TW201819141A - Releasing film - Google Patents
Releasing film Download PDFInfo
- Publication number
- TW201819141A TW201819141A TW106116589A TW106116589A TW201819141A TW 201819141 A TW201819141 A TW 201819141A TW 106116589 A TW106116589 A TW 106116589A TW 106116589 A TW106116589 A TW 106116589A TW 201819141 A TW201819141 A TW 201819141A
- Authority
- TW
- Taiwan
- Prior art keywords
- meth
- acrylate
- resin
- release layer
- release film
- Prior art date
Links
- 229920005989 resin Polymers 0.000 claims abstract description 82
- 239000011347 resin Substances 0.000 claims abstract description 82
- 239000000945 filler Substances 0.000 claims abstract description 51
- 239000000758 substrate Substances 0.000 claims abstract description 46
- 239000002245 particle Substances 0.000 claims abstract description 31
- -1 polyethylene terephthalate Polymers 0.000 claims description 70
- 239000003431 cross linking reagent Substances 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 14
- 229920001187 thermosetting polymer Polymers 0.000 claims description 10
- 229920001707 polybutylene terephthalate Polymers 0.000 claims description 6
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 6
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 6
- IKCQWKJZLSDDSS-UHFFFAOYSA-N 2-formyloxyethyl formate Chemical compound O=COCCOC=O IKCQWKJZLSDDSS-UHFFFAOYSA-N 0.000 claims description 2
- 229920000417 polynaphthalene Polymers 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 109
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 105
- 238000000465 moulding Methods 0.000 description 36
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 32
- 238000000034 method Methods 0.000 description 29
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 24
- 239000000178 monomer Substances 0.000 description 23
- 239000004065 semiconductor Substances 0.000 description 23
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 20
- 239000004925 Acrylic resin Substances 0.000 description 18
- 229920000178 Acrylic resin Polymers 0.000 description 18
- 239000000203 mixture Substances 0.000 description 18
- 125000000524 functional group Chemical group 0.000 description 16
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 15
- 239000000853 adhesive Substances 0.000 description 11
- 230000001070 adhesive effect Effects 0.000 description 11
- 239000000126 substance Substances 0.000 description 10
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 9
- 238000005259 measurement Methods 0.000 description 9
- 238000006116 polymerization reaction Methods 0.000 description 9
- 150000002430 hydrocarbons Chemical group 0.000 description 8
- 230000014759 maintenance of location Effects 0.000 description 8
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 8
- 125000002723 alicyclic group Chemical group 0.000 description 7
- 238000004132 cross linking Methods 0.000 description 7
- 150000002148 esters Chemical class 0.000 description 7
- 238000007789 sealing Methods 0.000 description 7
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 6
- 229920001577 copolymer Polymers 0.000 description 6
- 230000003746 surface roughness Effects 0.000 description 6
- 125000000217 alkyl group Chemical group 0.000 description 5
- 125000004432 carbon atom Chemical group C* 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 238000001035 drying Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 150000003440 styrenes Chemical class 0.000 description 5
- 238000001721 transfer moulding Methods 0.000 description 5
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 4
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 229920001519 homopolymer Polymers 0.000 description 4
- 239000012948 isocyanate Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000003960 organic solvent Substances 0.000 description 4
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
- 229920000728 polyester Polymers 0.000 description 4
- 229920005672 polyolefin resin Polymers 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 3
- 229920000877 Melamine resin Polymers 0.000 description 3
- IQYMRQZTDOLQHC-ZQTLJVIJSA-N [(1R,4S)-2-bicyclo[2.2.1]heptanyl] prop-2-enoate Chemical compound C1C[C@H]2C(OC(=O)C=C)C[C@@H]1C2 IQYMRQZTDOLQHC-ZQTLJVIJSA-N 0.000 description 3
- 150000001336 alkenes Chemical class 0.000 description 3
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 3
- 125000003277 amino group Chemical group 0.000 description 3
- RJGDLRCDCYRQOQ-UHFFFAOYSA-N anthrone Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3CC2=C1 RJGDLRCDCYRQOQ-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 238000000748 compression moulding Methods 0.000 description 3
- BTQLDZMOTPTCGG-UHFFFAOYSA-N cyclopentyl prop-2-enoate Chemical compound C=CC(=O)OC1CCCC1 BTQLDZMOTPTCGG-UHFFFAOYSA-N 0.000 description 3
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 3
- 125000003700 epoxy group Chemical group 0.000 description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 3
- 229910001410 inorganic ion Inorganic materials 0.000 description 3
- 239000003566 sealing material Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 230000037303 wrinkles Effects 0.000 description 3
- REPVLJRCJUVQFA-UHFFFAOYSA-N (-)-isopinocampheol Natural products C1C(O)C(C)C2C(C)(C)C1C2 REPVLJRCJUVQFA-UHFFFAOYSA-N 0.000 description 2
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 2
- VZXTWGWHSMCWGA-UHFFFAOYSA-N 1,3,5-triazine-2,4-diamine Chemical compound NC1=NC=NC(N)=N1 VZXTWGWHSMCWGA-UHFFFAOYSA-N 0.000 description 2
- PHPRWKJDGHSJMI-UHFFFAOYSA-N 1-adamantyl prop-2-enoate Chemical compound C1C(C2)CC3CC2CC1(OC(=O)C=C)C3 PHPRWKJDGHSJMI-UHFFFAOYSA-N 0.000 description 2
- RKMGAJGJIURJSJ-UHFFFAOYSA-N 2,2,6,6-tetramethylpiperidine Chemical compound CC1(C)CCCC(C)(C)N1 RKMGAJGJIURJSJ-UHFFFAOYSA-N 0.000 description 2
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 2
- JLBJTVDPSNHSKJ-UHFFFAOYSA-N 4-Methylstyrene Chemical compound CC1=CC=C(C=C)C=C1 JLBJTVDPSNHSKJ-UHFFFAOYSA-N 0.000 description 2
- UDMMZSJNHAWYKX-UHFFFAOYSA-N 4-phenylbicyclo[2.2.1]hept-2-ene Chemical compound C1C(C=C2)CCC21C1=CC=CC=C1 UDMMZSJNHAWYKX-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 2
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 2
- 241001422033 Thestylus Species 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- SKKHNUKNMQLBTJ-QIIDTADFSA-N [(1s,4r)-3-bicyclo[2.2.1]heptanyl] 2-methylprop-2-enoate Chemical compound C1C[C@H]2C(OC(=O)C(=C)C)C[C@@H]1C2 SKKHNUKNMQLBTJ-QIIDTADFSA-N 0.000 description 2
- MZVQCMJNVPIDEA-UHFFFAOYSA-N [CH2]CN(CC)CC Chemical group [CH2]CN(CC)CC MZVQCMJNVPIDEA-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 125000004018 acid anhydride group Chemical group 0.000 description 2
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical class C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- 229940116229 borneol Drugs 0.000 description 2
- CKDOCTFBFTVPSN-UHFFFAOYSA-N borneol Natural products C1CC2(C)C(C)CC1C2(C)C CKDOCTFBFTVPSN-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000001723 curing Methods 0.000 description 2
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 2
- KBLWLMPSVYBVDK-UHFFFAOYSA-N cyclohexyl prop-2-enoate Chemical compound C=CC(=O)OC1CCCCC1 KBLWLMPSVYBVDK-UHFFFAOYSA-N 0.000 description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical compound C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 2
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 2
- 150000002009 diols Chemical class 0.000 description 2
- DTGKSKDOIYIVQL-UHFFFAOYSA-N dl-isoborneol Natural products C1CC2(C)C(O)CC1C2(C)C DTGKSKDOIYIVQL-UHFFFAOYSA-N 0.000 description 2
- LQZZUXJYWNFBMV-UHFFFAOYSA-N dodecan-1-ol Chemical compound CCCCCCCCCCCCO LQZZUXJYWNFBMV-UHFFFAOYSA-N 0.000 description 2
- 229920000840 ethylene tetrafluoroethylene copolymer Polymers 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 125000005842 heteroatom Chemical group 0.000 description 2
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000003518 norbornenyl group Chemical group C12(C=CC(CC1)C2)* 0.000 description 2
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 2
- 239000011112 polyethylene naphthalate Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- 239000010457 zeolite Substances 0.000 description 2
- APAUNQLFVGBQQW-UHFFFAOYSA-N (1,2,2-trimethylcyclohexyl) 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1(C)CCCCC1(C)C APAUNQLFVGBQQW-UHFFFAOYSA-N 0.000 description 1
- UGESFXVNLURSNE-UHFFFAOYSA-N (2-prop-2-enoyloxy-1,4-dioxan-2-yl) prop-2-enoate Chemical compound C=CC(=O)OC1(COCCO1)OC(=O)C=C UGESFXVNLURSNE-UHFFFAOYSA-N 0.000 description 1
- VYPRXWXGLLURNB-UHFFFAOYSA-N (5-methyl-2-propan-2-ylcyclohexyl) 2-methylprop-2-enoate Chemical compound CC(C)C1CCC(C)CC1OC(=O)C(C)=C VYPRXWXGLLURNB-UHFFFAOYSA-N 0.000 description 1
- BPXVHIRIPLPOPT-UHFFFAOYSA-N 1,3,5-tris(2-hydroxyethyl)-1,3,5-triazinane-2,4,6-trione Chemical compound OCCN1C(=O)N(CCO)C(=O)N(CCO)C1=O BPXVHIRIPLPOPT-UHFFFAOYSA-N 0.000 description 1
- YLVACWCCJCZITJ-UHFFFAOYSA-N 1,4-dioxane-2,3-diol Chemical compound OC1OCCOC1O YLVACWCCJCZITJ-UHFFFAOYSA-N 0.000 description 1
- NBIYKOUEZOEMMC-UHFFFAOYSA-N 1-(2-methylpropyl)pyrrole-2,5-dione Chemical compound CC(C)CN1C(=O)C=CC1=O NBIYKOUEZOEMMC-UHFFFAOYSA-N 0.000 description 1
- MZVABYGYVXBZDP-UHFFFAOYSA-N 1-adamantyl 2-methylprop-2-enoate Chemical compound C1C(C2)CC3CC2CC1(OC(=O)C(=C)C)C3 MZVABYGYVXBZDP-UHFFFAOYSA-N 0.000 description 1
- MKRBAPNEJMFMHU-UHFFFAOYSA-N 1-benzylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1CC1=CC=CC=C1 MKRBAPNEJMFMHU-UHFFFAOYSA-N 0.000 description 1
- JNPCNDJVEUEFBO-UHFFFAOYSA-N 1-butylpyrrole-2,5-dione Chemical compound CCCCN1C(=O)C=CC1=O JNPCNDJVEUEFBO-UHFFFAOYSA-N 0.000 description 1
- BOVQCIDBZXNFEJ-UHFFFAOYSA-N 1-chloro-3-ethenylbenzene Chemical compound ClC1=CC=CC(C=C)=C1 BOVQCIDBZXNFEJ-UHFFFAOYSA-N 0.000 description 1
- KTZVZZJJVJQZHV-UHFFFAOYSA-N 1-chloro-4-ethenylbenzene Chemical compound ClC1=CC=C(C=C)C=C1 KTZVZZJJVJQZHV-UHFFFAOYSA-N 0.000 description 1
- XHAFIUUYXQFJEW-UHFFFAOYSA-N 1-chloroethenylbenzene Chemical compound ClC(=C)C1=CC=CC=C1 XHAFIUUYXQFJEW-UHFFFAOYSA-N 0.000 description 1
- SJLLJZNSZJHXQN-UHFFFAOYSA-N 1-dodecylpyrrole-2,5-dione Chemical compound CCCCCCCCCCCCN1C(=O)C=CC1=O SJLLJZNSZJHXQN-UHFFFAOYSA-N 0.000 description 1
- VTPNYMSKBPZSTF-UHFFFAOYSA-N 1-ethenyl-2-ethylbenzene Chemical compound CCC1=CC=CC=C1C=C VTPNYMSKBPZSTF-UHFFFAOYSA-N 0.000 description 1
- NVZWEEGUWXZOKI-UHFFFAOYSA-N 1-ethenyl-2-methylbenzene Chemical compound CC1=CC=CC=C1C=C NVZWEEGUWXZOKI-UHFFFAOYSA-N 0.000 description 1
- XHUZSRRCICJJCN-UHFFFAOYSA-N 1-ethenyl-3-ethylbenzene Chemical compound CCC1=CC=CC(C=C)=C1 XHUZSRRCICJJCN-UHFFFAOYSA-N 0.000 description 1
- JZHGRUMIRATHIU-UHFFFAOYSA-N 1-ethenyl-3-methylbenzene Chemical compound CC1=CC=CC(C=C)=C1 JZHGRUMIRATHIU-UHFFFAOYSA-N 0.000 description 1
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- JWVTWJNGILGLAT-UHFFFAOYSA-N 1-ethenyl-4-fluorobenzene Chemical compound FC1=CC=C(C=C)C=C1 JWVTWJNGILGLAT-UHFFFAOYSA-N 0.000 description 1
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- HIDBROSJWZYGSZ-UHFFFAOYSA-N 1-phenylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1=CC=CC=C1 HIDBROSJWZYGSZ-UHFFFAOYSA-N 0.000 description 1
- DABFKTHTXOELJF-UHFFFAOYSA-N 1-propylpyrrole-2,5-dione Chemical compound CCCN1C(=O)C=CC1=O DABFKTHTXOELJF-UHFFFAOYSA-N 0.000 description 1
- YEKDUBMGZZTUDY-UHFFFAOYSA-N 1-tert-butylpyrrole-2,5-dione Chemical compound CC(C)(C)N1C(=O)C=CC1=O YEKDUBMGZZTUDY-UHFFFAOYSA-N 0.000 description 1
- IGGDKDTUCAWDAN-UHFFFAOYSA-N 1-vinylnaphthalene Chemical compound C1=CC=C2C(C=C)=CC=CC2=C1 IGGDKDTUCAWDAN-UHFFFAOYSA-N 0.000 description 1
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- DPYJMQGTOTVJBV-UHFFFAOYSA-N 2,2-difluoroethenylbenzene Chemical compound FC(F)=CC1=CC=CC=C1 DPYJMQGTOTVJBV-UHFFFAOYSA-N 0.000 description 1
- CZZVAVMGKRNEAT-UHFFFAOYSA-N 2,2-dimethylpropane-1,3-diol;3-hydroxy-2,2-dimethylpropanoic acid Chemical compound OCC(C)(C)CO.OCC(C)(C)C(O)=O CZZVAVMGKRNEAT-UHFFFAOYSA-N 0.000 description 1
- BJELTSYBAHKXRW-UHFFFAOYSA-N 2,4,6-triallyloxy-1,3,5-triazine Chemical compound C=CCOC1=NC(OCC=C)=NC(OCC=C)=N1 BJELTSYBAHKXRW-UHFFFAOYSA-N 0.000 description 1
- SBYMUDUGTIKLCR-UHFFFAOYSA-N 2-chloroethenylbenzene Chemical compound ClC=CC1=CC=CC=C1 SBYMUDUGTIKLCR-UHFFFAOYSA-N 0.000 description 1
- WHBAYNMEIXUTJV-UHFFFAOYSA-N 2-chloroethyl prop-2-enoate Chemical compound ClCCOC(=O)C=C WHBAYNMEIXUTJV-UHFFFAOYSA-N 0.000 description 1
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- 125000004777 2-fluoroethyl group Chemical group [H]C([H])(F)C([H])([H])* 0.000 description 1
- CTHJQRHPNQEPAB-UHFFFAOYSA-N 2-methoxyethenylbenzene Chemical compound COC=CC1=CC=CC=C1 CTHJQRHPNQEPAB-UHFFFAOYSA-N 0.000 description 1
- XLLXMBCBJGATSP-UHFFFAOYSA-N 2-phenylethenol Chemical compound OC=CC1=CC=CC=C1 XLLXMBCBJGATSP-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- KGIGUEBEKRSTEW-UHFFFAOYSA-N 2-vinylpyridine Chemical compound C=CC1=CC=CC=N1 KGIGUEBEKRSTEW-UHFFFAOYSA-N 0.000 description 1
- UJTRCPVECIHPBG-UHFFFAOYSA-N 3-cyclohexylpyrrole-2,5-dione Chemical compound O=C1NC(=O)C(C2CCCCC2)=C1 UJTRCPVECIHPBG-UHFFFAOYSA-N 0.000 description 1
- PNXLLYJEMJAMQS-UHFFFAOYSA-N 4-(2-methyloxiran-2-yl)butan-2-yl prop-2-enoate Chemical compound C(C=C)(=O)OC(CCC1(CO1)C)C PNXLLYJEMJAMQS-UHFFFAOYSA-N 0.000 description 1
- KFDVPJUYSDEJTH-UHFFFAOYSA-N 4-ethenylpyridine Chemical compound C=CC1=CC=NC=C1 KFDVPJUYSDEJTH-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/56—Coatings, e.g. enameled or galvanised; Releasing, lubricating or separating agents
- B29C33/68—Release sheets
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- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/18—Layered products comprising a layer of synthetic resin characterised by the use of special additives
- B32B27/20—Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/36—Layered products comprising a layer of synthetic resin comprising polyesters
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/70—Other properties
- B32B2307/748—Releasability
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
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Abstract
Description
本發明是有關於一種脫模膜。This invention relates to a release film.
半導體晶片通常為了阻擋外部空氣及進行保護而利用樹脂進行密封,並以稱為封裝的成形品的狀態被安裝於基板上。該成形品通常以經由作為密封樹脂的流路的流道(runner)而連結的每一個晶片的封裝成形品的形式而成形。於該情況下,藉由成形品的成形中所使用的模具的結構、對密封樹脂添加脫模劑等,獲得成形品的自模具的脫模性。The semiconductor wafer is usually sealed with a resin in order to block external air and protect it, and is mounted on the substrate in a state called a packaged molded article. This molded article is usually formed in the form of a packaged molded article of each wafer which is connected via a runner which is a flow path of a sealing resin. In this case, the mold release property of the molded article from the mold is obtained by the structure of the mold used for molding the molded article, the release agent or the like to the sealing resin.
另一方面,因封裝的小型化、多針化等要求,對球柵陣列(Ball Gird Array,BGA)方式、四方扁平無引腳(Quad Flat Non-leaded,QFN)方式、晶圓級晶片尺寸封裝(Wafer Level-Chip Size Package,WL-CSP)方式等的封裝的需求增加。於QFN方式中,為了確保間距以及防止由密封材引起的端子部的毛邊的產生,另外,於BGA方式以及WL-CSP方式中,為了提高自模具的封裝的脫模性,使用樹脂製脫模膜(例如,參照專利文獻1)。將使用此種脫模膜的成型方法稱為「膜輔助成型」。On the other hand, due to the miniaturization and multi-needle requirements of the package, Ball Grid Array (BGA), Quad Flat Non-leaded (QFN), wafer level wafer size The demand for packages such as the Wafer Level-Chip Size Package (WL-CSP) method has increased. In the QFN method, in order to ensure the pitch and prevent the generation of the burrs of the terminal portion by the sealing material, in the BGA method and the WL-CSP method, in order to improve the mold release property of the package from the mold, the resin is used for mold release. Film (for example, refer to Patent Document 1). A molding method using such a release film is referred to as "film-assisted molding".
於BGA方式以及WL-CSP方式的領域中,以1注射(shot)的大尺寸化與高效率化為目的,成型方法正在進行自先前以來的轉移成形方式向壓縮成形方式的變更。In the field of the BGA method and the WL-CSP system, the molding method is changing from the previous transfer molding method to the compression molding method for the purpose of increasing the size and efficiency of one shot.
另外,亦提出有如下製程:與該些成型方法無關地,將具有不同功能的功能性片材預先搭載於脫模膜,於成型步驟中以半導體封裝上配置有功能性片材的方式進行成型(例如,參照專利文獻2以及專利文獻3)。 [現有技術文獻] [專利文獻]Further, there has been proposed a process in which a functional sheet having a different function is mounted on a release film in advance, and a functional sheet is placed on a semiconductor package in a molding step, regardless of the molding methods. (For example, refer to Patent Document 2 and Patent Document 3). [Prior Art Document] [Patent Literature]
[專利文獻1]日本專利特開2002-158242號公報 [專利文獻2]日本專利特開2007-287937號公報 [專利文獻3]WO2013/183671號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. JP-A-2007-158937 (Patent Document No. 2007-287937) [Patent Document 3] WO2013/183671
[發明所欲解決之課題] 對專利文獻2以及專利文獻3中記載的方法而言,於成型半導體封裝的步驟中,能夠一併將功能性片材配置於半導體封裝上。另一方面,於實際的步驟中理想的是,脫模膜滿足功能性片材於直至成型步驟為止的步驟中不自脫模層剝離而受到保持的性能、與功能性片材於成型步驟中良好地進行脫模的性能。[Problems to be Solved by the Invention] In the methods described in Patent Document 2 and Patent Document 3, in the step of molding a semiconductor package, the functional sheet can be disposed on the semiconductor package. On the other hand, in the actual step, it is desirable that the release film satisfies the performance that the functional sheet is not released from the release layer in the step up to the molding step, and the functional sheet is in the molding step. The performance of demolding is performed well.
現如今利用壓縮成形方式而被廣泛使用的脫模膜中,無法賦予保持功能性片材的性能。因此,為了使用該脫模膜而於成型步驟中將功能性片材成型於半導體封裝上,需要將脫模膜配置於模具內後設置功能性片材。然而,將功能性片材設置於在形狀複雜且經加熱的模具內所配置的脫模膜上的步驟難以自動化,存在手工作業時缺乏作業效率以及安全性的問題。In the release film which is widely used by the compression molding method, the performance of retaining the functional sheet cannot be imparted. Therefore, in order to mold the functional sheet on the semiconductor package in the molding step using the release film, it is necessary to dispose the release film in the mold and then provide the functional sheet. However, the step of disposing the functional sheet on the release film disposed in the complicated shape and in the heated mold is difficult to automate, and there is a problem that work efficiency and safety are lacking in manual work.
本發明為鑒於所述情況而成者,其課題在於提供一種直至成型步驟為止的期間的保持功能性片材的性能、與成型步驟中的使功能性片材脫模的性能優異的脫模膜。 [解決課題之手段]The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a release film which is excellent in performance of a functional sheet and a performance of releasing a functional sheet in a molding step until a molding step. . [Means for solving the problem]
於用以解決所述課題的手段中包含以下的實施態樣。 <1>一種脫模膜,其具有:基材;以及脫模層,設置於所述基材上、且包含樹脂成分及填料;所述填料的體積平均粒子徑A(μm)與所述脫模層的每1 m2 的質量B(g/m2 )之比(A/B)為1以下。 <2>如<1>所述的脫模膜,其中所述填料的體積平均粒子徑A為1 μm~50 μm。 <3>如<1>或<2>所述的脫模膜,其中所述脫模層的每1 m2 的質量B為0.1 g/m2 ~100 g/m2 。 <4>如<1>至<3>中任一項所述的脫模膜,其中所述樹脂成分包含熱硬化性樹脂。 <5>如<1>至<4>中任一項所述的脫模膜,其進而含有交聯劑,相對於所述樹脂成分100質量份的所述交聯劑的含量為1質量份~10質量份。 <6>如<1>至<5>中任一項所述的脫模膜,其中所述基材含有選自由聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯及聚萘二甲酸乙二酯所組成的群組中的至少一種。 [發明的效果]The following embodiments are included in the means for solving the above problems. <1> A release film comprising: a substrate; and a release layer provided on the substrate and comprising a resin component and a filler; a volume average particle diameter A (μm) of the filler and the release The ratio (A/B) of the mass B (g/m 2 ) per 1 m 2 of the mold layer is 1 or less. <2> The release film according to <1>, wherein the filler has a volume average particle diameter A of from 1 μm to 50 μm. <3> The release film according to <1>, wherein the release layer has a mass B per 1 m 2 of from 0.1 g/m 2 to 100 g/m 2 . The release film according to any one of <1> to <3> wherein the resin component contains a thermosetting resin. The release film according to any one of <1> to <4> which further contains a crosslinking agent, and the content of the crosslinking agent is 1 part by mass based on 100 parts by mass of the resin component. ~10 parts by mass. The release film according to any one of <1> to <5> wherein the substrate contains a material selected from the group consisting of polyethylene terephthalate, polybutylene terephthalate, and polynaphthalene. At least one of the group consisting of ethylene diformate. [Effects of the Invention]
根據本發明,可提供一種直至成型步驟為止的期間的保持功能性片材的性能、與成型步驟中的使功能性片材脫模的性能優異的脫模膜。According to the present invention, it is possible to provide a release film which retains the performance of the functional sheet up to the molding step and which is excellent in the performance of releasing the functional sheet in the molding step.
以下,對用以實施本發明的形態進行詳細說明。但是,本發明並不限定於以下的實施形態。於以下的實施形態中,其構成要素(亦包含要素步驟(step)等)除特別明示的情況以外,並非為必需。數值及其範圍亦相同,並不限制本發明。Hereinafter, embodiments for carrying out the invention will be described in detail. However, the present invention is not limited to the following embodiments. In the following embodiments, constituent elements (including element steps, etc.) are not necessarily required unless otherwise specified. Numerical values and ranges thereof are also the same and do not limit the invention.
本說明書中「步驟」這一用語除與其他步驟獨立的步驟以外,即使於與其他步驟無法明確地加以區分的情況下,只要達成該步驟的目的,亦包括該步驟。 本說明書中使用「~」所表示的數值範圍包含「~」的前後所記載的數值分別作為最小值及最大值。 本說明書中階段性地所記載的數值範圍中,可將一個數值範圍中所記載的上限值或下限值替換為其他階段的記載的數值範圍的上限值或下限值。另外,本說明書中所記載的數值範圍中,可將所述數值範圍的上限值或下限值替換為實施例中所示的值。 本說明書中關於組成物中的各成分的含有率或含量,於在組成物中存在多種相當於各成分的物質的情況下,只要無特別說明,則是指存在於組成物中的該多種物質的合計含有率或含量。 本說明書中關於組成物中的各成分的粒子徑,於在組成物中存在多種相當於各成分的粒子的情況下,只要無特別說明,則是指存在於組成物中的該多種粒子的混合物的值。 本說明書中「層」或「膜」這一用語中,於對該層或膜所存在的區域進行觀察時,除形成於該區域的整體的情況以外,亦包含僅形成於該區域的一部分的情況。 本說明書中「積層」這一用語表示將層累積,可結合有兩個以上的層,亦能夠使兩個以上的層裝卸。 本說明書中「(甲基)丙烯醯基」是指丙烯醯基以及甲基丙烯醯基的至少一者,「(甲基)丙烯酸」是指丙烯酸以及甲基丙烯酸的至少一者,「(甲基)丙烯酸酯」是指丙烯酸酯以及甲基丙烯酸酯的至少一者。In the present specification, the term "step" is used in addition to the steps independent of the other steps, and even if it is not clearly distinguishable from other steps, the step is included as long as the purpose of the step is achieved. In the present specification, the numerical range indicated by "~" includes the numerical values described before and after "~" as the minimum value and the maximum value, respectively. In the numerical ranges described in the above paragraphs, the upper limit or the lower limit described in one numerical range may be replaced with the upper or lower limit of the numerical range described in the other stages. Further, in the numerical ranges described in the present specification, the upper limit or lower limit of the numerical range may be replaced with the value shown in the examples. In the present specification, the content or content of each component in the composition is such that when a plurality of substances corresponding to the respective components are present in the composition, unless otherwise specified, the plurality of substances present in the composition are used. The total content or content of the product. In the present specification, when the particle diameter of each component in the composition is a plurality of particles corresponding to the respective components in the composition, unless otherwise specified, it means a mixture of the plurality of particles present in the composition. Value. In the term "layer" or "film" as used in the specification, when the region in which the layer or the film is present is observed, in addition to the case where the entire region is formed, only a part of the region is formed. Happening. In the present specification, the term "layered" means that layers are accumulated, and two or more layers may be combined, and two or more layers may be attached or detached. In the present specification, "(meth)acryloyl group" means at least one of an acryloyl group and a methacrylic group, and "(meth)acrylic acid" means at least one of acrylic acid and methacrylic acid, "(A) By acrylate is meant at least one of acrylate and methacrylate.
<脫模膜> 本實施形態的脫模膜具有基材,以及設置於所述基材上、且包含樹脂成分及填料的脫模層,所述填料的體積平均粒子徑A(μm)與所述脫模層的每1 m2 的質量B(g/m2 )之比(A/B)為1以下。<Release film> The release film of this embodiment has a base material, and a release layer provided on the base material and containing a resin component and a filler, and the volume average particle diameter A (μm) of the filler The ratio (A/B) of the mass B (g/m 2 ) per 1 m 2 of the release layer is 1 or less.
本實施形態的脫模膜的直至成型步驟為止的期間的保持功能性片材的性能、與成型步驟中的使功能性片材脫模的性能優異。因此,可適宜地用於例如在半導體封裝的成型步驟中將功能性片材配置於半導體封裝的表面的方法。In the release film of the present embodiment, the performance of the functional sheet is maintained until the molding step, and the performance of releasing the functional sheet during the molding step is excellent. Therefore, it can be suitably used for a method of arranging a functional sheet on the surface of a semiconductor package, for example, in a molding step of a semiconductor package.
本實施形態的脫模膜的直至成型步驟為止的期間的保持功能性片材的性能、與成型步驟中的使功能性片材脫模的性能優異的理由未必明確,但推測由藉由脫模層中所含的樹脂成分所賦予的適度的黏著性、與藉由脫模層中所含的填料所賦予的適度的表面凹凸而引起。The reason for maintaining the performance of the functional sheet and the performance of releasing the functional sheet during the molding step in the molding step of the release film of the present embodiment is not necessarily clear, but it is presumed to be released by the mold release. The appropriate adhesiveness imparted by the resin component contained in the layer and the appropriate surface unevenness imparted by the filler contained in the release layer are caused.
就保持功能性片材的性能的觀點而言,脫模層中所含的填料的體積平均粒子徑A(μm)與脫模層的每1 m2 的質量B(g/m2 )之比較佳為1.0以下,更佳為0.7以下,進而佳為0.5以下。The volume average particle diameter A (μm) of the filler contained in the release layer is compared with the mass B (g/m 2 ) per 1 m 2 of the release layer from the viewpoint of maintaining the performance of the functional sheet. Preferably, it is 1.0 or less, more preferably 0.7 or less, and further preferably 0.5 or less.
A/B的下限值並無特別限制。例如根據半導體封裝的種類以及用途,於欲提高成型時的壓力的情況、欲使半導體封裝的最表面的完成品(finish)進行粗糙化的情況等時,就對脫模膜賦予高的脫模性能或使表面的粗糙度變粗糙的觀點而言,A/B的值較佳為大者。例如,較佳為0.3以上,更佳為0.5以上。The lower limit of A/B is not particularly limited. For example, depending on the type and application of the semiconductor package, when the pressure at the time of molding is to be increased, or when the finish of the semiconductor package is to be roughened, a high mold release is applied to the release film. The value of A/B is preferably larger from the viewpoint of performance or roughening of the roughness of the surface. For example, it is preferably 0.3 or more, more preferably 0.5 or more.
[脫模層] 脫模層包含樹脂成分以及填料,所述填料的體積平均粒子徑A(μm)與所述脫模層的每1 m2 的質量B(g/m2 )之比(A/B)為1以下。[Release Layer] The release layer contains a resin component and a filler, and a ratio of a volume average particle diameter A (μm) of the filler to a mass B (g/m 2 ) per 1 m 2 of the release layer (A) /B) is 1 or less.
本實施形態中,填料的體積平均粒子徑A(μm)為利用光繞射/散射法而測定的值,將體積基準的粒度分佈中自小徑側的累積成為50%時的粒子徑設為(D50)。In the present embodiment, the volume average particle diameter A (μm) of the filler is a value measured by a light diffraction/scattering method, and the particle diameter when the volume-based particle size distribution is 50% from the small-diameter side is set to (D50).
脫模層的每1 m2 的質量B(g/m2 )的範圍並無特別限定,可考慮與填料的平均粒子徑的關係而選擇。例如,較佳為0.1 g/m2 ~100 g/m2 ,更佳為1 g/m2 ~50 g/m2 。 若脫模層的每1 m2 的質量B為0.1 g/m2 以上,則於脫模層包含充分量的樹脂成分,於成型步驟中充分地獲得所需的柔軟性及延伸性,具有抑制自基材的脫模層的剝離或脫落的傾向。另外,充分地獲得柔軟性,具有良好地維持功能性片材的保持能力的傾向。 若脫模層的每1 m2 的質量B為100 g/m2 以下,則具有抑制脫模層變得過厚,因熱硬化時的熱收縮應力而導致脫模膜的平坦性受損的現象的傾向。另外,具有抑制脫模層變得過於柔軟而導致所搭載的功能性片材被埋入至脫模層,從而無法準確地配置於封裝表面的現象的傾向。The range of the mass B (g/m 2 ) per 1 m 2 of the release layer is not particularly limited, and may be selected in consideration of the relationship with the average particle diameter of the filler. For example, it is preferably from 0.1 g/m 2 to 100 g/m 2 , more preferably from 1 g/m 2 to 50 g/m 2 . When the mass B per 1 m 2 of the release layer is 0.1 g/m 2 or more, a sufficient amount of the resin component is contained in the release layer, and the desired flexibility and elongation are sufficiently obtained in the molding step, and the suppression is performed. The tendency to peel off or fall off from the release layer of the substrate. Further, the flexibility is sufficiently obtained, and the ability to maintain the functional sheet is favorably maintained. When the mass B per 1 m 2 of the release layer is 100 g/m 2 or less, the release layer is prevented from becoming too thick, and the flatness of the release film is impaired due to heat shrinkage stress during thermal curing. The tendency of the phenomenon. In addition, there is a tendency that the release sheet is prevented from being too soft and the functional sheet to be mounted is buried in the release layer, so that it cannot be accurately placed on the surface of the package.
本實施形態中,求出脫模層的每1 m2 的質量B(g/m2 )的方法並無特別限制。例如,根據以面積成為100 cm2 的方式(例如,10 cm×10 cm的大小)切出的脫模膜的質量(g)、與使用有機溶劑等自該脫模膜去除脫模層後的基材的質量(g)來求出脫模層的質量(g),並將所獲得的值乘以100而換算成每1 m2 的脫模層的質量(g),藉此可求出脫模層的每1 m2 的質量B(g/m2 )。In the present embodiment, the method of determining the mass B (g/m 2 ) per 1 m 2 of the release layer is not particularly limited. For example, the mass (g) of the release film cut out in such a manner that the area is 100 cm 2 (for example, a size of 10 cm × 10 cm), and the release layer after removing the release layer from the release film using an organic solvent or the like The mass (g) of the release layer is determined by the mass (g) of the substrate, and the obtained value is multiplied by 100 to obtain the mass (g) of the release layer per 1 m 2 , thereby obtaining The mass B (g/m 2 ) per 1 m 2 of the release layer.
脫模層的厚度並無特別限制。例如較佳為0.1 μm~100 μm。若脫模層的厚度為0.1 μm以上,則樹脂成分可充分地保持填料,因此於成型時不易產生填料脫落而混入至封裝內等的不良情況,具有可穩定地生產半導體封裝的傾向。若脫模層的厚度為100 μm以下,則可節約用於脫模層的原材料,就製造成本的觀點而言較佳。The thickness of the release layer is not particularly limited. For example, it is preferably from 0.1 μm to 100 μm. When the thickness of the mold release layer is 0.1 μm or more, the resin component can sufficiently retain the filler. Therefore, it is less likely to cause the filler to fall off during molding and to be mixed into the package, and the semiconductor package tends to be stably produced. When the thickness of the release layer is 100 μm or less, the raw material for the release layer can be saved, and it is preferable from the viewpoint of production cost.
本實施形態中脫模層的厚度為於任意的部位測定5點而獲得的值的數量平均值。脫模層的厚度例如可使用通用的測微計進行測定。In the present embodiment, the thickness of the release layer is an average value of the values obtained by measuring five points at an arbitrary position. The thickness of the release layer can be measured, for example, using a general-purpose micrometer.
脫模層根據用途可於外表面(與基材側的面為相反的面)具有凹凸。於脫模層在外表面具有凹凸的情況下,就封裝表面外觀的均一性的觀點而言,脫模層的外表面(與基材側的面為相反的面)的算術平均粗糙度(Ra)較佳為0.5 μm~5 μm。另外,外表面的十點平均粗糙度(Rz)較佳為5 μm~50 μm。The release layer may have irregularities on the outer surface (the surface opposite to the surface on the substrate side) depending on the application. When the release layer has irregularities on the outer surface, the arithmetic mean roughness (Ra) of the outer surface of the release layer (the surface opposite to the surface on the substrate side) from the viewpoint of the uniformity of the appearance of the package surface It is preferably 0.5 μm to 5 μm. Further, the ten-point average roughness (Rz) of the outer surface is preferably from 5 μm to 50 μm.
本實施形態中脫模層的外表面的算術平均粗糙度(Ra)以及十點平均粗糙度(Rz)例如可為利用使用表面粗糙度測定裝置(例如,小坂研究所(股),型號SE-3500)以觸針前端徑:2 μm、傳送速度:0.5 mm/s以及掃描距離:8 mm的條件進行測定而得的結果,並藉由日本工業標準(Japanese Industrial Standards,JIS)B0601(2013)或國際標準組織(International Organization for Standardization,ISO)4287(1997)中所規定的方法進行分析而獲得的值。In the present embodiment, the arithmetic mean roughness (Ra) and the ten-point average roughness (Rz) of the outer surface of the release layer may be, for example, a surface roughness measuring device (for example, a small flaw research institute, model SE-). 3500) Results obtained by measuring the tip end diameter of the stylus: 2 μm, the conveying speed: 0.5 mm/s, and the scanning distance: 8 mm, and by Japanese Industrial Standards (JIS) B0601 (2013) A value obtained by analysis by a method specified in International Organization for Standardization (ISO) 4287 (1997).
脫模層的外表面的於25℃下的黏力較佳為1.0 gf以上。若外表面的於25℃下的黏力為1.0 gf以上,則具有直至成型步驟為止的期間的保持功能性片材的性能更優異的傾向。The adhesive force at 25 ° C of the outer surface of the release layer is preferably 1.0 gf or more. When the adhesive force at 25 ° C of the outer surface is 1.0 gf or more, the performance of the functional sheet is maintained to be excellent even after the molding step.
脫模層的外表面的於170℃下的黏力較佳為20.0 gf以下。若外表面的於170℃下的黏力為20.0 gf以下,則具有成型步驟中的使功能性片材脫模的性能更優異的傾向。The adhesive force at 170 ° C of the outer surface of the release layer is preferably 20.0 gf or less. When the adhesive force at 170 ° C of the outer surface is 20.0 gf or less, the performance of demolding the functional sheet in the molding step tends to be more excellent.
本實施形態中脫模層的外表面的黏力(gf)例如可為使用黏力測試儀(例如,力世科(Rhesca)公司製造)及直徑5 mm的探針,以測定前負荷為10 gf、測定前負荷時間為1秒、測定時上昇速度為600 mm/min進行測定而得的值。The adhesive force (gf) of the outer surface of the release layer in the present embodiment can be, for example, a viscosity tester (for example, manufactured by Rhesca) and a probe having a diameter of 5 mm to measure the front load to be 10 Gf, a value obtained by measuring the pre-measurement load time of 1 second and the measurement of the ascending speed of 600 mm/min.
脫模層中的填料的含有率並無特別限制。例如,較佳為脫模層的總質量的1.0質量%~50.0質量%。若填料的含有率為脫模層的總質量的1.0質量%以上,則具有藉由脫模層的表面粗糙度而可將成型後的半導體封裝的表面精加工成無不均且均勻的外觀的傾向。若填料的含有率為脫模層的總質量的50.0質量%以下,則樹脂成分可充分地保持填料成分,因此於成型時不易產生填料成分脫落而混入至封裝內的不良情況,具有可穩定地生產半導體封裝的傾向。The content of the filler in the release layer is not particularly limited. For example, it is preferably 1.0% by mass to 50.0% by mass based on the total mass of the release layer. When the content of the filler is 1.0% by mass or more based on the total mass of the release layer, the surface of the molded semiconductor package can be finished to have a non-uniform and uniform appearance by the surface roughness of the release layer. tendency. When the content of the filler is 50.0% by mass or less based on the total mass of the release layer, the resin component can sufficiently retain the filler component. Therefore, the filler component is less likely to be detached during molding and mixed into the package, and the resin component can be stably stabilized. The tendency to produce semiconductor packages.
脫模層視需要除樹脂成分以及填料以外,亦可包含溶媒、錨定(anchoring)提昇劑、交聯促進劑、抗靜電劑、著色劑等其他成分。The release layer may contain, in addition to the resin component and the filler, other components such as a solvent, an anchoring enhancer, a crosslinking accelerator, an antistatic agent, and a colorant.
(樹脂成分) 脫模層中所含的樹脂成分的種類並無特別限制。例如可為具有藉由加熱而產生交聯反應並進行硬化的性質的樹脂(熱硬化性樹脂)。作為能夠用作樹脂成分的樹脂,可列舉丙烯酸樹脂、烯烴樹脂、苯乙烯樹脂、丙烯腈樹脂、矽酮樹脂、環氧樹脂、氰酸酯樹脂、馬來醯亞胺樹脂、烯丙基納迪克醯亞胺樹脂、苯酚樹脂、脲樹脂、三聚氰胺樹脂、醇酸樹脂、不飽和聚酯樹脂、鄰苯二甲酸二烯丙酯樹脂、間苯二酚甲醛樹脂、二甲苯樹脂、呋喃樹脂、胺基甲酸酯樹脂、酮樹脂、氰脲酸三烯丙酯樹脂、異氰酸酯樹脂、含三(2-羥基乙基)異氰脲酸酯的樹脂、含偏苯三酸三烯丙酯的樹脂、由環戊二烯所合成的熱硬化性樹脂、藉由芳香族二氰胺的三聚化而形成的熱硬化性樹脂等。脫模層中所含的樹脂成分可僅為一種亦可為兩種以上。(Resin Component) The type of the resin component contained in the release layer is not particularly limited. For example, it may be a resin (thermosetting resin) having a property of causing a crosslinking reaction by heating and curing. Examples of the resin which can be used as the resin component include an acrylic resin, an olefin resin, a styrene resin, an acrylonitrile resin, an anthrone resin, an epoxy resin, a cyanate resin, a maleimide resin, and an allyl Nadick.醯imine resin, phenol resin, urea resin, melamine resin, alkyd resin, unsaturated polyester resin, diallyl phthalate resin, resorcinol formaldehyde resin, xylene resin, furan resin, amine group Formate resin, ketone resin, triallyl cyanurate resin, isocyanate resin, resin containing tris(2-hydroxyethyl)isocyanurate, resin containing triallyl trimellitate, A thermosetting resin synthesized by cyclopentadiene or a thermosetting resin formed by trimerization of aromatic dicyandiamide. The resin component contained in the release layer may be one type or two or more types.
就對於半導體封裝的脫模性的觀點而言,脫模層較佳為包含選自丙烯酸樹脂、烯烴樹脂、苯乙烯樹脂以及丙烯腈樹脂中的至少一種作為樹脂成分。The release layer preferably contains at least one selected from the group consisting of an acrylic resin, an olefin resin, a styrene resin, and an acrylonitrile resin as a resin component from the viewpoint of mold release property of the semiconductor package.
丙烯酸樹脂可列舉於聚合成分中至少包含(甲基)丙烯酸單量體的均聚物或共聚物。具體而言,可列舉聚(甲基)丙烯酸、聚(甲基)丙烯酸酯等。The acrylic resin may, for example, be a homopolymer or a copolymer containing at least a (meth)acrylic monomer in a polymerization component. Specific examples thereof include poly(meth)acrylic acid, poly(meth)acrylate, and the like.
作為構成丙烯酸樹脂的(甲基)丙烯酸單量體,可列舉(甲基)丙烯酸、(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十二烷酯、(甲基)丙烯酸十四烷酯、(甲基)丙烯酸十六烷酯、(甲基)丙烯酸十八烷酯、(甲基)丙烯酸二十烷酯、(甲基)丙烯酸二十二烷酯、(甲基)丙烯酸環戊酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸環庚酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸苯酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸二甲基胺基乙酯、(甲基)丙烯酸二乙基胺基乙酯、(甲基)丙烯酸二甲基胺基丙酯、(甲基)丙烯酸2-氯乙酯、(甲基)丙烯酸2-氟乙酯、(甲基)丙烯酸二環戊酯等。Examples of the (meth)acrylic acid monovalent constituting the acrylic resin include (meth)acrylic acid, methyl (meth)acrylate, ethyl (meth)acrylate, and n-propyl (meth)acrylate, and (methyl). Isopropyl acrylate, n-butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tert-butyl (meth)acrylate, butyl (meth)acrylate Ester, hexyl (meth) acrylate, heptyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, octyl (meth) acrylate, decyl (meth) acrylate, (methyl) Ethyl acrylate, dodecyl (meth)acrylate, tetradecyl (meth)acrylate, cetyl (meth)acrylate, octadecyl (meth)acrylate, (meth)acrylic acid Decaalkyl ester, behenyl (meth)acrylate, cyclopentyl (meth)acrylate, cyclohexyl (meth)acrylate, cycloheptyl (meth)acrylate, benzyl (meth)acrylate, Phenyl (meth)acrylate, methoxyethyl (meth)acrylate, dimethylaminoethyl (meth)acrylate, diethylaminoethyl (meth)acrylate, (meth)acrylic acid Dimethylaminopropyl ester (Meth) acrylate, 2-chloroethyl acrylate, (meth) acrylate, 2-fluoro-ethyl (meth) acrylate, cyclopentyl acrylate.
作為構成丙烯酸樹脂的(甲基)丙烯酸單量體以外的單量體,可列舉苯乙烯、α-甲基苯乙烯、環己基馬來醯亞胺、乙烯基甲苯、氯乙烯、乙酸乙烯酯、N-乙烯基吡咯啶酮、丁二烯、異戊二烯、氯丁二烯等。Examples of the monomer other than the (meth)acrylic monomer constituting the acrylic resin include styrene, α-methylstyrene, cyclohexylmaleimide, vinyltoluene, vinyl chloride, and vinyl acetate. N-vinylpyrrolidone, butadiene, isoprene, chloroprene, and the like.
作為烯烴樹脂,可列舉烯烴(olefin)單量體或烯屬烴(alkene)單量體的均聚物、包含烯烴單量體或烯屬烴單量體作為聚合成分的共聚物。具體而言,可列舉聚乙烯、聚丙烯、聚甲基戊烯等聚烯烴。Examples of the olefin resin include a homopolymer of an olefin monomer or an alkene monolith, and a copolymer containing an olefin monomer or an olefinic monomer as a polymerization component. Specific examples thereof include polyolefins such as polyethylene, polypropylene, and polymethylpentene.
作為苯乙烯樹脂,可列舉苯乙烯或苯乙烯衍生物的均聚物、包含苯乙烯或苯乙烯衍生物作為聚合成分的共聚物等。作為苯乙烯衍生物,可列舉α-甲基苯乙烯、4-甲基苯乙烯、2-甲基苯乙烯、3-甲基苯乙烯、2-乙基苯乙烯、3-乙基苯乙烯、4-乙基苯乙烯等具有烷基鏈的烷基取代苯乙烯,2-氯苯乙烯、3-氯苯乙烯、4-氯苯乙烯等鹵素取代苯乙烯,4-氟苯乙烯、2,5-二氟苯乙烯等氟取代苯乙烯,乙烯基萘等。Examples of the styrene resin include a homopolymer of styrene or a styrene derivative, a copolymer containing styrene or a styrene derivative as a polymerization component, and the like. Examples of the styrene derivative include α-methylstyrene, 4-methylstyrene, 2-methylstyrene, 3-methylstyrene, 2-ethylstyrene, and 3-ethylstyrene. Alkyl-substituted styrene having an alkyl chain such as 4-ethylstyrene, halogen-substituted styrene such as 2-chlorostyrene, 3-chlorostyrene or 4-chlorostyrene, 4-fluorostyrene, 2,5 - Fluorine-substituted styrene such as difluorostyrene, vinyl naphthalene, and the like.
作為丙烯腈樹脂,可列舉(甲基)丙烯腈單量體的均聚物、包含(甲基)丙烯腈單量體作為聚合成分的共聚物等。The acrylonitrile resin may, for example, be a homopolymer of a (meth)acrylonitrile monolith or a copolymer containing a (meth)acrylonitrile monolith as a polymerization component.
於使用熱硬化性樹脂作為樹脂成分的情況下,可使用交聯劑。於使用交聯劑的情況下,相對於熱硬化性樹脂100質量份的交聯劑的含量並無特別限制。例如,相對於熱硬化性樹脂100質量份的交聯劑的含量可為1質量份~10質量份。When a thermosetting resin is used as the resin component, a crosslinking agent can be used. In the case of using a crosslinking agent, the content of the crosslinking agent relative to 100 parts by mass of the thermosetting resin is not particularly limited. For example, the content of the crosslinking agent per 100 parts by mass of the thermosetting resin may be from 1 part by mass to 10 parts by mass.
交聯劑的種類並無特別限制,可根據熱硬化性樹脂的種類、所期望的硬化速度等來選擇。例如,於使用丙烯酸樹脂作為熱硬化性樹脂的情況下,可自異氰酸酯化合物、三聚氰胺化合物、環氧化合物等公知的交聯劑中選擇。The type of the crosslinking agent is not particularly limited, and can be selected depending on the type of the thermosetting resin, the desired curing rate, and the like. For example, when an acrylic resin is used as the thermosetting resin, it can be selected from known crosslinking agents such as an isocyanate compound, a melamine compound, and an epoxy compound.
[填料] 填料的體積平均粒子徑只要滿足體積平均粒子徑A(μm)與所述脫模層的每1 m2 的質量B(g/m2 )之比(A/B)為1以下的條件,則並無特別限制。例如,較佳為1 μm~50 μm。[Filler] The volume average particle diameter of the filler is such that the ratio (A/B) of the volume average particle diameter A (μm) to the mass B (g/m 2 ) per 1 m 2 of the release layer is 1 or less. Conditions are not particularly limited. For example, it is preferably from 1 μm to 50 μm.
若填料的體積平均粒子徑為1 μm以上,則具有於脫模層的外表面形成充分的凹凸的傾向,且具有提高所成型的半導體封裝表面的外觀的均勻性、抑制密封材的流痕的傾向。若填料的體積平均粒子徑為50 μm以下,則具有抑制自脫模層的填料的脫落而所需的脫模層的厚度得到抑制的傾向。When the volume average particle diameter of the filler is 1 μm or more, sufficient unevenness is formed on the outer surface of the release layer, and the uniformity of the appearance of the surface of the formed semiconductor package is improved, and the flow marks of the sealing material are suppressed. tendency. When the volume average particle diameter of the filler is 50 μm or less, the thickness of the release layer required to suppress the fall of the filler from the release layer tends to be suppressed.
就半導體封裝表面的外觀的觀點而言,填料的體積平均粒子徑的上限較佳為50 μm,更佳為20 μm。就調整所成型的半導體封裝的表面粗糙度的觀點而言,填料的體積平均粒子徑的下限較佳為1 μm。The upper limit of the volume average particle diameter of the filler is preferably 50 μm, more preferably 20 μm, from the viewpoint of the appearance of the surface of the semiconductor package. From the viewpoint of adjusting the surface roughness of the formed semiconductor package, the lower limit of the volume average particle diameter of the filler is preferably 1 μm.
脫模層中所含的填料的形狀並無特別限定。例如可列舉球形、橢圓形、不定形等。The shape of the filler contained in the release layer is not particularly limited. For example, a spherical shape, an elliptical shape, an amorphous shape, etc. are mentioned.
填料只要可以包含於脫模層中的狀態保持其形態(即,難以溶解於脫模層的形成中所使用的有機溶劑、脫模層中所含的樹脂成分等),則其材質並無特別限制,可為包含有機物質的填料,亦可為包含無機物質的填料,抑或可為包含有機物質與無機物質此兩者的填料。脫模層中所含的填料可僅為一種,亦可為兩種以上。The filler is not particularly required as long as it can be contained in the release layer in a state in which it retains its form (that is, it is difficult to dissolve in the organic solvent used in the formation of the release layer, the resin component contained in the release layer, etc.). The restriction may be a filler containing an organic substance, a filler containing an inorganic substance, or a filler containing both an organic substance and an inorganic substance. The filler contained in the release layer may be one type or two or more types.
作為成為填料的材質的無機物質,可列舉銀、金、銅等金屬、二氧化矽、氧化鋁、二氧化鈦、氧化鐵等。無機物質可具有導電性,亦可不具有導電性。Examples of the inorganic substance to be used as the filler include metals such as silver, gold, and copper, ceria, alumina, titania, and iron oxide. The inorganic substance may or may not have electrical conductivity.
於使用包含無機物質的填料的情況下,亦可併用無機離子交換體。作為無機離子交換體,有效的是於將脫模層膜在熱水溶液中萃取時,確認到於水溶液中所萃取的離子(Na+ 、K+ 、Cl- 、F- 、RCOO- 、Br- 等,R為烷基、芳基等)的捕獲作用者。作為此種無機離子交換體的例子,可列舉天然出產的沸石(zeolite)、沸石類、酸性白土、白雲石、水滑石類等天然礦物,人工合成的合成沸石等。In the case of using a filler containing an inorganic substance, an inorganic ion exchanger can also be used in combination. As an inorganic ion exchanger, it is effective to extract ions (Na + , K + , Cl - , F - , RCOO - , Br - etc.) extracted in an aqueous solution when the release layer film is extracted in a hot aqueous solution. , R is the capture of alkyl, aryl, etc.). Examples of such inorganic ion exchangers include natural minerals such as zeolites, zeolites, acid clays, dolomites, and hydrotalcites, and synthetic zeolites synthesized by artificial synthesis.
作為成為填料的材質的有機物質,可列舉丙烯酸樹脂、醯亞胺樹脂、醯胺樹脂、醯胺醯亞胺樹脂、烯烴樹脂、苯乙烯樹脂、碳酸酯樹脂、矽酮樹脂、丙烯腈-丁二烯-苯乙烯(Acrylonitrile Butadiene Styrene,ABS)樹脂等。該些樹脂較佳為藉由交聯反應而進行硬化的狀態。Examples of the organic substance to be used as the filler include an acrylic resin, a quinone imine resin, a guanamine resin, an amidoxime resin, an olefin resin, a styrene resin, a carbonate resin, an anthrone resin, and an acrylonitrile-butadiene. Acrylonitrile Butadiene Styrene (ABS) resin and the like. These resins are preferably in a state of being cured by a crosslinking reaction.
所述填料之中,包含藉由交聯反應而進行硬化的狀態下的丙烯酸樹脂(以下,亦稱為交聯型丙烯酸樹脂)的填料對樹脂成分的分散性優異,同時藉由選擇成為聚合成分的單體的種類而容易調節填料的形狀、粒子徑、耐熱性等特性,因此較佳。Among the fillers, a filler containing an acrylic resin (hereinafter also referred to as a cross-linking type acrylic resin) in a state of being cured by a crosslinking reaction is excellent in dispersibility of a resin component, and is selected as a polymerization component. The type of the monomer is preferable because it is easy to adjust the properties such as the shape of the filler, the particle diameter, and the heat resistance.
作為交聯型丙烯酸樹脂,較佳為藉由使(甲基)丙烯酸丁酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸2-乙基己酯等不包含官能基的(甲基)丙烯酸單量體、與(甲基)丙烯酸、(甲基)甲基丙烯酸羥基乙酯、(甲基)丙烯醯胺、(甲基)丙烯腈等具有官能基的(甲基)丙烯酸單量體或其他單體共聚而獲得的(甲基)丙烯酸共聚物。The crosslinked acrylic resin is preferably a (meth) group which does not contain a functional group such as butyl (meth)acrylate, ethyl (meth)acrylate or 2-ethylhexyl (meth)acrylate. Acrylic acid mono-substrate, (meth)acrylic acid mono-substrate having functional groups such as (meth)acrylic acid, (meth)acrylic acid hydroxyethyl ester, (meth)acrylamide, (meth)acrylonitrile or the like Or a (meth)acrylic copolymer obtained by copolymerization of other monomers.
作為成為交聯型丙烯酸樹脂的聚合成分的(甲基)丙烯酸單量體,可列舉(1)具有鏈狀烷基的(甲基)丙烯酸單量體、(2)具有脂環式骨架的(甲基)丙烯酸單量體、(3)多官能(甲基)丙烯酸單量體、(4)具有官能基的(甲基)丙烯酸單量體等。以下,分別對(甲基)丙烯酸單量體進行說明。Examples of the (meth)acrylic monomer which is a polymerization component of the crosslinked acrylic resin include (1) a (meth)acrylic monomer having a chain alkyl group and (2) an alicyclic skeleton ( (meth)acrylic acid mono-body, (3) polyfunctional (meth)acrylic acid mono-body, (4) functional group-containing (meth)acrylic monomer, and the like. Hereinafter, the (meth)acrylic acid single body will be described.
(1)具有鏈狀烷基的(甲基)丙烯酸單量體 作為具有鏈狀烴基的(甲基)丙烯酸單量體,可列舉於酯部分具有鏈狀烴基的(甲基)丙烯酸酯(以下,亦有時將(甲基)丙烯酸酯((meth)acrylic acid ester)記載為(甲基)丙烯酸酯((meth)acrylate))。(1) A (meth)acrylic acid monomer having a chain alkyl group as a (meth)acrylic acid monomer having a chain hydrocarbon group, and a (meth) acrylate having a chain hydrocarbon group in the ester portion (hereinafter, Also, a (meth)acrylic acid ester is sometimes referred to as (meth)acrylate.
作為具有鏈狀烴基的(甲基)丙烯酸酯,例如可列舉具有碳數1~20的鏈狀烴基的(甲基)丙烯酸酯。若烴基的碳數為20以下,則具有成為低彈性係數的傾向。就丙烯酸聚合物的溶解性的觀點而言,碳數較佳為2~18,就成型步驟中的耐熱性的觀點而言,碳數更佳為4~18。鏈狀烴基較佳為碳數1~20的烷基。The (meth) acrylate having a chain hydrocarbon group is, for example, a (meth) acrylate having a chain hydrocarbon group having 1 to 20 carbon atoms. When the number of carbon atoms of the hydrocarbon group is 20 or less, it tends to have a low modulus of elasticity. The carbon number is preferably from 2 to 18 in view of the solubility of the acrylic polymer, and the carbon number is more preferably from 4 to 18 from the viewpoint of heat resistance in the molding step. The chain hydrocarbon group is preferably an alkyl group having 1 to 20 carbon atoms.
鏈狀烴基可為直鏈狀亦可為分支,於分支的情況下,較佳為不包含三級碳原子。藉由不包含三級碳原子,不易因低溫下的熱分解引起質量減少,就耐熱性的方面而言有利。The chain hydrocarbon group may be linear or branched, and in the case of branching, it preferably does not contain tertiary carbon atoms. By not including a tertiary carbon atom, it is difficult to reduce the mass due to thermal decomposition at a low temperature, and it is advantageous in terms of heat resistance.
作為具有鏈狀且碳數為1~20的烴基的(甲基)丙烯酸酯,具體而言,可列舉(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸正己酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸1-十二烷醇酯、(甲基)丙烯酸異硬脂酯等。Specific examples of the (meth) acrylate having a chain-like hydrocarbon group having 1 to 20 carbon atoms include methyl (meth)acrylate, ethyl (meth)acrylate, and n-propyl (meth)acrylate. Ester, isopropyl (meth)acrylate, n-butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, amyl (meth)acrylate, (methyl) ) n-hexyl acrylate, n-octyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, decyl (meth) acrylate, 1-dodecanol (meth) acrylate, (methyl) ) Isostearyl acrylate and the like.
(2)具有脂環式骨架的(甲基)丙烯酸單量體 作為具有脂環式骨架的(甲基)丙烯酸單量體,可列舉具有脂環式骨架的(甲基)丙烯酸酯。作為脂環式骨架,可列舉環烷烴骨架、二環烷烴骨架、降冰片骨架、異冰片骨架等。其中,就提高透明性的觀點而言,較佳為二環烷烴骨架以及降冰片骨架。(2) (Meth)acrylic acid monovalent body having an alicyclic skeleton As the (meth)acrylic acid monovalent body having an alicyclic skeleton, a (meth) acrylate having an alicyclic skeleton can be mentioned. Examples of the alicyclic skeleton include a cycloalkane skeleton, a bicycloalkane skeleton, a norbornene skeleton, and an isobornyl skeleton. Among them, from the viewpoint of improving transparency, a bicycloalkane skeleton and a norbornene skeleton are preferred.
作為具有脂環式骨架的(甲基)丙烯酸單量體,具體而言,可列舉(甲基)丙烯酸環戊酯((meth)acrylate cyclopentyl)、(甲基)丙烯酸環戊酯((meth)acrylate cyclopentanyl)、(甲基)丙烯酸環己酯、(甲基)丙烯酸甲基環己酯、(甲基)丙烯酸三甲基環己酯、(甲基)丙烯酸降冰片酯、(甲基)丙烯酸降冰片基甲酯、(甲基)丙烯酸苯基降冰片酯、(甲基)丙烯酸氰基降冰片酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸冰片酯、(甲基)丙烯酸薄荷酯、(甲基)丙烯酸葑酯、(甲基)丙烯酸金剛烷酯、(甲基)丙烯酸二甲基金剛烷酯、(甲基)丙烯酸三環[5.2.1.02,6 ]癸-8-基酯、(甲基)丙烯酸三環[5.2.1.02,6 ]癸-4-甲酯、(甲基)丙烯酸環癸酯等。Specific examples of the (meth)acrylic acid monovalent body having an alicyclic skeleton include (meth)acrylate cyclopentyl (meth)acrylate cyclopentyl (meth)acrylate cyclopentyl ester (meth). Acrylate cyclopentanyl), cyclohexyl (meth)acrylate, methylcyclohexyl (meth)acrylate, trimethylcyclohexyl (meth)acrylate, norbornene (meth)acrylate, (meth)acrylic acid Norborn methyl ester, phenyl norbornene (meth)acrylate, cyanonorbornyl (meth)acrylate, isobornyl (meth)acrylate, borneol (meth)acrylate, (meth)acrylic acid Menthyl ester, decyl (meth) acrylate, adamantyl (meth) acrylate, dimethyl adamantyl (meth) acrylate, tricyclo(methyl) acrylate [5.2.1.0 2,6 ] 癸-8 - a base ester, a tricyclo[(methyl)) acrylate [5.2.1.0 2,6 ] 癸-4-methyl ester, a cyclomethacrylate (meth) acrylate or the like.
就耐熱性的觀點而言,較佳為丙烯酸環戊酯、丙烯酸環己酯、丙烯酸異冰片酯、丙烯酸降冰片酯、丙烯酸降冰片基甲酯、丙烯酸三環[5.2.1.02,6 ]癸-8-基酯、丙烯酸三環[5.2.1.02,6 ]癸-4-甲酯、丙烯酸金剛烷酯、甲基丙烯酸環戊酯、甲基丙烯酸環己酯、甲基丙烯酸甲基環己酯、甲基丙烯酸三甲基環己酯、甲基丙烯酸降冰片酯、甲基丙烯酸降冰片基甲酯、甲基丙烯酸異冰片酯、甲基丙烯酸冰片酯、甲基丙烯酸薄荷酯、甲基丙烯酸葑酯、甲基丙烯酸金剛烷酯、甲基丙烯酸二甲基金剛烷酯、甲基丙烯酸三環[5.2.1.02,6 ]癸-8-基酯、甲基丙烯酸三環[5.2.1.02,6 ]癸-4-甲酯、甲基丙烯酸環癸酯、甲基丙烯酸苯基降冰片酯等。From the viewpoint of heat resistance, cyclopentyl acrylate, cyclohexyl acrylate, isobornyl acrylate, norbornyl acrylate, norbornyl acrylate, and tricyclohexyl acrylate [5.2.1.0 2,6 ]癸 are preferred . -8-yl ester, tricyclo[5.1.02 2,6 ]indole-4-methyl ester, adamantyl acrylate, cyclopentyl methacrylate, cyclohexyl methacrylate, methylcyclohexyl methacrylate Ester, trimethylcyclohexyl methacrylate, norbornyl methacrylate, norbornyl methacrylate, isobornyl methacrylate, borneol methacrylate, menthyl methacrylate, methacrylic acid Oxime ester, adamantyl methacrylate, dimethyl hydroxyalkyl methacrylate, tricyclo [5.0.1.02 2,6 ] 癸-8-yl methacrylate, tricyclomethacrylate [5.2.1.0 2 , 6 ] 癸-4-methyl ester, cyclodecyl methacrylate, phenyl norbornene methacrylate, and the like.
進而就高耐熱性的方面而言,更佳為丙烯酸環戊酯、丙烯酸環己酯、丙烯酸異冰片酯、丙烯酸降冰片酯、丙烯酸降冰片基甲酯、丙烯酸三環[5.2.1.02,6 ]癸-8-基酯、丙烯酸三環[5.2.1.02,6 ]癸-4-甲酯、丙烯酸金剛烷酯等。Further, in terms of high heat resistance, cyclopentyl acrylate, cyclohexyl acrylate, isobornyl acrylate, norbornyl acrylate, acrylonitrile norbornyl methyl ester, acrylic tricyclo[5.2.1.0 2,6癸-8-yl ester, tricyclo[5.1.02.0 2,6 ] 癸-4-methyl ester, adamantyl acrylate, and the like.
(3)多官能(甲基)丙烯酸單量體 多官能(甲基)丙烯酸單量體只要具有兩個以上的(甲基)丙烯醯基,則並無特別限制。作為多官能(甲基)丙烯酸單量體,可列舉具有兩個以上的(甲基)丙烯醯基與脂環式骨架的(甲基)丙烯酸單量體、具有兩個以上的(甲基)丙烯醯基與脂肪族骨架的(甲基)丙烯酸單量體、具有兩個以上的(甲基)丙烯醯基與二噁烷二醇(dioxane glycol)骨架的(甲基)丙烯酸單量體、具有兩個以上的(甲基)丙烯醯基與後述(4)具有官能基的(甲基)丙烯酸單量體可具有的官能基的(甲基)丙烯酸單量體等。(3) Polyfunctional (meth)acrylic Monomer The polyfunctional (meth)acrylic monomer is not particularly limited as long as it has two or more (meth)acrylinyl groups. Examples of the polyfunctional (meth)acrylic acid monovalent body include a (meth)acrylic acid monomeric body having two or more (meth)acrylonyl groups and an alicyclic skeleton, and two or more (meth) groups. a (meth)acrylic acid mono-body having an acryl fluorenyl group and an aliphatic skeleton, a (meth)acrylic acid mono-body having two or more (meth) acrylonitrile groups and a dioxane glycol skeleton, A (meth)acrylic acid monocomponent having two or more (meth)acryl fluorenyl groups and a functional group which the (meth)acrylic acid mono-substrate having a functional group (4) described later has.
作為多官能(甲基)丙烯酸單量體,例如可列舉環己烷-1,4-二甲醇二(甲基)丙烯酸酯、環己烷-1,3-二甲醇二(甲基)丙烯酸酯、三環癸烷二羥甲基二(甲基)丙烯酸酯(例如,日本化藥股份有限公司製造,卡亞拉得(KAYARAD)R-684,三環癸烷二羥甲基二丙烯酸酯等),三環癸烷二甲醇二(甲基)丙烯酸酯(例如,新中村化學股份有限公司製造,A-DCP,三環癸烷二甲醇二丙烯酸酯等),二噁烷二醇二(甲基)丙烯酸酯(例如,日本化藥股份有限公司製造,卡亞拉得(KAYARAD)R-604,二噁烷二醇二丙烯酸酯等),新戊二醇二(甲基)丙烯酸酯、二環戊基二(甲基)丙烯酸酯、1,6-己烷二醇二(甲基)丙烯酸酯、環氧乙烷改質1,6-己烷二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙烯酸酯、(聚)環氧乙烷改質新戊二醇二(甲基)丙烯酸酯、羥基特戊酸新戊二醇二(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、環氧乙烷改質雙酚A型二(甲基)丙烯酸酯(較佳為聚環氧乙烷改質雙酚A型二(甲基)丙烯酸酯,更佳為環氧乙烷5莫耳~15莫耳改質雙酚A型二(甲基)丙烯酸酯)以及(聚)環氧乙烷改質磷酸二(甲基)丙烯酸酯等。Examples of the polyfunctional (meth)acrylic acid monovalent body include cyclohexane-1,4-dimethanol di(meth)acrylate and cyclohexane-1,3-dimethanol di(meth)acrylate. Tricyclodecane dimethylol di(meth) acrylate (for example, manufactured by Nippon Kayaku Co., Ltd., KAYARAD R-684, tricyclodecane dimethylol diacrylate, etc.) ), tricyclodecane dimethanol di(meth) acrylate (for example, manufactured by Shin-Nakamura Chemical Co., Ltd., A-DCP, tricyclodecane dimethanol diacrylate, etc.), dioxane diol di(a) Acrylate (for example, manufactured by Nippon Kayaku Co., Ltd., KAYARAD R-604, dioxanediol diacrylate, etc.), neopentyl glycol di(meth)acrylate, two Cyclopentyl di(meth)acrylate, 1,6-hexanediol di(meth)acrylate, ethylene oxide modified 1,6-hexanediol di(meth)acrylate, new Pentyl glycol di(meth)acrylate, (poly)ethylene oxide modified neopentyl glycol di(meth)acrylate, hydroxypivalic acid neopentyl glycol di(meth)acrylate, polyethyl b Diol diol Acrylate, polypropylene glycol di(meth)acrylate, ethylene oxide modified bisphenol A type di(meth)acrylate (preferably polyethylene oxide modified bisphenol A type II (A) Acrylate, more preferably ethylene oxide 5 moles to 15 moles modified bisphenol A type di(meth)acrylate) and (poly)ethylene oxide modified phosphoric acid di(meth)acrylic acid Ester and the like.
(4)具有官能基的(甲基)丙烯酸單量體 作為具有官能基的(甲基)丙烯酸單量體,可列舉於分子內具有選自由羧基、羥基、酸酐基、胺基、醯胺基以及環氧基所組成的群組中的至少一種官能基的(甲基)丙烯酸單量體。(4) A (meth)acrylic monomer having a functional group as a (meth)acrylic monomer having a functional group, which may be exemplified by having a carboxyl group, a hydroxyl group, an acid anhydride group, an amine group, or a guanamine group in the molecule. And a (meth)acrylic monocomponent of at least one functional group in the group consisting of epoxy groups.
具有羧基作為官能基的(甲基)丙烯酸單量體可列舉(甲基)丙烯酸、2-(甲基)丙烯醯氧基乙基丁二酸、2-(甲基)丙烯醯氧基乙基鄰苯二甲酸、2-(甲基)丙烯醯氧基乙基六氫鄰苯二甲酸、2-(甲基)丙烯醯氧基丙基六氫鄰苯二甲酸等。Examples of the (meth)acrylic mono-unit having a carboxyl group as a functional group include (meth)acrylic acid, 2-(meth)acryloxyethyl succinic acid, and 2-(methyl)acryloxyethyloxy group. Phthalic acid, 2-(meth)acryloxyethyl hexahydrophthalic acid, 2-(meth)acryloxypropylhexahydrophthalic acid, and the like.
具有羥基作為官能基的(甲基)丙烯酸單量體可列舉(甲基)丙烯酸羥基乙酯、(甲基)丙烯酸羥基丙酯、(甲基)丙烯酸羥基丁酯、環己烷二甲醇單(甲基)丙烯酸酯、N-羥甲基(甲基)丙烯醯胺等。Examples of the (meth)acrylic mono-unit having a hydroxyl group as a functional group include hydroxyethyl (meth)acrylate, hydroxypropyl (meth)acrylate, hydroxybutyl (meth)acrylate, and cyclohexanedimethanol ( Methyl) acrylate, N-methylol (meth) acrylamide, and the like.
具有酸酐基作為官能基的(甲基)丙烯酸單量體可列舉偏苯三甲酸酐(甲基)丙烯醯氧基乙酯、環己烷三羧酸酐(甲基)丙烯醯氧基乙酯等。Examples of the (meth)acrylic mono-compound having an acid anhydride group as a functional group include trimellitic anhydride (meth) propylene decyloxyethyl ester, cyclohexane tricarboxylic anhydride (methyl) propylene decyloxyethyl ester, and the like.
具有胺基作為官能基的(甲基)丙烯酸單量體可列舉(甲基)丙烯酸二乙基胺基乙酯、(甲基)丙烯酸-2,2,6,6-四甲基哌啶酯、(甲基)丙烯醯胺等。The mono(meth)acrylic acid group having an amine group as a functional group may, for example, diethylaminoethyl (meth)acrylate or 2,2,6,6-tetramethylpiperidine (meth)acrylate. , (meth) acrylamide, and the like.
具有醯胺基作為官能基的(甲基)丙烯酸單量體可列舉N-(甲基)丙烯醯基甘胺醯胺等。Examples of the (meth)acrylic acid monovalent body having a mercapto group as a functional group include N-(meth)acrylonitrile glycine decylamine.
具有環氧基作為官能基的(甲基)丙烯酸單量體可列舉(甲基)丙烯酸縮水甘油酯、α-乙基(甲基)丙烯酸縮水甘油酯、α-正丙基(甲基)丙烯酸縮水甘油酯、2-(2,3-環氧丙氧基)乙基(甲基)丙烯酸酯、3-(2,3-環氧丙氧基)丙基(甲基)丙烯酸酯、4-(2,3-環氧丙氧基)丁基(甲基)丙烯酸酯、5-(2,3-環氧丙氧基)戊基(甲基)丙烯酸酯、6-(2,3-環氧丙氧基)己基(甲基)丙烯酸酯、(甲基)丙烯酸-3,4-環氧丁酯、(甲基)丙烯酸-4,5-環氧戊酯、(甲基)丙烯酸-6,7-環氧庚酯、α-乙基(甲基)丙烯酸-6,7-環氧庚酯、(甲基)丙烯酸-3-甲基-3,4-環氧丁酯、(甲基)丙烯酸-4-甲基-4,5-環氧戊酯、(甲基)丙烯酸-5-甲基-5,6-環氧己酯、(甲基)丙烯酸-β-甲基縮水甘油酯、α-乙基(甲基)丙烯酸-β-甲基縮水甘油酯、(甲基)丙烯酸-3-甲基-3,4-環氧丁酯、(甲基)丙烯酸-4-甲基-4,5-環氧戊酯、(甲基)丙烯酸-5-甲基-5,6-環氧己酯等。Examples of the (meth)acrylic mono-unit having an epoxy group as a functional group include glycidyl (meth)acrylate, glycidyl α-ethyl (meth)acrylate, and α-n-propyl (meth)acrylic acid. Glycidyl ester, 2-(2,3-epoxypropoxy)ethyl (meth) acrylate, 3-(2,3-epoxypropoxy)propyl (meth) acrylate, 4- (2,3-epoxypropoxy)butyl (meth) acrylate, 5-(2,3-epoxypropoxy)pentyl (meth) acrylate, 6-(2,3-ring Oxypropoxy)hexyl (meth) acrylate, 3,4-epoxybutyl (meth) acrylate, 4,5-epoxypentyl (meth) acrylate, (meth) acrylate-6 , 7-epoxyheptyl ester, α-ethyl (meth)acrylic acid-6,7-epoxyheptyl ester, (meth)acrylic acid-3-methyl-3,4-epoxybutyl ester, (methyl )-4-methyl-4,5-epoxypentyl acrylate, 5-methyl-5,6-epoxyhexyl (meth)acrylate, β-methylglycidyl (meth)acrylate , α-ethyl (meth)acrylic acid-β-methyl glycidyl ester, (meth)acrylic acid-3-methyl-3,4-epoxybutyl ester, (meth)acrylic acid-4-methyl- 4,5-epoxypentyl ester, 5-methyl-5,6-epoxyhexyl (meth)acrylate, and the like.
具有官能基的(甲基)丙烯酸單量體中,對具有環氧基作為官能基的(甲基)丙烯酸單量體(較佳為甲基丙烯酸縮水甘油酯)進行聚合而獲得的丙烯酸樹脂的氣密性優異,因此就提高脫模膜的防污性的觀點而言較佳。In the (meth)acrylic acid monomer having a functional group, an acrylic resin obtained by polymerizing a (meth)acrylic mono-compound (preferably glycidyl methacrylate) having an epoxy group as a functional group Since it is excellent in airtightness, it is preferable from the viewpoint of improving the antifouling property of a release film.
(其他單體) 交聯型丙烯酸樹脂可包含所述(甲基)丙烯酸單量體以外的單體(其他單體)作為聚合成分。作為其他單體,可列舉包含苯環或雜環的(甲基)丙烯酸單量體、芳香族乙烯基化合物、氰乙烯化合物、不飽和二羧酸酐、N-取代馬來醯亞胺等。(Other monomer) The crosslinked acrylic resin may contain a monomer (other monomer) other than the (meth)acrylic monomer as a polymerization component. Examples of the other monomer include a (meth)acrylic acid monovalent body containing a benzene ring or a hetero ring, an aromatic vinyl compound, a vinyl cyanide compound, an unsaturated dicarboxylic anhydride, and an N-substituted maleimide.
作為包含苯環或雜環的(甲基)丙烯酸單量體,可列舉(甲基)丙烯酸苯酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸苯氧基乙酯、(甲基)丙烯酸萘酯、(甲基)丙烯酸四羥糠酯等。Examples of the (meth)acrylic acid monovalent body containing a benzene ring or a hetero ring include phenyl (meth)acrylate, benzyl (meth)acrylate, phenoxyethyl (meth)acrylate, and (methyl). Naphthyl acrylate, tetrahydroxy hydroxy (meth) acrylate, and the like.
作為芳香族乙烯基化合物,可列舉4-乙烯基吡啶、2-乙烯基吡啶、α-甲基苯乙烯、α-乙基苯乙烯、α-氟苯乙烯、α-氯苯乙烯、α-溴苯乙烯、氟苯乙烯、氯苯乙烯、溴苯乙烯、甲基苯乙烯、甲氧基苯乙烯、(鄰-、間-、對-)羥基苯乙烯、苯乙烯等。Examples of the aromatic vinyl compound include 4-vinylpyridine, 2-vinylpyridine, α-methylstyrene, α-ethylstyrene, α-fluorostyrene, α-chlorostyrene, and α-bromine. Styrene, fluorostyrene, chlorostyrene, bromostyrene, methylstyrene, methoxystyrene, (o-, m-, p-)hydroxystyrene, styrene, and the like.
作為氰乙烯化合物,可列舉丙烯腈、甲基丙烯腈等。Examples of the vinyl cyanide compound include acrylonitrile and methacrylonitrile.
作為不飽和二羧酸酐類,可列舉馬來酸酐等。Examples of the unsaturated dicarboxylic acid anhydride include maleic anhydride and the like.
作為N-取代馬來醯亞胺類,可列舉N-甲基馬來醯亞胺、N-乙基馬來醯亞胺、N-丙基馬來醯亞胺、N-異丙基馬來醯亞胺、N-丁基馬來醯亞胺、N-異丁基馬來醯亞胺、N-第三丁基馬來醯亞胺、N-月桂基馬來醯亞胺、N-環己基馬來醯亞胺、N-苄基馬來醯亞胺、N-苯基馬來醯亞胺等。Examples of the N-substituted maleimide group include N-methylmaleimide, N-ethylmaleimide, N-propylmaleimide, and N-isopropylmaline. Yttrium, N-butyl maleimide, N-isobutyl maleimide, N-tert-butyl maleimide, N-lauryl maleimide, N-ring Hexylmadanimine, N-benzylmaleimide, N-phenylmaleimide, and the like.
(交聯劑) 用以產生交聯型丙烯酸樹脂的交聯反應的交聯劑的種類並無特別限制。例如可列舉異氰酸酯化合物、三聚氰胺化合物、環氧化合物等公知的交聯劑。為了於交聯型丙烯酸樹脂中形成緩慢擴展的網眼狀結構,較佳為使用多官能的交聯劑。本說明書中所謂「多官能」是指三官能以上。(Crosslinking Agent) The kind of the crosslinking agent used to generate the crosslinking reaction of the crosslinking type acrylic resin is not particularly limited. For example, a known crosslinking agent, such as an isocyanate compound, a melamine compound, and an epoxy compound, is mentioned. In order to form a slowly expanding network structure in the crosslinked acrylic resin, it is preferred to use a polyfunctional crosslinking agent. In the present specification, "polyfunctional" means a trifunctional or higher.
[基材] 基材的種類並無特別限制。基材較佳為兼具對於成型時的模具的加熱而言可耐受規定時間的程度的耐熱性、及可充分地追隨模具的結構的柔軟性。作為具有此種特性的基材,可列舉包含具有耐熱性的樹脂的基材。於基材包含樹脂的情況下,樹脂可僅為一種亦可為兩種以上。[Substrate] The type of the substrate is not particularly limited. The base material preferably has heat resistance that can withstand a predetermined period of time for heating the mold at the time of molding, and flexibility that can sufficiently follow the structure of the mold. Examples of the substrate having such characteristics include a substrate containing a resin having heat resistance. In the case where the substrate contains a resin, the resin may be used alone or in combination of two or more.
若考慮到於高溫(通常為100℃~200℃左右)下進行密封材的成形,則基材理想的是具有可耐受該溫度規定時間程度的耐熱性。另外,為了抑制將脫模膜安裝於模具時以及於成形中流動的密封樹脂的褶皺、脫模膜的破裂等的發生,重要的是考慮高溫下的彈性係數、延伸率等而進行選擇。When the sealing material is formed at a high temperature (usually about 100 ° C to 200 ° C), the substrate preferably has heat resistance to withstand the temperature for a predetermined period of time. In addition, in order to suppress the occurrence of wrinkles of the sealing resin, cracking of the release film, and the like when the release film is attached to the mold, it is important to select the elastic modulus, the elongation, and the like at a high temperature.
就耐熱性以及高溫時的彈性係數的觀點而言,基材較佳為包含聚酯作為樹脂。作為聚酯,可列舉聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯、聚萘二甲酸乙二酯、包含兩種以上的該些聚酯的聚合成分作為聚合成分的樹脂、將該些聚酯進行改質而成的樹脂等。其中,較佳為包含選自由聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯以及聚萘二甲酸乙二酯所組成的群組中的至少一種。The base material preferably contains a polyester as a resin from the viewpoint of heat resistance and an elastic modulus at a high temperature. Examples of the polyester include polyethylene terephthalate, polybutylene terephthalate, polyethylene naphthalate, and a resin containing a polymerization component of two or more kinds of these polyesters as a polymerization component. A resin obtained by modifying these polyesters. Among them, it is preferable to contain at least one selected from the group consisting of polyethylene terephthalate, polybutylene terephthalate, and polyethylene naphthalate.
基材較佳為片材狀。具體而言,可列舉將樹脂成型為片材狀者。就對模具的追隨性的觀點而言,較佳為經雙軸延伸的樹脂片材(膜)。The substrate is preferably in the form of a sheet. Specifically, the resin is molded into a sheet shape. From the viewpoint of followability to the mold, a biaxially stretched resin sheet (film) is preferred.
基材的厚度並無特別限定。例如,較佳為1 μm~100 μm,更佳為3 μm~20 μm。若基材的厚度為1 μm以上,則具有脫模膜的處理性優異、難以產生褶皺的傾向。若厚度為100 μm以下,則具有成型時的對模具的追隨性優異、抑制所成型的半導體封裝的褶皺等的產生的傾向。The thickness of the substrate is not particularly limited. For example, it is preferably 1 μm to 100 μm, more preferably 3 μm to 20 μm. When the thickness of the base material is 1 μm or more, the release film is excellent in handleability, and wrinkles are less likely to occur. When the thickness is 100 μm or less, the film has excellent followability to the mold and suppresses generation of wrinkles or the like of the formed semiconductor package.
本實施形態中基材的厚度為於任意的部位測定5點而獲得的值的數量平均值。基材的厚度例如可使用通用的測微計進行測定。In the present embodiment, the thickness of the substrate is an average value of the values obtained by measuring five points at an arbitrary position. The thickness of the substrate can be measured, for example, using a general-purpose micrometer.
基材與模具的表面接觸,因此根據其材質,有時為了將脫模膜自模具剝離而需要更大的剝離力。於基材難以自模具剝離的情況下,較佳為以自模具容易地剝離的方式來調整基材。Since the base material is in contact with the surface of the mold, depending on the material thereof, a larger peeling force is sometimes required in order to peel the release film from the mold. In the case where it is difficult for the substrate to be peeled off from the mold, it is preferred to adjust the substrate so as to be easily peeled off from the mold.
作為以自模具容易地剝離的方式來調整基材的方法,可列舉對與基材的脫模層側的面為相反側的面(與模具相接之側的面)實施梨皮加工等於表面賦予凹凸的加工的方法、於基材上進而設置另一脫模層(第2脫模層)的方法等。As a method of adjusting the substrate so as to be easily peeled off from the mold, the surface opposite to the surface on the side of the release layer of the substrate (the surface on the side in contact with the mold) is subjected to pear processing equal to the surface. A method of imparting processing to the unevenness, a method of further providing another release layer (second release layer) on the substrate, and the like.
於基材上設置第2脫模層的情況下,第2脫模層的材質並無特別限制。例如可使用與所述脫模層中使用的材料相同的材料而形成。第2脫模層的厚度並無特別限定,較佳為0.1 μm~100 μm。將第2脫模層的厚度定義為與所述脫模層的厚度相同。When the second release layer is provided on the substrate, the material of the second release layer is not particularly limited. For example, it can be formed using the same material as that used in the release layer. The thickness of the second release layer is not particularly limited, but is preferably 0.1 μm to 100 μm. The thickness of the second release layer is defined to be the same as the thickness of the release layer.
[其他構件] 脫模膜視需要可具有脫模層與基材以外的構件。例如,可於脫模層與基材之間、基材與第2脫模層之間等設置脫模層或第2脫模層的錨定提昇層、抗靜電層、著色層等構件。另外,為了保護脫模膜的表面,亦可設置保護層。[Other members] The release film may have a member other than the release layer and the substrate as needed. For example, a member such as an anchor lifting layer, an anchor lifting layer, an antistatic layer, or a colored layer of the release layer or the second release layer may be provided between the release layer and the substrate, or between the substrate and the second release layer. Further, in order to protect the surface of the release film, a protective layer may be provided.
<脫模膜的製作方法> 脫模膜的製作方法並無特別限制。例如,製備用以形成脫模層的組成物並將其賦予至基材的單面,視需要藉由乾燥而去除組成物中的揮發成分,從而於基材上形成脫模層,藉此可製作脫模膜。於該情況下,可藉由調節賦予至基材上的組成物的量以及所使用的填料的量,將所形成的脫模層中所含的填料的體積平均粒子徑A(μm)與脫模層的每1 m2 的質量B(g/m2 )之比(A/B)設為1以下。<Method for Producing Release Film> The method for producing the release film is not particularly limited. For example, a composition for forming a release layer is prepared and imparted to one side of the substrate, and if necessary, the volatile component in the composition is removed by drying to form a release layer on the substrate. Make a release film. In this case, the volume average particle diameter A (μm) of the filler contained in the formed release layer can be adjusted by adjusting the amount of the composition imparted to the substrate and the amount of the filler to be used. The ratio (A/B) of the mass B (g/m 2 ) per 1 m 2 of the mold layer was set to 1 or less.
用以形成脫模層的組成物的製備方法並無特別限制。例如可將樹脂成分、填料、及溶媒混合而製備。就將厚度不均得到抑制的脫模層形成於基材上的觀點而言,較佳為將能夠溶解樹脂成分的有機溶劑用作溶媒。作為有機溶劑,可列舉甲苯、甲基乙基酮、乙酸乙酯等。The preparation method of the composition for forming the release layer is not particularly limited. For example, a resin component, a filler, and a solvent can be mixed and prepared. From the viewpoint of forming a release layer in which thickness unevenness is suppressed on a substrate, it is preferred to use an organic solvent capable of dissolving a resin component as a solvent. Examples of the organic solvent include toluene, methyl ethyl ketone, and ethyl acetate.
將組成物賦予至基材的方法並無特別限定。例如可藉由輥塗法、棒塗法、吻合式塗佈法等公知的塗佈方法而賦予。於將用以形成脫模層的組成物賦予至基材時,較佳為以所形成的脫模層的厚度成為0.1 μm~100 μm的方式賦予。The method of imparting the composition to the substrate is not particularly limited. For example, it can be provided by a known coating method such as a roll coating method, a bar coating method, or an anastomosis coating method. When the composition for forming the release layer is applied to the substrate, it is preferably provided so that the thickness of the release layer formed is from 0.1 μm to 100 μm.
視需要可將賦予至基材的組成物乾燥而去除組成物中的溶媒等揮發成分。乾燥的方法並無特別限制,可藉由公知的方法進行。乾燥例如可於50℃~150℃下進行0.1分鐘~60分鐘。The composition to be applied to the substrate can be dried as needed to remove volatile components such as a solvent in the composition. The method of drying is not particularly limited and can be carried out by a known method. Drying can be carried out, for example, at 50 ° C to 150 ° C for 0.1 minutes to 60 minutes.
[脫模膜的使用方法] 以下,參照圖式對本實施形態的脫模膜的使用方法的一例進行說明。另外,各圖中的構件的大小為概念上的大小,構件間的大小的相對性關係並不限定於此。[Method of Using Release Film] Hereinafter, an example of a method of using the release film of the present embodiment will be described with reference to the drawings. In addition, the size of the members in each drawing is conceptually large, and the relative relationship between the sizes of the members is not limited thereto.
圖1是示意性地表示保持功能性片材的狀態下的脫模膜的剖面者。圖1中,脫模膜10具有基材1及脫模層2,於脫模層2上配置有功能性片材3。Fig. 1 is a view schematically showing a cross section of a release film in a state in which a functional sheet is held. In FIG. 1, the release film 10 has the base material 1 and the release layer 2, and the functional sheet 3 is arrange|positioned on the mold release layer 2.
圖2是示意性地表示供給自卷的狀態捲出(wind off)的脫模膜10,並使用轉移成形方式的成型設備進行成型時的設備的剖面者。圖2中符號4表示模具,符號5表示用以將密封樹脂注入至模具內的空隙的柱塞。符號6為半導體封裝用的支撐構件,於BGA方式的封裝形態等下,大多於支撐構件的內部設置有電路。符號7為半導體晶片,半導體晶片上的電路一般藉由金、銅等金屬製線(未圖示)而與支撐構件內的電路連接。FIG. 2 is a cross-sectional view of the apparatus when the release film 10 that is wind-off from the state of being wound is schematically illustrated and molded by a molding apparatus using a transfer molding method. In Fig. 2, reference numeral 4 denotes a mold, and reference numeral 5 denotes a plunger for injecting a sealing resin into a gap in the mold. Reference numeral 6 denotes a support member for a semiconductor package, and in a BGA type package form or the like, a circuit is often provided inside the support member. Reference numeral 7 is a semiconductor wafer, and a circuit on a semiconductor wafer is generally connected to a circuit in a supporting member by a metal wire (not shown) such as gold or copper.
如圖2所示,將脫模膜10自卷8A捲出而配置於模具4的凹部。此時,將搭載於脫模膜10上的功能性片材3亦配置於模具4的凹部。另外,模具4被加熱(例如,170℃左右),並設定為供後續步驟中所注入的密封樹脂熔融。As shown in FIG. 2, the release film 10 is wound up from the roll 8A and placed in the concave portion of the mold 4. At this time, the functional sheet 3 mounted on the release film 10 is also placed in the concave portion of the mold 4. Further, the mold 4 is heated (for example, at about 170 ° C) and set to melt the sealing resin injected in the subsequent step.
圖3是示意性地表示使上下的模具4接觸,並使用柱塞5將密封樹脂9注入至模具4內的空隙的狀態者。FIG. 3 is a view schematically showing a state in which the upper and lower molds 4 are brought into contact with each other, and the sealing resin 9 is injected into the gap in the mold 4 using the plunger 5.
圖4是示意性地表示於成型結束後,將上下的模具4分離的狀態者。如圖4所示般,使搭載於脫模膜10上的功能性片材3自脫模膜10分離而配置於半導體封裝上。將使用後的脫模膜10捲繞於卷8B而進行回收。Fig. 4 is a view schematically showing a state in which the upper and lower molds 4 are separated after the molding is completed. As shown in FIG. 4, the functional sheet 3 mounted on the release film 10 is separated from the release film 10 and placed on the semiconductor package. The release film 10 after use is wound around the roll 8B and collected.
本實施形態的脫模膜的直至成型步驟為止的期間的功能性片材的保持性優異,因此,將功能性片材不自脫模膜脫落地配置於模具內。另外,成型步驟中的使功能性片材脫模的性能優異,因此,於成型結束後將上下模具分離時使功能性片材自脫模片材分離而配置於半導體封裝上。 [實施例]Since the functional sheet of the release film of the present embodiment has excellent retention of the functional sheet until the molding step, the functional sheet is placed in the mold without falling off from the release film. Further, in the molding step, the performance of releasing the functional sheet is excellent. Therefore, when the upper and lower molds are separated after the molding is completed, the functional sheet is separated from the release sheet and placed on the semiconductor package. [Examples]
以下,參照實施例對本發明進行具體的說明。但是,本發明並不受該些實施例的限制。Hereinafter, the present invention will be specifically described with reference to the embodiments. However, the invention is not limited by the embodiments.
<實施例1~實施例10、比較例1~比較例7> (脫模層形成用組成物的製備) 將作為樹脂成分的丙烯酸樹脂、交聯劑、及填料以各材料的不揮發成分成為表1或表2中記載的量(質量份)的方式,與甲苯進行混合,製成固體成分為15質量%的甲苯溶液而製備脫模層形成用組成物。<Examples 1 to 10 and Comparative Examples 1 to 7> (Preparation of a composition for forming a release layer) The acrylic resin, the crosslinking agent, and the filler as a resin component are made into a nonvolatile component of each material. The amount (parts by mass) described in Table 1 or Table 2 was mixed with toluene to prepare a toluene solution having a solid content of 15% by mass to prepare a composition for forming a release layer.
作為丙烯酸樹脂,使用丙烯酸酯的共聚物、乙酸乙酯、以及丙烯酸正丁酯的24質量%甲苯溶液(綜研化學股份有限公司、商品名「S-43」)。 作為交聯劑,使用異氰酸酯化合物的75質量%甲苯溶液(東曹股份有限公司、商品名「克羅奈特(Coronate)L」)、以及六亞甲基二異氰酸酯的加成物改質聚異氰酸酯(旭化成化學股份有限公司、商品名「杜拉奈特(Duranate)AE710-100」)。 作為填料,使用作為甲基丙烯酸酯的共聚物的交聯型丙烯酸樹脂的粒子(綜研化學股份有限公司,商品名「MX-150(體積平均粒子徑:1.5 μm)」、「MX-300(體積平均粒子徑:3.0 μm)」、以及「MX-1000(體積平均粒子徑:10.0 μm)」)或二氧化矽粒子(體積平均粒子徑:5.0 μm、富士矽化學(FUJI Silysia Chemical)股份有限公司、商品名「索羅斯菲爾(Sylosphere)C-0809」)。As the acrylic resin, a copolymer of acrylate, ethyl acetate, and a 24 mass% toluene solution of n-butyl acrylate (Integrated Chemical Co., Ltd., trade name "S-43") was used. As a crosslinking agent, a 75 mass% toluene solution of an isocyanate compound (Tosoh Corporation, trade name "Coronate L"), and an adduct of hexamethylene diisocyanate are used to modify polyisocyanate. (Asahi Kasei Chemical Co., Ltd., trade name "Duranate AE710-100"). As a filler, particles of a crosslinked acrylic resin which is a copolymer of methacrylate (Comprehensive Chemical Co., Ltd., trade name "MX-150 (volume average particle diameter: 1.5 μm)", "MX-300 (volume) Average particle diameter: 3.0 μm), and "MX-1000 (volume average particle diameter: 10.0 μm)" or cerium oxide particles (volume average particle diameter: 5.0 μm, FUJI Silysia Chemical Co., Ltd. The product name is "Sylosphere C-0809").
(脫模膜的製作) 使用輥塗佈機並以0.5 m/min~3 m/min的速度,將所製備的脫模層形成用組成物塗佈於基材的單面,於該狀態下以100℃在長度為3 m的乾燥爐內進行乾燥,於基材上形成脫模層而獲得脫模膜。此時,以乾燥後的組成物的每1 m2 的塗佈量(脫模層的質量)成為表1或表2所示的值(g)的方式來調整塗佈時的間隙。(Production of Release Film) The prepared release layer-forming composition was applied to one side of the substrate at a rate of 0.5 m/min to 3 m/min using a roll coater, in this state. The mold was dried in a drying oven having a length of 3 m at 100 ° C to form a release layer on the substrate to obtain a release film. At this time, the gap at the time of coating was adjusted so that the coating amount per 1 m 2 of the composition after drying (the mass of the release layer) became the value (g) shown in Table 1 or Table 2.
作為基材,使用將厚度為25 μm的經雙軸延伸的聚對苯二甲酸乙二酯(Polyethylene terephthalate,PET)膜(帝人杜邦薄膜(Dupont Teijin Films)股份有限公司、商品名「FT3-25」)、及經雙軸延伸的聚對苯二甲酸丁二酯(Polybutylene terephthalate,PBT)膜(大倉工業股份有限公司)分別進行電暈處理者。As the substrate, a biaxially stretched polyethylene terephthalate (PET) film having a thickness of 25 μm (Dupont Teijin Films Co., Ltd., trade name "FT3-25" was used. "), and the biaxially stretched polybutylene terephthalate (PBT) film (Dakura Industry Co., Ltd.) for corona treatment.
(脫模層的質量的測定) 將所製作的脫模膜切出為10 cm×10 cm的尺寸而測定質量。其後,使用甲基乙基酮而去除脫模層,風乾後再次測定質量,根據前後的質量差算出脫模層的質量。將所獲得的值乘以100,算出每1 m2 的脫模層的質量(g/m2 )。將結果示於表1或表2。(Measurement of mass of release layer) The produced release film was cut into a size of 10 cm × 10 cm to measure the mass. Thereafter, the release layer was removed using methyl ethyl ketone, the mass was measured again after air drying, and the quality of the release layer was calculated from the difference in mass before and after. The obtained value was multiplied by 100, and the mass (g/m 2 ) of the release layer per 1 m 2 was calculated. The results are shown in Table 1 or Table 2.
(黏力的測定) 以測定時測定探針與脫模層接觸的方式,將所製作的脫模膜設置於黏力測試儀(力世科(Rhesca)公司製造、商品名「TAC-II」)。其後,使用直徑為5 mm的探針,以探針下降速度:120 mm/min、測定前負荷:10 gf、測定時的上昇速度:600 mm/min的條件測定黏力(gf)。黏力的測定分別於對室溫進行設想的溫度(25℃)、以及對成型步驟進行設想的溫度(170℃)下進行實施。將結果示於表1或表2。(Measurement of Adhesion) The release film was placed on a viscosity tester (manufactured by Rhesca) under the trade name "TAC-II" by measuring the contact between the probe and the release layer during measurement. ). Thereafter, the viscosity (gf) was measured using a probe having a diameter of 5 mm at a probe lowering speed of 120 mm/min, a pre-measurement load: 10 gf, and a rising speed at the time of measurement: 600 mm/min. The measurement of the adhesive force was carried out at a temperature (25 ° C) assumed for room temperature and a temperature (170 ° C) assumed for the molding step. The results are shown in Table 1 or Table 2.
(保持性的評價) 為了評價脫模膜保持功能性片材的能力,進行以下的試驗。 將所製作的脫模膜切出為15 cm×30 cm的大小,使用矽酮橡膠輥將50 cm×100 cm的無塵紙貼合於所切出的脫模膜的脫模層上。其後,於25℃的環境下以無塵紙在下方的方式放置於台上,抓住脫模膜端部沿90°的方向提昇50 cm~100 cm,觀察所貼合的無塵紙是否剝離。將無塵紙未剝離的情況設為「OK」、將剝離的情況設為「NG」,將結果示於表1或表2。(Evaluation of Retention Property) In order to evaluate the ability of a release film to hold a functional sheet, the following test was performed. The produced release film was cut into a size of 15 cm × 30 cm, and 50 cm × 100 cm of dust-free paper was attached to the release layer of the cut release film using an anthrone rubber roller. Thereafter, the paper was placed on the stage with the dust-free paper under the environment at 25 ° C, and the end of the release film was lifted by 50 cm to 100 cm in the direction of 90° to observe whether the adhered dust-free paper was peeled off. The case where the dust-free paper was not peeled off was set to "OK", and the case where peeling was performed was "NG", and the result is shown in Table 1 or Table 2.
(表面粗糙度的評價) 使用表面粗糙度測定裝置(小坂研究所股份有限公司,型號SE-3500),以觸針前端徑:2 μm、傳送速度:0.5 mm/s以及掃描距離:8 mm的條件進行測定,藉由JIS B0601(2013)或ISO 4287(1997)對所測定的結果進行分析,獲得脫模層的外表面的算術平均粗糙度(Ra)與十點平均粗糙度(Rz)。將結果示於表1或表2。(Evaluation of surface roughness) Using a surface roughness measuring device (Otaru Research Institute Co., Ltd., model SE-3500), the tip diameter of the stylus was 2 μm, the conveying speed was 0.5 mm/s, and the scanning distance was 8 mm. The conditions were measured, and the measured results were analyzed by JIS B0601 (2013) or ISO 4287 (1997) to obtain an arithmetic mean roughness (Ra) and a ten-point average roughness (Rz) of the outer surface of the release layer. The results are shown in Table 1 or Table 2.
<比較例8> 對主要作為以壓縮成形方式的脫模膜而被廣泛使用的乙烯-四氟乙烯(Ethylene Tetra Fluoro Ethylene,ETFT)膜(旭硝子股份有限公司、商品名:「阿福萊克斯(Aflex)50HK」)進行與實施例相同的評價。將結果示於表2。此外,阿福萊克斯(Aflex)50HK不具有樹脂層(脫模層),因此未實施脫模層的質量的測定。<Comparative Example 8> An Ethylene Tetra Fluoro Ethylene (ETFT) film which is widely used as a release film by a compression molding method (Asahi Glass Co., Ltd., trade name: "Afulex" Aflex) 50HK") was evaluated in the same manner as in the examples. The results are shown in Table 2. Further, since Aflex 50HK does not have a resin layer (release layer), the measurement of the quality of the release layer is not performed.
[表1]
[表2]
如表1所示般可知,關於填料的體積平均粒子徑A(μm)與脫模層的每1 m2 的質量B(g/m2 )之比(A/B)為1以下的實施例1~實施例10的脫模膜,於25℃下的黏力高,於保持性的評價試驗中亦未看到無塵紙的剝離,保持性優異。另一方面可知,於170℃下的黏力低,於成型步驟中具有良好的脫模性能。進而可知,即使調節脫模層中所含的填料的種類與含量而變更表面粗糙度,亦可獲得良好的結果,因此可維持所期望的特性並可應對脫模膜的材質與封裝的組合的多樣化。As shown in Table 1, the ratio (A/B) of the volume average particle diameter A (μm) of the filler to the mass B (g/m 2 ) per 1 m 2 of the release layer was 1 or less. In the release film of 1 to 10, the adhesive strength at 25 ° C was high, and the peeling of the dust-free paper was not observed in the evaluation test of the retention property, and the retention property was excellent. On the other hand, it was found that the adhesive strength at 170 ° C was low and the mold release property was good in the molding step. Further, it has been found that even if the surface roughness is changed by adjusting the type and content of the filler contained in the release layer, good results can be obtained, so that desired characteristics can be maintained and the combination of the material and the package of the release film can be dealt with. diversification.
關於填料的體積平均粒子徑A(μm)與脫模層的每1 m2 的質量B(g/m2 )之比(A/B)超過1的比較例1~比較例7的脫模膜,於25℃下的黏力明顯低,於保持性的評價試驗中亦看到無塵紙的剝離,保持性較實施例差。The release film of Comparative Example 1 to Comparative Example 7 in which the ratio (A/B) of the volume average particle diameter A (μm) of the filler to the mass B (g/m 2 ) per 1 m 2 of the release layer exceeded 1 The adhesive strength at 25 ° C was remarkably low, and the peeling of the dust-free paper was also observed in the evaluation test of the retention property, and the retention was inferior to the examples.
比較例8的用作脫模膜的阿福萊克斯(Aflex)50HK的於25℃下的黏力與170℃下的黏力均低,脫模性優異。然而,於保持性的評價試驗中看到無塵紙的剝離,保持性較實施例差。The adhesive force of Aflex 50HK used as a release film of Comparative Example 8 at 25 ° C and the adhesive strength at 170 ° C were both low, and the mold release property was excellent. However, the peeling of the dust-free paper was observed in the evaluation test of the retention property, and the retention property was inferior to that of the examples.
由以上結果可知,本實施形態的脫模膜的直至成型步驟為止的期間的保持功能性片材的性能、與成型步驟中的使功能性片材脫模的性能優異。From the above results, it is understood that the performance of the functional sheet of the release film of the present embodiment up to the molding step is excellent in the performance of releasing the functional sheet during the molding step.
將日本專利申請案第2016-101820號的揭示整體藉由參照而併入至本說明書中。將本說明書中所記載的所有文獻、專利申請案及技術規格與具體且各個地記載有藉由參照而併入各個文獻、專利申請案及技術規格的情況同等程度地,藉由參照而併入至本說明書中。The disclosure of Japanese Patent Application No. 2016-101820 is incorporated herein by reference in its entirety. All the documents, patent applications, and technical specifications described in the specification are specifically and individually described as being incorporated by reference to the respective documents, patent applications, and technical specifications. To this manual.
1‧‧‧基材1‧‧‧Substrate
2‧‧‧脫模層2‧‧‧ release layer
3‧‧‧功能性片材3‧‧‧ functional sheets
4‧‧‧模具4‧‧‧Mold
5‧‧‧柱塞5‧‧‧Plunger
6‧‧‧支撐構件6‧‧‧Support members
7‧‧‧半導體晶片7‧‧‧Semiconductor wafer
8A、8B‧‧‧卷8A, 8B‧‧ ‧ volumes
9‧‧‧密封樹脂9‧‧‧ Sealing resin
10‧‧‧脫模膜10‧‧‧ release film
圖1是示意性地表示保持功能性片材的狀態下的脫模膜的剖面的圖。 圖2是示意性地表示使用脫模膜並藉由轉移成形方式成型時的設備的剖面的圖。 圖3是示意性地表示使用脫模膜並藉由轉移成形方式成型時的設備的剖面的圖。 圖4是示意性地表示使用脫模膜並藉由轉移成形方式成型時的設備的剖面的圖。FIG. 1 is a view schematically showing a cross section of a release film in a state in which a functional sheet is held. Fig. 2 is a view schematically showing a cross section of an apparatus when a release film is used and molded by a transfer molding method. Fig. 3 is a view schematically showing a cross section of an apparatus when a release film is used and molded by a transfer molding method. Fig. 4 is a view schematically showing a cross section of an apparatus when a release film is used and molded by a transfer molding method.
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