201142314 六、發明說明： 【發明所屬之技術領域】 [⑽1] 本發明係有關於一種電磁干擾量測方法，特別係有 關於一種非接觸式之電磁干擾量測方法。 【先前技射疗】 [0002] 習知非接觸式之電磁干擾量測方法，如我國公開專 利第200841 032號所示，其係具有一頻譜分析儀以及一 電性連接該頻譜分析儀之近場探棒’該董測方法係以該 近場探棒對一待測物進行非接觸式掃描而得到一近場頻 譜’該近場頻譜係可有效確認該待财物是否具有電磁干 擾源，惟該方法無法提供電磁干擾源之干擾路徑，若該 待測物包含有複數個電路單元，便無法得知電磁干擾源 是否對各該電路單元造成電磁干擾。 【發明内容】 [0003] 本發明之主要目的係在於提供一種非接觸式之電磁 干擾量測方法，其包含提供一待測物、一無線發送裝置 、一第一無線接收裝置、一向量網路分析儀及一頻譜分 析儀，該向量網路分析儀係具有一第一通訊埠及一第二 通訊埠，該無線發送裝置係電性連接該第一通訊埠，該 第一無線接收裝置係電性連接該第二通訊埠；提供一校 正基準件，該向量網路分析儀係量測該校正基準件以獲 得一近場探棒因子；以該頻譜分析儀量測該待測物以獲 得一第一干擾源頻譜，以該向量網路分析儀量測該待測 物以獲得一第一路徑轉移函數；將該近場探棒因子分別 乘以該第一干擾源頻譜及該第一路徑轉移函數以獲得一 099116460 表單編號A0101 第4頁/共22頁 0992029264-0 201142314 第二干擾源頻譜及一第二路徑轉移函數；使該第二干擾 源頻譜及該第二路徑轉移函數相加以獲得一預測電磁千 擾頻譜。本發明係藉由該頻譜分析儀量測該待測物以獲 得一第一干擾源頻譜以及以該向量網路分析儀量測該待 測物以獲得一第一路徑轉移函數，再經由還原校正及數 據分析而得到該預測電磁干擾頻譜，該非接觸式之電磁 干擾量測方法可有效預測干擾源之干擾路徑，從而解決 電磁干擾問題。 【實施方式】 [0004] 請參閱第1圖’其係本發明之，較佳實施例，一種非 . ：： . . . . 接觸式之電磁千擾量測方法1之步驟如下：首先，請參閱 第1圖之步驟（A)、第2A圖、第2B圖及第5圖，提供一待 測物10、一向量網路分析儀2〇、一頻譜分析儀30、一無 線發送裝置40及一第一無線接收裝置41，該向量網路分 析儀20係具有一第一通訊埠21及一第二通訊琿22，該無 線發送裝置40係電性連接該第一通訊埠21，該第一無線201142314 VI. Description of the invention: [Technical field to which the invention pertains] [(10) 1] The present invention relates to an electromagnetic interference measurement method, and more particularly to a non-contact electromagnetic interference measurement method. [Previous technical radiotherapy] [0002] A conventional non-contact electromagnetic interference measurement method, as shown in Chinese Patent Publication No. 200841 032, which has a spectrum analyzer and an electrical connection to the spectrum analyzer. The field probe 'the Dong measurement method uses the near-field probe to perform a non-contact scanning on a test object to obtain a near-field spectrum. The near-field spectrum system can effectively confirm whether the property has an electromagnetic interference source, but The method cannot provide an interference path of the electromagnetic interference source. If the object to be tested includes a plurality of circuit units, it is impossible to know whether the electromagnetic interference source causes electromagnetic interference to each of the circuit units. SUMMARY OF THE INVENTION [0003] The main object of the present invention is to provide a non-contact electromagnetic interference measurement method, comprising providing a test object, a wireless transmitting device, a first wireless receiving device, and a vector network. An analyzer and a spectrum analyzer, the vector network analyzer has a first communication port and a second communication port, the wireless transmitting device is electrically connected to the first communication port, and the first wireless receiving device is electrically connected Connecting the second communication port; providing a calibration reference component, the vector network analyzer measuring the calibration reference component to obtain a near-field probe factor; and measuring the object to be tested by the spectrum analyzer to obtain a a first interference source spectrum, the vector network analyzer is used to measure the object to be tested to obtain a first path transfer function; and the near-field probe factor is multiplied by the first interference source spectrum and the first path transfer The function obtains a 099116460 form number A0101 page 4 / a total of 22 pages 0992029264-0 201142314 a second interference source spectrum and a second path transfer function; the second interference source spectrum and the second path transfer function The phase is added to obtain a predicted electromagnetic interference spectrum. The invention measures the object to be tested by the spectrum analyzer to obtain a first interference source spectrum and measures the object to be tested by the vector network analyzer to obtain a first path transfer function, and then performs correction through reduction. And the data analysis obtains the predicted electromagnetic interference spectrum, and the non-contact electromagnetic interference measurement method can effectively predict the interference path of the interference source, thereby solving the electromagnetic interference problem. [Embodiment] [0004] Please refer to FIG. 1 , which is a preferred embodiment of the present invention. The steps of the non-contact: electromagnetic interference measurement method 1 are as follows: First, please Referring to steps (A), 2A, 2B, and 5 of FIG. 1, a test object 10, a vector network analyzer 2, a spectrum analyzer 30, a wireless transmitting device 40, and a first wireless receiving device 41, the vector network analyzer 20 has a first communication port 21 and a second communication port 22, the wireless transmitting device 40 is electrically connected to the first communication port 21, the first wireless
接收装置41係電性連接該第二.通訊蜂2 2，在本實施例中 ，該待測物1 〇需放置穩固並使該|寺測物丨0運作於正常狀 態，以確保後續量測之精確度，請參閱第1圖之步驟（B) ，校正該向量網路分析儀20及該頻譜分析儀3〇，該向量 網路分析儀20係以一校正器進行儀器（圖未繪出）校正， 該校正器係紐連接該第—通訊琿21及該第二通訊埠22 以校正儀H本身所產生之系統誤差，接著，請參閱第1@ 之步驟（C)及第3圖，提供一校正基準件5〇，該向量網路 分析儀20係量測該校正基準件5()以得到—近場探棒因子 099116460 ，較佳地，該向量網路分析儀2〇係可以穿 表單編n ; 還反射綠 201142314 (Thru-Ref lect-Line，TRL)校正法對該校正基準件5〇 進行量測，以測得包含振幅及相位f訊之該近場探棒因 子"亥近場探棒因子係用以校正該無線發送裝置4 〇及該 第一無線接收裝置41發送或接收訊號時，在不同頻率下 所產生之訊號衰減量，在本實施例中，該校正基準件5〇 係可為-微帶親’該微帶線51之—端係電性連接該第 二通訊埠22 ’又，該校正基準件50係另包含—終端負載 52，該終端負載52係電性連接該微帶線51，在本實施例 中，該微帶線51係具有寬頻以及低損耗特性，另外，請 參閱第7圖，其係為該近場探棒因子之量測曲線圖，該曲 線圖係用以作為電磁干擾訊號之還原校正，接下來，請 參閱第1圖之步驟⑻、第2A圖及第2B圖，以該無線發送 裝置40及該第—無線接收裝置41搜尋該制物1()之一電 磁干擾源，該待測物1〇若具有複數個電路單元，通常也 具有複數個電磁干擾源，此時可藉由近場探測以找出一 取強之電斜擾源所在之__行非躺式量測，該 最強之電磁干擾源係稱為等效電磁千擾源，請參閱第1圖 之乂驟⑻、第4圖及第5圖，以該命量網路分析儀2〇量測 該待測物1G以得到—第—路徑轉移函數，以該頻譜分析 儀30量測該待測物1〇以得到一第一干擾源頻譜，請再參 閱第2A及㈣目’其係為非接觸叙電磁干擾量測方法1 中°亥第一路控轉移函數之量測方式，該量測方式係以 近電場或近磁場的形式，在待測物1G上生成感應電流， 因此該向量網路分析儀20係可藉由該無線發送裝置40注 入m號至該待測物1Q ’同時’係以該第—無線接收 装置41於該待測物上1〇接收測試訊號所造成之近電場及 0992029264-0 099116460 表單編號删丨 第6頁/共22頁 201142314The receiving device 41 is electrically connected to the second communication bee 2 2 . In this embodiment, the object to be tested 1 needs to be placed stably and the device is operated in a normal state to ensure subsequent measurement. For the accuracy, refer to step (B) of FIG. 1 to calibrate the vector network analyzer 20 and the spectrum analyzer 3, and the vector network analyzer 20 performs the instrument with a corrector (not shown). Correction, the corrector button is connected to the first communication port 21 and the second communication port 22 to correct the systematic error generated by the instrument H itself, and then, referring to steps 1 (c) and 3 of the first step, A calibration reference component 5 is provided. The vector network analyzer 20 measures the calibration reference component 5() to obtain a near-field probe factor of 099116460. Preferably, the vector network analyzer 2 can be worn. The form is edited; the green 201142314 (Thru-Ref lect-Line, TRL) correction method is also used to measure the calibration reference element 5 to measure the near-field probe factor including amplitude and phase f. The near field probe factor is used to correct the wireless transmitting device 4 and the first wireless receiving device 41 to send When the signal is received, the amount of signal attenuation generated at different frequencies, in this embodiment, the calibration reference member 5 can be - the microstrip pro-the microstrip line 51 is electrically connected to the second end The communication unit 22' further includes a terminal load 52, and the terminal load 52 is electrically connected to the microstrip line 51. In the embodiment, the microstrip line 51 has a wide frequency and low loss. Characteristic, in addition, please refer to FIG. 7 , which is a measurement curve of the near-field probe factor, which is used as a reduction correction of the electromagnetic interference signal, and then, refer to the step (8) of FIG. 1 . 2A and 2B, the wireless transmitting device 40 and the first wireless receiving device 41 search for one of the electromagnetic interference sources of the workpiece 1 (), if the object to be tested has a plurality of circuit units, usually It also has a plurality of electromagnetic interference sources. At this time, near-field detection can be used to find a __line non-recumbent measurement in which a strong electric oblique source is located. The strongest electromagnetic interference source is called equivalent electromagnetic. For the source of interference, please refer to steps (8), 4 and 5 in Figure 1 The quantity network analyzer 2 measures the object to be tested 1G to obtain a first path transfer function, and the spectrum analyzer 30 measures the object to be tested to obtain a first interference source spectrum. 2A and (4) are the measurement methods of the first road-controlled transfer function in the non-contact EM measurement method. The measurement method is in the form of near-field or near-field, on the object to be tested 1G. The induced current is generated. Therefore, the vector network analyzer 20 can inject the m number into the object to be tested 1Q 'by the wireless transmitting device 40 while the first wireless receiving device 41 is on the object to be tested. Receiving the near-field caused by the test signal and 0992029264-0 099116460 Form No. Delete Page 6 of 22 201142314
近磁場’轉為功率訊號後回傳至該向量網路分析儀20， 再經由分析而得到該第一路徑轉移函數，在本實施例中 ，該無線發送裝置40係可為一近場探棒42，該第一無線 接收裝置41係可為該近場探棒42或一天線43，請再參閱 第4圖’其係為量測該第一轉移函數之較佳實施例，在本 實施例中’該待測物係可為一液晶顯示器丨丨，該液晶顯 示器11係具有一天線12 ’該天線12之一端係電性連接一 第一同轴電纜44 ’該第一同軸電纜44係電性連接該第二 通訊蜂22 ’在本實施例中該第一無線接收裝置41係可為 該液晶顯示器11之該六線12 ,另外，該天線12係為可能 ^:到等效電磁干擾源干擾之元件，較佳地，該天線12係 可為一WWAN接收機，該向量網路分柝儀2〇係藉由該近場 探棒42輸入一測試訊號至該液晶顯示器丨丨之等效電磁干 擾源之量測點，該測試訊號經由轉移路徑到達該天線12 時，該第一同軸電纜44係接收該天線12所發出之測試訊 號並經由該向量網路分析儀2〇分析以得到該第一路徑轉 移函數，該近場探棒因子所獲得之相位資訊係可還原該 第一路徑轉移函數之相位延遲另外，請再參閱第5圖， 其係為量測該第一干擾頻譜之較佳實施例，在本實施例 中，其另具有一預放大器6〇及一第二無線接收裝置45， 该預放大器60係電性連接該頻譜分析儀3〇及該第二無線 接收裝置45，在本實施例中，該第二無線接收裝置45係 可為一近場探棒42，該液晶顯示器u之等效電磁干擾源 之頻譜訊號被該近場探棒42接收，經由該預放大器6〇之 訊號放大，最後由該頻譜分析儀3〇記錄量測值，該預放 大器60之增益可經由步驟（B)之校正，使得量測值還原而 099116460 表單編號A0101 第7頁/共22頁 0995 201142314 付到真實之該第一干擾源頻譜，請再參閱第6圖，其係為 °亥天線12實際產生之電磁干擾頻譜之量測方式，該量測 方式係以一第二同轴電纜46電性連接該天線12，從該天 線12所接收之電磁干擾訊號再經由該預放大器60之訊號 放大，最後由該頻譜分析儀30記錄量測值，另外，請參 閱第1圖之步驟（F)，將該近場探棒因子乘以該第一干擾 源頻4以得到一第二干擾源頻譜及將該近場探棒因子乘 以該第一路徑轉移函數以得到—第二路徑轉移函數經 由上述之數據運算，該干擾源頻譜及該路徑轉移函數可 經由近場探棒因子之量測曲線圖校正而還原真實數據， 最後μ參閱第1圖之步驟（G)，將該第二千擾源頻譜及 該第二路徑轉移函數相加以得到一預測電磁干擾頻譜， 在步驟（G)中’該第二干擾源頻譜係以dBm為單位、該第 一路控轉移函數係以dB值為單位，兩者可直接相加而得 ，請參閱第8A圖、第8B圖，其係為以該非接觸式之電磁 干擾量測方法1預測該液晶顯示器丨丨之該天線丨2kWWAN 頻帶内所產生之該預測電磁干擾頻譜曲線以及該天線i 2 實際產生之電磁干擾頻譜曲線之比對圖，本量測係包含 WWAN頻帶中之GSM及UMTS兩頻帶，由第8A圖及第8B圖可 得知兩者之間吻合度極高，並可診斷出該液晶顯示器Π 畫素時脈之高次諧波係造成該WWAN接收機的去敏化，請 參閱第9A圖及第9B圖，其係為本實施例中所測得之路徑 轉移函數，藉由路徑轉移函數之量測數據得知，只要增 加路徑之衰減量即可有效改善該液晶顯示器11對該WWAN 接收機的電磁干擾。本發明係藉由以該頻譜分析儀量測 該待測物以獲得一第一干擾源頻譜以及以該向量網路分 099116460 表單編號 A0101 第 8 頁/共 22 頁 0992029264-0 201142314 析儀量測該待測物以獲得一第一路徑轉移函數，再經由 還原校正及數據運算而得到該預測電磁干擾頻譜，該非 接觸式之電磁干擾量測方法可有效預測干擾源之干擾路 徑，從而解決電磁干擾問題。 本發明之保護範圍當視後附之申請專利範圍所界定 者為準，任何熟知此項技藝者，在不脫離本發明之精神 和範圍内所作之任何變化與修改，均屬於本發明之保護 範圍。 【圖式簡單說明】 [0005] 第1圖：依據本發明之第一較佳實施例，一種非接觸式之 電磁干擾量測方法之流程圖。 第2A-2B圖：依據本發明之第一較佳實施例，該非接觸式 之電磁干擾量測方法之路徑轉移函數之量測範例圖。 第3圖：依據本發明之第一較佳實施例，該非接觸式之電 磁干擾量測方法之近場探棒因子之量測示意圖。 第4圖：依據本發明之第一較佳實施例，該非接觸式之電 磁干擾量測方法之路徑轉移函數之量測示意圖。 第5圖：依據本發明之第一較佳實施例，該非接觸式之電 磁干擾量測方法之干擾源頻譜·之量測示意圖。 第6圖：依據本發明之第一較佳實施例，該非接觸式之電 磁干擾量測方法之實際電磁干擾頻譜之量測示意圖。 第7圖：依據本發明之第一較佳實施例，該非接觸式之電 磁干擾量測方法之近場探棒因子之量測曲線圖。 第8A-8B圖：依據本發明之第一較佳實施例，該非接觸式 之電磁干擾量測方法之預測電磁干擾頻譜-實際電磁干擾 頻譜之比對圖。 表單編號A0101 099116460 第9頁/共22頁 0992029264-0 201142314 第9A-9B圖：依據本發明之第一較佳實施例，該非接觸式 之電磁干擾量測方法之路徑轉移函數之量測曲線圖。 【主要元件符號說明】 [0006] 1非接觸式之電磁干擾量測方法 10待測物 12天線 2 0向量網路分析儀 22第二通訊埠 30頻譜分析儀 40無線發送裝置 42近場探棒43天線 44第一同軸電纜 46第二同軸電纜 50校正基準件 52終端負載 60預放大器 11液晶顯示器 21第一通訊埠 41第一無線接收裝置 45第二無線接收裝置 51微帶線 099116460 表單編號A0101 第10頁/共22頁 0992029264-0The near magnetic field is converted to a power signal and then transmitted back to the vector network analyzer 20, and the first path transfer function is obtained through analysis. In this embodiment, the wireless transmitting device 40 can be a near field probe. The first wireless receiving device 41 can be the near field probe 42 or an antenna 43, please refer to FIG. 4, which is a preferred embodiment for measuring the first transfer function, in this embodiment. The liquid crystal display 11 has an antenna 12', and one end of the antenna 12 is electrically connected to a first coaxial cable 44. The first coaxial cable 44 is electrically connected. The second communication receiver 22 is connected to the first wireless receiving device 41. In the embodiment, the first wireless receiving device 41 can be the six wires 12 of the liquid crystal display 11. In addition, the antenna 12 is possible to: an equivalent electromagnetic interference source. Preferably, the antenna 12 is a WWAN receiver, and the vector network router 2 inputs a test signal to the liquid crystal display by the near-field probe 42. The measuring point of the electromagnetic interference source, the test signal arrives via the transfer path In the case of the antenna 12, the first coaxial cable 44 receives the test signal sent by the antenna 12 and analyzes it via the vector network analyzer 2 to obtain the first path transfer function. The phase obtained by the near-field probe factor The information system can restore the phase delay of the first path transfer function. In addition, please refer to FIG. 5, which is a preferred embodiment for measuring the first interference spectrum. In this embodiment, the device further has a preamplifier. The second wireless receiving device 45 is electrically connected to the spectrum analyzer 3 and the second wireless receiving device 45. In this embodiment, the second wireless receiving device 45 can be a near-field probe 42, the spectral signal of the equivalent electromagnetic interference source of the liquid crystal display u is received by the near-field probe 42, amplified by the signal of the pre-amplifier 6〇, and finally recorded by the spectrum analyzer 3〇 The value, the gain of the preamplifier 60 can be corrected by the step (B), so that the measured value is restored and 099116460 Form No. A0101 Page 7 / Total 22 Page 0995 201142314 The real first source spectrum is paid, please refer to number 6 The measuring method is a measuring method of the electromagnetic interference spectrum actually generated by the antenna 12, and the measuring method is electrically connected to the antenna 12 by a second coaxial cable 46, and the electromagnetic interference signal received from the antenna 12 is further Through the signal amplification of the preamplifier 60, the measured value is finally recorded by the spectrum analyzer 30. In addition, referring to the step (F) of FIG. 1, the near field probe factor is multiplied by the first interference source frequency 4. Obtaining a second interference source spectrum and multiplying the near-field probe factor by the first path transfer function to obtain - the second path transfer function is operated via the data, the interference source spectrum and the path transfer function may be The measurement curve of the field probe factor is corrected to restore the real data. Finally, referring to step (G) of FIG. 1, the second interference source spectrum and the second path transfer function are added to obtain a predicted electromagnetic interference spectrum. In step (G), the second interference source spectrum is in dBm, and the first path-controlled transfer function is in dB. The two can be directly added together. Please refer to FIG. 8A and FIG. 8B map, which is based on the non- The contact type electromagnetic interference measurement method 1 predicts a comparison map of the predicted electromagnetic interference spectrum curve generated in the antenna 丨 2 kW WAN band of the liquid crystal display and the electromagnetic interference spectrum curve actually generated by the antenna i 2 , the quantity The measurement system includes two bands of GSM and UMTS in the WWAN band. It can be seen from Fig. 8A and Fig. 8B that the degree of agreement between the two is extremely high, and the higher harmonics of the pixel clock of the liquid crystal display can be diagnosed. The desensitization of the WWAN receiver is caused. Please refer to FIG. 9A and FIG. 9B, which are the path transfer functions measured in the embodiment, and the measurement data of the path transfer function is known to be increased. The attenuation of the path can effectively improve the electromagnetic interference of the liquid crystal display 11 to the WWAN receiver. The present invention measures the spectrum of the object to be measured by the spectrum analyzer to obtain a first interference source spectrum and the vector network is divided into 099116460 Form No. A0101 Page 8 of 22 0992029264-0 201142314 The test object obtains a first path transfer function, and the predicted electromagnetic interference spectrum is obtained through a reduction correction and a data operation. The non-contact electromagnetic interference measurement method can effectively predict an interference path of the interference source, thereby solving the electromagnetic interference. problem. The scope of the present invention is defined by the scope of the appended claims, and any changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention are within the scope of the present invention. . BRIEF DESCRIPTION OF THE DRAWINGS [0005] FIG. 1 is a flow chart showing a non-contact electromagnetic interference measurement method according to a first preferred embodiment of the present invention. 2A-2B is a diagram showing an example of measurement of a path transfer function of the non-contact type electromagnetic interference measurement method according to the first preferred embodiment of the present invention. Figure 3 is a diagram showing the measurement of the near-field probe factor of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention. Figure 4 is a schematic illustration of the measurement of the path transfer function of the non-contact electromagnetic interference measurement method in accordance with a first preferred embodiment of the present invention. Figure 5 is a diagram showing the measurement of the interference source spectrum of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention. Figure 6 is a diagram showing the measurement of the actual electromagnetic interference spectrum of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention. Figure 7 is a graph showing the measurement of the near-field probe factor of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention. 8A-8B is a diagram showing the comparison of the predicted electromagnetic interference spectrum-actual electromagnetic interference spectrum of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention. Form No. A0101 099116460 Page 9 of 22 0992029264-0 201142314 Figure 9A-9B: Measurement curve of the path transfer function of the non-contact electromagnetic interference measurement method according to the first preferred embodiment of the present invention . [Main component symbol description] [0006] 1 non-contact electromagnetic interference measurement method 10 object to be tested 12 antenna 2 0 vector network analyzer 22 second communication 埠 30 spectrum analyzer 40 wireless transmission device 42 near field probe 43 antenna 44 first coaxial cable 46 second coaxial cable 50 correction reference member 52 terminal load 60 preamplifier 11 liquid crystal display 21 first communication port 41 first wireless receiving device 45 second wireless receiving device 51 microstrip line 099116460 form number A0101 Page 10 of 22 page 0992029264-0