KR20110046053A - burn-in test apparatus for USB menory device - Google Patents

Abstract

PURPOSE: A burn-in test device of a USB memory device is provided to improve the reliability and efficiency of a test by preventing particles. CONSTITUTION: A sealing chamber(A) is opened or closed by a door. A plurality of connection holes penetrate through the sealing chamber along a vertical inner surface facing the door. A plurality of mounting holes(75) penetrate through a vertical planar test panel(74). The plurality of mounting holes correspond to the plurality of connection hole one by one. An air conditioning unit circulates cold and warm gas in the sealing chamber. A USB memory device is fitted to the USB connector. A cable connected to a USB connector is drawn toward the side of the sealing chamber. The mounting hole and the connection hole penetrate through a cylindrical USB holder.

Description

Burn-in test apparatus for USB menory device

The present invention relates to an apparatus for burn-in test of a USB memory device. More specifically, the present invention is a burn-in test device for checking the normal operation of a USB memory device for a high temperature and low temperature environment. The present invention relates to a burn-in test device for a USB memory device, which can be greatly reduced and greatly improves the reliability and efficiency of the test.

Universal Serial Bus (USB) was developed to meet the interconnection needs of the Computer Telephony Integration (CTI) industry, starting with version 0.7 in 1994, then version 1.0 in 1996, and version 2.0 in 2000. It has already become the most widely used I / O interface in the world.

USB is a universal bus specification for the plug and play interface of computers and peripherals. Its data transfer speed is fast, highly scalable, requires no power, and hot-plug PnP. Support.

As a result, USB is attracting the most attention in the USB memory device category among USB MSCs, and the size and size of light and small size are based on the technological development of the semiconductor and packaging industries. Thanks to the increased capacity, it is widely used in security media and operating system media beyond simple data storage media. In addition, USB memory devices are becoming an indispensable necessity in modern life, pursuing compatibility with functions such as integrated SD cards as well as design changes to express user's personality.

Keeping up with the trend, among the many items that determine the product competitiveness of USB memory devices, maintaining a high level of reliability against external changes is the main topic. To verify this, each manufacturer conducts a burn-in test to verify the normal operation of the product for extreme temperatures of low temperature and high temperature before completion of the USB memory device. do.

1 is a photograph for explaining a general burn-in test method of a USB memory device.

As can be seen, for general burn-in testing, secure multiple USB memory devices (2) in a USB rack (USB rack: 10). In this case, a horizontal test panel 12 is provided in the form of a multi-layer shelf in the USB rack 10, and a plurality of USB connectors exist on the upper surface of the test panel 12 for fixing the USB memory device 2. The USB connector is connected to a separate controller through a cable 14 drawn from the test panel 12.

Subsequently, after mounting the USB rack 10 in a temperature-controlled burn-in chamber, it is sealed and the internal temperature is adjusted. During this process, the controller applies an input signal to the USB memory device 2 through the cable 14 and analyzes the output signal to check whether the USB memory device 2 operates normally according to the corresponding temperature.

However, the above general burn-in test presents several problems, one of which is the difficulty in keeping the burn-in chamber tight due to the cable 14.

That is, for the burn-in test, the USB rack 10 is mounted in the burn-in chamber and placed in a sealed environment separated from the outside, while the controller cannot be mounted inside the burn-in chamber. Because of this, the cables 14 are connected to each other. For this purpose, the cables 14 must substantially penetrate the burn-in chamber, thereby greatly preventing the airtightness. If airtight in the burn-in chamber is not maintained, temperature control will be difficult to obtain accurate test results and may lead to safety problems due to leakage of high or low temperature environments.

In addition, the user must take out the USB rack 10 from the burn-in chamber every time, replace the USB memory device 2, and then reinsert it, which is not only annoying, but also a cause of fatal contamination of the burn-in chamber. The probability of particle generation is high.

In addition, there is a high possibility that part of the cable 14 in the structure of the general burn-in chamber and the USB rack 10 is exposed to the inside of the burn-in chamber. Due to the extreme environment inside the burn-in chamber, there is a possibility that the cable 14 may be damaged, and even if an insulating coating is used, the probability of particle generation due to hardening is high, which greatly reduces the test reliability.

The present invention has been made to solve the above problems. That is, an object of the present invention is to provide a burn-in test device for a USB memory device that is easy to maintain airtightness of a closed space in which a high temperature and low temperature environment is created, has excellent workability, and has low occurrence of particles. In addition, the present invention aims to provide a space-efficient burn-in test device of the USB memory device to be installed and operated in a small space, thereby greatly increasing the reliability and efficiency of the burn-in test of the USB memory device I want to improve.

In order to achieve the above object, the present invention, the front facing toward the user is opened and closed by the door and the plurality of connecting holes along the inner side of the vertical facing the door; A test panel of a vertical plane in close contact with the inner side and having a plurality of mounting holes penetrating one-to-one with the connection hole; Air conditioning means for circulating cold / hot gas into the sealed chamber; A cylindrical shape in which a USB connector on one side to which the USB memory device is inserted is inserted through the mounting hole and the connection hole in a one-to-one correspondence to closely contact the test panel so that the cable connected to the USB connector is drawn out to the other side outside the sealed chamber. A burn-in test apparatus for a USB memory device including a USB holder is provided.

At this time, the air-conditioning means is provided on the upper end of the sealed chamber and the first duct through the plurality of inflow holes on the bottom facing the sealed chamber; A second duct provided at a lower end of the sealed chamber and having a plurality of exhaust holes penetrated through the upper surface facing the sealed chamber; A third duct provided at one side of the sealed chamber and connecting the first and second ducts; A blowing fan installed in the third duct; A heat exchanger of a cooling system installed between the second duct and the blowing fan; And a heater installed between the second duct and the blowing fan.

The apparatus may further include a fan cover mounted on the third duct and provided with a suction hole connected to the second duct and a supply hole connected to the first duct via the heat exchanger and the heater to cover the blower fan. And a controller room integrally provided at a rear surface of the sealed room to accommodate the other side of the holder; A controller mounted in the controller room and connected to the cable to control whether the USB device is normally operated by an electrical method; And a device chamber integrally provided at a lower end of the sealed chamber and the controller chamber and receiving the cooling system, the at least one being fixed to the outer surface of the holder and closely attached to the mounting hole and the connection hole. O-rings; It characterized in that it further comprises a heat insulating material filled between the mounting holes in the test panel.

The burn-in test apparatus of the USB memory device according to the present invention exhibits the advantage that airtightness of the sealed chamber is easy.

In other words, the burn-in test apparatus for a USB memory device according to the present invention includes an adjacent controller room through an interior of a USB holder through which a cable for connecting the USB memory device and the controller is inserted through an inner side of a sealed room including a test panel. Withdrawal directly into the controller leaves no room in the air tightness of the enclosure.

Therefore, the airtightness of the sealed chamber is very easy.

In addition, the burn-in test apparatus of the USB memory device according to the present invention can minimize the length of the cable by being disposed adjacent to the sealed room and the controller room, thereby preventing unnecessary signal distortion and the like, thereby increasing the reliability of the test. have.

In addition, the burn-in test apparatus of the USB memory device according to the present invention exhibits low particle generation probability and excellent workability since no components except the USB memory device are separated or recombined during the test process.

The result is a significant improvement in test reliability and efficiency.

EMBODIMENT OF THE INVENTION Hereinafter, one preferable aspect of this invention is looked at with reference to drawings.

Prior to the full description, in the following, the direction toward the user is referred to as front or front for convenience and the opposite direction to the back or rear and other directions are according to a conventional concept, which will be used consistently in the present specification.

2 and 3 are views illustrating the appearance of a burn-in test apparatus (hereinafter, simply referred to as a burn-in test apparatus) of a USB memory device according to the present invention. FIG. 2 is a front view and FIG. Each corresponds to a side view. 4 to 6 is a view showing the internal structure of the burn-in test apparatus according to the present invention, Figure 4 is a cross-sectional view of the IV-IV line of Figure 2, Figure 5 is a cross-sectional view of the VV line of FIG. 6 corresponds to a cross sectional view taken along the line VI-VI of FIG. 3.

As can be seen, the burn-in test apparatus 50 according to the present invention exhibits a hexahedron or similar form, in which a sealed chamber A in which the USB memory device 2 is mounted and a controller in which the controller 110 is mounted. Room (B), the equipment room (C) in which a part of the other cooling system 120 is mounted is defined.

At this time, the sealed chamber A is in front of the burn-in test apparatus 50, the controller chamber B is behind the sealed chamber A, and the equipment chamber C is sealed chamber A and the controller chamber B. It is desirable to be located under), which can be found in each configuration and role.

This is as follows.

First, the sealed chamber A corresponds to a process region in which the USB memory device 2 under test is mounted and a high temperature and low temperature environment is created.

To this end, the sealed chamber A is opened and closed by the door 62, and air conditioning means for creating a high temperature and low temperature environment by generating and circulating cold / hot gases is built in, and the inner side 72 facing the door 62 is provided. As a result, the test panel 74 of the vertical plane is tightly fixed. In addition, a plurality of USB holders 92 are horizontally inserted into the inner side 72 including the test panel 74 so as to fix the USB memory device 2 (see 96 of FIG. 9). ) And at the same time ensure a stable electrical connection between the USB memory device (2) and the controller (110).

At this time, the USB holder 92 is a USB connector 96 is mounted on one side of the cylindrical shape, the cable is electrically connected to the USB connector 96 along the inner longitudinal direction (see 98 in FIG. 9, hereinafter the same. ) Is built. Therefore, when the UBS holder 92 is inserted through the test panel 74 and the inner side 72 of the sealed chamber A, the USB connector 96 is in close contact with the control panel 74 and the cable 98 is connected to the USB holder ( 92 is withdrawn to the outside of the sealed chamber (A) through the other side.

The detailed configuration of such a sealed room (A) will be described in detail in the corresponding section.

On the other hand, considering that the sealed chamber A is a part that is often revised for burn-in testing of the USB memory device 2, it is convenient to use it disposed at the front end of the burn-in test apparatus 50. For the same reason, the door 62 is appropriate to open and close the entire surface of the sealed chamber A at the front of the burn-in test apparatus 50. Preferably, the door 62 is provided inside the sealed chamber A. A window 64 is provided for visual observation.

Next, the controller room B corresponds to a storage area in which the controller 110 is mounted.

At this time, the controller 110 is electrically connected to the USB memory device 2 of the airtight chamber A through a cable 98 inside the USB holder 92 connected to the USB connector 96, and connected to the cable 98. After applying the input signal, analyze the output signal to check whether the USB memory device (2) is operating normally.

On the other hand, if the cable 98 connecting the USB memory device 2 and the controller 110 becomes unnecessarily long, the reliability of the test may be degraded due to signal distortion and the like. Therefore, it is appropriate that the controller room B is disposed at the rear end of the sealed chamber A to minimize the length of the cable 98. Furthermore, the cable 98 is connected to the controller room through the interior of the USB holder 92. As it is withdrawn directly to (B), there is no room for exposure to the high or low temperature environment of the closed chamber (A).

Finally, the equipment room C corresponds to a storage area in which a part of the cooling system 120 is mounted.

At this time, a part of the cooling system 120 collectively refers to a related system for cooling the gas, such as a compressor, a condenser, and an expander, except for the heat exchanger E of the air conditioning unit, which will be described later, and they are relatively large in volume and load. Therefore, the equipment room C is relatively stable located at the lower ends of the sealed room A and the controller room B, and preferably the burn-in test apparatus 50 corresponding to the outer surface of the equipment room C is preferable. Along the bottom is a plurality of holes for air circulation.

In addition, the front panel of the burn-in test apparatus 50 controls the controller 110, the cooling system 120, the heater (H) of the air conditioning means to be described later, and a control panel (P) for displaying the analysis results of the controller 110. ) Can be installed. Therefore, the user checks and controls the overall operation state while watching the test process inside the closed chamber A through the window 64 of the door 62. In addition, the bottom surface of the burn-in test apparatus 50 may be provided with a plurality of wheels 52 for the convenience of movement or a pedestal 54 for horizontal adjustment.

Since these are for convenience of use, it will be apparent to those skilled in the art that they may be appropriately modified, omitted, or added according to the purpose.

7 to 9 are views for explaining the sealing chamber (A) and the components directly related thereto, Figure 7 is a cutaway perspective view showing a portion of the sealed chamber (A), Figure 8 is a fan cover ( 100 is a perspective view of FIG. 8, FIG. 8 is a perspective view of the USB holder 92, and FIG. 9 is a cross-sectional view of the USB holder 92. First, reference is made to FIGS. 4 to 6 together.

As can be seen, the test panel 74 in the vertical plane is tightly fixed to the inner side 72 of the closed chamber A facing the door 62. At this time, the plurality of mounting holes 75 and the connection holes 73 through which the USB holder 92 is inserted penetrate through the inner side 72 of the sealed chamber A including the test panel 74 in a one-to-one correspondence. 4 and 5)

In addition, the airtight means for generating and circulating cold / hot gas is built in the sealed room A to create a high temperature and low temperature environment.

The air-conditioning means for this purpose is provided along the upper end of the sealed chamber (A) and the first duct 82, the lower end of the sealed chamber (A) through which a plurality of inflow holes (h1) is passed through the bottom facing the sealed chamber (A) The second duct 84 is provided along the plurality of exhaust holes (h2) through the upper surface facing the sealed chamber (A), provided along one side of the sealed chamber (A) first and second ducts (82, 84) The cooling system installed between the third duct 86, the blowing fan (F) installed in the third duct 86 and rotated by the motor (M), the second duct 84 and the blowing fan (F) And a heater H installed between the heat exchanger E, the second duct 84, and the blowing fan F of the 120.

As a result, when the blowing fan F is rotated by the motor M, the air inside the sealed chamber A flows into the sealed chamber A through the inlet hole h1 of the first duct 82 and then the second The circulation is exhausted to the exhaust hole of the duct 84, and then transferred to the first duct 82 via the heat exchanger E and the heater H.

Therefore, if the heat exchanger (E) or the heater (H) is properly driven during this process, it is possible to create a desired high temperature and low temperature environment inside the sealed chamber (A).

At this time, preferably using a predetermined fan cover 100 to cover the blowing fan (F) can be expected to more smoothly circulate the air.

The fan cover 100 for this purpose is mounted on the third duct 86 to be closed by covering the blowing fan F, but the part showing a relatively low pressure by the rotation of the blowing fan F, for example. The suction hole 102 connected to the second duct 84 through the heat exchanger E and the heater H passes through one surface vertically close to the axial direction of the blowing fan F, and the blowing fan F By the rotation of the portion showing a relatively high pressure, for example, the upper end of the blowing fan (F) shows a form in which the supply hole 104 is directly connected to the first duct 82.

As a result, when the blowing fan F rotates, the air passing through the heat exchanger E and the heater H from the second duct 84 flows into the suction hole 102 of the fan cover 100 having a relatively low pressure. After the pressure is transmitted to the first duct 82 through the high supply hole 104.

Therefore, smoother circulation of air in one direction can be achieved.

For reference, Figure 7 shows a part of the sealed chamber (A) is cut away, so that only one motor (M) and the blowing fan (F) is shown and only a part of the fan cover 100 is also shown. However, referring to FIG. 4 and the like, it can be seen that two motors M and a blowing fan F can be used. In this case, the fan cover 100 shows the shape of FIG. 8.

In addition, the USB holder 92 is inserted into the connection hole 73 of the side surface 72 in the sealed chamber A, including the mounting hole 75 of the test panel 74, and is closely attached to the test panel 74. It provides a USB connector 96 and at the same time ensures a stable electrical connection between the USB memory device (2) and the controller (100).

9 and 10, the USB holder 92 for this purpose, the USB connector 96 is mounted on one side of the cylindrical shape, the cable 98 is electrically connected to the USB connector 96 along the inner longitudinal direction ) Is built in and is drawn out to the other side of the USB holder 92.

Therefore, when the USB holder 92 is inserted into the mounting hole 75 of the control panel 74 and the connection hole 73 of the side 72 of the sealed chamber A, the USB connector 96 of one side of the USB holder 92 is inserted. ) Is tightly fixed to the exposed surface of the control panel 74, the other side of the USB holder 92 is exposed to the controller chamber 110, which is the rear end of the sealed chamber (A), so that the cable 98 to the controller chamber (B) Allow direct withdrawal.

At this time, the USB holder 92 is made of a material such as engineering plastics having high heat resistance, and a plurality of O-rings 99 are interposed along the outer surface thereof so that the mounting hole 75 and the sealing chamber A of the test panel 74 are interposed therebetween. It is desirable to be intimately inserted into the connection hole 73 of the inner side 72. In addition, a heat insulating material may be filled in the test panel 74 and / or the inner side 72 of the sealed chamber A in order to block heat between the sealed chamber A and the controller chamber B. FIG.

The burn-in test process of the USB memory device using the burn-in test apparatus according to the present invention is summarized as follows.

First, the user opens the door 62 of the burn-in test apparatus 50 according to the present invention to open the sealed chamber A. At this time, the USB holder 92 is pre-inserted into the connection hole 73 of the side surface 72 of the sealed chamber A, including the mounting hole 75 of the test panel 74, and the test panel 74. The USB connector 96 is tightly fixed to the exposed surface of the), and the cable 98 connected to the USB connector 96 is directly connected to the controller 100 of the controller room 110 through the inside of the USB holder 92. .

Next, the user inserts and fixes the USB memory device 2 into the USB connector 96. In this way, the USB memory device 2 is electrically connected to the controller 100.

Next, the user closes the door 62 to seal the sealed chamber A, manipulates the control panel P, and creates a desired high or low temperature environment in the sealed chamber A. FIG. At this time, the method of creating a high or low temperature environment into the sealed chamber (A) has already been described through the description of the air conditioning means.

During this process, the user checks, checks and controls the overall operation state while watching the test process inside the closed chamber A through the window 64 of the door 62.

Finally, when the burn-in test of the USB memory device 2 is completed, the user opens the door 62, replaces it with a new USB memory device 2, and repeats the burn-in test according to the above method. .

The above description and drawings are only examples of the present invention and do not limit the present invention. In other words, all modifications within the technical spirit of the present invention should belong to the scope of the present invention, the scope of the present invention is specified in the claims.

1 is a photo showing a burn-in test method of a general USB memory device.

2 is a front view of a burn-in test apparatus according to the present invention.

3 is a side view of a burn-in test apparatus according to the present invention.

4 is a cross-sectional view taken along line IV-IV of FIG. 2.

5 is a cross-sectional view taken along the line V-V in FIG.

FIG. 6 is a sectional view taken along line VI-VI of FIG. 3; FIG.

7 is a cutaway perspective view of a closed chamber of the burn-in test apparatus according to the present invention.

8 is a perspective view of a fan cover of the burn-in test apparatus according to the present invention.

9 is a perspective view of a USB holder of a burn-in test apparatus according to the present invention.

10 is a cross-sectional view of a USB holder of a burn-in test apparatus according to the present invention.

<Description of the symbols for the main parts of the drawings>

A: sealed chamber 74: test panel

75: mounting holes 82, 84, 86: first to third duct

h1, h2: Intake hole and exhaust hole 100: Fan cover

H: Heater E: Heat Exchanger

M: Motor F: Blower Fan

Claims (5)

An airtight chamber in which a front surface facing the user is opened and closed by a door and a plurality of connection holes penetrates along an inner side of the vertical body facing the door; A test panel of a vertical plane in close contact with the inner side and having a plurality of mounting holes penetrating one-to-one with the connection hole; Air conditioning means for circulating cold / hot gas into the sealed chamber; And A cylindrical shape in which a USB connector on one side to which the USB memory device is inserted is inserted through the mounting hole and the connection hole in a one-to-one correspondence so as to be in close contact with the test panel so that the cable connected to the USB connector is drawn out to the other side outside the sealed chamber. Burn-in test device for a USB memory device comprising a USB holder. The method according to claim 1, The air conditioning means, A first duct provided at an upper end of the sealed chamber and having a plurality of inflow holes passing through the bottom of the sealed chamber; A second duct provided at a lower end of the sealed chamber and having a plurality of exhaust holes penetrated through the upper surface facing the sealed chamber; A third duct provided at one side of the sealed chamber and connecting the first and second ducts; A blowing fan installed in the third duct; A heat exchanger of a cooling system installed between the second duct and the blowing fan; And And a heater installed between the second duct and the blower fan. The method according to claim 2, And a fan cover mounted on the third duct, provided with a suction hole connected to the second duct via the heat exchanger and a heater, and a supply hole connected to the first duct to cover the blower fan. Burn-in test device for memory devices. The method according to claim 2, A controller chamber integrally provided at a rear side of the sealed chamber to accommodate the other side of the holder; A controller mounted in the controller room and connected to the cable to control whether the USB device is normally operated by an electrical method; And And a device chamber which is integrally provided at a lower end of the sealed chamber and the controller chamber and accommodates the cooling system. The method according to claim 1, At least one o-ring fixed to an outer surface of the holder to be in close contact with the mounting hole and the connection hole; And And a heat insulator filled between the mounting holes in the test panel.

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