TW290743B - - Google Patents
Info
- Publication number
- TW290743B TW290743B TW085102056A TW85102056A TW290743B TW 290743 B TW290743 B TW 290743B TW 085102056 A TW085102056 A TW 085102056A TW 85102056 A TW85102056 A TW 85102056A TW 290743 B TW290743 B TW 290743B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/925—Fluid growth doping control, e.g. delta doping
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6805195A JPH08264836A (ja) | 1995-03-27 | 1995-03-27 | 化合物半導体発光素子およびその製造方法 |
JP6804795A JPH08264835A (ja) | 1995-03-27 | 1995-03-27 | 化合物半導体発光素子およびその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW290743B true TW290743B (zh) | 1996-11-11 |
Family
ID=26409291
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085102056A TW290743B (zh) | 1995-03-27 | 1996-02-23 |
Country Status (6)
Country | Link |
---|---|
US (2) | US5665986A (zh) |
EP (1) | EP0735598A3 (zh) |
KR (1) | KR960036160A (zh) |
CN (1) | CN1082255C (zh) |
CA (1) | CA2170922C (zh) |
TW (1) | TW290743B (zh) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5909040A (en) * | 1994-03-09 | 1999-06-01 | Kabushiki Kaisha Toshiba | Semiconductor device including quaternary buffer layer with pinholes |
JP3771952B2 (ja) * | 1995-06-28 | 2006-05-10 | ソニー株式会社 | 単結晶iii−v族化合物半導体層の成長方法、発光素子の製造方法およびトランジスタの製造方法 |
JPH0983017A (ja) * | 1995-09-08 | 1997-03-28 | Sumitomo Electric Ind Ltd | エピタキシャルウェハおよびその製造方法 |
JP2925004B2 (ja) * | 1996-03-22 | 1999-07-26 | 日本電気株式会社 | 窒化ガリウムの結晶成長方法 |
JP3164016B2 (ja) * | 1996-05-31 | 2001-05-08 | 住友電気工業株式会社 | 発光素子および発光素子用ウエハの製造方法 |
US6030848A (en) * | 1996-06-28 | 2000-02-29 | Kabushiki Kaisha Toshiba | Method for manufacturing a GaN-based compound semiconductor light emitting device |
US5684309A (en) * | 1996-07-11 | 1997-11-04 | North Carolina State University | Stacked quantum well aluminum indium gallium nitride light emitting diodes |
JPH111399A (ja) * | 1996-12-05 | 1999-01-06 | Lg Electron Inc | 窒化ガリウム半導体単結晶基板の製造方法並びにその基板を用いた窒化ガリウムダイオード |
US6091083A (en) * | 1997-06-02 | 2000-07-18 | Sharp Kabushiki Kaisha | Gallium nitride type compound semiconductor light-emitting device having buffer layer with non-flat surface |
DE19725900C2 (de) * | 1997-06-13 | 2003-03-06 | Dieter Bimberg | Verfahren zur Abscheidung von Galliumnitrid auf Silizium-Substraten |
US6559467B2 (en) * | 1997-11-18 | 2003-05-06 | Technologies And Devices International, Inc. | P-n heterojunction-based structures utilizing HVPE grown III-V compound layers |
JP4166885B2 (ja) | 1998-05-18 | 2008-10-15 | 富士通株式会社 | 光半導体装置およびその製造方法 |
US6194742B1 (en) | 1998-06-05 | 2001-02-27 | Lumileds Lighting, U.S., Llc | Strain engineered and impurity controlled III-V nitride semiconductor films and optoelectronic devices |
KR100495215B1 (ko) * | 2002-12-27 | 2005-06-14 | 삼성전기주식회사 | 수직구조 갈륨나이트라이드 발광다이오드 및 그 제조방법 |
JP3841092B2 (ja) | 2003-08-26 | 2006-11-01 | 住友電気工業株式会社 | 発光装置 |
JP2005191530A (ja) * | 2003-12-03 | 2005-07-14 | Sumitomo Electric Ind Ltd | 発光装置 |
US7872268B2 (en) * | 2004-04-22 | 2011-01-18 | Cree, Inc. | Substrate buffer structure for group III nitride devices |
CN101656288B (zh) * | 2005-07-06 | 2013-06-12 | Lg伊诺特有限公司 | 氮化物半导体led |
CN100550443C (zh) * | 2005-07-06 | 2009-10-14 | Lg伊诺特有限公司 | 氮化物半导体led及其制造方法 |
US7585769B2 (en) * | 2006-05-05 | 2009-09-08 | Applied Materials, Inc. | Parasitic particle suppression in growth of III-V nitride films using MOCVD and HVPE |
TWI309439B (en) * | 2006-09-05 | 2009-05-01 | Ind Tech Res Inst | Nitride semiconductor and method for forming the same |
US9064706B2 (en) * | 2006-11-17 | 2015-06-23 | Sumitomo Electric Industries, Ltd. | Composite of III-nitride crystal on laterally stacked substrates |
WO2010017136A1 (en) * | 2008-08-04 | 2010-02-11 | Amir Dassoud Dabiran | Microchannel plate photocathode |
JP5378829B2 (ja) * | 2009-02-19 | 2013-12-25 | 住友電気工業株式会社 | エピタキシャルウエハを形成する方法、及び半導体素子を作製する方法 |
US8933543B2 (en) | 2010-04-02 | 2015-01-13 | Panasonic Intellectual Property Management Co., Ltd. | Nitride semiconductor element having m-plane angled semiconductor region and electrode including Mg and Ag |
DE102011002146B4 (de) * | 2011-04-18 | 2023-03-09 | Aixtron Se | Vorrichtung und Verfahren zum Abscheiden von Halbleiterschichten mit HCI-Zugabe zur Unterdrückung parasitären Wachstums |
DE102011002145B4 (de) * | 2011-04-18 | 2023-02-09 | Aixtron Se | Vorrichtung und Verfahren zum großflächigen Abscheiden von Halbleiterschichten mit gasgetrennter HCI-Einspeisung |
CN103258722A (zh) * | 2013-04-27 | 2013-08-21 | 中国电子科技集团公司第十三研究所 | GaAs衬底采用AlGaInN缓冲层生长三族氮化物的方法 |
CN106328771B (zh) * | 2015-07-04 | 2018-08-17 | 东莞市中镓半导体科技有限公司 | 一种在金属氮化镓复合衬底上外延无裂纹高晶体质量led外延层的方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5218216A (en) * | 1987-01-31 | 1993-06-08 | Toyoda Gosei Co., Ltd. | Gallium nitride group semiconductor and light emitting diode comprising it and the process of producing the same |
US5278433A (en) * | 1990-02-28 | 1994-01-11 | Toyoda Gosei Co., Ltd. | Light-emitting semiconductor device using gallium nitride group compound with double layer structures for the n-layer and/or the i-layer |
US5281830A (en) * | 1990-10-27 | 1994-01-25 | Toyoda Gosei Co., Ltd. | Light-emitting semiconductor device using gallium nitride group compound |
JPH088217B2 (ja) * | 1991-01-31 | 1996-01-29 | 日亜化学工業株式会社 | 窒化ガリウム系化合物半導体の結晶成長方法 |
DE69229265T2 (de) * | 1991-03-18 | 1999-09-23 | Trustees Of Boston University, Boston | Verfahren zur herstellung und dotierung hochisolierender dünner schichten aus monokristallinem galliumnitrid |
JP3155007B2 (ja) * | 1991-07-05 | 2001-04-09 | 三菱化学株式会社 | 化合物半導体とその製造方法 |
JP2666228B2 (ja) * | 1991-10-30 | 1997-10-22 | 豊田合成株式会社 | 窒化ガリウム系化合物半導体発光素子 |
US5400740A (en) * | 1992-02-06 | 1995-03-28 | Mitsubishi Chemical Corporation | Method of preparing compound semiconductor |
JP3247437B2 (ja) * | 1992-03-10 | 2002-01-15 | 旭化成株式会社 | 窒化物系半導体素子およびその製造方法 |
US5578839A (en) * | 1992-11-20 | 1996-11-26 | Nichia Chemical Industries, Ltd. | Light-emitting gallium nitride-based compound semiconductor device |
US5523589A (en) * | 1994-09-20 | 1996-06-04 | Cree Research, Inc. | Vertical geometry light emitting diode with group III nitride active layer and extended lifetime |
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1996
- 1996-02-23 TW TW085102056A patent/TW290743B/zh not_active IP Right Cessation
- 1996-03-04 CA CA002170922A patent/CA2170922C/en not_active Expired - Fee Related
- 1996-03-07 US US08/614,837 patent/US5665986A/en not_active Expired - Lifetime
- 1996-03-07 EP EP96103584A patent/EP0735598A3/en not_active Withdrawn
- 1996-03-12 KR KR1019960006429A patent/KR960036160A/ko not_active Application Discontinuation
- 1996-03-27 CN CN96104423A patent/CN1082255C/zh not_active Expired - Fee Related
-
1997
- 1997-05-15 US US08/856,911 patent/US5756374A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CA2170922C (en) | 2000-02-01 |
CN1082255C (zh) | 2002-04-03 |
EP0735598A3 (en) | 1998-09-23 |
US5665986A (en) | 1997-09-09 |
CA2170922A1 (en) | 1996-09-28 |
KR960036160A (ko) | 1996-10-28 |
US5756374A (en) | 1998-05-26 |
EP0735598A2 (en) | 1996-10-02 |
CN1137690A (zh) | 1996-12-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |