TWI226590B - Method of temperature increase identification for electronic component - Google Patents
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χ226590 五、發明說明(1) 發明所屬之技術領域 本發明係有關於 先前技術: 隨著科 漸提昇。對 I的無塵室 貴’因此不 期條件進行 Α施的設置 現有的 之偵測,即 護系統或消 防警報與滅 ^ ’習知技 系統,例如 t偵測系統 影像監測辨 %像攝影等 先期提早預 然而, 統多半係以 使用上仍然 通常, 技的進步, 於某些特定 而言,其内 僅要能先期 即時應變的 曰益重要。 火災防護系 火災發生之 防設施的感 火等動作。 術中已採用 中華民國專 」以及公告 識方法」等 方式,對特 防的效果。 上述習知的 影像辨識的 有其不便之 一般房屋或 種電氣元件溫昇辨識分類方法。 人類對於各種災害防護的要求也曰 地點,例如精密實驗室戒半導體廠 的儀器設備或工件材料通常成本昂 發現火災,同時更必須對火災的先 目的。因此,火災防護系統與消防 統或消防設施, 後產生煙霧及高 測器位置,使其 針對上述被動式 紅外線熱影像整 利公告第4 6 6 1 0 7 第47622 1號之「 專利,均已提出 定區域進行主動 紅外線熱影像整 方式來進行溫昇 處’以下加以說 密閉場所若未放 多半都屬於 溫.,傳達到 作動後,才 火災防護系 合型的偵測 號之「紅外 利用熱影像 使用如紅外 監控,以得 被動式 火災防 進行消 統的缺 或監控 線熱影 進行之 線等熱 到火災 合型偵測或監控 的偵阀與監控, 明之。 置高熱源或易燃χ226590 V. Description of the invention (1) Technical field to which the invention belongs The present invention relates to the prior art: As the subject gradually improves. The clean room of I is expensive. Therefore, it is expected that the existing detection is set, that is, the protection system or the fire alarm and extinguishing system. ^ The conventional technology system, such as the t-detection system, image monitoring, identification, image photography, etc. Advance early. However, most of the systems are still usually used. Advances in technology are, in some specific terms, only important to be able to respond immediately in advance. Fire protection system Actions such as fire detection in fire prevention facilities. During the operation, the methods of the Republic of China and the method of public notice have been adopted to prevent special effects. The conventional image recognition has its inconveniences, such as general house or electrical component temperature rise recognition classification method. Human requirements for various disaster protection are also called locations, such as precision laboratories or semiconductor factory equipment or workpiece materials are often costly to detect a fire, and the primary purpose of the fire must be the first purpose. Therefore, the fire protection system and the fire control system or fire protection facilities generate smoke and the position of the high-level detector, so that they can respond to the above-mentioned passive infrared thermal image straightening announcement No. 4 6 6 1 0 7 47622 1 Active infrared thermal imaging in a fixed area to adjust the temperature rise. Below, it is said that the closed place is mostly warm if it is not placed. It is communicated to the fire protection system and the detection number of "Infrared use thermal imaging" Use detection valves and monitors such as infrared monitoring, passive fire prevention to eliminate the lack of control, or monitoring lines to perform thermal imaging to the fire detection or monitoring, and make it clear. Set a high heat source or flammable.
0718-9097TWF(N1);10910008;calvin.ptd 12265900718-9097TWF (N1); 10910008; calvin.ptd 1226590
品時,最容易發生火災的# 路元件等部位。㉙言 最常見的因素多半係因通電 旦實驗室内產生煙霧時,即 或電路元件已經接近燃燒起 災,然而,當煙霧開始產生 燃燒條件已經具備,因此火 生,容易應變不及;且即便 作’但儀器設備或其工件材 或損毁等狀況,影響所及, 害。 此時,若使用上述習知 監控系統來進行密閉空間的 偵測的標準值,使得儀器設 度尚未到達標準值之前,即 實驗室或半導體廠房之中, 高溫或低溫狀態下進行,所 同,且各有不同的操作安全 的溫度必然遠南於一般電氣 程下所使用的某些特定元件 變質,甚至產生燃燒反應。 系統進行偵測,不但溫度偵 偵測或監控系統產生警示動 起因為何,甚至容易產生誤 份’通常是在其電力系統或電 不考慮特殊場合時,火災發& 而造成的情況。舉例而言,一 可能表示儀器設備的電力系統 火點,雖然此時並未發生火 時,即表示溫度已到達燃點, 災可能在極短的時間内隨時發 在第一反應時間内進行滅火動 料仍然可能因高溫而產生變質 可能足以造成無法彌補的災、_ 的紅外線熱影像整合型偵測或 溫度偵測,雖然可以設定溫度 備的電力系統或電路元件之溫 先進行警示動作。然而,精密 某些實驗或製程可能在特定的 使用的電子元件其燃點各不相 溫度範圍;舉例而言,加熱器 元件或裝置的溫度,而低溫製 則可能在常溫左右的溫度即會_ 此時,若以紅外線偵測或監& 測的標準值不易決定,而且在 作時,也不易辨別溫度異常的 判’無法正確辨識高溫的起因Parts, etc., which are most prone to fire during production. The most common factors are presumably due to the generation of smoke in the electrical laboratory, that is, the circuit components are close to burning and disaster. However, when the smoke begins to generate combustion conditions, the fire is easy to react to; 'But the condition of the equipment or its workpiece materials or damage, etc., affects and harms. At this time, if the above-mentioned conventional monitoring system is used to perform the standard value of the detection of the closed space, so that the setting of the instrument has not reached the standard value, that is, in a laboratory or a semiconductor factory, under high or low temperature conditions, the same, And each has a different operating safety temperature, which must be far south than some specific components used in general electrical processes, and even produce combustion reactions. The system performs detection, not only the temperature detection detection or monitoring system generates a warning, but also is prone to errors. It is usually caused by a fire & when its power system or power does not consider special occasions. For example, one may indicate the fire point of the electrical system of the equipment. Although no fire occurs at this time, it means that the temperature has reached the ignition point. The disaster may be fired in the first reaction time at any time within a very short time. The material may still be deteriorated due to high temperature, which may be enough to cause irreparable disasters. Infrared thermal image integrated detection or temperature detection, although the temperature of the power system or circuit components can be set to warn first. However, some experiments or processes may be precise in the specific use of electronic components with different ignition temperatures; for example, the temperature of a heater element or device, while the low temperature system may be around normal temperature. When the standard value of infrared detection or monitoring is not easy to determine, and it is difficult to distinguish the temperature abnormality during operation, the cause of high temperature cannot be identified correctly.
〇718-9097TWF(Nl);l〇91〇〇〇8;calvin.ptd 第7頁 1226590 --—-- 五、發明說明(3) ϊίίί!”期反應,或是實驗或製程中位於操作安全 /皿度轭圍的電氣元件之正常反應。 韦作女王 發明内容: 辨气’本發明之目的在於提供一種電氣元件溫昇 以改良’針對電氣元件的溫昇分類法則,將i; 類分為失效類別與失效嚴重性等兩類“ 2貝3,如此可更容易地對電氣元件因溫 ^ 失效等狀況以及其嚴重性進们貞測。 1生異韦或 特定氣元?溫昇辨識分類方法,係對所價測之( 像資j:並將j電氧7°件預先建立其不同溫度狀態的影 ^貝=並將廷些影像資料參數化後,存放於一參數資 犀之中。如此,在以紅外線熱影像整合型偵測 偵測特定空間日寺’即可將熱影像轉換皿:將达 =應參數與參數資料庫中之參數值加以比對,而以 像中各區之溫度分佈係對應於何種電氣〇718-9097TWF (Nl); 1091〇〇〇8; calvin.ptd Page 7 1226590 ----- V. Description of the invention (3) ϊίί! ”Phase reaction, or it is located in the operation or safety during the experiment or process / The normal response of electrical components surrounded by a yoke. Queen Zuo's invention: Distinguishing gas' The purpose of the present invention is to provide a temperature rise of electrical components to improve the classification of the temperature rise of electrical components. Failure category and failure severity are two types: "2" and "3", so that it is easier to test the electrical components due to temperature ^ failure conditions and their severity. 1 different Weiwei or specific gas element? The temperature rise identification classification method is based on the measured value (such as image j: and the 7 degrees of oxygen and oxygen components in advance to establish their different temperature states ^ shell = parameter parameters, and then stored in a parameter In this way, the thermal image can be converted into a specific space by detecting infrared temples in a specific space using infrared thermal image integrated detection: compare the parameter values in the parameter and parameter database, and use What kind of electrical distribution does the temperature distribution of each zone in the image correspond to?
件之溫昇辨識結果。 仟乂及電乳7L 本發明揭示一種電氣元件溫昇辨識分類方法,包 列步Ί先,提供複數電氣元件;其次,擷取電氣看 對應於複數熱狀態之複數熱影像資料,並將這些敎影像 料進行影像處理,而得到對應之複數熱特徵資料*,、其中 &電瑕《 7L件之熱狀態中之至少一者係屬於溫昇劣化熱狀 悲;然後,擷取一特定區域之特定熱影像,進行影像處Identification result of temperature rise of parts.仟 乂 和 电 乳 7L The present invention discloses a method for identifying and classifying the temperature rise of electrical components. First, it provides a plurality of electrical components. Second, it acquires electrical thermal image data corresponding to a plurality of thermal states, and converts these 敎The image material is subjected to image processing to obtain corresponding plural thermal characteristic data *, and at least one of the thermal states of the & electric flaw "7L pieces belongs to the thermal rise and degradation heat state; then, a specific area is extracted Specific thermal image
0718-9097TWF(Nl);10910008;calvin.ptd 1226590 五、發明說明(4) ,其中 將特定 到該特 分類方 高溫度 如溫度 特定熱 用類神 主軸分 糊集合 該特定區域係具有 熱特徵資料與所有 定區域之溫昇辨識 法中,熱特徵資料 資料以及溫度分佈 分佈形狀資料以及 特徵資料與熱特徵 經網路之多層分類 析(Principal (Fuzzy Set )等 徵和優點能更明顯 並配合所附圖式做 理,得到對應之特定熱特徵資 電氣元件中之至少一者;最後^ 熱特徵資料進行分類比對,以〜 結果。 传 本發明之電氣元件溫昇辨識 可包含失效嚴重性資料(例如最 範圍資料)與失效類別資料(_ 三維溫度映射資料。)另外,^ 資料進行分類比對之動作,可採 (Multi-layer Perception ) > Component Analysis )模式或模 方法。 、 的、特 施例, 為使本發明之上述及其他目 易懂,下文特舉一具體之較佳實 詳細說明。 實施方式: 請參見第1圖與第2圖,說明本發明之 識分類方法之流程。本發明之電氣元件溫昇辨識八:昇辨 :應:Γ二紅外線熱影像整合型監控偵測系 用’例如第1圖即顯示_紅外線熱影像整使 統。 玉i控偵測系 第1圖中,熱影像或煙霧影像係使用一 20 (例如一紅外線攝影機)來進行擷取、作°裝置 切作。影像擷取 0718-9097TlVF(Nl);l〇91〇〇〇8;calvin.ptd 第9頁 1226590 五、發明說明(5) 裝置20所偵測之一特定區域擷取其特定之影像,例如紅外 線之熱影像或一般可見光影像,會送至影像處理辨識裝置 10以進行轉換與比對的動作❶另外,影像擷取裝置2〇可具 有一調整裝置210 ,用以調整其偵測之特定區域的範圍, 以使影像擷取裝置20可進行移動或旋轉等調整動作,而使 偵測之特定區域涵蓋較大的範圍,並減少無法偵測的死 角。 影像處理辨識裝置10通常係設置在一電腦主機,飼服 =其他適纟的處理器π,或設置成一控制晶片的型式。 ,第1圖所示’影像處理辨識裝置1〇可具有一影像處理模 :且10、一影像辨識比對模組120、一判斷模組130以及一 制模組140。影像擷取控制模組140係用以控制 jm?0之動作。影像處理模組110係用以接收影 ==所榻取的影像信號,並進行影像處理,而產 有的相關資料。影像辨識比對模組120中具 有二特破資料庫125,儲存預先建立的複數熱 使得影像辨識比對模組丨2 〇接收經由:媼 ’ 杆旦彡偾♦饰a〜 侵叹、!田衫像處理模組1 1 〇所進 灯〜像處理後仔到的相關資料後 的熱特徵資料進行比對並進行影像辨識貝枓庫125中 本發明之電氣元件溫昇辨識分類 識常用的電氣元件在、、w择戶一政^ 主要係用以辨 在進杆雷潜_I在酿度昇咼時所可能產生的問題,因此 ,進仃電軋70件溫昇辨識分類之前,必須 數電氣元件(步驟Sip)。 、 八吊見的複 電乳兀件的種類眾多,包含有輸配電元件、控制元 第10頁 0718-9097TTVF(Nl);l〇91〇〇〇8;calvin ptd 12265900718-9097TWF (Nl); 10910008; calvin.ptd 1226590 V. Description of the invention (4), in which the high temperature such as the temperature of the special classification is specified, and the god-like spindle is used to paste the specific area. The specific area has thermal characteristics data In the identification method of temperature rise in all fixed regions, the characteristics and advantages of thermal characteristic data and temperature distribution distribution shape data as well as the characteristic data and thermal characteristics via the network's multilayer classification analysis (Principal (Fuzzy Set)) can be more obvious and cooperate with all The drawings are processed to obtain at least one of the corresponding specific thermal characteristics of the electrical components; finally, the thermal characteristics data are classified and compared, and the result is ~. The identification of the temperature rise of the electrical components of the present invention may include failure severity data. (For example, the most range data) and failure category data (_ 3D temperature mapping data.) In addition, ^ data can be classified and compared by using the Multi-layer Perception > Component Analysis mode or method. In order to make the above and other objects of the present invention comprehensible, a specific preferred detailed description is given below. Embodiment: Please refer to FIG. 1 and FIG. 2 to describe the process of the recognition classification method of the present invention. Identification of the temperature rise of the electrical components of the present invention 8: Identification: Response: Γ Two infrared thermal image integrated monitoring and detection systems ′ For example, the first picture is displayed_infrared thermal image system. Jade control detection system In the first picture, a thermal image or a smoke image is captured using a 20 (for example, an infrared camera) and cut as a ° device. Image capture 0718-9097TlVF (Nl); 10910.08; calvin.ptd Page 9 1226590 V. Description of the invention (5) A specific area detected by the device 20 captures a specific image, such as infrared The thermal image or general visible light image will be sent to the image processing identification device 10 for conversion and comparison. In addition, the image capture device 20 may have an adjustment device 210 for adjusting the specific area it detects. The range allows the image capture device 20 to perform adjustments such as movement or rotation, so that the specific area detected covers a larger area, and reduces undetectable dead angles. The image processing and identifying device 10 is usually set on a computer host, and the feeding service = other suitable processors π, or a control chip. The image processing identification device 10 shown in FIG. 1 may have an image processing module: 10, an image identification comparison module 120, a determination module 130, and a manufacturing module 140. The image capture control module 140 is used to control the motion of jm? 0. The image processing module 110 is used to receive the image signals obtained by the image processing, and perform image processing, and produce relevant data. The image recognition and comparison module 120 has two special broken databases 125, which store the pre-established complex heat to make the image recognition and comparison module 丨 2 〇Receive via: 杆The T-shirt image processing module 1 1 10 enters the lamp ~ the thermal characteristic data after the relevant data obtained after the image processing are compared and the image is identified. The temperature rise identification and classification of the electrical components of the present invention in the beijing library 125 are commonly used. The electrical components are selected by one household and one government ^ It is mainly used to identify the problems that may occur during the advancement of the thunder potential _I when the degree of brewing is increased. Therefore, before the classification of 70 pieces of temperature rise in the electric rolling must be identified, Count electrical components (step Sip). There are many types of complex electric milk components, including power transmission and distribution components and control elements. Page 10 0718-9097TTVF (Nl); 1091〇〇8; calvin ptd 1226590
五、發明說明(6) 件、保護元件、以及量測元件等四類。由於本 識常用的電氣元件在溫度昇高時所可能產生的問韻’,、二辨 可將電氣7〇件依其熱源產生方式以及阻隔狀態來八此 見的電氣元件之熱源產生方式可分為單一熱源、;:、:常 三熱源、以及多熱源等四種,若再考慮單一熱源3 、 界有阻,,或是熱源之間的接觸,則可細分為下'二八^外 1 ·單熱源無阻隔··如電阻、加熱器、比壓、、 笠。 时比流器 2· f熱源有阻隔:如開關、繼電器、變壓器等。 3. 單熱源接點:如電容接點、開關接點、加熱器接點 4. 雙熱源tl件··如雙燈座、雙錶座等。 5·雙熱源線路:如單相使用線路、相位不平衡線路5. Description of the invention (6) There are four categories, such as pieces, protection elements, and measuring elements. Due to the possible rhyme of the electrical components commonly used in the knowledge when the temperature rises, the two methods can be divided into 70 electrical components according to their heat source generation method and block state. There are four types of heat sources: single heat source, constant heat source, and multiple heat sources. If you consider the single heat source 3, the boundary is blocked, or the contact between heat sources, it can be subdivided into the following two sources: · Single heat source without barrier ·· such as resistance, heater, specific pressure, 、. The current source 2 · f is blocked by heat sources: switches, relays, transformers, etc. 3. Single heat source contact: such as capacitor contact, switch contact, heater contact 4. Double heat source tl ... · such as double lamp holder, double meter holder, etc. 5 · Dual heat source line: such as single-phase line, phase unbalanced line
第11頁 1226590 五、發明說明(7) 怨,在溫昇劣化熱妝… 度過高,但可能巳鈐怨的電氣兀件並不見得產生煙霧或溫 能產生劣化現象。^因為溫度的上昇而使得電氣元件的效 可能也不相同,因於不同的電氣元件,其溫昇劣化現象 的熱狀態組合。 必須針對不同的電氣元件而選擇不同 然後,這些電$ 一 置1 0進行影像處理虱70 =的熱影像資料由影像處理辨識裝 S30) ’並存放於特徵而:到複數熱特徵資料(步驟 特徵資料可包含失效、番4庫^25中以供辨識比對之用。熱 效嚴重性資料一般# ^,料與失效類別資料兩種。失 最高溫度資料以及;;元:溫昇劣化的程度,例如 通常是顯現電氣元件工:、w ::料;而失效類別資料則 分佈形狀資料以及三牛= 現象的模式,例如溫度 更性貝料與失效頰別資料的組合糟由失效嚴 一電氣元件產生一 έΡ 了對不同熱狀態之每 、、且獨特的熱特徵資料。 ’ 接者,即可依步驟S2〇以及S3〇之 件的一特定區域擷取一特 2作,對具有電氣元 影像處理’得到對應之特定熱,並進行 時,並不需特別指明特定區域中所右的(v驟%0 )。此 何。 有的電氣元件分别為 最後’將特定熱特徵資料與欠 熱特徵資料進行分類比對,以得到=二庫1 2 5中的所有 果(步驟S60 )。以下說明分類比對、之1區域之溫昇辨識結 徵資料與熱特徵資料進行分類比對 作。將特定熱特 $立模式動作,可採Page 11 1226590 V. Description of the invention (7) Resentment, deterioration of hot makeup during temperature rise ... Excessive, but electrical components that may be resentful do not necessarily produce smoke or degradation of temperature. ^ Electrical components may have different effects due to temperature rise. Due to different electrical components, the thermal state combination of temperature rise and degradation phenomena. Must choose differently for different electrical components. Then, set the electricity to 10 for image processing. The thermal image data is identified by the image processing device (S30) 'and stored in the feature: to the multiple thermal feature data (step feature The data may include failures, Pan 4 library ^ 25 for identification and comparison. The thermal efficiency severity data is generally # ^, data and failure category data. Lost maximum temperature data and;; Yuan: the degree of temperature rise degradation , For example, it usually shows electrical components :, w :: material; and the failure category data is distributed shape data and three cattle = phenomenon patterns, such as the combination of temperature change material and failure cheek data. The component generates a unique thermal characteristic data for each of the different thermal states. 'Then, a special operation can be extracted according to a specific area of steps S20 and S30, and the electrical components The image processing 'gets the corresponding specific heat, and it is not necessary to specify the right (v step% 0) in the specific area when performing the process. Some electrical components are the last' to specify the specific thermal characteristics. Classify and compare the data with the underheating characteristic data to obtain all the fruits in the second library 1 2 5 (step S60). The classification and comparison will be described below, and the temperature rise identification knot data and thermal characteristic data in area 1 will be classified. By comparison, you can use a specific hot special mode to operate.
_-9。9 而_-9. 9 while
S Ϊ226590 五、發明說明(8) 用類神經網路之多層分類(Multi-layer Perception)、 主車由分析(Principal Component Analysis)模式或模糊 集合(Fuzzy Set )等方法,以取得各熱影像圖之特徵為 輪入模式,而電氣元件的分類原則為輸出模式,由此輸入 輪出之間所建立的模式,即可尋求其最佳化參數。 請再參見第3A圖以及第3B圖,以一範例說明本發明之 電氣元件溫昇辨識分類方法中影像辨識分類的動作。S Ϊ226590 V. Description of the invention (8) Use methods such as Multi-layer Perception of neural network, Principal Component Analysis mode or Fuzzy Set to obtain each thermal image map It is characterized by a turn-in mode, and the classification principle of electrical components is an output mode. From this, the model established between the input and output can be sought for its optimized parameters. Please refer to FIG. 3A and FIG. 3B again, and use an example to describe the operation of image recognition and classification in the method for identifying and classifying the temperature rise of electrical components according to the present invention.
第3 A圖係顯示一組電氣元件,由(a )至(f )分別為不同 之角度及遠近距離所拍攝之熱影像資料。由於一熱影像之 中’通常會具有不只一個的區域高溫,因此在進行影像處 理時,須先進行平滑化(Smoothing)處理後,再進行乂軸 或γ軸投射或數值方法等動作,如此即可取得高溫區域之 位置,而得到最高溫度資料以及溫度分佈範圍資料。 另外,電氣 其三維立體之角 度分佈形狀資料 元件,則會依外 料。因此,一般 變異量後,進行 進行映射(Mapp 三維溫度映射資 影像資料,其背 3B圖之(a)至(f ) 兀仵之熱y刀佈,會受到其是否具有阻隔 度所影響。無外殼阻隔之電氣元件,其 y由可見光直接得到,但若有外殼之電 殼之散熱條件而影響其溫度分佈形狀資 必須先獲取熱影像資料中的溫度平均值 去除背景溫度的動作,並以模糊邏輯方Figure 3A shows a group of electrical components, from (a) to (f), the thermal image data taken at different angles and distances. In a thermal image, there are usually more than one area with high temperature. Therefore, when performing image processing, smoothing (Smoothing) must be performed first, then Z axis or γ axis projection or numerical methods should be performed. The position of the high temperature area can be obtained, and the maximum temperature data and temperature distribution range data can be obtained. In addition, the three-dimensional angular distribution shape data element of Electric will be based on unexpected data. Therefore, after the general amount of variation, mapping (Mapp 3D temperature mapping image data, the hot y knife cloth of (a) to (f) of the vulture on the back of the 3B figure, will be affected by whether it has a barrier degree. None The electrical component of the enclosure is directly obtained by visible light, but if the heat dissipation condition of the enclosure has influence on its temperature distribution shape, the temperature average value in the thermal image data must be obtained first to remove the background temperature and blur it. Logical party
1 ng )動作,取得溫度分佈形狀資料以方 料、。藉由上述影像處理後的電氣元件之 厅、1度均已去除,且經過映射動作,如 所示。 在此必須說明5 由於衫像處理與辨識的技術日新月1 ng) operation to obtain the temperature distribution shape data for the purpose of calculation. The hall and 1-degree electrical components have been removed after the above image processing, and they have been mapped as shown below. It must be explained here because of the new technology of shirt processing and identification
l22659〇 五 L、發明說明(9) ^ -------- 異 , gj . 上述每本發明所使用的影像處理與辨識技術並不受限於 技術。例中所述之形式,而可應用其他適當之影像處理 非用以限ΐ:::以二較佳實施例揭露如i,然其並 ::之精神和範圍内,仍項技藝者,在不脫離本發 明之保護範圍當視後附之申乍二=的更動與潤飾,因此本發 之申μ專利範圍所界定者為準。l22659〇 5 L. Description of the invention (9) ^ -------- Different, gj. The image processing and identification technology used in each of the above inventions is not limited to technology. In the form described in the example, other appropriate image processing can be applied. It is not limited. ::: The two preferred embodiments are used to expose such as i, but within the spirit and scope of ::, they are still skilled in the art. Without departing from the scope of protection of the present invention, the modifications and retouching of Shen Zairi = will be deemed as appended, so what is defined in the patent scope of this application shall prevail.
0718-9097TWF(Nl);10910008;calvin.ptd 第14頁 1226590 圖式簡單說明 第1圖係顯示紅外線熱影像整合型監控偵測系統之一 例的示意圖。 第2圖係顯示本發明之電氣元件溫昇辨識分類方法的 流程圖。 第3 A圖係顯示本發明之電氣元件未經影像處理之熱影 像資料之示意圖。 第3B圖係顯示本發明之電氣元件經影像處理後之熱影 像資料之不意圖。0718-9097TWF (Nl); 10910008; calvin.ptd Page 14 1226590 Brief Description of Drawings Figure 1 is a schematic diagram showing an example of an infrared thermal image integrated monitoring and detection system. Fig. 2 is a flowchart showing a method for identifying and classifying the temperature rise of an electrical component according to the present invention. Figure 3A is a schematic diagram showing the thermal image data of the electrical component of the present invention without image processing. Figure 3B shows the intention of the thermal image data of the electrical component of the present invention after image processing.
符號說明: I 0〜影像處理辨識裝置; II 0〜影像處理模組; 1 2 0〜影像辨識比對模組; 1 2 5〜特徵資料庫; 1 3 0〜判斷模組; 1 4 0〜影像擷取控制模組; 20〜影像擷取裝置; 2 1 0〜調整裝置。Explanation of symbols: I 0 ~ image processing identification device; II 0 ~ image processing module; 1 2 0 ~ image identification comparison module; 1 2 5 ~ feature database; 1 3 0 ~ judgment module; 1 4 0 ~ Image capture control module; 20 ~ image capture device; 2 10 ~ adjustment device.
0718-9097TWF(Nl);10910008;calvin.ptd 第15頁0718-9097TWF (Nl); 10910008; calvin.ptd Page 15
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