KR20110047887A - Temperature detect circuit - Google Patents

Abstract

The present invention relates to a temperature detection circuit for accurately detecting the temperature in the product for the smooth operation of the product. The present invention provides reference value generating means for generating a reference value to be used for temperature detection; Voltage generating means for generating an analog voltage with respect to the temperature detection value; Pulse generating means for varying and generating the period of the enable pulse signal based on the reference value level in accordance with the detection temperature; And a comparison means for comparing the analog voltage value and the reference value according to the detection temperature and outputting the comparison value when the variably adjusted enable pulse signal is input.

Description

TEMPERATURE DETECT CIRCUIT}

The present invention relates to a temperature detection circuit for accurately detecting the temperature in the product for the smooth operation of the product.

The semiconductor device is used in various fields, but one of them is used to store various kinds of data. Since such semiconductor memory devices are used in various portable devices, including desktop computers and notebook computers, large capacity, high speed, small size, and low power are required.

In addition, semiconductor devices use various types of internal voltages by using externally supplied power voltages. In particular, in the case of a semiconductor memory device (DRAM), a voltage of VCORE which is a voltage used in a core region of the memory device, a VPP voltage which is higher than an external potential VDD applied to a cell transistor gate (word line), and a cell The negative voltage VBB, which is lower than the ground voltage VSS used for the bulk of the transistor, is used. This internal voltage must be at a constant level for PVT (Process, Voltage, Temperature) changes at low operating supplies.

Therefore, in order to control the normal operation of the semiconductor device, it is necessary to detect the operating temperature of the product and perform appropriate control according to the rise or fall of the temperature. Therefore, the semiconductor device includes a configuration for detecting a temperature and transferring the same to a device such as a CPU.

However, in the process of detecting the temperature and transmitting it to the CPU, the conventional temperature detector generates enable pulses at regular intervals without considering the temperature of the region, and converts current or voltage, which is an analog value for the detected temperature, into a digital value. Is outputting. The enable pulse is a value generated by the oscillation address OSCILLATION ADDRESS of the clock signal and the mode register set MRS. Therefore, when the enable pulse is generated at the same period in the conventional temperature detection device, there is a problem of generating an incorrect temperature code as an output value at a value close to an absolute value.

Accordingly, an object of the present invention is to provide a temperature detection circuit capable of accurately detecting a temperature around a product and delivering an accurate temperature code to a CPU in accordance with the sensed temperature.

A temperature detection circuit according to an embodiment of the present invention for achieving the above object comprises: reference value generating means for generating a reference value to be used for temperature detection; Voltage generating means for generating an analog voltage with respect to the temperature detection value; Pulse generating means for varying and generating the period of the enable pulse signal based on the reference value level in accordance with the detection temperature; And a comparison means for comparing the analog voltage value and the reference value according to the detection temperature and outputting the comparison value when the variably adjusted enable pulse signal is input.

The present invention variably adjusts the enable operation cycle according to the change of the ambient temperature at the time of detecting the temperature of the product. With this control, the present invention enables accurate temperature detection according to the ambient temperature, and delivers accurate information to the CPU, thereby achieving the effect of smooth operation control of the product.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The following embodiments are provided as examples to sufficiently convey the spirit of the present invention to those skilled in the art. Accordingly, the present invention is not limited to the embodiments described below and may be embodied in other forms. In addition, in the drawings, the size and thickness of the device may be exaggerated for convenience. Like numbers refer to like elements throughout.

1 is a control block diagram for temperature detection according to an embodiment of the present invention.

When the voltage initialization value VPWRUP is input, the reference value generator 10 generates an absolute value VTEMP, which is a reference value to be used for temperature detection, by the detection value of the temperature variable element BJT.

When the temperature detection value TEMP_SENSEON is input, the voltage generator 20 generates an analog voltage with respect to the input temperature detection value.

When the temperature reading signal and the clock signal are input, the pulse generator 30 generates an enable pulse signal used in the operation of reading out the detected temperature.

The comparator circuit 40 inputs an absolute value generated in the reference value generator 10, an analog voltage value generated in the voltage generator 20, an enable pulse signal generated in the pulse generator 30, and a temperature detection value. . When the enable pulse signal is input, the comparator circuit 40 compares the analog voltage value according to the detection temperature with the absolute value according to the reference value and outputs the comparison value. In this way, the output signal is transferred to the CPU, thereby controlling the temperature.

On the other hand, the present invention is characterized in that the enable pulse period value is adjusted differently according to the analog voltage value of the detection temperature when the temperature detection is performed in the portion close to the reference voltage and when the temperature is detected in the portion far from the reference voltage. have. Therefore, the present invention requires a control process for adjusting the enable pulse period value.

2 to 4 show a detailed configuration of the pulse generator 30 for generating the enable pulse signal shown in FIG.

First, referring to FIG. 2, the pulse generator 30 includes two comparators for comparing analog voltage values according to temperature detection values with respect to a reference value REF, and calculates an output value of the comparator to enable the enable signal EN. Is occurring.

That is, the first comparator is a configuration for judging whether the detected temperature value is included in the constant level range 1 raised on the basis of the reference value REF level. The second comparator is configured to determine whether the detected temperature value is included in the constant level range 2 lowered on the basis of the reference value level.

Therefore, when the enable signal EN generated by the combination of the first and second comparators is a high signal, the temperature detection value is determined to be located near the reference value REF. On the contrary, when the enable signal EN generated by the combination of the first and second comparators is a low signal, it is determined that the temperature detection value is located at a predetermined level or more away from the reference value REF.

Next, the pulse generator 30 of the present invention uses an oscillator signal having two different periods, as shown in FIG. The oscillator signal is used as follows.

FIG. 4 illustrates a control configuration diagram of generating the enable pulse signal ENABLEP using the enable signal EN and the oscillator signals OSC1 and OSC2 shown in FIGS. 2 and 3.

That is, the first oscillator signal OSC1 and the enable signal EN pass through a calculator composed of a NAND gate and an inverter to generate a first pulse signal. In addition, the second oscillator signal OSC2 and the inverted signal ENB of the enable signal pass through a calculator composed of a NAND gate and an inverter to generate a second pulse signal. The signal passing through the two calculators is selected from an operator consisting of a combination of a noah gate and an inverter and outputs the signal. The pulse signal output from the NOA gate and a signal generated by passing the pulse signal through a delay circuit composed of a plurality of inverters are combined in a calculator consisting of a NAND gate and an inverter to generate a final pulse signal.

Accordingly, according to the above configuration, the pulse generator 30 is operated by the first pulse signal generated by the first oscillator signal OSC1 when the enable signal EN input is a high signal. The cycle is adjusted quickly. On the contrary, when the enable signal EN input is a low signal, the enable pulse period which is operated by the second pulse signal generated by the second oscillator signal OSC2 is slowly adjusted.

The above-described preferred embodiment of the present invention is disclosed for the purpose of illustration, and may be applied to a case in which the enable operation period is variably adjusted according to the change of the ambient temperature when the temperature of the product is detected. Therefore, those skilled in the art will be able to improve, change, substitute or add other embodiments within the technical spirit and scope of the present invention disclosed in the appended claims.

1 is a block diagram of a temperature detection circuit according to an embodiment of the present invention;

2 is a block diagram of a comparator included in the pulse generator shown in FIG.

3 is an exemplary oscillator signal used in the pulse generator shown in FIG.

4 is a block diagram of a pulse generator included in the pulse generator shown in FIG.

Explanation of symbols on the main parts of the drawings

10: reference value generator 20: voltage generator

30: pulse generator 40: comparator circuit

Claims (5)

Reference value generating means for generating a reference value to be used for temperature detection; Voltage generating means for generating an analog voltage with respect to the temperature detection value; Pulse generating means for varying and generating the period of the enable pulse signal based on the reference value level in accordance with the detection temperature; And a comparison means for comparing the analog voltage value and the reference value according to the detection temperature and outputting the comparison value, when the variably adjusted enable pulse signal is input. The method of claim 1, And the pulse generating means includes a comparing section for determining in which range the detection temperature is included on the basis of the reference value level. The method of claim 2, The pulse generating means further comprises a pulse generator for varying the enable pulse period in accordance with the determined value of the comparator. The method of claim 3, wherein The pulse generator further includes a selector for selecting an oscillator signal for determining an enable pulse period. The method of claim 4, wherein The pulse generation unit further includes a delay circuit for delaying a predetermined amount of the pulse signal selected by the selection unit.

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