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SE8704467D0 - Apparat for provning av kretskort - Google Patents

Apparat for provning av kretskort

Info

Publication number
SE8704467D0
SE8704467D0 SE8704467A SE8704467A SE8704467D0 SE 8704467 D0 SE8704467 D0 SE 8704467D0 SE 8704467 A SE8704467 A SE 8704467A SE 8704467 A SE8704467 A SE 8704467A SE 8704467 D0 SE8704467 D0 SE 8704467D0
Authority
SE
Sweden
Prior art keywords
contact
members
support
sockets
support plate
Prior art date
Application number
SE8704467A
Other languages
English (en)
Other versions
SE457315B (sv
Inventor
Reinhold Strandberg
Original Assignee
Reinhold Strandberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Reinhold Strandberg filed Critical Reinhold Strandberg
Priority to SE8704467A priority Critical patent/SE457315B/sv
Publication of SE8704467D0 publication Critical patent/SE8704467D0/sv
Priority to PCT/SE1988/000611 priority patent/WO1989005089A1/en
Publication of SE457315B publication Critical patent/SE457315B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
SE8704467A 1987-11-16 1987-11-16 Apparat foer provning av kretskort SE457315B (sv)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE8704467A SE457315B (sv) 1987-11-16 1987-11-16 Apparat foer provning av kretskort
PCT/SE1988/000611 WO1989005089A1 (en) 1987-11-16 1988-11-15 Apparatus for testing circuit cards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8704467A SE457315B (sv) 1987-11-16 1987-11-16 Apparat foer provning av kretskort

Publications (2)

Publication Number Publication Date
SE8704467D0 true SE8704467D0 (sv) 1987-11-16
SE457315B SE457315B (sv) 1988-12-12

Family

ID=20370228

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8704467A SE457315B (sv) 1987-11-16 1987-11-16 Apparat foer provning av kretskort

Country Status (2)

Country Link
SE (1) SE457315B (sv)
WO (1) WO1989005089A1 (sv)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3925505A1 (de) * 1989-04-05 1990-10-11 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE102006059429A1 (de) 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
JP6598294B2 (ja) * 2015-08-03 2019-10-30 株式会社笠作エレクトロニクス 充放電装置、充放電装置用のプローブピンの取付ユニット、充放電装置用のプローブピンユニット、及び充放電システム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2243457C3 (de) * 1972-09-04 1978-09-14 Werner 7750 Konstanz Heilmann Vorrichtung zum Prüfen elektronischer Schaltungen
DE2344239B2 (de) * 1973-09-01 1977-11-03 Luther, Erich, 3050 Wunstorf; Maelzer, Fritz; Maelzer, Martin; 7910 Reutti Post Neu-Ulm; Türkkan, Tamer, 3011 Laatzen Kontaktvorrichtung zum anschliessen einer gedruckten schaltung an ein pruefgeraet
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
DE3311977A1 (de) * 1983-03-31 1984-10-04 Siemens AG, 1000 Berlin und 8000 München Anordnung zum elektrischen abtasten einer baugruppe
AT395485B (de) * 1985-01-22 1993-01-25 Feinmetall Gmbh Pruefadapter
AT391762B (de) * 1985-11-26 1990-11-26 Alcatel Austria Ag Vorrichtung zum pruefen von leiterplatten

Also Published As

Publication number Publication date
SE457315B (sv) 1988-12-12
WO1989005089A1 (en) 1989-06-01

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