1333078 九、發明說明： 【發明所屬之技術領域】 本發明係關於測試顯示面板，特別是一種可測試不同規格顯 -示面板之測試治具及測試方法。 【先前技術】 * 示面板在製作完成之後，必須利用測試機台產生測試信 號，送入顯示面板中，以確認顯示面板是否可以正確作動。由於 剛由產線元成製作的顯示面板還沒有設置訊號排線或是電連接 器’因此這時候測試機台必須透過具備探針的測試治具，來對顯 不面板饋入測試訊號。測試治具係以探針接觸顯示面板邊緣外露 • 的訊號接點（Contact Pad)來達成電性連接，而將測試信號傳送 至待測試之顯示面板上。 不同規格之顯示面板尺寸大小並不相同，在顯示面板上的訊 號接點數目及配置位置也會不同。習知技術中係將測試治具可移 動地設置於測試平台上，使測試治具可以快速地改變於測試平台 上的位置，藉以配合不同尺寸的顯示面板，或是將複數個探針可 6 1333078 移動地設置於測試治具上，並使該些探針除了可以沿著測試治具 之長軸方向移動而改變位置外，也可以進行伸縮以選擇是否接觸 訊號接點，藉以配合不同顯示面板的訊號接點位置配置。但當顯 • 不面板除了尺寸變化之外，訊號接點的配置位置也有變化時，採 ㈣職治訪雜地設置於賴料上之料測試顯示面板 ♦時’仍需要更換探針之配置位置不同的測試治具。而當顯示面板 的訊號接點數量衫時，為了將複數悔針可雜地設置於測試 治具上之正確位置時錢定每一探針突出或縮人戦治具，將耗 去許夕％間。不淪是採用將測試治具可移動地設置於測試平台上 方式或是採用將複數個探針可移動地設置於測試治具上之方式 •、'試’·’、貞7^面板皆無法快速地在產線上進行測試規格的變換。 【發明内容】 ;S知技術之顯示面板之測試勤無法快速酿測試規格 的問題，本發明提供―種可測試不同規格齡面板之測試治具及 Μ方法’可任意地測試不同規格之顯示面板。 7 1333078 為了達成上述目的，本發明提出一種可測試不同規格顯示面 板之測試治具，其包括有一板件、複數個第一探針、複數個第二 才木針一第一電連接組件及一第二電連接組件。第一探針設於板 件之-側邊，分·以接觸—具有第―規格之第—受測面板的訊 號接點。第一探針设於板件之側邊，分別用以接觸一具有第二規 格之第二受測面板的訊號接點。第—電連接組件用以接收—第一 測。式訊號’透過各第-探針傳送至第—受測面板的訊號接點。第 -電連接組件，㈣接收_第二測試訊號，透過各第二探針傳送 至第二受測面板的訊號接點。如此—來，就可以透過同—套測試 治具，對具備不同規格之面板進行測試。 本發月更提出-種顯示面板之測試方法，其係先提供一板 件，並於板件之側邊設複數個第一探針及複數個第二探針。接著 ^待測觸和板置於1試平台上，並將制觸示面板之 就接點與對應之第—探針或第二探針接觸。判斷待測試顯示面 板係與對應之第_探針或第二探針接觸，若待測試顯示面板與第 —探針接觸’則對第—探針傳輪—第—戦訊號。若待測試顯示 8 田板與第二探針接觸’騎第二探針傳輪—第二測試訊號。 本發明之功效在於’本發明只要選擇測試訊號由第—電連接 件或第—A連接組件館人’就可以快速地變換測試治具之測試 規格*而要針對不同的顯示面板更制試治具，或耗費時間調 正測減冶具’使測試流程可以快速地因應產線產品的變化。 以下在’、％方式巾詳細敘述本發明之詳細特徵以及優點，其 内容足以餘健習_鄕者了解本制之技_容並據以實 加且根據本說明書所揭露之内容、申請專利範圍及圖式，任何 關技藝者可輕易地理解本發明相社目的及優點。 以上之關於本發明内容之說明及以下之實施方式之說明係用 以示範與_树狄_，並錢供轉明之專射請範圍更 進一步之解釋。 【實施方式】 為使對本發明的目的 再匕特徵、及其功能有進一步的瞭 解’兹配合實施例詳細說明如下。 參閱「第1圖」所示，# &丄 y、’、為本發明第—實施例所揭露之一種 1333078 測試機台100，用以測試顯示面板200。該測試機台100勿y冬有用 以承載顯示面板200之測試平台110及二可測試不同規格顯示面 板200之測試治具120。二測試治具120分別設置於測試平台削 . 兩側，用以傳送測試訊號至顯示面板200，以對顯示面板2〇〇進 - 行測試。 籲 再麥照「第2A圖」及「第2B圖」所示，各測試治具包 括一板件121、複數個第一探針122及複數個第二探針123。複數 個第一探針122設於板件121之一側邊，同時第—探針122之位 置配置’係相對於-具有第一規格之第一受測面板2〇〇a的訊號接 點201a的位置。當第—受測面板2〇〇&放置於測試平台η。，且使 φ 測試治具120位於第一受測面板篇的邊緣上方時，各第一探針 122係接觸第一受測面板2〇〇a之訊號接點2〇1&，如「第2A圖」 所示。複數個第二探針123亦設置於板件121之側邊。第二探針 123之位置配置’爾目對於—具有第二規格之第二受測面板纖 的訊號接點雇的位置。當第二受測面板2_放置於測試平台 110使測试冶具120位於第二受測面板2〇〇b的邊緣上方時，各第 1333078 一备、針123係接觸第二受測面板2〇〇b之訊號接點2〇lb，如「第 2B圖」所示。由於第一探針122及第二探針123之位置配置，係 分別相對於第一受測面板2〇〇a及第二受測面板2〇〇b配置，是故 • 第彳衣針122及第二探針123之位置配置較佳係交錯或是間隔配 置。當第一受測面板20如放置於測試平台11〇時，第一受測面板 • 之訊號接點只會與第一探針】μ接觸，而不會與第二探針⑵ 接觸。反之，當第二受測面板200b放置於測試平台u〇時，第二 又測面板200b之訊號接點2〇lb只會與第二探針123接觸，而不 會與第-探針122接觸。參照「第3A圖」及「第3B圖」所示， 測試治具120更包含複_針座127a、㈣、❿^置於板件 • U1之邊緣。該等第一探針122及該等第二探針123係固定於各 針座127a、127b、127c上，而設置於板件121之邊緣。其中，第 探針122及第二探針⑵係先固定於針座127a、127b、12九上， 針座127a'127b、127c在被設置於板件121邊緣，藉以使板件121 的組裝較為便利，同時，針座127a、127b、咖也可以延長第一 板針122及第二探針123距離。探針設置於針座127a、127b、127c 11 1333078 上的數目，可依據各探針所要設置的相對位置來決定。以本實施 例為例，各針座127a、127b、127c的探針數目(第一探脚加 以前述為 上第二探針123)可為二個、三個或四個，但數目並不 限。1333078 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a test display panel, and more particularly to a test fixture and a test method capable of testing display panels of different specifications. [Prior Art] * After the display panel is completed, the test machine must be used to generate a test signal and sent to the display panel to confirm whether the display panel can be operated correctly. Since the display panel that has just been manufactured by the production line has not yet provided a signal cable or an electrical connector, the test machine must pass the test fixture with the probe to feed the test signal to the display panel. The test fixture is connected to the display panel to be tested by the probe touching the contact pad on the edge of the display panel to make an electrical connection. Different sizes of display panels are not the same size, and the number of signal contacts and configuration positions on the display panel will be different. In the prior art, the test fixture is movably disposed on the test platform, so that the test fixture can be quickly changed to the position on the test platform, so as to match different size display panels, or multiple probes can be used. 1333078 is movably disposed on the test fixture, and the probes can be changed in position in addition to being movable along the long axis of the test fixture, and can also be telescoped to select whether to contact the signal contacts, thereby matching different display panels. Signal contact location configuration. However, when the display of the signal contact is changed in addition to the size change of the panel, the position of the probe is still required to be replaced when the test is displayed on the material. Different test fixtures. When the number of signal contacts on the display panel is set, in order to set the reciprocal needles in the correct position on the test fixture, each probe protrudes or shrinks the fixture, which will consume between. It is a method of movably setting the test fixture on the test platform or a method of movably placing a plurality of probes on the test fixture. • The 'test'·', 贞7^ panel cannot be used. Quickly change the test specifications on the production line. [Summary of the Invention] The test panel of the S-technical technology cannot quickly test the specifications of the test panel. The present invention provides a test fixture and a method for testing panels of different ages. The panel can be arbitrarily tested with different specifications. . 7 1333078 In order to achieve the above object, the present invention provides a test fixture capable of testing display panels of different specifications, comprising a plate member, a plurality of first probes, a plurality of second wood pins, a first electrical connection component and a a second electrical connection assembly. The first probe is disposed on the side of the panel, and is in contact with the signal contacts of the panel to be tested having the first specification. The first probes are disposed on the side of the board for contacting the signal contacts of the second panel to be tested having the second specification. The first electrical connection assembly is configured to receive the first measurement. The signal signal is transmitted to the signal contacts of the first panel to be tested through the respective probes. The first electrical connection component, (4) receives the second test signal, and transmits the second probe to the signal contact of the second panel under test. In this way, it is possible to test panels with different specifications through the same set of test fixtures. In the present month, a test method for a display panel is proposed, which first provides a panel, and a plurality of first probes and a plurality of second probes are disposed on the side of the panel. Then, the touch panel to be tested is placed on the test platform, and the contact point of the touch panel is brought into contact with the corresponding probe or second probe. It is judged that the display panel to be tested is in contact with the corresponding _ probe or the second probe, and if the display panel to be tested is in contact with the first probe, then the first probe is transmitted to the first probe. If the test is to be displayed, the 8 field plate is in contact with the second probe, and the second probe is transmitted to the second test signal. The effect of the invention is that the invention can quickly change the test specification of the test fixture by simply selecting the test signal from the first electrical connector or the -A connection component pavilion*, and further testing for different display panels. With or with time-consuming corrections, the test process can quickly respond to changes in the product line. In the following, the detailed features and advantages of the present invention are described in detail in the '% mode towel, and the content thereof is sufficient for the remainder of the training. _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ And the drawings, any subject skilled in the art can easily understand the objects and advantages of the present invention. The above description of the contents of the present invention and the following description of the embodiments are used to demonstrate the scope of the singularity of the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ [Embodiment] In order to further understand the object of the present invention and its function, the following embodiments will be described in detail. Referring to "FIG. 1", # & 丄 y, ', is a 1333078 test machine 100 disclosed in the first embodiment of the present invention for testing the display panel 200. The test machine 100 is not useful for carrying the test platform 110 of the display panel 200 and the test fixture 120 for testing the display panel 200 of different specifications. The two test fixtures 120 are respectively disposed on the test platform for cutting the test signals to the display panel 200 on both sides to perform the test on the display panel 2. The test fixtures include a plate member 121, a plurality of first probes 122 and a plurality of second probes 123, as shown in Figs. 2A and 2B. The plurality of first probes 122 are disposed on one side of the plate member 121, and the position of the first probe 122 is disposed relative to the signal contact 201a of the first tested panel 2A having the first specification. s position. When the first - tested panel 2 〇〇 & is placed on the test platform η. When the φ test fixture 120 is located above the edge of the first panel to be tested, each of the first probes 122 contacts the signal contacts 2〇1& of the first panel 2a to be tested, such as “2A”. Figure". A plurality of second probes 123 are also disposed on the side of the plate member 121. The position of the second probe 123 is set to the position of the signal contact of the second panel fiber having the second specification. When the second panel 2 to be tested is placed on the test platform 110 so that the test tool 120 is located above the edge of the second panel 2b to be tested, each of the 1333078 and the needle 123 contacts the second panel 2 to be tested. The signal contact of 〇b is 2〇lb, as shown in Figure 2B. The positional arrangement of the first probe 122 and the second probe 123 are respectively arranged with respect to the first panel under test 2A and the second panel 2b to be tested, so that the first needle 122 and The positional arrangement of the second probes 123 is preferably staggered or spaced. When the first panel 20 to be tested is placed on the test platform 11, the signal contact of the first panel to be tested will only contact the first probe, and will not contact the second probe (2). On the other hand, when the second panel 200b is placed on the test platform, the signal contact 2〇1b of the second panel 200b is only in contact with the second probe 123, and is not in contact with the probe 114. . Referring to "3A" and "3B", the test fixture 120 further includes a complex _ needle holder 127a, (4), and a ❿^ placed on the edge of the plate member U1. The first probes 122 and the second probes 123 are fixed to the respective needle holders 127a, 127b, and 127c, and are disposed at the edges of the plate member 121. The probe 122 and the second probe (2) are first fixed on the needle holders 127a, 127b, and 12, and the needle holders 127a'127b and 127c are disposed on the edge of the plate member 121, so that the assembly of the plate member 121 is relatively Conveniently, the needle holders 127a, 127b, and the coffee can also extend the distance between the first needle 122 and the second probe 123. The number of probes disposed on the hubs 127a, 127b, 127c 11 1333078 can be determined according to the relative positions to be set by the probes. In this embodiment, for example, the number of probes of each of the hubs 127a, 127b, and 127c (the first probe is the upper second probe 123) may be two, three, or four, but the number is not limited. .
再參照「第2A圖」、「第2B圖」、「第M圖」及「第犯圖_ 所示，測試治具120更包含有一第一電連接組件124及第二電連 接組件125。第一電連接組件124係電性連接於第一探針⑵，用 以接收-第-職訊號。於測試第—受測面板施時，係以測試 訊號源（圖未繪示）之電連接器131電性連接於第一電連接組件 124 ’並以排、線132連接電連接器131及測試訊號源。當測試第— 受測面板時，戦訊號源提供―第—測試訊號，該第一測試 訊號通過麟132及電連接器⑶，將第一測試訊號傳輸至第一 電連接組件12心並透過各第一探針m傳輸至第—受測面板細a 的訊號接點2Gla。相同地，當測試第二受測面板·b時，測試 訊號源提供-第二顧喊·，該第二測試訊號通麵線132及電 連接β 131 ’將第二測試訊號傳輸至第二電連接組件125，並透過 12 1333078 各弟—杈針123，傳輸至第二受測面板200b的訊號接點2〇lb。 請參照「第4A圖」及「第牝圖」所示，第一電連接組件124 更包含-第-電路板124a及複數條第一導線mc，且第一電路板 Ua之上具有—金屬線路層⑽，係電性連接於第—導線ϋ。 各弟-導線124c之另一端係分別電性連接於各第一探針⑵，以 傳送第-測試峨至各第—探針122。職地，第二電連接組件 ⑵更包含-第二電路板12Sa及複數條第一導線既，且第二電 路板125a之上具有—金屬線路層挪，物_於第二導線 以。各第二導線既之另一端係分別電性連接於各第二探針 123 ’以傳送第二測試訊號至各第二探針123。 應用上述測試治具11〇進行之測 法，係先提供一側邊設 有複數個第-探針122及複數個第 休針123之板件120。接著 將一待測試顯示面板置於測試平台11〇 、， 上’亚將待測試顯示面板 之訊號接點朗應ϋ針122 ^ 〜％針123接觸。然後判 斷待測試_祕之訊隸點倾對 牙铢針122或第二探 針123接觸。若待測試顯示面板之訊 μ 唼站與弟一探針122接觸， 13 則決疋待測試顯示面板之規格為第一規格，並對該等第—探針⑵ 傳輪第，則咸訊號。若待測試面板之訊號接點與第二擇、在十⑵接 觸’則決又但測試面板之規格為第二規格，並對第二探針123傳 輪第一測喊訊號。如此一來，只要選擇測試訊號由第一電連接組 -件124或第二電連接組件125饋入，就可以透過同一套測試治具 • m，對具備不同規格之面板進行測試。 乡、閱第5A圖」及「第5B圖」所示，為本發明第二實施例 所提供之—種測試治具12()，該測試治具i2Q包含—板件⑵、複 數個第—探針122、複數個第二探針123、複數個第三探針126、 第一電連接組件124、第二電連接組件125。第一探針122、第二 • 探針123及第三探針以係設置於板件〗2〇之-側邊。對於具備 不同規格之第-受測面板篇及第二受測面板纖而言，其等 之訊號接點201a、201b中，會有部分位於相同的配置位置，這一 部份的訊號接點2〇la、2〇lb可透過第三探針⑶來接觸，也就是 說第三探針126係可選擇地接觸第—受測面板施之部分訊號接 點201a，或是第二受測面板200b之部分訊號接，點咖。於此實 14 4中第-麟122及第三料U6 n城之位置配置，係 翻第-叉測面板2〇〇a的訊號接點2〇2a的位置，如厂第5A圖」 斤不。同樣地，相同的這些第三探針126與第二探針123共同組 置配置’係相對於第二受測面板2識的訊號接點迎匕的 置如f5B圖」所示。是以，第一探針122與第三探針126 可共同用於接觸第一受測面板烏之訊號接點201a，而第二探針 123與第三探針126可共同用於接觸第二受測面板200b之訊號接 點 2〇lb。 對於第-測試訊號及第二測試訊制傳遞而言，於第一電性 連接組件m之第—導線12如+ ’部分之第一導線敗係連接 於第二抓針126，其餘第_導線124e係連接於第—探針⑵。於 第二電性連接組件125之第二導線125以，部分之第二導線收 連接於第三探針126 ’其餘第二導線125c係係連接於第二探針 123。也就是說’至少—第一導線⑽及至少—第二導線咖係 共同電性連接於第三探針126。因此，當測試第一受測面板_ 時，測試訊號源提供-第—測試訊號時，該第一測試訊號通過第 15 1333078 一探針122及第三探針126傳輸至第一受測面板2〇〇a之訊號接點 2〇la。相同地’當測試第二受測面板200b時，測試訊號源提供— 弟一測5式訊號，該第二測試訊號係通過第二探針及第三探針 126傳輸至第二受測面板2〇〇b之訊號接腳點2〇lb。 參閱「第6圖」所示’係為本發明所揭露測試治具12〇之電 性連接組件不;|圖，該測試治具12Q大致與第—實施例相同，其 差異在於第一電性連接組件124及第二電性連接組件125係分別 電性連接於電連接器131。電連接器131係透過排線132連接第 一電性連接组件124或是第二電性連接，组件125，以快速地插接 於測試訊號源’接收第—測試訊號或是第二測試訊號。 雖然本發明以前述之實施例揭露如上，然其並_以限定本 發明。在不脫離本發明之精神和 範圍内，所為之更動與潤飾，均 護範圍請參考 屬本發明之專梅護顧。關於本發_界定之保 所附之申請專利範圍。 【圖式簡單說明】. 第1 圖為本發明第-實施例之測試機台； 16 第2A圖、及第2B 立體圖； 圖為本發明第—實施例W試治具之局部 / 3A圖及第犯圖為本發明第一實施例之測試治具之局部分 關’揭ϋ連接组件及第二電連接組件； 4Α圖及第4Β圖為本發明第一實施例之平面示意圖 5Α圖及第5Β圖為本發明第二實施例之平面示意圖； 第6圖為本發明測試治具之之連接組件示意圖 【主要元件符號說明】 100 120 122 124 124b 125 125b 測試機台 測試治具 第一探針 第一電連接組件 金屬線路層 第二電連接組件 金屬線路層 126 第三探針 110 測試平台 121 板件 123 第二探針 124a 第一電路板 124c 第一導線 125a 弟一電路板 125c 第二導線 127a 針座 1333078 127b 針座 127c 針座 131 電連接器 132 排線 200 顯示面板 200a 第一受測面板 200b 第二受測面板 201a 訊5虎接點 201b 訊5虎接點 18Referring to "2A", "2B", "M" and "figure_", the test fixture 120 further includes a first electrical connection component 124 and a second electrical connection component 125. An electrical connection component 124 is electrically connected to the first probe (2) for receiving the -first-level signal. When testing the first-test panel, the electrical connector of the test signal source (not shown) is used. The first electrical connection component 124' is electrically connected to the first electrical connection component 124', and the electrical connector 131 and the test signal source are connected by the row and the line 132. When the first test panel is tested, the signal source provides a "first" test signal, the first The test signal is transmitted through the lining 132 and the electrical connector (3) to the first electrical connection component 12 and transmitted through the first probes m to the signal contact 2G1a of the first panel a. When testing the second panel to be tested, the test signal source provides a second signal, and the second test signal through the line 132 and the electrical connection β 131 'transmits the second test signal to the second electrical connection component. 125, and transmitted to the second panel under test 200b through 12 1333078 brothers - pin 123 No. 2 lb. Please refer to "4A" and "Figure", the first electrical connection component 124 further includes a -th circuit board 124a and a plurality of first wires mc, and the first circuit board Above Ua is a metal circuit layer (10) electrically connected to the first wire. The other end of each of the wires-wires 124c is electrically connected to each of the first probes (2) to transmit the first test sputum to each of the first probes 122. The second electrical connection component (2) further includes a second circuit board 12Sa and a plurality of first wires, and the second circuit board 125a has a metal circuit layer and a second wire. The other ends of the second wires are electrically connected to the respective second probes 123' to transmit the second test signals to the second probes 123. The test using the above test fixture 11 is to first provide a plate member 120 having a plurality of first probes 122 and a plurality of first break pins 123 on one side. Then, a test display panel to be tested is placed on the test platform 11 〇 , , and the signal contact of the display panel to be tested is contacted by the Phillips pin 122 ^ 〜 % pin 123. Then, it is judged that the test point to be tested is in contact with the gum needle 122 or the second probe 123. If the information of the display panel to be tested is in contact with the first probe 122, 13 the size of the display panel to be tested is determined to be the first specification, and the first probe (2) is the first signal. If the signal contact of the panel to be tested is in contact with the second selection, at ten (2), then the specification of the test panel is the second specification, and the first probe 123 is transmitted to the second probe 123. In this way, as long as the test signal is selected to be fed by the first electrical connection group member 124 or the second electrical connection assembly 125, the panel with different specifications can be tested through the same test fixture. As shown in FIG. 5A and FIG. 5B, a test fixture 12() is provided for the second embodiment of the present invention. The test fixture i2Q includes a panel (2) and a plurality of sections. The probe 122, the plurality of second probes 123, the plurality of third probes 126, the first electrical connection component 124, and the second electrical connection component 125. The first probe 122, the second probe 123, and the third probe are disposed on the side of the panel. For the first-test panel and the second panel fiber with different specifications, some of the signal contacts 201a and 201b will be located at the same configuration position. This part of the signal contact 2 〇la, 2〇lb can be contacted through the third probe (3), that is, the third probe 126 can selectively contact the partial signal contact 201a of the first panel to be tested, or the second panel 200b to be tested. Part of the signal is connected, point coffee. In this case, the position of the first lining 122 and the third material U6 n city is the position of the signal contact 2〇2a of the second fork measuring panel 2〇〇a, as shown in the factory picture 5A. . Similarly, the same arrangement of the third probes 126 and the second probes 123 is arranged as shown in Figure 5 below with respect to the signal contacts of the second panel 2 to be tested. Therefore, the first probe 122 and the third probe 126 can be used together to contact the signal contact 201a of the first panel under test, and the second probe 123 and the third probe 126 can be used together to contact the second probe 126. The signal contact of the panel 200b under test is 2〇lb. For the first test signal and the second test signal transmission, the first wire of the first electrical connection component m, such as the + ' portion, is connected to the second grasping pin 126, and the remaining first wire 124e is attached to the first probe (2). The second wire 125 of the second electrical connection component 125 is connected to the third probe 126 by a portion of the second wire 126. The remaining second wire 125c is ligated to the second probe 123. That is, at least the first wire (10) and at least the second wire are electrically connected to the third probe 126. Therefore, when the first test panel _ is tested, when the test signal source provides the -first test signal, the first test signal is transmitted to the first tested panel 2 through the 15th 1333078 probe 122 and the third probe 126. 〇〇a signal contact 2〇la. Similarly, when the second panel 200b is tested, the test signal source provides a mode 5 signal, and the second test signal is transmitted to the second panel 2 through the second probe and the third probe 126. 〇〇b signal pin 2 lb. Referring to the "Fig. 6", it is the electrical connection component of the test fixture disclosed in the present invention. The test fixture 12Q is substantially the same as the first embodiment, and the difference lies in the first electrical property. The connecting component 124 and the second electrical connecting component 125 are electrically connected to the electrical connector 131, respectively. The electrical connector 131 is connected to the first electrical connection component 124 or the second electrical connection through the cable 132, and the component 125 is quickly inserted into the test signal source to receive the first test signal or the second test signal. Although the present invention has been disclosed above in the foregoing embodiments, it is intended to limit the invention. Without changing the spirit and scope of the present invention, the scope of the modification and retouching, please refer to the special plum care belonging to the present invention. About the scope of this application. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a test machine of the first embodiment of the present invention; 16 FIG. 2A and FIG. 2B are perspective views; FIG. 1 is a partial/3A view of a test fixture of the first embodiment of the present invention; The first diagram is the partial part of the test fixture of the first embodiment of the present invention, and the second connection diagram and the second electrical connection component are provided in the first embodiment of the present invention. 5 is a schematic plan view of a second embodiment of the present invention; FIG. 6 is a schematic view of a connecting component of the test fixture of the present invention [Signature of main components] 100 120 122 124 124b 125 125b Test machine test fixture first probe First electrical connection component metal circuit layer second electrical connection component metal circuit layer 126 third probe 110 test platform 121 plate 123 second probe 124a first circuit board 124c first wire 125a first circuit board 125c second wire 127a Header 1333078 127b Header 127c Header 131 Electrical Connector 132 Cable 200 Display Panel 200a First Test Panel 200b Second Test Panel 201a Signal 5 Tiger Contact 201b Signal 5 Tiger Contact 18