,其包括相連接之側壁131與底壁132。所述收板槽13於側壁131靠近底壁132處設置有快拆塞133,以便於清洗或更換保存液。當然,所述收板槽13並不限於為長方體形,還可為圓柱體形、複數棱柱或其他不規則形狀。僅需其橫截面略大於基板之橫截面即可。優選地,所述收板槽13為透明材質。本實施例中,所述保存液130為純水。 The receiving groove 13 contains a holding liquid 130 for immersing the substrate transferred from the guiding and conveying mechanism 120. The take-up slot 13 is located at one end of the guide transport mechanism 120 such that the substrate transported by the guide transport mechanism 120 falls into the take-up slot 13. The take-up slot 13 is adjacent to the lower plate portion 126 of the guide transport mechanism 120. The receiving groove 13 is a rectangular parallelepiped groove whose one end is not sealed, and includes a connecting side wall 131 and a bottom wall 132. The closing groove 13 is provided with a quick release plug 133 at the side wall 131 near the bottom wall 132 for cleaning or replacing the preservation liquid. Of course, the receiving groove 13 is not limited to a rectangular parallelepiped shape, and may also be a cylindrical shape, a plurality of prisms or other irregular shapes. It only needs to have a cross section slightly larger than the cross section of the substrate. Preferably, the receiving groove 13 is made of a transparent material. In this embodiment, the preservation solution 130 is pure water.

所述放板單元14與收板槽13相對,用於從所述收板槽13之保存液130中吸取基板,並將所述基板放置於第二濕處理單元15以進行第二濕處理。所述放板單元14靠近所述第二濕處理 單元15設置。所述放板單元14包括一移動臂140、一安裝架141與複數吸盤142。所述安裝架141連接於所述移動臂140。所述複數吸盤142安裝於所述安裝架141。所述移動臂140可機械連接於一驅動器(圖未示),從而可於驅動器之驅動下移動。所述移動臂140用於帶動安裝架141移動。所述安裝架141包括第一安裝桿143、連接桿144與第二安裝桿145。所述連接桿144連接於所述移動臂140。所述第一安裝桿143與第二安裝桿145分別連接於所述連接桿144相對之兩端。所述複數吸盤142相互間隔地安裝於所述第一安裝桿143與第二安裝桿145,用於於移動臂140帶動下浸入保存液130中吸取基板。所述複數吸盤142可藉由抽液管(圖未示)連接於一泵(圖未示)。藉由控制泵來控制吸盤142之抽取保存液與放出保存液之動作,而實現吸取與釋放基板。本實施例中,所述吸盤142之數量為四個。所述第一安裝桿143與第二安裝桿145上分別安裝有兩個吸盤142。 The board unit 14 is opposite to the receiving slot 13 for taking in a substrate from the storage solution 130 of the receiving slot 13 and placing the substrate in the second wet processing unit 15 for performing a second wet processing. The board unit 14 is adjacent to the second wet processing Unit 15 is set. The board unit 14 includes a moving arm 140, a mounting bracket 141 and a plurality of suction cups 142. The mounting bracket 141 is coupled to the moving arm 140. The plurality of suction cups 142 are mounted to the mounting bracket 141. The moving arm 140 can be mechanically coupled to a driver (not shown) so as to be movable under the driving of the driver. The moving arm 140 is used to drive the mounting bracket 141 to move. The mounting bracket 141 includes a first mounting rod 143, a connecting rod 144 and a second mounting rod 145. The connecting rod 144 is coupled to the moving arm 140. The first mounting rod 143 and the second mounting rod 145 are respectively connected to opposite ends of the connecting rod 144. The plurality of suction cups 142 are mounted on the first mounting rod 143 and the second mounting rod 145 at a distance from each other for absorbing the substrate by the moving arm 140. The plurality of suction cups 142 can be connected to a pump (not shown) by a liquid pipe (not shown). The suction and release of the substrate is achieved by controlling the pump to control the action of extracting the holding solution of the suction cup 142 and releasing the preservation liquid. In this embodiment, the number of the suction cups 142 is four. Two suction cups 142 are respectively mounted on the first mounting rod 143 and the second mounting rod 145.

所述第二濕處理單元15包括第二傳送機構150、第二儲存槽151與第二噴淋機構152。所述第二傳送機構150位於第二儲存槽151與第二噴淋機構152之間,且用於傳送放板單元14放置之基板。所述第二儲存槽151用於儲存第二處理液。所述第二噴淋機構152連通於所述第二儲存槽151,與第二傳送機構150相對,用於向第二傳送機構150傳送之基板噴淋第二濕處理液。所述第二傳送機構150包括複數根第二承載傳送輥153與複數根第二壓制傳送輥154。所述複數根第二承載傳送 輥153並排設置,且均靠近所述第二儲存槽151。所述複數根第二壓制傳送輥154並排設置,且均靠近所述第二噴淋機構152。所述複數根第二承載傳送輥153均沿第一方向繞其中心軸轉動,所述複數根第二壓制傳送輥154均沿與第一方向相反之第二方向繞其中心軸轉動,從而帶動位於所述複數根第二承載傳送輥153與複數根第二壓制傳送輥154之間之基板移動。所述第二噴淋機構152包括複數第二噴頭155。所述複數第二噴頭155均分佈於所述第二傳送機構150靠近所述複數根第二壓制傳送輥154之一側,即,與所述複數根第二壓制傳送輥154相對。當然,所述複數第二噴頭155還可於所述第二傳送機構150之兩側均有分佈,如此,可同時對基板之兩個表面進行處理。本實施例中,所述第二濕處理單元15為蝕刻單元,所述第二儲存槽151內儲存有蝕刻液,蝕刻液自第二噴淋機構152噴向基板後,還可流回所述第二儲存槽151內。優選地,所述第二濕處理單元15還包括一第二處理液調節器(圖未示),如此,可對所述第二儲存槽151內之第二處理液之成份進行即時補充調節。 The second wet processing unit 15 includes a second conveying mechanism 150, a second storage tank 151, and a second shower mechanism 152. The second transport mechanism 150 is located between the second storage tank 151 and the second shower mechanism 152 and is configured to transport the substrate on which the board unit 14 is placed. The second storage tank 151 is configured to store the second processing liquid. The second shower mechanism 152 is connected to the second storage tank 151, opposite to the second transport mechanism 150, and the substrate for transporting to the second transport mechanism 150 sprays the second wet processing liquid. The second conveying mechanism 150 includes a plurality of second carrier conveying rollers 153 and a plurality of second pressing conveying rollers 154. The plurality of second bearers transmit The rollers 153 are arranged side by side and are both adjacent to the second storage tank 151. The plurality of second pressing conveyance rollers 154 are disposed side by side and are both adjacent to the second shower mechanism 152. The plurality of second carrier conveying rollers 153 are all rotated about a central axis thereof in a first direction, and the plurality of second pressing conveying rollers 154 are all rotated about a central axis thereof in a second direction opposite to the first direction, thereby driving The substrate is moved between the plurality of second carrier transport rollers 153 and the plurality of second press transport rollers 154. The second shower mechanism 152 includes a plurality of second showerheads 155. The plurality of second nozzles 155 are distributed on one side of the second conveying mechanism 150 near the plurality of second pressing conveying rollers 154, that is, opposite to the plurality of second pressing conveying rollers 154. Of course, the plurality of second nozzles 155 can also be distributed on both sides of the second conveying mechanism 150, so that the two surfaces of the substrate can be processed simultaneously. In this embodiment, the second wet processing unit 15 is an etching unit, and the second storage tank 151 stores an etching liquid. After the etching liquid is sprayed from the second spraying mechanism 152 to the substrate, the etching liquid may flow back to the The second storage tank 151 is inside. Preferably, the second wet processing unit 15 further includes a second treatment liquid regulator (not shown), so that the components of the second treatment liquid in the second storage tank 151 can be immediately supplementally adjusted.

當然,所述第二濕處理單元15還可採用浸泡之方式對基板進行第一濕處理,如此,所述第二濕處理單元15可不具有噴淋機構,僅需將基板置入第二儲存槽151內,使第二濕處理液浸泡所述基板,即可對基板進行第二濕處理。 Of course, the second wet processing unit 15 can also perform the first wet processing on the substrate by using the soaking method. Thus, the second wet processing unit 15 can have no spraying mechanism, and only the substrate needs to be placed in the second storage tank. In 151, the substrate is subjected to a second wet treatment by immersing the second wet processing liquid in the substrate.

可理解,於實際生產過程中,由於空間之限制,所述清洗單元12與所述第二濕處理單元15可能並非首尾相接。此時,可 設置複數收板槽13,將裝滿基板之一收板槽13移到所述第二濕處理單元15處,藉由放板單元14將基板送給所述第二濕處理單元15進行處理。而於清洗單元12之下板部126放置一盛有保存液130而沒有放置基板之收板槽13,以接收並浸置經過所述清洗單元12清洗後之基板。 It can be understood that, in the actual production process, the cleaning unit 12 and the second wet processing unit 15 may not be in end-to-end due to space constraints. At this time, A plurality of receiving slots 13 are provided to move the receiving tray 13 of the filled substrate to the second wet processing unit 15, and the substrate is fed to the second wet processing unit 15 for processing. On the lower plate portion 126 of the cleaning unit 12, a receiving groove 13 containing the holding liquid 130 and no substrate is placed to receive and immerse the substrate cleaned by the cleaning unit 12.

請一併參閱圖1、圖3與圖4,使用如上所述之濕處理裝置10之濕處理方法可包括以下步驟: Referring to FIG. 1, FIG. 3 and FIG. 4 together, the wet processing method using the wet processing apparatus 10 as described above may include the following steps:

首先,提供基板100。本實施例中,所述基板100為方形之電路板基板,於進入濕處理裝置10之前,可於其表面形成光致抗蝕劑層並進行曝光。 First, the substrate 100 is provided. In this embodiment, the substrate 100 is a square circuit board substrate. Before entering the wet processing device 10, a photoresist layer can be formed on the surface thereof and exposed.

其次,將所述基板100送入第一濕處理單元11以進行第一濕處理。基板100於所述第一傳送機構110之摩擦作用下傳送。所述第一噴淋機構112之複數第一噴頭115向所述基板100靠近所述複數根第一壓制傳送輥114之表面噴淋第一濕處理液,即,顯影液。基板100表面之光致抗蝕劑層部分溶解。 Next, the substrate 100 is sent to the first wet processing unit 11 for the first wet processing. The substrate 100 is transported under the friction of the first transport mechanism 110. The plurality of first showerheads 115 of the first shower mechanism 112 spray the first wet processing liquid, that is, the developer liquid, toward the surface of the substrate 100 near the plurality of first pressing transport rollers 114. The photoresist layer on the surface of the substrate 100 is partially dissolved.

再次,將經所述第一濕處理單元11處理後之基板100置於所述清洗單元12,使所述清洗液噴淋機構122對所述引導傳送機構120傳送之基板100噴淋清洗液以進行清洗,並使清洗後之基板100落入所述收板槽13內。本實施例中,由於所述引導傳送機構120連接於所述第一傳送機構110一端,經所述第一濕處理單元11處理後之基板100直接被傳送至清洗單元12之引導傳送機構120。當基板100自傳輸部125傳送到下板部 126後,由於所述下板部126之傳輸方向與所述傳輸部125之傳輸方向成銳角,且向靠近收板槽13之方向傾斜,基板100傾斜落入收板槽13內,並逐漸下沉。後續落入收板槽13之基板100依次堆疊於前一基板100之上方。由於收板槽13內盛有保存液130,基板100不會因摩擦或碰撞產生刮傷,複數基板100之間也不會因靜電作用而黏附於一起。 The substrate 100 processed by the first wet processing unit 11 is placed in the cleaning unit 12, and the cleaning liquid spraying mechanism 122 sprays the cleaning liquid on the substrate 100 conveyed by the guiding and conveying mechanism 120. The cleaning is performed, and the cleaned substrate 100 is dropped into the receiving groove 13. In this embodiment, since the guiding and conveying mechanism 120 is connected to one end of the first conveying mechanism 110, the substrate 100 processed by the first wet processing unit 11 is directly transferred to the guiding and conveying mechanism 120 of the cleaning unit 12. When the substrate 100 is transferred from the transport portion 125 to the lower plate portion After the 126, since the transmission direction of the lower plate portion 126 is at an acute angle to the transmission direction of the transmission portion 125 and is inclined toward the receiving groove 13, the substrate 100 is inclined to fall into the receiving groove 13, and gradually descends. sink. Substrate 100 that subsequently falls into the tray slot 13 is sequentially stacked above the previous substrate 100. Since the holding liquid 130 is contained in the receiving groove 13, the substrate 100 is not scratched by friction or collision, and the plurality of substrates 100 are not adhered by static electricity.

最後,藉由所述放板單元14從所述收板槽13之保存液130中吸取基板100,並將所述基板100放置於所述第二濕處理單元15以對基板100進行第二濕處理。所述移動臂140帶動所述安裝架141與複數吸盤142進入收板槽13內。使每個吸盤142均與基板100之一頂角相對。啟動泵,每個吸盤142與基板100之間之保存液130被吸走,從而於基板100靠近吸盤142之表面形成負壓,使得基板100被複數吸盤142吸附住。所述複數吸盤142於所述移動臂140之帶動下離開所述收板槽13,將基板100承載於第二傳送機構150之複數根第二承載傳送輥153上後,藉由調節泵使基板100脫離所述複數吸盤142。利用所述第二濕處理單元15對基板100進行濕處理時,所述複數第二噴頭155向所述基板100之表面噴淋第二處理液,即蝕刻液。基板100暴露於光致抗蝕劑層之部分導電銅層與蝕刻液發生化學反應而被蝕刻掉。 Finally, the substrate 100 is taken up from the storage solution 130 of the receiving slot 13 by the panel unit 14, and the substrate 100 is placed in the second wet processing unit 15 to perform second wet on the substrate 100. deal with. The moving arm 140 drives the mounting bracket 141 and the plurality of suction cups 142 into the receiving groove 13 . Each of the chucks 142 is opposed to a top corner of the substrate 100. The pump is activated, and the preservative solution 130 between each of the chucks 142 and the substrate 100 is sucked away, thereby forming a negative pressure on the surface of the substrate 100 near the chuck 142, so that the substrate 100 is attracted by the plurality of chucks 142. The plurality of suction cups 142 are separated from the receiving groove 13 by the moving arm 140, and after the substrate 100 is carried on the plurality of second carrying conveying rollers 153 of the second conveying mechanism 150, the substrate is adjusted by adjusting the pump. 100 is detached from the plurality of suction cups 142. When the substrate 100 is subjected to wet processing by the second wet processing unit 15, the plurality of second heads 155 spray a second processing liquid, that is, an etching liquid, onto the surface of the substrate 100. A portion of the conductive copper layer exposed to the photoresist layer of the substrate 100 is chemically reacted with the etching solution to be etched away.

可理解,若第二濕處理單元15與清洗單元12之間距離較大,於本步驟之前,可先將收板槽13移至所述第二濕處理單元15附近。 It can be understood that if the distance between the second wet processing unit 15 and the cleaning unit 12 is large, before the step, the closing groove 13 can be moved to the vicinity of the second wet processing unit 15.

本技術方案提供之濕處理裝置10採用盛有保存液130之收板槽13浸置經清洗單元12清洗後之基板100,從而一方面可避免基板100因摩擦或碰撞產生刮傷,另一方面還可避免複數基板100之間因靜電作用而黏附於一起。此外,還可省去清洗後之烘乾過程,避免基板100發生變形。收板槽13內之基板100不必進行清洗即可送入第二濕處理單元15進行處理。使用如上所述之濕處理裝置10之濕處理方法可減少處理工序、節省大量資源,有利於提高產品品質。 The wet processing apparatus 10 provided by the technical solution is immersed in the substrate 100 cleaned by the cleaning unit 12 by using the receiving tank 13 containing the preserving liquid 130, thereby preventing the substrate 100 from being scratched by friction or collision on the other hand. It is also possible to prevent the plurality of substrates 100 from sticking together due to electrostatic action. In addition, the drying process after cleaning can be omitted to avoid deformation of the substrate 100. The substrate 100 in the tray 13 can be sent to the second wet processing unit 15 for processing without being cleaned. The wet processing method using the wet processing apparatus 10 as described above can reduce the number of processing steps, save a lot of resources, and contribute to improvement in product quality.

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

10‧‧‧濕處理裝置 10‧‧‧ Wet treatment device

11‧‧‧第一濕處理單元 11‧‧‧First Wet Processing Unit

110‧‧‧第一傳送機構 110‧‧‧First transmission agency

111‧‧‧第一儲存槽 111‧‧‧First storage tank

112‧‧‧第一噴淋機構 112‧‧‧First sprinkler

113‧‧‧第一承載傳送輥 113‧‧‧First carrying conveyor roller

114‧‧‧第一壓制傳送輥 114‧‧‧First press transfer roller

115‧‧‧第一噴頭 115‧‧‧First nozzle

12‧‧‧清洗單元 12‧‧‧cleaning unit

120‧‧‧引導傳送機構 120‧‧‧Guided transport agency

121‧‧‧清洗液儲存槽 121‧‧‧cleaning fluid storage tank

122‧‧‧清洗液噴淋機構 122‧‧‧Clean liquid spraying mechanism

123‧‧‧承載傳送滾輪 123‧‧‧ Carrying conveyor wheel

124‧‧‧壓制傳送滾輪 124‧‧‧Repression transfer roller

125‧‧‧傳輸部 125‧‧‧Transportation Department

126‧‧‧下板部 126‧‧‧ Lower Board

127‧‧‧清洗液噴頭 127‧‧‧cleaning liquid spray head

13‧‧‧收板槽 13‧‧‧Receiving slot

130‧‧‧保存液 130‧‧‧Preservation solution

131‧‧‧側壁 131‧‧‧ side wall

132‧‧‧底壁 132‧‧‧ bottom wall

133‧‧‧快拆塞 133‧‧‧ quick release

14‧‧‧放板單元 14‧‧‧Plate unit

140‧‧‧移動臂 140‧‧‧ moving arm

141‧‧‧安裝架 141‧‧‧mounting frame

142‧‧‧吸盤 142‧‧‧Sucker

15‧‧‧第二濕處理單元 15‧‧‧Second wet processing unit

150‧‧‧第二傳送機構 150‧‧‧Second transport agency

151‧‧‧第二儲存槽 151‧‧‧Second storage tank

152‧‧‧第二噴淋機構 152‧‧‧Second sprinkler

153‧‧‧第二承載傳送輥 153‧‧‧Second load carrying roller

154‧‧‧第二壓制傳送輥 154‧‧‧Second press transfer roller

155‧‧‧第二噴頭 155‧‧‧second nozzle

Claims (9)

一種濕處理裝置,用於對基板進行濕處理,所述濕處理裝置包括第一濕處理單元、第二濕處理單元、清洗單元、收板槽與放板單元;所述清洗單元、收板槽與放板單元均位於所述第一濕處理單元與第二濕處理單元之間;所述第一濕處理單元用於對基板進行第一濕處理;所述第二濕處理單元用於對基板進行第二濕處理;所述清洗單元靠近第一濕處理單元,用於對基板進行清洗,所述清洗單元包括引導傳送機構與清洗液噴淋機構,所述引導傳送機構用於將經所述第一濕處理單元處理後之基板傳送至收板槽,所述引導傳送機構包括相鄰之傳輸部與下板部,所述傳輸部與清洗液噴淋機構相對,所述收板槽靠近所述下板部,所述下板部之傳輸方向與所述傳輸部之傳輸方向成銳角,且向靠近收板槽之方向傾斜,以使自傳輸部傳送至下板部之基板落入收板槽,所述傳輸部與下板部均包括複數根承載傳送滾輪與複數根壓制傳送滾輪,所述複數根承載傳送滾輪與複數根壓制傳送滾輪相對設置,用於傳送位於複數根承載傳送滾輪與複數根壓制傳送滾輪之間之基板,所述清洗液噴淋機構與所述引導傳送機構相對,用於向所述引導傳送機構傳送之基板噴淋清洗液;所述收板槽位於清洗單元與第二濕處理單元之間,收板槽內盛有保存液,用於浸置自引導傳送機構傳送之基板;所述放板單元與收板槽相對,用於從所述收板槽之保存液中吸取基板,並將 所述基板放置於所述第二濕處理單元以進行第二濕處理。 A wet processing apparatus for wet processing a substrate, the wet processing apparatus comprising a first wet processing unit, a second wet processing unit, a cleaning unit, a take-up slot and a board unit; the cleaning unit and the receiving slot And the board unit are located between the first wet processing unit and the second wet processing unit; the first wet processing unit is configured to perform a first wet processing on the substrate; and the second wet processing unit is used to the opposite substrate Performing a second wet processing; the cleaning unit is adjacent to the first wet processing unit for cleaning the substrate, the cleaning unit includes a guiding conveying mechanism and a cleaning liquid spraying mechanism, and the guiding conveying mechanism is configured to The substrate processed by the first wet processing unit is transferred to a take-up slot, and the guide transport mechanism includes an adjacent transport portion and a lower plate portion, the transport portion is opposite to the cleaning liquid spray mechanism, and the take-up slot is close to the In the lower plate portion, the conveying direction of the lower plate portion is at an acute angle to the conveying direction of the conveying portion, and is inclined toward the closing groove so that the substrate transferred from the conveying portion to the lower plate portion falls into the closing plate Slot The conveying portion and the lower plate portion each include a plurality of carrying conveying rollers and a plurality of pressing conveying rollers, and the plurality of carrying conveying rollers are disposed opposite to the plurality of pressing conveying rollers for conveying the plurality of carrying conveying rollers and the plurality of pressing conveyings a substrate between the rollers, the cleaning liquid spraying mechanism is opposite to the guiding conveying mechanism, and is used for spraying the cleaning liquid to the substrate conveyed by the guiding conveying mechanism; the receiving groove is located at the cleaning unit and the second wet processing Between the units, the receiving tank contains a holding liquid for immersing the substrate conveyed by the guiding conveying mechanism; the releasing unit is opposite to the receiving groove for sucking the substrate from the holding liquid of the receiving groove And The substrate is placed in the second wet processing unit for a second wet processing. 如申請專利範圍第1項所述之濕處理裝置,其中,所述清洗單元還包括用於儲存清洗液之清洗液儲存槽,所述清洗液噴淋機構與所述清洗液儲存槽相連通,所述引導傳送機構位於所述清洗液儲存槽與所述清洗液噴淋機構之間,所述複數根承載傳送滾輪並排設置,且均靠近所述清洗液儲存槽,所述複數根壓制傳送滾輪並排設置,且均靠近所述清洗液噴淋機構。 The wet processing apparatus according to claim 1, wherein the cleaning unit further comprises a cleaning liquid storage tank for storing the cleaning liquid, and the cleaning liquid spraying mechanism is connected to the cleaning liquid storage tank, The guiding conveying mechanism is located between the cleaning liquid storage tank and the cleaning liquid spraying mechanism, the plurality of carrying conveying rollers are arranged side by side, and both are close to the cleaning liquid storage tank, and the plurality of pressing conveying rollers They are arranged side by side and are close to the cleaning liquid spraying mechanism. 如申請專利範圍第1項所述之濕處理裝置,其中,所述第一濕處理單元包括第一傳送機構、第一噴淋機構及用於儲存第一濕處理液之第一儲存槽,所述第一傳送機構連接於所述引導傳送機構之一端,用於將基板傳送至引導傳送機構,所述第一傳送機構位於所述第一儲存槽與第一噴淋機構之間,所述第一噴淋機構與第一儲存槽相連通,用於向所述第一傳送機構傳送之基板噴出第一濕處理液。 The wet processing apparatus of claim 1, wherein the first wet processing unit comprises a first conveying mechanism, a first spraying mechanism, and a first storage tank for storing the first wet processing liquid, a first conveying mechanism connected to one end of the guiding conveying mechanism for conveying the substrate to the guiding conveying mechanism, the first conveying mechanism being located between the first storage tank and the first spraying mechanism, the first A spraying mechanism is in communication with the first storage tank, and the substrate for conveying the first conveying mechanism ejects the first wet processing liquid. 如申請專利範圍第3項所述之濕處理裝置,其中,所述第一傳送機構包括複數根第一承載傳送輥與複數根第一壓制傳送輥,所述複數根第一承載傳送輥均靠近所述第一儲存槽,所述複數根第一承載傳送輥並排設置,且與所述引導傳送機構之複數根承載傳送滾輪相鄰,所述複數根第一壓制傳送輥均靠近所述第一噴淋機構,所述複數根第一壓制傳送輥並排設置,且與所述引導傳送機構之複數根壓制傳送滾輪相鄰,所述複數根第一承載傳送輥與複數根第一壓制傳送輥相對設置,用於傳送位於複數根第一承載傳送輥與複數根第一壓制傳 送輥之間之基板。 The wet processing apparatus of claim 3, wherein the first conveying mechanism comprises a plurality of first carrier conveying rollers and a plurality of first pressing conveying rollers, the plurality of first carrier conveying rollers being close to each other The first storage tank, the plurality of first carrier conveying rollers are arranged side by side, and adjacent to the plurality of carrier conveying rollers of the guiding conveying mechanism, the plurality of first pressing conveying rollers are all close to the first a spraying mechanism, the plurality of first pressing conveying rollers are arranged side by side, and adjacent to the plurality of pressing conveying rollers of the guiding conveying mechanism, the plurality of first carrying conveying rollers are opposite to the plurality of first pressing conveying rollers Setting for transmitting a plurality of first carrier transfer rollers and a plurality of first suppression passes The substrate between the rollers. 如申請專利範圍第3項所述之濕處理裝置,其中,所述第一濕處理單元還包括一第一濕處理液調節器,所述第一濕處理液調節器用於監控所述第一儲存槽內之第一濕處理液之濃度,並於該濃度低於預定值時進行補充調節。 The wet processing apparatus of claim 3, wherein the first wet processing unit further comprises a first wet processing liquid regulator, wherein the first wet processing liquid regulator is configured to monitor the first storage The concentration of the first wet treatment liquid in the tank, and the supplementary adjustment is performed when the concentration is lower than a predetermined value. 如申請專利範圍第1項所述之濕處理裝置,其中,所述第二濕處理單元包括第二傳送機構、第二噴淋機構及用於儲存第二濕處理液之第二儲存槽,所述第二傳送機構位於所述第二儲存槽與第二噴淋機構之間,所述第二傳送機構用於傳送來自放板單元之基板,所述第二噴淋機構與第二儲存槽相連通,用於向所述第二傳送機構傳送之基板噴出第二濕處理液。 The wet processing apparatus according to claim 1, wherein the second wet processing unit comprises a second conveying mechanism, a second spraying mechanism, and a second storage tank for storing the second wet processing liquid. The second conveying mechanism is located between the second storage tank and the second spraying mechanism, the second conveying mechanism is for conveying the substrate from the discharging unit, and the second spraying mechanism is connected to the second storage tank The second wet processing liquid is ejected from the substrate for conveying to the second conveying mechanism. 如申請專利範圍第6項所述之濕處理裝置,其中,所述第二傳送機構包括複數根第二承載傳送輥與複數根第二壓制傳送輥,所述複數根第二承載傳送輥並排設置,且均靠近所述第二儲存槽,所述複數根第二壓制傳送輥並排設置,且均靠近所述第二噴淋機構,所述複數根第二承載傳送輥與複數根第二壓制傳送輥相對設置,用於傳送位於複數根第二承載傳送輥與複數根第二壓制傳送輥之間之基板。 The wet processing apparatus of claim 6, wherein the second conveying mechanism comprises a plurality of second carrier conveying rollers and a plurality of second pressing conveying rollers, and the plurality of second carrier conveying rollers are arranged side by side And both are adjacent to the second storage tank, the plurality of second pressing conveying rollers are arranged side by side, and both are adjacent to the second spraying mechanism, the plurality of second carrying conveying rollers and the plurality of second pressing conveyings The rollers are disposed oppositely for transporting the substrate between the plurality of second carrier transport rollers and the plurality of second press transport rollers. 如申請專利範圍第1項所述之濕處理裝置,其中,所述放板單元包括一移動臂、一安裝架與複數吸盤,所述安裝架連接於所述移動臂,所述移動臂用於帶動安裝架移動,所述複數吸盤相互間隔地安裝於所述安裝架,用於在移動臂帶動下浸入保存液中吸取基板。 The wet processing apparatus according to claim 1, wherein the loading unit comprises a moving arm, a mounting bracket and a plurality of suction cups, the mounting bracket is coupled to the moving arm, and the moving arm is used for The mounting frame is moved, and the plurality of suction cups are mounted on the mounting frame at a distance from each other for absorbing the substrate by immersing the storage liquid under the driving of the moving arm. 一種使用如申請專利範圍第1項所述之濕處理裝置之濕處理 方法,包括步驟:提供基板;將所述基板送入所述第一濕處理單元以進行第一濕處理;利用引導傳送機構傳送經所述第一濕處理單元處理後之基板,使所述清洗液噴淋機構對所述引導傳送機構傳送之基板噴淋清洗液以進行清洗,並使清洗後之基板落入所述收板槽內;藉由所述放板單元從所述收板槽之保存液中吸取基板,並將所述基板放置於所述第二濕處理單元以對基板進行第二濕處理。 Wet treatment using a wet processing device as described in claim 1 The method includes the steps of: providing a substrate; feeding the substrate to the first wet processing unit to perform a first wet processing; and transferring the substrate processed by the first wet processing unit by using a guiding transport mechanism to cause the cleaning The liquid spraying mechanism sprays the cleaning liquid on the substrate conveyed by the guiding and conveying mechanism to clean the substrate, and causes the cleaned substrate to fall into the receiving groove; and the discharging unit is from the receiving groove The substrate is taken up in the preservation solution, and the substrate is placed in the second wet processing unit to perform a second wet treatment on the substrate.
TW99131121A 2010-09-15 2010-09-15 Apparatus and method for wet process TWI415533B (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW439135B (en) * 1998-07-06 2001-06-07 Steag Micro Tech Gmbh Method and device for cleaning substrates
TWI228772B (en) * 2003-07-24 2005-03-01 Chi Mei Optoelectronics Corp Wet machine and wet process by using the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW439135B (en) * 1998-07-06 2001-06-07 Steag Micro Tech Gmbh Method and device for cleaning substrates
TWI228772B (en) * 2003-07-24 2005-03-01 Chi Mei Optoelectronics Corp Wet machine and wet process by using the same

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