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KR20160078672A - Head limiting movement range of laser spot and atomic force microscope having the same - Google Patents

Head limiting movement range of laser spot and atomic force microscope having the same Download PDF

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Publication number
KR20160078672A
KR20160078672A KR1020140188493A KR20140188493A KR20160078672A KR 20160078672 A KR20160078672 A KR 20160078672A KR 1020140188493 A KR1020140188493 A KR 1020140188493A KR 20140188493 A KR20140188493 A KR 20140188493A KR 20160078672 A KR20160078672 A KR 20160078672A
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KR
South Korea
Prior art keywords
spot
cantilever
laser spot
movement restricting
head
Prior art date
Application number
KR1020140188493A
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Korean (ko)
Other versions
KR101678183B1 (en
Inventor
박상일
김동율
안병운
정상한
Original Assignee
파크시스템스 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to KR1020140188493A priority Critical patent/KR101678183B1/en
Priority to US14/757,519 priority patent/US9645168B2/en
Publication of KR20160078672A publication Critical patent/KR20160078672A/en
Application granted granted Critical
Publication of KR101678183B1 publication Critical patent/KR101678183B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
    • Y10S977/853—Biological sample

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a head for improving usability by limiting a moving range of a laser spot and an atomic force microscope having the head.
A head according to an embodiment of the present invention is a head for measuring deflection of the cantilever using laser light reflected on the surface of the cantilever in order to obtain information on a surface of a sample using a tip of a cantilever . The head comprising: spot moving means configured to move the laser spot so as to position the laser spot on the surface of the cantilever; And movement restricting means configured to limit a movement range of the laser spot which can be moved by the spot movement means to a predetermined range; .

Description

Technical Field [0001] The present invention relates to a head for limiting the range of movement of a laser spot, and an atomic microscope having the same. [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a head and an atomic microscope having the same, and more particularly, to a head having improved usability by limiting a moving range of a laser spot and an atomic microscope having the head.

Scanning Probe Microscope (SPM) is a microscope that scans microscopic probes produced through MEMS processes, etc., and scans the surface of the specimens, and displays the 3D surface images of the specimens. Such a scanning probe microscope can be classified into an AFM (Atomic Force Microscope), a Scanning Tunneling Microscope (STM), and the like according to a measurement method.

FIG. 1 is a schematic perspective view of an atomic microscope in which a conventional XY scanner and a Z scanner are separated, and FIG. 2 is a schematic conceptual view of a head used in an atomic microscope having the structure of FIG.

1, the atomic force microscope 10 includes a cantilever 2 that follows a surface of a measurement target 1 in contact or noncontact state, an XY scanner (not shown) that scans an object to be measured in the XY plane in the X and Y directions A Z scanner 21 connected to the cantilever 2 to move the cantilever 2 in a relatively small displacement in the Z direction and a Z scanner 21 connected to the cantilever 2 to move the cantilever 2 and the Z scanner 21 in Z And a stationary frame 13 for fixing the XY scanner 11 and the Z stage 12. The XY scanner 12 and the XY scanner 12 are fixed to each other.

The atomic force microscope 10 scans the surface of the measurement target 1 with the cantilever 2 to obtain an image such as a topography. The relative movement between the surface of the measurement target 1 and the cantilever 2 can be performed by the XY scanner 11. Moving the cantilever 2 up and down along the surface of the measurement target 1 can be performed by the Z scanner (Not shown).

The cantilever 2 and the Z scanner 21 are connected by a probe arm 22. The head 20 including the probe arm 22 and the Z scanner 21 is shown in FIG. It was not explicitly shown.

Referring to FIG. 2, the head 20 is configured to measure the movement (for example, the degree of warping) of the cantilever 2 by the laser system and to provide it to the controller not shown.

The head 20 has a laser beam generator 23 for irradiating a laser beam to the mirror 24 fixed to the intermediate body 28. The laser beam generator 23 irradiates the mirror 24 with a laser beam. The laser light is directly reflected by the mirror 24, passes through the hole formed in the intermediate body 28, and is reflected again on the upper surface of the cantilever 2. The reflected laser light is reflected again by the steering mirror 25 and is incident on the light detecting device 26. Here, the optical detection device 26 mainly uses a PSPD (Position Sensitive Photo Detector), and the laser spot is located in the center of the PSPD, thereby completing the preparation of the measurement. The Z scanner 21 is controlled based on the signal detected by the light detecting device 26. [ The optical detecting device 26 may be fixed to the housing 30 of the head 20, and the specific arrangement of the optical detecting device 26 will be omitted for convenience of description.

In order to place the laser spot in the center of the light detecting device 26, it is necessary to first arrange the laser spot on the upper surface of the cantilever 2. The user uses the vision system (not shown) that can see the upper side of the cantilever 2 to visually check whether or not the laser spot is located on the upper surface of the cantilever 2 and adjust the position of the adjustment knobs 27A, So that the laser spot is positioned on the upper surface of the cantilever 2 manually. The adjustment knobs 27A and 27B can change the path of the laser light by changing the inclination of the intermediate body 28 supporting the mirror 24. [ For example, the adjustment knob 27A may cause movement of the laser spot along the width direction of the cantilever 2, and the adjustment knob 27B may cause the movement of the laser spot along the length direction of the cantilever 2 have.

The spot region (hereinafter referred to as spot region) of the laser spot which can be adjusted by the adjustment knobs 27A and 27B is widely designed to accommodate the cantilevers 2 of various sizes and to reflect assembly tolerances and the like.

However, the widely designed spot area causes inconvenience in use. The user adjusts the laser spots to the upper surface of the cantilever 2 by adjusting the adjustment knobs 27A and 27B again at the time of changing the cantilever 2 because the laser spot is missed in the vision system due to the large spot area It happens frequently. Users who are not familiar with the device will spend a great deal of time unnecessarily placing the laser spot on the upper surface of the cantilever 2, thereby causing a great inconvenience to use.

(Patent Document 1)

Korean Patent No. 10-0646441

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a head having improved usability by limiting a moving range of a laser spot and an atomic microscope having the same.

The problems of the present invention are not limited to the above-mentioned problems, and other problems not mentioned can be clearly understood by those skilled in the art from the following description.

According to an aspect of the present invention, there is provided a head for irradiating a laser beam onto a surface of a cantilever using a tip of a cantilever, Of the head. The head comprising: spot moving means configured to move the laser spot so as to position the laser spot on the surface of the cantilever; And movement restricting means configured to limit a movement range of the laser spot which can be moved by the spot movement means to a predetermined range; .

According to another aspect of the present invention, the spot moving means has a knob and a screw forming portion, and moves the laser spot by a linear movement of an end portion by the rotation of the knob. The movement restricting means limits the rotation of the knob to a predetermined range.

According to another aspect of the present invention, the restricting means is a protruding portion protruding to the outer circumferential surface of the spot moving means, and a latching portion is formed so that the protruding portion can be caught.

According to still another aspect of the present invention, the movement restricting means is detachable to the spot moving means, and the restricting means includes a protruding portion protruding to the outer circumferential surface thereof, and the locking portion is formed so that the protruding portion can be caught.

According to another feature of the present invention, the movement restricting means restricts the positionable region of the laser spot, and controls the movement of the laser spot in the center of the locatable region of the laser spot so that the target point of the surface of the predetermined cantilever is located. A limiting means is mounted on the spot moving means.

An atomic force microscope according to an embodiment of the present invention includes a head having the above-described structure.

According to the head and the atomic force microscope having the head according to the present invention, the laser spot can be easily positioned on the surface of the cantilever by limiting the movement range of the laser spot to a predetermined range, thereby providing high usability and convenience .

1 is a schematic perspective view of an atomic force microscope in which a conventional XY scanner and a Z scanner are separated.
2 is a schematic conceptual view of a head used in an atomic force microscope having the structure of FIG.
3 is a conceptual diagram schematically showing a laser spot adjusting mechanism provided in a head of a general atomic microscope.
4 is a schematic perspective view schematically showing the restricting means and the engaging portion;
Fig. 5 is a schematic top view for explaining the action of the restricting means and the engaging portion of Fig. 4;

BRIEF DESCRIPTION OF THE DRAWINGS The advantages and features of the present invention, and the manner of achieving them, will be apparent from and elucidated with reference to the embodiments described hereinafter in conjunction with the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Is provided to fully convey the scope of the invention to those skilled in the art, and the invention is only defined by the scope of the claims.

It is to be understood that elements or layers are referred to as being "on " other elements or layers, including both intervening layers or other elements directly on or in between.

Although the first, second, etc. are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are used only to distinguish one component from another. Therefore, it goes without saying that the first component mentioned below may be the second component within the technical scope of the present invention.

Like reference numerals refer to like elements throughout the specification.

The sizes and thicknesses of the individual components shown in the figures are shown for convenience of explanation and the present invention is not necessarily limited to the size and thickness of the components shown.

It is to be understood that each of the features of the various embodiments of the present invention may be combined or combined with each other partially or entirely and technically various interlocking and driving is possible as will be appreciated by those skilled in the art, It may be possible to cooperate with each other in association.

Hereinafter, a head and an atomic force microscope according to the present invention will be described with reference to the accompanying drawings.

Fig. 3 is a conceptual view schematically showing a laser spot adjusting mechanism provided in a head of a general atomic microscope, Fig. 4 is a schematic perspective view schematically showing a restricting means and a catching part, Fig. 5 is a cross- Is a schematic top view for explaining the negative action.

Prior to the detailed description, the configurations illustrated in Figs. 3 to 5 only show those related to configurations performing the function of positioning the laser spot on the upper surface of the cantilever, among various configurations of heads provided in the atomic microscope Be careful about points. (For example, a configuration in which the laser light reflected on the upper surface of the cantilever is positioned at the center of the optical detecting device, a configuration of the Z scanner, etc.) other than the configurations exemplified in Figs. 3 to 5, According to the configuration of the head is satisfactory. For example, the other configurations may follow the configurations of Figs. 1 and 2, or may follow the configuration of the head of the atomic microscope of a totally different type.

Referring to FIG. 3, a mirror 24 is attached and positioned on the intermediate body 28. Here, instead of the mirror 24, a known prism may be used to form the optical path.

The laser light generating section 23 irradiates laser light (indicated by a dotted line) toward the mirror 24. The laser light reflected by the mirror 24 is directed downward. The laser light generating unit 23 is fixed so as not to be displaced relative to the incremental body 28 and the mirror 24. That is, the laser light generating section 23 is relatively not movable relative to the mirror 24.

Spot moving means 27A and 27B are provided to change the laser light path that is reflected from the mirror 24 and directed downward. 3), and the spot moving means 27A, 27B are rotatably mounted on the other side of the other side edge of the intermediate body 28. The one side edge portion of the intermediate body 28 is rotatably fixed to the housing (30 of Figs. 2 and 4) Are positioned to make point contact with the portions.

A spring (not shown) provides an elastic force to the intermediate body 28 in the + Z direction in order to maintain contact between the intermediate body 28 and the spot moving means 27A and 27B. Each of the spot moving means 27A and 27B has a knob 27a and a screw forming portion 27b which are knobs respectively and the screw forming portion 27b is screwed to the housing 30 of the head, , The spot moving means 27A and 27B can move up and down.

The spot moving means 27A is moved up and down by rotation to rotate the intermediate body 28 about the X axis to cause movement of the laser spot along the Y direction. Further, the spot moving means 27B is moved up and down by rotation to rotate the intermediate body 28 about the Y-axis, thereby causing movement of the laser spot along the X-direction.

Referring to Figs. 4 and 5, the movement restricting means 40, which is further added to the head 20 having the configuration of Figs. 2 and 3, will be described in detail.

The movement restricting means 40 limits the spot moving means 27A and 27B so that the laser spot can be moved only within a predetermined range. The movement restricting means 40 has a hollow 41 so that the knob 27a can be inserted from the upper side of the knob 27a. It is preferable that the movement restricting means 40 is detachable to the spot moving means 27A and 27B as shown in Fig. 4, and the details will be described later.

In the meantime, the hollow 41 is closed to the upper side and opened to the lower side in the present embodiment, but the present invention is not limited thereto, and the hollow 41 may be opened to the upper side.

When the movement restricting means 40 is fitted in the knob 27a of the spot moving means 27A and 27B, the spot moving means 27A and 27B are rotated by the rotation of the movement restricting means 40. [ That is, the movement restricting means 40 and the spot moving means 27A and 27B are fixed to each other. The fixing means may be variously configured. For example, the fixing means 40 may be fixed to the inner peripheral surface of the movement limiting means 40 and the protruding portions respectively formed on the outer peripheral surface of the knob 27a by engagement of the slit, The movement restricting means 40 and the knob 27a may be fixed by inserting and screwing a set screw into the screw hole. The movement restricting means 40 and the knob 27a can be fixed in various ways.

On the outer circumferential surface of the movement restricting means 40, a protruding portion 42 is provided. The protruding portion 42 is a protruding portion having a turning radius larger than the turning radius of the outer circumferential surface of the movement restricting means 40. The protruding portion 42 is formed to be engageable with the engaging portion 31 formed in the housing 30 of the head.

5, the rotation of the spot moving means 27A, 27B is restricted by the physical interference between the projecting portion 42 and the engaging portion 31. As shown in Fig. The spot moving means 27A and 27B can rotate by R °, and R ° can be adjusted in design by the width of the projecting portion 42, the size of the engaging portion 31, and the like. On the other hand, on the other hand, it is also possible to limit the spot moving means 27A, 27B by providing two or more catching portions 31, and to limit the spot moving means 27A, 27B by adjusting the shape of the catching portion 31 It is possible.

Since the pitches of the screw forming portions 27b of the spot moving means 27A and 27B are determined in advance, the up and down moving widths of the spot moving means 27A and 27B, which are restricted when the desired R ° is determined, are determined. The distance that the laser spot is moved when the up-down moving width is determined can also be determined by calculation. The distance by which the laser spot is moved depends on various design criteria (that is, it may vary depending on the positional relationship between the fixed portion P and the spot moving means 27A and 27B), and may be appropriately selected.

Hereinafter, a method of providing the movement restricting means 40 to the spot moving means 27A, 27B will be described.

The movement restricting means 40 restricts the positionable area of the laser spot so that the movement restricting means 40 moves the spot moving means (not shown) so that the desired point of the surface of the predetermined cantilever is located at the center of the locatable region of the laser spot 27A, 27B.

First, the reference (predetermined) cantilever is mounted on the head 20, and then the spot moving means 27A and 27B are adjusted to position the laser spot on the upper surface of the cantilever 2. [ Here, the reference cantilever is preferably a frequently used cantilever.

Thereafter, as shown in Fig. 5, the movement restricting means 40 is fixed to the spot moving means 27A, 27B with the protruding portion 42 of the movement restricting means 40 being positioned opposite to the engaging portion 31. [ That is, the projecting portion 42 is set so that it can be positioned at the center of the rotatable region of the spot moving means 27A, 27B. Accordingly, the laser spot can be moved only a limited distance in the X and Y directions about the target upper surface of the cantilever.

If the reference cantilever is to be changed or the moving region of the laser spot must be changed again due to any cause (for example, abrasion of a portion in contact with the spot moving means 27A, 27B, etc.) .

If the movement restricting means 40 is mounted as described above, by limiting the moving region of the laser spot, the position of the laser spot can be predicted to some extent, thereby increasing the usability.

In addition, the movement restricting means 40 is detachable, and thus can be reset according to the situation. It should be noted, however, that it is not excluded that the movement restricting means is formed in the spot moving means 27A, 27B itself. In this case, the movement restricting means may be a protruding portion protruding to the outer peripheral surface of the spot moving means 27A, 27B. 4, the protrusion 42 is not formed in the movement restricting means 40 but may be integrally formed on the surface of the knob 27a.

On the other hand, in the case of using another cantilever which is completely different from the reference cantilever, the movement restricting means 40 may be removed from the spot moving means 27A, 27B and the existing method may be used. That is, since the movement restricting means 40 is detachable, it is possible to cope with various situations, and thus the usability of the equipment is increased.

Other than the above-described configuration, the configuration of the heads and atomic force microscopes of the XE series and NX series of Park Systems Inc., which is the applicant of this patent, can be followed. However, the present invention is not limited thereto.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, You will understand. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive.

23 ... The laser light generating unit 24 ... mirror
27A, 27B ... The spot moving means 27a ... Knob
27b ... Screw forming portion 28 ... Intermediate body
30 ... Housing 31 ... [0030]
40 ... Movement restricting means 41 ... Hollow
42 ... projection part

Claims (6)

A head for measuring deflection of the cantilever using laser light reflected on a surface of the cantilever to obtain information on a surface of a sample using a tip of the cantilever,
Spot moving means configured to move the laser spot so as to position the laser spot on the surface of the cantilever; And
Movement restricting means configured to limit a movement range of the laser spot which can be moved by the spot movement means to a predetermined range; ≪ / RTI > The method according to claim 1,
Wherein the spot moving means has a knob and a screw forming portion and moves the laser spot by linear motion of the end portion by the rotation of the knob,
Wherein the movement restricting means limits the rotation of the knob to a predetermined range. 3. The method of claim 2,
Wherein the movement restricting means is a protrusion protruding from the outer circumferential surface of the spot moving means,
And the engaging portion is formed to engage with the projection. 3. The method of claim 2,
Wherein the movement restricting means is detachable to the spot moving means,
Wherein the movement restricting means has a protruding portion protruding from the outer circumferential surface thereof,
And the engaging portion is formed to engage with the projection. 5. The method of claim 4,
The movement restricting means limits the positionable area of the laser spot,
Characterized in that the movement restricting means is mounted on the spot moving means such that a desired point on the surface of the predetermined cantilever is located at the center of the locatable region of the laser spot. An atomic force microscope comprising a head according to any one of claims 1 to 5.
KR1020140188493A 2014-12-24 2014-12-24 Head limiting movement range of laser spot and atomic force microscope having the same KR101678183B1 (en)

Priority Applications (2)

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KR1020140188493A KR101678183B1 (en) 2014-12-24 2014-12-24 Head limiting movement range of laser spot and atomic force microscope having the same
US14/757,519 US9645168B2 (en) 2014-12-24 2015-12-23 Head limiting movement range of laser spot and atomic force microscope having the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020140188493A KR101678183B1 (en) 2014-12-24 2014-12-24 Head limiting movement range of laser spot and atomic force microscope having the same

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KR101678183B1 KR101678183B1 (en) 2016-11-22

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08101219A (en) * 1994-09-30 1996-04-16 Shimadzu Corp Scanning probe microscope
KR20040092608A (en) * 2003-04-24 2004-11-04 대한민국(서울대학교 총장) Head of atomic force microscope

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157251A (en) * 1991-03-13 1992-10-20 Park Scientific Instruments Scanning force microscope having aligning and adjusting means
US6677567B2 (en) * 2002-02-15 2004-01-13 Psia Corporation Scanning probe microscope with improved scan accuracy, scan speed, and optical vision
US7478552B2 (en) * 2006-03-21 2009-01-20 Veeco Instruments Inc. Optical detection alignment/tracking method and apparatus
US8321960B2 (en) * 2008-01-24 2012-11-27 Shimadzu Corporation Scanning probe microscope

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08101219A (en) * 1994-09-30 1996-04-16 Shimadzu Corp Scanning probe microscope
KR20040092608A (en) * 2003-04-24 2004-11-04 대한민국(서울대학교 총장) Head of atomic force microscope

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US20160187373A1 (en) 2016-06-30
US9645168B2 (en) 2017-05-09
KR101678183B1 (en) 2016-11-22

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