[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

KR930011299A - Thin Film Transistor Manufacturing Method - Google Patents

Thin Film Transistor Manufacturing Method Download PDF

Info

Publication number
KR930011299A
KR930011299A KR1019910020852A KR910020852A KR930011299A KR 930011299 A KR930011299 A KR 930011299A KR 1019910020852 A KR1019910020852 A KR 1019910020852A KR 910020852 A KR910020852 A KR 910020852A KR 930011299 A KR930011299 A KR 930011299A
Authority
KR
South Korea
Prior art keywords
amorphous semiconductor
thin film
insulating film
source
film transistor
Prior art date
Application number
KR1019910020852A
Other languages
Korean (ko)
Other versions
KR940007458B1 (en
Inventor
강경철
Original Assignee
이헌조
주식회사 금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이헌조, 주식회사 금성사 filed Critical 이헌조
Priority to KR1019910020852A priority Critical patent/KR940007458B1/en
Publication of KR930011299A publication Critical patent/KR930011299A/en
Application granted granted Critical
Publication of KR940007458B1 publication Critical patent/KR940007458B1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Thin Film Transistor (AREA)

Abstract

본 발명은 양질의 액정표시를 실현할 수 있는 박막 트랜지스터 제조방법에 관한 것으로, 기판(1)상에 게이트(2) 형성후게이트 절연막(3)과 비정질 반도체(4) 및 n비정질 반도체(5)를 적층 패터닝하는 단계, 게이트 절연막(3)상의 n비정질 반도체(5) 및 비정질 반도체(4)의 불필요한 부분을 제거후 화소전극(7) 형성단계, 배리어 금속(6)을 증착하고 소오스/드레인용 전극(8)을 도프후 사진 시각법으로 소오스/드레인용 전극(8)과 배리어 금슥(6) 및 n비정질 반도체(5)의 불필요한 부분을 식각하는 단계로 이루어진다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a thin film transistor capable of realizing high quality liquid crystal display. The gate insulating film 3 and the amorphous semiconductor 4 and the n amorphous semiconductor 5 are formed after the gate 2 is formed on the substrate 1. Stack patterning, removing the unnecessary portions of the n-amorphous semiconductor 5 and the amorphous semiconductor 4 on the gate insulating film 3, and then forming the pixel electrode 7, depositing the barrier metal 6, and depositing a source / drain electrode. After dope (8), an unnecessary portion of the source / drain electrode 8, the barrier metallization 6, and the n amorphous semiconductor 5 is etched by a photographic visual method.

Description

박막 트랜지스터 제조방법Thin Film Transistor Manufacturing Method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2도는 본 발명 박막 트랜지스터의 공정 단면도.2 is a process cross-sectional view of the thin film transistor of the present invention.

Claims (1)

기판(1)상에 게이트(2)를 형성하고 게이트 절연막(3)과 비정질 반도체(4) 및 n비정필 반도체(5)를 차례로 적층하여 패터닝하는 단계와, 게이트 절연막(3)상의 n비정질 반도체(5) 및 비정질 반도체(4)의 불필요한 부분을 사진 식각법에 의해 제거하고 화소전극(7)을 형성하는 단계와, 배리어금속(6)을 증착하고 소오스/드레인용 전극(8)을 도프한후 사진 식각법으로 소오스/드레인용 전극(8)과 배리어 금속(6) 및 n비정질 반도체(5)의 불필요한 부분을 식각하는 단계로 제조함을 특징으로 하는 박막 트랜지스터 제조방법.Forming a gate 2 on the substrate 1, stacking and patterning the gate insulating film 3, the amorphous semiconductor 4, and the n amorphous semiconductor 5 in sequence, and the n amorphous semiconductor on the gate insulating film 3 (5) and removing unnecessary portions of the amorphous semiconductor 4 by photolithography to form the pixel electrode 7, depositing the barrier metal 6 and doping the source / drain electrode 8 And etching unnecessary portions of the source / drain electrode (8), the barrier metal (6), and the n amorphous semiconductor (5) by a photolithography method. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019910020852A 1991-11-21 1991-11-21 Manufacturing method of thin film transistor KR940007458B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019910020852A KR940007458B1 (en) 1991-11-21 1991-11-21 Manufacturing method of thin film transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910020852A KR940007458B1 (en) 1991-11-21 1991-11-21 Manufacturing method of thin film transistor

Publications (2)

Publication Number Publication Date
KR930011299A true KR930011299A (en) 1993-06-24
KR940007458B1 KR940007458B1 (en) 1994-08-18

Family

ID=19323253

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910020852A KR940007458B1 (en) 1991-11-21 1991-11-21 Manufacturing method of thin film transistor

Country Status (1)

Country Link
KR (1) KR940007458B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100498864B1 (en) * 2001-07-13 2005-07-04 르 라보레또레 쎄르비에르 New benzenesulphonamide compounds, a process for their preparation and pharmaceutical compositions containing them

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100498864B1 (en) * 2001-07-13 2005-07-04 르 라보레또레 쎄르비에르 New benzenesulphonamide compounds, a process for their preparation and pharmaceutical compositions containing them

Also Published As

Publication number Publication date
KR940007458B1 (en) 1994-08-18

Similar Documents

Publication Publication Date Title
KR970011965A (en) LCD and its manufacturing method
KR980003732A (en) Manufacturing method of liquid crystal display device
KR970022414A (en) Manufacturing method of liquid crystal display device
KR940003076A (en) Method of manufacturing multilayer thin film transistor
KR960032058A (en) Thin film transistor liquid crystal display device and manufacturing method thereof
KR970028753A (en) Manufacturing method of liquid crystal display element
KR930011299A (en) Thin Film Transistor Manufacturing Method
KR20020037417A (en) Method for manufacturing vertical tft lcd device
KR970054502A (en) Vertical thin film transistor and its manufacturing method, and pixel array for ultra thin liquid crystal display device using same
KR960024603A (en) Thin film transistor liquid crystal display device and manufacturing method thereof
KR950004584A (en) Manufacturing method of polycrystalline silicon thin film transistor with offset structure
KR960043292A (en) Manufacturing method of thin film transistor panel for liquid crystal display device
KR940000911A (en) LCD and Manufacturing Method
KR970075984A (en) A method of manufacturing an active matrix substrate and an active matrix substrate
KR950021763A (en) Method of manufacturing thin film transistor
KR940003088A (en) Method of manufacturing thin film transistor
KR970054501A (en) Low doping drain thin film transistor manufacturing method
KR970054490A (en) Manufacturing Method of Thin Film Transistor Liquid Crystal Display
KR970054506A (en) Method of manufacturing a fully self-matching thin film transistor using a laser
KR950006518A (en) Method of manufacturing polycrystalline silicon thin film transistor liquid crystal display
KR950012756A (en) Manufacturing method of thin film transistor for liquid crystal display device
KR940016904A (en) Method of manufacturing thin film transistor
KR950009980A (en) Source / Drain region formation method of semiconductor device
KR950033613A (en) TFT-LCD and its manufacturing method
KR930018756A (en) Thin film transistor of liquid crystal display and manufacturing method

Legal Events

Date Code Title Description
A201 Request for examination
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20070702

Year of fee payment: 14

LAPS Lapse due to unpaid annual fee