SG11201506001VA - Polishing composition, method for producing polishing composition and method for producing polished article - Google Patents
Polishing composition, method for producing polishing composition and method for producing polished articleInfo
- Publication number
- SG11201506001VA SG11201506001VA SG11201506001VA SG11201506001VA SG11201506001VA SG 11201506001V A SG11201506001V A SG 11201506001VA SG 11201506001V A SG11201506001V A SG 11201506001VA SG 11201506001V A SG11201506001V A SG 11201506001VA SG 11201506001V A SG11201506001V A SG 11201506001VA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing composition
- producing
- polished article
- article
- producing polished
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Composite Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013026020 | 2013-02-13 | ||
PCT/JP2014/053065 WO2014126051A1 (en) | 2013-02-13 | 2014-02-10 | Polishing composition, production method for polishing composition, and production method for polished article |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201506001VA true SG11201506001VA (en) | 2015-09-29 |
Family
ID=51354053
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201506001VA SG11201506001VA (en) | 2013-02-13 | 2014-02-10 | Polishing composition, method for producing polishing composition and method for producing polished article |
Country Status (8)
Country | Link |
---|---|
US (1) | US20150376464A1 (en) |
EP (1) | EP2957613B1 (en) |
JP (2) | JP5897200B2 (en) |
KR (1) | KR102226441B1 (en) |
CN (1) | CN104995277B (en) |
SG (1) | SG11201506001VA (en) |
TW (1) | TWI624536B (en) |
WO (1) | WO2014126051A1 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10717899B2 (en) | 2013-03-19 | 2020-07-21 | Fujimi Incorporated | Polishing composition, method for producing polishing composition and polishing composition preparation kit |
SG11201507438YA (en) | 2013-03-19 | 2015-10-29 | Fujimi Inc | Polishing composition, method for producing polishing composition and polishing composition preparation kit |
JP6314019B2 (en) * | 2014-03-31 | 2018-04-18 | ニッタ・ハース株式会社 | Semiconductor substrate polishing method |
JP6185432B2 (en) * | 2014-06-24 | 2017-08-23 | 株式会社フジミインコーポレーテッド | Silicon wafer polishing composition |
CN107001916B (en) * | 2014-12-05 | 2019-01-22 | 3M创新有限公司 | Abrasive composition |
WO2016181888A1 (en) * | 2015-05-08 | 2016-11-17 | 株式会社フジミインコーポレーテッド | Polishing composition |
JP6582601B2 (en) * | 2015-06-22 | 2019-10-02 | 日立化成株式会社 | Polishing liquid, storage liquid and polishing method |
JP6797796B2 (en) * | 2015-07-01 | 2020-12-09 | 東亞合成株式会社 | Wetting agent for polishing and polishing liquid composition |
WO2017189453A1 (en) | 2016-04-28 | 2017-11-02 | Natureworks Llc | Polymer foam insulation structure having a facing of a multi-layer sheet that contains a heat resistant polymer layer and a polylactide resin layer |
US20190270914A1 (en) * | 2016-10-28 | 2019-09-05 | Tokuyama Corporation | Fumed silica and method for producing the same |
JP6792413B2 (en) * | 2016-10-31 | 2020-11-25 | 花王株式会社 | Abrasive liquid composition for silicon wafer |
JP7061965B2 (en) * | 2016-11-22 | 2022-05-02 | 株式会社フジミインコーポレーテッド | Polishing composition |
WO2018150945A1 (en) * | 2017-02-20 | 2018-08-23 | 株式会社フジミインコーポレーテッド | Silicon substrate intermediate polishing composition and silicon substrate polishing composition set |
JP6879798B2 (en) * | 2017-03-30 | 2021-06-02 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
JP7074525B2 (en) | 2017-03-30 | 2022-05-24 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
WO2018216733A1 (en) * | 2017-05-26 | 2018-11-29 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method using same |
EP3410236B1 (en) * | 2017-05-29 | 2021-02-17 | The Swatch Group Research and Development Ltd | Device and method for adjusting the rate and correcting the state of a watch |
SG11202000380VA (en) * | 2017-07-21 | 2020-02-27 | Fujimi Inc | Method of polishing substrate and polishing composition set |
US11649377B2 (en) * | 2017-08-14 | 2023-05-16 | Resonac Corporation | Polishing liquid, polishing liquid set and polishing method |
JP6929239B2 (en) * | 2018-03-30 | 2021-09-01 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
US20210277282A1 (en) * | 2018-07-04 | 2021-09-09 | Sumitomo Seika Chemicals Co., Ltd. | Polishing composition |
JP7424768B2 (en) * | 2019-08-08 | 2024-01-30 | 株式会社フジミインコーポレーテッド | Filtration method for polishing additive-containing liquid, polishing additive-containing liquid, polishing composition, method for producing polishing composition, and filter |
EP3792327A1 (en) * | 2019-09-11 | 2021-03-17 | Fujimi Incorporated | Polishing composition, polishing method and method for manufacturing semiconductor substrate |
CN112175524B (en) * | 2020-09-21 | 2022-02-15 | 万华化学集团电子材料有限公司 | Sapphire polishing composition and application thereof |
KR102492236B1 (en) * | 2020-12-17 | 2023-01-26 | 에스케이실트론 주식회사 | Polishing device and method of polishing for wafer |
WO2023181928A1 (en) | 2022-03-23 | 2023-09-28 | 株式会社フジミインコーポレーテッド | Polishing composition |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001185516A (en) * | 1999-12-24 | 2001-07-06 | Kao Corp | Abrasive assistant |
JP2004051756A (en) * | 2002-07-19 | 2004-02-19 | Sanyo Chem Ind Ltd | Abrasive composition for cmp process |
JP4593064B2 (en) | 2002-09-30 | 2010-12-08 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method using the same |
JP4212861B2 (en) * | 2002-09-30 | 2009-01-21 | 株式会社フジミインコーポレーテッド | Polishing composition and silicon wafer polishing method using the same, and rinsing composition and silicon wafer rinsing method using the same |
JP4668528B2 (en) | 2003-09-05 | 2011-04-13 | 株式会社フジミインコーポレーテッド | Polishing composition |
JP2005268664A (en) * | 2004-03-19 | 2005-09-29 | Fujimi Inc | Abrasive composition |
JPWO2005110679A1 (en) * | 2004-05-19 | 2008-03-21 | 日産化学工業株式会社 | Polishing composition |
US20060000808A1 (en) * | 2004-07-01 | 2006-01-05 | Fuji Photo Film Co., Ltd. | Polishing solution of metal and chemical mechanical polishing method |
JP4814502B2 (en) * | 2004-09-09 | 2011-11-16 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method using the same |
JP2006086462A (en) * | 2004-09-17 | 2006-03-30 | Fujimi Inc | Polishing composition and manufacturing method of wiring structure using the same |
JP5026665B2 (en) * | 2004-10-15 | 2012-09-12 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method using the same |
JP4027929B2 (en) * | 2004-11-30 | 2007-12-26 | 花王株式会社 | Polishing liquid composition for semiconductor substrate |
JP2006352043A (en) * | 2005-06-20 | 2006-12-28 | Nitta Haas Inc | Composition for polishing semiconductor |
JP2007073548A (en) * | 2005-09-02 | 2007-03-22 | Fujimi Inc | Polishing method |
JP2007095946A (en) * | 2005-09-28 | 2007-04-12 | Fujifilm Corp | Metal polishing solution and polishing method |
EP1813656A3 (en) * | 2006-01-30 | 2009-09-02 | FUJIFILM Corporation | Metal-polishing liquid and chemical mechanical polishing method using the same |
JP2007214205A (en) * | 2006-02-07 | 2007-08-23 | Fujimi Inc | Polishing composition |
JP5204960B2 (en) * | 2006-08-24 | 2013-06-05 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
JP5335183B2 (en) * | 2006-08-24 | 2013-11-06 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
JP2008091524A (en) * | 2006-09-29 | 2008-04-17 | Fujifilm Corp | Polishing solution for metal |
JP5196819B2 (en) * | 2007-03-19 | 2013-05-15 | ニッタ・ハース株式会社 | Polishing composition |
US10144849B2 (en) * | 2008-02-01 | 2018-12-04 | Fujimi Incorporated | Polishing composition and polishing method using the same |
US9202709B2 (en) * | 2008-03-19 | 2015-12-01 | Fujifilm Corporation | Polishing liquid for metal and polishing method using the same |
JP2009231486A (en) * | 2008-03-21 | 2009-10-08 | Kao Corp | Polishing liquid composition for silicon wafer |
KR101604328B1 (en) * | 2008-06-18 | 2016-03-17 | 가부시키가이샤 후지미인코퍼레이티드 | Polishing composition and polishing method using the same |
JP5474400B2 (en) * | 2008-07-03 | 2014-04-16 | 株式会社フジミインコーポレーテッド | Semiconductor wetting agent, polishing composition and polishing method using the same |
JP5362319B2 (en) * | 2008-10-21 | 2013-12-11 | 花王株式会社 | Polishing liquid composition |
US20100164106A1 (en) * | 2008-12-31 | 2010-07-01 | Cheil Industries Inc. | CMP Slurry Composition for Barrier Polishing for Manufacturing Copper Interconnects, Polishing Method Using the Composition, and Semiconductor Device Manufactured by the Method |
JP2011171689A (en) * | 2009-07-07 | 2011-09-01 | Kao Corp | Polishing liquid composition for silicon wafer |
JP5493528B2 (en) * | 2009-07-15 | 2014-05-14 | 日立化成株式会社 | CMP polishing liquid and polishing method using this CMP polishing liquid |
JP5441578B2 (en) * | 2009-09-11 | 2014-03-12 | 花王株式会社 | Polishing liquid composition |
JP5321430B2 (en) * | 2009-12-02 | 2013-10-23 | 信越半導体株式会社 | Polishing agent for polishing silicon wafer and polishing method for silicon wafer |
JP5492603B2 (en) * | 2010-03-02 | 2014-05-14 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method using the same |
JP5544244B2 (en) * | 2010-08-09 | 2014-07-09 | 株式会社フジミインコーポレーテッド | Polishing composition and polishing method |
JP2012079964A (en) * | 2010-10-04 | 2012-04-19 | Nissan Chem Ind Ltd | Polishing liquid composition for semiconductor wafer |
JP6050125B2 (en) * | 2011-01-26 | 2016-12-21 | 株式会社フジミインコーポレーテッド | Polishing composition, polishing method using the same, and substrate manufacturing method |
WO2012161202A1 (en) * | 2011-05-24 | 2012-11-29 | 株式会社クラレ | Erosion inhibitor for chemical mechanical polishing, slurry for chemical mechanical polishing, and chemical mechanical polishing method |
JP2014041978A (en) * | 2012-08-23 | 2014-03-06 | Fujimi Inc | Polishing composition, manufacturing method of polishing composition, and manufacturing method of polishing composition undiluted solution |
-
2014
- 2014-02-10 SG SG11201506001VA patent/SG11201506001VA/en unknown
- 2014-02-10 EP EP14751996.1A patent/EP2957613B1/en active Active
- 2014-02-10 KR KR1020157024572A patent/KR102226441B1/en active IP Right Grant
- 2014-02-10 JP JP2015500230A patent/JP5897200B2/en active Active
- 2014-02-10 US US14/767,494 patent/US20150376464A1/en not_active Abandoned
- 2014-02-10 CN CN201480008802.5A patent/CN104995277B/en active Active
- 2014-02-10 WO PCT/JP2014/053065 patent/WO2014126051A1/en active Application Filing
- 2014-02-12 TW TW103104570A patent/TWI624536B/en active
-
2016
- 2016-03-01 JP JP2016038583A patent/JP6387032B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2957613A1 (en) | 2015-12-23 |
TWI624536B (en) | 2018-05-21 |
CN104995277B (en) | 2018-05-08 |
JPWO2014126051A1 (en) | 2017-02-02 |
JP5897200B2 (en) | 2016-03-30 |
EP2957613B1 (en) | 2020-11-18 |
WO2014126051A1 (en) | 2014-08-21 |
KR20150119062A (en) | 2015-10-23 |
TW201443212A (en) | 2014-11-16 |
KR102226441B1 (en) | 2021-03-12 |
CN104995277A (en) | 2015-10-21 |
JP2016138278A (en) | 2016-08-04 |
US20150376464A1 (en) | 2015-12-31 |
JP6387032B2 (en) | 2018-09-05 |
EP2957613A4 (en) | 2016-11-09 |
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