PL3076148T3 - Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego - Google Patents
Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującegoInfo
- Publication number
- PL3076148T3 PL3076148T3 PL15161923T PL15161923T PL3076148T3 PL 3076148 T3 PL3076148 T3 PL 3076148T3 PL 15161923 T PL15161923 T PL 15161923T PL 15161923 T PL15161923 T PL 15161923T PL 3076148 T3 PL3076148 T3 PL 3076148T3
- Authority
- PL
- Poland
- Prior art keywords
- measuring
- imaging system
- properties
- optical imaging
- optical
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/30—Collimators
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
- G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B43/00—Testing correct operation of photographic apparatus or parts thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Biomedical Technology (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Geometry (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP15161923.6A EP3076148B1 (de) | 2015-03-31 | 2015-03-31 | Vorrichtung und verfahren zum messen von abbildungseigenschaften eines optischen abbildungssystems |
Publications (1)
Publication Number | Publication Date |
---|---|
PL3076148T3 true PL3076148T3 (pl) | 2019-10-31 |
Family
ID=53039686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL15161923T PL3076148T3 (pl) | 2015-03-31 | 2015-03-31 | Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP3076148B1 (pl) |
KR (1) | KR102031947B1 (pl) |
CN (1) | CN106028024B (pl) |
PL (1) | PL3076148T3 (pl) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BR112019017815B1 (pt) * | 2017-03-14 | 2023-11-07 | Jfe Steel Corporation | Método e aparelho para medir quantidade de sinuosidade de uma tira durante transporte da mesma, e método e aparelho para detectar sinuosidade anormal |
KR102099977B1 (ko) | 2018-02-20 | 2020-04-10 | (주) 루리텍 | 콜리메이터쌍을 이용한 카메라 특성 관리장치 |
DE102019105622B4 (de) * | 2019-03-06 | 2022-03-17 | Konrad Gmbh | Kollimator und Verfahren zum Testen einer Kamera |
JP6733895B1 (ja) * | 2019-03-19 | 2020-08-05 | 株式会社Pfa | カメラモジュール製造装置及びカメラモジュール製造方法 |
CN112203080B (zh) * | 2019-07-08 | 2022-06-03 | 宁波舜宇光电信息有限公司 | 解像力测试方法、设备及存储介质 |
KR102083759B1 (ko) * | 2019-07-31 | 2020-03-02 | (주)이즈미디어 | 광학기구 정렬 검사장치 |
US11397417B2 (en) | 2019-11-23 | 2022-07-26 | Automation Engineering Inc. | Hybrid wide field of view target system |
DE102019135222A1 (de) * | 2019-12-19 | 2021-06-24 | Connaught Electronics Ltd. | System zum Bestimmen des Sichtfelds (FOV - Field of View) einer Kamera |
CN111093072A (zh) * | 2020-01-03 | 2020-05-01 | 深圳市同为数码科技股份有限公司 | 一种成像模组平整度调整、检测和固定的装置及方法 |
CN114731370B (zh) * | 2020-02-26 | 2023-08-29 | 株式会社Pfa | 相机模块制造装置 |
KR20210145439A (ko) * | 2020-05-25 | 2021-12-02 | 삼성전기주식회사 | 장착 구조물 및 이를 구비하는 검사 장치 |
IT202000014590A1 (it) * | 2020-06-18 | 2021-12-18 | Main Axis S R L | Dispositivo di controllo per corpi ottici |
CN111982472B (zh) * | 2020-08-17 | 2022-06-21 | 福州锐景达光电科技有限公司 | 测量逆投影光路放大倍率的方法及建立mtf曲线的方法 |
WO2022081370A1 (en) | 2020-10-15 | 2022-04-21 | Applied Materials, Inc. | In-line metrology systems, apparatus, and methods for optical devices |
CN115550640B (zh) * | 2022-10-09 | 2024-07-05 | 知行汽车科技(苏州)股份有限公司 | 一种逆畸变清晰度测试图卡设计方法 |
KR20240147046A (ko) | 2023-03-31 | 2024-10-08 | (주) 루리텍 | 챠트 기울어짐 처리 장치 및 방법 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
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US3733135A (en) * | 1971-06-23 | 1973-05-15 | Us Army | Method and apparatus for measuring image forming properties of an image display panel |
JPS5520420A (en) * | 1978-07-29 | 1980-02-13 | Ricoh Co Ltd | Mtf examination unit |
JPS5694883A (en) | 1979-12-27 | 1981-07-31 | Osawa Seimitsu Kogyo Kk | Focus detector for video camera |
JPS57172221A (en) * | 1981-04-16 | 1982-10-23 | Ricoh Co Ltd | Mtf measuring device for image sensor |
DE3225343A1 (de) * | 1982-07-07 | 1984-01-12 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und vorrichtung zur pruefung von linsen |
JPH10142102A (ja) * | 1996-11-07 | 1998-05-29 | Ricoh Co Ltd | レンズの測定装置及び方法 |
JPH11183326A (ja) * | 1997-12-25 | 1999-07-09 | Ricoh Co Ltd | レンズの測定装置及び測定方法 |
EP1503403B1 (en) * | 2002-04-17 | 2009-04-15 | Canon Kabushiki Kaisha | Reticle and optical characteristic measuring method |
CN1673708A (zh) * | 2004-03-23 | 2005-09-28 | 九骅科技股份有限公司 | 镜头光学解析量测系统 |
JP2005274925A (ja) | 2004-03-24 | 2005-10-06 | Pioneer Electronic Corp | ピント調整方法、ピント調整装置 |
US7598996B2 (en) | 2004-11-16 | 2009-10-06 | Aptina Imaging Corporation | System and method for focusing a digital camera |
GB2460654B (en) | 2008-06-03 | 2011-09-21 | Ian David Taylor | Autofocus system test chart |
US8675077B2 (en) * | 2008-07-23 | 2014-03-18 | Flir Systems, Inc. | Alignment metrology and resolution measurement system for imaging arrays |
CN101639351A (zh) * | 2008-07-30 | 2010-02-03 | 北京航天计量测试技术研究所 | 一种双轴ccd传感器光电自准直仪 |
CN101476977A (zh) * | 2009-01-13 | 2009-07-08 | 洛阳汉腾光电有限公司 | 一种摄像机光学性能检测装置及检测方法 |
JP2012058139A (ja) * | 2010-09-10 | 2012-03-22 | Fujifilm Corp | レンズ検査装置及び方法 |
DE102013212097A1 (de) * | 2013-06-25 | 2015-01-08 | Cassidian Optronics Gmbh | Kollimatorvorrichtung und Verfahren zur Prüfung und Justierung wenigstens eines optischen Geräts |
CN103512731B (zh) * | 2013-10-08 | 2017-08-01 | 中国计量科学研究院 | 一种镜片后顶焦度的测量方法 |
CN106092521B (zh) * | 2016-08-11 | 2019-04-12 | 麦克奥迪实业集团有限公司 | 一种高精度的物镜齐焦检测设备及检测方法 |
-
2015
- 2015-03-31 PL PL15161923T patent/PL3076148T3/pl unknown
- 2015-03-31 EP EP15161923.6A patent/EP3076148B1/de active Active
-
2016
- 2016-03-30 KR KR1020160038383A patent/KR102031947B1/ko active IP Right Grant
- 2016-03-31 CN CN201610196132.5A patent/CN106028024B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN106028024A (zh) | 2016-10-12 |
KR20160117336A (ko) | 2016-10-10 |
KR102031947B1 (ko) | 2019-10-14 |
EP3076148B1 (de) | 2019-05-08 |
CN106028024B (zh) | 2019-11-05 |
EP3076148A1 (de) | 2016-10-05 |
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