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TW327253B - The manufacturing method of metallization for IC - Google Patents

The manufacturing method of metallization for IC

Info

Publication number
TW327253B
TW327253B TW086107268A TW86107268A TW327253B TW 327253 B TW327253 B TW 327253B TW 086107268 A TW086107268 A TW 086107268A TW 86107268 A TW86107268 A TW 86107268A TW 327253 B TW327253 B TW 327253B
Authority
TW
Taiwan
Prior art keywords
metal layer
metallization
etching technology
dielectric
layer
Prior art date
Application number
TW086107268A
Other languages
Chinese (zh)
Inventor
Horng-Huei Tzeng
Original Assignee
Vanguard Int Semiconduct Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vanguard Int Semiconduct Corp filed Critical Vanguard Int Semiconduct Corp
Priority to TW086107268A priority Critical patent/TW327253B/en
Application granted granted Critical
Publication of TW327253B publication Critical patent/TW327253B/en

Links

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  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

A manufacturing method of metallization for IC includes following steps: - Form electrical device on semiconductor substrate, that electrical device includes conductive area; - Deposit a dielectric layer, and planarization that dielectric; - Use lithographic and etching technology to etch dielectric layer to form hole till the conductive area; - Form barrier metal layer; - Form buffer metal layer; - Form stuffing metal layer; - Use etching technology to proceed etching back on stuffing metal layer to form metal stud inside the hole; - Form 1st metal layer, and use lithographic and etching technology to etch 1st metal layer, buffer metal layer and barrier metal layer to finish metallization of IC.
TW086107268A 1997-05-23 1997-05-23 The manufacturing method of metallization for IC TW327253B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086107268A TW327253B (en) 1997-05-23 1997-05-23 The manufacturing method of metallization for IC

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086107268A TW327253B (en) 1997-05-23 1997-05-23 The manufacturing method of metallization for IC

Publications (1)

Publication Number Publication Date
TW327253B true TW327253B (en) 1998-02-21

Family

ID=58262338

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086107268A TW327253B (en) 1997-05-23 1997-05-23 The manufacturing method of metallization for IC

Country Status (1)

Country Link
TW (1) TW327253B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412119B (en) * 2003-08-22 2013-10-11 Agere Systems Inc Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412119B (en) * 2003-08-22 2013-10-11 Agere Systems Inc Semiconductor device

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees