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SG101468A1 - Automatic optical inspection of printed circuit board packages with polarity - Google Patents

Automatic optical inspection of printed circuit board packages with polarity

Info

Publication number
SG101468A1
SG101468A1 SG200105312A SG200105312A SG101468A1 SG 101468 A1 SG101468 A1 SG 101468A1 SG 200105312 A SG200105312 A SG 200105312A SG 200105312 A SG200105312 A SG 200105312A SG 101468 A1 SG101468 A1 SG 101468A1
Authority
SG
Singapore
Prior art keywords
polarity
circuit board
printed circuit
optical inspection
automatic optical
Prior art date
Application number
SG200105312A
Inventor
Ching Sim Tong
S Limqueco Rory
Original Assignee
Seagate Technology Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/897,760 external-priority patent/US20020076095A1/en
Application filed by Seagate Technology Llc filed Critical Seagate Technology Llc
Publication of SG101468A1 publication Critical patent/SG101468A1/en

Links

SG200105312A 2000-12-20 2001-08-30 Automatic optical inspection of printed circuit board packages with polarity SG101468A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US25705700P 2000-12-20 2000-12-20
US28271601P 2001-04-10 2001-04-10
US09/897,760 US20020076095A1 (en) 2000-12-20 2001-06-29 Automatic optical inspection of printed circuit board packages with polarity

Publications (1)

Publication Number Publication Date
SG101468A1 true SG101468A1 (en) 2004-01-30

Family

ID=32600829

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200105312A SG101468A1 (en) 2000-12-20 2001-08-30 Automatic optical inspection of printed circuit board packages with polarity

Country Status (1)

Country Link
SG (1) SG101468A1 (en)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02251714A (en) * 1989-03-27 1990-10-09 Hitachi Ltd Method for inspecting polarity of mounted polar part and visual inspection method for mounting board
JPH04236500A (en) * 1991-01-21 1992-08-25 Nec Corp Inspecting device for mounted polarity direction of polarized electronic component
JPH04236318A (en) * 1991-01-21 1992-08-25 Nec Corp Inspecting device of polarity of capacitor
JPH04342198A (en) * 1991-05-20 1992-11-27 Fujitsu Ltd Identifying apparatus for polarity of electronic component
JPH08195600A (en) * 1995-01-18 1996-07-30 Nagano Japan Radio Co Polarity inspection for electronic component
JPH095033A (en) * 1995-06-19 1997-01-10 Nagoya Denki Kogyo Kk Inspecting apparatus for mounted part of printed-circuit board
JPH1051199A (en) * 1996-07-31 1998-02-20 Nagoya Denki Kogyo Kk Inspection of orientation of mounted component
KR100227427B1 (en) * 1997-03-27 1999-11-01 전주범 Testing method and device for the polarity of electrolytic condenser using color sensor
TW381182B (en) * 1998-12-31 2000-02-01 Test Research Inc Testing method of In-circuit testing with image recognition system

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02251714A (en) * 1989-03-27 1990-10-09 Hitachi Ltd Method for inspecting polarity of mounted polar part and visual inspection method for mounting board
JPH04236500A (en) * 1991-01-21 1992-08-25 Nec Corp Inspecting device for mounted polarity direction of polarized electronic component
JPH04236318A (en) * 1991-01-21 1992-08-25 Nec Corp Inspecting device of polarity of capacitor
JPH04342198A (en) * 1991-05-20 1992-11-27 Fujitsu Ltd Identifying apparatus for polarity of electronic component
JPH08195600A (en) * 1995-01-18 1996-07-30 Nagano Japan Radio Co Polarity inspection for electronic component
JPH095033A (en) * 1995-06-19 1997-01-10 Nagoya Denki Kogyo Kk Inspecting apparatus for mounted part of printed-circuit board
JPH1051199A (en) * 1996-07-31 1998-02-20 Nagoya Denki Kogyo Kk Inspection of orientation of mounted component
KR100227427B1 (en) * 1997-03-27 1999-11-01 전주범 Testing method and device for the polarity of electrolytic condenser using color sensor
TW381182B (en) * 1998-12-31 2000-02-01 Test Research Inc Testing method of In-circuit testing with image recognition system

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