TW201043983A - Test device of plate-shaped inspected object - Google Patents
Test device of plate-shaped inspected object Download PDFInfo
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- TW201043983A TW201043983A TW99108272A TW99108272A TW201043983A TW 201043983 A TW201043983 A TW 201043983A TW 99108272 A TW99108272 A TW 99108272A TW 99108272 A TW99108272 A TW 99108272A TW 201043983 A TW201043983 A TW 201043983A
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
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201043983 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種液晶顯示面板般平板狀被檢查體之 測試裝置。 【先前技術】 進行液晶顯示面板般顯示用面板之點燈測試之裝置, 具備用以對被檢查體進行通電之探針單元、特別是對接觸 〇 子之針尖進行定位之定位功能(亦即,對準功能)。 此種裝置,-般而言,具備檢查載台或工件台般之面 板承載部、在XYZ之3方向位移與繞延伸於z方向之0轴 線位移之載台移動機構、及配置於面板承載部上方之探針 單元β 2定位時,在將被檢查體可解除地吸附於面板承载部 之狀悲下,藉由載台移動機構使探針單元相對面板承載部 位移’以使被檢查體之電極與接觸子之針尖接觸。° ㈣’此種測試裝置中,不僅是面板承載部,亦必須 藉由載台移動機構使支承面板承載部之裝置、背光單元等 位移’因此載台移動機構大型化,測試裝置價格變貴。 特別疋,近年來進行大型被檢查體之測試之裝置,藉 由載口位移之對象物之重量有超過一噸之情形,是以 避免載台移動德媸% ^ ·'、、电 主 動機構進—步大型化,測試裝置價格進一步變 貴。 ^ :解夬上述問題,提出-種藉由使被檢查體相對面 3 201043983 板承載部位移,將被 觸子之針尖_之料裝^2^。錄之電極與接 此對準裝置,在面板承載面 於對應邊之延伸方向相距-間隔配置之一對第f二配置 在面板承載面之對向之另 置一之”1推進器’ 第2推進器。各推垃及另彡分別配置 件、及使W 被檢查體之端面之按愿構 " 構件相對被檢查體進退於x 之移動機構。 々门次γ方向 位時’藉由移動機構使各推進器之按壓構件按壓 承載部位移,藉此進Λ ,使被檢查體相對面板 進订疋位,以使被檢查體之電極鱼接 子之針尖接觸。 〜 此種對準裝置中,作為各推進器之移動機構,使用藉 由空氣或油般μ力流體使按壓構件進退之機構時,被檢查 體藉由該等推進器被推向中心,相對面板承載部定位。 然而,此種對準裝f中,即使供應至配置在面板承載 部之對向側之兩推進器、或於對應邊之延伸方向相距一間 隔之推進器之流體之壓力僅有些微差異,推進器之按壓力 亦產生差異。其結果,被檢查體無法正確地位移,無法進 行正確之定位。 專利文獻1 :日本特開2〇08一 188727號公報 【發明内容】 本發明提供一種可進行被檢查體之正確定位之廉價之 201043983 測試裝置。 本發明之平板狀被檢查體之測試裝置,包含具有承接 平板狀被檢查體之矩形面板承載面之面板承載部、具備按 壓於該被檢查體之電極之複數個接觸子之探針單元、及使 該面板承載部所承接之被檢查體相對該接觸子定位之對準 裝置。[Technical Field] The present invention relates to a test apparatus for a flat-shaped object to be inspected like a liquid crystal display panel. [Prior Art] A device for performing a lighting test of a panel for a liquid crystal display panel, comprising a probe unit for energizing a subject, in particular, a positioning function for positioning a tip of the contact tweezers (ie, Alignment function). Such a device, in general, has a panel carrying portion such as an inspection stage or a workpiece stage, a stage moving mechanism that is displaced in the XYZ direction of 3 and a zero axis extending in the z direction, and is disposed on the panel carrier. When the probe unit β 2 above the portion is positioned, the probe unit is displaced relative to the panel bearing portion by the stage moving mechanism when the object to be inspected is removably adsorbed to the panel carrying portion, so that the object to be inspected The electrode is in contact with the tip of the contact. (4) In the test apparatus, not only the panel carrying portion but also the device for supporting the panel carrying portion, the backlight unit, and the like are displaced by the stage moving mechanism. Therefore, the stage moving mechanism is enlarged, and the price of the test device becomes expensive. In particular, in recent years, in the device for testing large-scale objects, the weight of the object displaced by the carrier has more than one ton, which is to avoid the movement of the stage. - The size of the test is increased, and the price of the test device is further increased. ^ : Solving the above problem, proposes that by placing the opposite side of the object to be inspected 3 201043983, the plate bearing portion will be loaded with the tip of the contactor. The recorded electrode is connected to the alignment device, and the panel bearing surface is disposed at a distance from the corresponding side of the corresponding side-interval arrangement. The pair of the second surface is disposed opposite to the panel bearing surface. The pusher, each of the pusher and the other member, and the moving mechanism of the end face of the W object to be inspected relative to the object to be inspected and moved back to the x. The mechanism causes the pressing members of the pushers to be pressed against the bearing portion, thereby advancing, so that the object to be inspected is aligned with respect to the panel to contact the tip of the electrode of the electrode of the object to be inspected. When the mechanism for advancing and retracting the pressing member by air or oil-like fluid is used as the moving mechanism of each of the pushers, the object to be inspected is pushed toward the center by the pushers, and is positioned relative to the panel carrying portion. In the aligning device f, even if the pressure applied to the two thrusters disposed on the opposite sides of the panel bearing portion or the thrusters spaced apart from each other in the extending direction of the corresponding side is only slightly different, the pushing of the pusher Pressure As a result, the object to be inspected cannot be correctly displaced, and the correct positioning cannot be performed. Patent Document 1: Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. 08-188727. The test device of the flat specimen according to the present invention includes a panel bearing portion having a rectangular panel bearing surface for receiving a flat object, and a plurality of contacts having electrodes pressed against the object to be inspected a probe unit and an alignment device for positioning the object to be inspected by the panel carrier relative to the contact.
該對準裝置,包含分別配置在該面板承載面之對向之 一對邊中一邊及另一邊之第丨推進器機構及第丨定位機 構、及分別配置在該面板承載面之對向之另一對邊中一邊 及另一邊之第2推進器機構及第2定位機構。 該推進器機構及該定位機構分別具備位於該面板承載 面外側之至少一個按壓構件、及使該按壓構件在X方向或γ 方向位移之至少一個驅動 構,將該按_牛在”動:二广:位機構之該驅動機 除。 削牛在Μ方向或γ方向之位置維持成可解 :定位機構可包含可控制旋轉角度位置之馬達。 ° 機構之該㈣構件,係以至少在其移動… 易彈性_或不會彈性變形之材科製作亦可其移動方向不 動源機構可包含驅動源,及藉由該驅 驅動源:起維持成可解除之機構。0方向之位置與該 各定位機構之該维持 向、藉延伸於該 於該滾珠螺桿、使 滾珠螺#,及螺合 按屢構件在該χ方向或γ方向位移之 201043983 螺帽。 各推進器機構之該驅動機構之驅動源可包含使用壓力 流體使該按壓構件進退之汽缸機構。 本發明之測試裝置可進一步包含壓力彼此不同之第1 及第2壓力流體源、及將該第1及第2壓力流體源之壓力 流體選擇性供應至該推進器機構之該驅動機構之驅動源之 閥裝置。 本發明之測試裝置可進一步包含將壓力彼此不同之至 少二個麼力流體選擇性供應至該推進器機構之該驅動機構 之驅動源之電空調整器。 該推進器機構及該定位機構分別可進一步具備支承該 按壓構件、藉由該驅動機構驅動而在該又方向或γ方向移 動之配置於該面板承載部之移動體。 該按壓構件係以可繞延伸於Z方向之軸線旋轉之方式 支承於該移動體亦可。 本發明之測試裝置可進—步包含使該面板承載部移畫 於Z方向之Z移動機構。 本發明之測試裝置可進一步包含 ’ G 3配置於該面板承^ 部、當藉由該對準裝;晋##址&左Μ, 了 +裝置使β玄被檢查體位移時使該被檢查旁 從該面板承載面浮起之浮起裝置。 該浮起裝置可包含一部分 刀J不目對該面板承載面突出; 退縮'配置於該面板承載部之球體 - 久以使該球體之一4 分從該面板承載面露出之方式彈壓之彈簧。 該面板承載部可包含在該面面; 戰面開放之開放部 201043983 及將該開放部選擇性連接於麼力流體之供應源及減屋槽之 至少一者之閥件。 本發明之測試裝置可進一步包含配置有該面板承載 部丑具有矩形之第1開口之台座。又,該面板承載部可具 備共同形成能與該第!開口對向之相似於該第!開口之矩 形之第2開口且共同形成該面板承载面 開口之大小之方式配置於該台座之四個移動片。 Ο Ο 另-對::動片在Y方向相距—間隔平行延伸於X方向, 二=移動片在X方向相距一間隔平行延伸於γ方向亦 板承載面二移動片共同形成該第2開口且共同形成該面 且以可改變該第2開π之大小之方式 台座亦可。再者,相鄰之移The aligning device includes a second thruster mechanism and a second locating mechanism respectively disposed on one side and the other of the opposite sides of the facing surface of the panel, and the opposite direction respectively disposed on the bearing surface of the panel A second thruster mechanism and a second positioning mechanism on one side and the other side of the pair. Each of the pusher mechanism and the positioning mechanism includes at least one pressing member located outside the panel bearing surface and at least one driving structure for displacing the pressing member in the X direction or the γ direction, and the pressing is performed. Wide: The drive of the position mechanism is divided. The position of the cutting cattle in the Μ or γ direction is maintained as solvable: the positioning mechanism can include a motor that can control the position of the rotation angle. The (4) member of the mechanism is moved at least ... easy to elastic _ or material that is not elastically deformed or its moving direction, the source mechanism may include a driving source, and the driving source is maintained as a mechanism that can be released. The position of the 0 direction and the positioning The maintenance mechanism of the mechanism is extended by the 201043983 nut extending to the ball screw, the ball screw #, and the screwing member in the χ direction or the γ direction. The driving source of the driving mechanism of each thruster mechanism The cylinder device of the present invention may include a first and second pressure fluid source having different pressures from each other, and the first a pressure device of a second source of pressurized fluid is selectively supplied to a valve device of a drive source of the drive mechanism of the pusher mechanism. The test device of the present invention may further comprise selectively supplying at least two force fluids different in pressure from each other to An electropneumatic regulator of a drive source of the drive mechanism of the propeller mechanism. The propeller mechanism and the positioning mechanism may further comprise a support member for driving, and driving in the direction or the γ direction by the drive mechanism a moving body disposed on the panel carrying portion. The pressing member is supported by the movable body so as to be rotatable about an axis extending in the Z direction. The testing device of the present invention can further include moving the panel carrying portion The Z moving mechanism drawn in the Z direction. The testing device of the present invention may further comprise 'G 3 disposed on the panel bearing portion, by the alignment device; Jin ##地址& left button, + device for β When the body is displaced, the floating device that is lifted from the bearing surface of the panel is inspected. The floating device may include a part of the knife J not protruding from the bearing surface of the panel; a ball disposed on the panel carrying portion - a spring that is biased so that one of the balls is exposed from the panel carrying surface. The panel carrying portion may be included in the face; the open face of the war face 201043983 and The opening portion is selectively connected to at least one of a supply source of the Mobilis fluid and a reduction tank. The test apparatus of the present invention may further include a pedestal in which the first opening having a rectangular shape of the panel bearing portion is disposed. Further, the panel carrying portion may be provided with four second openings that are formed in a rectangular shape similar to the opening of the first opening, and which are arranged to form a size of the opening of the panel bearing surface.片 Ο - 对 对 : Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο Ο The pedestal may be formed by opening and forming the surface together and changing the size of the second opening π. Furthermore, the adjacent shift
古a々概上 1糸以不妨礙往Y方向戋X 方向之獨立移動之方式結合亦可。 本發明之測試裝置可進— 部、具有矩形之第i開口之台座广:配置有該面板承載 板承載部之間、以能使該移動片在該χ =該。座與該面 之方式結合於該台座之結合機構。 及¥方向移動 本發明之測試裝置可谁— 合機構在該X方向或¥方’包含使各移動片透過該結 移動機構。 。移動、配置於該台座之移動片 ^移動片移動機構可包含 轉角度位置之馬達。 秒勒方拶動之可控制旋 本發明之測試裝置可 探針單元在彼此接近分 /包含使該面板承裁部及該 離方向移動之上下移動機構。 7 201043983 本發明之測試裝置可進一步包含以從上方拍攝該 查體之標記部之方式支承於該探針單元之攝影機裳置。 本發明之測試裝置可進一步包含支承該面板承載部之 又,該探針單元係支承於該架台或該面板承載部亦 本發明之測試震置可進一步包含將該探針單元支承於 該面板承載部之單元支承機構。該單元支承機構可具備以 可在該X方向或γ古 门次Y方向移動之方式承接於該面板承载部、The ancient a々 is generally combined with a method that does not hinder the independent movement in the X direction in the Y direction. The test apparatus of the present invention can have a wide pedestal with a rectangular i-th opening: the panel carrier is disposed between the load-bearing portions to enable the moving piece to be in the frame. The combination of the seat and the face is coupled to the pedestal. And ¥ direction movement The test device of the present invention can be configured to allow the respective moving pieces to pass through the knot moving mechanism in the X direction or the ¥ side. . Moving piece disposed on the pedestal ^The moving piece moving mechanism may include a motor at an angular position. The control device of the present invention can be used in the test device of the present invention. The probe units can be moved closer to each other/including moving the upper and lower movement mechanisms of the panel receiving portion and the separating direction. 7 201043983 The test apparatus of the present invention may further comprise a camera skirt supported by the probe unit in such a manner as to photograph the marking portion of the object from above. The test apparatus of the present invention may further comprise a support for the panel carrying portion, the probe unit being supported by the mount or the panel carrying portion. The test mount of the present invention may further comprise supporting the probe unit on the panel. Unit support mechanism. The unit supporting mechanism may be provided to be supported by the panel carrying portion so as to be movable in the X direction or the γ ancient gate Y direction.
l伸於γ方向或乂方向之第t移動體,以可斜向移動於X 方向或Y方向與2方向之方式結合於該第1移動體、延伸 於該υ方向或Χ方向之第2移動體,規定該第2移動體之 前進終端位置之制動件,及使該第1移動體在該X方向或υ 方向移動、藉此使該第2移動體在該χ方向或¥方向移動 且在ζ彳向位移之探針移動機構。又,該探針單元係支承 於該第2移動體亦可。 忒早7L支承機構可進一步包含延伸於該γ方向或X方 向、以在該面板承載部可在該γ方向或乂方向移動之方式 支承於該面板承載部、使該帛1移動體支承於該面板承載 部之移動體承載件,及使該移動體承載件在其長邊方向移 動、將在該Υ方向或X方向上相對該面板承載部之位置維 持成可解除之單元位置調整裝置。 該k針單凡可進一步包含沿著該矩形之邊延伸且支承 於該單元支承機構之支承基座,及在該支承基座之長邊方 向相距-間隔 '以可在z方向移動之方式支承於該支承基 201043983 座、支承複數個該接觸子之探針塊β 該支承基座係以可繞延伸於ζ方向之軸線角度性旋轉 . 之方式支承於單元支承機構亦可。又,該探針單元進一步 , 具備使該支承基座相對該面板承載部角度性旋轉、將該面 板承載部與該探針單元繞延伸於該ζ方向之軸線之位置關 係維持成可解除之角度調整機構亦可。 探針移動機構可包含選擇性使該探針塊位移於從該面 板承載面後退之退開位置、用以定位被檢查體之對準位 〇 置、使該接觸子接觸被檢查體之電極之接觸位置並維持成 可解除之可控制位置之馬達。 該探針單元係分別配置於與該矩形之相鄰二邊對應之 部位亦可β 該對準襄置可包含在該面板承載面之對向之一對邊中 了邊及另-邊分別讀應邊之延伸方向相距—間隔配置之 複數個該第1推進器機構及複數個該第丨定位機構。 Ο …該對準裝置可包含在該面板承載面之對向之一對邊中 一邊及另一邊分別於對應邊之延伸方向相 一斟兮势,& 間隔配置之 對該第1推進器機構及一對該第丨定位機構。 該對準裝置可包含在該面板承載面 心對向之一對邊中 該另一邊於對應邊之延伸方向相距一 i定位機構。 己置之-對該第 雅進器機構可具備於對柯 之複數個該按壓構件…該第1推進器檣二相距一間隔 構可具備使該按壓構件在x方向或A t該驅動機 方向位移之驅動源, 9 201043983 γ方向或X方向相距一間隔支 之轴線旋轉之方式支承於該驅動 及將該複數個按壓構件在 承、以可繞延伸於z方向 源之支承構件。 田定位時Μ由使各推進器機構及各定位機構之各按 壓構件按壓被檢杳體之又方6+ X, _ —之χ方向或γ方向之端面,使被檢查 體相對面板承載部位蒋,基+ A, a 移藉此進仃定位,以使被檢查體之 電極與接觸子之針尖接觸。 進行上述定位時,各定位機構之驅動機構將該按壓構 件在X方向或γ方向之位置維持成可解除,因此各定位機 構之㈣構件在X方向或Y方向之位置不會位移。因此, 可將定位機構之按㈣件使用為決定被檢查體在X方向及 γ方向之基準位置之構件。 上述結果,根據本發明,被檢查體與探針單元,係藉 由推進器機構使定位機構之按壓構件按壓被檢查體之χ ^ 向及Υ方向之端面,而可正確地定位。 又,各推進器機構及各定位機構只要為使輕重量之被 ^查體位移之構造即可,因此重量輕,不需要使面板承載 邛或背光單元等重量大之對象物位移之大型對準裝置,因 此測試裝置廉價。 再者’不僅是推進器機構側之按壓部,若能使決定武 準位置之定位機構側之按壓構件相對被檢查體 . 〜 《II對 板承栽部之被檢查體之交接作業變容易。 各定位機構之驅動機構將該按壓構件在χ方向式 向 4 Υ方 ° 位置維持成可解除之驅動源若包含脈衝馬達般可 is制 201043983 位置之馬達,則各定位機構之按壓構件在χ方向戋y方向 之位置’只要馬達不旋轉即不會位移。 . 各定位機構之按壓構件只要以至少在其移動方向不易 彈性變形或不會彈性變形之材料製作,則被檢查體^ 在X方向或γ方向之位置,可藉由此種按廢構件正確地定 位。 【實施方式】 Ο (用語之說明) 本發明中,圖2中,蔣:, 將上下方向(與面板承載部所承接 之被檢查體垂直之方向)稱為Z方向或上下方向,將左右方 向稱為X方向或左右方向,將紙#面方向稱為y方向或前 後向…;而Jt等方向依測試時被檢查體之姿勢而不同。 因此,本發明之測試裝置,藉由X方向及γ方向規定 之xy面,使用在成為水平面之狀態、相對水平面成為傾斜 之狀態等任一狀態皆可。a t-th moving body extending in the γ direction or the 乂 direction, coupled to the first moving body and the second moving extending in the υ direction or the Χ direction so as to be obliquely movable in the X direction, the Y direction, and the 2 direction The body defines a brake member that advances the end position of the second movable body, and moves the first movable body in the X direction or the υ direction, thereby moving the second movable body in the χ direction or the ¥ direction and The probe moving mechanism of the displacement. Further, the probe unit may be supported by the second movable body. The 7L support mechanism may further include extending in the γ direction or the X direction, and supporting the panel bearing portion so that the panel bearing portion can move in the γ direction or the 乂 direction, and supporting the 帛1 moving body The moving body carrier of the panel carrying portion and the unit position adjusting device for moving the moving body carrier in the longitudinal direction thereof to maintain the position of the panel carrying portion in the x direction or the X direction. The k-pin may further include a support base extending along a side of the rectangle and supported by the unit support mechanism, and supporting at a distance from the longitudinal direction of the support base to be movable in the z direction The support base 201043983 supports the probe block β of the plurality of contacts. The support base may be supported by the unit support mechanism so as to be angularly rotatable about an axis extending in the x-direction. Further, the probe unit further includes an angle at which the support base is angularly rotated with respect to the panel carrying portion, and the positional relationship between the panel carrying portion and the probe unit about the axis extending in the meandering direction is maintained at a retractable angle Adjustment agencies are also available. The probe moving mechanism may include selectively displacing the probe block in an unfolding position retracted from the panel bearing surface, positioning an alignment position of the object to be inspected, and contacting the contact electrode with the electrode of the object to be inspected A motor that contacts the position and maintains a releasable controllable position. The probe unit is respectively disposed at a portion corresponding to two adjacent sides of the rectangle, and the alignment device can be included in the opposite side of the opposite side of the panel bearing surface and read on the other side. A plurality of the first thruster mechanisms and a plurality of the second jaw positioning mechanisms arranged at a distance from each other in the direction in which the edges extend. The aligning device may include one side of the opposite side of the facing surface of the panel bearing surface and the other side respectively facing the extending direction of the corresponding side, and the first thruster mechanism is disposed at intervals And a pair of the third positioning mechanism. The alignment device may be included in one of the opposite sides of the facing side of the panel bearing surface, and the other side is spaced apart from the corresponding side by a positioning mechanism. The first ejector mechanism may be provided with a plurality of the pressing members for the yoke mechanism. The first thruster may be provided with the spacer member in the x direction or the driving direction of the driving device. Drive source for displacement, 9 201043983 The γ direction or the X direction is supported by the drive member and the plurality of pressing members are supported by the support member capable of winding around the source in the z direction. In the field positioning, each pressing member of each of the propeller mechanism and each positioning mechanism is pressed against the end face of the inspected body 6+X, _- or the end face of the γ direction, so that the object to be inspected is opposite to the panel bearing site. , the base + A, a is moved to thereby position the electrode so that the electrode of the object to be inspected contacts the tip of the contact. When the positioning is performed, the driving mechanism of each positioning mechanism maintains the position of the pressing member in the X direction or the γ direction so as to be disengageable, so that the members of the positioning mechanism (4) are not displaced in the X direction or the Y direction. Therefore, the member (4) of the positioning mechanism can be used as a member for determining the reference position of the object to be inspected in the X direction and the γ direction. As a result of the above, according to the present invention, the object to be inspected and the probe unit can be accurately positioned by pressing the pressing member of the positioning mechanism against the end faces of the object to be examined and the direction of the object by the pusher mechanism. Further, each of the pusher mechanisms and each of the positioning mechanisms may be configured to displace the light weight and the object to be inspected, so that the weight is light, and large-scale alignment of the object such as the panel bearing or the backlight unit is not required to be displaced. The device is therefore inexpensive. In addition, it is not only the pressing portion on the side of the pusher mechanism, but also the pressing member on the side of the positioning mechanism that determines the position of the tool can be moved to the object to be inspected. The driving mechanism of each positioning mechanism maintains the pressing member in the χ direction to the 4 Υ ° position to release the motor. If the motor includes a pulse motor, the pressing member of the positioning mechanism is in the χ direction. The position in the 戋y direction is not displaced as long as the motor does not rotate. The pressing member of each positioning mechanism can be made of a material that is not easily elastically deformed or elastically deformed at least in the moving direction thereof, and the position of the object to be inspected in the X direction or the γ direction can be correctly determined by such a scrap member. Positioning. [Embodiment] Ο (Description of Terms) In the present invention, in FIG. 2, Jiang: The vertical direction (the direction perpendicular to the object to be inspected by the panel bearing portion) is referred to as the Z direction or the vertical direction, and the left and right directions are used. It is called the X direction or the left and right direction, and the paper # plane direction is referred to as the y direction or the forward and backward direction; and the Jt direction is different depending on the posture of the object to be inspected during the test. Therefore, in the test apparatus of the present invention, the xy plane defined by the X direction and the γ direction may be used in any state such as a state of being a horizontal plane and a state of being inclined with respect to a horizontal plane.
(實施例) a參照圖1〜圖4 ’測試裝置10使用為以封入液晶之液 ^板般顯不用面板為平板狀被檢查體12(參照圖4、 7、9等)、將該被檢查體12連接於既定電路以進行點燈檢 查般電氣測試之裝置。 被檢查體12具有矩形 办此 矩$之形狀,且在與矩形之各邊對應 之各緣部具備複數個雷 .^ 電極。以下,為了容易理解,將被檢 查體12說明為具有在 八万向較長之長方形形狀者。圖示之 11 201043983 例中,被檢查體12,在與矩形之相鄰邊對應之二個緣部分 別在對應緣部之長邊方向相距一間隔具有複數個電極。 (關於測試裝置) 測試裝置10,包含機器基座亦即平台14,在平台 之上側相距一間隔配置之台座16,配置於台座16之上D側、 承接被檢查體12之面板承載部18,配置於面板承載部18 之上側之複數個探針單元20,使各探針單元2〇支承於面板 承載部18之單元支承機構22’從上方拍攝面板承載部a 所承接之被檢查體12之標記部(之後說明)、安裝於探針單 元20之複數個攝影機裝置24,及使面板承載部18所承接 之被檢查體12相對面板承載部18定位、之後說明之 裝置。 圖不之例中,探針單元2〇係配置於與矩形之相鄰二邊 對應之各部位。缺而,^>^4« βα q Λ …、而探針早70 20之配置部位,係依據被 檢查體12之電極之配置位置決定。 又,圖不之例中,單元支承機構22係配置於與矩形之 邊對應之各部位。麸而,gg _ 1,,, .、、'而皁凡支承機構22不配置在未配置 探針單元20之部位亦可。 再者,圖不之例中,二個攝影機裝置24,在與矩形之 相鄰it《彡對應之部位,在該邊之長邊方向相距一間 隔配置,且—個攝影機裝置24係配置於與相鄰二邊之另一 邊對應之部位。然而’將:個攝影機裝置Μ於探針單元2〇 之長邊方向相距-間隔配置於各探針單元20亦可。 平〇 14係支承於測試裝置1〇之架台25(參照圖4)。然 12 201043983 而’平台14為架台25之一部公t-r* 口丨刀亦可。平台14與台座16 具有矩形板之形狀,且台座16仿y 0位於平台14之上方之狀態 下’在Z(上下)方向相距一間隔。 台座1.6係藉由複數個支杈9 又狂26(參照圖4)支承於平台 14’且具有大於被檢查體12之矩 t開口 16a(參照圖1及圖 4)。在平台14與台座16之間配罟古 间配置有已知之背光單元28(參 照圖4)。 (關於面板承載部)(Example) A Referring to Fig. 1 to Fig. 4, the test apparatus 10 is used to display a liquid crystal panel, and the panel is a flat object 12 (see Figs. 4, 7, and the like). The device 12 is connected to a predetermined circuit for performing electrical inspections such as lighting inspection. The object 12 to be inspected has a rectangular shape of the moment $, and has a plurality of lightning electrodes at each edge portion corresponding to each side of the rectangle. Hereinafter, for the sake of easy understanding, the object to be inspected 12 will be described as having a rectangular shape having a long length of 80,000. In the example of 201043983, in the test object 12, the two edge portions corresponding to the adjacent sides of the rectangle have a plurality of electrodes spaced apart from each other in the longitudinal direction of the corresponding edge portion. (About the test device) The test device 10 includes a platform 14 which is a machine base, and a pedestal 16 which is disposed at a distance from the upper side of the platform, and is disposed on the D side of the pedestal 16 and receives the panel bearing portion 18 of the object 12 to be inspected. a plurality of probe units 20 disposed on the upper side of the panel carrying portion 18, and the unit supporting mechanism 22' for supporting the probe units 2 to the panel carrying portion 18 to photograph the object 12 to be inspected from above by the panel carrying portion a A marking portion (described later), a plurality of camera devices 24 attached to the probe unit 20, and a device for positioning the object 12 to be inspected by the panel carrier portion 18 with respect to the panel carrier portion 18 will be described later. In the example of the figure, the probe unit 2 is disposed at each portion corresponding to two adjacent sides of the rectangle. In the absence of ^^^^«βα q Λ ..., the position of the probe 70 70 is determined by the position of the electrode of the object 12 to be inspected. Further, in the example of the figure, the unit supporting mechanism 22 is disposed at each portion corresponding to the side of the rectangle. The bran is gg _ 1, , , . , , and the soap supporting mechanism 22 is not disposed at a portion where the probe unit 20 is not disposed. Further, in the example of the figure, the two camera devices 24 are disposed at intervals in the longitudinal direction of the side adjacent to the rectangle "the corresponding portion", and the camera devices 24 are disposed in the same manner. The part corresponding to the other side of the adjacent two sides. However, it is also possible to arrange a plurality of camera devices in the longitudinal direction of the probe unit 2A at intervals in the respective probe units 20. The raft 14 is supported by the gantry 25 of the test apparatus 1 (see Fig. 4). However, 12 201043983 and 'platform 14' is one of the pedestal 25's t-r* knives. The platform 14 and the pedestal 16 have the shape of a rectangular plate, and the pedestal 16 is placed at a position above the platform 14 in the Z (up and down) direction. The pedestal 1.6 is supported by the platform 14' by a plurality of supports 9 and mad 26 (see Fig. 4) and has a larger opening 16a than the object 12 to be inspected (see Figs. 1 and 4). A known backlight unit 28 is disposed between the platform 14 and the pedestal 16 (refer to Fig. 4). (About the panel bearing section)
面板承載部18,如圖5所千,. 固所不’具備彼此組合成井字狀 字狀之四個移動片30。欠教; 砂斯乃川各移動片30,如圖4至圖10、 或卍 圖12、圖13所示,在官λ纪p 社見厪尺寸小之長方形之第1片部30a 與寬度尺寸小之長方形之第2 κ π ι罘2月30b中、第1片部30a 成為水平、第2片部30h夕當 Π JUb之寬度方向成為上下方向之狀態 下’結合成L字狀。 4㈣Ji 3UXY面内於丫方向相距—間隔平行延 n伸於X方向,另一對移動片3〇在XY面内於X方向相距一 :::平仃延伸於γ方向。此等移動片%係藉由之後說明之 °機構62,在與台座16平行之面(XY面)内可二維(X方 向及Y方向)移動地結合於台座16。 等四個移動片30,共同形成與被檢查體12及開口 16a相似之矩形開口 32,且與矩形之面板承載面w共同形 成;^ 2片部3〇b之頂面。開口 16a及32彼此對向以允許 、單元28之光射進面板承載面34所承接之被檢杳 體 12。 — 13 201043983 上述四個移動片30,係以可改變 可在XY面内二維移動)之方式 广之尺寸(亦即, 62結合於台座16。 之後說明之結合機構 相鄰之二個移動片30,係以在χ 體移動及在γ方向β (或Υ方向)可一 當之結合手段結合=方向)可個別移動之方式,藉由適 象移動片30在γ方亡相鄰之移動片30,在不妨礙對 向(或Χ方向)之獨立移動之方十α人 亦即,各移動片3〇,—動之方式結合。 在該相鄰之-移動片3。之長邊方向二=3。以能 移動,且結合於相鄰之另一移動片^方向或Χ方向)獨立 移動片之長邊方向二: 能在該相鄰之另- (向或Χ方向)—體移動。 向W 手段’可使用例如延伸於X方向(或Υ方 :-μ開口 32之侧開放且具有截頭四角錐形之截面形狀之 錐槽、及可滑動地嵌合於該鸿尾槽、具有截頭四角 ,形之截面形狀之所謂鳩尾座之組合。 鳩尾槽係形成於相鄰二個移動片3G之—者之 上開口 32側之端緣部,氣座係形成於相鄰三 ° 之另-者之長邊方向上之一端緣部。 動片 然而,替代鳩尾槽與鴻尾座之組合,使用導軌與可滑 於該導軌及不㊣分離地結合之導引件 < 組合之其他处A 手段亦可。 口 在各移動片30設有圖18及圖19所示之複數個浮起裝 置j6。序起裝置36,當藉由該對準裝置使被檢查體η位 移時,與被檢查體丨2 —起從面板承载面34浮起,使對準 201043983 時被檢查體12之移動順利β 圖18及圖19所示之例ψ 办… 例中,各洋起裝置30,包含埋入 於第2片部30b以使開口部在坌〇 口如 1任第2片部30b之頂面(面板承 載面34)開放之有底筒構件38 卞、一部分可相對面板承載面 34突出沒人地配置於筒構件38之球體4q、彈壓以使球體 4〇之-部分從面板承載面34露出之彈菁42、位於球體4〇 與彈簧42之間且可上下方向移動地配置於筒構件38之圓 Ο ❹ 板狀球體軸承44、及限制球體4G在筒構件%内之位移之 環46。 浮起裝置36,使被檢查體12承接於球體⑽,維持成 從面板承載面34浮起之狀態。因此,彈簣42之㈣力只 要為能使被檢查體丨2從面板承載面34浮起之程度即可。 如圖23所示,面板承載部18,在各第2片部鳩具備 在面板承載面34開放之複數個開放部48、及連通該等開放 部48之連通孔50。圖示之例中,各開放部48係孔,但為 在面板承載面34開放、延伸於第2片部3汕之長邊方向之 槽之其他·開放部亦可。 各第2片部30b之連通孔5〇,係藉由管件54導通/斷 開地連接於閥件52^件52係連結於真空槽般減壓後之減 壓槽56’藉由閥驅動裝置58驅動,選擇性導通/斷開減壓 槽56與連通孔50之間之空氣流路。 上述空氣流路導通後,開放部48及連通孔5〇連接於 減壓槽。藉此,被檢查體12抗衡浮起裝置刊之彈簧β之 彈壓力將球體40壓下,無法位移地真空吸附於面板承載面 15 201043983 34。在此狀態下,進行被檢查體12之點燈測試。 與上述情形相反,上述空氣流路斷開後,開放部48及 連通孔50從減壓槽56切離。藉此,解除被檢查體12對面 板承載面34之吸附,球體40之一部分因彈簧42之彈壓力 從面板承載面34稍微突出。 上述結果,被檢查體12從面板承載面34稍微浮起。 在此狀態下,進行新舊被檢查體12之更換與新被檢查體Μ 之對準。對準如後述說明般’係藉由對準裝置使被檢查體 U位移來進行。對準時,被檢查體12僅抵接於球體4〇, 從面板承載面34浮起,因此順利且輕易地位移。 如圖23所不,替代上述浮起裝置36,將壓縮空氣源般 壓力流體源6〇連接於閥件52 ’使減壓槽56及壓力流體源 6〇藉由閥件52選擇性連接於連通孔5〇亦可。 ^上述情形,作為閥件52係使用切換閥。被檢查體12, 久曰开1放。p 48連接於壓力流體源6〇、來自壓力流體源 卯之壓力流體從開放部48噴出,從面板承載面Μ稍微浮 (關於結合機構) 如圖1、圖 圖5所不,上述結合機構62,為了使四 個移動片30可在父古心 在X方向及γ方向移動地結合於台座16, 置於口座16與面板承載部18之間。The panel carrying portion 18, as shown in Fig. 5, has four moving pieces 30 which are combined with each other in a shape of a well. The teachings of the sands are as follows. As shown in Fig. 4 to Fig. 10, or Fig. 12 and Fig. 13, the first piece 30a of the rectangle having a small size is small and the width is small. In the 2nd κ π 罘 罘 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 4 (4) Ji 3UXY in the plane in the 丫 direction - the parallel parallel extension n extends in the X direction, the other pair of moving pieces 3 〇 in the XY plane in the X direction is separated by a ::: flat 仃 extending in the γ direction. These moving pieces % are coupled to the pedestal 16 in a two-dimensional (X-direction and Y-direction) movement in a plane (XY plane) parallel to the pedestal 16 by a mechanism 62 which will be described later. The four moving pieces 30 are formed to form a rectangular opening 32 similar to the object to be inspected 12 and the opening 16a, and are formed together with the rectangular face bearing surface w; the top surface of the 2 piece 3b. The openings 16a and 32 oppose each other to allow the light from the unit 28 to be incident on the body 12 to be received by the panel carrying surface 34. — 13 201043983 The above four moving pieces 30 are widely sized in such a manner that they can be moved two-dimensionally in the XY plane (that is, 62 is coupled to the pedestal 16. The two moving pieces adjacent to the combining mechanism will be described later). 30, in the manner of moving in the corpuscle and in the γ direction β (or Υ direction), the combination of the means can be individually moved, by means of the movable moving piece 30 in the γ square adjacent to the moving piece 30. In the case of an independent movement that does not interfere with the opposite direction (or the direction of the Χ), that is, the moving pieces are combined, and the moving pieces are combined. In the adjacent - moving sheet 3. The long side direction is 2 = 3. The long side direction 2 of the independent moving piece can be moved and combined with the adjacent moving piece ^ direction or the Χ direction: it can move in the adjacent - (toward or Χ direction) body. For the W means, for example, a tapered groove extending in the X direction (or the side of the opening: -μ opening 32 and having a cross-sectional shape of a truncated quadrangular pyramid) and slidably fitted to the H-shaped groove can be used. A combination of the so-called tailstocks of the cross-sectional shape of the cross-section. The dovetail groove is formed at the edge of the opening 32 side of the adjacent two moving pieces 3G, and the air bearing system is formed at an adjacent three-degree. Another one of the end edges of the long side. The movable piece, however, replaces the combination of the dovetail groove and the tailstock, using a guide rail and a guide member that can be slidably attached to the guide rail and is not separated separately. The means A can also be used. The mouth is provided with a plurality of floating devices j6 shown in Figs. 18 and 19 in each of the moving pieces 30. The sorting device 36, when the object to be inspected is displaced by the aligning device, The object to be inspected 2 floats up from the panel bearing surface 34, so that the movement of the object 12 to be aligned at the time of 201043983 is smoothly β. In the example shown in Figs. 18 and 19, in the example, each hoisting device 30 includes Embedding in the second sheet portion 30b such that the opening portion is at the top surface of the second sheet portion 30b Face 34) The open bottomed tubular member 38 卞, a portion of which can be disposed on the spherical body 4q of the tubular member 38 with respect to the panel bearing surface 34, and is elastically pressed to expose the portion of the spherical body 4 from the panel bearing surface 34. 42. A circular Ο 板 plate-like spherical bearing 44 disposed between the ball 4 〇 and the spring 42 and movable in the vertical direction, and a ring 46 for restricting displacement of the spherical body 4G in the tubular member %. 36, the object to be inspected 12 is received by the sphere (10), and is maintained in a state of being floated from the panel bearing surface 34. Therefore, the force of the magazine 42 is such that the object to be inspected 2 can be floated from the panel bearing surface 34. As shown in Fig. 23, the panel supporting portion 18 includes a plurality of opening portions 48 that are open to the panel carrying surface 34 and communication holes 50 that communicate with the opening portions 48 in the respective second sheet portions. In the example, each of the opening portions 48 is a hole, but may be another opening portion that is open to the panel receiving surface 34 and extends in the longitudinal direction of the second sheet portion 3汕. The communicating hole of each of the second sheet portions 30b 5〇, connected to the valve member 52 by means of the tube member 54 open/closely connected to the vacuum The pressure reducing groove 56' after the normal pressure reduction is driven by the valve driving device 58 to selectively open/close the air flow path between the pressure reducing groove 56 and the communication hole 50. After the air flow path is turned on, the opening portion 48 and The communication hole 5 is connected to the pressure reducing groove, whereby the object 12 is pressed against the spring pressure of the spring β, which is published by the lifting device, and the ball 40 is pressed down, and is vacuum-adsorbed to the panel bearing surface 15 201043983 34 in a state of displacement. Next, the lighting test of the test object 12 is performed. Contrary to the above, after the air flow path is broken, the open portion 48 and the communication hole 50 are separated from the pressure reducing groove 56. Thereby, the test object 12 is released from the panel. Adsorption of the bearing surface 34, a portion of the ball 40 slightly protrudes from the panel bearing surface 34 by the spring pressure of the spring 42. As a result of the above, the object to be inspected 12 is slightly floated from the panel bearing surface 34. In this state, the replacement of the old and new objects 12 to be inspected is aligned with the newly inspected body. The alignment is performed by displacing the object U by the alignment device as will be described later. At the time of alignment, the object to be inspected 12 abuts only on the spherical body 4, and floats from the panel bearing surface 34, so that it is smoothly and easily displaced. As shown in Fig. 23, instead of the floating device 36, a compressed air source pressure fluid source 6 is connected to the valve member 52' so that the pressure reducing groove 56 and the pressure fluid source 6 are selectively connected to each other by the valve member 52. Hole 5 can also be used. In the above case, the switching valve is used as the valve member 52. The body 12 to be inspected is placed for a long time. The p 48 is connected to the pressure fluid source 6〇, and the pressure fluid from the pressure fluid source 喷 is ejected from the open portion 48, and slightly floats from the panel bearing surface 关于 (with respect to the coupling mechanism). The coupling mechanism 62 is as shown in FIG. 1 and FIG. In order to allow the four moving pieces 30 to be coupled to the pedestal 16 in the X direction and the γ direction in the father's ancient heart, it is placed between the mouth seat 16 and the panel carrying portion 18.
圖:之例中,結合機構62,具備在X方向相距一間隔 十仃延伸於γ大A 、可移動於X方向地配置於台座丨6之帶 狀之-對U滑件64,及在第i滑件64之上方在γ方向相 16 201043983 隔平行延伸於χ方向、可移動於¥方 座16之帶狀之一對第2滑件“。 置於口 如圖5所示,-第2滑件66藉由結合構件68可移動 ::::::合於-第1滑件64,"2滑件= 、取冓牛68可移動於γ方向地結合於另一第上滑件64。 及::6朝4 台座16上面所具備之一對軌道70 及另-端部結合 向)移動地,在各滑件之-端部 Ο ::合構件68,可移動於γ方向地結合於設在對應之 、首72^ 4且延伸於該第1滑件64之長邊方向之一對執 ^ ’且可移動於X方向地結合於設在對應 :延:於該第2滑…長邊方向之另—對軌道;二6 ^結合構件68,可相對台座Μ在XY面内二維移動。 地仕=之例中,延伸於Y方向之各移動片無法位移 二一合構件68’延伸於又方向之各移動片3〇,可移 方向地結合於延伸於χ方向之第2滑件& 軌道72。 π件64及66分別藉由移動片移動 向(V方向),在上述移動方向之適當位置维持成可解除 :不之例中’作為各移動片移動機構74,使用下述機 t’Y亦即使用設置於台座16上面之馬達’在延伸於X方向 之狀態T連結於該馬達、藉由該馬達旋轉之滾珠 ^及螺合於該滾珠螺捍且藉由連結具連結於滑件㈣ 螺帽之機構。馬達係脈衝馬達般可將旋轉角度位置維 17 201043983 持成可解除之可控制位置之馬達。 ,例如,-對第i滑件64藉由對應之移動片移 Μ 在彼此接近分離方向(X方向)移動時,透過结人 結於第旧料之-側之(延伸於丫方向)— 在彼此接近分離方向(X方向)與結合構件68 —起移動, 在該一側之移動片30藉由上述鳩尾槽與鳩尾座等之妗人= 段連結之另一側之(延伸於又方向)一對移動片3〇與^ 之移動片30之移動一起移動於χ方向。 又’ -對第2滑件66藉由對應之移動片移動機構Μ 在彼此接近分離方向(Y方向)移動時,連結於第2滑件Μ 之該另一側之(延伸於X方向)一對移動片30在彼此接近分 離方向方向)與第2滑件66—起移動,且在該移動片如 藉由上述鴻尾槽與場尾座等之結合手段連結之該一側之(延 伸於γ方向)-對移動片3G與該另—側之移動片3q之移動 一起移動於長邊方向(γ方向)。 _因此’四個移動片3〇以開口 32之尺寸成為圖3及圖6 所不之尺寸之方式移動。其結果,可依據待測試之被檢查 體U之尺寸改變開u 32或面板承載面34之尺寸。此作業 在被檢查體12之點燈測試前先進行。 (關於對準裝置) 參照圖2、圖4、圖7至圖1〇、圖16及圖17,上述對 :裝置,包含在面板承載面34之對向之一對邊(χ邊)中一 2另-邊分別於對應邊之長邊方向相距一間隔配置之一 對弟1推進器機構8〇及一對第1定位機構82、及分別配置 18 ΟIn the example of the present invention, the coupling mechanism 62 includes a strip-shaped U-slider 64 that is disposed at a distance of ten 仃 in the X direction and that extends in the X direction and is disposed in the X direction. The upper portion of the i-slider 64 is in the γ-direction phase 16 201043983, and is parallel to the χ direction, and can be moved to the second slider of the strip shape of the square seat 16". The placement port is as shown in FIG. 5, - 2nd The slider 66 is movable by the coupling member 68: ::::: is combined with the -first slider 64, "2 slider =, and the yak 68 is movable in the γ direction to be coupled to the other upper slider 64. and ::6 toward the 4 pedestal 16 with one of the pair of rails 70 and the other end of the joint) moving, at the end of each slider Ο :: joint member 68, can move in the γ direction And being coupled to one of the longitudinal direction of the first slider 72 and extending in the longitudinal direction of the first slider 64 and being movable in the X direction to be coupled to the corresponding one: extending: the second sliding ...the other side of the long side direction - the pair of rails; the two 6 ^ joint members 68 can be moved two-dimensionally in the XY plane with respect to the pedestal 。. In the example of the Shishi =, each moving piece extending in the Y direction cannot be displaced by the two-in-one member 68' extends in the direction Each of the moving pieces 3 〇 is movably coupled to the second slider & track 72 extending in the χ direction. The π pieces 64 and 66 are moved by the moving piece (V direction), respectively, in the above moving direction. The position is maintained to be detachable: in the other case, 'as the moving piece moving mechanism 74, the motor t provided on the upper surface of the pedestal 16 is connected to the motor in a state T extending in the X direction, using the following machine t'Y a ball that is rotated by the motor and a mechanism that is screwed to the ball screw and coupled to the slider (four) nut by a connecting rod. The motor is like a pulse motor, and the rotation angle position is maintained at a height of 17 201043983. a motor that controls the position. For example, - the i-th slider 64 is moved by the corresponding moving piece. When moving closer to the separating direction (X direction), the knot is connected to the side of the old material (extending from丫 direction) - moving in close to each other in the separation direction (X direction) and the coupling member 68, and the moving piece 30 on the one side is connected to the other side of the =人= segment of the dovetail slot and the like Extending in the direction) a pair of moving pieces 3〇 and ^ shift The movement of the movable piece 30 moves together in the χ direction. Further, the pair of second sliding pieces 66 are coupled to the second sliding piece 藉 when moving in the separation direction (Y direction) by the corresponding moving piece moving mechanism Μ On the other side (extending in the X direction), the pair of moving pieces 30 move in the direction of the separation direction from each other, and move along with the second slider 66, and the moving piece is, for example, by the above-mentioned trailing groove and the tailstock. The one side of the joining means (extending in the γ direction) moves in the longitudinal direction (γ direction) together with the movement of the moving piece 3G and the moving piece 3q on the other side. _ Therefore 'four moving pieces 3 〇 The size of the opening 32 is moved so as to be the size of FIGS. 3 and 6. As a result, the size of the opening u 32 or the panel bearing surface 34 can be changed depending on the size of the object U to be tested. This operation is performed before the lighting test of the object 12 to be inspected. (Regarding Alignment Device) Referring to Figures 2, 4, 7 to 1B, 16 and 17, the pair of devices is included in one of the opposite sides (edges) of the panel bearing surface 34. 2, the other side is disposed at a distance from the longitudinal side of the corresponding side, and the pair of the first propeller mechanism 8〇 and the pair of first positioning mechanisms 82 are respectively arranged and 18 Ο
G 201043983 在面板承载面34之對向之另一對邊(γ邊)中一邊及另一邊 之第2推進器機構84及第2定位機構%。 、推進器機構80, 84分別使被檢查體12相對配置在 進器機構配置側相反側之定位機構82或%進退。相對於 此,定位機構82, 86分別決定被檢查體12在 γ 方向)之基準位置。 Υ 如圖7至圖1〇所示,推進器機構8〇, 84及定位機構82 =別1 立於與面板承載面34相同高度位置,具備俯視時位 於面板承載面34外侧之按壓構件9〇、按壓構件% 之支柱狀移動體92、使移動體92或按壓構件%相對面板 承載面34進退之驅動機構94、及支承該等之支承板96。 圖不之例中’移動體92具有延伸於上下方向之支 形狀。按壓構件90係藉由安裝銷98以在移動體& 部可繞延伸於ζ方向之輛線旋轉之方式m 為其他構件。 — 支承板9 6,係以在設於而此& # 牡叹於面板承載部18之移動片3〇G 201043983 The second thruster mechanism 84 and the second positioning mechanism % on one side and the other side of the opposite side (γ side) of the panel bearing surface 34. The pusher mechanisms 80 and 84 advance and retreat the positioning mechanism 82 or % of the object to be inspected 12 on the side opposite to the arrangement side of the feeder mechanism, respectively. In contrast, the positioning mechanisms 82, 86 determine the reference position of the subject 12 in the γ direction, respectively. Υ As shown in FIG. 7 to FIG. 1A, the pusher mechanisms 8A, 84 and the positioning mechanism 82 are located at the same height position as the panel bearing surface 34, and have a pressing member 9 located outside the panel bearing surface 34 in plan view. The pillar-shaped moving body 92 of the pressing member %, the driving mechanism 94 that moves the moving body 92 or the pressing member % against the panel carrying surface 34, and the supporting plate 96 that supports the same. In the example of the figure, the moving body 92 has a branch shape extending in the up and down direction. The pressing member 90 is another member by the mounting pin 98 so that the moving body & portion can be rotated about a line extending in the x direction. — The support plate 9 6 is attached to the moving piece 3 of the panel bearing portion 18
第1片部30a之上面之一斜站、若1ΛΛ-r A 對執道100可移動於第1片部30a 之長邊方向(X方向或γ方向)之方式組裝。兩軌道 1片部30a之寬度方向(γ方士 ^ 门以方向或X方向)相距—間隔平行延 伸於長邊方向(X方向或γ方向)。 如圖7至圖1〇所示,支承板96係藉由導引件10”且 裝於一軌道100’且裝栽於另-軌道100之上面。因此,一 軌道100:用=導轨。另—執道100’在X方向(或Υ方向) 之複數個部位分別具備在上方開放之母螺孔⑽。 19 201043983 在另一軌道100,裝載1 ^ ε 取具有延伸於X方向(或Υ方向) 之長孔106之帶狀擋模1〇8, ^ 1無法相對移動地設於支承板 96。擋模1〇8,從上方插入再 長孔106’藉由螺合於母螺孔1〇4 之螺栓110,可解除地安裝 文衷於另一軌道1〇〇。藉此,各支承 板96,可解除地固定於\方向(或γ方向)之既定位置。 上述結果,推進器機構8〇, 84及定位機構% %分別 可解除地固定於又方向(或γ方向)之既定位置。因此,另 軌道100作用為將推進器機構及定位機構於X方向(或 γ方向)之位置可解除地固定之固定軌道。 然而,推進器機構及定位機構於χ方向(或γ方向)之 位置,可藉由改變螺合螺栓110之母螺孔104與對螺拴110 之擋模108之位置,依據被檢查體12之種類、尺寸等選擇。 各驅動機構94,具備在支承板96之寬度方向(γ方向 或X方向)相距一間隔延伸於支承板96之長邊方向(X方向 或Υ方向)之一對軌道112、以可移動於支承板96之寬度方 向之方式嵌合於各軌道112之滑件114、連結兩滑件114之 連結板116、及使按壓構件90移動於支承板96之寬度方向 之驅動源11 8。 滑件114係安裝於連結板116之下面。驅動源118係 安裝於支承板96之上面。移動體92係以豎立狀態安穿於 連結板1 16之上。然而,使移動體92與連結板116為〜 ’_丨— 構造亦可。 如圖9及圖10所示,推進器機構8〇,84之各驅私、. Π 8 ’係使用空氣壓汽缸或油壓汽缸之流體壓汽缸機構。此 20 201043983 汽缸機構,其汽缸安裝於支承板96,活塞桿連結於滑件114。 因此推進器機構80,84之各驅動機構94,藉由驅動 源118使滑件114相對第2片部幾進退,據以使按壓構 件96相對面板承載面34或被檢查冑12進退於X方向或γ 方向。 〇One of the upper surfaces of the first piece portion 30a is obliquely positioned, and if 1ΛΛ-r A is attached to the longitudinal direction (X direction or γ direction) of the first piece 30a. The width direction of the two track portions 30a (the γ square door is in the direction or the X direction) is spaced apart from each other in the longitudinal direction (X direction or γ direction). As shown in Fig. 7 to Fig. 1A, the support plate 96 is mounted on a rail 100' by a guide member 10'' and mounted on the other rail 100. Therefore, a rail 100: uses a guide rail. In addition, the obstruction 100' has a female screw hole (10) opened at a plurality of positions in the X direction (or the Υ direction). 19 201043983 In another track 100, loading 1 ^ ε takes an extension in the X direction (or Υ The belt-shaped stopper die 1〇8, ^1 of the long hole 106 of the direction) is not movably provided on the support plate 96. The stopper die 1〇8 is inserted into the long hole 106' from above by screwing into the female screw hole 1 The bolt 110 of the crucible 4 is releasably attached to the other rail 1〇〇. Thereby, each of the support plates 96 is releasably fixed at a predetermined position in the \ direction (or the γ direction). 8〇, 84 and the positioning mechanism %% are respectively releasably fixed to the predetermined position in the direction of the direction (or the γ direction). Therefore, the other track 100 acts to position the thruster mechanism and the positioning mechanism in the X direction (or the γ direction). Removable fixed rail. However, the thruster mechanism and positioning mechanism are in the χ direction (or γ direction) The position can be selected by changing the position of the female screw hole 104 of the screw bolt 110 and the retaining die 108 of the threaded bolt 110, depending on the type, size, etc. of the object to be inspected 12. Each of the driving mechanisms 94 is provided on the support plate 96. One direction of the width direction (γ direction or X direction) extending in the longitudinal direction (X direction or the Υ direction) of the support plate 96 is fitted to each of the rails 112 so as to be movable in the width direction of the support plate 96. The slider 114 of the rail 112, the connecting plate 116 connecting the two sliders 114, and the driving source 11 for moving the pressing member 90 in the width direction of the supporting plate 96. The slider 114 is attached to the lower surface of the connecting plate 116. The 118 series is mounted on the upper surface of the support plate 96. The movable body 92 is placed on the connecting plate 16 in an upright state. However, the moving body 92 and the connecting plate 116 may be configured as a ''丨-structure. As shown in Fig. 10, each of the thruster mechanisms 8A, 84 is smuggled, and the Π8' is a fluid pressure cylinder mechanism using an air pressure cylinder or a hydraulic cylinder. The 20 201043983 cylinder mechanism is mounted on the support plate 96. The piston rod is coupled to the slider 114. Therefore, the thruster machine The driving mechanisms 94 of the 80, 84 drive the slider 114 forward and backward relative to the second sheet by the driving source 118, so that the pressing member 96 advances and retreats in the X direction or the γ direction with respect to the panel bearing surface 34 or the inspected crucible 12. 〇
如圖7及圖8所示,定位機構82, 86之各驅動源118, 係使用脈衝馬達般可控制旋轉角度位置之馬達。因此,定 位機構82, 86之各驅動機構94進一步具備從對應之驅動源 118延伸於支承板96之寬度方向(X方向或Y方向)、藉由 對應之驅動源118旋轉之滾珠螺桿12〇,及螺合於滾珠螺桿 120之螺帽122。螺帽122係安裝於連結板ιΐ6。 定位機構82, 86之各驅動機構94,係藉由驅動源ιΐ8 使滾珠螺桿120旋轉,據以使螺帽122相對第2片部3〇b 進退’藉此使按壓構件96相對面板承載面34或被檢查體 12進退於(X方向或γ方向)。 如圖20所示’推進器機構8〇, 84之各驅動源(汽紅機 構)U8係藉由閥裝置128選擇性連接於二個壓力流體源124 126。壓力流體源124, 126儲存具有彼此不同壓力之經壓縮 之空氣或油般之壓力流體。 ----穴明柯™叫驅動衷置128選擇性驅動之複 數個閥件。閥裝置,128内之各關林孫益山0日 <合閱件係藉由閥驅動裝置129 選擇性驅動,將推進器機構8G,84之驅動源ιΐ8之一個選 :性連接於壓力流體源m,126。藉此,上述汽缸機構之活 赛桿相對汽缸進退,使按壓構件96相對面板承載面34或 21 201043983 被檢查體12進退。 又,如圖20所示,定位機構82, %之各驅動源(可控制 位置之馬達)118,係藉由馬達驅動裝置13〇驅動,藉由對應 之按壓構件96決定被檢查體12在χ方向(或γ方向)之基 準位置。各基準位置係藉由被檢查體12之種類、尺寸等預 先決定。 具有上述構造之對準裝置,如圖2〇所示,使χ方向用 之定位機構86之按壓構件96進退於χ方向,維持被 體12在Χ方向之基準位置’且藉由χ方向用之推進器機構 84之按壓構件96使被檢查體12相對χ方向用之定位機構 86之按壓構件96按壓。藉此,被檢查體12在乂方向對準。 被檢查體12在Υ方向之對準,係藉由使γ方向用之定 位機構82, 82及Υ方向用之推進器機構8〇, 8〇進行上述動 作來進行。 被檢查體12在繞延伸於ζ方向之0軸線之對準,如圖 21所不,可藉由使γ方向用之定位機構82,以及γ方向用 之推進器機構80, 84之按壓構件9〇分別移動於箭頭所示方 向來進行。 進行上述對準時,各推進器機構之驅動源係連接於壓 力低之壓力流體源124。藉此,被檢查體12係被按壓構件 90以較弱力量挾持。其結果,被檢查體12與按壓構件⑽ 碰撞時作用於被檢查體12之衝擊小,可防止起因於該衝擊 之被檢查體12之破損。 對準之期間,被檢查體丨2係藉由圖丨8及圖丨9所示之 22 201043983 浮起裝置36,從面板承載面 被檢查體12順剎狡& 洋起。因此’進行對準時, 如上、f移動,可進行正確之對準。 如上述,進行對準時夂 被檢查體12之基準位、,’定位機構之按壓構件90決定 係以至少在其移動方向^ ^各定位機構之按壓構件90 不易磨耗或不會磨耗 (變形或不會彈性變形、或 藉此t 如硬質樹脂製作。 藉此,定位機構之按壓構件9 進器機構之按魔構件 P使被檢查體12被推 ΟAs shown in Figs. 7 and 8, each of the drive sources 118 of the positioning mechanisms 82, 86 is a motor that can control the rotational angular position using a pulse motor. Therefore, each of the drive mechanisms 94 of the positioning mechanisms 82, 86 further includes a ball screw 12A that extends from the corresponding drive source 118 in the width direction (X direction or Y direction) of the support plate 96 and is rotated by the corresponding drive source 118. And screwed to the nut 122 of the ball screw 120. The nut 122 is attached to the web ι 6 . Each of the driving mechanisms 94 of the positioning mechanisms 82, 86 rotates the ball screw 120 by the driving source ι8, so that the nut 122 advances and retreats relative to the second piece 3b", thereby causing the pressing member 96 to face the panel bearing surface 34. Or the object to be inspected 12 advances and retreats (in the X direction or the γ direction). As shown in Fig. 20, the respective drive sources (vapor red bodies) U8 of the pusher mechanisms 8A, 84 are selectively coupled to the two pressurized fluid sources 124 126 by valve means 128. The pressurized fluid sources 124, 126 store compressed air or oil-like pressure fluids having different pressures from each other. ---- Acer MingkeTM is called a multi-valve valve driven by 128 selective drive. The valve device, each of the Guanlin Sun Yishan 0ths in the 128th is selectively driven by the valve driving device 129, and one of the driving sources ι 8 of the thruster mechanisms 8G, 84 is selectively connected to the pressure fluid source. m, 126. Thereby, the piston rod of the above-described cylinder mechanism advances and retracts relative to the cylinder, and the pressing member 96 advances and retreats with respect to the panel bearing surface 34 or 21 201043983. Further, as shown in Fig. 20, the respective driving sources (motors of the controllable position) 118 of the positioning mechanism 82, % are driven by the motor driving device 13A, and the corresponding pressing member 96 determines that the object to be inspected 12 is in the crucible. The reference position of the direction (or γ direction). Each of the reference positions is determined in advance by the type, size, and the like of the object 12 to be inspected. The alignment device having the above-described configuration, as shown in FIG. 2A, causes the pressing member 96 of the positioning mechanism 86 for the χ direction to advance and retreat in the χ direction, maintain the reference position of the body 12 in the Χ direction, and is used by the χ direction. The pressing member 96 of the pusher mechanism 84 presses the pressing member 96 of the positioning mechanism 86 for the inspection object 12 with respect to the squatting direction. Thereby, the object to be inspected 12 is aligned in the x direction. The alignment of the test object 12 in the Υ direction is performed by the positioning mechanisms 82, 82 for the γ direction and the pusher mechanisms 8 〇 8 〇 for the Υ direction. The inspection body 12 is aligned with respect to the 0 axis extending in the x-direction, as shown in Fig. 21, by the positioning mechanism 82 for the γ direction, and the pressing member 9 for the γ direction of the pusher mechanism 80, 84. 〇 Move in the direction indicated by the arrow. When the alignment is performed, the driving source of each of the thruster mechanisms is connected to the pressure fluid source 124 having a low pressure. Thereby, the object to be inspected 12 is held by the pressing member 90 with a weak force. As a result, the impact applied to the test object 12 when the test object 12 collides with the pressing member (10) is small, and damage of the test object 12 due to the impact can be prevented. During the alignment, the object to be inspected 2 is lifted from the panel bearing surface by the 22 201043983 floating device 36 shown in Figs. 8 and 9 . Therefore, when alignment is performed, as above, f is moved, and correct alignment can be performed. As described above, when the alignment is performed, the reference position of the object 12 to be inspected, and the pressing member 90 of the positioning mechanism is determined to be at least in the moving direction thereof. The pressing member 90 of each positioning mechanism is not easily worn or worn (deformed or not) It is elastically deformed, or is made of, for example, a hard resin. Thereby, the pressing member P of the pressing member 9 of the positioning mechanism pushes the object 12 to be inspected.
驅動源亦可維持基準位 …達作為 變形即可決定作為㈣源之馬達之 ^ 置控制容易。 囚此馬達之位 動源之 位機構 然而’考慮㈣構件9G之彈性變形決^作為驅 馬達之旋轉量之情形1可彈性變形之材料製作定 之按壓構件90亦可。 =對於此’推進器機構之按壓構# %,可為具有不使 3 —體12破損之程度之高度之樹脂般材料。因此,推進 器機構之_構件9Q ’為不會彈性變形之材料及會彈性變 形之材料之任一者皆可。 被檢查體12藉由推進器機構8〇, 84按壓於定位機構“ 86之按壓構件90時,滾珠螺捍12〇與螺帽122係藉由該等 間之摩擦力,只要在驅動源118不被驅動之情況下,可阻 止定位機構82, 86之按壓構件90之後退。藉此,用於定位 之基準位置不會位移。 如上述,定位機構82, 86之各驅動機構94將按壓構件 23 201043983 90在X方向或γ方向之前進終端位置維持成可變更及可解 除。X方向、Υ方向及繞0轴線之對準結束之狀態係如圖 16及圖17所示。 對準結束後,各推進器機構之驅動源係連接於壓力高 之壓力流體源126。藉此,被檢查體12係被按壓構件90以 較強力量挾持。被檢查體12在點燈測試結束之前,維持被 按壓構件90強力挾持之狀態。 (關於探針單元) 如圖7、圖11等所示,各探針單元2〇包含沿著矩形之 邊(X方向或Υ方向)延伸且支承於單元支承機構22之板狀 支承基座132,在支承基座132之長邊方向相距一間隔、安 裝於支承基座132之複數個支承塊134,以可在ζ方向移動 之方式支承於各支承塊134之移動塊136,及安裝於各移動 塊136之探針塊138。 支承基座132係藉由複數個螺桿構件(未圖示)可移除 地安裝於單元支承機構22之上面。各支承塊134具有從其 上端部突出至面板承載面34側之突出部。 各移動塊136係藉由設於支承基座132之前側(開口 32 之側)延伸於上下方向之軌道140、及以可移動於軌道ι4〇 之上下方向之方式結合之導引件142,組裝於支承基座 132,且可藉由在上下方向貫通支承塊134之上述突出部、 螺合於移動塊144之調整螺桿144調整在上下方向之位置。 各探針塊138’如圖9及圖11所示,具有在X方向或 Y方向相距一間隔排列之複數個接觸子146,且在將該等接 24 201043983 1 子146之針尖朝向面板承載部以狀態下支承於移動塊 (單元支承機構) 如圖7、圖9、圖11 圖15等所示,單元支承機構22 ,、備置於面板承載部18之第1片部30a、延伸於第!片 長邊方向之板狀移動體承載件㈣,配置於移動體 承載件150之第1銘勤薇 移動體152’以可移動於相對面板承載面 ΟThe drive source can also maintain the reference position. As a variant, it is easy to control the motor as the (4) source. In this case, the positional mechanism of the motor is used. However, the elastic deformation of the member 9G is considered as the case where the amount of rotation of the motor is used. = The resin structure #% of the 'propeller mechanism' may be a resin-like material having a height that does not damage the body 12. Therefore, the member 9Q' of the pusher mechanism is either a material that does not elastically deform and a material that is elastically deformable. When the object to be inspected 12 is pressed against the pressing member 90 of the positioning mechanism "86" by the pusher mechanism 8, the ball screw 12 and the nut 122 are frictional with each other as long as the driving source 118 does not When driven, the pressing members 90 of the positioning mechanisms 82, 86 can be prevented from retreating. Thereby, the reference position for positioning is not displaced. As described above, each of the driving mechanisms 94 of the positioning mechanisms 82, 86 will press the member 23. 201043983 90 The position of the terminal in the X direction or the γ direction is maintained and can be changed. The state in which the alignment of the X direction, the Υ direction and the 0 axis is completed is as shown in Fig. 16 and Fig. 17. The driving source of each of the pusher mechanisms is connected to the pressure fluid source 126 having a high pressure. Thereby, the object to be inspected 12 is held by the pressing member 90 with a strong force. The object to be inspected 12 is maintained before the end of the lighting test. The pressing member 90 is in a state of strong holding. (About the probe unit) As shown in FIGS. 7 and 11 and the like, each of the probe units 2 includes extending along the side of the rectangle (X direction or Υ direction) and supported by the unit supporting mechanism. 22-plate support base 132, at A plurality of support blocks 134 mounted on the support base 132 at a distance from the longitudinal direction of the susceptor 132 are supported by the moving block 136 of each support block 134 so as to be movable in the ζ direction, and are mounted on the moving blocks. The probe block 138 of 136. The support base 132 is removably mounted on the unit support mechanism 22 by a plurality of screw members (not shown). Each support block 134 has a protrusion from its upper end to the panel bearing surface. The protruding portion on the 34 side. Each moving block 136 is coupled to the rail 140 extending in the up and down direction on the front side (the side of the opening 32) of the support base 132, and is coupled to the upper and lower directions of the rail ι4〇. The guide 142 is assembled to the support base 132, and can be adjusted in the vertical direction by the protruding portion penetrating the support block 134 in the vertical direction and the adjusting screw 144 screwed to the moving block 144. As shown in FIG. 9 and FIG. 11, a plurality of contact 146 are arranged at a distance from each other in the X direction or the Y direction, and are supported by the tip of the connection 24 201043983 1 146 toward the panel carrying portion. Moving block Mechanism, as shown in FIG. 7, FIG. 9, FIG. 11, FIG. 15, etc., the unit support mechanism 22, the first piece 30a provided in the panel carrying portion 18, and the plate-shaped moving body carrier extending in the longitudinal direction of the first piece (4) The first Mingqin moving body 152' disposed on the moving body carrier 150 is movable to the opposite panel bearing surface Ο
G 34傾斜之方向之方式結合於第i移動體152之第2移動體 B4,安裝於第2移動體154 <上端邵之頂板156,使第1 移動體152朝第1片部30a之寬度方向移動之探針移動機構 及規定帛2移動體154之前進終端位置(開口 32側之 位置)之制動件160。 移動體承載件15〇係藉由在移動體承載件15〇之寬度 方向相距-間隔、平行延伸於移動體承龄15〇之長邊方 向(X方向或以向)之狀態下設於第1片部30a之-對或複 數對軌道162及以可移祕各減162之長邊方向之方式 支承於各軌道162且組裝於移動體承載件15〇之下側之導 引件⑹,結合於第i片部30a之上。因此,移動體承载件 150可移動於第i片部3〇a之長邊方向。 第1移動體152係藉由在移動體承載件丨5〇(第丨片部 30a)之長邊方向相距一間隔、平行延伸於移動體承载件I” 之寬度方向之狀態下設於移動體承載件15〇之一對執道166 及以可移動於各軌道166之長邊方向之方式支承於各軌道 166且組裝於第i移動體152之下側之導引件168,結合於 25 201043983 因此,第1移動體152可移動於 片部30a)之寬度方向。 移動體承載件150之上。 移動體承載件15〇(或第1 第1及第2移動體152及154,斜向結合於面板承載面 34 ’以使第2移動體154位於面板承載面34之侧。因此, 第1及第2移動體152及154,分別具有朝向斜下之面及朝 向斜上之面。第2移動體154延伸於第i片部I之長邊方 向’且以愈上部愈接近面板承載面34之側之方式斜向延伸。 又,第2移動體154係藉由設於第i移動體152之朝 向斜下之面、在第1片部30a之長邊方向相距一間隔、平行 延伸於第i片部30a之寬度方向之一對軌道17〇及以可移動 於各軌道170之長邊方向之方式結合於各軌道17〇且設於 第2移動體154之朝向斜下之面之導引件π,結合於第【 移動體152。因此,第2移動體154可移動於相對第】移動 體15 2傾斜之方向。 頂板156具有在第1>}部3如之長邊方向較長之長方形 2形狀,且安裝於第2移動體154之頂部。探針單元汕係 文裝於頂板156之上,支承於第2移動體ι54。 各探針移動機構158係使用下述機構,亦即使用設置 於移動體承載件15〇之上面之馬達174,在延伸於χ方向(或 γ方向)之狀態下連結於馬達174'藉由馬冑174旋轉之滾 珠螺桿176,螺合於滾珠螺桿i76之螺帽丨78,及安裝於第 2移動體154、支承螺帽178之結合具18〇之機構。、 馬達174 ’係如脈衝馬達般可將旋轉角度位置維持成可 解除之可控制位置之馬達’且透過拖% 182支承於移動體 26 201043983 承載件150。滚珠螺桿176係連結於馬達174之旋轉轴,且 透過另一拖架184支承於移動體承載件15〇。 又,第1及第2移動體152及154係藉由以延伸於斜 上方在上端開放之方式形成於第1移動體152之孔丨86、及 從上方插入至孔186之桿件188’防止在朝向斜下之面及朝 向斜上之面在垂直方向之相對位移,以及往第1及第2移 動體152及154之長邊方向之相對位移。 第1及第2移動體152及154,係藉由配置於桿件188 〇 之周圍之壓縮螺旋彈簧190,以第i及第2移動體152及 154在桿件188之長邊方向分離之方式相對彈壓。實際上, 第1移動體152係藉由軌道166及導引件168防止往桿件 188之長邊方向之位移,因此第2移動體154係藉由彈簧 190往斜上方彈壓。 又,如圖11所示,單元支承機構22具備設於第1及 第2移動體152及154之制動件191及193,以規定第2移 動體154之上升終端位置^制動件191及193,以第2移動 0體154上升時彼此抵接、阻止第2移動體154之上升之方 式,分別設於第1及第2移動體152及154之朝向斜下之 面及朝向斜上之面。 在上述單元支承機構22,第1移動體152藉由馬達174 .之正轉移動向被檢查體12時’第2移動體154亦移動向相 同方向。此時’使第2移動體154抗衡彈簧19〇之彈壓力 位移至斜下方之位移產生機構〗92(參照圖7、圖11、圖13 等)係設於第2移動機構154。 · 27 201043983 如圖7、圖11所示,位移產生機構192具備設於第2 多:體154之被檢查體12之侧之朝向斜下之面之口字狀之 拖架194 &以可繞延伸於第2移動體…之長邊方向之軸 本旋轉及可抵接於制動彳⑽之方式安裝於拖架Μ 196。 在單疋支承機構22,第1及第2移動體152及154藉 由馬達174移動向被檢查體12時,輥196抵接於制動件“ο。 第1及第2移動體152& 154藉由馬達174進一步移 動向被檢查體12時’第2移動體154之前進藉由制動件⑽ 阻止後,在軌道17〇及導引件172之嵌合部產生使第2移 動體154位移至斜下方之位移力。 藉由上述位移力,隨著第1移動體152之進一步前進, 第2移動體154移動至下方。其結&,探針單元2〇移動至 下方,探針塊138所具備之接觸子之針尖按壓於被檢查體 12之電極。 此時,被檢查體12,由於藉由按壓構件9〇以較強力量 挾持且吸附於面板承載面34,因此即使接觸子之針尖按壓 於被檢查體12之電極,亦可確實防止被檢查體12相對面 板承載部18及探針單元20位移。 在上述狀態下,馬達174反轉時,在輥丨%抵接於制 動件160之狀態下,第i移動體152相對面板承載面“及 第2移動體154後退。此段期間,第2移動體154藉由彈 菁190之力量相對第丨移動體152上升,與被檢查體^在 上方分離。 28 201043983 馬達174進一步反轉時’第1移動體152持續後退。 然而’第2移動體154,由於制動件193抵接於制動件ι91 而停止上升,在此狀態下與第1移動體152 一起相對面板 承载面34後退至退開位置。 如上述,第2移動體154及探針塊138,相對面板承載 面34及被檢查體12,藉由馬達ι74之正轉前進及下降,在 前進及下降之位置維持成可解除,又,藉由馬達174之反 轉上升及後退’在退開位置維持成可解除。The direction in which the G 34 is inclined is coupled to the second movable body B4 of the i-th movable body 152, and is attached to the second movable body 154 < the upper end of the top plate 156, and the first movable body 152 is oriented to the width of the first piece 30a. The probe moving mechanism that moves in the direction and the brake member 160 that defines the 帛2 moving body 154 before entering the end position (the position on the opening 32 side). The moving body carrier 15 is provided in the first direction in the longitudinal direction (X direction or in the direction of the moving body 15 相) in the width direction of the moving body carrier 15〇. a pair of pairs or a plurality of pairs of tracks 162 and a guide member (6) supported on each of the rails 162 and fixed to the lower side of the movable body carrier 15A in a longitudinal direction of the movable portion 162, combined with Above the i-th piece 30a. Therefore, the moving body carrier 150 can be moved in the longitudinal direction of the i-th piece 3a. The first movable body 152 is provided on the movable body in a state in which the longitudinal direction of the movable body carrier 丨5〇 (the first piece portion 30a) is spaced apart from each other and extends in parallel in the width direction of the movable body carrier I". One of the carrier 15 对 is supported by the trajectory 166 and the guide 168 is mounted on each of the rails 166 so as to be movable on the lower side of each of the rails 166 and is assembled to the lower side of the ith moving body 152, and is coupled to 25 201043983. Therefore, the first moving body 152 can be moved in the width direction of the sheet portion 30a) on the moving body carrier 150. The moving body carrier 15 (or the first and second moving bodies 152 and 154, obliquely coupled) The panel carrying surface 34' is such that the second moving body 154 is located on the side of the panel carrying surface 34. Therefore, the first and second moving bodies 152 and 154 each have a surface that faces obliquely downward and a surface that faces obliquely. The moving body 154 extends in the longitudinal direction ' of the i-th piece I and extends obliquely so that the upper portion is closer to the side of the panel receiving surface 34. Further, the second moving body 154 is provided on the i-th moving body 152. The surface facing obliquely downward is spaced apart from the i-th portion 3 in the longitudinal direction of the first sheet portion 30a. One of the width directions of 0a is coupled to the track 17A and the guide member π which is disposed on each of the tracks 17A so as to be movable in the longitudinal direction of each of the tracks 170, and is disposed on the face of the second moving body 154 which is inclined downward. The second movable body 154 is movable in the direction in which the opposite movable body 15 2 is inclined. The top plate 156 has a rectangular shape 2 which is long in the longitudinal direction of the first > And attached to the top of the second movable body 154. The probe unit is mounted on the top plate 156 and supported by the second movable body ι 54. Each of the probe moving mechanisms 158 uses the following mechanism, that is, The motor 174 on the upper side of the moving body carrier 15 is coupled to the motor 174' in a state of being extended in the χ direction (or the γ direction). The ball screw 176 rotated by the stirrup 174 is screwed to the nut of the ball screw i76.丨78, and a mechanism that is attached to the second movable body 154 and the coupling nut 178 of the support nut 178. The motor 174' is a motor that can maintain the rotational angle position as a detachable controllable position like a pulse motor. Supported by the mobile body 26 through the drag 182 150. The ball screw 176 is coupled to the rotating shaft of the motor 174, and is supported by the moving body carrier 15A through the other carriage 184. Further, the first and second moving bodies 152 and 154 are extended by obliquely upward. The hole 丨 86 formed in the first movable body 152 at the upper end and the rod 188 ′ inserted into the hole 186 from above prevent relative displacement in the vertical direction on the face facing obliquely and obliquely upward, and The relative displacement in the longitudinal direction of the first and second moving bodies 152 and 154. The first and second moving bodies 152 and 154 are separated by the compression coil spring 190 disposed around the rod member 188, and the i-th and second moving bodies 152 and 154 are separated in the longitudinal direction of the rod member 188. Relative pressure. Actually, the first movable body 152 is prevented from being displaced in the longitudinal direction of the rod 188 by the rail 166 and the guide 168, so that the second movable body 154 is biased upward by the spring 190. Further, as shown in FIG. 11, the unit support mechanism 22 includes brake members 191 and 193 provided in the first and second movable bodies 152 and 154 to define the ascending end positions of the second movable body 154, and the brake members 191 and 193. When the second moving body 154 is raised and abuts against each other, and the second moving body 154 is prevented from rising, the first and second moving bodies 152 and 154 are disposed obliquely downward and upwardly. In the unit support mechanism 22, when the first movable body 152 moves toward the test object 12 by the forward rotation of the motor 174, the second movable body 154 also moves in the same direction. At this time, the displacement generating mechanism 92 (see Figs. 7, 11, 13 and the like) for shifting the elastic force of the second movable body 154 against the spring 19 is attached to the second moving mechanism 154. 27 201043983 As shown in FIG. 7 and FIG. 11 , the displacement generating mechanism 192 includes a mouth-shaped trailer 194 & which is provided on the side of the second object body 154 on the side of the object 12 to be inspected obliquely downward. The trailer Μ 196 is attached to the trailer 10 (10) so as to be rotatable about the longitudinal direction extending in the longitudinal direction of the second moving body. In the single-turn support mechanism 22, when the first and second movable bodies 152 and 154 are moved toward the test object 12 by the motor 174, the roller 196 abuts against the brake "o. The first and second movable bodies 152 & 154 borrow When the motor 174 is further moved toward the test object 12, the second movable body 154 is prevented from being displaced by the brake member (10), and the second movable body 154 is displaced to the oblique portion at the fitting portion of the rail 17 and the guide 172. Displacement force below. With the above displacement force, as the first moving body 152 advances further, the second moving body 154 moves to the lower side. The knot & the probe unit 2〇 moves to the lower side, and the probe block 138 The needle tip of the contact is pressed against the electrode of the subject 12. At this time, the subject 12 is held by the pressing member 9 〇 with a strong force and is attracted to the panel bearing surface 34, so that even the tip of the contact is pressed. The electrode of the test object 12 can also reliably prevent the test object 12 from being displaced relative to the panel carrier portion 18 and the probe unit 20. In the above state, when the motor 174 is reversed, the roller 丨% abuts against the brake member 160. In the state, the i-th moving body 152 is opposite to the panel bearing surface "and the second The moving body 154 moves backward. During this period, the second moving body 154 rises relative to the second moving body 152 by the force of the elastic 190, and is separated from the object to be inspected. 28 201043983 When the motor 174 is further reversed, the first moving body 152 continues to retreat. However, the second movable body 154 stops rising due to the contact of the brake member 193 with the brake member 119, and in this state, the first movable body 152 is retracted to the retracted position with respect to the panel bearing surface 34. As described above, the second movable body 154 and the probe block 138 are held forward and lowered by the forward movement of the motor ι 74 with respect to the panel bearing surface 34 and the test object 12, and are maintained at the forward and downward positions, and The reverse rotation and retreat of the motor 174 are maintained at the retracted position to be released.
在第2移動體154或探針塊138後退至退開位置之狀 態下,對面板承載面34進行被檢查體12之更換。此時, 由於被檢查體丨2從面板承載面34浮起且探針單元汕從面 板承載® 34大幅後iE ’因此容易進行對面板承载面34之 被檢查體12之交接。 (關於攝影機裝置) 如圖至圖13等所示,各攝影機裝置24具備 支承於探針單元20之支承基座132之倒l字狀之支承塊 、及以從上方拍攝標記部(未圖示)之 2〇〇之攝影機202。 & δ己邵係設於被檢 你 子之針尖等。攝影機202拍攝被檢查:二特定之接觸 盔姦吐爭你 上 12之標記部附近, 為產生影像訊號之視訊攝影機般 ⑽區域感測器。 域感測器,可使用 各攝影機202之輸出訊號,在未 與徬泠w & 圖7^之控制裝置進行 〜像處理,使用於求出被檢查體12 詞·測4裝置1〇、特別 29 201043983 是面板承載部18或探針單元2〇等之位置偏移。求出之位 置偏移係使用為使上述對準裝置驅動之訊號。 (關於角度調整裝置) 如圖15所不’各單元支承機構22進一步包含使移動 體承載件150移動於其長邊方向,將相對面板承載部18之 方向(或Y方向)之位置維持成可解除之角度調整裝置。 上述角度調整裝置具備以使支承基座132可繞相對頂 板156延伸於z方向之軸線角度性旋轉之方式支承於頂板 156之結合軸2〇6,固定於頂板之長邊方向之端部上面之螺 帽遞’及螺合於螺帽208、將支承基座132之長邊方向之 端部後面按壓至X方向(或γ方向)之一對調整螺桿加。 在上述角度調整裝置,使兩調整螺桿210對螺帽2〇8 之螺入量-者大-者小時,支承基座132繞結合軸2〇6角 度性旋轉,相對頂板156位移。因此,藉由調整兩調整螺 桿21〇對螺帽扇之螺入量,可調整支承基座132相對對 應之移動片30之姿勢。 (關於單元位置調整裝置) 如圖丨2、圖13、圖15等所示,探針單元“藉由單元 位置調整裝置相對面板承載部18之移動片3〇移動至X方 向(或Υ方向),調整在X方向(或γ方向)之位置。 圖示之例中,單元位置調整裝置包含配置於第1片邱 術之可控制位置之馬達212、藉由馬達212旋轉之滚珠螺 桿214、螺合於滾珠螺桿214之螺帽216、及結合於螺帽 與移動體承載件150之結合具218。 ' 30 201043983 馬達212正轉時,藉由螺帽216移動於χ方向(或γ 向)’移動體承載件150移動於相同方向。馬達212反轉時, 藉由螺帽216移動於Υ方向(或X方向)’移動體承載件150 藉此,移動體承載件150或探針單元2〇相對移動片扣 之X方向(或Υ方向)之位置被調整,可解除地維持在該位 置,因此能使各接觸子146之針尖與被檢查體12 = 實接觸。 啼 ❹When the second movable body 154 or the probe block 138 is moved back to the retracted position, the panel receiving surface 34 is replaced with the object 12 to be inspected. At this time, since the object to be inspected 2 floats from the panel bearing surface 34 and the probe unit 承载 is loaded from the panel by a large rear iE ', it is easy to perform the handing over of the object to be inspected body 12 of the panel bearing surface 34. (About the camera device) As shown in FIG. 13 and the like, each of the camera devices 24 includes an inverted l-shaped support block supported by the support base 132 of the probe unit 20, and a marker portion is photographed from above (not shown). 2) camera 202. & δ has been set at the tip of the needle you are examining. The camera 202 is photographed and inspected: two specific contacts, the helmet and the spit, and the video detector-like (10) area sensor for generating video signals near the top of the 12 mark. The domain sensor can use the output signal of each camera 202 to perform image processing on the control device without the 彷泠w & Fig. 7^, and is used to obtain the test object 12 word test 4 device 1 〇, special 29 201043983 is the positional shift of the panel carrier 18 or the probe unit 2 or the like. The position offset obtained is used to drive the above-mentioned alignment device. (About the angle adjusting device) As shown in Fig. 15, the unit supporting mechanism 22 further includes moving the moving body carrier 150 in the longitudinal direction thereof, and maintaining the position in the direction (or the Y direction) of the panel bearing portion 18 to be Lift the angle adjustment device. The angle adjusting device is provided with a coupling shaft 2〇6 supported by the top plate 156 so that the support base 132 can be angularly rotated about an axis extending in the z direction with respect to the top plate 156, and is fixed to the end portion of the top plate in the longitudinal direction. The nut is screwed and screwed to the nut 208, and one end of the end portion of the support base 132 in the longitudinal direction is pressed to one of the X direction (or the γ direction) to the adjustment screw. In the above-described angle adjusting device, when the amount of screwing of the two adjusting screws 210 to the nut 2〇8 is large, the supporting base 132 is angularly rotated about the coupling shaft 2〇6, and is displaced relative to the top plate 156. Therefore, by adjusting the amount of screwing of the two adjusting screws 21 to the nut, the posture of the supporting base 132 relative to the moving piece 30 can be adjusted. (Regarding the unit position adjusting device) As shown in FIG. 2, FIG. 13, FIG. 15, and the like, the probe unit "moves to the X direction (or the Υ direction) by the moving position piece 3 of the panel position adjusting portion 18 by the unit position adjusting device. The position in the X direction (or the γ direction) is adjusted. In the illustrated example, the unit position adjusting device includes a motor 212 disposed at a controllable position of the first piece of Qiu, a ball screw 214 rotated by the motor 212, and a screw. A nut 216 coupled to the ball screw 214 and a coupling 218 coupled to the nut and the moving body carrier 150. ' 30 201043983 When the motor 212 rotates forward, the nut 216 moves in the χ direction (or γ direction) The moving body carrier 150 moves in the same direction. When the motor 212 is reversed, the nut carrier 150 is moved by the nut 216 in the Υ direction (or X direction), whereby the moving body carrier 150 or the probe unit 2 〇 The position of the X-direction (or the Υ direction) relative to the moving piece is adjusted to be releasably maintained at this position, so that the tip of each contact 146 can be brought into contact with the object to be inspected 12 = 啼❹.
Q (關於測試裝置之動作) 如圖22(A)所示,測試裝置1〇,在各探針單元2〇、 第2移動體92、各第2移動體154後退之狀態下,從上方 進行對面板承載部18之被檢查體12之交接。 接著,如圖15(B)所示,各按壓構件9〇前進進行對 且探針塊138前進各接觸子之針尖移動至被檢查體η之電 極上方。此段期間,推進器機構8(),84分別藉由低流體魔 力作動,防止被檢查體1 2之破損。 接著,如圖15(C)所示,各探針塊138下降各接觸子之 針尖㈣於被檢查體12之電極。此段期間,推進器機構8〇 84分別藉由高流體壓力作動,防止被檢查體12之位移。在 此狀態下’使被檢查體12通電,進行被檢查體12 測試。 ‘’足 上述點燈測試,為作業員從上方目視被檢查體12之目 視點燈測試亦可’為使用視訊攝影機般區域感測器且在控 制裝置進行影像處理之自動點燈測試亦可。 31 201043983 點燈測試之期間’被檢查體12係 且藉由接料146㈣於面板㈣面34 =保持 48連接於減壓槽56亦可 將開放部 J此時,不需要減壓槽56。 結束電氣測試後,各探針單元2〇、各第!移動體152、 各第2移動體154後退至圖22 V 7 0 丁 ^位置,被檢杳縣】2 從面板承載面34浮起後,谁杆斟$4£; 7 饱宜體12 體12之交接。 進仃對面板承載…被檢查 (另一實施例) 參㈣24,測試裝置25G,作為使面板承 :早:20移動於彼此接近分離方向之上下移動機構,“ 使用以使面板承載部18移動於上下方向 式藉由支柱26支承台座丨6之ζ載台ay。 Ζ載台252係所謂一般之升降機構,替代平纟 裝置之架台25所支承。背光單元28係裝载於Ζ载台252。 探針單元20係透過使探針單元2〇 台254支承於架台25。 Υ面内移動之探針載 測試裝置250,使面板承載部18藉由ζ載台2 探針單元2G上下移動,除了使各 、 台254尤町早70 20藉由探針載 4在ΧΥ面内移動之點外’與測試裝置 同樣地使用。 W用相冋且 (對準之另一實施例) 替代測試裝置250之Ζ載台252、或除 習知測試裝置相同,具備使面板承載部18移動於:、卜U Ζ方向之機構、繞θ轴線角度性旋轉之機構等之情形,探針 32 201043983 單元2〇與被檢查體12之對準藉由上述以外之方法進行亦 可。以下,針對此種對準之例進行說明。 • 具備0移動機構之情形,在藉由推進II機構80,84及 定位機構82, 86保持被檢查體12之狀態下,使被檢查體12 繞Θ軸線角度性旋轉,且使面板承載部川與兩探針單元 一起藉由移動片移動機構74般適當之機構移動於χ方向或 Υ方向。 具備β移動機構與丫移動機構之情形,如圖25所亍, 〇在藉由推進器機構80,84及定位機構82,86保持被檢查體 12之狀態下’使被檢查體12藉由0移動機構繞θ轴線角度 性旋轉’且藉由Υ移動機構使被檢查體12相對兩探針單元 20位移於Υ方向,接著使兩探針單元20相對被檢查體12 移動於X方向。 具備β移動機構與Χ移動機構之情形,在藉由推進器 機構80, 84及定位機構82,86保持被檢查體12之狀態下, 使被檢查體12藉由0移動機構繞0軸線角度性旋轉,且藉Q (action of the test apparatus) As shown in Fig. 22 (A), the test apparatus 1 is moved from above in a state where each of the probe unit 2, the second movable body 92, and each of the second movable bodies 154 is retracted. The transfer of the object 12 to be inspected by the panel carrier 18. Next, as shown in Fig. 15(B), each of the pressing members 9 is advanced and the tip of each contact of the probe block 138 is moved to the upper side of the electrode of the subject η. During this period, the pusher mechanisms 8(), 84 are respectively actuated by the low fluid magic to prevent breakage of the object to be inspected. Next, as shown in Fig. 15(C), each probe block 138 lowers the tip (4) of each contact to the electrode of the subject 12. During this period, the pusher mechanisms 8〇84 are respectively actuated by high fluid pressure to prevent displacement of the object 12 to be inspected. In this state, the object 12 to be inspected is energized, and the test object 12 is tested. The above lighting test can be used to visually inspect the object 12 of the object to be inspected from above. It can also be an automatic lighting test using a video camera-like area sensor and performing image processing on the control device. 31 201043983 During the lighting test, the object to be inspected 12 is attached to the pressure reducing groove 56 by the receiving material 146 (four) on the panel (four) surface 34 = the holding portion 48. The opening portion J is not required. After the electrical test is completed, each probe unit is 2〇, each! The moving body 152 and each of the second moving bodies 154 are retracted to the position of V 7 0 in Fig. 22, and the inspected county 2 is lifted from the panel bearing surface 34, and the rod is 斟$4 £; 7 satisfies the body 12 body 12 Handover. Carrying in the panel bearing ... is inspected (another embodiment) Ref. (4) 24, test device 25G, as the panel bearing: early: 20 moves closer to each other in the direction of separation, moving the mechanism, "used to move the panel carrier 18 to The up-down direction supports the yoke ay of the pedestal 6 by the struts 26. The cymbal 252 is a so-called general elevating mechanism supported by the gantry 25 of the rafter. The backlight unit 28 is mounted on the cymbal 252. The probe unit 20 is configured to support the probe unit 2 on the gantry 25 by the probe unit 2. The probe-carrying unit 250 moves the probe-carrying unit 18 up and down by the cymbal stage 2 probe unit 2G. Let each station 254 Youcho early 70 20 be used in the same way as the test device by the point where the probe carrier 4 moves within the crucible surface. W is used in conjunction with another embodiment (aligned with another embodiment) instead of the test device 250 The gantry 252 or the like, in addition to the conventional test device, includes a mechanism for moving the panel carrying portion 18 in a direction of the U Ζ direction, a mechanism for angular rotation about the θ axis, and the like, the probe 32 201043983 unit 2 Aligning the 〇 with the object to be inspected by the above Other methods may be used. Hereinafter, an example of such alignment will be described. • In the case where the 0 moving mechanism is provided, the state in which the object to be inspected 12 is held by the advancing II mechanisms 80 and 84 and the positioning mechanisms 82 and 86 The object 12 is angularly rotated about the axis of the object, and the panel bearing portion is moved together with the two probe units by a mechanism suitable for moving the sheet moving mechanism 74 in the χ direction or the Υ direction. In the case of the moving mechanism, as shown in Fig. 25, in the state in which the object to be inspected 12 is held by the pusher mechanisms 80, 84 and the positioning mechanisms 82, 86, the subject 12 is moved by the 0 moving mechanism about the axis of θ. The angular rotation 'and the displacement of the test object 12 relative to the two probe units 20 in the x direction by the movement mechanism, and then the two probe units 20 are moved in the X direction relative to the object 12 to be inspected. In the case of the mechanism, in the state in which the object to be inspected 12 is held by the pusher mechanisms 80, 84 and the positioning mechanisms 82, 86, the object to be inspected 12 is angularly rotated about the 0 axis by the 0 moving mechanism, and borrowed.
由X移動機構使被檢查體12相對兩探針單元2〇位移於X 方向,接著使兩探針單元2〇相對被檢查體12移動於γ 向。 具備0移動機構與ΧΥ移動機構之情形,如圖26所示, 在藉由推進器機構8〇, 84及定位機構82, 86保持被檢查體 12之狀態下,使被檢查體丨2藉由g移動機構繞0軸線角度 ί·生旋轉,且藉由ΧΥ移動機構使被檢查體12相對兩探針單 兀20位移於X方向。此時,不使兩探針單元2〇位移亦可。 33 201043983 替代在面板承載® 34《對向之一對邊中一邊、將一對 推進器機構84在對應邊之延伸方向相距一間隔配置,如圖 27所示配置單一推進器機構84亦可,或雖未圖示,配置三 個以上之推進器機構84亦可。 又,替代在面板承載面34之對向之一對邊中—邊、將 一對推進器機構84在對應邊之延伸方向相距一間隔配置, 如圖28所示,具備在對應邊之方向相距一間隔之複數個按 壓構件90、將該等按壓構件9〇在γ方向(或χ方向)相距一 間隔支承之支承構件260、使支承構件26〇在χ方向或γ 方向位移之驅動源118、及以能使支承構件26〇繞延伸於ζ 方向之軸線旋轉之方式連結支承於驅動源118之樞軸銷262 亦可。 圖28所示之實施例中,各按壓構件9〇係支承於上述 移動體92,且移動體92係支承於支承構件26〇。 (結合機構之另一實施例) 參照圖29,結合機構之另—實施例,使用三對結合構 件 270, 272, 274。 口各結合構件270,與圖5所示之結合構件68相同,以 可移動於Υ方向之方式結合於設在第1滑件64之一對軌道 72且以可移動於Χ方向之方式結合於設在第2滑件66之 —對軌道72。 各結合構件272,以可移動於χ方向之方式結合於設在 第2 '月件66之另一對執道72。各結合構件274,以可移動 γ* . D 式結合於設在第1滑件64之一對軌道72,且 34 201043983 以無法移動之方式安裝於延伸於γ方向之移動片Μ。 延伸於Υ方向之各移動片30,在設於其下面之一對軌 道以可移動於γ方向之方式結合於結合構件27〇,且 以無法移動之方式安裝於結合構件274。 Ο 〇 延伸於X方向之各移動片30,在設於其下面之一對軌 道謂,以可移動於X方向之方式結合於結合構件272 ,且 藉由以無法移動之方式設於下面之一對輔助結合構件⑽ 以可移動於X方向之方式結合於第2滑件66之軌道u。 ,在結合機構之另-實施例,—對滑件心彼此接 近分離方向(X方向)移動時,透過結合構件 1滑件64之一方向之-側移動… -起在彼此接近分離方向(X方向)移動,且使藉由上述鳩尾 槽與鸿尾座等之結合手段連結於該—側移動片⑽之延伸於 X方向之另-侧移動片30隨著該一側移動片3〇之移動移動 於X方向。 又’ -對第2滑件66在彼此接近分離方向(γ方向)移The X-moving mechanism displaces the subject 12 relative to the two probe units 2 in the X direction, and then moves the two probe units 2 to move relative to the subject 12 in the γ direction. In the case where the 0 moving mechanism and the moving mechanism are provided, as shown in Fig. 26, the object to be inspected 2 is caused by the state in which the object to be inspected 12 is held by the pusher mechanisms 8A, 84 and the positioning mechanisms 82, 86. The moving mechanism rotates about the 0-axis angle ί·, and the object to be inspected 12 is displaced relative to the two probes 20 in the X direction by the ΧΥ moving mechanism. At this time, the two probe units 2 may not be displaced. 33 201043983 instead of the panel bearing 34 34 "on one of the opposite sides, the pair of thrusters 84 are arranged at an interval from the direction in which the corresponding sides extend, and a single thruster mechanism 84 may be arranged as shown in FIG. Alternatively, three or more thruster mechanisms 84 may be disposed. Further, instead of one of the opposite sides of the panel bearing surface 34, the pair of pusher mechanisms 84 are arranged at an interval from each other in the extending direction of the corresponding side, as shown in FIG. a plurality of pressing members 90 at intervals, a supporting member 260 that supports the pressing members 9 in a γ direction (or a χ direction), and a driving source 118 that displaces the supporting member 26 in the χ direction or the γ direction, The pivot pin 262 supported by the drive source 118 may be coupled to the support member 26 so as to be rotatable about an axis extending in the ζ direction. In the embodiment shown in Fig. 28, each of the pressing members 9 is supported by the moving body 92, and the moving body 92 is supported by the supporting member 26''. (Another embodiment of the bonding mechanism) Referring to Fig. 29, in addition to the other embodiments of the mechanism, three pairs of bonding members 270, 272, 274 are used. The port joint member 270 is coupled to the pair of rails 72 provided in the first slider 64 so as to be movable in the Υ direction, and is coupled to the yoke direction in the same manner as the joint member 68 shown in FIG. It is provided on the pair of rails 72 of the second slider 66. Each of the coupling members 272 is coupled to the other pair of lanes 72 provided in the second 'moon member 66 so as to be movable in the χ direction. Each of the coupling members 274 is coupled to a pair of rails 72 provided in the first slider 64 in a movable γ*.D type, and 34 201043983 is attached to the moving sheet extending in the γ direction so as not to be movable. Each of the moving pieces 30 extending in the z-direction is coupled to the coupling member 27A so as to be movable in the γ direction on one of the lower pair of rails, and is attached to the coupling member 274 so as not to be movable. Each of the moving pieces 30 extending in the X direction is coupled to the coupling member 272 so as to be movable in the X direction, and is disposed in the lower side by being movable in the X direction. The auxiliary coupling member (10) is coupled to the rail u of the second slider 66 so as to be movable in the X direction. In another embodiment of the coupling mechanism, when the slider cores are moved closer to each other in the separation direction (X direction), the direction of the one side of the slider 64 is transmitted through the coupling member 1 to move in the direction of the separation member (X) Moving in the direction, and connecting the other-side moving piece 30 extending in the X direction of the side-moving piece (10) by the combination means of the above-described dovetail groove and the tailstock, etc. Move in the X direction. And the pair of second sliders 66 are moved closer to each other in the separation direction (γ direction)
動時,透過結合構件272使連結於第2滑件“之延伸於X 方向之該另-側移動片3〇與第2滑件66一起在彼此接近 分離方向(Υ方向)移動,且使藉由上述填尾槽與續尾座等之 結合手段連結於該另—側移動片3G之延伸於γ方向之該一 側移動片30隨著該另—侧移動片3()之移動移動於長邊方 向(Y方向)。 因此,四個移動Η v pq 動片30以開口 32之尺寸成為圖3及圖6 所不之尺寸之方式蒋叙 生社里 —2 移動其…果,可依據待測試之被檢查 35 201043983 體12之尺寸變更開口 32或面板承載面34之尺寸β ^早元支承機構20、結合機構62、移動片移動機構74、 疋位機構82, 86、探針移動機構158等,作為使 對移動之機構之驅動源之馬達,為旋轉式馬達及線= 之任一者皆可。 1 同樣地,各推進器機構之驅動源,在旋轉力或推進力 】於疋位機構之馬達之範圍内,為可二階段變更之旋轉式 馬達及線性馬達之任一者皆可。 > 二而壓縮空軋之體積隨壓力變化,因此作為推進器 機構之驅動源,使用使用壓縮空氣之汽缸機構時,在對準 時,可大幅減低按壓構件碰撞被檢查體時之衝擊。因此, 較佳為’使用使用壓縮空氣之汽缸機構。 又’替代使用上述馬達(電動機),特別是定位機構82, % 之驅動源,為使用滾珠螺桿12〇與螺帽122之機構 '使用 齒輪齒條之機構等’且使用使該等機構驅動之油壓馬達般 其他驅動源亦可。 面板承載部18具有無法變更開口 32之尺寸之構造, 例如相同尺寸之被檢查體專用之構造亦可。又,定位機構 之構造亦可進行各種變更。 如上述實施例,替代二種類之壓力流體源124, 126、閥 裝置128及閥驅動裝置129 ’使用可藉由電壓控制輸出適當 之壓力流體之電空調整器亦可。此時,電空調整器將彼此 不同之至少二個麼力流體選擇性供應至推進器機構8〇, 84 之驅動機構之驅動源118。 36 201043983 …本:明並不限於上述實施例,在未脫離申請專利範圍 記載之旨趣之範圍内,可進行各種變更。 【圖式簡單說明】 圖1係顯示本發明之測試裝置之—實施例的立體圖。 圖2係圖丨所示之測試裝置的前視圖。 圖4係沿圖3中4—4線的截面圖 圖3係圖!所示之測試裝置的俯視圖。 Ο Ο 圖 5係為 '' -----me外切籾乃栘動微攝之一實施 例,將面板承載部及承接其之台座分解顯示的立體圖。 ,圖6係將圖1所示之測試裝置中探針單㈣去顯示的 俯視圖。 之下係沿圖3中7—7線的截面圖’為省略面板承載部 之下方構件的截面圖。 圖8係將定位機構之一實施例與面板承載部之移 一起顯示的立體圖。 之下沿圖3中9—9線的截面圖,為省略面板承载部 之下方構件的截面圖。 係將推進器機構之一實施例與面板承载 片一起顯示的立體圖。 抄動 2係將探針單元及其支承機構與面板承載部 片 起顯不的前視圖。 圖12係用以說明探針單元與被檢查體 圖。 t關係的立體 37 201043983 圖13係將探針單元及其支^機構分解顯㈣立體圖。 圖Η係從X方向中一方向觀察單元支承機構之一實施 例的立體圖。 圖15係從與圖14相反之方向觀察圖Μ之單元支承機 構的立體圖。 圖16係顯示進行定位_ $施 仃疋位時之推進器機構與定位機構之關 係的圖。 圖17係顯示進行^位及接觸時之推進器機構、定位機 構、及被檢查體之關係’為將一部分截面顯示的前視圖。 圖18係顯示面板承載部與浮起裝置之關係之一實施例 的立體圖。 圖19係顯示浮起裝置之-實施例的截面圖。 圖20係用以說明圖i所示之測試裝置進行之定位的 圖,為說明使被檢查體在以向位移之狀態的圖。 圖係用以說明圖i所示之測試装置進行之定位的 圖,為說明使被檢查體繞以、㈣度性旋轉之狀態的圖。 圖係、說月探針單元之位移狀態的圖,⑷係顯示探針 單元位於退開位置時之灿舴 、μ β 卞之狀蟋’(Β)係顯示探針單元位於中間 置時之狀也,(C)係顯不探針單元位於接觸位置時之狀態。 圖23係將面板承載部之開放部之_實施例與浮起裝置 之另一實施例一起顯示的圖。 圖24係顯示本發明之測試裝置之另一實施例的圖。 圖25係用以說明另—定位方法的圖。 圖26係用以說明又一定位方法的圖。 38 201043983 將面板承載 圖27係顯示定位裝置之另一實施例的圖 圖28係顯示定位裝置之又一實施例的圖 • 圖29係為了說明結合機構之另一實施例, β及承接其之台座分解顯示的立體圖。During the movement, the other-side moving piece 3〇 connected to the second slider “connecting to the second slider” in the X direction is moved closer to the separating direction (Υ direction) by the coupling member 272, and the borrowing is performed. The side moving piece 30 extending from the other side moving piece 3G extending in the γ direction by the combination of the above-mentioned tailing groove and the rear tail seat or the like moves along the moving side of the other side moving piece 3 () The direction of the side (Y direction). Therefore, the four moving Η v pq moving piece 30 is the size of the opening 32 by the size of the opening 32. In the manner of the size of the figure 3 and FIG. 6, the movement of the fruit piece 30 can be determined according to the test to be tested. Inspected 35 201043983 The size change opening 32 of the body 12 or the size of the panel bearing surface 34 β ^ early support mechanism 20, the coupling mechanism 62, the moving piece moving mechanism 74, the clamping mechanism 82, 86, the probe moving mechanism 158, etc. The motor that drives the driving mechanism is either a rotary motor or a wire. 1 Similarly, the driving force of each thruster mechanism is in the clamping mechanism. Rotary motor with two stages change within the range of the motor And either of the linear motors can be used. 2. The volume of the compressed air rolling varies with the pressure. Therefore, when the cylinder mechanism using compressed air is used as the driving source of the thruster mechanism, the pressing member can be greatly reduced in alignment. Impact when colliding with the object to be inspected. Therefore, it is preferable to use a cylinder mechanism using compressed air. In addition, instead of using the above motor (electric motor), in particular, the driving mechanism of the positioning mechanism 82, %, the ball screw 12 is used. The mechanism of the nut 122 is a mechanism using a rack and pinion, etc., and other driving sources such as a hydraulic motor that drives the mechanisms may be used. The panel carrying portion 18 has a configuration in which the size of the opening 32 cannot be changed, for example, the same size. The structure of the object to be inspected may also be modified. Further, the structure of the positioning mechanism may be variously modified. As in the above embodiment, instead of the two types of pressure fluid sources 124, 126, valve device 128 and valve driving device 129' may be used The voltage control outputs an appropriate electro-pneumatic regulator of the pressure fluid. At this time, the electro-pneumatic regulator will select at least two different fluids different from each other. The drive source 118 is supplied to the drive mechanism of the pusher mechanism 8A, 84. 36 201043983 The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a perspective view showing an embodiment of a test apparatus of the present invention. Fig. 2 is a front view of the test apparatus shown in Fig. 4. Fig. 4 is a sectional view taken along line 4-4 of Fig. 3. 3 图 图! The top view of the test device shown. Ο Ο Figure 5 is a ''--me outer cut is one of the examples of the micro-camera, the panel bearing part and the pedestal that receives it are disassembled and displayed Fig. 6 is a top view showing the probe unit (four) in the test device shown in Fig. 1. The cross-sectional view taken along line 7-7 in Fig. 3 is a cross-sectional view in which the lower member of the panel carrying portion is omitted. Figure 8 is a perspective view showing the movement of one of the positioning mechanisms with the panel carrier. The cross-sectional view taken along line 9-9 in Fig. 3 is a cross-sectional view in which the lower member of the panel carrying portion is omitted. A perspective view showing one embodiment of a pusher mechanism together with a panel carrier. The copy 2 is a front view showing the probe unit and its supporting mechanism and the panel carrying portion. Figure 12 is a view for explaining the probe unit and the object to be inspected. Stereoscopic relationship of the relationship 37 201043983 Figure 13 is a perspective view of the probe unit and its support mechanism. Figure Η is a perspective view of an embodiment of the unit support mechanism viewed from one of the X directions. Fig. 15 is a perspective view of the unit supporting mechanism as seen from the direction opposite to Fig. 14. Fig. 16 is a view showing the relationship between the thruster mechanism and the positioning mechanism when positioning is performed. Fig. 17 is a front view showing a relationship between a pusher mechanism, a positioning mechanism, and an object to be inspected when the position and contact are performed. Fig. 18 is a perspective view showing an embodiment of a relationship between a panel carrying portion and a floating device. Figure 19 is a cross-sectional view showing an embodiment of a floating device. Fig. 20 is a view for explaining the positioning of the test apparatus shown in Fig. i, for explaining the state in which the object to be inspected is displaced in the direction of the orientation. The figure is for explaining the positioning of the test apparatus shown in Fig. i, and is a view for explaining a state in which the object to be inspected is wound and rotated four degrees. Figure 4, diagram showing the displacement state of the moon probe unit, (4) showing the state of the 舴 舴, μ β 卞 when the probe unit is in the retracted position Β '(Β) shows the probe unit in the middle position Also, (C) shows the state in which the probe unit is located at the contact position. Fig. 23 is a view showing the embodiment of the open portion of the panel carrying portion together with another embodiment of the floating device. Figure 24 is a diagram showing another embodiment of the test apparatus of the present invention. Figure 25 is a diagram for explaining another positioning method. Figure 26 is a diagram for explaining still another positioning method. 38 201043983 FIG. 27 is a diagram showing another embodiment of the positioning device. FIG. 28 is a view showing still another embodiment of the positioning device. FIG. 29 is a view for explaining another embodiment of the coupling mechanism, β and accepting the same. The pedestal is exploded to show a perspective view.
【主要元件符號說明】 10, 250 測試裝置 12 平板狀被檢查體 14 平台 16 台座 16a, 32 開口 18 面板承載部 20 探針單元 22 單元支承機構 24 攝影機裝置 25 架台 26 支枉 28 背光單元 30 移動片 30a, 30b 第1及第2片 34 面板承載面 36 浮起裝置 40 球體 42 彈簧 39 201043983 48 開放部 50 連通孔 52 閥件 54 管件 56 減壓槽 58 閥驅動裝置 60 壓力流體源 62 結合機構 64, 66 第1及第2滑件 68, 270, 272, 274, 276 結合構件 70, 72, 276, 278 軌道 74 移動片移動機構 80, 84 推進器機構 82, 86 定位機構 90 按壓構件 92 移動體 94 驅動機構 9 6 支承板 98 安裝銷 114 滑件 116 連結板 118 驅動源 120 滚珠螺桿 122 螺帽 201043983 124, 126 壓力流體源 128 閥裝置 129 閥驅動裝置 130 馬達驅動裝置 132 支承基座 134 支承塊 136 移動塊 138 探針塊[Main component symbol description] 10, 250 Test device 12 Flat object 14 Platform 16 pedestal 16a, 32 Opening 18 Panel carrier 20 Probe unit 22 Unit support mechanism 24 Camera device 25 Rack 26 Support 28 Backlight unit 30 Movement Sheet 30a, 30b 1st and 2nd sheet 34 Panel bearing surface 36 Floating device 40 Ball 42 Spring 39 201043983 48 Opening 50 Connecting hole 52 Valve member 54 Tube 56 Relief tank 58 Valve drive 60 Pressure fluid source 62 Bonding mechanism 64, 66 1st and 2nd slides 68, 270, 272, 274, 276 Joint members 70, 72, 276, 278 Track 74 Moving piece moving mechanism 80, 84 Propeller mechanism 82, 86 Positioning mechanism 90 Pressing member 92 Moving Body 94 Drive mechanism 9 6 Support plate 98 Mounting pin 114 Slide 116 Link plate 118 Drive source 120 Ball screw 122 Nut 201043983 124, 126 Pressure fluid source 128 Valve device 129 Valve drive 130 Motor drive 132 Support base 134 Support Block 136 moving block 138 probe block
146 接觸子 150 移動體承載件 152, 154 第1及第2移動體 156 頂板 158 探針移動機構 160 制動件 162, 166, 170 軌道 164, 168, 172 導引件 174 馬達 176 滾珠螺桿 178 螺帽 180 結合具 186 孔 188 桿件 190 壓縮螺旋彈簧 192 位移產生機構 41 201043983 194 196 200 202 206 208 210 212 214 216 218 252 260 262 拖架 輥 支承塊 攝影機 結合軸(角度調整裝置) 螺帽(角度調整裝置) 調整螺桿(角度調整裝置) 馬達(單元位置調整裝置) 滚珠螺桿(單元位置調整裝置) 螺帽(單元位置調整裝置) 結合具(單元位置調整裝置) Z載台 支承構件 樞軸銷 42146 Contactor 150 Moving body carrier 152, 154 1st and 2nd moving body 156 Top plate 158 Probe moving mechanism 160 Brake 162, 166, 170 Track 164, 168, 172 Guide 174 Motor 176 Ball screw 178 Nut 180 Adapter 186 hole 188 Rod 190 Compression coil spring 192 Displacement generating mechanism 41 201043983 194 196 200 202 206 208 210 212 214 216 218 252 260 262 Trailer roller support block camera coupling shaft (angle adjustment device) Nut (angle adjustment Device) Adjusting screw (angle adjustment device) Motor (unit position adjustment device) Ball screw (unit position adjustment device) Nut (unit position adjustment device) Combination tool (unit position adjustment device) Z stage support member pivot pin 42
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI614548B (en) * | 2013-10-28 | 2018-02-11 | 高雄晶傑達光電科技股份有限公司 | Light inspection device |
TWI730135B (en) * | 2016-06-30 | 2021-06-11 | 日商日本電產三協股份有限公司 | Alignment device |
CN116990628A (en) * | 2023-09-28 | 2023-11-03 | 珠海市枫杨科技有限公司 | Automatic positioning and inserting device and system for large screen function test |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8402314B2 (en) * | 2010-12-09 | 2013-03-19 | Apple Inc. | Debug registers for halting processor cores after reset or power off |
KR101371370B1 (en) * | 2013-12-13 | 2014-03-07 | 한동희 | Panel bonding unit, panel bonding apparatus having the same and panel bonding method |
JP2015219007A (en) * | 2014-05-13 | 2015-12-07 | 日本電産リード株式会社 | Positioner and processor |
TWI581035B (en) * | 2015-07-24 | 2017-05-01 | 惠特科技股份有限公司 | Positioning method for liquid testing panel |
CN107765107B (en) * | 2016-08-18 | 2023-09-15 | 苏州迈瑞微电子有限公司 | Fingerprint identification module sensitivity test fixture and test method |
JP7058159B2 (en) * | 2018-03-28 | 2022-04-21 | 株式会社エンプラス | Positioning mechanism and inspection equipment |
CN108732364B (en) * | 2018-07-13 | 2024-08-06 | 深圳市活水床旁诊断仪器有限公司 | Incubation groove device |
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CN112873137B (en) * | 2020-12-29 | 2022-11-04 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | Stripping workbench |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4490066B2 (en) * | 2003-09-18 | 2010-06-23 | 株式会社日本マイクロニクス | Display panel inspection device |
JP4570930B2 (en) * | 2004-10-22 | 2010-10-27 | 株式会社日本マイクロニクス | Electrical connection device used in panel inspection equipment |
WO2006085364A1 (en) * | 2005-02-09 | 2006-08-17 | Advantest Corporation | Electronic component test equipment |
JP4674151B2 (en) * | 2005-11-16 | 2011-04-20 | 株式会社日本マイクロニクス | Lighting inspection device |
WO2007143326A2 (en) * | 2006-05-31 | 2007-12-13 | Applied Materials, Inc. | Mini-prober for tft-lcd testing |
JP2008188727A (en) * | 2007-02-06 | 2008-08-21 | Joyo Kogaku Kk | Alignment method and its apparatus |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI614548B (en) * | 2013-10-28 | 2018-02-11 | 高雄晶傑達光電科技股份有限公司 | Light inspection device |
TWI730135B (en) * | 2016-06-30 | 2021-06-11 | 日商日本電產三協股份有限公司 | Alignment device |
CN116990628A (en) * | 2023-09-28 | 2023-11-03 | 珠海市枫杨科技有限公司 | Automatic positioning and inserting device and system for large screen function test |
CN116990628B (en) * | 2023-09-28 | 2023-12-15 | 珠海市枫杨科技有限公司 | Automatic positioning and inserting device and system for large screen function test |
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JP2011085574A (en) | 2011-04-28 |
TWI424177B (en) | 2014-01-21 |
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