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TW200710398A - Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate - Google Patents

Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate

Info

Publication number
TW200710398A
TW200710398A TW095112316A TW95112316A TW200710398A TW 200710398 A TW200710398 A TW 200710398A TW 095112316 A TW095112316 A TW 095112316A TW 95112316 A TW95112316 A TW 95112316A TW 200710398 A TW200710398 A TW 200710398A
Authority
TW
Taiwan
Prior art keywords
work table
display
use substrate
testing device
exchanging apparatus
Prior art date
Application number
TW095112316A
Other languages
Chinese (zh)
Other versions
TWI304886B (en
Inventor
Shinji Hujiwara
Takeshi Saitou
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200710398A publication Critical patent/TW200710398A/en
Application granted granted Critical
Publication of TWI304886B publication Critical patent/TWI304886B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Handcart (AREA)

Abstract

To provide an apparatus used for an aide of exchanging a work table. The exchanging apparatus comprises; a cart capable of moving on a floor; a conveyance device disposed at the cart; and a first positioning device which positions the conveyance device in relation to a testing device whose work table should be exchanged. The conveyance device includes a conveyance frame which forms an internal space and is supported by the cart so as to able to move in the X-direction within a plane parallel to a display-use substrate received by the work table, in order to convey the work table.
TW095112316A 2005-04-28 2006-04-07 Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate TW200710398A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005132091A JP4768309B2 (en) 2005-04-28 2005-04-28 Exchange device for work table receiving display substrate and inspection device for display substrate

Publications (2)

Publication Number Publication Date
TW200710398A true TW200710398A (en) 2007-03-16
TWI304886B TWI304886B (en) 2009-01-01

Family

ID=37475507

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095112316A TW200710398A (en) 2005-04-28 2006-04-07 Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate

Country Status (3)

Country Link
JP (1) JP4768309B2 (en)
KR (1) KR100754846B1 (en)
TW (1) TW200710398A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107678191B (en) * 2016-08-02 2024-02-27 北京清大天达光电科技股份有限公司 Carrier opening and closing mechanism
KR102503000B1 (en) * 2017-09-08 2023-02-23 주식회사 탑 엔지니어링 Socket for camera module
KR102478405B1 (en) * 2021-12-09 2022-12-16 주식회사 윈체 Portable automatic worktable for doors and windows
KR102598883B1 (en) * 2022-11-30 2023-11-06 한화시스템 주식회사 Apparatus and method for antenna test
KR102598884B1 (en) * 2022-11-30 2023-11-06 한화시스템 주식회사 Apparatus and method for antenna test
KR102573634B1 (en) * 2023-03-17 2023-09-01 주식회사 새광이엔지 Full length and full width inspection device
KR102583855B1 (en) * 2023-03-17 2023-09-27 주식회사 새광이엔지 Multi-inspection device including flatness inspection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3673022B2 (en) * 1996-06-24 2005-07-20 株式会社日本マイクロニクス LCD panel inspection equipment
JPH1010153A (en) * 1996-06-26 1998-01-16 Nippon Maikuronikusu:Kk Storeroom for probe unit and inspecting system using the storeroom
JPH1114956A (en) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd Inspection stage for liquid crystal panel
JP3958852B2 (en) * 1997-12-22 2007-08-15 株式会社日本マイクロニクス Substrate inspection device
US6486927B1 (en) * 1999-11-19 2002-11-26 De & T Co., Ltd. Liquid crystal display test system
JP2003270155A (en) * 2002-03-15 2003-09-25 Olympus Optical Co Ltd Substrate holding device and inspection device

Also Published As

Publication number Publication date
KR20060113396A (en) 2006-11-02
JP2006308450A (en) 2006-11-09
JP4768309B2 (en) 2011-09-07
KR100754846B1 (en) 2007-09-04
TWI304886B (en) 2009-01-01

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