TWI461856B - With a precise alignment of the tilt exposure mechanism - Google Patents
With a precise alignment of the tilt exposure mechanism Download PDFInfo
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- TWI461856B TWI461856B TW097136591A TW97136591A TWI461856B TW I461856 B TWI461856 B TW I461856B TW 097136591 A TW097136591 A TW 097136591A TW 97136591 A TW97136591 A TW 97136591A TW I461856 B TWI461856 B TW I461856B
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Description
本發明係有關於一種傾斜曝光機構,尤指一種具精密對準之傾斜曝光機構。The present invention relates to a tilt exposure mechanism, and more particularly to a tilt exposure mechanism with precise alignment.
在微系統製造技術之曝光過程中,微結構的角度深受材料或介質折射率的不同而有限制,而且角度的控制易受製程參數影響且不易控制其精準度,並且無法同時完成垂直和傾斜兩種曝光方式。In the exposure process of microsystem manufacturing technology, the angle of the microstructure is limited by the refractive index of the material or medium, and the control of the angle is susceptible to the process parameters and it is difficult to control its accuracy, and vertical and tilt cannot be completed at the same time. Two exposure methods.
由於傾斜曝光技術已證實可開發出許多微元件,如製作45度光學讀寫頭所需微鏡面、稜鏡及光波導結構,以應用於光電技術及生物晶片中。惟目前習知之傾斜曝光機構並無法同時完成精密對準及傾斜曝光。Since tilt exposure technology has been demonstrated, many micro-elements can be developed, such as micro-mirrors, germanium and optical waveguide structures required to fabricate 45-degree optical read/write heads for use in optoelectronic technology and bio-wafers. However, the conventional tilting exposure mechanism cannot simultaneously perform precise alignment and tilt exposure.
習知之專利前案中,例如核准之中華民國發明第091105554專利案,即揭示一種「利用灰階曝光法製作傾斜散射式反射板之方法」,其特徵在於使用一光罩,上述光罩的圖案係衍生自灰階透光產生原則(generation scheme)中,將上述光罩圖案垂直劃分成複數個圖案區域,使得每一圖案區域各自具有複數個微透光塊(micro transparent block)及微遮光塊(micro dark block),並使得上述複數個微透光塊在每一圖案區域中所佔的總面積的變化具有一連續性變化特徵以產生各圖案區域透光率變化曲線(transmittance profile),藉以調控上述透光率變化曲線,以在上述傾斜散射式反射板的光阻層中產生所需的結構。In the prior patent application, for example, the Patent No. 091105554 of the Republic of China is approved, which discloses a method for producing a tilted scattering reflector by a gray scale exposure method, characterized in that a mask is used, and the pattern of the mask is used. Derived from the gray scale generation scheme, the reticle pattern is vertically divided into a plurality of pattern regions, such that each pattern region has a plurality of micro transparent blocks and micro opaque blocks. And (micro dark block), and causing the change in the total area occupied by the plurality of micro-transparent blocks in each pattern region to have a continuity change characteristic to generate a transmittance profile of each pattern region, thereby The light transmittance change curve is adjusted to produce a desired structure in the photoresist layer of the above-described oblique scattering type reflector.
又例如核准之中華民國發明第087120965專利案,即揭示一種「利用可抵消傾斜變形的訊號之印刷用刷版曝光裝置」,係針對以複數個像素的畫像帶寬度將畫像資訊呈帶 狀地螺旋記錄到被倦裝在圓筒上之印刷用刷版的表面之印刷用刷版曝光裝置,其特徵為:由呈正圓筒狀地被捲裝在圓筒上之印刷用刷版、及利用光束將畫像資訊呈帶狀地記錄到此刷版之曝光器、及在圓筒旋轉一圈之期間,將前述曝光器相對於圓筒朝向筒軸方向移動1個畫像帶寬度之移動機構、及以開始寫入畫像帶的時點為始點,產生與圓筒的旋轉周期相同周期的鋸齒波狀的可抵消傾斜變形的訊號之電路等所形成;將這種可抵消傾斜變形的訊號施加到前述曝光器;而在圓筒轉動一圈之期間,將光束依序地朝與前述移動機構的移動方向相反的方向偏向,直到光束偏移達到1個畫像帶寬度為止,而對於刷版進行沒有變形的記錄。For example, the Patent No. 087120965 patent of the Republic of China is disclosed, which discloses a "printing plate exposure device using a signal capable of canceling the oblique deformation", which is for carrying a portrait information with a width of a plurality of pixels. A printing plate exposure apparatus which is spirally recorded on the surface of a printing brush plate which is worn on a cylinder, and is characterized in that the printing plate is wound on a cylinder in a substantially cylindrical shape, And a moving mechanism for recording the image information in the strip shape by the light beam and moving the exposure device to the cylinder axis direction by one image band width while the cylinder is rotated once; And a circuit that starts to write the image tape as a starting point, and generates a sawtooth wave-like signal that cancels the oblique deformation in the same cycle as the rotation cycle of the cylinder; and applies such a signal that cancels the oblique deformation. To the aforementioned exposer; while the cylinder rotates one revolution, the light beam is sequentially deflected in a direction opposite to the moving direction of the moving mechanism until the beam shift reaches a width of one portrait band, and for the brush plate No distortion records.
然上述專利之結構相對複雜且無法同時完成垂直和傾斜兩種曝光方式,誠屬美中不足之處。However, the structure of the above patent is relatively complicated and it is impossible to complete both vertical and oblique exposure modes, which is a drawback.
針對上述習知曝光裝置之缺點,本發明提供一種具精密對準之傾斜曝光機構,以改善上述之缺點。In view of the above disadvantages of the conventional exposure apparatus, the present invention provides a tilting exposure mechanism with precise alignment to improve the above disadvantages.
本發明之一目的係提供一種具精密對準之傾斜曝光機構,其具有垂直和傾斜兩種曝光方式,和可置入補償折射率匹配材料,改善介質折射率的不同對曝光角度準確性的影響,並且設有數位電腦型計數器來調控曝光角度,讓微結構角度更為精確,更利於微製程技術。It is an object of the present invention to provide a tilting exposure mechanism with precise alignment, which has both vertical and oblique exposure modes, and can be incorporated with a compensation index matching material to improve the influence of the refractive index of the medium on the accuracy of the exposure angle. And there are digital computer-type counters to adjust the exposure angle, so that the microstructure angle is more accurate, which is more conducive to micro-process technology.
本發明之另一目的係提供一種具精密對準之傾斜曝光機構,其可省卻許多光學微元件需採用精密加工、研磨或射出成型之繁雜及昂貴方式製作,對於積體化技術之發展而言亦可省卻人工組裝之困擾,使微型化暨積體化製程整合之技術跨出一大步。Another object of the present invention is to provide a tilting exposure mechanism with precise alignment, which can eliminate the need for many optical micro-components to be fabricated in a complicated and expensive manner by precision machining, grinding or injection molding, for the development of integrated technology. It can also eliminate the trouble of manual assembly, making the technology of miniaturization and integrated process integration a big step.
為達上述之目的,本發明之一種具精密對準之傾斜曝光機構,其包括:一槽體,用以承載下列元件;一光罩置具,係置於該槽體中,其上具有至少一光罩夾具及至少一光罩與晶片夾具,以供固持一光罩及一晶片;以及一傾斜角度旋轉載台,係置於該槽體中且可與該光罩置具結合,其可供調整該光罩置具之傾斜角度。In order to achieve the above object, a tilting exposure mechanism with precise alignment according to the present invention includes: a slot body for carrying the following components; and a reticle mounting device disposed in the slot body having at least a reticle holder and at least one reticle and wafer holder for holding a reticle and a wafer; and an inclined angle rotating stage, which is placed in the slot body and can be combined with the reticle mount For adjusting the tilt angle of the reticle.
為使 貴審查委員能進一步瞭解本發明之結構、特徵及其目的,茲附以圖式及較佳具體實施例之詳細說明如后。The detailed description of the drawings and the preferred embodiments are set forth in the accompanying drawings.
請一併參照圖1及圖3c,其中圖1繪示本案之具精密對準之傾斜曝光機構之分解示意圖;圖2繪示本案之具精密對準之傾斜曝光機構之組合示意圖;圖3a繪示本案之光罩置具之上側示意圖;圖3b繪示本案之光罩置具之下側示意圖;圖3c繪示本案之光罩置具之剖面示意圖。Please refer to FIG. 1 and FIG. 3c together, wherein FIG. 1 is an exploded perspective view of the tilting exposure mechanism with precise alignment in the present case; FIG. 2 is a schematic view showing the combination of the tilting exposure mechanism with precise alignment in the present case; The upper side view of the reticle of the present invention is shown; FIG. 3b is a schematic view of the lower side of the reticle of the present invention; and FIG. 3c is a schematic cross-sectional view of the reticle of the present invention.
如圖所示,本案之具精密對準之傾斜曝光機構,其包括:一槽體10;一光罩置具20;以及一傾斜角度旋轉載台30所組合而成者。As shown in the figure, the present invention has a precisely aligned tilt exposure mechanism comprising: a trough body 10; a reticle mount 20; and a combination of tilt angle rotating stages 30.
其中,該槽體10用以承載該光罩置具20及傾斜角度旋轉載台30等元件,該槽體10係呈一中空長方體,且可以金屬材質所製成。The tank body 10 is configured to carry the reticle mount 20 and the tilt angle rotating stage 30 and the like. The tank body 10 is a hollow rectangular parallelepiped and can be made of a metal material.
該光罩置具20係置於該槽體10中,其上具有至少一光罩夾具21及至少一光罩與晶片夾具22,以供固持一光罩及一晶片(兩者皆圖未示)。其中,該光罩置具20係呈一圓盤狀,其上表面進一步具有至少一提把23以及複數個旋鈕24(如圖3c所示),其中該提把23可方便該供光罩置具20之安裝,該旋鈕24可等距配置於該光罩置具20上,且每一旋鈕24下方具有一彈簧25,該旋鈕24可供調整該彈 簧25之K值。The reticle 20 is disposed in the cavity 10, and has at least one reticle clamp 21 and at least one reticle and wafer holder 22 for holding a reticle and a wafer (both not shown) ). The reticle 20 has a disk shape, and the upper surface further has at least one handle 23 and a plurality of knobs 24 (as shown in FIG. 3c), wherein the handle 23 can facilitate the light supply cover. With the installation of 20, the knob 24 can be equidistantly disposed on the reticle 20, and each knob 24 has a spring 25 underneath, and the knob 24 can adjust the bullet The value of the spring 25 is K.
如圖3b及3c所示,該光罩夾具21之數量例如但不限於為四個,且等距配置於該光罩置具20之下表面上,在本實施例中係以四個光罩夾具21為例加以說明,但並不以此為限。該光罩與晶片夾具22概呈L形,其數量為四個,且等距配置於該光罩置具20之下表面上,且每一光罩與晶片夾具22係位於每一光罩夾具21之一側,在本實施例中係以四個光罩與晶片夾具22為例加以說明,但並不以此為限。As shown in FIGS. 3b and 3c, the number of the reticle clamps 21 is, for example but not limited to, four, and is equidistantly disposed on the lower surface of the reticle mount 20, in the embodiment, four reticle The jig 21 is described as an example, but is not limited thereto. The reticle and the wafer holder 22 are substantially L-shaped, and the number is four, and is equidistantly disposed on the lower surface of the reticle 20, and each reticle and wafer holder 22 is located in each reticle holder. In one embodiment, the four masks and the wafer holder 22 are described as an example, but are not limited thereto.
該傾斜角度旋轉載台30係置於該槽體10中且可與該光罩置具20結合,可供調整該光罩置具20之傾斜角度。The tilt angle rotating stage 30 is placed in the slot body 10 and can be coupled with the reticle mount 20 for adjusting the tilt angle of the reticle mount 20.
於運作時,可先將光罩藉由四個光罩夾具21作固定,再利用四個光罩與晶片夾具22將晶片固定在光罩之下層,完成固定後,一併將光罩置具20放入該槽體10中固定,最後再以傾斜角度旋轉載台30進行調控曝光角度,如此即可讓微結構角度更為精確,更利於微製程技術。In operation, the reticle can be fixed by four reticle clamps 21, and then the reticle and the wafer holder 22 are used to fix the wafer under the reticle. After the fixing is completed, the reticle is placed. 20 is fixed in the trough body 10, and finally the stage 30 is rotated at an oblique angle to adjust the exposure angle, so that the microstructure angle is more accurate and the micro-process technology is more favorable.
請參照圖4,其繪示本案之傾斜角度旋轉載台之分解示意圖。如圖所示,本案之傾斜角度旋轉載台30進一步具有:一承載座31;一主體32;以及一連動體33。Please refer to FIG. 4 , which is a schematic exploded view of the tilting angle rotating stage of the present invention. As shown in the figure, the tilting angle rotating stage 30 of the present invention further has: a carrier 31; a main body 32; and a linking body 33.
其中,該承載座31係置於該槽體10中,且具有一圓孔311以容置該主體32,且該承載座31具有一結合孔312。The carrier 31 is disposed in the slot 10 and has a circular hole 311 for receiving the main body 32. The carrier 31 has a coupling hole 312.
該主體32,其具有一旋轉盤321、一齒輪322及一傳動桿323,其中,該齒輪322位於該旋轉盤321上方且連接至該旋轉盤321,可接受該旋轉盤321之傳動而驅動該傳動桿323,且該傳動桿323可穿過該圓孔311,此外,該旋轉盤321上進一步具有一把手324供使用者操作。The main body 32 has a rotating disc 321 , a gear 322 and a transmission rod 323 . The gear 322 is located above the rotating disc 321 and is connected to the rotating disc 321 . The driving of the rotating disc 321 can be driven to drive the main body 32 . The transmission rod 323 and the transmission rod 323 can pass through the circular hole 311. Further, the rotating disc 321 further has a handle 324 for the user to operate.
該連動體33係置於該承載座31之另一側,其亦具有結合孔331供該傳動桿323穿置及固持。俾操作者可藉由握持該把手324而轉動該旋轉盤321,該旋轉盤321轉動時將帶動該齒輪322及該傳動桿323,藉由該傳動桿323以使承載座31傾斜至所要之角度,藉以達到操作者所要之角度。The linkage 33 is disposed on the other side of the carrier 31. The coupling body 33 also has a coupling hole 331 for the transmission rod 323 to be placed and held. The operator can rotate the rotary disk 321 by holding the handle 324. When the rotary disk 321 rotates, the gear 322 and the transmission rod 323 will be driven, and the transmission rod 323 is used to tilt the carrier 31 to the desired position. Angle, in order to achieve the desired angle of the operator.
請參照圖5,其繪示本案之具精密對準之傾斜曝光機構進一步具有一角度及水平校正顯示裝置之示意圖。如圖所示,本案之具精密對準之傾斜曝光機構進一步具有:一角度及水平校正顯示裝置40。Please refer to FIG. 5 , which is a schematic diagram of the tilting exposure mechanism with precise alignment in this case further having an angle and horizontal correction display device. As shown, the tilting exposure mechanism of the present invention with precise alignment further has an angle and level correction display device 40.
其中,該角度及水平校正顯示裝置40係置於該槽體10之一側壁上,例如但不限於左側壁上,用以顯示該傾斜角度旋轉載台30之傾斜角度,並作為該傾斜角度旋轉載台30水平校正顯示用,其中該角度顯示裝置40例如但不限於為發光二極體(LED)顯示裝置或液晶顯示裝置(LCD)。The angle and level correction display device 40 is disposed on one side wall of the slot body 10, such as but not limited to the left side wall, for displaying the tilt angle of the tilting stage 30, and as the tilt angle The transfer stage 30 is used for horizontal correction display, wherein the angle display device 40 is, for example but not limited to, a light emitting diode (LED) display device or a liquid crystal display device (LCD).
此外,本發明之具精密對準之傾斜曝光機構進一步具有一計數器50,例如但不限於為一數位電腦型計數器,其係置於該槽體10之一側壁上,例如但不限於左側壁上且耦接至該傾斜角度旋轉載台30,用以精密調控該傾斜角度旋轉載台之旋轉角度。In addition, the precise alignment tilt exposure mechanism of the present invention further has a counter 50 such as, but not limited to, a digital computer type counter that is placed on one of the side walls of the housing 10, such as but not limited to the left side wall. And coupled to the tilt angle rotation stage 30, for precisely adjusting the rotation angle of the tilt angle rotation stage.
因此,由上述之結果可得知,本發明之具精密對準之傾斜曝光機構具有垂直和傾斜兩種曝光方式,和可置入補償折射率匹配材料,改善介質折射率的不同對曝光角度準確性的影響,並且設有數位電腦型計數器來調控曝光角度,讓微結構角度更為精確,更利於微製程技術;此外,其可省卻許多光學微元件需採用精密加工、研磨或射出成型之繁雜及昂貴方式製作,對於積體化技術之發展而言亦 可省卻人工組裝之困擾,使微型化暨積體化製程整合之技術跨出一大步等優點,因此,確較習知之傾斜曝光機構具進步性。Therefore, as can be seen from the above results, the tilting exposure mechanism with precise alignment of the present invention has two vertical and oblique exposure modes, and can be placed with a compensation index matching material to improve the refractive index of the medium to accurately determine the exposure angle. Sexual effects, and a digital computer-type counter to adjust the exposure angle, making the microstructure angle more accurate, more conducive to micro-process technology; in addition, it can eliminate the need for many optical micro-components to use precision machining, grinding or injection molding And expensive production, for the development of integrated technology It can save the trouble of manual assembly, and make the technology of miniaturization and integrated process integration a big step. Therefore, it is indeed more advanced than the conventional tilt exposure mechanism.
本案所揭示者,乃較佳實施例,舉凡局部之變更或修飾而源於本案之技術思想而為熟習該項技藝之人所易於推知者,俱不脫本案之專利權範疇。The disclosure of the present invention is a preferred embodiment. Any change or modification of the present invention originating from the technical idea of the present invention and being easily inferred by those skilled in the art will not deviate from the scope of patent rights of the present invention.
綜上所陳,本案無論就目的、手段與功效,在在顯示其迴異於習知之技術特徵,且其首先發明合於實用,亦在在符合發明之專利要件,懇請 貴審查委員明察,並祈早日賜予專利,俾嘉惠社會,實感德便。In summary, this case, regardless of its purpose, means and efficacy, is showing its technical characteristics that are different from the conventional ones, and its first invention is practical and practical, and it is also in compliance with the patent requirements of the invention. Pray for the patents at an early date.
槽體‧‧‧10Slot ‧‧10
光罩置具‧‧‧20Photomask ‧ ‧ ‧
光罩夾具‧‧‧21Photomask fixture ‧‧21
光罩與晶片夾具‧‧‧22Mask and wafer fixture ‧‧22
提把‧‧‧23‧‧23
旋鈕‧‧‧24Knob ‧‧‧24
彈簧‧‧‧25Spring ‧‧25
傾斜角度旋轉載台‧‧‧30Rotating stage with tilt angle ‧ ‧ 30
承載座‧‧‧31Carrier ‧‧31
圓孔‧‧‧311Round hole ‧‧ 311
結合孔‧‧‧312Combined hole ‧‧ 312
主體‧‧‧32Main body ‧‧32
旋轉盤‧‧‧321Rotating plate ‧ ‧ 321
齒輪‧‧‧322Gear ‧‧322
傳動桿‧‧‧323Transmission rod ‧‧‧323
把手‧‧‧324Handle ‧‧ 324
連動體‧‧‧33Linkage ‧‧33
結合孔‧‧‧331Combined hole ‧ ‧ 331
角度及水平校正顯示裝置‧‧‧40Angle and level correction display device ‧‧40
計數器‧‧‧50Counter ‧‧50
圖1為一示意圖,其繪示本案之具精密對準之傾斜曝光機構之分解示意圖。FIG. 1 is a schematic view showing an exploded view of the tilting exposure mechanism with precise alignment in the present case.
圖2為一示意圖,其繪示本案之具精密對準之傾斜曝光機構之組合示意圖。FIG. 2 is a schematic view showing the combination of the tilting exposure mechanism with precise alignment in the present case.
圖3a為一示意圖,其繪示本案之光罩置具之上側示意圖。FIG. 3a is a schematic view showing the upper side of the reticle of the present invention.
圖3b為一示意圖,其繪示本案之光罩置具之下側示意圖。Figure 3b is a schematic view showing the underside of the reticle of the present invention.
圖3c為一示意圖,其繪示本案之光罩置具之剖面示意圖。FIG. 3c is a schematic view showing a cross-sectional view of the reticle of the present invention.
圖4為一示意圖,其繪示本案之傾斜角度旋轉載台之分解示意圖。Fig. 4 is a schematic view showing the exploded view of the tilting stage of the tilt angle of the present invention.
圖5為一示意圖,其繪示本案之具精密對準之傾斜曝光機構進一步具有一角度及一水平校正顯示裝置之示意圖。FIG. 5 is a schematic view showing the tilting exposure mechanism with precise alignment of the present invention further having an angle and a horizontal correction display device.
槽體‧‧‧10Slot ‧‧10
光罩置具‧‧‧20Photomask ‧ ‧ ‧
提把‧‧‧23‧‧23
旋鈕‧‧‧24Knob ‧‧‧24
傾斜角度旋轉載台‧‧‧30Rotating stage with tilt angle ‧ ‧ 30
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TW097136591A TWI461856B (en) | 2008-09-24 | 2008-09-24 | With a precise alignment of the tilt exposure mechanism |
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TW097136591A TWI461856B (en) | 2008-09-24 | 2008-09-24 | With a precise alignment of the tilt exposure mechanism |
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TW201013321A TW201013321A (en) | 2010-04-01 |
TWI461856B true TWI461856B (en) | 2014-11-21 |
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CN110515279A (en) * | 2019-08-23 | 2019-11-29 | 深圳市华星光电半导体显示技术有限公司 | A kind of mask plate jig, exposure machine |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM301356U (en) * | 2006-05-03 | 2006-11-21 | M & R Nano Technology Co Ltd | Aligning and positioning device of an exposing device |
TW200811591A (en) * | 2006-07-11 | 2008-03-01 | Nikon Corp | Reticle holding member, reticle stage, exposure apparatus, projection-exposure method and device manufacturing method |
TW200814147A (en) * | 2006-09-01 | 2008-03-16 | Nikon Corp | Discharge lamp, light source apparatus, exposure apparatus and exposure apparatus manufacturing method |
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2008
- 2008-09-24 TW TW097136591A patent/TWI461856B/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM301356U (en) * | 2006-05-03 | 2006-11-21 | M & R Nano Technology Co Ltd | Aligning and positioning device of an exposing device |
TW200811591A (en) * | 2006-07-11 | 2008-03-01 | Nikon Corp | Reticle holding member, reticle stage, exposure apparatus, projection-exposure method and device manufacturing method |
TW200814147A (en) * | 2006-09-01 | 2008-03-16 | Nikon Corp | Discharge lamp, light source apparatus, exposure apparatus and exposure apparatus manufacturing method |
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