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TWI408746B - Method of fabricating patterned substrate - Google Patents

Method of fabricating patterned substrate Download PDF

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Publication number
TWI408746B
TWI408746B TW100101976A TW100101976A TWI408746B TW I408746 B TWI408746 B TW I408746B TW 100101976 A TW100101976 A TW 100101976A TW 100101976 A TW100101976 A TW 100101976A TW I408746 B TWI408746 B TW I408746B
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Taiwan
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substrate
aluminum
temperature
manufacturing
patterned
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TW100101976A
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Chinese (zh)
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TW201232658A (en
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wen teng Liang
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Lextar Electronics Corp
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Priority to CN2011102193823A priority patent/CN102610710A/en
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  • Drying Of Semiconductors (AREA)

Abstract

The invention provides a method for manufacturing graphical substrates, which comprises the steps of (a) providing a substrate with an upper surface; (b) depositing a metal layer on the upper surface of the substrate; (c) increasing the temperature so as to aggregate a plurality of metal particles on the upper surface; (d) introducing reaction gas so as to react the plurality of metal particles with the reaction gas and form a patterned structure on the upper surface. The invention manufactures sapphire substrates in a grow-up manner. Compared with the prior etching manner, the complicated steps are avoided and only the fundamental equipment is required.

Description

圖形化基板之製造方法Method for manufacturing patterned substrate

本發明係有關於一種圖形化基板之製造方法,特別是一種無須藉由蝕刻製程以製作圖形化基板之製造方法。The present invention relates to a method of fabricating a patterned substrate, and more particularly to a method of fabricating a patterned substrate without an etching process.

隨著科技的日新月異,近年來發光二極體(Light-Emmiting Diode,LED)因其具有耗電量低、元件壽命長、無須暖燈時間、反應速度快以及體積小的優點,使其愈來愈廣泛地被應用在各式場合。With the rapid development of technology, in recent years, Light-Emmiting Diode (LED) has become more and more popular because of its low power consumption, long component life, no need for warm-up time, fast response, and small size. The more widely used it is in various situations.

發光二極體通常設置於具有圖形化表面之藍寶石基板上,藉以提昇其發光效率。然而,於先前技術中藍寶石基板係必須經過乾蝕刻製程或溼蝕刻製程以形成圖形化表面於藍寶石基板上,於蝕刻過程中必須利用金屬,氧化物或氮化物保護部分的藍寶石基板,而蝕刻過程結束後得需對藍寶石基板作清潔,又受限黃光製程,僅能製作出微米等級之圖形化藍寶石基板。此過程不僅繁瑣費時,更必須搭配有昂貴的機台設備而導致製造成本高昂。The light-emitting diode is usually disposed on a sapphire substrate having a patterned surface to enhance its luminous efficiency. However, in the prior art, the sapphire substrate system must be subjected to a dry etching process or a wet etching process to form a patterned surface on the sapphire substrate, and the sapphire substrate must be protected by metal, oxide or nitride during the etching process, and the etching process. After the end, the sapphire substrate needs to be cleaned, and the yellow light process is limited, and only a micron-sized patterned sapphire substrate can be produced. This process is not only cumbersome and time consuming, but must also be accompanied by expensive machine equipment, resulting in high manufacturing costs.

緣是,本發明人有感上述之課題,乃特潛心研究並配合學理之運用,終於提出一種設計合理且有效改善上述缺失之本發明。The reason is that the present inventors have felt the above-mentioned problems, and have devoted themselves to research and cooperated with the application of the theory, and finally proposed a present invention which is rational in design and effective in improving the above-mentioned defects.

本發明提供一種圖形化基板之製造方法,包含下述步驟:(a)提供基板,基板具有上表面;(b)升高溫度至600~900℃且通入三甲基鋁(Trimethyl-aluminum,TMAL),以於基板之上表面形成鋁層;(c)保持溫度於600~900℃至使鋁層聚集成為多個鋁粒,分佈於上表面,同時使基板之部份上表面未被鋁粒遮住而露出;以及(d)通入反應氣體,使多個鋁粒與反應氣體化合形成圖形化結構於上表面。The invention provides a method for manufacturing a patterned substrate, comprising the steps of: (a) providing a substrate having an upper surface; (b) raising the temperature to 600-900 ° C and introducing trimethyl-aluminum (Trimethyl-aluminum, TMAL) to form an aluminum layer on the upper surface of the substrate; (c) maintaining the temperature at 600-900 ° C until the aluminum layer is aggregated into a plurality of aluminum particles distributed on the upper surface while the upper surface of the substrate is not aluminum The particles are covered and exposed; and (d) the reaction gas is introduced to combine a plurality of aluminum particles with the reaction gas to form a patterned structure on the upper surface.

本發明提供另一種圖形化基板之製造方法,包含下述步驟:(a)提供基板,基板具有上表面;(b)鍍設金屬層於基板之上表面;(c)升高溫度至使金屬層聚集為不規則圖形金屬粒,分佈於上表面,同時使基板之部份上表面未被金屬粒遮住而露出;以及(d)通入反應氣體,使不規則圖形金屬粒與反應氣體化合形成圖形化結構於上表面。The invention provides a method for manufacturing another patterned substrate, comprising the steps of: (a) providing a substrate having an upper surface; (b) plating a metal layer on the upper surface of the substrate; (c) raising the temperature to the metal The layers are aggregated into irregular pattern metal particles distributed on the upper surface while partially exposing a portion of the upper surface of the substrate without being covered by the metal particles; and (d) introducing a reaction gas to combine the irregular pattern metal particles with the reaction gas A patterned structure is formed on the upper surface.

本發明具有以下有益的效果:本發明利用成長之方式製作藍寶石基板,相較於習知以蝕刻之方式製作藍寶石基板,可省卻不少繁瑣步驟及僅須使用最基本的機台設備,,即可製作出奈米等級的圖形化結構於藍寶石基板上。The invention has the following beneficial effects: the invention uses the growing method to manufacture the sapphire substrate, and the sapphire substrate is etched in a conventional manner, which can save a lot of cumbersome steps and only need to use the most basic machine equipment, ie A nanoscale patterned structure can be fabricated on the sapphire substrate.

為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。For a better understanding of the features and technical aspects of the present invention, reference should be made to the accompanying drawings.

請參閱圖1至圖3,依序為本發明實施圖形化基板1之製造方法時,基板1之剖視圖面(一)~(三),圖形化基板1之製造方法,包含下列步驟:(a)提供基板1,基板1具有上表面10;(b)於基板1之上表面10沉積鋁層2(c)升高溫度至使鋁層2聚集形成多個鋁粒分佈於上表面10;(d)通入反應氣體,使多個鋁粒與反應氣體化合形成圖形化結構於上表面10。而詳細內容則更進一步敘述如下。Referring to FIG. 1 to FIG. 3, in order to implement the method for manufacturing the patterned substrate 1 according to the present invention, the cross-sectional view (1) to (3) of the substrate 1 and the method for manufacturing the patterned substrate 1 include the following steps: Providing a substrate 1 having an upper surface 10; (b) depositing an aluminum layer 2 on the upper surface 10 of the substrate 1 (c) raising the temperature to cause the aluminum layer 2 to aggregate to form a plurality of aluminum particles distributed on the upper surface 10; d) introducing a reaction gas to combine a plurality of aluminum particles with the reaction gas to form a patterned structure on the upper surface 10. The details are further described below.

請合併參閱圖4,首先執行步驟(a)提供基板1,基板1具有上表面10;於步驟(a)中,基板1通常為藍寶石基板,以供設置發光二極體,藉以使發光二極體能夠提供良好的發光效率,然基板1並不限於使用藍寶石基板。步驟(a)後,執行步驟(b)。於步驟(b)中,將整體溫度升高至600~900℃後,並通入三甲基鋁(Trimethyl-aluminum,TMAL),以於基板1之上表面10形成鋁層2;於步驟(b)中鋁層2之詳細形成步驟如下:(b1)升高溫度至600~900℃;(b2)以1~200毫升/分之速率通入三甲基鋁(Trimethyl-aluminum,TMAL)10~120秒,以於基板1之上表面10形成鋁層2。在步驟(b)後執行步驟(c)停止通入三甲基鋁,且保持溫度於600~900℃至使鋁層2聚集成為多個鋁粒3,分佈於上表面10,保持溫度1~120秒,以形成100nm~200nm之鋁粒3。最後執行步驟(d)通入反應氣體,使多個鋁粒3與反應氣體化合形成圖形化結構於上表面10。其中,反應氣體通常為氧氣、氨氣或氮氣,但不限於氧氣、氨氣和氮氣,而於步驟(d)之詳細步驟如下:(d1)持溫600~900℃;以及(d2)通入氧氣10~1800秒,使多個鋁粒3與反應氣體化合形成多晶氧化鋁於基板1之上表面10。若欲形成單晶氧化鋁,於步驟(c)後,步驟(d)之詳細步驟可改為:(d1’)升溫至1100~1300℃;以及(d2’)通入氧氣10~18()0秒,使所述多個鋁粒3與反應氣體化合形成單晶氧化鋁於基板1之上表面10;或者,若欲形成單晶氮化鋁,可於步驟(c)後依下述步驟執行:(d1”)持溫600~900℃;以及(d2”)通入氨氣10~1800秒,使多個鋁粒3與反應氣體化合形成單晶氮化鋁於基板1之上表面10。Referring to FIG. 4, firstly, step (a) is performed to provide a substrate 1 having an upper surface 10; in the step (a), the substrate 1 is usually a sapphire substrate for providing a light-emitting diode, thereby making the light-emitting diode The body can provide good luminous efficiency, and the substrate 1 is not limited to the use of a sapphire substrate. After step (a), step (b) is performed. In the step (b), the overall temperature is raised to 600-900 ° C, and trimethyl-aluminum (TMAL) is introduced to form an aluminum layer 2 on the upper surface 10 of the substrate 1; b) The detailed formation steps of the middle aluminum layer 2 are as follows: (b1) raising the temperature to 600-900 ° C; (b2) introducing trimethyl-aluminum (TMAL) 10 at a rate of 1 to 200 ml/min. ~120 seconds, to form the aluminum layer 2 on the upper surface 10 of the substrate 1. After step (b), step (c) is performed to stop the introduction of trimethylaluminum, and the temperature is maintained at 600-900 ° C until the aluminum layer 2 is aggregated into a plurality of aluminum particles 3, distributed on the upper surface 10, and maintained at a temperature of 1~ 120 seconds to form aluminum particles 3 of 100 nm to 200 nm. Finally, step (d) is carried out to introduce a reaction gas, and a plurality of aluminum particles 3 are combined with the reaction gas to form a patterned structure on the upper surface 10. Wherein, the reaction gas is usually oxygen, ammonia or nitrogen, but is not limited to oxygen, ammonia and nitrogen, and the detailed steps in step (d) are as follows: (d1) holding temperature 600~900 °C; and (d2) access Oxygen is 10 to 1800 seconds, and a plurality of aluminum particles 3 are combined with a reaction gas to form polycrystalline alumina on the upper surface 10 of the substrate 1. If the single crystal alumina is to be formed, after step (c), the detailed steps of step (d) can be changed to: (d1') temperature rise to 1100~1300 °C; and (d2') oxygen supply 10~18 () 0 seconds, the plurality of aluminum particles 3 are combined with a reaction gas to form single crystal alumina on the upper surface 10 of the substrate 1; or, if a single crystal aluminum nitride is to be formed, the following steps may be followed in the step (c) Execution: (d1") holding temperature 600~900 °C; and (d2") introducing ammonia gas for 10~1800 seconds, combining a plurality of aluminum particles 3 with a reaction gas to form single crystal aluminum nitride on the upper surface 10 of the substrate 1 .

請參閱圖5至圖7,依序為本發明實施另一種圖形化基板之製造方法時,基板1之剖視圖面(一)~(三)。請合併參考圖8所示,本發明圖形化基板之製造方法,包含下列步驟:(a)提供基板1,基板1具有上表面10;於步驟(a)中,基板1通常為藍寶石基板,以使發光二極體能達到良好的發光效率,但不限定為藍寶石基板。接著,執行步驟(b)鍍設金屬層5於基板1之上表面10;可使用化鍍或電鍍的方式,可隨製造者選擇。步驟(b)後,執行步驟(c)升高溫度以使金屬層5形成為不規則圖形金屬粒6,分佈於上表面10;於步驟(c)中不規則圖形金屬層5之詳細形成步驟如下,(c1)升高溫度至200~900℃之間;以及(c2)保持200~900℃之溫度1~400分鐘,以使金屬層5形成為不規則圖形金屬粒6,分佈於上表面10,同時使基板之部份上表面未被金屬粒6遮住而露出,金屬粒6高度和大小會接近於金屬層5厚度。接著,執行步驟(d)通入一反應氣體,使不規則圖形金屬粒6與反應氣體化合形成圖形化結構於上表面10,所需時間和金屬粒6大小相關,金屬粒6越大所需時間越久。其中,金屬層5較佳為鋁層,反應氣體可為氧氣或氮氣,使鋁層與氧氣或氮氣結合成氧化鋁或氮化鋁,但在此不作限定。於步驟(d)中,單晶氧化鋁之詳細形成步驟如下:(d1)升高溫度至1100~1300℃;以及(d2)通入氧氣1~1440分鐘,使不規則圖形金屬層5與反應氣體化合形成單晶氧化鋁於基板之上表面10。Referring to FIG. 5 to FIG. 7 , in order to implement another method for manufacturing a patterned substrate according to the present invention, the cross-sectional views (1) to (3) of the substrate 1 are sequentially performed. Referring to FIG. 8, the method for manufacturing the patterned substrate of the present invention comprises the following steps: (a) providing a substrate 1 having an upper surface 10; and in the step (a), the substrate 1 is usually a sapphire substrate, The light-emitting diode can achieve good luminous efficiency, but is not limited to a sapphire substrate. Next, step (b) is performed to plate the metal layer 5 on the upper surface 10 of the substrate 1; the plating or plating may be used, which may be selected by the manufacturer. After the step (b), the step (c) is performed to raise the temperature so that the metal layer 5 is formed as the irregular pattern metal particles 6 and distributed on the upper surface 10; and the detailed formation step of the irregular pattern metal layer 5 in the step (c) As follows, (c1) raising the temperature to between 200 and 900 ° C; and (c2) maintaining the temperature of 200 to 900 ° C for 1 to 400 minutes, so that the metal layer 5 is formed as irregular pattern metal particles 6 and distributed on the upper surface. 10. At the same time, a part of the upper surface of the substrate is not covered by the metal particles 6, and the height and size of the metal particles 6 are close to the thickness of the metal layer 5. Then, step (d) is carried out to pass a reaction gas, and the irregular pattern metal particles 6 are combined with the reaction gas to form a patterned structure on the upper surface 10. The time required is related to the size of the metal particles 6, and the metal particles 6 are required to be larger. The longer the time. The metal layer 5 is preferably an aluminum layer, and the reaction gas may be oxygen or nitrogen, and the aluminum layer is combined with oxygen or nitrogen to form aluminum oxide or aluminum nitride, but is not limited herein. In the step (d), the detailed formation steps of the single crystal alumina are as follows: (d1) raising the temperature to 1100 to 1300 ° C; and (d2) introducing oxygen for 1 to 1440 minutes to cause the irregular pattern metal layer 5 and the reaction The gas combines to form a single crystal alumina on the upper surface 10 of the substrate.

於製備一圖形化基板後,即可將基板放入磊晶機台內磊晶,最廣為使用的磊晶機台為使用有機金屬化學氣相沉積法(Metal-organic Chemical Vapor Deposition,MOCVD)之磊晶機台。綜上所述,本發明之圖形化基板之製造方法採用晶體成長之技術取代習知以蝕刻製程,改善過於繁複的習知圖形化基板之製造方法,且可省略額外的蝕刻設備,例如感應耦合電漿離子蝕刻(Inductive Coupling Plasma,ICP)、溼蝕刻及黃光等設備皆不需要,只利用磊晶機台即可完成。由於本發明之圖形化基板之製造方法不再需要上述蝕刻設備,因此清除蝕刻原料及花費在不同設備間運送的時間亦可省下。再者,由於本發明之圖形化基板之製造方法是採用晶體成長之技術,因此圖形尺寸更可達奈米等級。After preparing a patterned substrate, the substrate can be placed in an epitaxial machine for epitaxy. The most widely used epitaxial machine is Metal-organic Chemical Vapor Deposition (MOCVD). The epitaxial machine. In summary, the method for fabricating the patterned substrate of the present invention replaces the conventional etching process by the technique of crystal growth, and improves the manufacturing method of the conventional complicated patterned substrate, and can omit additional etching equipment such as inductive coupling. Devices such as Inductive Coupling Plasma (ICP), wet etching, and yellow light are not required, and can be completed only by using an epitaxial machine. Since the above-described etching apparatus is no longer required in the method of manufacturing the patterned substrate of the present invention, the time for removing the etching raw material and the transportation between the different apparatuses can be saved. Furthermore, since the method of manufacturing the patterned substrate of the present invention is a technique of crystal growth, the pattern size is up to the nanometer level.

惟以上所述僅為本發明之較佳實施例,非意欲侷限本發明的專利保護範圍,故舉凡運用本發明說明書及圖式內容所為的等效變化,均同理皆包含於本發明的權利保護範圍內,合予陳明。The above is only the preferred embodiment of the present invention, and is not intended to limit the scope of the invention, and the equivalents of the present invention and the equivalents of the drawings are all included in the present invention. Within the scope of protection, it is given to Chen Ming.

1...基板1. . . Substrate

10...上表面10. . . Upper surface

2...鋁層2. . . Aluminum layer

3...鋁粒3. . . Aluminum

4...圖形化結構4. . . Graphical structure

5...金屬層5. . . Metal layer

6...金屬粒6. . . Metal grain

圖1為本發明之第一實施例之製造方法之圖形化基板之剖視圖(一);Figure 1 is a cross-sectional view (1) of a patterned substrate of a manufacturing method according to a first embodiment of the present invention;

圖2為本發明之第一實施例之製造方法之圖形化基板之剖視圖(二);Figure 2 is a cross-sectional view (2) of the patterned substrate of the manufacturing method of the first embodiment of the present invention;

圖3為本發明之第一實施例之製造方法之圖形化基板之剖視圖(三);Figure 3 is a cross-sectional view (3) of the patterned substrate of the manufacturing method of the first embodiment of the present invention;

圖4係為本發明之第一實施例之圖形化基板之製造方法之之流程圖。4 is a flow chart showing a method of manufacturing a patterned substrate according to a first embodiment of the present invention.

圖5為本發明之第二實施例之製造方法之圖形化基板之剖視圖(一);Figure 5 is a cross-sectional view (1) of the patterned substrate of the manufacturing method of the second embodiment of the present invention;

圖6為本發明之第二實施例之製造方法之圖形化基板之剖視圖(二);Figure 6 is a cross-sectional view (2) of the patterned substrate of the manufacturing method of the second embodiment of the present invention;

圖7為本發明之第二實施例之製造方法之圖形化基板之剖視圖(三);以及Figure 7 is a cross-sectional view (3) of the patterned substrate of the manufacturing method of the second embodiment of the present invention;

圖8係為本發明之第二實施例之圖形化基板之製造方法之之流程圖。Fig. 8 is a flow chart showing a method of manufacturing a patterned substrate according to a second embodiment of the present invention.

1...基板1. . . Substrate

10...上表面10. . . Upper surface

4...圖形化結構4. . . Graphical structure

Claims (10)

一種圖形化基板之製造方法,包含下列步驟:(a)提供一基板,該基板具有一上表面;(b)於該基板之該上表面沉積一金屬層;(c)升高溫度至使該金屬層聚集形成多個金屬粒分佈於上表面,同時使該基板之部份該上表面未被所述多個金屬粒遮住而露出;以及(d)通入一反應氣體,使所述多個金屬粒與該反應氣體化合形成圖形化結構於該上表面。A method of fabricating a patterned substrate comprising the steps of: (a) providing a substrate having an upper surface; (b) depositing a metal layer on the upper surface of the substrate; (c) raising the temperature to cause the The metal layers are aggregated to form a plurality of metal particles distributed on the upper surface while a portion of the upper surface of the substrate is not exposed by the plurality of metal particles; and (d) a reactive gas is introduced to cause the plurality of The metal particles are combined with the reaction gas to form a patterned structure on the upper surface. 一種圖形化基板之製造方法,包含下列步驟:(a)提供一基板,該基板具有一上表面;(b)升高溫度至600~900 ℃且通入三甲基鋁(Trimethyl-aluminum,TMAL),以於該基板之該上表面形成一鋁層;(c)停止通入三甲基鋁,且保持溫度於600~900℃至使該鋁層聚集成為多個鋁粒,分佈於該上表面;以及(d)通入一反應氣體,使所述多個鋁粒與該反應氣體化合形成圖形化結構於該上表面。A method of manufacturing a patterned substrate, comprising the steps of: (a) providing a substrate having an upper surface; (b) raising the temperature to 600-900 ° C and introducing trimethyl-aluminum (TMAL) And forming an aluminum layer on the upper surface of the substrate; (c) stopping the passage of the trimethylaluminum and maintaining the temperature at 600-900 ° C until the aluminum layer is aggregated into a plurality of aluminum particles, distributed thereon And (d) introducing a reactive gas to combine the plurality of aluminum particles with the reactive gas to form a patterned structure on the upper surface. 如申請專利範圍第2項所述之製造方法,其中該基板為一藍寶石基板,該反應氣體為氧氣、氨氣或氮氣,且步驟(b)包含下述步驟:(b1)升高溫度至600~900℃;以及(b2)以1~200毫升/分之速率通入三甲基鋁(Trimethyl-aluminum,TMAL)10~120秒,以於該基板之該上表面形成該鋁層。The manufacturing method according to claim 2, wherein the substrate is a sapphire substrate, the reaction gas is oxygen, ammonia or nitrogen, and the step (b) comprises the step of: (b1) raising the temperature to 600 ~900 ° C; and (b2) Trimethyl-aluminum (TMAL) is introduced at a rate of 1 to 200 ml/min for 10 to 120 seconds to form the aluminum layer on the upper surface of the substrate. 如申請專利範圍第3項所述之製造方法,其中步驟(d)包含下述步驟:(d1)持溫600~900℃;以及(d2)通入氧氣1~120秒,使所述多個鋁粒與該反應氣體化合形成多晶氧化鋁於該基板之該上表面。The manufacturing method according to claim 3, wherein the step (d) comprises the steps of: (d1) holding a temperature of 600 to 900 ° C; and (d2) introducing oxygen for 1 to 120 seconds to make the plurality of Aluminum particles are combined with the reaction gas to form polycrystalline alumina on the upper surface of the substrate. 如申請專利範圍第3項所述之製造方法,其中步驟(d)包含下述步驟:(d1’)升溫至1100~1300℃;以及(d2’)通入氧氣10~1800秒,使所述多個鋁粒與該反應氣體化合形成單晶氧化鋁於該基板之該上表面。The manufacturing method of claim 3, wherein the step (d) comprises the steps of: (d1') raising the temperature to 1100 to 1300 ° C; and (d2') introducing oxygen for 10 to 1800 seconds to cause the A plurality of aluminum particles are combined with the reaction gas to form single crystal alumina on the upper surface of the substrate. 如申請專利範圍第3項所述之製造方法,其中步驟(d)包含下述步驟:(d1”)持溫600~900℃;以及(d2”)通入氨氣或氮氣10~1800秒,使所述多個鋁粒與該反應氣體化合形成單晶氮化鋁於該基板之該上表面。The manufacturing method according to claim 3, wherein the step (d) comprises the steps of: (d1") holding a temperature of 600 to 900 ° C; and (d2") introducing ammonia or nitrogen for 10 to 1800 seconds, The plurality of aluminum particles are combined with the reaction gas to form a single crystal aluminum nitride on the upper surface of the substrate. 一種圖形化基板之製造方法,包含下列步驟:(a)提供一基板,該基板具有一上表面;(b)鍍設一金屬層於該基板之該上表面;(c)升高溫度以使該金屬層形成為不規則圖形金屬層,分佈於該上表面;以及(d)通入一反應氣體,使該不規則圖形金屬層與該反應氣體化合形成圖形化結構於該上表面。A method of fabricating a patterned substrate, comprising the steps of: (a) providing a substrate having an upper surface; (b) plating a metal layer on the upper surface of the substrate; and (c) raising a temperature to cause And forming a patterned metal layer on the upper surface; 如申請專利範圍第7項所述之製造方法,其中該基板為一藍寶石基板,該金屬層為一鋁層,該反應氣體為氧氣、氨氣或氮氣。The manufacturing method according to claim 7, wherein the substrate is a sapphire substrate, the metal layer is an aluminum layer, and the reaction gas is oxygen, ammonia or nitrogen. 如申請專利範圍第8項所述之製造方法,其中步驟(c)包含下述步驟:(c1)升高溫度至200~900℃之間;以及(c2)保持200~900℃之溫度1~400分,以使該金屬層形成為不規則圖形金屬粒,分佈於該上表面。The manufacturing method according to claim 8, wherein the step (c) comprises the steps of: (c1) raising the temperature to between 200 and 900 ° C; and (c2) maintaining the temperature of 200 to 900 ° C. 400 minutes so that the metal layer is formed as irregular pattern metal particles distributed on the upper surface. 如申請專利範圍第9項所述之製造方法,其中步驟(d)包含下述步驟:(d1)升高溫度至1100~1300℃;以及(d2)通入氧氣1~1440分鐘,使不規則圖形金屬層與該反應氣體化合形成單晶氧化鋁於該基板之該上表面。The manufacturing method according to claim 9, wherein the step (d) comprises the steps of: (d1) raising the temperature to 1100 to 1300 ° C; and (d2) introducing oxygen for 1 to 1440 minutes to make the irregularity A patterned metal layer is combined with the reactive gas to form single crystal alumina on the upper surface of the substrate.
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020013037A1 (en) * 1997-05-30 2002-01-31 Ichiro Yamashita Two-dimensionally arrayed quantum device
US20100006430A1 (en) * 2006-10-20 2010-01-14 Showa Denko K.K. Sputtering deposition apparatus and backing plate for use in sputtering deposition apparatus
US7674644B2 (en) * 2004-09-13 2010-03-09 Showa Denko K.K. Method for fabrication of group III nitride semiconductor
TW201029051A (en) * 2009-01-21 2010-08-01 Siltron Inc Semiconductor device, light emitting device and method for manufacturing the same
TW201031032A (en) * 2008-12-08 2010-08-16 Showa Denko Kk Template substrate used for semiconductor light-emitting device, the manufacturing method thereof, manufacturing method of semiconductor light-emitting device and the device thereof
TW201034242A (en) * 2008-10-20 2010-09-16 Showa Denko Kk Semiconductor light-emitting device and method for producing the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5032145B2 (en) * 2006-04-14 2012-09-26 株式会社東芝 Semiconductor device
CN101295636A (en) * 2007-04-25 2008-10-29 中国科学院半导体研究所 Production method of pattern underlay for epitaxial growth of high-crystal quality nitride
KR100990226B1 (en) * 2007-11-21 2010-10-29 우리엘에스티 주식회사 GaN-based Light Emitting Diode having omnidirectional reflector with 3-dimensional structure and method for fabricating the same
CN101599466B (en) * 2009-07-10 2012-08-29 中山大学 Graphic substrate for epitaxial growth and production method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020013037A1 (en) * 1997-05-30 2002-01-31 Ichiro Yamashita Two-dimensionally arrayed quantum device
US7674644B2 (en) * 2004-09-13 2010-03-09 Showa Denko K.K. Method for fabrication of group III nitride semiconductor
US20100006430A1 (en) * 2006-10-20 2010-01-14 Showa Denko K.K. Sputtering deposition apparatus and backing plate for use in sputtering deposition apparatus
TW201034242A (en) * 2008-10-20 2010-09-16 Showa Denko Kk Semiconductor light-emitting device and method for producing the same
TW201031032A (en) * 2008-12-08 2010-08-16 Showa Denko Kk Template substrate used for semiconductor light-emitting device, the manufacturing method thereof, manufacturing method of semiconductor light-emitting device and the device thereof
TW201029051A (en) * 2009-01-21 2010-08-01 Siltron Inc Semiconductor device, light emitting device and method for manufacturing the same

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