KR930011299A - Thin Film Transistor Manufacturing Method - Google Patents
Thin Film Transistor Manufacturing Method Download PDFInfo
- Publication number
- KR930011299A KR930011299A KR1019910020852A KR910020852A KR930011299A KR 930011299 A KR930011299 A KR 930011299A KR 1019910020852 A KR1019910020852 A KR 1019910020852A KR 910020852 A KR910020852 A KR 910020852A KR 930011299 A KR930011299 A KR 930011299A
- Authority
- KR
- South Korea
- Prior art keywords
- amorphous semiconductor
- thin film
- insulating film
- source
- film transistor
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title abstract description 3
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 claims abstract description 4
- 239000004065 semiconductor Substances 0.000 claims abstract 10
- 230000004888 barrier function Effects 0.000 claims abstract 4
- 238000000151 deposition Methods 0.000 claims abstract 3
- 239000002184 metal Substances 0.000 claims abstract 3
- 238000000059 patterning Methods 0.000 claims abstract 2
- 239000000758 substrate Substances 0.000 claims abstract 2
- 238000000206 photolithography Methods 0.000 claims 2
- 238000005530 etching Methods 0.000 claims 1
- 239000010408 film Substances 0.000 abstract 2
- 239000004973 liquid crystal related substance Substances 0.000 abstract 1
- 238000001465 metallisation Methods 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Thin Film Transistor (AREA)
Abstract
본 발명은 양질의 액정표시를 실현할 수 있는 박막 트랜지스터 제조방법에 관한 것으로, 기판(1)상에 게이트(2) 형성후게이트 절연막(3)과 비정질 반도체(4) 및 n비정질 반도체(5)를 적층 패터닝하는 단계, 게이트 절연막(3)상의 n비정질 반도체(5) 및 비정질 반도체(4)의 불필요한 부분을 제거후 화소전극(7) 형성단계, 배리어 금속(6)을 증착하고 소오스/드레인용 전극(8)을 도프후 사진 시각법으로 소오스/드레인용 전극(8)과 배리어 금슥(6) 및 n비정질 반도체(5)의 불필요한 부분을 식각하는 단계로 이루어진다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a thin film transistor capable of realizing high quality liquid crystal display. The gate insulating film 3 and the amorphous semiconductor 4 and the n amorphous semiconductor 5 are formed after the gate 2 is formed on the substrate 1. Stack patterning, removing the unnecessary portions of the n-amorphous semiconductor 5 and the amorphous semiconductor 4 on the gate insulating film 3, and then forming the pixel electrode 7, depositing the barrier metal 6, and depositing a source / drain electrode. After dope (8), an unnecessary portion of the source / drain electrode 8, the barrier metallization 6, and the n amorphous semiconductor 5 is etched by a photographic visual method.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제2도는 본 발명 박막 트랜지스터의 공정 단면도.2 is a process cross-sectional view of the thin film transistor of the present invention.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910020852A KR940007458B1 (en) | 1991-11-21 | 1991-11-21 | Manufacturing method of thin film transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910020852A KR940007458B1 (en) | 1991-11-21 | 1991-11-21 | Manufacturing method of thin film transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930011299A true KR930011299A (en) | 1993-06-24 |
KR940007458B1 KR940007458B1 (en) | 1994-08-18 |
Family
ID=19323253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910020852A KR940007458B1 (en) | 1991-11-21 | 1991-11-21 | Manufacturing method of thin film transistor |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR940007458B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100498864B1 (en) * | 2001-07-13 | 2005-07-04 | 르 라보레또레 쎄르비에르 | New benzenesulphonamide compounds, a process for their preparation and pharmaceutical compositions containing them |
-
1991
- 1991-11-21 KR KR1019910020852A patent/KR940007458B1/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100498864B1 (en) * | 2001-07-13 | 2005-07-04 | 르 라보레또레 쎄르비에르 | New benzenesulphonamide compounds, a process for their preparation and pharmaceutical compositions containing them |
Also Published As
Publication number | Publication date |
---|---|
KR940007458B1 (en) | 1994-08-18 |
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GRNT | Written decision to grant | ||
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LAPS | Lapse due to unpaid annual fee |