TW253975B - - Google Patents
Info
- Publication number
- TW253975B TW253975B TW082106467A TW82106467A TW253975B TW 253975 B TW253975 B TW 253975B TW 082106467 A TW082106467 A TW 082106467A TW 82106467 A TW82106467 A TW 82106467A TW 253975 B TW253975 B TW 253975B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24363892 | 1992-09-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW253975B true TW253975B (zh) | 1995-08-11 |
Family
ID=51401513
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW082106467A TW253975B (zh) | 1992-09-11 | 1993-08-12 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR940008040A (zh) |
TW (1) | TW253975B (zh) |
-
1993
- 1993-08-12 TW TW082106467A patent/TW253975B/zh not_active IP Right Cessation
- 1993-09-10 KR KR1019930018279A patent/KR940008040A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR940008040A (ko) | 1994-04-28 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |