TW508644B - Die bonding device - Google Patents
Die bonding device Download PDFInfo
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- TW508644B TW508644B TW090128634A TW90128634A TW508644B TW 508644 B TW508644 B TW 508644B TW 090128634 A TW090128634 A TW 090128634A TW 90128634 A TW90128634 A TW 90128634A TW 508644 B TW508644 B TW 508644B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
- Y10T156/1702—For plural parts or plural areas of single part
- Y10T156/1744—Means bringing discrete articles into assembled relationship
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
- Y10T156/1798—Surface bonding means and/or assemblymeans with work feeding or handling means with liquid adhesive or adhesive activator applying means
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53187—Multiple station assembly apparatus
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
508644 五、發明說明(l) 【發明領域】 本發明係有關於一種黏晶裝置,尤關於一種可使美板 於黏晶程序中保持基板平整性、及提高單位時間產量二為 晶裝置。 > 【習知技術】 黏晶是I C封裝製程中十分重要的程序之一,其係將晶 圓(wafer)切割後的晶粒(die)取出並黏著固定於美板、曰曰 (substrate)上,以提供後續銲線(wlre b〇nding)土、及封 膠(molding)等程序。隨著封裝技術的發展與製程技術的 進步’封裝構造之體積是越來越輕、薄、短、小,為因應 此一趨勢,晶粒之尺寸係越大、且其厚度係越薄,另外, 與其訊號連接之基板厚度亦是越來越薄,例如目前基板的 厚度已發展至0· 26mm以下之超薄基板。 如圖1所不,習知黏晶裝置3 〇 〇主要包括有一點膠機構 30\、、一晶粒取放機構(圖中只示出其中之機械臂)30 2、及 一壓合機構3 0 4。其中,點膠機構3 〇 j係用以點滯銀膠 (silver paste)311於基板3 0 3上;晶粒取放機構3〇2則於 銀膠311點滯完成後,將晶粒312一顆一顆地取放於基板 30 3上由於基板在進行黏晶(die bonding)程序前, 品先丸、烤基板’以去除基板中之濕氣(m 〇丨s t u r e),但基板 3 0 3=過咼溫烘烤之後,由於濕氣的蒸發及熱應力,因此 會&成基板叉熱變形翹曲(warpage ),為使基板於點膠及 置晶的程序中’能保持其平整性,故以壓合機構(圖中只508644 V. Description of the Invention (l) [Field of the Invention] The present invention relates to a crystal sticking device, and more particularly to a crystal sticking device that can maintain the flatness of a substrate in a sticking process and improve the yield per unit time. > [Known technology] Sticking crystal is one of the very important procedures in the IC packaging process. It removes and cuts the die from the wafer and adheres it to the US board and substrate. To provide subsequent procedures such as soil bonding and molding. With the development of packaging technology and the progress of process technology, the volume of packaging structure is becoming lighter, thinner, shorter, and smaller. In response to this trend, the larger the size of the grains, and the thinner the thickness, The thickness of the substrate connected to its signal is also getting thinner. For example, the thickness of the substrate has now developed to ultra-thin substrates below 0.26mm. As shown in FIG. 1, the conventional sticky crystal device 3 00 mainly includes a point glue mechanism 30, a grain pick-and-place mechanism (only the mechanical arm is shown in the figure) 30 2, and a pressing mechanism 3 0 4. Among them, the dispensing mechanism 3 0j is used to dot the silver paste 311 on the substrate 3 03; the grain pick-and-place mechanism 3 02 is to finish the die 312 after the silver paste 311 is finished. Place them one by one on the substrate 303. Before the substrate is subjected to the die bonding process, the product is shot and baked to remove the moisture (m0 丨 sture) from the substrate, but the substrate 3 0 3 = After baking at high temperature, due to the evaporation of moisture and thermal stress, it will & form a substrate fork thermal deformation and warpage (warpage), so that the substrate can maintain its flatness during the process of dispensing and crystal placement. , So the press mechanism (the picture only
508644 五、發明說明(2) 示出其中之壓桿)304或真空吸力以壓住或吸住基板3〇3。 但’當置晶程序完成後’係需將基板3 〇 3放入烤箱中,或 者以後熱(post-heated)加熱法,以烘烤固化(curing)銀 膠311,此時基板3 0 3大多會脫離壓合機構3〇4或解除真 空,因此在此一狀態下,基板3 〇 3即會造成翹曲。 由於基板在進行黏晶程序過程中會造成基板赵曲,因 此縱使於點膠及黏晶過程中,以壓合機構或真空吸力來整 平基板’但當壓力或吸力解除後,基板仍然會恢復翹曲變 形的狀悲,導致銀膠產生緊縮(shrinkage)的現象,以致 於產生孔洞(v 〇 i d ),進而降低產品的可靠度 (reliability)。 因黏晶程序完成後必須要烘烤固化銀膠 又 —— --------- 故必須 將黏有晶粒之基板先放入基板盒中,再送至烤箱中烘烤, 或以後熱加熱方式直接在軌道上加熱以固化銀膠。但是, 不論是以烤箱式或是以後熱(post_heat)加熱法來烘 膠,都必需使基板停滯一段時間,以配合烤箱或機台之作 業’造成時間上的延遲’進而導致單位時間產量的下 因此i如何使基板保持平整,且不會因加熱而其 板之翹曲變形,以及加速黏晶程序的整體 ς 要的課題。 只馬一 $ 【發明概要】 ί ί Γ上述的課題,故本發明之目的係在於提供-種 玎3L免土板於黏晶程序時翹曲變形之黏晶裝置。’、 508644508644 V. Description of the invention (2) Shows the pressure rod) 304 or vacuum suction to hold or hold the substrate 3 03. However, after the process of setting the crystal is completed, the substrate 3 0 3 needs to be placed in an oven, or a post-heated heating method is used to cure and cure the silver glue 311. At this time, the substrate 3 0 3 is mostly It will be released from the compression mechanism 304 or the vacuum will be released, so in this state, the substrate 303 will cause warpage. Because the substrate will cause the substrate to bend during the die-bonding process, even during the dispensing and die-bonding process, the substrate is leveled by a pressing mechanism or vacuum suction. However, when the pressure or suction is released, the substrate will still recover. The shape of warping and deformation leads to the shrinkage of the silver glue, so that holes (v oid) are generated, thereby reducing the reliability of the product. After the sticky crystal process is completed, the silver glue must be baked and cured ----------- Therefore, the substrate with the die must be placed in the substrate box, and then sent to the oven for baking, or later Thermal heating directly heats the silver glue on the track. However, no matter if the glue is baked by the oven or post_heat heating method, the substrate must be stagnated for a period of time to cooperate with the operation of the oven or the machine 'causing a delay in time' and thus leading to a decrease in the output per unit time. Therefore, how to keep the substrate flat without warping and deforming the plate due to heating, and to accelerate the overall process of the die attach process. Ma Mayi $ [Summary of the invention] ί Γ The above-mentioned subject, so the purpose of the present invention is to provide a kind of 黏 3L soil-free plate warping deformation of the sticky crystal device during the sticky crystal process. ’, 508644
目的係在於提供一 種加速黏晶程序 又,本發明之另一 時間之黏晶裝置。 而,本發明係藉由一财 以使基板在黏晶的整個過程 基板產生趣曲變形的現象。 動之輸送機構,其可連續地 供烤固化程序,以提高黏晶 量。 高溫之載具來持續定位基板, 中均能保持其平整性,以避免 此外,本發明更藉由一循環作 進行點膠程序、置晶程序 '及 程序速率,及單位時間之產 因此’為達上述目的,本發明传一 要包括有-輸送機構、一預熱機構:、至; !機構、-晶粒取放機構、及一加 機構: 續作動;該等載具係載置於該輸送機構;:= 係對基板進行烘烤,點膠機構在基板 放-:位;心反上晶粒取放機構在黏著劑點滯處,置 使晶;亚以加熱機構烘烤固化該黏著劑,以 由於本發明之黏晶裝置係以耐高溫之載 二’且該載具係能使該基板保持平整, :二 =為去除濕氣而經過烘烤處理,也不會; 2象,進而導致點滞於基板上之銀膠產生緊縮 而务生孔洞,以致於降低產品的良率。此外,該 一輸送機構所輸送以連續進行點膠、黏晶、及烘二 其中’在銀膠供烤程序中,由於基板係定位於載具I,卫The purpose is to provide an accelerated die attach process and another embodiment of the present invention. However, the present invention uses a lot of money to make the substrate deform in the whole process of sticking the substrate. The moving conveying mechanism can continuously provide the curing process to increase the amount of sticky crystals. The high-temperature carrier can continuously position the substrate, which can maintain its flatness in order to avoid it. In addition, the present invention further performs a dispensing process, a crystal setting process and a program rate through a cycle, and the yield per unit time is therefore To achieve the above-mentioned object, the present invention includes: a conveying mechanism, a preheating mechanism: to;! Mechanism,-grain pick-and-place mechanism, and a plus mechanism: continued operations; these carriers are placed in the Conveying mechanism: == Baking the substrate, the dispensing mechanism is placed on the substrate at the-: position; on the contrary, the crystal picking and placing mechanism is placed at the point where the adhesive stagnates, and the crystal is placed; the heating mechanism is used to bake and solidify the adhesion. Because the sticky crystal device of the present invention is a high-temperature-resistant carrier II, and the carrier system can keep the substrate flat,: II = after baking treatment to remove moisture, it will not; As a result, the silver glue that stagnates on the substrate will shrink and create holes, which will reduce the yield of the product. In addition, the conveying mechanism is used to continuously perform dispensing, sticking, and baking. Among them, in the silver glue supply baking process, since the substrate is positioned on the carrier I, the
508644508644
基板上所點滯之銀膠可以在 言之,在烘烤程序中,不會 板處於停滯的狀態,故可避 位時間的產量。 維持在連續烘烤的狀態下,換 因為烘烤固化銀膠,而需使基 免時間上的延遲,進而増加單 【較佳實施例之詳細說明】 以下將參考相關圖式,說明本發明較佳實施例黏晶裝 如圖2所示,本發明較佳實施例黏晶裝置丨主要包 一輸送機構π、一預熱機構12、一個以上之載呈13、一 膠機構14、一晶粒取放機構15、及一加熱機構16。其中二 ?具13係使基板17能定位於其上,且該等載具⑴系由輸送 機構11所輸送·’預熱機構12係對基板進行預先烘烤,點膠 機構14係在基板上點滯如銀膠141之黏著劑,再由晶粒取/ 放機構15在銀膠141點滯處,置放晶粒151於基板17上,並 以加熱機構16烘烤固化銀膠141,以使晶粒151與基板17電 連接。於此需說明的是,預熱機構丨2、點膠機構丨4、晶粒 取放機構15、及加熱機構16係位於輸送機構丨丨之上方,但 為不意上之便利,則是繪製於輸送機構丨丨的側上方。 如圖3所示,載具1 3之四側係分別設有壓制片丨3工,用 以壓制置於載具13中之基板17,首先將基板η置入載呈13 ,,再以壓制片131沿圖中箭頭所示之方向移動,以使該 等壓制片1 3 1可壓制住基板1 7。此外,載具丨3亦可具複數 個吸孔’其係能產生真空吸力,以使該基板能藉由該等吸In other words, the stagnation of the silver glue on the substrate can be said, in the baking process, the plate will not be in a stagnant state, so the yield can be avoided. Maintaining the state of continuous baking, it is necessary to make the base glue free of time delay due to baking and curing the silver glue, and then add a single order [Detailed description of the preferred embodiment] The following will refer to the related drawings to explain the present invention. As shown in FIG. 2, the sticking crystal device of the preferred embodiment is shown in FIG. 2. The sticking device of the preferred embodiment of the present invention 丨 mainly includes a conveying mechanism π, a preheating mechanism 12, more than one load 13, a glue mechanism 14, a die The pick-and-place mechanism 15 and a heating mechanism 16. The second tool 13 is used to position the substrate 17 on it, and the carriers are transported by the conveying mechanism 11. The preheating mechanism 12 is used to pre-bake the substrate, and the dispensing mechanism 14 is on the substrate. The sticking point is like an adhesive of silver glue 141, and then the grain picking / putting mechanism 15 places the die 151 on the substrate 17 at the point where the silver glue 141 stagnates, and the silver glue 141 is baked and cured by the heating mechanism 16 to The die 151 is electrically connected to the substrate 17. It should be noted here that the preheating mechanism 丨 2, the dispensing mechanism 丨 4, the grain taking and placing mechanism 15, and the heating mechanism 16 are located above the conveying mechanism 丨 丨, but for the sake of convenience, it is drawn on Above the side of the transport mechanism. As shown in FIG. 3, the four sides of the carrier 13 are respectively provided with a pressing sheet 3 for pressing the substrate 17 placed in the carrier 13. First, the substrate n is placed into the carrier 13 and then pressed. The sheet 131 moves in the direction indicated by the arrow in the figure, so that the pressed sheets 1 3 1 can press the substrate 17. In addition, the carrier 3 can also have a plurality of suction holes ’, which can generate a vacuum suction force, so that the substrate can absorb
第7頁 508644 五、發明說明(5) 孔之真空吸力,而使基板17能定位於載且 由耐高溫材料所構成,如埶 :、 载八1 3係 si m m ^ 口〖生之衣虱树脂、聚胺基甲酸 ;再;考上夠, 置放器㈣基板π置放於上且預Λ區Γ係以基板 壓制基板!7於載具13上。::1 機3才壓制片⑶以 複數個滾輪,以使該輸送機構〗丨可沿著水平方向成 動,亦即沿圖2中之箭頭方向循環移動。 °衣 哉且’於預備區U〇中’係將基板17安置於 載具13上,再由輸达機構丨丨輸送而進入下一預 預烤區111係可置放數個載具13,且置於該等載且°|3上之 基板17係一方面由輸送機構u傳送而移動,另一/方面 預熱機構12進行預烤’以使基板17中的水氣可被消除 ',且 使基板Π可-邊供烤-邊進行傳送。由於基板 由 13所壓制,故縱然基板17受高溫烘烤,仍可保持直表面^ 平整,亦即不會產生基板17翹曲變形之現象,且^合 烘烤基板1 7而停滯基板1 7之傳送。 ' 基板17在預烤區111烘烤完畢之後,進入點膠區112。 在此區域中,基板17仍以載具13來定位,亦即以設於載具 1 3四側的壓制片1 3 1壓制住基板1 7,點膠機構丨4係於基板 1 7上用以置放晶粒之區域點上銀膠1 41或其他之黏著劑。 銀膠141點置完畢後,進入置晶區U3,於此區域中广基板 仍繼續置於載具13上,並藉由輸送機構丨丨之作動而^ 動,以使晶粒取放機構1 5可將切割完成之晶粒丨5丨一顆一Page 7 508644 V. Description of the invention (5) The vacuum suction of the holes enables the substrate 17 to be positioned on a load and made of a high temperature resistant material, such as: 埶: 、 8 1 3 series si mm ^ 口 raw clothes louse Resin, polyurethane; again; consider enough, the placement device 够 substrate π is placed on top and the pre-Λ region Γ is the substrate pressing substrate! 7 on the carrier 13. :: The machine 3 only presses the tablet ⑶ with a plurality of rollers, so that the conveying mechanism can move in the horizontal direction, that is, cyclically move in the direction of the arrow in FIG. 2. ° Clothing and 'in the preparatory zone U0', the substrate 17 is placed on the carrier 13, and then transported by the conveyance mechanism 丨 丨 into the next pre-pre-bake zone 111, several carriers 13 can be placed, And the substrate 17 placed on the load 3 ° is moved by the conveying mechanism u on the one hand, and the preheating mechanism 12 performs pre-baking 'so that the moisture in the substrate 17 can be eliminated', And the substrate Π can be transferred while being baked. Since the substrate is pressed by 13, even if the substrate 17 is baked at a high temperature, the straight surface can be maintained ^ flat, that is, the phenomenon of warping and deformation of the substrate 17 does not occur, and the baking substrate 17 is combined with the stagnation substrate 7 Its transmission. 'After the substrate 17 is baked in the pre-baking area 111, it enters the dispensing area 112. In this area, the substrate 17 is still positioned by the carrier 13, that is, the substrate 1 7 is pressed by the pressing sheets 1 3 1 provided on the four sides of the carrier 1 3, and the dispensing mechanism 4 is used on the substrate 17 Use the silver glue 1 41 or other adhesives in the area where the grains are placed. After the silver glue 141 is placed, it enters the crystal placement area U3. In this area, the Zhongguang substrate is still placed on the carrier 13 and is moved by the action of the conveying mechanism 丨 丨 so that the crystal grain picking and placing mechanism 1 5Cut the finished grain 丨 5 丨 One by one
ΙΗ1 第8頁 立 發明說明(6) 顆地置,在點有銀膠141之基板17上。 緊贫地桩人 (CUring),使得晶粒151能夠與基板17 區114中,係置放有數個具有基二 17可二邊循ί it 機構11傳送該等載具13,由於基板 續進行因:二方面又可以加熱機構心 的狀態便可進行烘烤,因此可增加整體之二不 進而提高單位之產量。 s刀正筱之逑度, 此區==固!^呈序完畢之後’進入基板取出區115,於 可:動開來以=四側的壓制片131,係 除。 彳使基板17此猎由牽引器18自載具13中移 接著,去除了基板Π之載具i =广水面方向以環狀連續運轉 可被重覆使用。告恭目19^ η 從4寺戟具13 ⑺會將基板17又;時,基板置放器 烤區111、點膠區112、置晶 、以使基板17繼續進入預 出區1 1 5,以不齡砧去西 、供烤區1 1 4 '及基板取 ^ 以不斷地重覆預烤、點膠、置晶、供烤等程 圖4係本發明較佳實施例之另一每 佳實施例黏晶裝置2主要包括 ’本發明較 2 5、及一加熱機構2 6。 日日"取放機構 5〇8644 五、發明說明(7) 於本實施例中,輸送機構2 1係能進行垂直方向的連續 循環作動。輸送機構21具有載具存放盒23a,其係用以儲灵 $載具23,且係與昇降器(圖中未示)配合,以使載具存放 盒23a能夠上下作動,進而使載具23作相對地移動。當載 具23移動至預備區21〇時,基板置放器2〇係將基板27置入 載具23中,並移動壓制片231以壓制基板27。然後,載具 23便進入預烤區211時,預熱機構22烘烤基板27以去除基 板27的濕氣。接著,進入點膠區212,以點膠機構24胃占^ 銀膠241完畢後,再進入置晶區⑴,以晶粒取放機構^置 放晶粒251。置晶程序完畢之後必須經過烘烤,以使先前 ,滞的銀膠2㈣化,據以使晶粒251與基板27以接先人則, 預烤區211及烘烤區214進行烘•時,i有 :二邊猎著輸送細進行輸送,而不妨礙供烤二搁 哭?s二序兀畢之後’進入基板取出區215,以牽引 w 2 8將基板2 7自載具2 3移出。 晕引 於本實施例中,當基板27取出後 方向下送入載具存放盒23a以存放等載^、23沿圖中A 放盒23a儲滿載具23_, 尋載/、23。當載具存 ^係與昇降器相配合,以使載具23门可則述,载具存放盒 沿圖中C方向向上移動,據 =存放盒23a中 "^23 ^ ^ ^ ^ ^21 , t ^ 〇 ^ 傅%運轉而可重 第10頁 508644 五 發明說明(8) 複使用。 由於本發明之黏晶裝置係以耐高溫之載具來承載基 板,且該載具係能使基板保持平整’因此即便基板於黏晶 前為去除濕氣而經過烘烤處理,也不會由於烘烤後,因為 水氣的蒸發及熱壓力的產生,而造成基板翹曲變形,導致 點滯於基板上之銀膠產生緊縮的現象,產生孔洞,而降低 產品的良率。此外’該載具更以—輪送機構之輸送以進 〆連串之預烤、點膠、置晶、及烘烤程序,尤纟 預烤及烘烤程序中,由於該等基板係分別平择地置於兮算 載具上’且該等載具係由輸送機構所傳送,因^ 點滯之銀膠可以持續地被烘烤,不會為 :: 膠,而需使基板停滯下來,導致耽擱供 ^烤口化銀 低單位時間的產量。 u、烤㈣間,進而降 於本實施例之詳細說明中所提出 了易於說明本發明之技術内|,而並將太$貫施例僅為 制於該實施例,因此,在不超出本發:^月狹義地限 專利範圍之情況,可作種種變化實施。之精神及以下申請ΙΗ1 PAGE 8 INTRODUCTION (6) The ground is placed on the substrate 17 with silver glue 141. The CUring is tight, so that the die 151 can be placed in the area 17 of the substrate 17 with a plurality of bases, 17 and two sides, and it can be transported by the mechanism 11 because the substrate continues to cause : In the second aspect, the state of the mechanism heart can be heated for baking, so the overall second can be increased without further increasing the unit yield. s knife is the degree of the shovel, this area == solid! ^ after the completion of the sequence ′ enter the substrate removal area 115, and can: move to the four sides of the pressed piece 131, to remove.彳 The substrate 17 is moved from the carrier 13 by the tractor 18. Then, the carrier i with the substrate Π removed = continuous running in a circular direction in the direction of the wide water surface can be repeatedly used. Attention 19 ^ η From 4 temples 13 to 13 will be the substrate 17 again; at the same time, the substrate placement device baking area 111, the dispensing area 112, the crystal, so that the substrate 17 continues to enter the pre-exit area 1 1 5 Go to the west with an anvil, bake area 1 1 4 'and take the substrate ^ to repeatedly repeat the pre-bake, dispensing, crystal setting, bake, etc. Figure 4 is another preferred embodiment of the preferred embodiment of the present invention Embodiment The die attach device 2 mainly includes the present invention 25, and a heating mechanism 26. Day and day " Pick and place mechanism 5〇8644 V. Description of the invention (7) In this embodiment, the conveying mechanism 21 can perform continuous and cyclic operation in the vertical direction. The conveying mechanism 21 has a vehicle storage box 23a, which is used to store the vehicle 23, and cooperates with a lifter (not shown) to enable the vehicle storage box 23a to move up and down, thereby enabling the vehicle 23 For relative movement. When the carrier 23 is moved to the preparation area 21o, the substrate setter 20 places the substrate 27 into the carrier 23, and moves the pressing sheet 231 to press the substrate 27. Then, when the carrier 23 enters the pre-bake area 211, the pre-heating mechanism 22 bakes the substrate 27 to remove moisture from the substrate 27. Next, after entering the dispensing area 212, after the stomach glue 241 is finished by the dispensing mechanism 24, the wafer placement area ⑴ is entered again, and the grains 251 are placed by the grain taking and placing mechanism ^. After the crystal setting process is completed, baking must be performed to make the previously stagnant silver glue 2 melt, so that the crystal grains 251 and the substrate 27 can be replaced by the predecessors, and the pre-baking area 211 and the baking area 214 are baked. I have: the two sides are hunting the conveyer to carry the conveyance without hindering the roaster from crying. After the second order is completed, the user enters the substrate removal area 215 and pulls the substrate 2 7 out of the carrier 2 3 by pulling w 2 8. Halo In this embodiment, when the substrate 27 is taken out, it is fed into the carrier storage box 23a to store the equal loads ^, 23, and the carriers 23_, 23 /, 23 are stored in the box 23a in the figure. When the storage of the vehicle is matched with the lifter, so that the 23 doors of the vehicle can be described, the storage box of the vehicle moves upward in the direction of C in the figure. According to the storage box 23a " ^ 23 ^ ^ ^ ^ ^ 21 , t ^ 〇 ^ Fu% is running and can be repeated. Page 10 508644 Five invention instructions (8) Reuse. Since the crystal sticking device of the present invention uses a high temperature resistant carrier to carry the substrate, and the carrier can keep the substrate flat, so even if the substrate is subjected to baking treatment to remove moisture before the crystal sticking, it will not be caused by After baking, the substrate is warped and deformed due to the evaporation of water vapor and the generation of thermal pressure, which results in the shrinkage of the silver glue that stagnates on the substrate, resulting in holes and reducing the yield of the product. In addition, the carrier uses a conveyor mechanism to feed a series of pre-baking, dispensing, crystal setting, and baking procedures, especially in the pre-baking and baking procedures. Selectively place on the calculation carrier 'and these carriers are transported by the conveying mechanism. Because the lagging silver glue can be continuously baked, it will not be: glue, and the substrate needs to be stopped, This results in delayed supply of roasted silver with low yield per unit time. u, roasting, and then falling into the technology described in the detailed description of this embodiment, which is easy to explain the invention, and the embodiment is only limited to this embodiment, so it does not exceed this Issue: In the narrow sense, the scope of patents can be implemented in various ways. Spirit and following applications
第11頁 508644 圖式簡單說明 【圖式之簡單說明】 圖1係習知以壓合機構壓制基板以進行點膠及黏晶程 序之示意圖。 圖2係本發明較佳實施例之黏晶裝置進行預烤、點 膠、及黏晶之俯視示意圖。 圖3係基板以載具壓制之立體示意圖。 圖4係本發明較佳實施例之黏晶裝置進行預烤、點 膠、及黏晶另一實施態樣之立體示意圖。 【圖式符號說明】 1 黏晶裝置 10 基板置放器 11 輸送機構 110 預備區 111 預烤區 112 點膠區 113 置晶區 114 烘烤區 115 基板取出區 12 預熱機構 13 載具 131 壓制片 14 點膠機構 141 銀膠Page 11 508644 Brief description of the drawing [Simplified description of the drawing] Fig. 1 is a schematic diagram of a conventional process of pressing a substrate by a pressing mechanism to perform the dispensing and sticking processes. FIG. 2 is a schematic plan view of pre-baking, dispensing, and sticking crystals of a die attaching device according to a preferred embodiment of the present invention. Figure 3 is a schematic perspective view of a substrate pressed by a carrier. FIG. 4 is a schematic perspective view of another embodiment of pre-baking, dispensing, and sticking crystals of the sticking crystal device of the preferred embodiment of the present invention. [Symbol description] 1 Sticking device 10 Substrate placement device 11 Conveying mechanism 110 Preparing area 111 Pre-baking area 112 Dispensing area 113 Crystal placement area 114 Baking area 115 Substrate taking-out area 12 Preheating mechanism 13 Carrier 131 Pressing Piece 14 Dispense mechanism 141 Silver glue
第12頁 508644 圖式簡單說明 15 晶 粒 取 放 機 151 晶 粒 16 加 孰 機 構 17 基 板 18 牽 引 器 2 黏 晶 裝 置 20 基 板 置 放 哭 OXJ 21 m 送 機 構 210 預 備 區 211 預 烤 212 點 膠 區 213 置 晶 區 214 烘 烤 區 215 基 板 取 出 22 預 機 構 23 載 具 231 壓 制 片 23a 載 具 存 放 各 24 點 膠 機 構 241 銀 膠 25 晶 粒 取 放 機 251 晶 粒 26 加 軌 機 構 27 基 板Page 12 508644 Brief description of the drawings 15 Grain picking and placing machine 151 Grain 16 Adding mechanism 17 Substrate 18 Retractor 2 Sticky crystal device 20 Substrate placement OXJ 21 m Feeding mechanism 210 Preparing area 211 Pre-baking 212 Dispensing area 213 Crystal placement area 214 Baking area 215 Substrate removal 22 Pre-mechanism 23 Carrier 231 Pressed piece 23a Carrier storage each 24 Dispensing mechanism 241 Silver glue 25 Die pick and place machine 251 Die 26 Rail adding mechanism 27 Substrate
第13頁 508644Page 13 508644
第14頁Page 14
Claims (1)
Priority Applications (2)
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TW090128634A TW508644B (en) | 2001-11-19 | 2001-11-19 | Die bonding device |
US10/268,240 US6722412B2 (en) | 2001-11-19 | 2002-10-09 | Die bonder |
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TW090128634A TW508644B (en) | 2001-11-19 | 2001-11-19 | Die bonding device |
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EP1376658B1 (en) * | 2002-06-25 | 2011-07-06 | Kabushiki Kaisha Toshiba | Method and apparatus for manufacturing semiconductor device |
DE10245398B3 (en) * | 2002-09-28 | 2004-06-03 | Mühlbauer Ag | Device and method for applying semiconductor chips to carriers |
US20050097736A1 (en) * | 2003-11-10 | 2005-05-12 | Texas Instruments Incorporated | Method and system for integrated circuit bonding |
KR100634869B1 (en) * | 2005-05-30 | 2006-10-17 | 삼성전자주식회사 | Apparatus for attaching multi-die |
US20090014499A1 (en) * | 2007-07-11 | 2009-01-15 | Honeywell International Inc. | Automated preform attach for vacuum packaging |
TW200947641A (en) * | 2008-05-15 | 2009-11-16 | Gio Optoelectronics Corp | Die bonding apparatus |
US8381965B2 (en) | 2010-07-22 | 2013-02-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal compress bonding |
US8104666B1 (en) * | 2010-09-01 | 2012-01-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal compressive bonding with separate die-attach and reflow processes |
US8141766B1 (en) * | 2010-09-06 | 2012-03-27 | Cheng Uei Precision Industry Co., Ltd. | Automatic soldering system |
CN102122626B (en) * | 2010-10-26 | 2013-02-06 | 深圳市华星光电技术有限公司 | Conveying device and method, and display panel assembly equipment and method applied thereby |
CH705229B1 (en) | 2011-07-08 | 2015-06-15 | Esec Ag | Method and apparatus for the assembly of semiconductor chips. |
KR101923531B1 (en) | 2011-12-23 | 2018-11-30 | 삼성전자주식회사 | Apparatus of bonding semiconductor chip |
US9789572B1 (en) * | 2014-01-09 | 2017-10-17 | Flextronics Ap, Llc | Universal automation line |
JP2021502240A (en) | 2017-11-10 | 2021-01-28 | ノードソン コーポレーションNordson Corporation | Systems and methods for coating substrates |
KR102568388B1 (en) * | 2018-06-04 | 2023-08-18 | 한화정밀기계 주식회사 | Bonding apparatus |
CN110858552B (en) * | 2018-08-24 | 2022-06-17 | 上海微电子装备(集团)股份有限公司 | Bonding equipment and bonding method |
CN117330842B (en) * | 2023-12-01 | 2024-02-27 | 长春黄金研究院有限公司 | Preparation and detection device of silver powder pulping performance test piece |
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US5173338A (en) * | 1991-04-04 | 1992-12-22 | Ak Technology, Inc. | Lead frame workholder and transport apparatus and method |
JP2811613B2 (en) * | 1991-09-02 | 1998-10-15 | ティーディーケイ株式会社 | Manufacturing method and apparatus for electronic components |
US5547537A (en) * | 1992-05-20 | 1996-08-20 | Kulicke & Soffa, Investments, Inc. | Ceramic carrier transport for die attach equipment |
US6205745B1 (en) * | 1998-05-27 | 2001-03-27 | Lucent Technologies Inc. | High speed flip-chip dispensing |
EP0975008A1 (en) * | 1998-07-20 | 2000-01-26 | Alphasem AG | Method and device for treating a flat workpiece, in particular a semiconductor wafer |
EP1076357A1 (en) * | 1999-08-11 | 2001-02-14 | SiMoTec GmbH | Mounting apparatus for processing microsystem products |
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