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TWI386495B - A multilayer coating mold - Google Patents

A multilayer coating mold Download PDF

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Publication number
TWI386495B
TWI386495B TW94142524A TW94142524A TWI386495B TW I386495 B TWI386495 B TW I386495B TW 94142524 A TW94142524 A TW 94142524A TW 94142524 A TW94142524 A TW 94142524A TW I386495 B TWI386495 B TW I386495B
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layer
chromium
carbon
mold
substrate
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TW94142524A
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TW200722538A (en
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Ga-Lane Chen
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Hon Hai Prec Ind Co Ltd
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Description

一種具有多層鍍層之模具Mold with multiple layers of plating

本發明涉及一種模具,尤其係一種具有多層鍍膜之模具。The present invention relates to a mold, and more particularly to a mold having a multi-layer coating.

隨著社會發展,科技進步,人們對於模具之性能要求愈來愈高。然,通常模具基材一般難以滿足較高綜合性能之要求,因此往往需採用表面處理技術於模具基材表面鍍上一些修飾材料,以於一定程度上彌補模具基材本身之不足。With the development of society and the advancement of science and technology, people's performance requirements for molds are getting higher and higher. However, usually the mold substrate is generally difficult to meet the requirements of higher comprehensive performance, so it is often necessary to use surface treatment technology to plate some surface of the mold substrate with some modified materials to compensate for the deficiency of the mold substrate itself.

近年來,於科學技術快速發展之推動下,表面處理技術中出現了一種類鑽碳鍍層。類鑽碳係結構中混合了SP2 石墨平面鍵結與SP3 四面體鑽石共價鍵結之非晶態碳。類鑽碳中之SP2 鍵結之石墨組織,層與層之間以微弱之凡得瓦爾鍵鍵結,導致層與層間極易滑動,可使類鑽碳鍍層具有低摩擦係數與潤滑等效果,具有較好之脫膜性。In recent years, driven by the rapid development of science and technology, a variety of carbon coatings have appeared in surface treatment technology. The carbon-like structure of the diamond-like structure is a mixture of amorphous carbon covalently bonded to the SP 2 graphite plane bond and the SP 3 tetrahedral diamond. The graphite structure of the SP 2 bond in the diamond-like carbon, the layer is bonded with the weak van der Waals bond, which makes the layer and the layer easily slide, which can make the diamond-like carbon coating have low friction coefficient and lubrication effect. , has a good release property.

由於類鑽碳具有良好之鍍層性能,於模具表面處理技術中應用較多。然,先前技術常採用單層純類鑽碳鍍層來改善模具性能,而當類鉆碳鍍膜厚度太厚時,會產生較大內應力,使其與基材附著性不佳,易脫落;厚度太薄時,容易使基材元素擴散至保護膜表層,導致類鉆碳鍍膜變色而與基材發生反應,喪失其脫膜性。Because diamond-like carbon has good coating performance, it is widely used in mold surface treatment technology. However, the prior art often uses a single layer of pure diamond-like carbon coating to improve the mold performance, and when the thickness of the diamond-like carbon coating is too thick, a large internal stress is generated, which makes the adhesion to the substrate poor, easy to fall off; When it is too thin, it is easy to diffuse the substrate element to the surface layer of the protective film, causing the diamond-like carbon coating to discolor and react with the substrate to lose its release property.

有鑑於此,提供一種與基材附著性強,且脫膜性佳之鍍膜模具實為必需。In view of the above, it is necessary to provide a coating die having strong adhesion to a substrate and excellent release property.

下面將以具體實施例說明一種與基材附著性強,且脫膜性佳之鍍膜模具。Hereinafter, a coating die having strong adhesion to a substrate and excellent release property will be described by way of specific examples.

一種具有多層鍍膜之模具,包括一基材,以及於該基材上依次形成之一鉻層或矽化鉻層,一矽層,一碳化矽層,一碳化矽與碳之組合層及一含氫類鑽碳層。A mold having a multi-layer coating, comprising a substrate, and sequentially forming a chromium layer or a chromium telluride layer, a tantalum layer, a tantalum carbide layer, a combined layer of tantalum carbide and carbon, and a hydrogen containing layer on the substrate Drilling carbon layer.

相較於先前技術,所述具有多層鍍膜之模具,藉由於基材上形成一鉻層或矽化鉻層以及一矽層,可增強後續鍍層與基材之附著性;最外層選用含氫類鉆碳材,可有效增強模具之脫膜性;另,碳化矽具有較強之硬度,中間採用一碳化矽層及一碳化矽與碳之組合層,可增強模具之耐磨性。Compared with the prior art, the mold with multi-layer coating can enhance the adhesion of the subsequent coating to the substrate by forming a chromium layer or a chromium-deposited layer and a layer on the substrate; the outermost layer is made of a hydrogen-containing diamond. The carbon material can effectively enhance the release property of the mold; in addition, the tantalum carbide has a strong hardness, and a carbonized tantalum layer and a combination layer of tantalum carbide and carbon are used in the middle to enhance the wear resistance of the mold.

下面將結合附圖對本發明實施例作進一步之詳細說明。The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

請參見第一圖,一種具有多層鍍膜之模具100,包括:一基材110,以及一鉻層或矽化鉻層120,一矽層130,一碳化矽層140,一碳化矽與碳之組合層150及一含氫類鉆碳層160。Referring to the first figure, a mold 100 having a multi-layer coating includes: a substrate 110, and a chromium layer or a chromium telluride layer 120, a tantalum layer 130, a tantalum carbide layer 140, and a combination of tantalum carbide and carbon. 150 and a hydrogen-containing diamond carbon layer 160.

其中,該基材110之材質為不鏽鋼,如鐵碳鉻合金、鐵碳鉻鉬合金、鐵碳鉻矽合金、鐵碳鉻鎳鉬合金、鐵碳鉻鎳鈦合金、鐵碳鉻鎢錳合金、鐵碳鉻鎢釩合金、鐵碳鉻鉬釩合金或鐵碳鉻鉬釩矽合金等。The material of the substrate 110 is stainless steel, such as iron carbon chromium alloy, iron carbon chromium molybdenum alloy, iron carbon chromium niobium alloy, iron carbon chromium nickel molybdenum alloy, iron carbon chromium nickel titanium alloy, iron carbon chromium tungsten manganese alloy, Iron carbon chromium tungsten vanadium alloy, iron carbon chromium molybdenum vanadium alloy or iron carbon chromium molybdenum vanadium tantalum alloy.

該鉻層或矽化鉻層120之厚度範圍為2~8奈米,優選為4~6奈米。The chromium layer or chromium telluride layer 120 has a thickness ranging from 2 to 8 nm, preferably from 4 to 6 nm.

該矽層130之厚度範圍亦為2~8奈米,優選為4~6奈米。The thickness of the ruthenium layer 130 is also in the range of 2 to 8 nm, preferably 4 to 6 nm.

設置該鉻層或矽化鉻層120之目的在於增加後續鍍層與基材110之附著性。The purpose of providing the chromium layer or chromium telluride layer 120 is to increase the adhesion of the subsequent plating layer to the substrate 110.

所述碳化矽層140及碳化矽與碳之組合層150之厚度範圍均為20~100奈米,優選均為40~80奈米。 所述含氫類鉆碳層160之厚度範圍為20~3000奈米,優選為100~2000奈米。The thickness of the tantalum carbide layer 140 and the tantalum carbide and carbon combination layer 150 ranges from 20 to 100 nm, preferably from 40 to 80 nm. The hydrogen-containing diamond-like carbon layer 160 has a thickness ranging from 20 to 3,000 nm, preferably from 100 to 2,000 nm.

結合第二圖,提供一濺鍍裝置200,該濺鍍裝置200具有一密封腔室210,該密封腔室210內具有一底座212,其可自由旋轉,一基材110設置於該底座212上,其可隨底座212一起旋轉,亦可自轉。腔室210內與該底座212相對之位置設置有一可旋轉之固定裝置214,其上固定有一第一靶材222,一第二靶材232以及一第三靶材242。其中,該第一靶材222之材質可選用鉻或矽化鉻,第二靶材232之材質可選用矽或碳化矽,第三靶材242為石墨。In conjunction with the second embodiment, a sputtering apparatus 200 is provided. The sputtering apparatus 200 has a sealing chamber 210. The sealing chamber 210 has a base 212 that is freely rotatable. A substrate 110 is disposed on the base 212. It can rotate with the base 212 and can also rotate. A rotatable fixing device 214 is disposed in the chamber 210 opposite to the base 212, and a first target 222, a second target 232 and a third target 242 are fixed thereon. The material of the first target 222 may be selected from chromium or chromium telluride, the second target 232 may be made of tantalum or tantalum carbide, and the third target 242 may be graphite.

射頻電源224、234、244之負極分別與該第一靶材222、第二靶材232及第三靶材242連接,射頻電源224、234、244之正極均連接基材110。射頻電源224、234、244之工作頻率均為13.56百萬赫茲。一偏置電源250設置於底座212之一端,於底座212上施加一負偏壓,以加速正離子向基材110之沈積速度。偏置電源250可為直流或交流電源,本實施例中採用交流電源,其頻率為20~800千赫,優選為40~400千赫,其電壓為-100~-30伏,優選為-60~-40伏。The cathodes of the RF power sources 224, 234, and 244 are respectively connected to the first target 222, the second target 232, and the third target 242, and the anodes of the RF power sources 224, 234, and 244 are connected to the substrate 110. The operating frequencies of the RF power supplies 224, 234, and 244 are all 13.56 megahertz. A bias power supply 250 is disposed at one end of the base 212 to apply a negative bias on the base 212 to accelerate the deposition rate of positive ions to the substrate 110. The bias power supply 250 can be a direct current or an alternating current power source. In this embodiment, an alternating current power source is used, and the frequency thereof is 20 to 800 kHz, preferably 40 to 400 kHz, and the voltage is -100 to -30 volts, preferably -60. ~-40 volts.

由於濺鍍時,腔室210內需充有工作氣體,工作氣體通常為不與靶材、基材110以及後續形成之鍍膜發生反應之惰性氣體,該惰性氣體可選用氬氣或氪氣。當然,根據待鍍膜層之需要,工作氣體可為上述惰性氣體與其他氣體之混合氣體,為此,該腔室210設置有一抽氣口260,一氣體輸入口270。Since the working chamber is filled with the working gas during the sputtering, the working gas is usually an inert gas which does not react with the target, the substrate 110 and the subsequently formed coating, and the inert gas may be argon or helium. Of course, the working gas may be a mixed gas of the above inert gas and other gases according to the needs of the layer to be coated. To this end, the chamber 210 is provided with an air suction port 260 and a gas input port 270.

製作上述具有多層鍍膜之模具100包括以下步驟:於基材110上形成一鉻層或矽化鉻層120。具體步驟為:首先,從抽氣口260將腔室210抽為真空後,從氣體輸入口270向腔室210內充入氬氣或氪氣,開啟射頻電源224,射頻電源234、244均處於關閉狀態,旋轉固定裝置214或底座212,使第一靶材222處於與基材110垂直相對之位置,於第一靶材222與作為陽極之底座212之間發生輝光放電,由於氬氣分子於射頻電源224作用下會被離子化為帶正電荷之氬離子,於電場作用下,氬離子向負極即第一靶材222方向加速運動,並不斷撞擊第一靶材222之表面,氬離子之動能轉移至靶材原子,當靶材原子獲得足夠動能後,便脫離第一靶材222之表面而沈積於基材110上形成該鉻層或矽化鉻層120。該濺鍍過程中,基材110可進行自轉,以於基材110表面濺鍍上比較均勻之鉻層或矽化鉻層120。該自轉速度可為10~200轉/分鐘,優選為20~80轉/分鐘。且控制濺鍍時間,使沈積於基材110上之鉻層或矽化鉻層120之厚度為2~8奈米,優選為4~6奈米。The above-described mold 100 having a multi-layer coating includes the steps of forming a chromium layer or a chromium telluride layer 120 on the substrate 110. The specific steps are as follows: first, after the chamber 210 is evacuated from the air suction port 260, the chamber 210 is filled with argon or helium gas from the gas input port 270, and the RF power source 224 is turned on, and the RF power sources 234 and 244 are all turned off. The state, the rotating fixture 214 or the base 212 is such that the first target 222 is at a position perpendicular to the substrate 110, and a glow discharge occurs between the first target 222 and the base 212 as an anode, because the argon molecules are in the radio frequency. The power source 224 is ionized into a positively charged argon ion. Under the action of the electric field, the argon ions accelerate toward the negative electrode, that is, the first target 222, and continuously strike the surface of the first target 222, and the kinetic energy of the argon ion. Transfer to the target atoms, after the target atoms have sufficient kinetic energy, they are separated from the surface of the first target 222 and deposited on the substrate 110 to form the chromium layer or the chromium telluride layer 120. During the sputtering process, the substrate 110 can be rotated to sputter a relatively uniform chromium layer or chromium telluride layer 120 on the surface of the substrate 110. The rotation speed may be 10 to 200 rpm, preferably 20 to 80 rpm. And controlling the sputtering time, the thickness of the chromium layer or the chromium telluride layer 120 deposited on the substrate 110 is 2-8 nm, preferably 4-6 nm.

於鉻層或矽化鉻層120上形成一矽層130。與形成鉻層或矽化鉻層120原理類似,同樣使用濺鍍裝置200,開啟射頻電源234,關閉射頻電源224,244處於關閉狀態,旋轉固定裝置214或底座212,使第二靶材232處於與基材110垂直相對之位置,於第二靶材232與作為陽極之底座212之間發生輝光放電,從而於鉻層或矽化鉻層120上形成一矽層130,本步驟中第二靶材232之材質採用矽。該濺鍍過程中,基材110可進行自轉,以於鉻層或矽化鉻層120表面濺鍍上比較均勻之矽層130。該自轉速度可為10~200轉/分鐘,優選為20~80轉/分鐘。且控制濺鍍時間,使沈積於鉻層或矽化鉻層120上之矽層130之厚度為2~8奈米,優選為4~6奈米。A layer of germanium 130 is formed on the chromium layer or chromium telluride layer 120. Similar to the principle of forming a chromium layer or a chromium telluride layer 120, the sputtering device 200 is also used, the RF power source 234 is turned on, the RF power source 224, 244 is turned off, and the fixture 214 or the base 212 is rotated to bring the second target 232 into contact with The substrate 110 is vertically opposed to a glow discharge between the second target 232 and the base 212 as an anode, thereby forming a germanium layer 130 on the chromium layer or the chromium telluride layer 120. In this step, the second target 232 is formed. The material is made of 矽. During the sputtering process, the substrate 110 can be rotated to deposit a relatively uniform layer 130 on the surface of the chromium layer or the chromium telluride layer 120. The rotation speed may be 10 to 200 rpm, preferably 20 to 80 rpm. And controlling the sputtering time, the thickness of the germanium layer 130 deposited on the chromium layer or the chromium telluride layer 120 is 2-8 nm, preferably 4-6 nm.

於矽層130上形成碳化矽層140。與形成矽層130原理類似,同樣使用濺鍍裝置200,不同之處係:本步驟中第二靶材232之材質採用碳化矽。射頻電源234處於開啟狀態,射頻電源224、244均處於關閉狀態,旋轉固定裝置214或底座212,使第二靶材232處於與基材110垂直相對之位置,於第二靶材232與作為陽極之底座212之間發生輝光放電,從而於矽層130上形成一碳化矽層140。該濺鍍過程中,基材110可進行自轉,以於矽層130表面濺鍍上比較均勻之碳化矽層140。該自轉速度可為10~200轉/分鐘,優選為20~80轉/分鐘。且控制濺鍍時間,使碳化矽層140之厚度為20~100奈米,優選為40~80奈米。A tantalum carbide layer 140 is formed on the tantalum layer 130. Similar to the principle of forming the germanium layer 130, the sputtering apparatus 200 is also used, except that the material of the second target 232 is tantalum carbide in this step. The RF power source 234 is in an on state, and the RF power sources 224 and 244 are all in a closed state, and the fixing device 214 or the base 212 is rotated to position the second target 232 at a position perpendicular to the substrate 110 at the second target 232 and as an anode. A glow discharge occurs between the bases 212 to form a tantalum carbide layer 140 on the tantalum layer 130. During the sputtering process, the substrate 110 can be rotated to deposit a relatively uniform tantalum carbide layer 140 on the surface of the tantalum layer 130. The rotation speed may be 10 to 200 rpm, preferably 20 to 80 rpm. And controlling the sputtering time, the thickness of the tantalum carbide layer 140 is 20 to 100 nm, preferably 40 to 80 nm.

於碳化矽層140上形成一碳化矽與碳之組合層150。與形成碳化矽層140原理類似,同樣使用濺鍍裝置200,不同之處係:本步驟採用第二靶材232及第三靶材242共同濺鍍。射頻電源234處於開啟狀態,並開啟射頻電源244,射頻電源224處於關閉狀態,即,以第二靶材232與第三靶材242作為陰極,於第二靶材232、第三靶材242與底座212之間進行輝光放電,從而於碳化矽層140上形成一碳化矽與碳之組合層150。該濺鍍過程中,基材110可進行自轉,以於碳化矽層140表面濺鍍上比較均勻之碳化矽與碳之組合層150。該自轉速度可為10~200轉/分鐘,優選為20~80轉/分鐘。且控制濺鍍時間,使該碳化矽與碳之組合層150之厚度為20~100奈米,優選為40~80奈米。A combined layer 150 of tantalum carbide and carbon is formed on the tantalum carbide layer 140. Similar to the principle of forming the tantalum carbide layer 140, the sputtering apparatus 200 is also used, except that this step uses the second target 232 and the third target 242 to be collectively sputtered. The RF power source 234 is in an on state, and the RF power source 244 is turned on. The RF power source 224 is in a closed state, that is, the second target 232 and the third target 242 are used as cathodes, and the second target 232 and the third target 242 are Glow discharge is performed between the bases 212 to form a combined layer 150 of tantalum carbide and carbon on the tantalum carbide layer 140. During the sputtering process, the substrate 110 can be rotated to deposit a relatively uniform combination of tantalum carbide and carbon on the surface of the tantalum carbide layer 140. The rotation speed may be 10 to 200 rpm, preferably 20 to 80 rpm. And controlling the sputtering time, the thickness of the combined layer 150 of tantalum carbide and carbon is 20 to 100 nm, preferably 40 to 80 nm.

於碳化矽與碳之組合層150上形成一含氫類鉆碳層160。與形成組合層150原理類似,同樣使用濺鍍裝置200,不同之處係:保持腔室210內之壓力條件下,從抽氣口260將腔室210抽真空,再從氣體輸入口270向腔室210中輸入一定比例之氫氣與氬氣之混合氣體,該比例滿足條件:氫氣於混合氣體中之體積比為5~20%。當然,亦可以輸入氫氣與氪氣之混合氣體,甲烷與氬氣之混合氣體或甲烷與氪氣之混合氣體,其中,氫氣與甲烷於其混合氣體中所占之體積比5~20%。射頻電源244處於開啟狀態,射頻電源224處於關閉狀態,將射頻電源234關閉,即,以第三靶材242作為陰極,且第三靶材242處於與基材110垂直相對之位置,於第三靶材242與底座212之間進行輝光放電,從而於碳化矽與碳之組合層150上形成一含氫類鑽碳層160。該濺鍍過程中,基材110可進行自轉,以於碳化矽與碳之組合層150表面濺鍍上比較均勻之含氫類鉆碳層160。該自轉速度可為10~200轉/分鐘,優選為20~80轉/分鐘。且控制濺鍍時間,使該含氫類鉆碳層160之厚度為20~3000奈米,優選為100~2000奈米。A hydrogen-containing diamond-like carbon layer 160 is formed on the combined layer 150 of tantalum carbide and carbon. Similar to the principle of forming the combined layer 150, the sputtering apparatus 200 is also used, except that the chamber 210 is evacuated from the suction port 260 under pressure conditions in the chamber 210, and then from the gas inlet 270 to the chamber. 210 is input with a certain proportion of a mixed gas of hydrogen and argon, and the ratio satisfies the condition that the volume ratio of hydrogen in the mixed gas is 5 to 20%. Of course, it is also possible to input a mixed gas of hydrogen and helium, a mixed gas of methane and argon or a mixed gas of methane and helium, wherein the volume ratio of hydrogen to methane in the mixed gas thereof is 5 to 20%. The RF power source 244 is in an on state, the RF power source 224 is in a closed state, and the RF power source 234 is turned off, that is, the third target 242 is used as a cathode, and the third target 242 is at a position perpendicular to the substrate 110, and is in a third position. A glow discharge is performed between the target 242 and the base 212 to form a hydrogen-containing diamond-like carbon layer 160 on the combined layer 150 of tantalum carbide and carbon. During the sputtering process, the substrate 110 can be rotated to deposit a relatively uniform hydrogen-containing diamond-like carbon layer 160 on the surface of the tantalum carbide-carbon combination layer 150. The rotation speed may be 10 to 200 rpm, preferably 20 to 80 rpm. And controlling the sputtering time, the thickness of the hydrogen-containing diamond-like carbon layer 160 is 20 to 3000 nm, preferably 100 to 2000 nm.

經過上述製程,最終得到於基材110上形成有一鉻層或矽化鉻層120,一矽層130,一碳化矽層140,一碳化矽與碳之組合層150,以及一含氫類鉆碳層160之具有多層鍍膜之模具100。After the above process, a chromium layer or a chromium telluride layer 120, a tantalum layer 130, a tantalum carbide layer 140, a combined layer 150 of tantalum carbide and carbon, and a hydrogen-containing carbon layer are formed on the substrate 110. A mold 100 having a multi-layer coating of 160.

本實施例所提供之具有多層鍍膜之模具100藉由於基材110上形成一鉻層或矽化鉻層120以及一矽層130,可增強後續鍍層與基材110之附著性;最外層選用含氫類鉆碳材,可有效增強模具100之脫膜性;另,碳化矽具有較強之硬度,中間採用一碳化矽層140及一碳化矽與碳之組合層150,可增強模具100之耐磨性。The mold 100 having the multi-layer coating provided by the embodiment can enhance the adhesion of the subsequent plating layer to the substrate 110 by forming a chromium layer or a chromium telluride layer 120 and a tantalum layer 130 on the substrate 110; the outermost layer is made of hydrogen. The diamond-like carbon material can effectively enhance the release property of the mold 100; in addition, the tantalum carbide has a strong hardness, and a carbonized tantalum layer 140 and a combination layer 150 of tantalum carbide and carbon are used in the middle to enhance the wear resistance of the mold 100. Sex.

綜上所述,本發明確已符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施例,舉凡熟悉本案技藝之人士,於援依本案發明精神所作之等效修飾或變化,皆應包含於以下之申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art of the present invention should be included in the following claims.

模具...100Mold. . . 100

基材...110Substrate. . . 110

鉻層或矽化鉻層...120Chrome layer or chrome layer. . . 120

矽層...130Layer of enamel. . . 130

碳化矽層...140Carbide layer. . . 140

組合層...150Combination layer. . . 150

含氫類鉆碳層...160Hydrogen-like carbon layer. . . 160

濺鍍裝置...200Sputtering device. . . 200

腔室...210Chamber. . . 210

底座...212Base. . . 212

固定裝置...214Fixtures. . . 214

靶材...222、232、242Target. . . 222, 232, 242

射頻電源...224、234、244RF power supply. . . 224, 234, 244

偏置電源...250Bias power supply. . . 250

抽氣口...260Pumping port. . . 260

氣體輸入口...270Gas inlet. . . 270

第一圖係本實施例所提供之具有多層鍍膜之模具之示意圖。The first figure is a schematic view of a mold having a multi-layer coating provided by this embodiment.

第二圖係本實施例中形成該具有多層鍍膜之模具之裝置示意圖。The second drawing is a schematic view of the apparatus for forming the mold having the multi-layer coating in this embodiment.

模具...100Mold. . . 100

基材...110Substrate. . . 110

鉻或矽化鉻層...120Chrome or chrome layer. . . 120

矽層...130Layer of enamel. . . 130

碳化矽層...140Carbide layer. . . 140

組合層...150Combination layer. . . 150

含氫類鉆碳層...160Hydrogen-like carbon layer. . . 160

Claims (10)

一種具有多層鍍膜之模具,包括一基材,以及於該基材上依次形成之一鉻層或矽化鉻層,一矽層,一碳化矽層,一碳化矽與碳之組合層及一含氫類鑽碳層。A mold having a multi-layer coating, comprising a substrate, and sequentially forming a chromium layer or a chromium telluride layer, a tantalum layer, a tantalum carbide layer, a combined layer of tantalum carbide and carbon, and a hydrogen containing layer on the substrate Drilling carbon layer. 如申請專利範圍第1項所述具有多層鍍膜之模具,其中,該基材之材質選自鐵碳鉻合金、鐵碳鉻鉬合金、鐵碳鉻矽合金、鐵碳鉻鎳鉬合金、鐵碳鉻鎳鈦合金、鐵碳鉻鎢錳合金、鐵碳鉻鎢釩合金、鐵碳鉻鉬釩合金以及鐵碳鉻鉬釩矽合金。The mold having a multi-layer coating according to claim 1, wherein the material of the substrate is selected from the group consisting of iron carbon chromium alloy, iron carbon chromium molybdenum alloy, iron carbon chromium niobium alloy, iron carbon chromium nickel molybdenum alloy, iron carbon. Chromium nickel titanium alloy, iron carbon chromium tungsten manganese alloy, iron carbon chromium tungsten vanadium alloy, iron carbon chromium molybdenum vanadium alloy and iron carbon chromium mo 如申請專利範圍第1項所述具有多層鍍膜之模具,其中,所述鉻層或矽化鉻層之厚度範圍為2~8奈米。The mold having a multi-layer coating according to claim 1, wherein the chromium layer or the chromium telluride layer has a thickness ranging from 2 to 8 nm. 如申請專利範圍第3項所述具有多層鍍膜之模具,其中,所述鉻層或矽化鉻層之厚度範圍為4~6奈米。The mold having a multi-layer coating according to claim 3, wherein the chromium layer or the chromium telluride layer has a thickness ranging from 4 to 6 nm. 如申請專利範圍第1項所述具有多層鍍膜之模具,其中,所述矽層之厚度範圍為2~8奈米。The mold having a multi-layer coating according to claim 1, wherein the thickness of the enamel layer ranges from 2 to 8 nm. 如申請專利範圍第5項所述具有多層鍍膜之模具,其中,所述矽層之厚度範圍為4~6奈米。The mold having a multi-layer coating according to claim 5, wherein the thickness of the ruthenium layer ranges from 4 to 6 nm. 如申請專利範圍第1項所述具有多層鍍膜之模具,其中,所述碳化矽層及碳化矽與碳之組合層之厚度範圍均為20~100奈米。The mold having a multi-layer coating according to the first aspect of the invention, wherein the tantalum carbide layer and the combined layer of tantalum carbide and carbon have a thickness ranging from 20 to 100 nm. 如申請專利範圍第7項所述具有多層鍍膜之模具,其中,所述碳化矽層及碳化矽與碳之組合層之厚度範圍均為40~80奈米。The mold having a multi-layer coating according to claim 7, wherein the tantalum carbide layer and the combined layer of tantalum carbide and carbon have a thickness ranging from 40 to 80 nm. 如申請專利範圍第1項所述具有多層鍍膜之模具,其中,所述含氫類鉆碳層之厚度範圍為20~3000奈米。The mold having a multi-layer coating according to claim 1, wherein the hydrogen-containing carbon layer has a thickness ranging from 20 to 3000 nm. 如申請專利範圍第9項所述具有多層鍍膜之模具,其中,所述含氫類鉆碳層之厚度範圍為100~2000奈米。The mold having a multi-layer coating according to claim 9, wherein the hydrogen-containing carbon layer has a thickness ranging from 100 to 2,000 nm.
TW94142524A 2005-12-02 2005-12-02 A multilayer coating mold TWI386495B (en)

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JPH05169459A (en) * 1991-12-24 1993-07-09 Sumitomo Electric Ind Ltd Mold for resin or rubber, part of resin or rubber molding apparatus and method for molding resin or rubber
TW520402B (en) * 2000-02-03 2003-02-11 Metal Ind Res & Dev Ct A method for processing a low sticking surface of an article
TW583322B (en) * 2001-11-28 2004-04-11 Metal Ind Res & Dev Ct Coating with low sticking and low friction coefficient on a surface of workpiece
CN1239417C (en) * 2003-04-28 2006-02-01 鸿富锦精密工业(深圳)有限公司 Die assembly for producing optical glass products and manufacturing method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05169459A (en) * 1991-12-24 1993-07-09 Sumitomo Electric Ind Ltd Mold for resin or rubber, part of resin or rubber molding apparatus and method for molding resin or rubber
TW520402B (en) * 2000-02-03 2003-02-11 Metal Ind Res & Dev Ct A method for processing a low sticking surface of an article
TW583322B (en) * 2001-11-28 2004-04-11 Metal Ind Res & Dev Ct Coating with low sticking and low friction coefficient on a surface of workpiece
CN1239417C (en) * 2003-04-28 2006-02-01 鸿富锦精密工业(深圳)有限公司 Die assembly for producing optical glass products and manufacturing method thereof

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