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TW202400981A - Testing device and testing method - Google Patents

Testing device and testing method Download PDF

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Publication number
TW202400981A
TW202400981A TW112110216A TW112110216A TW202400981A TW 202400981 A TW202400981 A TW 202400981A TW 112110216 A TW112110216 A TW 112110216A TW 112110216 A TW112110216 A TW 112110216A TW 202400981 A TW202400981 A TW 202400981A
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Taiwan
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circuit board
printed circuit
sensor
electronic component
jig
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TW112110216A
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Chinese (zh)
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金川陽介
山上大樹
石川裕之
須藤和幸
中西浩平
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日商三菱電機股份有限公司
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Publication of TW202400981A publication Critical patent/TW202400981A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces

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  • Health & Medical Sciences (AREA)
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Abstract

The purpose of the present invention is to provide a feature in which, in a test of the bending properties of a printed wiring board on which an electronic component is mounted, it is possible to highly accurately detect vibration caused by breakdown of the electronic component. This testing device comprises: a support base (3) for supporting both ends of a mounting surface of a printed wiring board (4) on which an electronic component (5) is mounted; a plunger jig (2) disposed on the surface of the printed wiring board (4) on the opposite side from the mounting surface, the plunger jig (2) applying a load to the electronic component (5) via the printed circuit board (4); a sensor (6) disposed surrounding the electronic component (5) on the mounting surface of the printed wiring board (4), the sensor (6) detecting vibration caused by breakdown of the electronic component (5) and outputting a voltage signal that corresponds to the vibration; a fixing jig (8) for fixing the sensor (6) to the printed wiring board (4); a pressing member for pressing the sensor (6) against the printed wiring board (4); and a measurement unit (10) for measuring the waveform of the voltage signal outputted from the sensor (6).

Description

測試裝置以及測試方法Test device and test method

本開示係關於一種測試裝置以及測試方法。This disclosure relates to a testing device and a testing method.

於非專利文獻1中,其關於耐印刷電路板彎曲性測試,定義一種在測試用印刷電路板,搭載電子零件後之狀態下之測試方法。在此測試方法中,其依據在以規定尺寸彎曲印刷電路板後之電子零件之性能與外觀異常以判定之。Non-patent document 1 defines a test method for testing printed circuit board bending resistance in a state where electronic components are mounted on a printed circuit board for testing. In this test method, it is judged based on the performance and appearance abnormalities of electronic parts after bending the printed circuit board to the specified size.

於此方法中,當成為不合格後,不瞭解電子零件之破壞產生後之彎曲尺寸(以下,稱做「極限值」)。為了知道極限值,並非必須知道一定尺寸地彎曲印刷電路板者,而必須知道使印刷電路板彎曲至電子零件達到龜裂等破壞為止時之彎曲尺寸。In this method, when the electronic component becomes defective, the bending size after damage occurs (hereinafter referred to as the "limit value") is not known. In order to know the limit value, it is not necessary to know how to bend the printed circuit board to a certain size, but it is necessary to know the bending size when the printed circuit board is bent until the electronic component is damaged such as cracks.

例如在專利文獻1中,開示有於量測在電子零件等之量測對象物單體中之抗折強度之裝置中,在構成載置有量測對象物之桌台之支撐部內,設有聲音發射感測器(以下,稱做「AE感測器」),藉AE感測器,檢測量測對象物之破壞所致之震動。 [先行技術文獻] [專利文獻] For example, Patent Document 1 discloses a device for measuring the flexural strength of a single object to be measured such as electronic components. In a support portion constituting a table on which the object to be measured is placed, there is provided The sound emission sensor (hereinafter referred to as "AE sensor") uses the AE sensor to detect vibrations caused by damage to the measurement object. [Advanced technical documents] [Patent Document]

[專利文獻1]日本發明專利特開2010-237197號公報 [非專利文獻] [Patent Document 1] Japanese Patent Publication No. 2010-237197 [Non-patent literature]

[非專利文獻1]JIS C 5101-22[Non-patent document 1] JIS C 5101-22

[發明所欲解決的問題][Problem to be solved by the invention]

但是,在專利文獻1所述之技術中,其並未假設彎曲搭載有量測對象物之印刷電路板,其並未成為用於在桌台,載置印刷電路板而彎曲之構造。However, the technology described in Patent Document 1 does not assume that the printed circuit board on which the measurement object is mounted is bent, and it does not have a structure for placing the printed circuit board on a table and bending it.

又,於專利文獻1所述之技術中,即使作為可載置印刷電路板之構造時,印刷電路板的下表面全體也與桌子相接觸,量測對象物之破壞所致之震動係藉桌子而衰減,所以,有AE感測器之檢測感度降低之問題。Furthermore, in the technology described in Patent Document 1, even when the printed circuit board is placed in a structure, the entire lower surface of the printed circuit board is in contact with the table, and the vibration caused by the damage of the measurement object is caused by the table. And attenuation, so there is a problem that the detection sensitivity of the AE sensor is reduced.

在此,本開示之目的,其在於提供一種於搭載有電子零件之印刷電路板之彎曲性測試中,可高精度地檢測電子零件之破壞所致之震動之技術。 [用以解決問題的手段] Here, the purpose of this disclosure is to provide a technology that can detect vibrations caused by damage to electronic components with high accuracy during a bending test of a printed circuit board equipped with electronic components. [Means used to solve problems]

本開示之測試裝置係包括:支撐座,支撐搭載有電子零件之印刷電路板的搭載面中之兩端部;推件治具,被配置於該印刷電路板中之該搭載面之相反側之面側,而且,對於該電子零件,透過該印刷電路板以施加負載;感測器,被配置於該印刷電路板的該搭載面中之該電子零件之周邊,而且,檢測該電子零件之破壞所致之震動,輸出對應於該震動之電壓訊號;固定治具,固定該感測器到該印刷電路板;壓抵構件,壓抵該感測器到該印刷電路板;以及量測部,用於量測自該感測器輸出之該電壓訊號之波形。 [發明功效] The test device of this disclosure includes: a support base that supports both ends of a mounting surface of a printed circuit board on which electronic components are mounted; and a pusher jig that is disposed on the opposite side of the mounting surface of the printed circuit board. On the surface side, a load is applied to the electronic component through the printed circuit board; the sensor is arranged around the electronic component in the mounting surface of the printed circuit board, and detects damage to the electronic component. The resulting vibration outputs a voltage signal corresponding to the vibration; the fixing fixture secures the sensor to the printed circuit board; the pressing member presses the sensor to the printed circuit board; and the measuring part, Used to measure the waveform of the voltage signal output from the sensor. [Invention effect]

當依據本開示時,支撐座係支撐印刷電路板的搭載面中之兩端部,所以,推件治具對於電子零件,透過印刷電路板以施加負載,藉此,可彎曲搭載電子零件後之印刷電路板。而且,感測器,其藉固定治具而被固定於印刷電路板,藉壓抵構件而被壓抵於印刷電路板,所以,成為可以穩定安裝感測器到印刷電路板。When based on this disclosure, the support base supports both ends of the mounting surface of the printed circuit board. Therefore, the pusher jig applies a load to the electronic component through the printed circuit board, thereby bending the electronic component after it is mounted. Printed circuit board. Furthermore, the sensor is fixed to the printed circuit board by the fixing jig, and is pressed against the printed circuit board by the pressing member. Therefore, the sensor can be stably mounted on the printed circuit board.

藉此,於搭載電子零件後之印刷電路板之彎曲性測試中,可高精度地檢測由電子零件之破壞所致之震動。In this way, during the bending test of the printed circuit board after mounting the electronic components, the vibration caused by the damage of the electronic components can be detected with high accuracy.

此開示之目的、特徵、事態及優點,其藉以下之詳細說明與附圖,可以更加明瞭。The purpose, characteristics, matters and advantages of this disclosure can be made clearer by the following detailed description and accompanying drawings.

[用以實施發明的形態][Form used to implement the invention]

<實施形態1> <測試裝置之構造> 針對實施形態1,使用圖面以說明於下。圖1為實施形態1之測試裝置之示意圖。圖2為自-Y方向觀看實施形態1之測試裝置所包括之感測器6之安裝處所之示意圖。圖3為自X方向觀看實施形態1之測試裝置所包括之感測器6之安裝處所之示意圖。 <Embodiment 1> <Construction of test equipment> Embodiment 1 is explained below using drawings. FIG. 1 is a schematic diagram of the test device of Embodiment 1. FIG. 2 is a schematic diagram of the installation location of the sensor 6 included in the test device of Embodiment 1 viewed from the -Y direction. FIG. 3 is a schematic view of the installation location of the sensor 6 included in the test device of Embodiment 1 viewed from the X direction.

於圖1中,X方向、Y方向及Z方向係彼此直交。以下之圖所示之X方向、Y方向及Z方向也彼此直交。以下,將包含X方向、及做為該X方向之相反方向之-X方向之方向,也稱做「X軸方向」。又,以下,將包含Y方向、及做為該Y方向之相反方向之-Y方向之方向,也稱做「Y軸方向」。又,以下,將包含Z方向、及做為該Z方向之相反方向之-Z方向之方向,也稱做「Z軸方向」。In Figure 1, the X direction, Y direction and Z direction are orthogonal to each other. The X direction, Y direction and Z direction shown in the figure below are also orthogonal to each other. Hereinafter, the X direction and the -X direction, which is the opposite direction to the X direction, will be included, and are also referred to as the "X-axis direction". In addition, below, the direction including the Y direction and the -Y direction which is the opposite direction of the Y direction will also be called the "Y-axis direction". In the following, the direction including the Z direction and the -Z direction which is the opposite direction of the Z direction will also be called the "Z-axis direction".

如圖1所示,測試裝置係包括一對之支撐座3、負載施加部1、感測器6、固定治具8、作為壓抵構件之彈性構件7、放大器9、及量測部10。As shown in Figure 1, the test device includes a pair of support bases 3, a load applying part 1, a sensor 6, a fixing fixture 8, an elastic member 7 as a pressing member, an amplifier 9, and a measuring part 10.

一對之支撐座3,其由在Y軸方向上延伸之圓柱狀構件所構成,使得可支撐與XY平面平行配置之印刷電路板4的搭載面中之兩端部(X軸方向之端部)。於印刷電路板4的搭載面之中央部,搭載有做為量測對象物之電子零件5。A pair of support bases 3 are composed of cylindrical members extending in the Y-axis direction so as to support both ends (ends in the X-axis direction) of the mounting surface of the printed circuit board 4 arranged parallel to the XY plane. ). The electronic component 5 serving as the object to be measured is mounted in the center of the mounting surface of the printed circuit board 4 .

負載施加部1係被配置於印刷電路板4中之搭載面之相反側之面側,亦即,被配置於印刷電路板4之上方(Z方向)。於負載施加部1設有往下方(-Z方向)突出之推件治具2。推件治具2係藉與負載施加部1一同下降,而對於電子零件5,透過印刷電路板4以施加負載。The load applying part 1 is arranged on the surface side of the printed circuit board 4 opposite to the mounting surface, that is, it is arranged above the printed circuit board 4 (Z direction). The load applying part 1 is provided with a push piece jig 2 protruding downward (-Z direction). The pusher jig 2 is lowered together with the load applying part 1, and a load is applied to the electronic component 5 through the printed circuit board 4.

感測器6係被配置於印刷電路板4的搭載面中之電子零件5之周邊。感測器6,其為檢測電子零件5之破壞所致之震動,輸出對應於震動之電壓訊號之AE感測器。The sensor 6 is arranged around the electronic component 5 on the mounting surface of the printed circuit board 4 . The sensor 6 is an AE sensor that detects vibration caused by damage to the electronic component 5 and outputs a voltage signal corresponding to the vibration.

如圖1~圖3所示,彈性構件7,其為板狀彈簧、螺旋彈簧、橡膠、或泡棉等之具有彈性之構件,為了壓抵感測器6到印刷電路板4,而被安裝於感測器6之下端(-Z方向之端)。固定治具8係用於固定感測器6到印刷電路板4之治具。固定治具8,其被形成為自X方向觀之,呈矩形框架狀,使得可以透過彈性構件7,以壓抵感測器6到印刷電路板4。As shown in Figures 1 to 3, the elastic member 7, which is an elastic member such as a plate spring, a coil spring, rubber, or foam, is installed in order to press the sensor 6 to the printed circuit board 4. At the lower end of sensor 6 (the end in the -Z direction). The fixing fixture 8 is a fixture used to fix the sensor 6 to the printed circuit board 4 . The fixing fixture 8 is formed in a rectangular frame shape when viewed from the X direction, so that it can press the sensor 6 to the printed circuit board 4 through the elastic member 7 .

放大器9係放大自感測器6輸出之電壓訊號,往量測部10輸出。量測部10係用於量測被放大後之電壓訊號之波形之電壓波形量測裝置。而且,放大器9並非必須之構造,所以可省略,但是,測試裝置最好包括放大器9。The amplifier 9 amplifies the voltage signal output from the sensor 6 and outputs it to the measuring part 10 . The measuring part 10 is a voltage waveform measuring device used to measure the waveform of the amplified voltage signal. Furthermore, the amplifier 9 is not a necessary construction and can be omitted, but the test device preferably includes the amplifier 9 .

<測試方法> 接著,說明使用測試裝置之測試方法。首先,於印刷電路板4的搭載面,藉軟焊而搭載有做為量測對象物之電子零件5,於印刷電路板4的搭載面中之電子零件5之周邊,感測器6係被固定治具8與彈性構件7所固定。而且,當進行符合JIS C 5101-22之耐印刷電路板彎曲性要求之測試時,作為印刷電路板4,其使用厚度1.6mm±0.2mm或0.8mm±0.1mm之玻璃布基材環氧樹脂印刷電路板用覆銅積層板。又,有一對之支撐座3之曲率半徑為5mm、一對之支撐座3之間隔為90mm之規定。 <Test method> Next, the test method using the test device is explained. First, the electronic component 5 as the object to be measured is mounted on the mounting surface of the printed circuit board 4 by soldering. The sensor 6 is mounted around the electronic component 5 on the mounting surface of the printed circuit board 4. The fixed fixture 8 is fixed with the elastic member 7 . Moreover, when testing in compliance with the printed circuit board bending resistance requirements of JIS C 5101-22, as the printed circuit board 4, a glass cloth base material epoxy resin with a thickness of 1.6mm±0.2mm or 0.8mm±0.1mm is used Copper-clad laminates for printed circuit boards. In addition, there are regulations that the radius of curvature of a pair of support seats 3 is 5 mm, and the distance between a pair of support seats 3 is 90 mm.

而且,彈性構件7之安裝位置也可以為感測器6之下側(-Z方向),只要為感測器6被印刷電路板4所壓抵之安裝位置即可。例如彈性構件7之安裝位置,其也可以於印刷電路板4的搭載面之相反側的面中,在固定治具8與印刷電路板4之間。Moreover, the installation position of the elastic member 7 may also be the lower side (-Z direction) of the sensor 6 , as long as it is the installation position where the sensor 6 is pressed by the printed circuit board 4 . For example, the installation position of the elastic member 7 may be on the opposite side to the mounting surface of the printed circuit board 4 , between the fixing jig 8 and the printed circuit board 4 .

接著,載置印刷電路板4到一對之支撐座3上,使得電子零件5位於下側(-Z方向)。此時,電子零件5係成為不與推件治具2直接接觸之方向。Next, the printed circuit board 4 is placed on the pair of supports 3 so that the electronic components 5 are located on the lower side (-Z direction). At this time, the electronic component 5 is in a direction not in direct contact with the pusher jig 2 .

使負載施加部1與推件治具2一同下降,以接觸推件治具2到印刷電路板4中之搭載面之相反側的面。在此,將推件治具2接觸到印刷電路板4後之推件治具2之位置,作為基準位置。使負載施加部1與推件治具2一同更加下降,以自基準位置更加施加負載。The load applying part 1 is lowered together with the pusher jig 2 so as to contact the surface of the pusher jig 2 opposite to the mounting surface in the printed circuit board 4 . Here, the position of the pusher jig 2 after the pusher jig 2 contacts the printed circuit board 4 is used as the reference position. The load applying part 1 is further lowered together with the pusher jig 2 to apply a further load from the reference position.

藉負載而印刷電路板4彎曲,當更加施加負載時,電子零件5係被破壞,由破壞所致之震動係由電子零件5產生。此震動係透過印刷電路板4,以傳播到感測器6。由電子零件5之破壞所致之震動,其由感測器6所檢測,被轉換為對應於震動之電壓訊號而被輸出。The printed circuit board 4 is bent by the load, and when a further load is applied, the electronic component 5 is damaged, and the vibration caused by the damage is generated by the electronic component 5 . This vibration is transmitted to the sensor 6 through the printed circuit board 4 . The vibration caused by the damage of the electronic component 5 is detected by the sensor 6, converted into a voltage signal corresponding to the vibration, and outputted.

此電壓訊號被放大器9放大後,被輸入到量測部10。於被輸入到量測部10之訊號中,在電子零件5之破壞所致之訊號之外,也包含來自負載施加部1與周邊設備之雜訊、及藉產生於周邊之震動,而自感測器6輸出之雜訊。為了進行考慮雜訊後之電壓訊號之量測,對於雜訊之電壓幅度,與對應於由電子零件5之破壞所致之震動之電壓訊號之電壓幅度間之電壓值,設定門檻值。This voltage signal is amplified by the amplifier 9 and then input to the measuring part 10 . The signals input to the measuring unit 10 include, in addition to signals caused by damage to the electronic component 5 , noise from the load applying unit 1 and peripheral devices, and self-induction due to vibrations generated in the surroundings. Noise output from detector 6. In order to measure the voltage signal after considering the noise, a threshold value is set for the voltage value between the voltage amplitude of the noise and the voltage amplitude of the voltage signal corresponding to the vibration caused by the damage of the electronic component 5 .

接著,說明決定門檻值之方法。在搭載電子零件5到印刷電路板後之狀態下,進行耐印刷電路板彎曲性測試,藉感測器6檢測由電子零件5之破壞所致之震動,藉量測部10量測電壓訊號之幅度。而且,在未搭載電子零件5到印刷電路板4之狀態下,進行耐印刷電路板彎曲性測試,藉量測部10量測電壓訊號之幅度。在未搭載電子零件5到印刷電路板4之狀態下,測得之電壓訊號係雜訊。Next, the method of determining the threshold value is explained. After the electronic component 5 is mounted on the printed circuit board, a bending resistance test of the printed circuit board is performed, the sensor 6 is used to detect the vibration caused by the damage of the electronic component 5, and the measuring part 10 is used to measure the voltage signal. amplitude. Moreover, in a state where the electronic component 5 is not mounted on the printed circuit board 4, a printed circuit board bending resistance test is performed, and the amplitude of the voltage signal is measured by the measuring part 10. In the state where the electronic component 5 is not mounted on the printed circuit board 4, the measured voltage signal is noise.

對於由電子零件5之破壞所致之電壓訊號之電壓幅度,與雜訊之電壓幅度間之電壓值,決定門檻值。而且,當測試裝置包括放大器9時,考慮其放大部分以決定門檻值。The threshold value is determined by the voltage value between the voltage amplitude of the voltage signal caused by the damage of the electronic component 5 and the voltage amplitude of the noise. Furthermore, when the test device includes the amplifier 9, its amplification part is considered to determine the threshold value.

回到測試裝置之動作之說明。使如此決定之門檻值設定到量測部10,一邊透過推件治具2,以藉負載施加部1而施加負載往印刷電路板4,一邊藉量測部10,量測自感測器6輸出之電壓訊號。Return to the description of the operation of the test device. The threshold value determined in this way is set to the measuring part 10, and the load is applied to the printed circuit board 4 by the load applying part 1 through the pusher jig 2, and the self-sensor 6 is measured by the measuring part 10. Output voltage signal.

當持續施加負載到印刷電路板4時,電子零件5係被破壞。藉感測器6檢測電子零件5破壞後之震動,當被量測部10所測得之電壓訊號之波形超過門檻值後,將自基準位置算起之推件治具2之押入尺寸,當作電子零件5之極限值。When a load is continuously applied to the printed circuit board 4, the electronic components 5 are destroyed. The sensor 6 is used to detect the vibration after the electronic component 5 is damaged. When the waveform of the voltage signal measured by the measuring part 10 exceeds the threshold value, the pushing size of the pusher fixture 2 calculated from the reference position is determined. The limit value of electronic components 5.

而且,針對自基準位置算起之推件治具2之押入尺寸,也可以在藉觸發訊號,而停止負載施加部1之動作後之狀態下量測,也可以將負載施加部1之下降速度作為一定,依據自基準位置中之時間,至觸發訊號之檢測時間為止所需之時間以算出之。而且,也可以使用雷射位移計等,量測自基準位置算起之推件治具2之押入尺寸。Furthermore, the pushing dimension of the pusher jig 2 from the reference position can also be measured in the state after stopping the operation of the load applying part 1 by the trigger signal, or the descending speed of the load applying part 1 can be measured. As a given, it is calculated based on the time required from the time in the reference position to the detection time of the trigger signal. Furthermore, a laser displacement meter or the like can also be used to measure the pushing dimension of the pusher jig 2 from the reference position.

又,感測器6也可以被固定於印刷電路板4的搭載面,或者,其相反側的面之任一面,但是,期望被固定於與印刷電路板4中之電子零件5相同之面側。其理由為由電子零件5之破壞所致之震動,其包含很多傳播在印刷電路板4的搭載面之能量,所以,自感測器6輸出之電壓訊號之幅度變大,由電子零件5之破壞所致之震動之檢測感度係提高。In addition, the sensor 6 may be fixed to the mounting surface of the printed circuit board 4 or any surface on the opposite side. However, it is desirably fixed to the same surface as the electronic component 5 of the printed circuit board 4 . . The reason is that the vibration caused by the damage of the electronic component 5 contains a lot of energy propagated on the mounting surface of the printed circuit board 4. Therefore, the amplitude of the voltage signal output from the sensor 6 becomes larger. The detection sensitivity of vibrations caused by damage is improved.

如此一來,藉感測器6被固定於印刷電路板4的搭載面中之電子零件5之周邊,由電子零件5之破壞所致之震動之檢測感度係提高。當檢測感度提高時,對應於由電子零件5之破壞所致之震動之電壓訊號,變得大於雜訊,對應於電子零件5之破壞之電壓訊號之幅度電壓值與雜訊之幅度電壓值之差係變大。結果,可使設定於量測部10之門檻值,設定為比雜訊之幅度電壓值大很多,由電子零件5之破壞所致之震動之誤檢測率係降低。In this way, since the sensor 6 is fixed around the electronic component 5 in the mounting surface of the printed circuit board 4, the detection sensitivity of the vibration caused by the damage of the electronic component 5 is improved. When the detection sensitivity increases, the voltage signal corresponding to the vibration caused by the damage of the electronic component 5 becomes larger than the noise. The amplitude voltage value of the voltage signal corresponding to the damage of the electronic component 5 is equal to the amplitude voltage value of the noise. The difference becomes larger. As a result, the threshold value set in the measuring part 10 can be set much larger than the amplitude voltage value of the noise, and the false detection rate of vibration caused by damage to the electronic component 5 is reduced.

又,為了更加提高感測器6之檢測感度,期望於感測器6與印刷電路板4之接觸面,塗佈凡士林或潤滑脂等之接觸媒質11。In addition, in order to further improve the detection sensitivity of the sensor 6, it is desirable to apply a contact medium 11 such as petroleum jelly or grease on the contact surface between the sensor 6 and the printed circuit board 4.

又,當固定感測器6到印刷電路板4時,期望固定為壓抵力在一定之壓力以上。圖4為表示在實施形態1之測試裝置所包括之印刷電路板4上,固定震動器13與感測器6後之狀態之示意圖。圖5為表示對於印刷電路板4之感測器6之壓抵力與感測器6之輸出電壓之關係之圖。Furthermore, when fixing the sensor 6 to the printed circuit board 4, it is desirable that the pressing force be fixed at a certain pressure or above. FIG. 4 is a schematic diagram showing the state after the vibrator 13 and the sensor 6 are fixed on the printed circuit board 4 included in the test device of the first embodiment. FIG. 5 is a diagram showing the relationship between the pressing force of the sensor 6 on the printed circuit board 4 and the output voltage of the sensor 6 .

如圖4所示,在進行耐印刷電路板彎曲性測試之前,於未搭載電子零件5之狀態下,固定震動器13於印刷電路板4的搭載面中之感測器6之周邊。於震動器13連接有訊號產生器14。自震動器13施加一定幅度之震動到印刷電路板4。圖5為表示當改變感測器6之對於印刷電路板4之壓抵力後,自感測器6輸出之電壓訊號。As shown in FIG. 4 , before conducting the printed circuit board bending resistance test, the vibrator 13 is fixed around the sensor 6 on the mounting surface of the printed circuit board 4 without the electronic component 5 being mounted. The vibrator 13 is connected with a signal generator 14 . The self-vibrator 13 applies a certain amplitude of vibration to the printed circuit board 4 . FIG. 5 shows the voltage signal output from the sensor 6 after changing the pressing force of the sensor 6 against the printed circuit board 4 .

當降低壓抵力時,自0.4kg/cm 2附近,由感測器6輸出之電壓訊號之幅度係變小。所以,使感測器6對於印刷電路板4之壓抵力為一定之壓力以上,具體來說,成為0.4kg/cm 2以上,藉此,自感測器6輸出之電壓訊號係變大,與雜訊之幅度差係變大。當幅度差變大時,可使被設定於量測部10之門檻值,設定為比雜訊之幅度電壓值高很多,由電子零件5之破壞所致之震動之誤檢測率係降低。藉此,可期待由電子零件5之破壞所致之震動之量測精度提高之效果。 When the pressing force is reduced, the amplitude of the voltage signal output by the sensor 6 becomes smaller from around 0.4kg/cm 2 . Therefore, the pressing force of the sensor 6 against the printed circuit board 4 is made to be above a certain pressure, specifically, above 0.4kg/cm 2 , whereby the voltage signal output from the sensor 6 becomes larger. The amplitude difference with the noise becomes larger. When the amplitude difference becomes large, the threshold value set in the measuring part 10 can be set much higher than the amplitude voltage value of the noise, so that the false detection rate of vibration caused by damage to the electronic component 5 is reduced. This can be expected to improve the measurement accuracy of vibration caused by damage to the electronic component 5 .

圖6為表示感測器6與震動器13間之距離之示意圖。如圖6所示,自感測器6至震動器13為止之距離,其期望為一定之距離以下。FIG. 6 is a schematic diagram showing the distance between the sensor 6 and the vibrator 13 . As shown in FIG. 6 , the distance from the sensor 6 to the vibrator 13 is preferably a certain distance or less.

如圖4所示,於印刷電路板4的搭載面中之搭載有電子零件5之位置,接著固定有震動器13。接著,藉固定治具8與彈性構件7,感測器6係被固定。自訊號產生器14輸入成為一定之震動幅之訊號到震動器13,藉此,印刷電路板4係產生震動。As shown in FIG. 4 , the vibrator 13 is fixed to the position where the electronic component 5 is mounted on the mounting surface of the printed circuit board 4 . Next, the sensor 6 is fixed by the fixing fixture 8 and the elastic member 7 . A signal with a certain vibration amplitude is input from the signal generator 14 to the vibrator 13, thereby causing the printed circuit board 4 to vibrate.

圖7為表示於震動器13中,施加一定震動到印刷電路板4後之震動器13與感測器6間之距離,與感測器6之輸出電壓之關係之圖。如圖7所示,可知當感測器6與震動器13間之距離變長時,自感測器6輸出之電壓值係降低。FIG. 7 is a diagram showing the relationship between the distance between the vibrator 13 and the sensor 6 and the output voltage of the sensor 6 after a certain vibration is applied to the printed circuit board 4 in the vibrator 13 . As shown in FIG. 7 , it can be seen that when the distance between the sensor 6 and the vibrator 13 becomes longer, the voltage value output from the sensor 6 decreases.

所以,使感測器6與電子零件5間之距離為一定之距離以下,具體來說,固定感測器6,使得成為5mm以下,藉此,對應於電子零件5之破壞所致之震動之感測器6之輸出電壓係較大地輸出,而感度變高。藉此,可使被設定於量測部10之門檻值,設定為比雜訊之幅度電壓高很多,由電子零件5之破壞所致之震動之誤檢測率係降低,可期待量測精度提高之效果。Therefore, the distance between the sensor 6 and the electronic component 5 is set to a certain distance or less. Specifically, the sensor 6 is fixed so that it is 5 mm or less. Thereby, the distance corresponding to the vibration caused by the damage of the electronic component 5 is reduced. The output voltage of the sensor 6 is larger, and the sensitivity becomes higher. By this, the threshold value set in the measuring part 10 can be set much higher than the amplitude voltage of the noise, and the false detection rate of vibration caused by the damage of the electronic component 5 can be reduced, and the measurement accuracy can be expected to be improved. The effect.

<效果> 如上所述,實施形態1之測試裝置係包括:支撐座3,支撐搭載有電子零件5之印刷電路板4的搭載面中之兩端部;推件治具2,被配置於印刷電路板4中之搭載面之相反側之面側,而且,對於電子零件5,透過印刷電路板4以施加負載;感測器6,被配置於印刷電路板4的搭載面中之電子零件5之周邊,而且,檢測由電子零件5之破壞所致之震動,輸出對應於震動之電壓訊號;固定治具8,固定感測器6於印刷電路板4;壓抵構件,壓抵感測器6到印刷電路板4;以及量測部10,用於量測自感測器6輸出之電壓訊號之波形。又,測試裝置還包括放大自感測器6輸出之電壓訊號之放大器9則更佳。在此情形下,量測部10係量測被放大器9所放大之電壓訊號之波形。 <Effect> As described above, the test device of Embodiment 1 includes: the support base 3 that supports both ends of the mounting surface of the printed circuit board 4 on which the electronic component 5 is mounted; and the pusher jig 2 that is arranged on the printed circuit board 4 On the opposite side of the mounting surface, a load is applied to the electronic component 5 through the printed circuit board 4; the sensor 6 is arranged around the electronic component 5 on the mounting surface of the printed circuit board 4. Moreover, the vibration caused by the damage of the electronic component 5 is detected, and a voltage signal corresponding to the vibration is output; the fixture 8 is fixed, and the sensor 6 is fixed on the printed circuit board 4; the pressing member is pressed against the sensor 6 to print The circuit board 4; and the measuring part 10 are used for measuring the waveform of the voltage signal output from the sensor 6. Furthermore, it is better if the test device further includes an amplifier 9 for amplifying the voltage signal output from the sensor 6 . In this case, the measuring part 10 measures the waveform of the voltage signal amplified by the amplifier 9 .

支撐座3係支撐印刷電路板4的搭載面中之兩端部,所以,推件治具2係對於電子零件5,透過印刷電路板4以施加負載,藉此,可彎曲搭載電子零件5後之印刷電路板4。而且,感測器6係藉固定治具8而被固定於印刷電路板4,藉壓抵構件而被壓抵到印刷電路板4,所以,成為可以穩定安裝感測器6到印刷電路板4。The support base 3 supports both ends of the mounting surface of the printed circuit board 4. Therefore, the pusher jig 2 applies a load to the electronic component 5 through the printed circuit board 4, thereby bending the electronic component 5. Printed circuit board 4. Furthermore, the sensor 6 is fixed to the printed circuit board 4 by the fixing jig 8 and pressed against the printed circuit board 4 by the pressing member. Therefore, the sensor 6 can be stably mounted to the printed circuit board 4 .

藉此,於搭載電子零件5後之印刷電路板4之彎曲性測試中,可高精度地檢測由電子零件5之破壞所致之震動。Thereby, during the bending test of the printed circuit board 4 after the electronic component 5 is mounted, the vibration caused by the damage of the electronic component 5 can be detected with high accuracy.

藉此,成為可確保包括搭載有電子零件5之印刷電路板4之製品之安全性。Thereby, the safety of the product including the printed circuit board 4 on which the electronic component 5 is mounted can be ensured.

又,與接著感測器6到印刷電路板4之方法相比較下,其可縮短感測器6之安裝及卸下所費之作業時間。In addition, compared with the method of attaching the sensor 6 to the printed circuit board 4, it can shorten the work time of installing and removing the sensor 6.

又,壓抵構件係包含彈性構件7,所以,藉採用彈性係數為已知之彈性構件7,關於感測器6之安裝之再現性係變高。藉改變彈性構件7之彈性係數,可簡單地獲得往感測器6之適切之壓抵力。結果,可再現性良好地穩定安裝感測器6。In addition, the pressing member includes the elastic member 7. Therefore, by using the elastic member 7 with a known elastic coefficient, the reproducibility of the installation of the sensor 6 becomes higher. By changing the elastic coefficient of the elastic member 7, an appropriate pressing force to the sensor 6 can be easily obtained. As a result, the sensor 6 can be mounted stably with good reproducibility.

又,壓抵感測器6到印刷電路板4之壓抵力,其為0.4kg/cm 2以上,所以,可感度良好地檢測耐印刷電路板彎曲性測試中之電子零件5之極限值。 In addition, the pressing force between the pressing sensor 6 and the printed circuit board 4 is 0.4 kg/cm 2 or more. Therefore, the limit value of the electronic component 5 in the printed circuit board bending resistance test can be detected with good sensitivity.

又,自感測器6至電子零件5為止之距離係5mm以下,所以,可感度良好地檢測耐印刷電路板彎曲性測試中之電子零件5之極限值。In addition, the distance from the sensor 6 to the electronic component 5 is 5 mm or less, so the limit value of the electronic component 5 in the printed circuit board bending resistance test can be detected with good sensitivity.

<實施形態2> 接著,說明實施形態2之測試裝置。圖8為實施形態2之測試裝置之示意圖。圖9為自X方向觀看實施形態2之測試裝置所包括之感測器6之安裝處所之示意圖。而且,於實施形態2中,針對與在實施形態1說明過者相同之構造元件,其賦予相同編號,說明則省略之。 <Embodiment 2> Next, the test device of Embodiment 2 will be described. FIG. 8 is a schematic diagram of the test device of Embodiment 2. FIG. 9 is a schematic view of the installation location of the sensor 6 included in the test device of Embodiment 2 viewed from the X direction. In addition, in Embodiment 2, the same structural elements as those described in Embodiment 1 are assigned the same numbers, and description thereof is omitted.

如圖8與圖9所示,於實施形態2中,螺絲12係作為壓抵構件。具體來說,為了固定感測器6到印刷電路板4,而設有固定治具8與螺絲12。As shown in FIGS. 8 and 9 , in Embodiment 2, the screw 12 serves as a pressing member. Specifically, in order to fix the sensor 6 to the printed circuit board 4, a fixing fixture 8 and screws 12 are provided.

在此例中,雖然自印刷電路板4之搭載面側,藉螺絲12而壓抵感測器6到印刷電路板4,但是,也可以自印刷電路板4的搭載面之相反側,透過固定治具8以藉螺絲12壓抵印刷電路板4。又,也可以取代螺絲12,而使用螺栓。In this example, the sensor 6 is pressed against the printed circuit board 4 by the screws 12 from the mounting surface side of the printed circuit board 4. However, it can also be fixed by fixing the sensor 6 from the opposite side of the mounting surface of the printed circuit board 4. The fixture 8 is pressed against the printed circuit board 4 by screws 12 . Furthermore, bolts may be used instead of screws 12 .

如上所述,在實施形態2之測試裝置中,壓抵構件係包含螺栓或螺絲12,所以,可以不使用彈性構件7地,以穩定之壓抵力固定感測器6。As described above, in the test device of Embodiment 2, the pressing member includes the bolt or screw 12, so the sensor 6 can be fixed with a stable pressing force without using the elastic member 7.

又,藉改變固定螺絲12時之轉速,可較容易調整感測器6之對於印刷電路板4之必要壓抵力,所以,成為可較容易獲得往感測器6之適切之壓抵力。結果,成為可感度良好地檢測由電子零件5之破壞所致之震動,而獲得誤檢測率變低之效果。In addition, by changing the rotation speed of the fixing screw 12, the necessary pressing force of the sensor 6 against the printed circuit board 4 can be more easily adjusted. Therefore, it becomes easier to obtain an appropriate pressing force against the sensor 6. As a result, the vibration caused by the damage of the electronic component 5 can be detected with good sensitivity, thereby achieving the effect of reducing the false detection rate.

又,當為了固定感測器6而使用彈性構件7時,為了確保期望之壓抵力,雖然需要彈性構件7之彈性率為已知,但是,有時彈性率會老化,所以,感測器6之面壓係隨著時間的推移而改變。因此,為了獲得穩定之壓抵力,必須總是管理彈性構件7之彈性率,但是,當使用螺絲12後,也可期待無須管理彈性構件7之彈性率之效果。而且,與接著感測器6到印刷電路板4之方法相比較下,其可縮短安裝及卸下感測器6所費之作業時間。In addition, when the elastic member 7 is used to fix the sensor 6, in order to ensure the desired pressing force, the elastic modulus of the elastic member 7 needs to be known. However, the elastic modulus may deteriorate, so the sensor 6. The facial pressure system changes over time. Therefore, in order to obtain a stable pressing force, the elastic modulus of the elastic member 7 must always be managed. However, when the screw 12 is used, the effect of not having to manage the elastic modulus of the elastic member 7 can also be expected. Moreover, compared with the method of attaching the sensor 6 to the printed circuit board 4, it can shorten the working time of installing and removing the sensor 6.

<實施形態3> 接著,說明實施形態3之測試裝置。圖10為實施形態3之測試裝置之示意圖。而且,於實施形態3中,針對與在實施形態1,2說明過者相同之構造元件,其賦予相同編號,而說明則省略之。 Embodiment 3> Next, the test device of Embodiment 3 will be described. Fig. 10 is a schematic diagram of the test device of Embodiment 3. Furthermore, in Embodiment 3, the same structural elements as those described in Embodiments 1 and 2 are assigned the same numbers, and description thereof is omitted.

如圖10所示,於實施形態3中,在實施形態1之構造之外,再於感測器6與量測部10之間,設有衰減特定頻段之電壓訊號之頻段消除過濾器15。而且,在實施形態2之構造之外,也可以再設有頻段消除過濾器15。As shown in FIG. 10 , in Embodiment 3, in addition to the structure of Embodiment 1, a frequency band elimination filter 15 that attenuates voltage signals in a specific frequency band is provided between the sensor 6 and the measurement unit 10 . Furthermore, in addition to the structure of Embodiment 2, a frequency band elimination filter 15 may be provided.

如上所述,於感測器6之輸出訊號中,其在由電子零件5之破壞所致之訊號之外,也包含來自負載施加部1與周邊設備之雜訊、及藉在周邊產生之震動,自感測器6輸出之雜訊。本來係必須檢測由電子零件5之破壞之震動所致之訊號,但是,當被雜訊誤導,以作為由電子零件5之破壞所致之震動而誤檢測後,產生耐印刷電路板彎曲性測試中之電子零件5之極限值,誤判定為與本來之極限值不同之值之情形。所以,藉配置頻段消除過濾器15於感測器6與量測部10之間,可抑制將雜訊作為由電子零件5之破壞所致之震動以誤檢測之情事。As mentioned above, the output signal of the sensor 6 includes, in addition to the signal caused by the damage of the electronic component 5 , noise from the load applying part 1 and peripheral equipment, and vibration generated in the surroundings. , the noise output from the sensor 6. Originally, it was necessary to detect the signal caused by the vibration caused by the damage of the electronic component 5. However, when it was misled by the noise and mistakenly detected as the vibration caused by the damage of the electronic component 5, the printed circuit board bending resistance test was produced. The limit value of the electronic component 5 is mistakenly determined to be a value different from the original limit value. Therefore, by arranging the frequency band cancellation filter 15 between the sensor 6 and the measurement part 10 , it is possible to suppress false detection of noise as vibration caused by damage of the electronic component 5 .

例如當電子零件5為陶瓷製積層電容器時,藉感測器6檢測破壞時之震動後,於較大之頻率範圍中,訊號係被檢測。即使藉頻段消除過濾器15,而特定頻段之電壓訊號衰減,此外之頻段之電壓訊號係幾乎不衰減地,通過頻段消除過濾器15。例如當雜訊之頻率為400kHz時,選擇衰減400kHz附近之頻段消除過濾器15。當由電子零件5之破壞所致之震動之頻率係100kHz以上600kHz以下時,與400kHz之雜訊一同地,電子零件5破壞後之震動所致之400kHz之電壓訊號也衰減。For example, when the electronic component 5 is a ceramic multilayer capacitor, after the sensor 6 detects the vibration when it is damaged, the signal is detected in a larger frequency range. Even if the voltage signal in a specific frequency band is attenuated by the frequency band cancellation filter 15, the voltage signals in other frequency bands pass through the frequency band cancellation filter 15 with almost no attenuation. For example, when the frequency of noise is 400kHz, select filter 15 to attenuate the frequency band near 400kHz. When the frequency of the vibration caused by the damage of the electronic part 5 is between 100kHz and below 600kHz, together with the noise of 400kHz, the voltage signal of 400kHz caused by the vibration after the damage of the electronic part 5 is also attenuated.

但是,此外之頻段之訊號,其幾乎不衰減地,通過頻段消除過濾器15。結果,頻段消除過濾器15係被配置於感測器6與量測部10之間,藉此,做為電子零件5之陶瓷製積層電容器之震動所致之由感測器6檢測之電壓訊號與雜訊之電壓差係變大。However, signals in other frequency bands pass through the frequency band elimination filter 15 with almost no attenuation. As a result, the frequency band elimination filter 15 is disposed between the sensor 6 and the measurement unit 10, thereby eliminating the voltage signal detected by the sensor 6 due to the vibration of the ceramic multilayer capacitor as the electronic component 5. The voltage difference with noise becomes larger.

作為參考,圖11為表示針對陶瓷製積層電容器達到極限值後之破壞所致之震動,被感測器6所測得之輸出訊號波形。又,圖12為表示包含於陶瓷製積層電容器達到極限值後之破壞所致之震動之各頻率之直方圖。For reference, FIG. 11 shows the output signal waveform measured by the sensor 6 for the vibration caused by the destruction of the ceramic multilayer capacitor after reaching the limit value. In addition, FIG. 12 is a histogram showing each frequency of the vibration caused by the destruction of the ceramic multilayer capacitor after reaching the limit value.

如上所述,實施形態3之測試裝置,其還包括被配置於感測器6與量測部10間之頻段消除過濾器15。所以,可藉頻段消除過濾器15,衰減雜訊至被設定於量測部10之門檻值以下為止。藉此,主要由雜訊所致之電子零件5之極限值之誤檢測率係降低,可期待檢測精度提高之效果。As mentioned above, the test device of Embodiment 3 further includes the frequency band elimination filter 15 arranged between the sensor 6 and the measurement unit 10 . Therefore, the frequency band cancellation filter 15 can be used to attenuate the noise until it is set below the threshold of the measurement unit 10 . Thereby, the false detection rate of the limit value of the electronic component 5, which is mainly caused by noise, is reduced, and an effect of improving the detection accuracy can be expected.

<實施形態4> 接著,說明實施形態4之測試裝置。圖13為自-Y方向觀看實施形態4之測試裝置所包括之感測器6之安裝處所之示意圖。圖14(a),(b)為表示實施形態4之測試裝置所包括之固定治具8的外周面之中,與推件治具2相向之部分8a之放大圖。而且,於實施形態4中,針對與在實施形態1~3說明過者相同之構造元件,其賦予相同編號,而省略其說明。 <Embodiment 4> Next, the test device of Embodiment 4 will be described. FIG. 13 is a schematic diagram of the installation location of the sensor 6 included in the test device of Embodiment 4 viewed from the -Y direction. 14(a) and (b) are enlarged views showing the portion 8a of the outer peripheral surface of the fixed jig 8 included in the test device of Embodiment 4 that faces the pusher jig 2. In addition, in Embodiment 4, the same structural elements as those described in Embodiments 1 to 3 are assigned the same numbers, and description thereof is omitted.

如圖13所示,在實施形態4中,相對於實施形態1之構造而言,固定治具8的外周面之形狀係不同。以下,說明固定治具8。與實施形態1之情形同樣地,固定治具8,其自X方向觀之,被形成為包圍印刷電路板4與作為壓抵構件之彈性構件7之矩形框架狀。在此,於實施形態4以後,說明壓抵構件包含彈性構件7之情形,但是,其也可以為壓抵構件包含螺絲12或螺栓之情形。固定治具8的內周面,其接觸到印刷電路板4中之搭載面之相反側的面、及彈性構件7中之印刷電路板4之相反側的部分。如圖14(a)所示,於實施形態4中,固定治具8的外周面之中,與推件治具2相向之部分8a,其被形成為圓弧狀。As shown in FIG. 13 , in the fourth embodiment, the shape of the outer peripheral surface of the fixing jig 8 is different from the structure of the first embodiment. Next, the fixing jig 8 will be described. As in the case of Embodiment 1, the fixing jig 8 is formed in a rectangular frame shape surrounding the printed circuit board 4 and the elastic member 7 serving as the pressing member when viewed from the X direction. Here, in Embodiment 4 and later, the case where the pressing member includes the elastic member 7 will be described. However, the pressing member may include the screw 12 or the bolt. The inner peripheral surface of the fixed jig 8 contacts the surface of the printed circuit board 4 on the opposite side to the mounting surface and the portion of the elastic member 7 on the opposite side of the printed circuit board 4 . As shown in FIG. 14(a) , in Embodiment 4, the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2 is formed in an arc shape.

為了提高震動之檢測感度,必須固定感測器6到電子零件5之周邊,當接近固定治具8到電子零件5時,固定治具8係接觸到推件治具2。當兩者接觸時,於彎曲測試時,推件治具2與固定治具8係摩擦而產生震動。因為此震動而產生雜訊,所以,誤檢測率係提高。推件治具2的尖端,其於JIS之耐印刷電路板彎曲測試中,被規定為R=5,於縮短感測器6與電子零件5之距離有其極限。在此,固定治具8的外周面之中,使與推件治具2相向之部分8a為圓弧狀,藉此,兩者係變得較難接觸,成為可使感測器6更接近電子零件5。結果,由電子零件5之破壞所致之震動之檢測感度係提高。In order to improve the vibration detection sensitivity, the sensor 6 must be fixed around the electronic component 5. When approaching the fixed fixture 8 to the electronic component 5, the fixed fixture 8 contacts the pusher fixture 2. When the two are in contact, during the bending test, the pusher fixture 2 and the fixed fixture 8 are rubbed and vibrate. Because this vibration generates noise, the false detection rate increases. The tip of the pusher jig 2 is specified as R=5 in the JIS printed circuit board bending resistance test, and has its limit in shortening the distance between the sensor 6 and the electronic component 5 . Here, the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2 is made into an arc shape. This makes it harder for the two to come into contact and allows the sensor 6 to be closer. Electronic parts 5. As a result, the detection sensitivity of the vibration caused by the damage of the electronic component 5 is improved.

在圖14(a)之例中,固定治具8的外周面之中,與推件治具2相向之部分8a被形成為圓弧狀,但是,並不侷限於此,其只要為避開與推件治具2之接觸之形狀即可。例如如圖14(b)所示,固定治具8的外周面之中,與推件治具2相向之部分8a,其也可以被形成為傾斜狀。In the example of FIG. 14(a) , the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2 is formed in an arc shape. However, it is not limited to this. The shape of the contact with the push piece fixture 2 is sufficient. For example, as shown in FIG. 14(b) , the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2 may also be formed in an inclined shape.

如上所述,於實施形態5之測試裝置中,固定治具8係被形成為包圍印刷電路板4與壓抵構件之框架狀,固定治具8的內周面,其接觸到印刷電路板4中之搭載面之相反側的面、及壓抵構件中之印刷電路板4之相反側的部分,固定治具8的外周面之中,與推件治具2相向之部分8a,其被形成為圓弧狀或傾斜狀。As described above, in the test device of Embodiment 5, the fixed jig 8 is formed into a frame shape surrounding the printed circuit board 4 and the pressing member, and the inner peripheral surface of the fixed jig 8 is in contact with the printed circuit board 4 The surface on the opposite side of the mounting surface and the part on the opposite side of the printed circuit board 4 in the pressing member are formed in the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2. It is arc-shaped or inclined.

因此,比實施形態1之情形,可使感測器6更加接近電子零件5配置。結果,可更加感度良好地檢測由電子零件5之破壞所致之震動,獲得更加降低誤檢測率之效果。Therefore, the sensor 6 can be arranged closer to the electronic component 5 than in the first embodiment. As a result, the vibration caused by the damage of the electronic component 5 can be detected with better sensitivity, thereby achieving the effect of further reducing the false detection rate.

<實施形態5> 接著,說明實施形態5之測試裝置。圖15為自X方向觀看實施形態5之測試裝置所包括之感測器6之安裝處所之示意圖。圖16(a),(b)為表示實施形態5之測試裝置所包括之固定治具8的內周面之中,與印刷電路板4接觸之部分8b之放大圖。圖16(c),(d)為表示實施形態5之測試裝置所包括之固定治具8的內周面之中,與印刷電路板4接觸之部分8b、及固定治具8的外周面之中,與推件治具2相向之部分8a之放大圖。而且,於實施形態5中,針對與實施形態1~4說明過者相同之構造元件,其賦予相同編號,說明係省略之。 Embodiment 5> Next, the test device of Embodiment 5 will be described. FIG. 15 is a schematic diagram of the installation location of the sensor 6 included in the test device of Embodiment 5 viewed from the X direction. 16(a) and (b) are enlarged views showing the portion 8b in contact with the printed circuit board 4 among the inner peripheral surfaces of the fixing jig 8 included in the test device according to the fifth embodiment. 16(c) and (d) show the portion 8b in contact with the printed circuit board 4 among the inner peripheral surface of the fixed jig 8 included in the test device according to the fifth embodiment, and the outer peripheral surface of the fixed jig 8. , an enlarged view of the part 8a facing the pusher fixture 2. In addition, in Embodiment 5, the same structural elements as those described in Embodiments 1 to 4 are assigned the same numbers, and description thereof is omitted.

如圖15與圖16(a)所示,在實施形態5中,相對於實施形態4而言,固定治具8的內周面之形狀係不同,固定治具8的內周面之中,與印刷電路板4接觸之部分8b係形成為圓弧狀。As shown in FIGS. 15 and 16(a) , in Embodiment 5, compared to Embodiment 4, the shape of the inner peripheral surface of the fixed jig 8 is different. Among the inner peripheral surfaces of the fixed jig 8, The portion 8b in contact with the printed circuit board 4 is formed in an arc shape.

當藉推件治具2而持續施加負載到印刷電路板4時,印刷電路板4係變形為圓弧狀(參照圖13),拉伸應力施加於電子零件5。在印刷電路板4之變形變大之同時,往電子零件5之應力也變大,最後達到極限值,而電子零件5係被破壞。所以,電子零件5之極限值影響到印刷電路板4變形之形狀。理想來說,印刷電路板4,其期望變形為與未安裝有固定治具8時之形狀相同之形狀。固定治具8中之與印刷電路板4接觸之部分8b之面積愈小,則對於印刷電路板4之變形形狀之影響愈小。結果,在印刷電路板4安裝有固定治具8之情形與未安裝之情形之間,作用於電子零件5之拉伸應力之大小沒有差值,成為可以較高精度地測試。When the load is continuously applied to the printed circuit board 4 by the pusher jig 2, the printed circuit board 4 is deformed into an arc shape (see FIG. 13), and tensile stress is applied to the electronic component 5. As the deformation of the printed circuit board 4 increases, the stress on the electronic components 5 also increases, and finally reaches a limit value, and the electronic components 5 are destroyed. Therefore, the limit value of the electronic component 5 affects the deformed shape of the printed circuit board 4 . Ideally, the printed circuit board 4 is expected to be deformed into the same shape as when the fixing jig 8 is not installed. The smaller the area of the portion 8b of the fixing fixture 8 that is in contact with the printed circuit board 4, the smaller the influence on the deformed shape of the printed circuit board 4. As a result, there is no difference in the magnitude of the tensile stress acting on the electronic component 5 between the state where the fixing jig 8 is mounted on the printed circuit board 4 and the state where it is not mounted, so that high-precision testing is possible.

在圖16(a)之例中,固定治具8的內周面之中,與印刷電路板4接觸之部分8b,其被形成為圓弧狀,但是,並不侷限於此,只要固定治具8中之與印刷電路板4接觸之部分8b之面積為較小之形狀即可。例如如圖16(b)所示,也可以固定治具8的內周面之中,與印刷電路板4接觸之部分8b被形成為傾斜狀。又,如圖16(c),(d)所示,也可以組合實施形態5之固定治具8之內周面形狀與實施形態4之固定治具8之外周面形狀。In the example of FIG. 16(a) , the portion 8b of the inner circumferential surface of the fixed jig 8 that is in contact with the printed circuit board 4 is formed into an arc shape. However, it is not limited to this. As long as the fixed jig 8 The area of the part 8b of the tool 8 that is in contact with the printed circuit board 4 only needs to be smaller. For example, as shown in FIG. 16( b ), the portion 8 b of the inner peripheral surface of the fixed jig 8 that is in contact with the printed circuit board 4 may be formed in an inclined shape. Furthermore, as shown in FIGS. 16(c) and (d) , the inner peripheral surface shape of the fixed jig 8 of the fifth embodiment and the outer peripheral surface shape of the fixed jig 8 of the fourth embodiment may be combined.

如上所述,在實施形態5之測試裝置中,固定治具8係被形成為包圍印刷電路板4與壓抵構件之框架狀,固定治具8的內周面係接觸到印刷電路板4中之搭載面之相反側的面、及壓抵構件中之印刷電路板4之相反側的部分,固定治具8的內周面之中,與印刷電路板4接觸之部分8b,其被形成為圓弧狀或傾斜狀。As described above, in the test device of Embodiment 5, the fixed jig 8 is formed in a frame shape surrounding the printed circuit board 4 and the pressing member, and the inner peripheral surface of the fixed jig 8 is in contact with the printed circuit board 4 The surface on the opposite side of the mounting surface and the part of the pressing member on the opposite side to the printed circuit board 4, and the part 8b of the inner peripheral surface of the fixing jig 8 that is in contact with the printed circuit board 4 are formed as Arc-shaped or inclined.

因此,在印刷電路板4安裝有固定治具8之情形與未安裝之情形之間,作用於電子零件5之拉伸應力之大小無差值,而獲得可較高精度地測試之效果。Therefore, there is no difference in the magnitude of the tensile stress acting on the electronic component 5 between the state where the printed circuit board 4 is mounted with the fixing jig 8 and the state where it is not mounted, thereby achieving the effect of enabling high-precision testing.

<實施形態6> 接著,說明實施形態6之定位治具16。圖17為自Z方向觀看實施形態6之定位治具16之示意圖。圖18為自-Y方向觀看實施形態6之定位治具16之示意圖。圖19為自Z方向觀看使用實施形態6之定位治具16,以安裝感測器6後之狀態之示意圖。圖20為自-Y方向觀看使用實施形態6之定位治具16,以安裝感測器6後之狀態之示意圖。而且,於實施形態6中,針對與在實施形態1~5說明過者相同之構造元件,其賦予相同編號,而省略其說明。 <Embodiment 6> Next, the positioning jig 16 of Embodiment 6 will be described. FIG. 17 is a schematic diagram of the positioning jig 16 of Embodiment 6 viewed from the Z direction. FIG. 18 is a schematic diagram of the positioning jig 16 of Embodiment 6 viewed from the -Y direction. FIG. 19 is a schematic diagram of the state after installing the sensor 6 using the positioning jig 16 of Embodiment 6, viewed from the Z direction. FIG. 20 is a schematic diagram of the state after the sensor 6 is installed using the positioning jig 16 of Embodiment 6, viewed from the -Y direction. Furthermore, in Embodiment 6, the same structural elements as those described in Embodiments 1 to 5 are assigned the same numbers, and description thereof is omitted.

如圖17~圖20所示,在實施形態6中,使用定位治具16以進行感測器6之定位。As shown in FIGS. 17 to 20 , in Embodiment 6, the positioning jig 16 is used to position the sensor 6 .

首先,說明定位治具16之構造。如圖17與圖18所示,定位治具16係包括板狀之基座16a、兩個之導引銷17、兩個之固定用柱塞18、感測器定位板19、及測微頭20。First, the structure of the positioning jig 16 will be described. As shown in Figures 17 and 18, the positioning fixture 16 includes a plate-shaped base 16a, two guide pins 17, two fixing plungers 18, a sensor positioning plate 19, and a micrometer head. 20.

基座16a係自Z方向觀之,被形成為矩形狀。在基座16a中之比X軸方向中央部還要靠近-X方向處,當設置固定治具8到定位治具16後,其設有用於使固定治具8與定位治具16不接觸之往-Z方向凹陷之凹部21。The base 16a is formed in a rectangular shape as viewed from the Z direction. In the base 16a, which is closer to the -X direction than the central part in the The concave portion 21 is depressed in the -Z direction.

兩個之導引銷17,其分別夾持基座16a中之凹部21,以被設於X軸方向兩側,進行印刷電路板4之Y軸方向之定位。兩個之固定用柱塞18,其分別被設於與基座16a中之兩個之導引銷17相向之位置,推抵印刷電路板4到兩個之導引銷17。Two guide pins 17 respectively clamp the recesses 21 in the base 16a and are arranged on both sides in the X-axis direction to position the printed circuit board 4 in the Y-axis direction. The two fixing plungers 18 are respectively located at positions facing the two guide pins 17 of the base 16a, and push the two guide pins 17 of the printed circuit board 4.

感測器定位板19,其被設於基座16a中之凹部21之X方向之周緣部,為了進行感測器6之定位,具有配合感測器6之剖面尺寸之半圓狀之缺口19a。測微頭20,其被設於本體部6a的X方向端部,進行印刷電路板4之X軸方向之定位。The sensor positioning plate 19 is provided at the peripheral edge of the recess 21 in the base 16 a in the X direction. In order to position the sensor 6 , it has a semicircular notch 19 a matching the cross-sectional size of the sensor 6 . The micrometer head 20 is provided at the X-direction end of the main body 6 a to position the printed circuit board 4 in the X-axis direction.

接著,使用圖19與圖20,說明使用定位治具16之感測器6之定位方法。首先,配置固定治具8於定位治具16的凹部21。之後,使組裝有電子零件5之印刷電路板4,通過被形成於定位治具16上的固定治具8之內周側之開口以配置。此時,凹部21係成為不接觸到印刷電路板4與固定治具8地,相對於定位治具16的基座16a而言,可水平(與XY平面平行)配置之構造。Next, the positioning method of the sensor 6 using the positioning jig 16 will be described using FIGS. 19 and 20 . First, the fixing jig 8 is arranged in the recess 21 of the positioning jig 16 . Thereafter, the printed circuit board 4 on which the electronic component 5 is assembled is placed through the opening on the inner peripheral side of the fixing jig 8 formed in the positioning jig 16 . At this time, the recess 21 has a structure that can be arranged horizontally (parallel to the XY plane) with respect to the base 16 a of the positioning jig 16 without contacting the printed circuit board 4 and the fixing jig 8 .

沿著定位治具16的導引銷17與固定用柱塞18,決定印刷電路板4之Y軸方向之位置。X軸方向之位置調整之進行,其為印刷電路板4移動至碰觸到測微頭20為止。而且,定位治具16中之測微頭20之位置,其事前調整到電子零件5與感測器6之距離成為期望距離之位置。在此狀態下,推抵感測器6到感測器定位板19之半圓狀之缺口19a,以定位感測器6之位置,以彈性構件固定7感測器6。之後,使印刷電路板4在-X方向上移動,自定位治具16卸下印刷電路板4,藉此,感測器6之定位與固定係結束。The position of the printed circuit board 4 in the Y-axis direction is determined along the guide pin 17 and the fixing plunger 18 of the positioning jig 16 . The position adjustment in the X-axis direction is carried out when the printed circuit board 4 moves until it touches the micrometer head 20 . Furthermore, the position of the micrometer head 20 in the positioning jig 16 is adjusted in advance to a position where the distance between the electronic component 5 and the sensor 6 becomes the desired distance. In this state, the sensor 6 is pushed to the semicircular notch 19a of the sensor positioning plate 19 to position the sensor 6, and the sensor 6 is fixed with an elastic member. Thereafter, the printed circuit board 4 is moved in the −X direction, and the printed circuit board 4 is removed from the positioning jig 16 , thereby completing the positioning and fixing of the sensor 6 .

如圖7所示,當感測器6與震動器13間之距離變長時,自感測器6輸出之電壓值係降低。所以,固定感測器6,使得感測器6與電子零件5間之距離為5mm以下。但是,如果接近感測器6到電子零件5時,在彎曲測試時,固定治具8係接觸到推件治具2。As shown in FIG. 7 , when the distance between the sensor 6 and the vibrator 13 becomes longer, the voltage value output from the sensor 6 decreases. Therefore, the sensor 6 is fixed so that the distance between the sensor 6 and the electronic component 5 is 5 mm or less. However, if the sensor 6 is brought close to the electronic component 5, the fixed jig 8 contacts the pusher jig 2 during the bending test.

但是,如圖13與圖14(a),(b)所示,固定治具8的外周面之中,使與推件治具2相向之部分8a為圓弧狀或傾斜狀,藉此,可更加接近固定治具8到推件治具2。但是,如上所述,必須精度良好地定位感測器6。However, as shown in Figures 13 and 14 (a) and (b), the portion 8a of the outer peripheral surface of the fixed jig 8 that faces the pusher jig 2 is arc-shaped or inclined, thereby The fixed fixture 8 can be closer to the push fixture 2 . However, as mentioned above, the sensor 6 must be positioned with good accuracy.

如上所述,於實施形態6之測試方法中,在搭載電子零件5到印刷電路板4的搭載面,藉固定治具8與壓抵構件,固定感測器6到印刷電路板4的搭載面中之電子零件5之周邊之工序中,其使用定位治具16,以定位感測器6到印刷電路板4。As described above, in the test method of Embodiment 6, the sensor 6 is fixed to the mounting surface of the printed circuit board 4 by the fixing jig 8 and the pressing member on the mounting surface of the printed circuit board 4 on which the electronic component 5 is mounted. In the process surrounding the electronic component 5 , a positioning jig 16 is used to position the sensor 6 to the printed circuit board 4 .

因此,成為可精度良好地固定感測器6到電子零件5之周邊,對應於由電子零件5之破壞所致之震動之感測器6之輸出電壓係較大地輸出,所以,震動之檢測感度係提高。Therefore, the sensor 6 can be fixed to the periphery of the electronic component 5 with high accuracy, and the output voltage of the sensor 6 corresponding to the vibration caused by the damage of the electronic component 5 is large, so the detection sensitivity of the vibration is improved. system improved.

此開示雖然被詳細地說明過,但是,上述之說明係於全部之事態中,其為例示,並非用於侷限者。其可被瞭解為未例示之無數變形例為可被假設者。Although this teaching has been explained in detail, the above explanation is based on the overall situation and is an illustration and not a limitation. It can be understood that numerous modifications not illustrated can be assumed.

而且,可以自由組合各實施形態,可適宜、變形、省略各實施形態。Furthermore, each embodiment can be freely combined, and each embodiment can be appropriately modified or omitted.

2:推件治具 3:支撐座 4:印刷電路板 5:電子零件 6:感測器 7:彈性構件 8:固定治具 9:放大器 10:量測部 12:螺絲 15:頻段消除過濾器 16:定位治具 2: Push piece fixture 3: Support base 4: Printed circuit board 5: Electronic parts 6: Sensor 7: Elastic component 8: Fixed fixture 9: Amplifier 10:Measurement Department 12:Screws 15: Band elimination filter 16: Positioning fixture

圖1為實施形態1之測試裝置之示意圖。 圖2為自-Y方向觀看實施形態1之測試裝置所包括之感測器之安裝處所之示意圖。 圖3為自X方向觀看實施形態1之測試裝置所包括之感測器之安裝處所之示意圖。 圖4為表示在實施形態1之測試裝置所包括之印刷電路板上,固定震動器感測器後之狀態之示意圖。 圖5為表示對於印刷電路板之感測器之壓抵力與感測器之輸出電壓之關係之圖。 圖6為表示感測器與震動器間之距離之示意圖。 圖7為表示於震動器中,施加一定震動到印刷電路板後之震動器與感測器間之距離,與感測器之輸出電壓之關係之圖。 圖8為實施形態2之測試裝置之示意圖。 圖9為自X方向觀看實施形態2之測試裝置所包括之感測器之安裝處所之示意圖。 圖10為實施形態3之測試裝置之示意圖。 圖11為表示針對陶瓷製積層電容器到達極限值後之造成破壞之震動,由感測器所檢測之輸出訊號波形之圖。 圖12為表示陶瓷製積層電容器到達極限值後之造成破壞之震動所包含之各頻率之直方圖。 圖13為自-Y方向觀看實施形態4之測試裝置所包括之感測器之安裝處所之示意圖。 圖14為表示實施形態4之測試裝置所包括之固定治具的外周面之中,與推件治具相向之部分之放大圖。 圖15為自X方向觀看實施形態5之測試裝置所包括之感測器之安裝處所之示意圖。 圖16為表示實施形態5之測試裝置所包括之固定治具的內周面之中,與印刷電路板接觸之部分、及固定治具的外周面之中,與推件治具相向之部分之放大圖。 圖17為自Z方向觀看實施形態6之定位治具之示意圖。 圖18為自-Y方向觀看實施形態6之定位治具之示意圖。 圖19為自Z方向觀看使用實施形態6之定位治具,安裝感測器後之狀態之示意圖。 圖20為自-Y方向觀看使用實施形態6之定位治具,安裝感測器後之狀態之示意圖。 FIG. 1 is a schematic diagram of the test device of Embodiment 1. FIG. 2 is a schematic view of the installation location of the sensor included in the test device of Embodiment 1 viewed from the -Y direction. 3 is a schematic view of the installation location of the sensor included in the test device of Embodiment 1 viewed from the X direction. 4 is a schematic diagram showing a state after the vibrator sensor is fixed on the printed circuit board included in the test device of Embodiment 1. FIG. 5 is a graph showing the relationship between the pressing force of the sensor on the printed circuit board and the output voltage of the sensor. Figure 6 is a schematic diagram showing the distance between the sensor and the vibrator. Figure 7 is a diagram showing the relationship between the distance between the vibrator and the sensor and the output voltage of the sensor after applying a certain vibration to the printed circuit board in the vibrator. FIG. 8 is a schematic diagram of the test device of Embodiment 2. 9 is a schematic view of the installation location of the sensor included in the test device of Embodiment 2 viewed from the X direction. Fig. 10 is a schematic diagram of the test device of Embodiment 3. Figure 11 is a diagram showing the output signal waveform detected by the sensor in response to the vibration that causes damage after the ceramic multilayer capacitor reaches the limit value. FIG. 12 is a histogram showing the frequencies involved in the vibration that causes damage to the ceramic multilayer capacitor after it reaches the limit value. 13 is a schematic view of the installation location of the sensor included in the test device of Embodiment 4 viewed from the -Y direction. FIG. 14 is an enlarged view showing the portion of the outer peripheral surface of the fixed jig included in the test device of Embodiment 4 that faces the pusher jig. FIG. 15 is a schematic view of the installation location of the sensor included in the test device of Embodiment 5 viewed from the X direction. 16 shows a portion of the inner circumferential surface of the fixed jig included in the test device of Embodiment 5 that is in contact with the printed circuit board, and a portion of the outer circumferential surface of the fixed jig that faces the pusher jig. Enlarge image. FIG. 17 is a schematic diagram of the positioning jig of Embodiment 6 viewed from the Z direction. FIG. 18 is a schematic diagram of the positioning jig of Embodiment 6 viewed from the -Y direction. FIG. 19 is a schematic diagram of the positioning jig of Embodiment 6 and the state after the sensor is installed, viewed from the Z direction. 20 is a schematic diagram of the positioning jig of Embodiment 6 and the state after the sensor is installed, viewed from the -Y direction.

1:負載施加部 1:Load application part

2:推件治具 2: Push piece fixture

3:支撐座 3: Support base

4:印刷電路板 4: Printed circuit board

5:電子零件 5: Electronic parts

6:感測器 6: Sensor

7:彈性構件 7: Elastic component

8:固定治具 8: Fixed fixture

9:放大器 9: Amplifier

10:量測部 10:Measurement Department

11:接觸媒質 11: Contact with media

Claims (11)

一種測試裝置,其包括: 支撐座,支撐搭載有電子零件之印刷電路板的搭載面中之兩端部; 推件治具,被配置於該印刷電路板中之該搭載面之相反側之面側,而且,對於該電子零件,透過該印刷電路板以施加負載; 感測器,被配置於該印刷電路板的該搭載面中之該電子零件的周邊,而且,檢測該電子零件之破壞所致之震動,輸出對應於該震動之電壓訊號; 固定治具,固定該感測器於該印刷電路板; 壓抵構件,壓抵該感測器到該印刷電路板;以及 量測部,用於量測自該感測器輸出之該電壓訊號之波形。 A test device including: A support base supports both ends of the mounting surface of a printed circuit board on which electronic components are mounted; The pusher jig is disposed on the opposite side of the mounting surface of the printed circuit board, and applies a load to the electronic component through the printed circuit board; The sensor is arranged around the electronic component in the mounting surface of the printed circuit board, and detects vibration caused by damage to the electronic component, and outputs a voltage signal corresponding to the vibration; Fixing fixture to fix the sensor on the printed circuit board; a pressing member that presses the sensor to the printed circuit board; and The measuring part is used to measure the waveform of the voltage signal output from the sensor. 如請求項1之測試裝置,其中還包括放大自該感測器輸出之該電壓訊號之放大器, 該量測部係量測被該放大器所放大之該電壓訊號之波形。 The test device of claim 1, further comprising an amplifier for amplifying the voltage signal output from the sensor, The measuring part measures the waveform of the voltage signal amplified by the amplifier. 如請求項1或請求項2之測試裝置,其中該壓抵構件係包含彈性構件。The test device of claim 1 or claim 2, wherein the pressing member includes an elastic member. 如請求項1或請求項2之測試裝置,其中該壓抵構件係包含螺栓或螺絲。The test device of claim 1 or claim 2, wherein the pressing member includes bolts or screws. 如請求項1或請求項2之測試裝置,其中還包括被配置於該感測器與該量測部間之頻段消除過濾器。The test device of claim 1 or claim 2 further includes a frequency band elimination filter disposed between the sensor and the measurement part. 如請求項1或請求項2之測試裝置,其中壓抵該感測器到該印刷電路板之壓抵力為0.4kg/cm 2以上。 Such as the test device of claim 1 or claim 2, wherein the pressing force from the sensor to the printed circuit board is more than 0.4kg/cm 2 . 如請求項1或請求項2之測試裝置,其中自該感測器至該電子零件為止之距離為5mm以下。For example, the test device of claim 1 or claim 2, wherein the distance from the sensor to the electronic component is less than 5 mm. 如請求項1或請求項2之測試裝置,其中該固定治具,其被形成為包圍該印刷電路板與該壓抵構件之框架狀, 該固定治具的內周面,其接觸到該印刷電路板中之該搭載面之相反側之面、及該壓抵構件中之該印刷電路板之相反側的部分, 該固定治具的外周面之中,與該推件治具相向之部分,其被形成為圓弧狀或傾斜狀。 The test device of claim 1 or claim 2, wherein the fixing fixture is formed into a frame shape surrounding the printed circuit board and the pressing member, The inner peripheral surface of the fixing jig contacts the surface of the printed circuit board on the opposite side to the mounting surface and the portion of the pressing member on the opposite side of the printed circuit board, The portion of the outer peripheral surface of the fixed fixture that faces the pusher fixture is formed into an arc shape or an inclined shape. 如請求項1或請求項2之測試裝置,其中該固定治具係被形成為包圍該印刷電路板與該壓抵構件之框架狀, 該固定治具的內周面,其接觸到該印刷電路板中之該搭載面之相反側的面、及該壓抵構件中之該印刷電路板之相反側的部分, 該固定治具的該內周面之中,與該印刷電路板接觸之部分,其被形成為圓弧狀或傾斜狀。 The test device of claim 1 or claim 2, wherein the fixing fixture is formed into a frame shape surrounding the printed circuit board and the pressing member, The inner peripheral surface of the fixing jig contacts the surface of the printed circuit board on the opposite side to the mounting surface and the portion of the pressing member on the opposite side of the printed circuit board, The portion of the inner peripheral surface of the fixed fixture that contacts the printed circuit board is formed into an arc shape or an inclined shape. 一種測試方法,使用請求項1或請求項2之測試裝置,其特徵在於: (a)搭載該電子零件到該印刷電路板的該搭載面,藉該固定治具與該壓抵構件,固定該感測器到該印刷電路板的該搭載面中之該電子零件之周邊之工序; (b)載置該印刷電路板到該支撐座上,使得該電子零件位於下側之工序; (c)下降該推件治具,以接觸到該印刷電路板中之該搭載面之相反側的面之工序; (d)更加下降該推件治具,自做為該推件治具接觸到該印刷電路板的上表面後之位置之基準位置,施加負載到該印刷電路板之工序; (e)藉該印刷電路板彎曲而該電子零件係被破壞,當被該量測部所測得之該電壓訊號之波形,超過被事先設定之門檻值後,將自該基準位置算起之該推件治具之押入尺寸,作為該電子零件之極限值。 A test method using the test device of claim 1 or claim 2, characterized by: (a) Mount the electronic component to the mounting surface of the printed circuit board, and fix the sensor to the periphery of the electronic component in the mounting surface of the printed circuit board through the fixing fixture and the pressing member. process; (b) The process of placing the printed circuit board on the support base so that the electronic component is located on the lower side; (c) The process of lowering the pusher fixture to contact the surface of the printed circuit board opposite to the mounting surface; (d) The process of further lowering the pusher jig and applying a load to the printed circuit board from the reference position where the pusher jig contacts the upper surface of the printed circuit board; (e) When the printed circuit board is bent and the electronic component is damaged, when the waveform of the voltage signal measured by the measuring part exceeds the preset threshold, the value will be calculated from the reference position. The push-in size of the push piece fixture is used as the limit value of the electronic component. 如請求項10之測試方法,其中於該工序(a)中,使用定位治具,以定位該感測器於該印刷電路板。The test method of claim 10, wherein in the process (a), a positioning jig is used to position the sensor on the printed circuit board.
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