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TWI479134B - Two - dimensional timing type colorimeter detection method and the colorimeter - Google Patents

Two - dimensional timing type colorimeter detection method and the colorimeter Download PDF

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TWI479134B
TWI479134B TW102115067A TW102115067A TWI479134B TW I479134 B TWI479134 B TW I479134B TW 102115067 A TW102115067 A TW 102115067A TW 102115067 A TW102115067 A TW 102115067A TW I479134 B TWI479134 B TW I479134B
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colorimeter
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TW201441589A (en
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Description

二維式時序型色度計檢測方法及該色度計Two-dimensional time series colorimeter detection method and the colorimeter

本發明是一種二維式時序型色度計檢測方法及該色度計,特別是關於一種能準確量化計算物體表面色彩的色度計。The invention relates to a two-dimensional time-series colorimeter detecting method and the colorimeter, in particular to a colorimeter capable of accurately quantifying the surface color of an object.

用於人眼對於物體顏色的感知,是來自可見光照射至物體表面後,受到物體表面反射的漫射光,刺激活化負責彩色感光的視錐細胞,並將光刺激轉換為電訊號至大腦視區進行判別,從而產生顏色知覺而辨別物體的顏色。可見光的波長範圍雖然因人而異,但一般約可涵蓋400~750nm。The human eye's perception of the color of the object is the diffused light reflected from the surface of the object after the visible light is irradiated onto the surface of the object, stimulating the activation of the cone responsible for color sensitization, and converting the light stimulus into a signal signal to the visual field of the brain. Discriminate, thereby producing color perception and discriminating the color of the object. Although the wavelength range of visible light varies from person to person, it generally covers about 400 to 750 nm.

由於人類感知色彩過程分別與光源、被照物表面、及觀察者色彩認知有關,並非單純決定於被照物,因此在定量化客觀敘述物體所呈現色彩時,即使排除較難控制的觀察者變因,仍然需要考量光源所造成的影響。為排除光源差異的干擾因素,統一對顏色的定義,國際照明委員會(International Commission on Illumination,CIE)定義出數種標準照明體與標準光源,及於1931年制定一色度圖,透過物體的反射光與CIE制定的配色函數,針對不同的波長予以不同的權重考量,最後計算出色度值大小,因此任何顏色皆可以在色度圖上以色度座標被標示出來。Since the process of human perception of color is related to the light source, the surface of the object to be illuminated, and the color perception of the observer, it is not determined solely by the object. Therefore, when quantifying the color of the objective object, even if it is difficult to control the observer change Therefore, it is still necessary to consider the impact of the light source. In order to eliminate the interference factors of light source differences and unify the definition of color, the International Commission on Illumination (CIE) defines several standard illuminants and standard light sources, and in 1931, a chromaticity diagram was developed to reflect light through objects. With the color matching function developed by CIE, different weights are considered for different wavelengths, and finally the degree of brilliance is calculated, so any color can be marked with chromaticity coordinates on the chromaticity diagram.

實務上,顏色測量儀器主要可分為色度計與光譜儀,以CIE標準光源D作為光源,前者是在感光元件前添加符合CIE配色函數的濾光片,當待測物反射光透過配色函數濾光片至感光元件,經過電路的計算可得到對應的色度座標;後者則是利用光色散原理,在色散過的光後方排列多個感光元件,其數量依解析度而不同,然後量測出色光在可見光範圍的光譜分佈,再經由電路套上CIE配色函數算出色度座標。In practice, the color measuring instruments can be mainly divided into a colorimeter and a spectrometer, and the CIE standard light source D is used as a light source. The former is to add a filter conforming to the CIE color matching function in front of the photosensitive element, and the reflected light of the object to be tested is filtered through the color matching function. From the light sheet to the photosensitive element, the corresponding chromaticity coordinates can be obtained through the calculation of the circuit; the latter uses the principle of light dispersion to arrange a plurality of photosensitive elements behind the dispersed light, the number of which varies according to the resolution, and then the measurement is excellent. The spectral distribution of light in the visible range, and then calculate the chromaticity coordinates via the CIE color matching function on the circuit.

其中,市面上色度計的配色函數濾光片在實務上很難鍍製, 以及相較於CIE標準光源D,色度計提供的光源並無法完全符合標準,造成其量測的色度值也存在誤差,色度計仍具改善及進步的空間。Among them, the color matching function filter of the colorimeter on the market is difficult to plate in practice. Compared with the CIE standard light source D, the light source provided by the colorimeter does not fully comply with the standard, resulting in errors in the measured chromaticity values, and the colorimeter still has room for improvement and improvement.

如台灣發明專利第I291549號「色度儀之色溫可調式方法」,提到一種藉由調整色度儀中光源的色溫,以模擬各CIE標準光源,其主要核心方法是先透過公式的運算,計算出光源所需光譜強度加上配色函數、物體反射率以及光功率計的波長頻率響應後,根據計算出的結果,在利用24顆LED任意組合出符合上述計算出的光譜分佈之光源,但在實務上,此種組合光源光譜分布複雜,無法透過簡單的線性疊加達成,例如:D65+X光源中,500nm附近很難完全匹配,這些匹配不好的區域都是量測誤差來源,實務上這並不是理想的解決方法。For example, Taiwan Invention Patent No. I291549 "Color Temperature Adjustable Method of Colorimeter" refers to a method for simulating the CIE standard light source by adjusting the color temperature of the light source in the colorimeter. The main core method is to first calculate through the formula. After calculating the required spectral intensity of the light source, the color matching function, the reflectance of the object, and the wavelength frequency response of the optical power meter, according to the calculated result, the light source that meets the above calculated spectral distribution is arbitrarily combined using 24 LEDs, but In practice, the spectral distribution of such combined light sources is complex and cannot be achieved by simple linear superposition. For example, in D65+X light source, it is difficult to completely match near 500nm. These poorly matched areas are sources of measurement error. This is not the ideal solution.

因此,如何設計出色度測量準確度高,及利用多顆不同中心光譜LED所發光,且不須透過複雜的組合及嚴格的篩選,即可使得光源完全符合CIE標準照明體的定義,更重要的是,在測量大面積物體的表面色彩時,可以有效排除空間誤差,使量測更具一定的準確度,以上各點將是製造色度計的重要課題。Therefore, how to design the accuracy measurement accuracy and use multiple different central spectrum LEDs to illuminate, and without the complicated combination and strict screening, the light source can fully comply with the definition of CIE standard illuminant, more importantly Yes, when measuring the surface color of a large-area object, the spatial error can be effectively eliminated, and the measurement is more accurate. The above points will be an important issue in the manufacture of the colorimeter.

本發明之一目的在提供一種色彩量測準確度高的二維式時序型色度計檢測方法與色度計。An object of the present invention is to provide a two-dimensional time-series colorimeter detection method and a colorimeter with high color measurement accuracy.

本發明之另一目的在提供一種不須透過複雜計算即可利用多顆LED組合成光源的二維式時序型色度計檢測方法與色度計。Another object of the present invention is to provide a two-dimensional time-series colorimeter detection method and a colorimeter that can combine a plurality of LEDs into a light source without complicated calculation.

本發明之又一目的在提供一種符合CIE標準光源規範的二維式時序型色度計檢測方法與色度計。It is still another object of the present invention to provide a two-dimensional time-series colorimeter detection method and colorimeter that conform to the CIE standard light source specification.

本發明之再一目的在提供可量測大面積待測物表面色彩而排除空間誤差的二維式時序型色度計檢測方法與色度計。Still another object of the present invention is to provide a two-dimensional time-series colorimeter detection method and a colorimeter that can measure the surface color of a large-area object to be tested while eliminating spatial errors.

依照本發明所揭露的一種二維式時序型色度計檢測方法,用以分析至少一待測物表面的色彩並轉換為色度,其中該色度計具有一個用以照射上述待測物表面的合成光源、一個取像裝置、一個控制及演算輸出裝置及一個儲存裝置;且其中上述合成光源包括複數個中心波長位於可見光範圍且彼此中心波長相異的LED,而上述待測物表面是被設置在一個預 定待測區域,該待測區域則被區分為複數待測位置,以及該儲存裝置儲存有每一上述待測位置對每一上述LED的反射以及該取像裝置對每一上述中心波長的響應之整體補償資料,該檢測方法包括下列步驟:a)逐一點亮上述合成光源的各LED,使其時序式照射至上述待測物表面;b)由上述取像裝置依照上述待測位置接收上述各LED照射至上述待測物表面的反射光,並輸出一個反射資料;及c)由上述控制及演算輸出裝置對所有上述反射光,依照每一上述的待測位置對每一照射的LED之反射資料及上述整體補償資料進行補償運算,並輸出一個對應的色度資料。A two-dimensional time-series colorimeter detection method for analyzing a color of at least one surface of a test object and converting it into chromaticity, wherein the colorimeter has a surface for illuminating the object to be tested a composite light source, an image capturing device, a control and calculation output device, and a storage device; and wherein the composite light source comprises a plurality of LEDs having central wavelengths in the visible light range and different from each other at a central wavelength, and the surface of the object to be tested is Set in one pre Determining a region to be tested, the region to be tested is divided into a plurality of locations to be tested, and the storage device stores a reflection of each of the LEDs of each of the locations to be tested and a response of the image capturing device to each of the center wavelengths The overall compensation data includes the following steps: a) illuminating each of the LEDs of the synthetic light source one by one to illuminate the surface of the object to be tested in a timed manner; b) receiving the above by the image capturing device according to the position to be tested Each LED illuminates the reflected light on the surface of the object to be tested, and outputs a reflected data; and c) the above-mentioned control and calculation output device pairs all of the reflected light according to each of the above-mentioned measured positions for each illuminated LED The reflection data and the above overall compensation data are subjected to compensation operations, and a corresponding chromaticity data is output.

以及一種二維式時序型色度計,用以分析至少一待測物表面的色彩並轉換為色度,該色度計具有一個供設置上述待測物表面的預定待測區域,且該待測區域包括複數個待測位置,該色度計包括:一個用以照射上述待測物表面的合成光源,包括複數個中心波長位於可見光範圍且彼此中心波長相異的LED;一個指令上述LED時序式逐一照射上述待測區域的控制及演算輸出裝置;一個接收上述待測物表面各上述待測位置所反射上述LED反射光的取像裝置,並輸出至該控制及演算輸出裝置;以及一個儲存裝置,儲存有每一上述待測位置對每一上述LED的反射和該取像裝置對每一上述中心波長的響應之整體補償資料,供該控制及演算輸出裝置依照上述取像裝置輸出的反射資料及上述整體補償資料進行補償運算,並輸出一個對應的色度資料。And a two-dimensional time-series colorimeter for analyzing the color of at least one surface of the object to be tested and converting it into chromaticity, the colorimeter having a predetermined area to be tested for setting the surface of the object to be tested, and the The measurement area includes a plurality of positions to be tested, the colorimeter includes: a composite light source for illuminating the surface of the object to be tested, and includes a plurality of LEDs whose center wavelengths are in the visible light range and different from each other at a center wavelength; and an instruction for the LED timing a control and calculation output device for illuminating the area to be tested one by one; an image capturing device for receiving the reflected light of the LEDs at each of the positions to be tested on the surface of the object to be tested, and outputting to the control and calculation output device; and storing The device stores, for each of the above-mentioned positions to be tested, the overall compensation data of the reflection of each of the LEDs and the response of the image capturing device to each of the central wavelengths, and the reflection of the control and the calculation output device according to the output of the image capturing device The data and the above-mentioned overall compensation data are subjected to compensation operations, and a corresponding chromaticity data is output.

其中補償運算乃本案之關鍵技術,補償內容可分為對位置的 補償,以及對合成光源的補償,對位置的補償是透過在測量待測物之前對色度計進行校正,將一片標準白板設置在待測區域裡,其中待測區域又可細分為多個待測位置,逐一點亮複數個LED,並由取像裝置記錄下每一個待測位置對應每一LED的反射資料,再針對每一LED計算出使每一待測位置均一化的位置補償資料,以解決習知色度計在測量時,光源或待測物的位置,以及待測物表面的面積大小,在取像裝置擷取反射資料時,因距離的不同所產生測量結果的誤差。The compensation operation is the key technology of this case, and the compensation content can be divided into Compensation, and compensation for the composite light source, the position compensation is performed by correcting the colorimeter before measuring the object to be tested, and setting a standard whiteboard in the area to be tested, wherein the area to be tested can be further divided into multiple to-be-tested areas. Measuring position, lighting a plurality of LEDs one by one, and recording the reflection data of each LED corresponding to each position to be tested by the image capturing device, and calculating position compensation data for each LED to be uniformized for each LED. In order to solve the problem of the position of the light source or the object to be tested and the size of the surface of the object to be tested during the measurement, the error of the measurement result is caused by the difference in the distance when the image capturing device takes the reflection data.

如圖1所示,本案首先將標準白板放置於待測區域,並且將標準白板所涵蓋的待測區域劃分成一個例如3X3矩陣,並以例如一CCD元件作為取像裝置,則對矩陣中的每一區塊位置CCD將獲得一個感測量度及色彩數值。此取像結果一方面會隨LED的擺放位置而在空間方面有所差異,例如中間正對光源位置較亮、周圍位置較暗的情形;另方面,也會隨CCD對矩陣每一區塊位置的相對空間差異,使所接收到的反射資料產生影響,若要獲得正確感測資料,對於上述兩者都必須給予對應的補償,才能使得矩陣中所有區塊位置測量結果皆是相同的亮度與色彩。As shown in FIG. 1 , the present invention first places a standard whiteboard in the area to be tested, and divides the area to be tested covered by the standard whiteboard into a matrix of, for example, 3×3, and uses, for example, a CCD component as an image capturing device, and then in the matrix. Each block position CCD will obtain a sense measurement and color value. On the one hand, the result of the image will vary in space with the placement of the LED, for example, where the position of the light source is brighter and the surrounding position is darker; on the other hand, each block of the matrix is also associated with the CCD. The relative spatial difference of the position causes the received reflection data to have an influence. If the correct sensing data is to be obtained, the corresponding compensation must be given for both of the above, so that all the block position measurement results in the matrix are the same brightness. With color.

其次,由於本案合成光源是利用多個中心波長相異的LED所組合而成,在取像裝置擷取反射資料時,也會因取像裝置中的感光元件對於不同的波長會有不同的響應大小,而造成測量的誤差。尤其更進一步,當每一個LED本身發光的亮度及中心波長也會隨著操作溫度及老化等因素而有發光強弱差異、衰減、及波長漂移等現象。因此在實際測量之前,對於每一個LED都必須依據其發光強度與波長進行補償,取得波長補償資料,依照CIE標準光源的規範,作為補償依據,例如透過多個LED可模擬出CIE標準光源D65的發光強度與光譜分布。Secondly, since the composite light source of the present invention is formed by combining a plurality of LEDs having different center wavelengths, when the image capturing device extracts the reflected data, the photosensitive elements in the image capturing device may have different responses to different wavelengths. Size, which causes measurement errors. In particular, the brightness and center wavelength of each LED itself will also have differences in illumination intensity, attenuation, and wavelength drift with operating temperature and aging. Therefore, before the actual measurement, each LED must be compensated according to its luminous intensity and wavelength, and obtain the wavelength compensation data. According to the specifications of the CIE standard light source, as a compensation basis, for example, the CIE standard light source D65 can be simulated through multiple LEDs. Luminous intensity and spectral distribution.

綜合上述,藉由事先的校正取得位置補償資料與波長補償資料,並將兩項補償資料整合成整體補償資料,且將該整體補償資料記錄在儲存裝置中,作為實際測量時,取像裝置擷取到反射資料後,控制及演算輸出裝置進行補償資料的依據,例如,在被劃分為九宮格的待測物表面上,以紅光LED進行照射,當取像裝置擷取到九宮格中心點位置的反射光,控制及演算輸出裝置即可透過整體補償資料,對該中心點的位置、紅光波長 以及CIE配色函數進行補償運算,進而得到一個不會因待測物位置及光源種類而產生誤差的測量結果,使每一次的測量都可以得到正確的色度資料。In summary, the position compensation data and the wavelength compensation data are obtained by prior correction, and the two compensation materials are integrated into the overall compensation data, and the overall compensation data is recorded in the storage device, and the image capturing device is used as the actual measurement. After the reflection data is obtained, the control and calculation output device performs the basis of the compensation data, for example, on the surface of the object to be tested divided into nine squares, and is illuminated by a red LED, and when the image capturing device is taken to the position of the center of the nine squares The reflected light, control and calculation output device can pass the overall compensation data, the position of the center point, the red wavelength And the CIE color matching function performs the compensation operation, and then obtains a measurement result that does not cause an error due to the position of the object to be tested and the type of the light source, so that the correct chromaticity data can be obtained for each measurement.

因此本案適合量測大面積的待測物,同時,不須特別對光源LED進行複雜的組合,即可模擬CIE標準光源,更重要的是,量測結果不因待測物、光源或取像裝置位置有所改變而產生誤差,以上所述即為本發明所著重之要點。Therefore, this case is suitable for measuring a large area of the object to be tested. At the same time, it is not necessary to perform a complicated combination of the light source LEDs to simulate a CIE standard light source. More importantly, the measurement result is not caused by the object to be tested, the light source or the image. The position of the device is changed to cause an error, and the above is the main point of the invention.

1‧‧‧二維式時序型色度計1‧‧‧Two-dimensional time series colorimeter

11‧‧‧合成光源11‧‧‧Synthetic light source

111、1111 、1112 、1113 ‧‧‧LED111, 111 1 , 111 2 , 111 3 ‧‧‧LED

12‧‧‧取像裝置12‧‧‧Image capture device

13‧‧‧控制及演算輸出裝置13‧‧‧Control and calculation output device

14‧‧‧儲存裝置14‧‧‧Storage device

15‧‧‧預定待測區域15‧‧‧Predetermined area to be tested

151‧‧‧待測位置151‧‧‧Location to be tested

152‧‧‧矩陣152‧‧‧Matrix

2‧‧‧標準白板2‧‧‧Standard Whiteboard

3’‧‧‧半球形反射罩3'‧‧‧hemispherical reflector

4’‧‧‧待測物4’‧‧‧Test objects

401-407‧‧‧步驟401-407‧‧‧Steps

501-504‧‧‧步驟501-504‧‧‧Steps

圖1是習知色度計光源照射分布及取像亮度不均示意圖。FIG. 1 is a schematic diagram showing the illumination distribution and the unevenness of the image brightness of a conventional colorimeter.

圖2是本發明第一較佳實施例示意圖。Figure 2 is a schematic view of a first preferred embodiment of the present invention.

圖3為第一較佳實施例結構方塊圖。Figure 3 is a block diagram showing the structure of the first preferred embodiment.

圖4是本發明校正補償流程示意圖。4 is a schematic diagram of a calibration compensation process of the present invention.

圖5是第一較佳實施例量測流程示意圖。Figure 5 is a schematic diagram of the measurement process of the first preferred embodiment.

圖6是本發明第二實施例示意圖。Figure 6 is a schematic view of a second embodiment of the present invention.

有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現;相同或相似的元件,將以相似的標號標示。The above and other technical features, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments.

如圖2與圖3所示,本發明第一較佳實施例,二維式時序型色度計1包括:一個合成光源11、一個控制及演算輸出裝置13、一個取像裝置12及一個儲存裝置14,其中合成光源11是由例如20個中心波長位於可見光範圍且彼此中心波長相異的LED111所組成,控制及演算輸出裝置13可指令上述的LED111時序式逐一點亮,該取像裝置12可包括一電荷耦合元件(CCD),以及一個供設置待測物的預定待測區域15,且該預定待測區域15包括複數個待測位置151。如前所述,藉由上述20個中心波長彼此相異的LED111,並且分別控制其輸入電能,可以輕易組合出模擬任何特定波長分布的光源,例如CIE的標準光源D65。As shown in FIG. 2 and FIG. 3, in a first preferred embodiment of the present invention, a two-dimensional time-series colorimeter 1 includes: a composite light source 11, a control and calculation output device 13, an image capturing device 12, and a storage device. The device 14 is composed of, for example, 20 LEDs 111 whose central wavelengths are in the visible light range and whose center wavelengths are different from each other. The control and calculation output device 13 can instruct the above-mentioned LEDs 111 to be illuminated one by one. The imaging device 12 is illuminated. A charge coupled element (CCD) may be included, and a predetermined area to be tested 15 for setting the object to be tested, and the predetermined area to be tested 15 includes a plurality of positions 151 to be tested. As described above, the light source simulating any particular wavelength distribution, such as the standard light source D65 of the CIE, can be easily combined by the above-mentioned 20 LEDs 111 whose center wavelengths are different from each other and their input electric energy are respectively controlled.

在實際測量之前,本發明必須有一個前置的校正補償步驟,請一併參考圖4流程圖,在步驟401將一片標準白板2設置在預定待測區域15,並由控制及演算輸出裝置13指令點亮合成光源11中的一個LED111 照射該標準白板2,步驟402取像裝置12擷取每一待測位置151對應該LED111的反射資料,並輸出反射資料至控制及演算輸出裝置13,其中該反射資料包括,反射光強度及波長,步驟403由控制及演算輸出裝置13判斷每一個LED111是否皆已被單獨點亮過,如果否,則回步驟401繼續點亮其他LED111,直到每一個LED111皆被點亮且取像裝置12皆已完成取像後,在步驟404控制及演算輸出裝置13針對每一LED111計算出一個使每一待測位置151反射光均一化的位置補償資料,及在步驟405控制及演算輸出裝置13依照每一LED111的發光強度、及取像裝置12對每一LED111中心波長的響應,計算出一個使每一LED111發光強度模擬一個預定發光強度成分的波長補償資料,本實施例中,以CIE標準光源D65作為預定模擬的光源,隨後步驟406控制及演算輸出裝置13整合計算上述位置補償資料及波長補償資料,並獲得每一待測位置151對應每一LED111反射資料的整體補償資料,最後在步驟407將該整體補償資料傳送至儲存裝置14儲存。Before the actual measurement, the present invention must have a pre-correction compensation step. Please refer to the flowchart of FIG. 4 together. In step 401, a standard whiteboard 2 is placed in the predetermined area to be tested 15, and the control and calculation output device 13 is provided. The command illuminates one of the LEDs 111 in the composite light source 11 Illuminating the standard whiteboard 2, the image capturing device 12 captures the reflected data corresponding to the LED 111 at each position 151 to be measured, and outputs the reflected data to the control and calculation output device 13, wherein the reflected data includes the reflected light intensity and the wavelength. Step 403 determines whether each of the LEDs 111 has been individually illuminated by the control and calculation output device 13. If not, then returning to step 401 to continue to illuminate the other LEDs 111 until each of the LEDs 111 is illuminated and the imaging device 12 is After the image capture has been completed, the control and calculation output device 13 calculates a position compensation data for each LED 111 to normalize the reflected light of each of the positions to be measured 151, and controls and calculates the output device 13 in accordance with step 405. The illuminating intensity of an LED 111 and the response of the image capturing device 12 to the center wavelength of each LED 111 are calculated as a wavelength compensation data for simulating the luminous intensity of each LED 111 by a predetermined luminous intensity component. In this embodiment, the CIE standard light source D65 is used. As a light source of the predetermined simulation, the following step 406 controls and calculates the output device 13 to integrate the position compensation data and the wavelength compensation data, and 151 corresponding to each position to be tested to obtain the entire information on each compensation LED111 reflection data, and finally transmitted to the storage device 14 stores at step 407 the overall compensation data.

本例中,將20個LED111平行排列成平面直照式光源,且LED111彼此的發光強度大致相等,預定待測區域15分為複數個待測位置151,在本例中是將其區隔為9個待測位置151。In this example, 20 LEDs 111 are arranged in parallel as a planar direct-illuminated light source, and the luminous intensities of the LEDs 111 are substantially equal to each other, and the predetermined area to be tested 15 is divided into a plurality of positions to be tested 151, which in this example is divided into 9 positions to be tested 151.

實際量測時,將待測物放置預定待測區域15的矩陣152上,其步驟流程請參考圖5,步驟501由控制及演算輸出裝置13指令點亮平面直照式光源的一個LED111照射待測物,步驟502由CCD依照3X3矩陣中每一待測位置151接收該LED照射至待測物表面的反射光,並輸出一個對應的反射資料至控制及演算輸出裝置13,步驟503由控制及演算輸出裝置13判斷每一個LED111是否皆已被單獨點亮過,如果否,則回步驟501繼續點亮其他LED111,直到每一個LED111皆被點亮且取像裝置12皆已完成取像後,在步驟504由控制及演算輸出裝置13提取儲存裝置14中的整體補償資料,並對所有LED111反射光的反射資料與整體補償資料進行補償運算,其中前述補償運算更包括一個結合CIE配色函數的運算,並輸出一個該待測物表面的色度資料。During actual measurement, the object to be tested is placed on the matrix 152 of the predetermined area to be tested 15, and the flow of the steps is referred to FIG. 5. Step 501 is performed by the control and calculation output device 13 to illuminate an LED 111 of the planar direct-illuminated light source. The measuring object, step 502 receives the reflected light of the LED to the surface of the object to be tested according to each position 151 in the 3X3 matrix, and outputs a corresponding reflected data to the control and calculation output device 13, step 503 is controlled and The calculation output device 13 determines whether each of the LEDs 111 has been individually illuminated. If not, the step 501 continues to illuminate the other LEDs 111 until each of the LEDs 111 is illuminated and the image capture device 12 has completed the image capture. At step 504, the overall compensation data in the storage device 14 is extracted by the control and calculation output device 13, and the reflection data of the reflected light of all the LEDs 111 and the overall compensation data are compensated, wherein the compensation operation further includes an operation combined with the CIE color matching function. And outputting a chromaticity data of the surface of the object to be tested.

由此,設置色度計時根本不需要考慮各LED本身發光強度,只要善用後端的補償運算,即可搭配出類似標準光源的照射效果,大 幅降低篩選光源的門檻;另方面,由於各LED配置及取像裝置的設置位置所造成的空間差異,也可以輕易藉由後端的補償運算消除,使得整體的色度檢測準確度與精密度都可以大幅提升。Therefore, setting the colorimetric timing does not need to consider the luminous intensity of each LED itself. As long as the back-end compensation operation is used, the illumination effect similar to the standard light source can be matched. The width reduces the threshold of the screening source; on the other hand, due to the spatial difference caused by the arrangement of the LEDs and the setting position of the image capturing device, it can also be easily eliminated by the compensation operation of the back end, so that the overall color detection accuracy and precision are both Can be greatly improved.

前一實施例的平面直照式光源是目前最常見的光源型式,但可能導致光線分布不均勻的情形,即使可以藉由上述補償運算彌補,但仍有可以更進一步改善得空間,因此本發明的第二實施例,如圖6所示,合成光源包括一個半球形反射罩3’,其反射面朝向預定待測區域,及20個不同中心波長的LED1111 、1112 、1113 是平行排列且發光方向朝向半球形反射罩3’設置,取像裝置則設置在半球形反射罩3’的頂部開口,待測物4’設置在預定待測區域,藉由半球形反射罩3’內壁面高反射、高擴散的材質使各不同中心波長的LED1111 、1112 、1113 照射光達到更好的混光效果,以提供更均勻化的光線照射。The planar direct-illuminated light source of the previous embodiment is the most common light source type at present, but may cause uneven distribution of light, and even if it can be compensated by the above compensation operation, there is still room for further improvement, and thus the present invention In a second embodiment, as shown in FIG. 6, the composite light source includes a hemispherical reflector 3' having a reflecting surface facing a predetermined area to be tested, and 20 different center wavelength LEDs 111 1 , 111 2 , and 111 3 are arranged in parallel. And the light emitting direction is disposed toward the hemispherical reflector 3', the image capturing device is disposed at the top opening of the hemispherical reflector 3', and the object to be tested 4' is disposed in the predetermined area to be tested, by the inner wall of the hemispherical reflector 3' The highly reflective, highly diffused material allows LEDs 111 1 , 111 2 , and 111 3 at different center wavelengths to achieve better light mixing for more uniform light illumination.

惟以上所述者,僅為本發明之較佳實施例而已,不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及發明說明書內容所作之簡單的等效變化與修飾,皆應仍屬本發明專利涵蓋之範圍內。The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited thereto, and any simple equivalent changes and modifications made in accordance with the scope of the present invention and the contents of the description of the invention should be It is still within the scope of the invention patent.

1‧‧‧二維式時序型色度計1‧‧‧Two-dimensional time series colorimeter

11‧‧‧合成光源11‧‧‧Synthetic light source

12‧‧‧取像裝置12‧‧‧Image capture device

13‧‧‧控制及演算輸出裝置13‧‧‧Control and calculation output device

14‧‧‧儲存裝置14‧‧‧Storage device

Claims (8)

一種二維式時序型色度計檢測方法,用以分析至少一待測物表面的色彩並轉換為色度,其中該色度計具有一個用以照射上述待測物表面的合成光源、一個取像裝置、一個控制及演算輸出裝置及一個儲存裝置;且其中上述合成光源包括複數個中心波長位於可見光範圍且彼此中心波長相異的LED,而上述待測物表面是被設置在一個預定待測區域,該預定待測區域則被區分為複數待測位置,以及該儲存裝置儲存有每一上述待測位置對每一上述LED的反射以及該取像裝置對每一上述中心波長的響應之整體補償資料,該檢測方法包括下列步驟:a)逐一點亮上述合成光源的各LED,使其時序式照射至上述待測物表面;b)由上述取像裝置依照上述待測位置接收上述各LED照射至上述待測物表面的反射光,並輸出一個反射資料;及c)由上述控制及演算輸出裝置對所有上述反射光,依照每一上述的待測位置對每一照射的LED之反射資料及上述整體補償資料進行補償運算,並輸出一個對應的色度資料。 A two-dimensional time-series colorimeter detection method for analyzing a color of at least one surface of a test object and converting it into chromaticity, wherein the colorimeter has a synthetic light source for illuminating the surface of the object to be tested, and a An image device, a control and calculation output device, and a storage device; and wherein the composite light source comprises a plurality of LEDs having central wavelengths in the visible light range and different from each other at a central wavelength, and the surface of the object to be tested is set to be predetermined to be tested a region, the predetermined area to be tested is divided into a plurality of positions to be tested, and the storage device stores a reflection of each of the LEDs and a response of the image capturing device to each of the center wavelengths Compensating data, the detecting method comprising the steps of: a) illuminating each of the LEDs of the synthetic light source one by one to illuminate the surface of the object to be tested in a timed manner; b) receiving, by the above-mentioned image capturing device, the LEDs according to the position to be tested Irradiating the reflected light to the surface of the object to be tested, and outputting a reflected data; and c) controlling all of the above reflections by the above control and calculation output device , Compensation calculation in accordance with each of the above-described position to be measured for each of the LED illumination reflection data and said overall compensation data, and outputs a corresponding chrominance data. 如申請專利範圍第1項所述的檢測方法,更包括在步驟a)前的下列預處理步驟:d)將一片標準白板設置在上述預定待測區域,並逐一點亮上述每一LED照射該標準白板;e)記錄每一上述待測位置對每一上述LED的反射資料;f)針對每一上述LED,計算出一個使每一上述待測位置反射光均一化的位置補償資料; g)依照每一上述LED的發光強度、及該取像裝置對每一上述LED中心波長的響應,計算出一個使上述LED發光強度模擬一個預定發光強度成分的波長補償資料;及h)整合計算上述位置補償資料及波長補償資料,獲得每一上述待測位置對每一上述LED反射資料的該整體補償資料。The detection method according to claim 1, further comprising the following pre-processing steps before step a): d) setting a piece of standard whiteboard in the predetermined area to be tested, and lighting each of the LEDs one by one a standard whiteboard; e) recording the reflection data of each of the LEDs at each of the above-mentioned locations to be tested; f) calculating, for each of the LEDs, a position compensation data for homogenizing the reflected light of each of the locations to be tested; g) calculating a wavelength compensation data for simulating a predetermined luminous intensity component of the LED luminous intensity according to the luminous intensity of each of the LEDs and the response of the imaging device to each of the LED center wavelengths; and h) integrating calculation The position compensation data and the wavelength compensation data are obtained, and the overall compensation data for each of the LED reflective materials is obtained for each of the positions to be tested. 如申請專利範圍第2項所述的檢測方法,其中計算上述波長補償資料的預定發光強度成分是符合CIE標準光源D65的成分比例。The detecting method according to claim 2, wherein the predetermined luminous intensity component of the wavelength compensation data is calculated to be a component ratio of the CIE standard light source D65. 一種二維式時序型色度計,用以分析至少一待測物表面的色彩並轉換為色度,該色度計具有一個供設置上述待測物表面的預定待測區域,且該預定待測區域包括複數個待測位置,該色度計包括:一個用以照射上述待測物表面的合成光源,包括複數個中心波長位於可見光範圍且彼此中心波長相異的LED;一個指令上述LED時序式逐一照射上述預定待測區域的控制及演算輸出裝置;一個接收上述待測物表面各上述待測位置所反射上述LED反射光的取像裝置,並輸出至該控制及演算輸出裝置;以及一個儲存裝置,儲存有每一上述待測位置對每一上述LED的反射和該取像裝置對每一上述中心波長的響應之整體補償資料,供該控制及演算輸出裝置依照上述取像裝置輸出的反射資料及上述整體補償資料進行補償運算,並輸出一個對應的色度資料。A two-dimensional time-series colorimeter for analyzing the color of at least one surface of the object to be tested and converting it into chromaticity, the colorimeter having a predetermined area to be tested for setting the surface of the object to be tested, and the predetermined The measurement area includes a plurality of positions to be tested, the colorimeter includes: a composite light source for illuminating the surface of the object to be tested, and includes a plurality of LEDs whose center wavelengths are in the visible light range and different from each other at a center wavelength; and an instruction for the LED timing a control and calculation output device for illuminating the predetermined area to be tested one by one; an image capturing device for receiving the reflected light of the LEDs at each of the positions to be tested on the surface of the object to be tested, and outputting to the control and calculation output device; The storage device stores, for each of the above-mentioned positions to be tested, the overall compensation data of the reflection of each of the LEDs and the response of the image capturing device to each of the central wavelengths, and the output of the control and calculation output device according to the image capturing device The reflection data and the above overall compensation data are subjected to compensation operations, and a corresponding chromaticity data is output. 如申請專利範圍第4項所述的色度計,其中上述合成光源是一個平行排列上述各LED的平面直照式光源。The colorimeter according to claim 4, wherein the synthetic light source is a planar direct-illuminated light source in which the LEDs are arranged in parallel. 如申請專利範圍第4項所述的色度計,其中上述合成光源包括一個反射面朝向上述預定待測區域的半球形反射罩,以及上述各LED是平行排列且發光方向朝向上述半球形反射罩設置。The colorimeter according to claim 4, wherein the synthetic light source comprises a hemispherical reflector having a reflecting surface facing the predetermined area to be tested, and the LEDs are arranged in parallel and the light emitting direction is toward the hemispherical reflector. Settings. 如申請專利範圍第4、5或6項所述的色度計,其中上述合成光源各LED彼此發光強度相等。The colorimeter according to claim 4, 5 or 6, wherein each of the LEDs of the synthetic light source has the same luminous intensity. 如申請專利範圍第4、5或6項所述的色度計,其中上述取像裝置包括一組電荷耦合元件(Charge-coupled Device,CCD)。A colorimeter as described in claim 4, 5 or 6, wherein said image capturing means comprises a set of charge-coupled devices (CCDs).
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