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TW202429962A - Camera module packaging structure - Google Patents

Camera module packaging structure Download PDF

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TW202429962A
TW202429962A TW112100282A TW112100282A TW202429962A TW 202429962 A TW202429962 A TW 202429962A TW 112100282 A TW112100282 A TW 112100282A TW 112100282 A TW112100282 A TW 112100282A TW 202429962 A TW202429962 A TW 202429962A
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camera module
circuit board
chip
packaging structure
photosensitive
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TW112100282A
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Chinese (zh)
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TWI835506B (en
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彭貴鋒
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新煒科技有限公司
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Abstract

The present application provides a camera module packaging structure, including a flexible circuit board, an embedded printed circuit board, and a camera module with chip scale package. The present application adopts a no-flow underfill, which simplifies the process flow, and the thermal curing time of the no-flow underfill is short, which is conducive to protecting semiconductor components and improving service life. In addition, the no-flow underfill can be used for the reflow step, and the application scope is wider. The present application can form a stable structure of vertical conduction and horizontal insulation between the camera module with chip scale package and the flexible circuit board by setting anisotropic conductive film.

Description

相機模組封裝結構Camera module packaging structure

本申請涉及一種相機模組封裝結構。This application relates to a camera module packaging structure.

相機模組加工的核心技術是封裝工藝,目前有四種主流的封裝技術,即CSP(Chip Scale Package,晶片級封裝)、COB(Chip on Board,板上封裝)、COF(Chip on FPC,覆晶薄膜)和FC(Flip Chip,倒裝晶片)。CSP中,晶圓背面延伸線路後一般會製作球柵陣列(Ball Grid Array,BGA)。CSP的優點包括封裝後的晶片尺寸與晶粒大小相當,適合應用於可攜式電子產品(例如,手機等)。The core technology of camera module processing is packaging technology. There are currently four mainstream packaging technologies, namely CSP (Chip Scale Package), COB (Chip on Board), COF (Chip on FPC) and FC (Flip Chip). In CSP, a ball grid array (BGA) is generally made after the circuit is extended on the back of the wafer. The advantages of CSP include that the chip size after packaging is equivalent to the grain size, which is suitable for application in portable electronic products (such as mobile phones, etc.).

底部填充劑(Underfill,一種化學膠水,主要成分為環氧樹脂)現已廣泛用於晶片背面的BGA,以提高晶片焊接於電路板後跌落時的可靠性。但是,現有的使用Underfill製程太繁瑣冗長,且所需使用的設備也多。Underfill (a chemical glue whose main component is epoxy resin) is now widely used on the back of the BGA chip to improve the reliability of the chip when it falls after being soldered to the circuit board. However, the existing underfill process is too cumbersome and lengthy, and requires a lot of equipment.

有鑑於此,本申請提出一種相機模組封裝結構,以簡化工藝流程。In view of this, this application proposes a camera module packaging structure to simplify the process flow.

本申請一實施方式提供一種相機模組封裝結構,其包括:An embodiment of the present application provides a camera module packaging structure, which includes:

柔性電路板;Flexible circuit board;

嵌入式印刷電路板,所述嵌入式印刷電路板與所述柔性電路板通過異方性導電膠電連接;和an embedded printed circuit board, the embedded printed circuit board being electrically connected to the flexible circuit board via anisotropic conductive glue; and

晶片級封裝相機模組,所述晶片級封裝相機模組設於所述嵌入式印刷電路板背離所述柔性電路板的一側,所述晶片級封裝相機模組與所述嵌入式印刷電路板之間通過非流動底部填充劑連接。A chip-level packaged camera module is arranged on a side of the embedded printed circuit board away from the flexible circuit board, and the chip-level packaged camera module is connected to the embedded printed circuit board through a non-flowing bottom filler.

一種實施方式中,所述非流動底部填充劑包括助焊劑和底部填充劑。In one embodiment, the no-flow underfill includes flux and underfill.

一種實施方式中,所述底部填充劑包括環氧樹脂。In one embodiment, the underfill comprises epoxy.

一種實施方式中,所述晶片級封裝相機模組包括基板、感光晶片、紅外濾光片和封裝部。所述基板包括相對設置的第一表面和第二表面,所述感光晶片設於所述第一表面。所述封裝部設於所述第一表面並包覆所述感光晶片,所述紅外濾光片設於所述封裝部上並與所述感光晶片相對設置。In one embodiment, the chip-level package camera module includes a substrate, a photosensitive chip, an infrared filter and a packaging part. The substrate includes a first surface and a second surface arranged opposite to each other, and the photosensitive chip is arranged on the first surface. The packaging part is arranged on the first surface and covers the photosensitive chip, and the infrared filter is arranged on the packaging part and arranged opposite to the photosensitive chip.

一種實施方式中,所述基板的所述第二表面設有球柵陣列。In one embodiment, a ball grid array is disposed on the second surface of the substrate.

一種實施方式中,所述晶片級封裝相機模組還包括被動元件。所述被動元件設於所述第一表面,所述被動元件被所述封裝部包覆。In one implementation, the wafer-level package camera module further includes a passive element. The passive element is disposed on the first surface and is covered by the packaging portion.

一種實施方式中,所述晶片級封裝相機模組還包括設置在所述封裝部上的鏡頭單元,所述鏡頭單元包括鏡頭和音圈馬達。In one implementation, the wafer-level package camera module further includes a lens unit disposed on the packaging portion, and the lens unit includes a lens and a voice coil motor.

一種實施方式中,所述感光晶片包括感光區和非感光區,所述紅外濾光片與所述感光區相對設置。In one implementation, the photosensitive chip includes a photosensitive area and a non-photosensitive area, and the infrared filter is arranged opposite to the photosensitive area.

一種實施方式中,所述感光晶片通過金屬導線與所述基板電連接。In one implementation, the photosensitive chip is electrically connected to the substrate via metal wires.

一種實施方式中,所述封裝部的材質包括固化膠。In one implementation, the material of the packaging portion includes curing glue.

本申請採用非流動底部填充劑,其在前期充當助焊劑角色,在回焊爐中轉換成黏合劑進行底部填充,回流焊過程可同時完成焊球焊接和所述非流動底部填充劑的固化。由於省略了施加助焊劑和去除助焊劑等步驟,進而簡化了工藝流程,且所述非流動底部填充劑的熱固化時間短,有利於保護半導體元器件,提高其使用壽命。另外,所述非流動底部填充劑可用於回流焊步驟,適用範圍更廣。並且,本申請通過設置異方性導電膠,可使晶片級封裝相機模組與柔性電路板之間形成垂直導通、橫向絕緣的穩定結構。This application uses a non-flowing bottom filler, which acts as a flux in the early stage and is converted into an adhesive for bottom filling in the reflow furnace. The reflow process can simultaneously complete solder ball welding and curing of the non-flowing bottom filler. Since the steps of applying flux and removing flux are omitted, the process flow is simplified, and the thermal curing time of the non-flowing bottom filler is short, which is beneficial to protect semiconductor components and improve their service life. In addition, the non-flowing bottom filler can be used in the reflow step, and has a wider range of applications. Moreover, by providing anisotropic conductive glue, this application can form a stable structure with vertical conduction and lateral insulation between the chip-level packaged camera module and the flexible circuit board.

除非另有定義,本文所使用的所有的技術和科學術語與屬於本申請實施例的技術領域的技術人員通常理解的含義相同。本文中所使用的術語只是為了描述具體的實施方式的目的,不是旨在於限制本申請實施例。Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present application embodiments. The terms used herein are only for the purpose of describing specific implementations and are not intended to limit the present application embodiments.

將理解,當一層被稱為“在”另一層“上”時,它可以直接在該另一層上或者可以在其間存在中間層。相反,當一層被稱為“直接在”另一層“上”時,不存在中間層。It will be understood that when a layer is referred to as being “on” another layer, it can be directly on the other layer or intervening layers may be present therebetween. In contrast, when a layer is referred to as being “directly on” another layer, there are no intervening layers.

這裡參考剖面圖描述本申請的實施例,這些剖面圖是本申請理想化的實施例(和中間構造)的示意圖。因而,由於製造工藝和/或公差而導致的圖示的形狀不同是可以預見的。因此,本申請的實施例不應解釋為限於這裡圖示的區域的特定形狀,而應包括例如由於製造而產生的形狀的偏差。圖中所示的區域本身僅是示意性的,它們的形狀並非用於圖示裝置的實際形狀,並且並非用於限制本申請的範圍。Embodiments of the present application are described herein with reference to cross-sectional views, which are schematic illustrations of idealized embodiments (and intermediate configurations) of the present application. As such, variations in the shapes illustrated due to manufacturing processes and/or tolerances are to be expected. Therefore, embodiments of the present application should not be construed as limited to the specific shapes of the regions illustrated herein, but should include deviations in shapes resulting, for example, from manufacturing. The regions illustrated in the figures are schematic in themselves, their shapes are not intended to illustrate the actual shapes of the devices, and are not intended to limit the scope of the present application.

下面結合附圖,對本申請的一些實施方式作詳細說明。在不衝突的情況下,下述的實施方式及實施方式中的特徵可以相互組合。The following is a detailed description of some implementations of the present application in conjunction with the attached drawings. In the absence of conflict, the following implementations and features in the implementations can be combined with each other.

請參閱圖1和圖2,本申請一實施例提供一種相機模組封裝結構100,其包括柔性電路板10、嵌入式印刷電路板30和晶片級封裝相機模組50。所述嵌入式印刷電路板30與所述柔性電路板10通過異方性導電膠20電連接。所述嵌入式印刷電路板30指的是,其上的被動元件(Passive Components,也即無源元件,例如電容、電阻等)嵌入至電路板內部的結構,如此,能縮小電路板尺寸,有利於降低整體的相機模組封裝結構100的尺寸。所述晶片級封裝相機模組50設於所述嵌入式印刷電路板30背離所述柔性電路板10的一側,所述晶片級封裝相機模組50與所述嵌入式印刷電路板30之間通過非流動底部填充劑40連接。Referring to FIG. 1 and FIG. 2 , an embodiment of the present application provides a camera module package structure 100, which includes a flexible circuit board 10, an embedded printed circuit board 30, and a wafer-level packaged camera module 50. The embedded printed circuit board 30 is electrically connected to the flexible circuit board 10 through an anisotropic conductive adhesive 20. The embedded printed circuit board 30 refers to a structure in which the passive components (i.e., passive components, such as capacitors, resistors, etc.) thereon are embedded into the circuit board, so that the size of the circuit board can be reduced, which is conducive to reducing the size of the overall camera module package structure 100. The WLP camera module 50 is disposed on a side of the embedded printed circuit board 30 away from the flexible circuit board 10 , and the WLP camera module 50 is connected to the embedded printed circuit board 30 via a non-flowing bottom filler 40 .

底部填充劑(Underfill)的應用原理是利用毛細作用使得膠水迅速流過BGA晶片底部,從而對BGA晶片進行底部填充,然後利用加熱對膠水進行固化,將BGA底部空隙大面積(一般覆蓋80%以上)填充滿從而達到加固的目的,增強BGA晶片與其連接的電路板之間的抗跌落性能。底部填充劑的結合過程一般為:施加助焊劑、熱壓、去除助焊劑、施加底部填充劑、熱壓等。本申請採用非流動底部填充劑40(No-flow Underfill),其在前期充當助焊劑角色,在回焊爐中轉換成黏合劑進行底部填充。所述非流動底部填充劑40可在焊球貼片前點好,回流焊過程可同時完成焊球焊接和所述非流動底部填充劑40的固化。由於不需要助焊劑從而可省略施加助焊劑和去除助焊劑等步驟,進而簡化了工藝流程,且所述非流動底部填充劑40的熱固化時間短,有利於保護半導體元器件,提高其使用壽命。另外,所述非流動底部填充劑40可用於回流焊步驟,適用範圍更廣。The application principle of underfill is to use the capillary action to make the glue flow quickly through the bottom of the BGA chip, thereby filling the bottom of the BGA chip, and then using heat to cure the glue to fill a large area of the BGA bottom gap (generally covering more than 80%) to achieve the purpose of reinforcement and enhance the anti-drop performance between the BGA chip and the circuit board connected to it. The bonding process of the underfill is generally: applying flux, hot pressing, removing flux, applying underfill, hot pressing, etc. This application uses a non-flow underfill 40, which acts as a flux in the early stage and is converted into an adhesive in the reflow furnace for underfilling. The non-flow bottom filler 40 can be applied before solder ball placement, and the reflow process can simultaneously complete solder ball bonding and curing of the non-flow bottom filler 40. Since no flux is required, the steps of applying and removing the flux can be omitted, thereby simplifying the process flow. The non-flow bottom filler 40 has a short thermal curing time, which is beneficial to protecting semiconductor components and improving their service life. In addition, the non-flow bottom filler 40 can be used in the reflow step, and has a wider range of applications.

異方性導電膠20(Anisotropic Conductive Film,ACF)以高品質的樹脂及導電粒子組合而成,主要用於連接需要互相導通的基材與線路,具有上下垂直(Z軸)電氣導通、左右平面(X、Y軸)絕緣的特性,並且具有優良的防濕、接著功能。ACF可通過Bonding機台壓合(溫度約為150~200℃),但因為還有回流焊製程,本申請所述異方性導電膠20需選擇可耐高溫(250℃以上)的異方性導電膠,能經受回流焊的爐溫溫度(峰值約250~260℃)。本申請通過設置異方性導電膠20,可使晶片級封裝相機模組50與柔性電路板(FPC)10之間形成垂直導通、橫向絕緣的穩定結構,解決了FPC等元器件無法通過高溫鉛錫焊接而完成線路連接的問題。Anisotropic Conductive Film (ACF) is a combination of high-quality resin and conductive particles. It is mainly used to connect substrates and circuits that need to be connected to each other. It has the characteristics of vertical electrical conduction (Z axis) and insulation in the left and right planes (X and Y axes), and has excellent moisture-proof and bonding functions. ACF can be pressed by a bonding machine (temperature is about 150~200℃), but because there is also a reflow soldering process, the anisotropic conductive glue 20 described in this application needs to be selected to be an anisotropic conductive glue that can withstand high temperatures (above 250℃) and can withstand the furnace temperature of the reflow soldering (peak temperature is about 250~260℃). The present application forms a stable structure with vertical conduction and lateral insulation between the chip-level packaged camera module 50 and the flexible circuit board (FPC) 10 by providing anisotropic conductive adhesive 20, thereby solving the problem that components such as FPC cannot be connected to circuits by high-temperature lead-tin welding.

一些實施例中,所述非流動底部填充劑40包括助焊劑和底部填充劑。所述助焊劑可為本領域常規或非常規的助焊劑,本申請並不作限制。例如,助焊劑可為含有無機酸的助焊劑,其主要成分為鹽酸、氫氟酸等;助焊劑也可為含有無機鹽的助焊劑,其主要成分為氯化鋅、氯化銨等。In some embodiments, the non-flowing bottom filler 40 includes a flux and a bottom filler. The flux may be a conventional or unconventional flux in the art, and the present application does not limit it. For example, the flux may be a flux containing an inorganic acid, the main components of which are hydrochloric acid, hydrofluoric acid, etc.; the flux may also be a flux containing an inorganic salt, the main components of which are zinc chloride, ammonium chloride, etc.

進一步地,所述底部填充劑可為但不限於環氧樹脂。Furthermore, the bottom filler may be but is not limited to epoxy resin.

如圖2所示,一些實施例中,所述晶片級封裝相機模組50包括基板51、感光晶片52、紅外濾光片53和封裝部54。所述基板51可為本領域習知的印刷電路板(PCB),所述基板51包括相對設置的第一表面511和第二表面512。As shown in Fig. 2, in some embodiments, the wafer-level package camera module 50 includes a substrate 51, a photosensitive chip 52, an infrared filter 53 and a packaging part 54. The substrate 51 can be a printed circuit board (PCB) known in the art, and the substrate 51 includes a first surface 511 and a second surface 512 arranged opposite to each other.

所述感光晶片52設於所述第一表面511,且大致位於所述第一表面511的中間位置。所述感光晶片52用於獲取外接影像,具體可為COMS(Complementary Metal Oxide Semiconductor,CMOS,互補金屬氧化物半導體)感光晶片。The photosensitive chip 52 is disposed on the first surface 511 and is approximately located in the middle of the first surface 511. The photosensitive chip 52 is used to obtain external images, and can be specifically a CMOS (Complementary Metal Oxide Semiconductor) photosensitive chip.

進一步地,所述感光晶片52可包括感光區521和非感光區522,感光區521大致位於所述感光晶片52的中部,其餘部分則構成非感光區522。所述感光晶片52可通過金屬導線60與所述基板51電連接。具體的,所述金屬導線60的一端可以焊接在感光晶片52的非感光區522的焊墊(圖未示)上,另一端焊接於基板51的電路上,從而形成電連接。所述金屬導線60可為但不限於金線、銀線等。Furthermore, the photosensitive chip 52 may include a photosensitive area 521 and a non-photosensitive area 522, wherein the photosensitive area 521 is approximately located in the middle of the photosensitive chip 52, and the remaining part constitutes the non-photosensitive area 522. The photosensitive chip 52 may be electrically connected to the substrate 51 via a metal wire 60. Specifically, one end of the metal wire 60 may be welded to a pad (not shown) of the non-photosensitive area 522 of the photosensitive chip 52, and the other end may be welded to a circuit of the substrate 51, thereby forming an electrical connection. The metal wire 60 may be, but is not limited to, a gold wire, a silver wire, etc.

所述封裝部54設於所述第一表面511並包覆所述感光晶片52。可以理解,所述封裝部54對金屬導線60也形成了包覆,從而有利於防止金屬導線60的斷裂及氧化。所述紅外濾光片53設於所述封裝部54上並與所述感光晶片52相對設置。具體的,所述紅外濾光片53與所述感光晶片52的感光區521相對設置。The packaging part 54 is disposed on the first surface 511 and covers the photosensitive chip 52. It can be understood that the packaging part 54 also covers the metal wire 60, which is beneficial to prevent the metal wire 60 from breaking and oxidation. The infrared filter 53 is disposed on the packaging part 54 and is disposed opposite to the photosensitive chip 52. Specifically, the infrared filter 53 is disposed opposite to the photosensitive area 521 of the photosensitive chip 52.

一些實施例中,所述紅外濾光片53直接固定在封裝部54上,即,在填充膠水或注塑膠形成封裝部54時,將紅外濾光片53放置在與感光晶片52的感光區521上方對應的位置上,在膠體固化的同時使紅外濾光片53黏接在封裝部54上。也即,一些實施例中,所述封裝部54由固化膠固化而成,所述固化膠可為但不限於紫外固化膠等。In some embodiments, the infrared filter 53 is directly fixed on the packaging part 54, that is, when filling glue or injecting glue to form the packaging part 54, the infrared filter 53 is placed at a position corresponding to the upper part of the photosensitive area 521 of the photosensitive chip 52, and the infrared filter 53 is bonded to the packaging part 54 while the glue is solidified. That is, in some embodiments, the packaging part 54 is formed by curing the curing glue, and the curing glue can be but is not limited to ultraviolet curing glue, etc.

如圖2所示,一些實施例中,所述晶片級封裝相機模組50還包括被動元件55。所述被動元件55設於所述第一表面511,大致位於所述基板51的端部區域。所述被動元件55被所述封裝部54包覆,使所述被動元件55不易脫落。所述被動元件55可為但不限於電阻、電容等元器件。As shown in FIG. 2 , in some embodiments, the wafer-level package camera module 50 further includes a passive element 55. The passive element 55 is disposed on the first surface 511, approximately at the end region of the substrate 51. The passive element 55 is covered by the packaging portion 54, so that the passive element 55 is not easy to fall off. The passive element 55 may be, but is not limited to, components such as resistors and capacitors.

如圖2所示,一些實施例中,所述晶片級封裝相機模組50還包括設置在所述封裝部54上的鏡頭單元56。所述鏡頭單元56包括鏡頭57和音圈馬達58,所述鏡頭單元56可通過音圈馬達58黏接在所述封裝部54背離所述基板51的表面。As shown in FIG2 , in some embodiments, the wafer-level package camera module 50 further includes a lens unit 56 disposed on the packaging portion 54. The lens unit 56 includes a lens 57 and a voice coil motor 58, and the lens unit 56 can be bonded to the surface of the packaging portion 54 away from the substrate 51 through the voice coil motor 58.

如圖1和圖2所示,一些實施例中,所述基板51的第二表面512設有球柵陣列(BGA)70。球柵陣列70中的各焊球可作為電路的I/O端與印刷電路板(PCB)互連。As shown in FIG1 and FIG2 , in some embodiments, a ball grid array (BGA) 70 is disposed on the second surface 512 of the substrate 51. Each solder ball in the ball grid array 70 can be interconnected with a printed circuit board (PCB) as an I/O terminal of the circuit.

本申請採用非流動底部填充劑40(No-flow Underfill),其在前期充當助焊劑角色,在回焊爐中轉換成黏合劑進行底部填充,回流焊過程可同時完成焊球焊接和所述非流動底部填充劑40的固化。由於省略了施加助焊劑和去除助焊劑等步驟,進而簡化了工藝流程,且所述非流動底部填充劑40的熱固化時間短,有利於保護半導體元器件,提高其使用壽命。另外,所述非流動底部填充劑40可用於回流焊步驟,適用範圍更廣。並且,本申請通過設置異方性導電膠20,可使晶片級封裝相機模組50與柔性電路板(FPC)10之間形成垂直導通、橫向絕緣的穩定結構。This application adopts a no-flow underfill 40, which acts as a flux in the early stage and is converted into an adhesive for bottom filling in the reflow furnace. The reflow process can simultaneously complete the solder ball welding and the curing of the no-flow underfill 40. Since the steps of applying the flux and removing the flux are omitted, the process flow is simplified, and the thermal curing time of the no-flow underfill 40 is short, which is beneficial to protect semiconductor components and improve their service life. In addition, the no-flow underfill 40 can be used in the reflow step, and has a wider range of applications. Furthermore, the present application can form a stable structure with vertical conduction and lateral insulation between the wafer-level package camera module 50 and the flexible circuit board (FPC) 10 by providing anisotropic conductive adhesive 20.

以上說明是本申請一些具體實施方式,但在實際的應用過程中不能僅僅局限於這些實施方式。對本領域的普通技術人員來說,根據本申請的技術構思做出的其他變形和改變,都應該屬於本申請的保護範圍。The above descriptions are some specific implementations of this application, but in the actual application process, it cannot be limited to these implementations. For ordinary technical personnel in this field, other variations and changes made according to the technical concept of this application should all fall within the scope of protection of this application.

100:相機模組封裝結構 10:柔性電路板 30:嵌入式印刷電路板 50:晶片級封裝相機模組 20:異方性導電膠 40:非流動底部填充劑 51:基板 52:感光晶片 53:紅外濾光片 54:封裝部 55:被動元件 56:鏡頭單元 57:鏡頭 58:音圈馬達 60:金屬導線 70:球柵陣列 511:第一表面 512:第二表面 521:感光區 522:非感光區 100: Camera module packaging structure 10: Flexible circuit board 30: Embedded printed circuit board 50: Wafer-level package camera module 20: Anisotropic conductive adhesive 40: Non-flowing bottom filler 51: Substrate 52: Photosensitive chip 53: Infrared filter 54: Package 55: Passive element 56: Lens unit 57: Lens 58: Voice coil motor 60: Metal wire 70: Ball grid array 511: First surface 512: Second surface 521: Photosensitive area 522: Non-photosensitive area

圖1為本申請一實施方式提供的相機模組封裝結構的分解結構示意圖。FIG1 is a schematic diagram of the exploded structure of a camera module packaging structure provided in an embodiment of the present application.

圖2為圖1所示的相機模組封裝結構的晶片級封裝相機模組的剖面示意圖。FIG. 2 is a schematic cross-sectional view of a wafer-level package camera module of the camera module package structure shown in FIG. 1 .

100:相機模組封裝結構 100: Camera module packaging structure

10:柔性電路板 10: Flexible circuit board

20:異方性導電膠 20: Anisotropic conductive glue

30:嵌入式印刷電路板 30:Embedded printed circuit board

40:非流動底部填充劑 40: Non-flowing bottom filler

50:晶片級封裝相機模組 50: Chip-level package camera module

70:球柵陣列 70: Ball and grid array

Claims (10)

一種相機模組封裝結構,其改良在於,包括: 柔性電路板; 嵌入式印刷電路板,所述嵌入式印刷電路板與所述柔性電路板通過異方性導電膠電連接;和 晶片級封裝相機模組,所述晶片級封裝相機模組設於所述嵌入式印刷電路板背離所述柔性電路板的一側,所述晶片級封裝相機模組與所述嵌入式印刷電路板之間通過非流動底部填充劑連接。 A camera module packaging structure, the improvement of which is that it includes: a flexible circuit board; an embedded printed circuit board, the embedded printed circuit board and the flexible circuit board are electrically connected through anisotropic conductive glue; and a chip-level packaged camera module, the chip-level packaged camera module is arranged on a side of the embedded printed circuit board away from the flexible circuit board, and the chip-level packaged camera module and the embedded printed circuit board are connected through a non-flowing bottom filler. 如請求項1所述之相機模組封裝結構,其中,所述非流動底部填充劑包括助焊劑和底部填充劑。A camera module packaging structure as described in claim 1, wherein the non-flowing bottom filler includes flux and bottom filler. 如請求項2所述之相機模組封裝結構,其中,所述底部填充劑包括環氧樹脂。A camera module packaging structure as described in claim 2, wherein the bottom filler includes epoxy resin. 如請求項1所述之相機模組封裝結構,其中,所述晶片級封裝相機模組包括基板、感光晶片、紅外濾光片和封裝部;所述基板包括相對設置的第一表面和第二表面,所述感光晶片設於所述第一表面,所述封裝部設於所述第一表面並包覆所述感光晶片,所述紅外濾光片設於所述封裝部上並與所述感光晶片相對設置。A camera module packaging structure as described in claim 1, wherein the chip-level packaged camera module includes a substrate, a photosensitive chip, an infrared filter and a packaging unit; the substrate includes a first surface and a second surface arranged opposite to each other, the photosensitive chip is arranged on the first surface, the packaging unit is arranged on the first surface and covers the photosensitive chip, and the infrared filter is arranged on the packaging unit and arranged opposite to the photosensitive chip. 如請求項4所述之相機模組封裝結構,其中,所述基板的所述第二表面設有球柵陣列。A camera module packaging structure as described in claim 4, wherein a ball grid array is provided on the second surface of the substrate. 如請求項4所述之相機模組封裝結構,其中,所述晶片級封裝相機模組還包括被動元件,所述被動元件設於所述第一表面,所述被動元件被所述封裝部包覆。The camera module packaging structure as described in claim 4, wherein the chip-level packaged camera module further includes a passive element, the passive element is disposed on the first surface, and the passive element is covered by the packaging portion. 如請求項4所述之相機模組封裝結構,其中,所述晶片級封裝相機模組還包括設置在所述封裝部上的鏡頭單元,所述鏡頭單元包括鏡頭和音圈馬達。The camera module packaging structure as described in claim 4, wherein the chip-level packaged camera module further includes a lens unit disposed on the packaging portion, and the lens unit includes a lens and a voice coil motor. 如請求項4所述之相機模組封裝結構,其中,所述感光晶片包括感光區和非感光區,所述紅外濾光片與所述感光區相對設置。The camera module packaging structure as described in claim 4, wherein the photosensitive chip includes a photosensitive area and a non-photosensitive area, and the infrared filter is arranged opposite to the photosensitive area. 如請求項4所述之相機模組封裝結構,其中,所述感光晶片通過金屬導線與所述基板電連接。A camera module packaging structure as described in claim 4, wherein the photosensitive chip is electrically connected to the substrate via metal wires. 如請求項4所述之相機模組封裝結構,其中,所述封裝部的材質包括固化膠。A camera module packaging structure as described in claim 4, wherein the material of the packaging part includes a curing glue.
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