[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

SG89279A1 - Method and apparatus for high throughput media defect testing using true reference value - Google Patents

Method and apparatus for high throughput media defect testing using true reference value

Info

Publication number
SG89279A1
SG89279A1 SG9902200A SG1999002200A SG89279A1 SG 89279 A1 SG89279 A1 SG 89279A1 SG 9902200 A SG9902200 A SG 9902200A SG 1999002200 A SG1999002200 A SG 1999002200A SG 89279 A1 SG89279 A1 SG 89279A1
Authority
SG
Singapore
Prior art keywords
reference value
high throughput
media defect
defect testing
true reference
Prior art date
Application number
SG9902200A
Inventor
Seng Ghee Tan
Yun Fook Thomas Liew
Teck Ee Loh
Silva Ahangama W Udaya
Original Assignee
Inst Data Storage
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inst Data Storage filed Critical Inst Data Storage
Priority to SG9902200A priority Critical patent/SG89279A1/en
Publication of SG89279A1 publication Critical patent/SG89279A1/en

Links

SG9902200A 1999-04-15 1999-04-15 Method and apparatus for high throughput media defect testing using true reference value SG89279A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG9902200A SG89279A1 (en) 1999-04-15 1999-04-15 Method and apparatus for high throughput media defect testing using true reference value

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG9902200A SG89279A1 (en) 1999-04-15 1999-04-15 Method and apparatus for high throughput media defect testing using true reference value

Publications (1)

Publication Number Publication Date
SG89279A1 true SG89279A1 (en) 2002-06-18

Family

ID=20430352

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9902200A SG89279A1 (en) 1999-04-15 1999-04-15 Method and apparatus for high throughput media defect testing using true reference value

Country Status (1)

Country Link
SG (1) SG89279A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996005596A1 (en) * 1994-08-15 1996-02-22 Trace Mountain Products, Inc. Method and apparatus for augmented missing pulse certification of a magnetic recording medium
US5532586A (en) * 1992-02-18 1996-07-02 Fujitsu Limited Method and apparatus for detecting magnetic disk defects using a complete disk erasure magnet
GB2326755A (en) * 1997-06-03 1998-12-30 Samsung Electronics Co Ltd Method of establishing the capacity of a hard disk drive

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532586A (en) * 1992-02-18 1996-07-02 Fujitsu Limited Method and apparatus for detecting magnetic disk defects using a complete disk erasure magnet
WO1996005596A1 (en) * 1994-08-15 1996-02-22 Trace Mountain Products, Inc. Method and apparatus for augmented missing pulse certification of a magnetic recording medium
GB2326755A (en) * 1997-06-03 1998-12-30 Samsung Electronics Co Ltd Method of establishing the capacity of a hard disk drive

Similar Documents

Publication Publication Date Title
IL152526A0 (en) Method and apparatus for inspecting defects
EP1324022A4 (en) Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface
IL151929A0 (en) Defect inspection apparatus and defect inspection method
GB2340950B (en) Method and apparatus for automotive and other testing
IL153050A0 (en) Method and apparatus for maximizing test coverage
GB2383422B (en) Method and apparatus for well testing
GB9805861D0 (en) A method and an apparatus for inspecting articles
AU2001269717A1 (en) Apparatus and method for detecting pipeline defects
EP1068506A4 (en) Apparatus and method for testing lubricity
GB2353600B (en) Method and apparatus for automotive and other testing
EP1028314A4 (en) Apparatus for nondestructive testing
SG103865A1 (en) Film quality inspecting method and film quality inspecting apparatus
EP0992802B8 (en) Method and apparatus for selecting targeted components in limited access test
SG97186A1 (en) Method and apparatus for inspecting components
AU1411900A (en) Method and apparatus for wafer inspection
GB0100248D0 (en) Method and apparatus for inspecting an object
SG89279A1 (en) Method and apparatus for high throughput media defect testing using true reference value
AU3087699A (en) Method and apparatus for testing surfaces
NO991275D0 (en) Method and apparatus for inspecting an object
SG50884A1 (en) Apparatus and method for inspecting disks
EP1161666A4 (en) Method and apparatus for sealing test materials
AUPP186598A0 (en) An apparatus and method for testing packages for defects
SG34319A1 (en) Method and apparatus for defect detection
AUPP906799A0 (en) An apparatus and method for testing packages for defects
GB9905000D0 (en) Method and apparatus for testing simultation behaviour