TW451214B - High efficiency CMOS pump circuit - Google Patents
High efficiency CMOS pump circuit Download PDFInfo
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- TW451214B TW451214B TW088119008A TW88119008A TW451214B TW 451214 B TW451214 B TW 451214B TW 088119008 A TW088119008 A TW 088119008A TW 88119008 A TW88119008 A TW 88119008A TW 451214 B TW451214 B TW 451214B
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
- H02M3/073—Charge pumps of the Schenkel-type
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Abstract
Description
經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(/ ) 發明詳細說明: (一) 發明技術領域: 本發明是有關於一種半導體積體電路,特別是有關於一 種用於半導體記憶元件之高效率CMOS幫浦(pump)電路。 (二) 發明技術背景: 一般而言,幫浦電路於半導體記憶體中已是非常重要的 機能,其用以提供內部電壓,內部電壓高於施加至記憶體晶 片之電壓。幫浦電路產生的高內部電壓用於一些不能於低晶 片電壓下動作的特定的機能。此一內部高電壓的提供,使低 電壓仍能施加至記憶體晶片,並利用於大部分的機能,以降 低功率消耗,並可提高晶片整合度。 幫浦電路之一重要的應用是提洪”字元線”(w〇rd 1 ine) 驅動電路偏壓電壓。字元線驅動電路需用高電壓,以提高自 記憶單元(memory cell)的讀出、寫入電流。常用之幫浦 電路包括有升壓電路(Booster Circuit)及”通過閘”(pass gate),升壓電路產生高電壓,而”通過閘”(pass gate)具有 數種型式,其功用爲接駿升壓電路之電容器上電荷至輸出負 載,在輸出負載上包括一整合電容器,使幫浦產生之電壓平 緩。 在美國專利案第5, 222, 042號中,揭露了一種動態隨機 存取記憶體(DRAM)字元線用升壓電路,其使用兩升壓電路 ,升壓字元線訊號,並降低電容器洩漏效應。而在美國專利 案第5,134, 317號中,揭露了一種動態隨機存取記憶體用電 荷幫浦(charge pump)電路,其降低升壓電容器的充電時 ---------—'Γ 裝------訂 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 1214 1214 經濟部智慧財產局員工消費合作社印製 A7 __B7_ 五、發明説明(>) 間。而在美國專利案第4, 673, 829號中,揭露了一種幫浦電 路,用於程式化記憶體陣列,其可降低“未選擇”記憶單元 的漏電流。 習用相關技術中,有一 IEEE固態電路期刊(IEEE Journal of Solid-state Circuits)技術期刊,其1998年3 月份第33卷第3冊中揭露有Pierre Favrat之“高效率CMOS倍 壓器”,其中描述倍壓器利用電荷幫浦單元以及改良式串式 開關。積體電荷幫浦,帶有75%效率,而利用外部電容器, 可得到高達9 5%效率。 另外,IEEE固態電路期刊(IEEE Journal of Solid-state Circuits) 之 1991 年4 月份第 26 卷第4 冊中 揭露有 Nakagome之“實驗的1. 5V 64Mb動態隨機存取記憶體”,其 中高密度動態隨機存取記憶體用之低電壓電路技術,包括有 字元線驅動器,其具有電荷幫浦電路,可達到高升壓比。 幫浦電路之一問題是”通過閘”(pass gate)電晶體之臨 限電壓(threshold voltage),其降低轉移至幫浦電路之輸 出之電荷量。而,未完全開啓之”通過閘”(pass gate)電晶 體,係爲具有高臨限電壓。要解決此問題’可使”通過閘 ”(pass gate)電晶體的閘極驅動爲高電壓,3倍VCC ’但驅動 ”通過閛”(pass gate)電晶體的閘極爲過高電壓’將導致驅 動”通過閘”(pass gate)電晶體的閘極之電路的崩潰 (breakdown)問題。 至於降低高閘極電壓之其他方式,則難以維持”通過閘 ,,(pass gate)電晶體完全開啓,且造成自升壓電路轉移至輸 I.._L--.----、J裝------訂 線 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS )八4麟(210X297公釐) 經濟部智慧財產局員工消費合作社印製 1 2 1 4 A7 __B7___ 五、發明説明()) 出之電荷低電導(conductance)。由於井部偏壓(well bias) 並不能維持最高電壓,因此可能造成電路的閂鎖(latch up) ο 請參閱圖一A,其係繪示一種習知技術簡單的幫浦電路 的電路圖。升壓電路係由一N通道電晶體10以及一電容器C1 所組成,N通道電晶體10之閘極與汲極共同地連接至VCC, 電容器Cl係由升壓訊號(boost signal)Bl所驅動。 節點11上的升壓電壓(boosted vo 1 tage)由一 N通道電 晶體12連接至Vout13。連接至¥0111:13之電容器C0自節點11上 的升壓電壓儲存電荷40Utl3受電晶體10以及電晶體12之臨 限電壓影響,降低轉移至幫浦電路之輸出之電荷量’致幫浦 電路之效率降低。 請參閱圖一B,其係繪示另一種習知技術的幫浦電路的 電路圖。第一電壓升壓電路係由電晶體10並式連接第二電晶 體20所組成。第二電晶體20之閘極,由第二升壓訊號(boost signal )B2經第二電容器C2所驅動。 第二訊號升壓電路係相同於第一訊號升壓電路’係由二 電晶體21以及22於V〇:及電容器C2之間,以並式連接所組成 。第二電晶體21之閘極,由第一升壓訊號(boost signal)Bl 經第一電容器Cl所驅動。 電晶體20以及21之交互耦合產生之返饋電路,驅動電晶 體20以及21完全開啓,消除節點11上升壓電壓上的電晶體20 以及21之臨限電壓效應。電晶體23形成”通過閘”(pass 本紙張尺度適用中國國家標準(CNS ) A4規格(21 OX 297公釐) —-L-------裝------訂 腺 ·' (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(+) gate),其連接升壓電壓的直流部分(DC component)至 V〇utl3以及輸出電容器CO。 3倍Vcc升壓器電路14用以驅動3倍Vcc驅動器15,3倍Vcc 驅動器15連接”通過闇”(pass gate)電晶體23之閘極,產生 .約2倍Vcc之輸出電壓Voutl3。3倍Vcc升壓器14及3倍Vcc驅動 器15的高電壓’可能導致升壓器14及驅動器15之電路崩潰。 請參閱圖一C ’其係繪示一種習知技術的幫浦電路的電 路圖,此幫浦電路不用3倍Vcc幫浦電壓而產生輸出13。此升 壓器電路除自電路節點16之升壓訊號(boosted s i gna l·)連接 ”通過閘”(pass gate)29外,係相同於圖一B所示之升壓電路 〇 升壓訊號(booster signal)Bl及B2產生之二升壓訊號 (boosted signal)11 及 16具有的交流部分(AC component) ,用以偏壓VB(5產生器28及”通過閘”(pass gate)29。Vw產生 器之二電晶體23以及24用以建立(establish)—電壓,以偏 壓P通道電晶體23、24、25及26用的N井。 連接電晶體25的源極之來自節點11之電壓,初始升壓約 2倍Vcc準位,而連接電晶體25的閘極之來自節點16之電壓, 初始拉降至約Vss準位。此完全開啓”通過閘”(pass gate)電 晶體25 〇 電晶體25的源極及閘極上出現初始電壓後,C1之電荷開 始經電晶體25分配(share)CO,而由電晶體10及20 ’ C2開始 預充至Vcc準位。來自電路節點16之電晶體25上的閘極電壓 開始增加,來自電路節點11之源極電福開始降低’使電晶體 --L--.----Ί1^------、1Τ-----J線 (讀先閣讀背面之注$項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) 451214 A7 £7_____ 五、發明説明(_?) 25不完全開啓,電晶體25的電導降低,並充電C0較久。電晶 體26相似,致造成幫浦電路的效率損耗。 (三)發明簡要說明: 因此,本發明中,提供一種高效率CMOS幫浦電路’其 包括有:一升壓電路,其由二升壓訊號(boost signal)所 驅動,產生一第一升壓電壓及一第二升壓電壓;上述第一升 壓電壓連接第一複數”通過閘”(pass gate)電晶體;上述第 二升壓電壓連接第二複數”通過閘”(pass gate)電晶體;控 制上述第一複數”通過閘”(pass gate)電晶體’以在一第一 半時脈(clock)期間產生一高電導,以自上述第一升壓電壓 傳導電荷電流至幫浦電路之輸出;及控制上述第二複數”通 過閘”(pass gate)電晶體,以在二第二半時脈期間產生二高 電導,以自上述第二升壓電壓傳導電荷電流至上述幫浦電路 之上述輸出。 較佳者,控制上述”通過閘”(pass gate)電晶體之閘極 電壓爲上述幫浦電路之最高輸出電壓加上一上述”通過閘 ”(pass gate)電晶體之臨限電壓,以完全開啓上述”通過閘 ”(pass gate)電晶體^ 較佳者,上述第一複數”通過閘”(pass gate)電晶體及 上述第二複數”通過閘”(Pass gate)電晶體,包含有並式連 接之NM0S電晶體及PM0S電晶體,以產生高電導,當其完全開 啓時,允許電?荒自升壓電壓有效地連接上述幫浦電路之上述 輸出。 本紙張尺度適用中國國家標隼(CNS ) A4規格(21〇Χ297公釐) ----------一^裝 訂 旅 (誇先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 1512 14 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(ς) 較佳者,上述PMOS電晶體係於N井中,其偏壓爲最高的 電路電壓,以防止電路閂鎖(circuit latch up)。 較佳者,上述幫浦電路之上述輸出電壓約爲2倍電路偏 壓電壓。 本發明中,提供一種CMOS幫浦電路,其包括有:一升 壓電路,連接二”通過閘”(pass gate)電路;上述升壓電路 由二互補的(comp 1 imentary)升壓訊號(boost signa 1)所驅 動;上述互補的升壓訊號產生二互補的升壓的訊號(boosted signal);上述二互補的升壓的訊號之第一升壓的訊號連接 上述二”通過鬧”(pass gate)電路之第一”通過閘”(pass gate)電路;上述二互補的升壓的訊號之第二升壓的訊號連 接上述二”通過閘”(pass gate)電路之第二”通過閘”(pass gate)電路;上述第二升壓電壓連接第二複數”通過閘”(pass gate)電晶體;控制上述第一及第二”通過閘”(pass gate)電 路,連接上述第一及第二升壓的訊號至幫浦電路輸出,產生 一高於上述升壓電路偏壓電壓之輸出電壓。 較佳者,控制上述第一及第二”通過閘”(pass gate)電 路爲補償”通過閘”(pass gate)電晶體之臨限電壓,以完全 開啓上述”通過閘”(pass gate)電晶體。 較佳者,上述第一”通過閘”(pass gate)電路及上述第 二”通過閘”(pass gate)電路’包含有並式連接、分別控制 之一NM0S電晶體及一PM0S電晶體,以產生一高電導”通過閘 ,,(pass gate) ° (請先閩讀背面之注意事項再填寫本頁)Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (/) Detailed description of the invention: (1) Technical field of the invention: The present invention relates to a semiconductor integrated circuit, and more particularly to a semiconductor memory circuit. High-efficiency CMOS pump circuit for components. (II) Background of the Invention: Generally speaking, the pump circuit is a very important function in semiconductor memory. It is used to provide an internal voltage that is higher than the voltage applied to the memory chip. The high internal voltage generated by the pump circuit is used for specific functions that cannot operate at low chip voltages. The provision of such an internal high voltage enables low voltage to be applied to the memory chip and utilizes most of the functions to reduce power consumption and improve chip integration. One important application of the pump circuit is to boost the "word line" (word ine) drive circuit bias voltage. The word line driver circuit needs a high voltage to increase the read and write current of the memory cell. Commonly used pump circuits include a booster circuit and a "pass gate". The booster circuit generates a high voltage, and the "pass gate" has several types, and its function is to connect the circuit. The charge from the capacitor of the boost circuit to the output load includes an integrated capacitor on the output load to smooth the voltage generated by the pump. In U.S. Patent No. 5,222,042, a step-up circuit for a dynamic random access memory (DRAM) word line is disclosed, which uses two step-up circuits to boost the word line signal and reduce the capacitor Leak effect. In U.S. Patent No. 5,134,317, a charge pump circuit for dynamic random access memory is disclosed, which reduces the charge of the boost capacitor when --------- ' Γ Packing --- order (please read the precautions on the back before filling this page) This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) 1214 1214 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs System A7 __B7_ V. Description of the invention (>). In U.S. Patent No. 4,673,829, a pump circuit is disclosed for programming a memory array, which can reduce the leakage current of "unselected" memory cells. Among the related technologies, there is an IEEE Journal of Solid-state Circuits technical journal. In March 1998, Volume 33, Volume 3 disclosed "High Efficiency CMOS Voltage Multiplier" by Pierre Favrat, which describes The voltage doubler uses a charge pump unit and a modified string switch. Integrated charge pumps with 75% efficiency, while using external capacitors can achieve up to 95% efficiency. In addition, the IEEE Journal of Solid-state Circuits in April 1991, Volume 26, Volume 4, disclosed Nakagome's "Experimental 1. 5V 64Mb Dynamic Random Access Memory", of which high-density dynamic The low-voltage circuit technology used in random access memory includes a word line driver with a charge pump circuit to achieve a high boost ratio. One problem with pump circuits is the threshold voltage of the "pass gate" transistor, which reduces the amount of charge transferred to the output of the pump circuit. However, the "pass gate" transistor, which is not fully turned on, has a high threshold voltage. To solve this problem 'the gate of the pass gate transistor can be driven to a high voltage, 3 times VCC' but driving the gate of the pass gate transistor to an extremely high voltage 'will cause The problem of circuit breakdown that drives the gate of a "pass gate" transistor. As for other ways to reduce the high gate voltage, it is difficult to maintain the "pass gate", the (pass gate) transistor is fully turned on, and the self-boost circuit is transferred to the output I .._ L --.----, J equipment ------ Booking (please read the notes on the back before filling this page) This paper size is applicable to Chinese National Standard (CNS) 8 4 Lin (210X297 mm) Printed by the Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs 1 2 1 4 A7 __B7___ V. Description of the invention ()) The low conductivity of the charge. Because the well bias cannot maintain the highest voltage, it may cause the circuit to latch up. Ο See FIG. 1A is a circuit diagram showing a simple pump circuit of a conventional technique. The booster circuit is composed of an N-channel transistor 10 and a capacitor C1. The gate and the drain of the N-channel transistor 10 are common. The ground is connected to VCC, and the capacitor Cl is driven by a boost signal Bl. The boosted vo 1 tage at node 11 is connected to Vout13 by an N-channel transistor 12. It is connected to ¥ 0111: 13 Capacitor C0 stores the charge 40 Utl3 from the boosted voltage on node 11. The effect of the threshold voltage of the crystal 10 and the transistor 12 reduces the amount of charge transferred to the pump circuit, which causes the efficiency of the pump circuit to be reduced. Please refer to FIG. 1B, which shows a pump of another conventional technique. The circuit diagram of the circuit. The first voltage boosting circuit is composed of transistor 10 connected in parallel with the second transistor 20. The gate of the second transistor 20 is connected by a second boost signal B2 via a second capacitor. Driven by C2. The second signal booster circuit is the same as the first signal booster circuit. It is composed of two transistors 21 and 22 between V0 and capacitor C2, connected in parallel. The second transistor 21 The gate is driven by the first boost signal Bl through the first capacitor Cl. The feedback circuit generated by the interactive coupling of the transistors 20 and 21 drives the transistors 20 and 21 to turn on completely, eliminating the rise of node 11 Threshold voltage effect of transistors 20 and 21 on the voltage and voltage. The transistor 23 forms a "pass gate" (pass This paper size applies Chinese National Standard (CNS) A4 specification (21 OX 297 mm) —-L --- ---- Equipment ------ Order gland · '(Please read the back first Please fill in this page again.) Printed A7 B7 by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention (+) gate), which connects the DC component of the boosted voltage to V〇utl3 and the output capacitor. CO. The 3 times Vcc booster circuit 14 is used to drive the 3 times Vcc driver 15, and the 3 times Vcc driver 15 is connected to the gate of the "pass gate" transistor 23 to generate about 2 times the Vcc output voltage Voutl3 The high voltage of the 3x Vcc booster 14 and the 3x Vcc driver 15 may cause the circuits of the booster 14 and the driver 15 to collapse. Please refer to FIG. 1C ', which is a circuit diagram of a conventional pump circuit. This pump circuit does not use 3 times the Vcc pump voltage to generate output 13. This booster circuit is the same as the booster circuit shown in Figure 1B except that the boosted signal (boosted si gna l ·) from the circuit node 16 is connected to the "pass gate" 29. booster signal) The two boosted signals 11 and 16 generated by Bl and B2 have AC components for biasing VB (5 generator 28 and "pass gate" 29. Vw The generator two transistors 23 and 24 are used to establish a voltage to bias the N-wells for the P-channel transistors 23, 24, 25, and 26. The source of the transistor 25 is connected to the voltage from node 11 , The initial boost is about 2 times the Vcc level, and the voltage from the node 16 connected to the gate of the transistor 25 is initially pulled down to about the Vss level. This fully turns on the "pass gate" transistor 25. After the initial voltage appears on the source and gate of transistor 25, the charge of C1 begins to share CO via transistor 25, and the transistor 10 and 20 'C2 begin to precharge to Vcc level. From circuit node 16 The gate voltage on the transistor 25 starts to increase, and the source voltage from the circuit node 11 starts to decrease. Body --L --.---- Ί1 ^ ------, 1T ----- J line (read the note on the back of the first cabinet, and then fill out this page) This paper size applies to Chinese national standards (CNS) A4 specification (210X 297 mm) 451214 A7 £ 7 _____ 5. Description of the invention (_?) 25 is not fully turned on, the conductivity of transistor 25 is reduced, and the charge C0 is longer. The transistor 26 is similar, causing the pump The efficiency loss of the circuit. (3) Brief description of the invention: Therefore, in the present invention, a high-efficiency CMOS pump circuit is provided, which includes: a booster circuit, which is driven by two boost signals to generate A first boost voltage and a second boost voltage; the first boost voltage is connected to a first complex "pass gate" transistor; the second boost voltage is connected to a second complex "pass gate" ( pass gate) transistor; controlling the first complex "pass gate" transistor to generate a high conductance during a first half clock period to conduct charge current from the first boosted voltage To the output of the pump circuit; and controlling the above-mentioned second complex "pass gate" transistor so that During the second half clock period, two high conductances are generated to conduct a charge current from the second boosted voltage to the output of the above-mentioned pump circuit. Preferably, the gate of the "pass gate" transistor is controlled The voltage is the highest output voltage of the above-mentioned pump circuit plus a threshold voltage of the above-mentioned "pass gate" transistor to fully turn on the above-mentioned "pass gate" transistor. A plurality of "pass gate" transistors and the above-mentioned second plurality of "pass gate" transistors include a parallel-connected NMOS transistor and a PM0S transistor to generate a high conductance when it is completely When turned on, the power supply self-boosting voltage is allowed to effectively connect the above-mentioned output of the above-mentioned pump circuit. This paper size is applicable to China National Standard (CNS) A4 specification (21〇 × 297 mm) ---------- One ^ Binding Travel (please read the precautions on the back before filling this page) Ministry of Economy Wisdom Printed by the Consumer Cooperative of the Property Bureau 1512 14 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Invention description (ς) Better, the above PMOS transistor system is in the N well, and its bias voltage is the highest circuit voltage. To prevent circuit latch up. Preferably, the output voltage of the pump circuit is about twice the circuit bias voltage. In the present invention, a CMOS pump circuit is provided, which includes: a booster circuit connected to two "pass gate" circuits; the booster circuit is composed of two complementary (comp 1 imentary) boost signals (boost signa 1); the complementary boosted signals generate two complementary boosted signals; the first boosted signal of the two complementary boosted signals connects the two "pass gates" (pass gate) ) The first "pass gate" circuit of the circuit; the second boosted signal of the two complementary boosted signals is connected to the second "pass gate" of the two "pass gate" circuits ( pass gate circuit; the second boosted voltage is connected to a second plurality of "pass gate" transistors; the first and second "pass gate" circuits are controlled to connect the first and second The boosted signal is output to the pump circuit to generate an output voltage higher than the bias voltage of the boost circuit. Preferably, the first and second "pass gate" circuits are controlled to compensate for the threshold voltage of the "pass gate" transistor to fully turn on the "pass gate" circuit. Crystal. Preferably, the first "pass gate" circuit and the second "pass gate" circuit described above include a NM0S transistor and a PM0S transistor which are connected in parallel and controlled separately. Generate a high conductance "pass gate, (pass gate) ° (Please read the precautions on the back before filling this page)
本紙張尺度適用中國國家標準(CNS ) Μ規格(210 X 297公釐) 2 1 4 A7 B7 五'發明説明(7 ) 較佳者,上述輸出電壓約爲上述升壓電路用之電路偏壓 之2倍振幅。 本發明中,提供一種一種電壓升壓之方法,其包括有 :連接二互補的升壓訊號至一電壓幫浦電路之一升壓電路; 自上述升壓電路連接一第一升壓的訊號至一第一”通過閘 ”(pass gate)電路;自上述升壓電路連接一第二升壓的訊號 至一第二”通過閘”(pass gate)電路;在一時脈之一第一半 週期,控制上述第一”通過閘”(pass gate)電路開啓’具有 高電導;在上述時脈之上述第一半週期,自一第一升壓的訊 號傳導電流至上述幫浦電路之上述輸出;經上述第一”通過 鬧”(pass gate)電路之高電導,充電一連接上述幫浦電路之 上述輸出之電容器高時脈比;在上述時脈之第二半週期,控 制上述第二”通過閘"(pass gate)電路開啓,具有高電導; 在上述時脈之上述第二半週期,自第二升壓的訊號傳導電流 至上述幫浦電路之上述輸出;經上述第二”通過閘”(pass gate)電路之高電導,高效率地充電上述連接上述幫浦電路 之上述輸出之電容器;及產生一幫浦電路輸出電壓,其高於 上述幫浦電路之電壓偏壓。 較佳者,控制上述第一”通過閘”(pass gate)電路及上 述第二”通過蘭”(pass gate)電路連接上述第一”通過閘 ”(pass gate)電路及上述第二”通過閘”(pass gate)電路之 各電晶體之各閘電壓,其約等於上述輸出電壓加上上述電晶 體之臨限電壓。 (請先閱讀背面之注意事項再填寫本頁) .裝. -訂 經濟部智慧財產局R工消費合作社印製 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 451 2 1 4 A7 ____B7__ 五、發明説明(K) 較佳者,自第一升壓的訊號及第二升壓的訊號傳導電流 ,係經由控制上述第一”通過閘”(pass gate)電路中之上述 N通道電晶體及上述P通道電晶體同步傳導,在上述時脈之 上述第一半週期,產生一高電導,及經由控制上述第二”通 過閘”(pass gate)電路中之上述N通道電晶體及上述P通道 電晶體同步傳導,在上述時脈之上述第二半週期,產生一高 電導。 爲使貴審查委員對於本發明案之特徵、目的與功效 能有更進一步之瞭解與認識,茲配合圖式詳細說明如后: (四)圖式之簡要說明: 圖一係繪示習知幫浦電路的電路圖。 圖二係繪示依據本發明實施例之幫浦電路的電路圖。 圖三係繪示依據本發明實施例之幫浦電路的波形圖。 圖四係繪示依據本發明實施例之幫浦電路連接字元線 驅動器的方塊圖。 圖五係繪示利用依據本發明實施例之幫浦電路升壓電 壓之方法的流程圖。 圖式中相同的圖號代表相同的部分。 圖號說明: CO、Cl、C2 ' C3、27-電容器This paper size applies the Chinese National Standard (CNS) M specification (210 X 297 mm) 2 1 4 A7 B7 Five 'invention description (7) Preferably, the above output voltage is approximately the same as the circuit bias voltage of the above booster circuit 2 times the amplitude. In the present invention, a voltage boosting method is provided, which includes: connecting two complementary boosting signals to one of a voltage boosting circuit; and connecting a first boosting signal from the boosting circuit to A first "pass gate" circuit; connecting a second boosted signal from the booster circuit to a second "pass gate" circuit; a first half cycle at one clock, Controlling the first "pass gate" circuit to turn on 'having high conductance; conducting the current from a first boosted signal to the output of the pump circuit during the first half cycle of the clock; The first "pass gate" circuit has a high conductance, and a capacitor connected to the output of the pump circuit has a high clock ratio; during the second half cycle of the clock, the second "pass gate" is controlled. " (pass gate) circuit is on and has high conductance; in the second half cycle of the clock, the current from the second boosted signal conducts current to the output of the above-mentioned pump circuit; through the second "pass gate" (pass gate) High conductance of the circuit, efficiently charging the capacitor connected to the output of the pump circuit; and generating a pump circuit output voltage that is higher than the voltage bias of the pump circuit. Preferably, the first The "pass gate" circuit and the above-mentioned second "pass gate" circuit are connected to each of the above-mentioned first "pass gate" circuit and the above-mentioned second "pass gate" circuit The gate voltage of the transistor is approximately equal to the above output voltage plus the threshold voltage of the above transistor. (Please read the precautions on the back before filling out this page.) The printed paper size is in accordance with the Chinese National Standard (CNS) A4 specification (210X297 mm) 451 2 1 4 A7 ____B7__ 5. Description of the invention (K) The better, the signal from the first boost and the signal from the second boost The conduction current is synchronously conducted by controlling the N-channel transistor and the P-channel transistor in the first "pass gate" circuit, and generates a high conductance during the first half period of the clock, By controlling the N-channel transistor and the P-channel transistor in the second "pass gate" circuit to conduct synchronously, a high conductance is generated during the second half cycle of the clock. For your review The members can further understand and recognize the features, purpose, and effects of the present invention, and they are explained in detail with the drawings as follows: (4) Brief description of the drawings: Figure 1 is a circuit diagram showing a conventional pump circuit Figure 2 is a circuit diagram of a pump circuit according to an embodiment of the present invention. Figure 3 is a waveform diagram of a pump circuit according to an embodiment of the present invention. FIG. 4 is a block diagram of a word circuit driver connected to a pump circuit according to an embodiment of the present invention. FIG. 5 is a flowchart illustrating a method for boosting a voltage using a pump circuit according to an embodiment of the present invention. The same drawing numbers in the drawings represent the same parts. Drawing number description: CO, Cl, C2 'C3, 27-capacitor
Bl、B2-升壓訊號 1〇、12、20〜電晶體 11、16、31、32-節點 : ________Q_______ 本紙張尺度逋用中國國家標準(CNS)M規格(210X297公釐) (諳先Μ讀背面之注$項再填寫本頁) ,裝· 經濟部智慧財產局員工消背合作社印製 A7 B7 五、發明説明(y ) 13、45-輸出電壓 14- 3倍Vcc升壓器 (請先閱讀背面之注意事項再填寫本頁) 15- 3倍Vcc驅動器 28- VB(;產生器 29- “通過閘”(pass gate) 30- 升壓電路 33、34-“通過閘”(pass gate)電路 35〜44-電晶體 46- 時脈電路 47- 控制邏輯 48- Vph幫浦電路 49- Vpp幫浦電路 50- 限制電路 51- N2a電壓爲Vph值 52a、52b-Nla 電壓Bl, B2-Boost signal 10, 12, 20 ~ Transistor 11, 16, 31, 32-node: ________Q_______ This paper size adopts China National Standard (CNS) M specification (210X297 mm) (read first) Note $ on the back and fill in this page again), install A7 B7 printed by the staff of the Intellectual Property Bureau of the Ministry of Economic Affairs V. Invention description (y) 13, 45-output voltage 14-3 times Vcc booster (please first Read the notes on the back and fill in this page again) 15- 3x Vcc driver 28- VB (; generator 29- "pass gate" 30- boost circuit 33, 34- "pass gate" Circuit 35 ~ 44-Transistor 46-Clock circuit 47- Control logic 48- Vph pump circuit 49- Vpp pump circuit 50- Limit circuit 51- N2a voltage is Vph value 52a, 52b-Nla voltage
53- N2b電壓爲0V53- N2b voltage is 0V
54- N2b電壓爲Vph值 55_N2a電壓爲〇V 經濟部智慧財產局員工消費合作社印製 56 a、56b-Nlb 電壓 (五)較佳實施例詳細說明: 以下,參照圖面詳細說明本發明之較佳實施例。 請參閱圖二,其係繪示本發明之Vpp幫浦電路49的電路 圖。時脈(c丨〇ck)電路46提供控制邏輯47時序(timings),產 _;_ίο_;_ 本紙張尺度逋用中國國家標準(CNS ) A4规格(210X297公釐) 5 2 ί 4· Α7 Β7 五、發明説明((Ό ) (請先間讀背面之注意事項再填寫本頁) 生複數控制訊號N2a、N2b、P2a及P2b 〇升壓電路30相同於圖 一C習知技術之升壓電路,其利用二升壓的訊號(boosted signal)連接”通過閘”(pass gate)電晶體。 節點31上升壓的訊號(boosted signal)Nla及節點32上 升壓的訊號(boosted signal)Nlb,連接二”通過閘”(pass gate)電路33及34,而Nla及Nib具有約爲2倍Vcc的最高電壓 值。升壓電路係由電晶體35、36、37及38及電容器C1及C2所 組成。 升壓訊號(booster signal)B1施加至電容器C1,並至電 晶體35及36之源點(source)。升壓訊號B1係爲時脈脈波 (clocked pulse),其具有零伏特之最低電壓及約Vcc之最高 電壓,高電壓Vcc約佔50%之工作週期(duty cycle)。同樣 地,升壓訊號B2施加至電容器C2,並至電晶體37及38之源點 。升壓訊號B2係爲時脈脈波,其互補(complimentary)於升 壓訊號B1,具有零伏特之最低電壓及約Vcc之最高電壓,高 電壓Vcc約佔50%之工作週期。 經濟部智慧財產局員工消費合作社印製 電晶體36及37交互耦合,彼此提供返饋,消除影響 節點31及32上升壓電壓的振幅之電晶體臨限電壓效應。電 晶體36的閘極連接電晶體37的源極及節點32,電晶體37 的閘極連接電晶體36的源極及節點31。電晶體36的閘極 係由節點32上的升壓的訊號Nib所驅動,電晶體37的閘 極係由節點31上的升壓的訊號Nla所驅動。 當升壓的訊號Nib爲高時,升顧的訊號Nla爲低,驅 __:____11 _ 本紙張尺度適用中國國家標準(CNS ) A4規格(210Χ297公嫠) :>4 δ 4 經濟部智慧財產局員工消費合作社印製 2 14214 A7 __B7_五、發明説明((/ ) 動電晶體36完全開啓,使節點31上的升壓的訊號至約等於 Vcc之電壓準位。節點31上的電壓約爲Vcc電壓之後,升 壓訊號B1爲高,增加節點31上的電壓Ma至約等於2倍 Vcc之值,並關閉電晶體36。 然後,升壓訊號B1驅動節點31上的Nla爲高,升壓 的訊號Nib爲低,而驅動電晶體37完全開啓,使節點32上 的升壓的訊號至約等於Vcc之電壓準位。節點32上的電壓 約爲Vcc電壓之後,升壓訊號B2爲高,增加節點32上的電 壓Nib至約等於2倍Vcc之值,並關閉電晶體37。 節點31上的升壓的訊號Nla連接”通過閘”(pass gate)電路33,節點32上的升壓的訊號連接”通過閘”(pass gate)電路34。”通過閘”(pass gate)電路33及34連接幫 浦電路輸出Vout及電容器C3通過閘”(pass gate)電路 33包括有電晶體39及40,其分別連接節點31上的訊號至 Vout 45 ° “通過閘"(pass gate)電路33的電晶體39係爲N通道 電晶體,其閘極以訊號N2a驅動,其中N2a=Vph= Vpm+ Vth ,Vpm係爲Vout之最大振幅,Vth係爲N通道電晶體39之 臨限電壓。電晶體40係爲N井中P通道電晶體,其閘極由 訊號P2a驅動,其中P2a=Vph= Vpm+ Vth。電晶體40之N 井偏壓Vph,等於V〇ut之最大振幅之電壓加上電晶體臨限 電壓’防止電路閂鎖的問題。 “通過閘,,(pass gate)電路34包括有電晶體43及44, (#先閱讀背面之注意事項再填寫本頁) .裝. 訂 本紙張尺度適用中國國家操準(CNS ) A4規格(210X297公釐) A7 B7 451214 五、發明説明(丨少) 其分別連接節點32上的升壓的訊號Nib至V〇ut 45。”通過 閘”(pass gate)電路44的電晶體34係爲N通道電晶體,其 閘極以”通過閘”(pass gate)電路訊號N2b驅動,其中 N2b=Vph= Vpm+ Vth 〇電晶體43係爲N井中P通道電晶體, 其閘極以”通過閘”(pass gate)電路訊號P2b驅動,其中 P2b=Vph= Vpm+ Vth 〇電晶體43之N井偏壓Vph,等於Vout 之最大振幅之電壓加上電晶體臨限電壓,防止電路閂鎖的問 題。 再請參閱圖三之電壓波形所繪示,閘極訊號N2a、N2b 、P2a及P2b之振幅及時序控制,使”通過閘”(pass gate) 電路33的電晶體39及40在一時脈(clock)期間之一半完全 開啓,”通過閘”(pass gate)電路34的電晶體44及43在一 時脈(clock)期間之另一半完全開啓。 閘控制訊號N2a、N2b、P2a及P2b具有Vph或0伏 特之電壓,使”通過閘”(pass gate)電晶體提供一高電導。 本發明之較佳實施例於”通過閘”(pass gate)33及34中使 用N通道電晶體及P通道電晶體,而任意數目、任意型式之 電晶體,可用來提供高電導,連接升壓的訊號Nla及Nib 至輸出45。例如,單一的N通道電晶體或單一的P通道電 晶體亦可使用。如需要較高電導,可使用兩個或更多N通道 電晶體或P通道電晶體。 再請參閱圖三,其繪示依據本發明實施例之波形圖。 時序升壓訊號B1及B2,彼此互補(complimentary),並具有 13 (請先閲讀背面之注意事項再填寫本頁) 裝_ 訂 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 經濟部智慧財產局員工消費合作社印製 A7 ___ B7 五、發明説明(1今) 一自0伏特至Vcc之脈波電壓。升壓訊號B1驅動節點31,產生 電壓Nla 52a及52b 〇當升壓訊號B1爲高時,Nla 52a爲大於 Vcc之正電壓,電荷經”通過閘”(pass gate)電路33分配輸出 至電容器C3,產生幫浦電路輸出45,並具有一上升電壓,如 -三所示之Vout 57。Vout 57中正上升持續直到電壓達到, 此時幫浦電路停止幫浦電流至輸出電容器C3。當升壓訊號B1 爲低時,”通過閘”(pass gate)電路33關閉,節點31預充至 Nla= Vcc 52b。 升壓訊號B2驅動節點32,產生電壓Nib 56a及56b。當 升壓訊號B2爲高時,Nib 56a爲大於Vcc之正電壓,電荷經” 通過閘”(pass gate)電路34分配輸出電容器C3,產生幫浦電 路輸出45,並具有一上升電壓,如圖三所示之Vout 57。 Vout 57中正上升持續直到電壓到達目標準位,此時幫浦電 路停止幫浦電流至輸出電容器C3 »當升壓訊號B2爲低時,” 通過閘”(pass gate)電路34關閉,節點32預充至Nib = Vcc 56b。 節點電壓Nla及Mb,在連接”通過閘”(pass gate)電 晶體39、40、43及44閘之”通過閘”(pass gate)控制訊號N2a 、N2b、P2a及P2b之控制之下,經”通過閘"(pass gate) 電路33及34連接幫浦電路輸出45。當N2a= Vph 51、P2a=0 V 53,”通過閘”(pass gate)33之N通道電晶體39及P通道 電晶體40傳導產生高電導,並自節點31連接電流,Nla 52a ,至輸出電容器C3,以產生輸出電壓Vout 57。當N2a= 0V 55、P2a= Vph 54,”通過閘"(pass _gai:e)33之Ν通道電晶 —.―^--_-------i -------" (請先鬩讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) 4 A7 __B7_ 五、發明説明(丨士) 體39及P通道電晶體40關閉,節點31上之電壓,Nla充至Vcc 52b。 當N2b= Vph 54、P2b=0 V 55,”通過鬧 ”(pass gate)34之N通道電晶體44及P通道電晶體43傳導產生高電 導’並自節點32連接電流’ Nib 56a ’至輸出電容器C3 ’以 產生輸出電壓Vout 57。當N2b= 0V 55、P2b= Vph 54 ’ ”通 過蘭”(pass gate)34之N通道電晶體44及P通道電晶體43關 閉,節點32上之電壓,Nib充至Vcc 56b。 當閘訊號N2a爲高準位,該準位爲Vph 51,且連接電 晶體39的源極之Nla亦爲高52a時,開啓”通過閘”(pass gate)33之N通道電晶體39。當閘訊號P2a爲0伏特53之低電 壓,且連接電晶體40的源極之Nla爲高52a時,開啓”通過閘 ”(pass gate)33之P通道電晶體40。 當閘訊號N2b爲高準位,該準位爲Vph 54,且連接電 晶體44的源極之Nib亦爲高56a時,開啓”通過閜”(pass gate)34之N通道電晶體44。當閘訊號P2b爲0伏特55之低電 壓,且連接電晶體43的源極之Nib爲高56a時,開啓”通過閘 ”(pass gate)34之P通道電晶體43。 再請參閿圖四,其繪示依據本發明實施例之數個Vpp 幫浦電路49連接複數字元線驅動器的方塊圖。Vpp幫浦電路 提供驅動器高電壓,約2倍Vcc,容許半導體記憶體之設計及 動作有適當的雜訊邊界(noise margin)。連接至Vpp幫浦電 路爲Vph幫浦電路48,用以提供Vpp幫浦電路49偏壓。Vph幫 浦電路之輸出,產生電壓Vph= Vout i Vth,其中,Vout爲 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (諳先閱讀背面之注意事項再填寫本K·) -裝. -訂 經濟部智慧財產局員工消費合作社印製 451214 A7 B7 五、發明説明(θ) (請先閱讀背面之注意事項再填寫本頁)54- N2b voltage is Vph value 55_N2a voltage is 0V The 56a, 56b-Nlb voltage (5) printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economy is described in detail in the following: Best embodiment. Please refer to FIG. 2, which is a circuit diagram of the Vpp pump circuit 49 of the present invention. The clock circuit 46 provides control logic 47 timings, which are produced by _; _ίο_; _ This paper size uses the Chinese National Standard (CNS) A4 specification (210X297 mm) 5 2 ί 4 · Α7 Β7 V. Description of the invention ((Ό) (please read the precautions on the back before filling this page). The complex control signals N2a, N2b, P2a and P2b. Booster circuit 30 is the same as the booster circuit of the conventional technology in Figure 1C. It uses two boosted signals to connect a "pass gate" transistor. The boosted signal Nla on node 31 and the boosted signal Nlb on node 32 are connected to two. "Pass gate" circuits 33 and 34, and Nla and Nib have the highest voltage value of about 2 times Vcc. The boost circuit is composed of transistors 35, 36, 37 and 38 and capacitors C1 and C2. Booster signal B1 is applied to capacitor C1 and to the source of transistors 35 and 36. Booster signal B1 is a clocked pulse, which has a minimum voltage of zero volts and The highest voltage is about Vcc, and the high voltage Vcc accounts for about 50% of the duty cycle. The boosted signal B2 is applied to capacitor C2 and to the source of transistors 37 and 38. The boosted signal B2 is a clock wave which is complementary to the boosted signal B1 and has a minimum voltage of zero volts and The highest voltage is about Vcc, and the high-voltage Vcc accounts for about 50% of the working cycle. The printed circuit 36 and 37 printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs are interactively coupled to provide feedback to each other, eliminating the effects on the boosted voltage on nodes 31 and 32 The threshold voltage effect of the transistor of amplitude. The gate of transistor 36 is connected to the source and node 32 of transistor 37, and the gate of transistor 37 is connected to the source and node 31 of transistor 36. The gate system of transistor 36 Driven by the boosted signal Nib on node 32, the gate of transistor 37 is driven by the boosted signal Nla on node 31. When the boosted signal Nib is high, the boosted signal Nla is low , Drive __: ____11 _ This paper size applies the Chinese National Standard (CNS) A4 specification (210 × 297 cm): > 4 δ 4 Printed by the Intellectual Property Bureau Staff Consumer Cooperatives 2 14214 A7 __B7_ V. Description of the invention ( (/) The power transistor 36 is fully turned on, The boosted signal on node 31 is approximately equal to the voltage level of Vcc. After the voltage on node 31 is about Vcc voltage, the boosted signal B1 is high, and the voltage Ma on node 31 is increased to approximately twice the value of Vcc And close transistor 36. Then, the boosted signal B1 drives Nla on the node 31 high, the boosted signal Nib is low, and the drive transistor 37 is fully turned on, so that the boosted signal on the node 32 reaches a voltage level approximately equal to Vcc. After the voltage at the node 32 is about Vcc, the boost signal B2 is high, the voltage Nib at the node 32 is increased to approximately twice the value of Vcc, and the transistor 37 is turned off. The boosted signal Nla on node 31 is connected to a "pass gate" circuit 33, and the boosted signal on node 32 is connected to a "pass gate" circuit 34. The "pass gate" circuits 33 and 34 connect the output Vout of the pump circuit and the capacitor C3 the pass gate circuit 33 includes transistors 39 and 40, which respectively connect the signal on node 31 to Vout 45 ° "The transistor 39 that passes through the (pass gate) circuit 33 is an N-channel transistor, and its gate is driven by the signal N2a, where N2a = Vph = Vpm + Vth, Vpm is the maximum amplitude of Vout, and Vth is N Threshold voltage of the channel transistor 39. Transistor 40 is a P-channel transistor in N-well. Its gate is driven by signal P2a, where P2a = Vph = Vpm + Vth. The N-well bias voltage Vph of the transistor 40 is equal to the voltage of the maximum amplitude of Vout plus the threshold voltage of the transistor 'to prevent the problem of circuit latch-up. "Pass gate, circuit 34 includes transistors 43 and 44, (#Read the precautions on the back before filling this page). Install. The size of the paper is applicable to China National Standards (CNS) A4 specifications ( 210X297 mm) A7 B7 451214 V. Description of the invention (丨 less) It connects the boosted signal Nib to Vout 45 on node 32 respectively. The transistor 34 of the "pass gate" circuit 44 is N Channel transistor, whose gate is driven by "pass gate" circuit signal N2b, where N2b = Vph = Vpm + Vth. Transistor 43 is a P-channel transistor in N-well, and its gate is "pass gate" ( Pass gate) circuit signal P2b driver, where P2b = Vph = Vpm + Vth 〇 N-well bias voltage Vph of transistor 43, the voltage equal to the maximum amplitude of Vout plus the threshold voltage of the transistor, to prevent the problem of circuit latch-up. Referring to the voltage waveform shown in FIG. 3, the amplitude and timing control of the gate signals N2a, N2b, P2a, and P2b enable the transistors 39 and 40 of the “pass gate” circuit 33 to be in a clock period. One half is fully on, and the transistors 44 and 43 of the "pass gate" circuit 34 The other half of the clock period is fully turned on. The gate control signals N2a, N2b, P2a, and P2b have a voltage of Vph or 0 volts, so that the "pass gate" transistor provides a high conductance. The preferred embodiment uses N-channel transistors and P-channel transistors in "pass gates" 33 and 34. Any number and type of transistors can be used to provide high conductance and connect the boosted signals Nla and Nib to output 45. For example, a single N-channel transistor or a single P-channel transistor can also be used. For higher conductance, two or more N-channel transistors or P-channel transistors can be used. See also Figure 3, which shows a waveform diagram according to an embodiment of the present invention. The timing boost signals B1 and B2 are complementary to each other and have 13 (please read the precautions on the back before filling this page). Printed by the Intellectual Property Bureau Staff Consumer Cooperatives This paper is printed in accordance with the Chinese National Standard (CNS) A4 specification (210X297 mm) Printed by the Consumer Assets Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 ___ B7 V. Description of invention (1 to date) 1 Pulse voltage from 0 volts to Vcc. Boost signal B1 drives node 31 to generate voltages Nla 52a and 52b 〇 When boost signal B1 is high, Nla 52a is a positive voltage greater than Vcc, and the charge is passed through The gate) circuit 33 distributes the output to the capacitor C3, generates a pump circuit output 45, and has a rising voltage, such as Vout 57 shown in -3. The positive rise in Vout 57 continues until the voltage is reached, at which point the pump circuit stops pumping current to the output capacitor C3. When the boost signal B1 is low, the "pass gate" circuit 33 is closed, and the node 31 is precharged to Nla = Vcc 52b. The boost signal B2 drives the node 32 to generate voltages Nib 56a and 56b. When the boost signal B2 is high, Nib 56a is a positive voltage greater than Vcc, and the charge is distributed to the output capacitor C3 via a "pass gate" circuit 34 to generate a pump circuit output 45 with a rising voltage, as shown in the figure. Vout 57 shown in three. The positive rise in Vout 57 continues until the voltage reaches the target level, at which time the pump circuit stops pumping current to the output capacitor C3 »When the boost signal B2 is low, the" pass gate "circuit 34 is closed, and the node 32 is preset. Charge to Nib = Vcc 56b. The node voltages Nla and Mb are controlled by the "pass gate" control signals N2a, N2b, P2a and P2b connected to the "pass gate" transistors 39, 40, 43 and 44. “Pass gate” circuits 33 and 34 are connected to the pump circuit output 45. When N2a = Vph 51, P2a = 0 V 53, “pass gate” N channel transistor 39 and P channel Transistor 40 conducts high conductance and connects current from node 31, Nla 52a, to output capacitor C3 to produce output voltage Vout 57. When N2a = 0V 55, P2a = Vph 54, "pass the gate" (pass _gai: e) 33 N-channel transistor —. — ^ --_------- i ------- " (Please read the precautions on the back before filling this page) This paper size applies China National Standard (CNS) A4 specification (210X297 mm) 4 A7 __B7_ V. Description of the invention (body) The body 39 and the P-channel transistor 40 are turned off, and the voltage on the node 31 is charged to Vcc 52b. When N2b = Vph 54, P2b = 0 V 55, the N-channel transistor 44 and P-channel transistor 43 pass through the pass gate 34 to generate high conductance, and connect the current 'Nib 56a' from node 32 to the output Capacitor C3 'to generate an output voltage Vout 57. When N2b = 0V 55, P2b = Vph 54 ', the N-channel transistor 44 and P-channel transistor 43 of the "pass gate" 34 are closed, and the voltage at node 32 is charged to Vcc 56b. When the gate signal N2a is a high level, the level is Vph 51, and the source Nla connected to the transistor 39 is also high 52a, the N-channel transistor 39 of the "pass gate" 33 is turned on. When the gate signal P2a is a low voltage of 0 volts 53 and the Nla of the source connected to the transistor 40 is high 52a, the P-channel transistor 40 of the "pass gate" 33 is turned on. When the gate signal N2b is at a high level, the level is Vph 54, and the source Nib connected to the transistor 44 is also high 56a, the N-channel transistor 44 of the "pass gate" 34 is turned on. When the gate signal P2b is a low voltage of 0 volts 55 and the source Nib connected to the transistor 43 is 56a high, the P-channel transistor 43 of the "pass gate" 34 is turned on. Please refer to FIG. 4 again, which shows a block diagram of a plurality of Vpp pump circuits 49 connected to a complex digital line driver according to an embodiment of the present invention. The Vpp pump circuit provides the driver with high voltage, about 2 times Vcc, allowing the design and operation of the semiconductor memory to have an appropriate noise margin. Connected to the Vpp pump circuit is a Vph pump circuit 48 for providing a bias to the Vpp pump circuit 49. The output of the Vph pump circuit generates the voltage Vph = Vout i Vth, where Vout is the paper size and applies the Chinese National Standard (CNS) A4 specification (210X297 mm) (谙 Please read the precautions on the back before filling in this K ·) -Installation. -Order printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives 451214 A7 B7 V. Description of the invention (θ) (Please read the precautions on the back before filling this page)
Vpp幫浦電路49之輸出電壓’約2倍Vcc,Vi:h係爲”通過閘 ”(pass gate)33及34之N通道電晶體39及44之臨限電壓,如 圖二所示。Vph幫浦電路48之輸出電壓,使Vpp幫浦電路”通 過閘”(pass gate)33及34之N通道電晶體完全開啓,並提供 P通道電晶體40及43之N井偏壓,防止電路閂鎖的問題。限 制電路50連接Vph幫浦電路48。限制電路50偵測Vph幫浦電路 48之輸出電壓。如Vph幫浦電路48之輸出電壓小於Vph,開啓 限制電路50 ,以致能Vph幫浦電路48,否則控制Vph幫浦電路 關閉。 VPP幫浦電路49爲高效率電路,產生輸出電壓Vout= Vpp,其約爲2倍Vcc,並連接以提供電力至記憶體陣列之字 元線驅動器。圖四所示之電路組態,提供需要的電壓偏壓多 數字元線驅動器,並需要唯一的高電壓Vph幫浦電路48 β數 個具效率之Vpp幫浦電路49利用自Vph幫浦電路48之輸出,產 生電壓以驅動多數字元線驅動器。 經濟部智慧財產局員工消費合作社印製 再請參閱圖五,其繪示產生高效率幫浦電壓之方法的 流程圖。60爲兩典型的互補(complimentary)升壓訊號連接 升壓電路,產生兩互補的升壓的訊號。61爲一第一升壓的訊 號連接至一第一”通過閘”(pass gate)電路。62爲一第二升 壓的訊號連接至一第二”通過閘”(pass gate)電路。63爲在 一時脈之一第一半週期,控制第一”通過閘”(pass gate)完 全開啓,產生高電導。64爲在一時脈之第一半週期,自第一 升壓的訊號傳導電流經第一”通過閘”(pass gate)至幫浦電 本紙張尺度逋用中國國家操準(CNS〉A4规格(210X297公釐)The output voltage of the Vpp pump circuit 49 is about 2 times Vcc, and Vi: h is the threshold voltage of the N-channel transistors 39 and 44 “pass gates” 33 and 34, as shown in FIG. The output voltage of the Vph pump circuit 48 enables the Vpp pump circuit to pass the N-channel transistors of pass gates 33 and 34 fully open, and provides the N-well bias voltage of the P-channel transistors 40 and 43 to prevent the circuit Latch problem. The limiting circuit 50 is connected to a Vph pump circuit 48. The limiting circuit 50 detects the output voltage of the Vph pump circuit 48. If the output voltage of the Vph pump circuit 48 is less than Vph, the limiting circuit 50 is turned on so that the Vph pump circuit 48 is enabled, otherwise the Vph pump circuit is controlled to be turned off. The VPP pump circuit 49 is a high-efficiency circuit that generates an output voltage Vout = Vpp, which is about 2 times Vcc, and is connected to provide power to the word line driver of the memory array. The circuit configuration shown in Figure 4 provides the required voltage-biased multi-digital line driver and requires the only high-voltage Vph pump circuit 48 β. Several efficient Vpp pump circuits 49 utilize the Vph pump circuit 48 The output generates voltage to drive the multi-digital line driver. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economics Please refer to Figure 5 again for a flowchart of a method for generating a high-efficiency pump voltage. 60 is two typical complementary boost signals connected to the boost circuit to generate two complementary boost signals. 61 is a first boosted signal connected to a first "pass gate" circuit. 62 is a second boosted signal connected to a second "pass gate" circuit. 63 is the first half cycle of one clock, which controls the first "pass gate" to fully open, resulting in high conductance. 64 is the first half cycle of one clock, the signal conducting current from the first boosted signal passes the first "pass gate" to Pudian's paper standard, using China National Standards (CNS> A4 specification ( 210X297 mm)
五、發明説明(/L) 路之輸出’ 65爲使經第一”通過蘭”(pass gate)之局電導, 高效率地充電至輸出電容器。 66爲在時脈之第二半週期,控制第二”通過閘”(pass gate)完全開啓’產生高電導。67爲在時脈之第二半週期, 自第二升壓的訊號傳導電流經第二”通過閘,,(pass gate)至 幫浦電路之輸出’ 68爲使經第二”通過閘”(pass gate)之高 電導’高效率地充電至輸出電容器,69爲產生幫浦電路輸出 電壓高時脈比,其約爲2倍Vcc。 以上所述充分顯示出本發明之目的及功效上均深富實 施之進步性’極具產業之利用價值,且爲目前市面上前所未 見之新發明’完全符合發明專利之要件,爰依法提出申請。 唯以上所述者’僅爲本發明之較佳實施例而已,當不 能以之限定本發明所實施之範圍。即大凡依本發明申請專利 範圍所作之均等變化與修飾,皆應仍麗於本發明專利涵蓋之 範圍內,謹請貴審查委員明鑑,並祈惠准,是所至禱。 II--.----ΓΤ 裝丨 — ./ '清乞竭黃疔&之主奪夢咦导真寫木頁·--V. Description of the Invention The output of the (/ L) circuit '65 is to make the first "pass gate" pass conductance to charge the output capacitor with high efficiency. 66 is the second half cycle of the clock, which controls the second "pass gate" to be fully turned on 'to generate high conductance. 67 is the second half cycle of the clock, and the signal conducting current from the second boosted signal passes through the second "pass gate," (pass gate) to the output of the pump circuit. 68 is the second "pass gate" ( The high conductance of the pass gate) is charged to the output capacitor with high efficiency. In order to generate a high clock ratio of the output voltage of the pump circuit, it is about 2 times Vcc. The above shows that the purpose and efficacy of the present invention are deep. The "progressive implementation" has great industrial use value, and is a new invention not seen in the market. It fully complies with the requirements of the invention patent, and applies according to law. Only the above mentioned ones are only a comparison of the present invention. Only the best embodiment, when the scope of the present invention can not be limited. That is to say, all equal changes and modifications made in accordance with the scope of the patent application of the present invention should still be within the scope of the invention patent, please ask your review committee Ming Jian, and praying for the right, is the most prayer. II --.---- ΓΤ 装 丨-./ 'Qing beg exhausted yellow 疔 & the master of the dream capture guide page ----
,1T, 1T
A 經濟部智慧財產局員工消費合作社印製 本紙張尺度逋用中國國家標準(CNS ) A4規格(210X297公釐)A Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs This paper uses the Chinese National Standard (CNS) A4 size (210X297 mm)
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Applications Claiming Priority (1)
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US09/246,421 US6198340B1 (en) | 1999-02-08 | 1999-02-08 | High efficiency CMOS pump circuit |
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TW451214B true TW451214B (en) | 2001-08-21 |
Family
ID=22930608
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TW088119008A TW451214B (en) | 1999-02-08 | 1999-11-02 | High efficiency CMOS pump circuit |
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US (1) | US6198340B1 (en) |
TW (1) | TW451214B (en) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080064044A9 (en) * | 1995-05-23 | 2008-03-13 | Nelson Randall W | Analysis of insulin-like growth factors from biological fluids by the use of affinity-based mass spectrometric methods |
JP4109340B2 (en) * | 1997-12-26 | 2008-07-02 | 株式会社ルネサステクノロジ | Semiconductor integrated circuit device |
US6570435B1 (en) * | 1999-11-18 | 2003-05-27 | Texas Instruments Incorporated | Integrated circuit with current limited charge pump and method |
EP1122887A1 (en) * | 2000-01-31 | 2001-08-08 | STMicroelectronics S.r.l. | Pre-charging circuit of an output buffer |
US6664846B1 (en) * | 2000-08-30 | 2003-12-16 | Altera Corporation | Cross coupled N-channel negative pump |
US6518829B2 (en) * | 2000-12-04 | 2003-02-11 | United Memories, Inc. | Driver timing and circuit technique for a low noise charge pump circuit |
US6501325B1 (en) * | 2001-01-18 | 2002-12-31 | Cypress Semiconductor Corp. | Low voltage supply higher efficiency cross-coupled high voltage charge pumps |
US7023259B1 (en) * | 2001-02-26 | 2006-04-04 | Cypress Semiconductor Corp. | High voltage switch with no latch-up hazards |
US20030016070A1 (en) * | 2001-07-17 | 2003-01-23 | Wenhua Yang | Bootstrap module for multi-stage circuit |
US20040100242A1 (en) * | 2002-02-22 | 2004-05-27 | Youichi Tobita | Voltage generation circuit |
KR100495430B1 (en) * | 2003-05-21 | 2005-06-14 | 삼성전자주식회사 | Tolerant input circuit |
US7088171B2 (en) * | 2003-06-13 | 2006-08-08 | Texas Instruments Incorporated | Charge pump with constant output current |
US20050024125A1 (en) * | 2003-08-01 | 2005-02-03 | Mcnitt John L. | Highly efficient, high current drive, multi-phase voltage multiplier |
KR100526344B1 (en) * | 2003-08-12 | 2005-11-08 | 삼성전자주식회사 | Apparatus and method for controlling boosted voltage |
JP4785411B2 (en) * | 2004-07-16 | 2011-10-05 | セイコーインスツル株式会社 | Charge pump circuit |
TWI273365B (en) * | 2004-08-17 | 2007-02-11 | Amic Technology Corp | Boost circuit with a voltage detector |
US7936023B1 (en) | 2006-09-26 | 2011-05-03 | Cypress Semiconductor Corporation | High voltage diode |
US7855592B1 (en) | 2006-09-28 | 2010-12-21 | Cypress Semiconductor Corporation | Charge pump |
US8143934B1 (en) * | 2008-07-01 | 2012-03-27 | Cypress Semiconductor Corporation | Analog switching system for low cross-talk |
KR20100138146A (en) * | 2009-06-24 | 2010-12-31 | 삼성전자주식회사 | High efficiency charge pump |
US8441307B2 (en) * | 2009-09-01 | 2013-05-14 | Aptus Power Semiconductor | Methods and circuits for a low input voltage charge pump |
US9246382B2 (en) * | 2013-08-08 | 2016-01-26 | Micron Technology, Inc. | Charge pump including supply voltage-based control signal level |
TWI660564B (en) * | 2018-06-01 | 2019-05-21 | 杰力科技股份有限公司 | Voltage converting circuit and control circuit thereof |
CN116137493A (en) * | 2021-11-17 | 2023-05-19 | 科奇芯有限公司 | Charge pump circuit |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4673829A (en) | 1982-02-08 | 1987-06-16 | Seeq Technology, Inc. | Charge pump for providing programming voltage to the word lines in a semiconductor memory array |
JP2607733B2 (en) | 1990-05-31 | 1997-05-07 | シャープ株式会社 | Semiconductor memory device booster circuit |
JPH04129089A (en) | 1990-09-19 | 1992-04-30 | Mitsubishi Electric Corp | Dynamic semiconductor memory |
US5600277A (en) * | 1995-05-09 | 1997-02-04 | Texas Instruments Incorporated | Apparatus and method for a NMOS redundancy fuse passgate circuit using a VPP supply |
KR0179852B1 (en) * | 1995-10-25 | 1999-04-15 | 문정환 | Charge pumping circuit |
US5933047A (en) * | 1997-04-30 | 1999-08-03 | Mosaid Technologies Incorporated | High voltage generating circuit for volatile semiconductor memories |
-
1999
- 1999-02-08 US US09/246,421 patent/US6198340B1/en not_active Expired - Lifetime
- 1999-11-02 TW TW088119008A patent/TW451214B/en not_active IP Right Cessation
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