LU74728A1 - - Google Patents

Info

Publication number: LU74728A1
Authority: LU; Luxembourg

Application number

LU74728A

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1975-04-16

Filing date

1976-04-09

Publication date

1977-02-04

1976-04-09 Application filed filed Critical

1977-02-04 Publication of LU74728A1 publication Critical patent/LU74728A1/xx

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
- G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices By Optical Means (AREA)

LU74728A 1975-04-16 1976-04-09 LU74728A1 (xx)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE19752516756 DE2516756A1 (de)	1975-04-16	1975-04-16	Verfahren und vorrichtung zur bestimmung einer flaechenabmessung in einer ebene

Publications (1)

Publication Number	Publication Date
LU74728A1 true LU74728A1 (xx)	1977-02-04

Family

ID=5944131

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
LU74728A LU74728A1 (xx)	1975-04-16	1976-04-09

Country Status (8)

Country	Link
US (1)	US4067652A (xx)
BE (1)	BE840835A (xx)
DE (1)	DE2516756A1 (xx)
FR (1)	FR2308085A1 (xx)
GB (2)	GB1547185A (xx)
IT (1)	IT1066861B (xx)
LU (1)	LU74728A1 (xx)
NL (1)	NL7603785A (xx)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
SE429163C (sv) *	1977-03-17	1985-11-18	Bethlehem Steel Corp	Anordning och forfarande for kontinuerlig kompensering av felsignaler vid elektrooptisk metning av en i rorelse befintlig stangs tverdimensioner
CH617130A5 (xx) *	1977-11-04	1980-05-14	Radioelectrique Comp Ind
DE2819395C2 (de) *	1978-05-03	1980-01-10	Hoesch Werke Ag, 4600 Dortmund	Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen
BE876124A (fr) *	1979-05-08	1979-09-03	Centre Rech Metallurgique	Procede pour controler les dimensions de la section transversale des poutrelles
GB2052734B (en) *	1979-05-21	1983-10-19	Daystrom Ltd	Position and dimension measuring apparaus
DE2920531B2 (de) *	1979-05-21	1981-04-16	Exatest Meßtechnik GmbH, 5090 Leverkusen	Einrichtung zur Dimensionsmessung von eigenleuchtendem Meßgut
US5114230A (en) *	1979-09-07	1992-05-19	Diffracto Ltd.	Electro-optical inspection
DE2945251A1 (de) *	1979-11-09	1981-05-14	Betriebsforschungsinstitut VDEh - Institut für angewandte Forschung GmbH, 4000 Düsseldorf	Verfahren und vorrichtung zur bestimmung der lage einer oberflaeche
US4490617A (en) *	1979-11-26	1984-12-25	European Electronic Systems Limited	Optical width measuring system using two cameras
EP0094522A3 (en) *	1980-03-19	1984-07-18	European Electronic Systems Limited	Edge detection
DE3208527C2 (de) *	1981-04-11	1985-06-20	Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München	Einrichtung zum Steuern von Arbeitsgeräten, insbesondere von Gebläsen, Bürsten, Düsen oder dgl. in einer automatischen Fahrzeugwaschanlage
DE3151384A1 (de) *	1981-12-24	1983-07-07	Thyssen AG vorm. August Thyssen-Hütte, 4100 Duisburg	Verfahren zum messen der breite, insbesondere des kopfes, von selbstleuchtendem walzgut und verfahren zum schopfen des kopfes von selbstleuchtendem walzgut
DE3415043C1 (de) *	1984-04-21	1985-07-11	Eltro GmbH, Gesellschaft für Strahlungstechnik, 6900 Heidelberg	Verfahren und Schaltungsanordnung zum entfernungs- und winkelunabhaengigen Messen gleicher Abstandspunkte von einem gemeinsamen Bezugspunkt aus
US5383021A (en) *	1993-04-19	1995-01-17	Mectron Engineering Company	Optical part inspection system
US5994711A (en) *	1997-10-21	1999-11-30	Xerox Corporation	Copy substrate edge electronic registration system for a reprographic system
US6252661B1 (en)	1999-08-02	2001-06-26	James L. Hanna	Optical sub-pixel parts inspection system
US6313948B1 (en)	1999-08-02	2001-11-06	James I. Hanna	Optical beam shaper

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3619626A (en) *	1969-03-17	1971-11-09	United States Steel Corp	Digital edge position detector
US3694658A (en) *	1970-10-22	1972-09-26	Morvue Inc	Veneer inspection system
DE2200324A1 (de) *	1971-01-08	1972-07-27	Valio Meijerien	Eine Vorrichtung zum Feststellen der Breite einer bewegten Materialbahn od.dgl.
GB1379473A (en) *	1972-03-04	1975-01-02	Sensors Inc	Inspection methods apparatus and systems
DE2211235C3 (de) *	1972-03-08	1975-04-17	Siemens Ag, 1000 Berlin Und 8000 Muenchen	MeBmikroskop mit einer Auswertelogik und einer Anzeigevorrichtung zur fotoelektrischen Messung linearer Größen
DE2220819B2 (de) *	1972-04-27	1978-09-28	Siemens Ag, 1000 Berlin Und 8000 Muenchen	Vorrichtung zur Steuerung des Durchmessers eines Halbleiterstabes an der Erstarrungsfront der Schmelzzone beim tiegellosen Zonenschmelzen
SE378302B (xx) *	1972-07-03	1975-08-25	Aga Ab
DE2244433A1 (de) *	1972-09-06	1974-03-14	Licentia Gmbh	Anordnung zur fotoelektrischen bestimmung der abmessung eines objektes

1975
- 1975-04-16 DE DE19752516756 patent/DE2516756A1/de not_active Withdrawn
1976
- 1976-04-08 GB GB14236/76A patent/GB1547185A/en not_active Expired
- 1976-04-08 GB GB40527/78A patent/GB1547186A/en not_active Expired
- 1976-04-09 NL NL7603785A patent/NL7603785A/xx not_active Application Discontinuation
- 1976-04-09 LU LU74728A patent/LU74728A1/xx unknown
- 1976-04-13 IT IT22221/76A patent/IT1066861B/it active
- 1976-04-13 US US05/676,623 patent/US4067652A/en not_active Expired - Lifetime
- 1976-04-15 FR FR7611145A patent/FR2308085A1/fr active Granted
- 1976-04-15 BE BE6045453A patent/BE840835A/xx not_active IP Right Cessation

Also Published As

Publication number	Publication date
DE2516756A1 (de)	1976-10-28
FR2308085B1 (xx)	1981-12-11
FR2308085A1 (fr)	1976-11-12
US4067652A (en)	1978-01-10
NL7603785A (nl)	1976-10-19
IT1066861B (it)	1985-03-12
GB1547185A (en)	1979-06-06
BE840835A (fr)	1976-10-15
GB1547186A (en)	1979-06-06

Publication	Publication Date	Title
CH602070A5 (xx)	1978-07-31
CH591377A5 (xx)	1977-09-15
BG22095A1 (xx)	1977-02-20
BG22448A1 (xx)	1977-04-20
BG22570A1 (xx)	1977-04-20
BG22771A1 (xx)	1977-04-20
BG23358A1 (xx)	1977-08-10
CH201875A4 (xx)	1977-07-15
CH574658A5 (xx)	1976-04-15
CH579496A5 (xx)	1976-09-15
CH583885A5 (xx)	1977-01-14
CH584610A5 (xx)	1977-02-15
CH587404A5 (xx)	1977-04-29
CH587405A5 (xx)	1977-04-29
CH589226A5 (xx)	1977-06-30
CH589535A5 (xx)	1977-07-15
CH590569A5 (xx)	1977-08-15
CH590726A5 (xx)	1977-08-31
CH602396A5 (xx)	1978-07-31
CH591607A5 (xx)	1977-09-30
CH592425A5 (xx)	1977-10-31
CH592752A5 (xx)	1977-11-15
CH593737A5 (xx)	1977-12-15
CH594132A5 (xx)	1977-12-30
CH594134A5 (xx)	1977-12-30