TWI402491B - - Google Patents
Info
- Publication number
- TWI402491B TWI402491B TW98146067A TW98146067A TWI402491B TW I402491 B TWI402491 B TW I402491B TW 98146067 A TW98146067 A TW 98146067A TW 98146067 A TW98146067 A TW 98146067A TW I402491 B TWI402491 B TW I402491B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98146067A TW201122445A (en) | 2009-12-31 | 2009-12-31 | Temperature detector. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW98146067A TW201122445A (en) | 2009-12-31 | 2009-12-31 | Temperature detector. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201122445A TW201122445A (en) | 2011-07-01 |
| TWI402491B true TWI402491B (en) | 2013-07-21 |
Family
ID=45046159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW98146067A TW201122445A (en) | 2009-12-31 | 2009-12-31 | Temperature detector. |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201122445A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI681174B (en) * | 2018-11-30 | 2020-01-01 | 徐振健 | Multi-point temperature detection device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW387992B (en) * | 1997-09-16 | 2000-04-21 | Applied Materials Inc | Papid thermal processing system for heating a substrate, temperature probe, and mthod for making a temperature probe |
| CN2588379Y (en) * | 2002-11-29 | 2003-11-26 | 林家路 | Electricity test pen with metal prober |
| US20050157775A1 (en) * | 2003-11-17 | 2005-07-21 | Maverick Industries, Inc. | Temperature probe and use thereof |
| US6964517B2 (en) * | 2002-11-22 | 2005-11-15 | Welker Engineering Company | Temperature probe and insertion device |
| TWI261671B (en) * | 2002-03-29 | 2006-09-11 | Axcelis Tech Inc | Contact temperature probe and process |
-
2009
- 2009-12-31 TW TW98146067A patent/TW201122445A/en unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW387992B (en) * | 1997-09-16 | 2000-04-21 | Applied Materials Inc | Papid thermal processing system for heating a substrate, temperature probe, and mthod for making a temperature probe |
| TWI261671B (en) * | 2002-03-29 | 2006-09-11 | Axcelis Tech Inc | Contact temperature probe and process |
| US6964517B2 (en) * | 2002-11-22 | 2005-11-15 | Welker Engineering Company | Temperature probe and insertion device |
| CN2588379Y (en) * | 2002-11-29 | 2003-11-26 | 林家路 | Electricity test pen with metal prober |
| US20050157775A1 (en) * | 2003-11-17 | 2005-07-21 | Maverick Industries, Inc. | Temperature probe and use thereof |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI681174B (en) * | 2018-11-30 | 2020-01-01 | 徐振健 | Multi-point temperature detection device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201122445A (en) | 2011-07-01 |