[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

SG11202007002YA - Methods and apparatus for cleaning substrates - Google Patents

Methods and apparatus for cleaning substrates

Info

Publication number
SG11202007002YA
SG11202007002YA SG11202007002YA SG11202007002YA SG11202007002YA SG 11202007002Y A SG11202007002Y A SG 11202007002YA SG 11202007002Y A SG11202007002Y A SG 11202007002YA SG 11202007002Y A SG11202007002Y A SG 11202007002YA SG 11202007002Y A SG11202007002Y A SG 11202007002YA
Authority
SG
Singapore
Prior art keywords
methods
cleaning substrates
substrates
cleaning
Prior art date
Application number
SG11202007002YA
Inventor
Hui Wang
Xi Wang
Xiaoyan Zhang
Fufa Chen
Fuping Chen
Original Assignee
Acm Res Shanghai Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Acm Res Shanghai Inc filed Critical Acm Res Shanghai Inc
Publication of SG11202007002YA publication Critical patent/SG11202007002YA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/08Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • B08B3/12Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/04Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B2203/00Details of cleaning machines or methods involving the use or presence of liquid or steam
    • B08B2203/005Details of cleaning machines or methods involving the use or presence of liquid or steam the liquid being ozonated

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
SG11202007002YA 2018-01-23 2018-01-23 Methods and apparatus for cleaning substrates SG11202007002YA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2018/073810 WO2019144273A1 (en) 2018-01-23 2018-01-23 Methods and apparatus for cleaning substrates

Publications (1)

Publication Number Publication Date
SG11202007002YA true SG11202007002YA (en) 2020-08-28

Family

ID=67395232

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202007002YA SG11202007002YA (en) 2018-01-23 2018-01-23 Methods and apparatus for cleaning substrates

Country Status (6)

Country Link
US (1) US20210035821A1 (en)
JP (1) JP7230037B2 (en)
KR (1) KR102548592B1 (en)
CN (1) CN111630649A (en)
SG (1) SG11202007002YA (en)
WO (1) WO2019144273A1 (en)

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3690619B2 (en) * 1996-01-12 2005-08-31 忠弘 大見 Cleaning method and cleaning device
TW355815B (en) * 1996-05-28 1999-04-11 Canon Kasei Kk Cleaning methods of porous surface and semiconductor surface
JP3192610B2 (en) * 1996-05-28 2001-07-30 キヤノン株式会社 Method for cleaning porous surface, method for cleaning semiconductor surface, and method for manufacturing semiconductor substrate
JP2002009035A (en) * 2000-06-26 2002-01-11 Toshiba Corp Method and device for washing substrate
JP2002124502A (en) 2000-07-14 2002-04-26 Dainippon Screen Mfg Co Ltd Method and apparatus for substrate treatment
JP2002289565A (en) 2001-03-26 2002-10-04 Toshiba Corp Cleaning method, method for manufacturing semiconductor device and method for manufacturing active matrix type display device
US7718009B2 (en) * 2004-08-30 2010-05-18 Applied Materials, Inc. Cleaning submicron structures on a semiconductor wafer surface
US7958899B2 (en) * 2007-08-21 2011-06-14 Dainippon Screen Mfg. Co., Ltd. Substrate cleaning apparatus and substrate cleaning method
CN101419903B (en) * 2007-10-24 2010-06-23 联华电子股份有限公司 Method for removing granules on wafer
US8585825B2 (en) * 2008-10-30 2013-11-19 Lam Research Corporation Acoustic assisted single wafer wet clean for semiconductor wafer process
KR101837070B1 (en) 2011-09-22 2018-03-09 에이씨엠 리서치 (상하이) 인코포레이티드 Methods and apparatus for cleaning flip chip assemblies
KR101925173B1 (en) * 2012-03-23 2018-12-04 가부시키가이샤 스크린 홀딩스 Substrate processing apparatus and heater cleaning method
KR102308587B1 (en) * 2014-03-19 2021-10-01 가부시키가이샤 스크린 홀딩스 Substrate processing apparatus and substrate processing method
JP2016058665A (en) * 2014-09-12 2016-04-21 株式会社Screenホールディングス Substrate cleaning method and substrate cleaning device
WO2016183707A1 (en) * 2015-05-15 2016-11-24 Acm Research (Shanghai) Inc. Methods and apparatus for cleaning semiconductor wafers
CN107636799B (en) * 2015-05-20 2021-12-03 盛美半导体设备(上海)股份有限公司 Method and apparatus for cleaning semiconductor substrate
CN105376927B (en) * 2015-09-24 2018-07-17 中国航天科技集团公司第九研究院第七七一研究所 A kind of processing method of PTFE products hole wall
US11000782B2 (en) * 2015-12-09 2021-05-11 Acm Research (Shanghai) Inc. Method and apparatus for cleaning substrates using high temperature chemicals and ultrasonic device
CN109075103B (en) * 2016-04-06 2022-06-10 盛美半导体设备(上海)股份有限公司 Method and apparatus for cleaning semiconductor substrate
CN105655241A (en) * 2016-04-07 2016-06-08 上海华力微电子有限公司 Single-wafer wet cleaning method
US10758875B2 (en) * 2016-12-30 2020-09-01 Semes Co., Ltd. Liquid supply unit, substrate treating apparatus, and method for removing bubbles

Also Published As

Publication number Publication date
US20210035821A1 (en) 2021-02-04
KR20200109350A (en) 2020-09-22
JP2021517732A (en) 2021-07-26
CN111630649A (en) 2020-09-04
WO2019144273A1 (en) 2019-08-01
JP7230037B2 (en) 2023-02-28
KR102548592B1 (en) 2023-06-28

Similar Documents

Publication Publication Date Title
PT3838096T (en) Surface cleaning apparatus
IL290841A (en) Method and apparatus for cleaning surfaces
EP3460460A4 (en) Cleaning apparatus and method
EP3638551A4 (en) Apparatus for cleaning object surface
GB2596442B (en) Surface cleaning apparatus
EP3823508C0 (en) Cleaning apparatus and cleaning system
HK1245045A1 (en) Cleaning apparatus and method for cleaning articles
GB2587728B (en) Surface cleaning apparatus
EP3718652C0 (en) Cleaning method and cleaning device
IL276471B1 (en) Method and apparatus for cleaning surfaces
EP3773111A4 (en) Method and apparatus for executing cleaning operation
SG11202007852YA (en) Substrate cleaning device and substrate cleaning method
SG10201907132SA (en) Apparatus for polishing and method for polishing
GB202209061D0 (en) Surface cleaning apparatus
SG10201707070RA (en) Substrate cleaning apparatus and substrate cleaning method
PL3850145T3 (en) Method and apparatus for cleaning laundry
SG10201906330YA (en) Polishing apparatus and polishing method
EP3377941A4 (en) Apparatus and methods for photomask backside cleaning
SG10201907130YA (en) Apparatus for polishing and method for polishing
GB2554307B (en) Apparatus for retaining liquid and method for brush cleaning
EP3752037A4 (en) Cleaning apparatus
EP3516684A4 (en) Methods and apparatus for cleaning substrates
SG10201909509UA (en) Substrate cleaning member and substrate cleaning apparatus
EP3965963C0 (en) Cleaning apparatus
SG10201912259TA (en) Polishing apparatus and polishing method