TW200741334A - Pattern forming method and gray-tone mask manufacturing method - Google Patents
Pattern forming method and gray-tone mask manufacturing methodInfo
- Publication number
- TW200741334A TW200741334A TW096106053A TW96106053A TW200741334A TW 200741334 A TW200741334 A TW 200741334A TW 096106053 A TW096106053 A TW 096106053A TW 96106053 A TW96106053 A TW 96106053A TW 200741334 A TW200741334 A TW 200741334A
- Authority
- TW
- Taiwan
- Prior art keywords
- inorganic
- mask layer
- resist pattern
- gray
- thin film
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/36—Masks having proximity correction features; Preparation thereof, e.g. optical proximity correction [OPC] design processes
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/80—Etching
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
A gray-tone mask has a light-shielding portion, a light-transmitting portion, and a gray-tone portion adapted to reduce a transmission amount of exposure light in use of the mask. For manufacturing this gray-tone mask, a method includes a step of preparing a mask blank in which a thin film containing metal and silicon and an inorganic-based etching mask layer each having resistance to etching of the other are formed on a light-transmissive substrate, a step of forming a first resist pattern on the inorganic-based etching mask layer, a step of etching the inorganic-based etching mask layer by using the first resist pattern as a mask and using an etching solution for the inorganic-based etching mask layer, a step of peeling off the first resist pattern remaining after etching the inorganic-based etching mask layer, a step of etching the thin film by using the inorganic-based etching mask layer as a mask and an etching solution for the thin film. The thin film is etched with the first resist pattern peeled off. Thereafter, a second resist pattern is formed on the inorganic-based etching mask layer and the light-transmissive substrate, and the inorganic-based etching mask layer is etched by using the second resist pattern as a mask and then the second resist pattern is peeled off. Thus, the gray-tone portion is formed by the thin film while the light-shielding portion is formed by the inorganic-based etching mask layer and the thin film.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006045659 | 2006-02-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200741334A true TW200741334A (en) | 2007-11-01 |
Family
ID=38613162
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096106053A TW200741334A (en) | 2006-02-22 | 2007-02-16 | Pattern forming method and gray-tone mask manufacturing method |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR20070085167A (en) |
CN (1) | CN101025566A (en) |
TW (1) | TW200741334A (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103412463A (en) * | 2013-08-27 | 2013-11-27 | 南通富士通微电子股份有限公司 | Mask plate and manufacturing method thereof |
DE102020106742A1 (en) | 2020-03-12 | 2021-09-16 | Auto-Kabel Management Gmbh | Electrical contact part and method for producing an electrical contact part |
CN113204074A (en) * | 2021-04-21 | 2021-08-03 | 上海大学 | Non-equal-height optical waveguide directional mode coupler prepared based on ultraviolet gray-scale photoetching method |
CN117637448B (en) * | 2024-01-26 | 2024-05-03 | 粤芯半导体技术股份有限公司 | Side wall manufacturing method and device, chip and electronic equipment |
-
2007
- 2007-02-16 TW TW096106053A patent/TW200741334A/en unknown
- 2007-02-16 CN CNA2007100841350A patent/CN101025566A/en active Pending
- 2007-02-22 KR KR1020070017748A patent/KR20070085167A/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR20070085167A (en) | 2007-08-27 |
CN101025566A (en) | 2007-08-29 |
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