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SG10202006954TA - Electrical contactor and electrical connecting apparatus - Google Patents

Electrical contactor and electrical connecting apparatus

Info

Publication number
SG10202006954TA
SG10202006954TA SG10202006954TA SG10202006954TA SG10202006954TA SG 10202006954T A SG10202006954T A SG 10202006954TA SG 10202006954T A SG10202006954T A SG 10202006954TA SG 10202006954T A SG10202006954T A SG 10202006954TA SG 10202006954T A SG10202006954T A SG 10202006954TA
Authority
SG
Singapore
Prior art keywords
electrical
connecting apparatus
contactor
electrical connecting
electrical contactor
Prior art date
Application number
SG10202006954TA
Inventor
KISHI Yasutaka
Wakazawa Masahiro
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of SG10202006954TA publication Critical patent/SG10202006954TA/en

Links

SG10202006954TA 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus SG10202006954TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019147760A JP2021028603A (en) 2019-08-09 2019-08-09 Electric contact and electrical connection device

Publications (1)

Publication Number Publication Date
SG10202006954TA true SG10202006954TA (en) 2021-03-30

Family

ID=74358284

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202006954TA SG10202006954TA (en) 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus

Country Status (6)

Country Link
US (1) US11255878B2 (en)
JP (1) JP2021028603A (en)
KR (1) KR102366546B1 (en)
CN (1) CN112345911A (en)
SG (1) SG10202006954TA (en)
TW (1) TWI749660B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1646397S (en) * 2019-05-21 2019-11-25
CN115436675A (en) 2021-06-04 2022-12-06 迪科特测试科技(苏州)有限公司 Testing device and probe assembly thereof
KR102563643B1 (en) * 2021-06-10 2023-08-04 주식회사 프로이천 Pin board
KR102321083B1 (en) * 2021-07-21 2021-11-03 (주)새한마이크로텍 Contact Probe
TWI792995B (en) * 2022-04-29 2023-02-11 中華精測科技股份有限公司 Cantilever probe card device and focusing probe thereof
TWI792996B (en) * 2022-04-29 2023-02-11 中華精測科技股份有限公司 Cantilever probe card device and probe having elastic arm thereof
TWI842533B (en) * 2023-05-18 2024-05-11 中華精測科技股份有限公司 Cantilever probe card device and cantilever probe module
CN116338266B (en) * 2023-05-23 2023-08-25 上海泽丰半导体科技有限公司 Segmented probe, probe card and welding method

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JPH07109780B2 (en) * 1991-02-19 1995-11-22 山一電機株式会社 Contacts in sockets for electrical components
CN1276259C (en) * 1998-12-02 2006-09-20 佛姆法克特股份有限公司 Photoetching contact elements
JP2000338133A (en) * 1999-05-31 2000-12-08 Isao Kimoto Contact
US7265565B2 (en) * 2003-02-04 2007-09-04 Microfabrica Inc. Cantilever microprobes for contacting electronic components and methods for making such probes
JP2004340617A (en) * 2003-05-13 2004-12-02 Micronics Japan Co Ltd Electrical connection burn-in apparatus
WO2004102207A1 (en) 2003-05-13 2004-11-25 Kabushiki Kaisha Nihon Micronics Probe for testing electric conduction
JP4571511B2 (en) * 2005-01-07 2010-10-27 株式会社日本マイクロニクス Probe for current test
JP4932499B2 (en) * 2005-01-14 2012-05-16 株式会社日本マイクロニクス Probe for current test
DE112005003667B4 (en) * 2005-08-09 2018-11-15 Kabushiki Kaisha Nihon Micronics Electrical test probe
KR100852625B1 (en) * 2006-12-04 2008-08-18 가부시키가이샤 니혼 마이크로닉스 Contact Block and Electrical Connection Device
JP5113392B2 (en) * 2007-01-22 2013-01-09 株式会社日本マイクロニクス Probe and electrical connection device using the same
JP2008203036A (en) * 2007-02-19 2008-09-04 Micronics Japan Co Ltd Electrical connection device
JP2008224640A (en) * 2007-03-08 2008-09-25 Isao Kimoto Probe assembly with rotary tip
CN101315391B (en) * 2007-05-28 2011-11-23 旺矽科技股份有限公司 Stretching type folding probe
JP5099487B2 (en) 2007-08-03 2012-12-19 軍生 木本 Multi-beam composite contact
JP2009229410A (en) 2008-03-25 2009-10-08 Micronics Japan Co Ltd Contactor for electric test and method of manufacturing the same
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KR100947862B1 (en) * 2008-06-30 2010-03-18 한국기계연구원 Cantilever type micro contact probe with hinge structure
JP5396112B2 (en) * 2009-03-12 2014-01-22 東京エレクトロン株式会社 Probe card
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US9052342B2 (en) * 2011-09-30 2015-06-09 Formfactor, Inc. Probe with cantilevered beam having solid and hollow sections
JP5886694B2 (en) * 2012-06-14 2016-03-16 株式会社日本マイクロニクス Cantilever type probe and probe card or probe unit including the same
JP5947139B2 (en) * 2012-07-27 2016-07-06 株式会社日本マイクロニクス Probe and electrical connection device
JP5968158B2 (en) * 2012-08-10 2016-08-10 株式会社日本マイクロニクス Contact probe and probe card
JP6584816B2 (en) * 2015-04-20 2019-10-02 日置電機株式会社 Probe unit and probe unit manufacturing method
JP2018179721A (en) * 2017-04-12 2018-11-15 株式会社日本マイクロニクス Electrical connection device
KR101963805B1 (en) 2017-12-12 2019-04-01 화인인스트루먼트(주) Probe for micro-LED
CN111033273B (en) * 2018-01-11 2022-04-26 欧姆龙株式会社 Probe, inspection tool, inspection unit, and inspection apparatus

Also Published As

Publication number Publication date
US11255878B2 (en) 2022-02-22
CN112345911A (en) 2021-02-09
TWI749660B (en) 2021-12-11
US20210041482A1 (en) 2021-02-11
JP2021028603A (en) 2021-02-25
KR20210018087A (en) 2021-02-17
KR102366546B1 (en) 2022-02-23
TW202111331A (en) 2021-03-16

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