KR20090111655A - Probe Unit for inspected the Flat Panel Display Device - Google Patents

Abstract

PURPOSE: A probe unit for inspecting a flat panel display device is provided to minimize the deviation of a probe block and a TCP block by aligning the probe block and the TCP block to an accurate position and fastening them with an anchor bolt. CONSTITUTION: In a probe unit for inspecting a flat panel display device, slits(36,38) are fitted to a pad pitch of a flat panel display device and are slid by a certain depth. Contact probes(37) of a certain length are arranged as many as the number of pads to be tested at the arranged slits. The contact plate probe holds a needle so that the needle has a certain length.

Description

Probe Unit for inspected the Flat Panel Display Device

1 is a perspective view of a probe block assembly of the present invention,

2 is an exploded view of a probe block and a TCP block of the prior art;

Figure 3 is an exploded view of the probe and the TCP block of the present invention

4 is an assembly of the probe and the TCP block of the present invention

** Explanation of symbols for the main parts of the drawings

2, 11, 41 probe block regulator

1, 15, 35, 45 probe block

3, 19, 30, 46 TCP blocks

4, 21, 39, 47. Flexible Circuit Board

5, 22, 42. Fixing bolt

12,13,44 alignment pin

14, 20, 31, 34. Alignment hole

16, 37.Probe

17, 40.Drive IC

32. Fastening screw

33. Fasteners

36,38. Alignment slit

The present invention relates to a probe for inspecting a flat panel display device, a probe assembly having the same, and more particularly, a probe block for inspecting a flat panel display device having excellent reproducibility and productivity by a line alignment process by a micromachining technology, and a probe having the same. To an assembly.

In general, TFT-LCD, PDP, OLED, etc. are a kind of flat panel display, in which pixels composed of a myriad of cells are arranged and have a predetermined size.

Although the internal structure is characteristic for each element, the video signal electrode and the driving circuit for applying the video signal are provided in common. After the flat panel display device is manufactured, a test is performed to remove the defective display device early by checking whether the flat panel display device is normal by applying an electrical signal by contacting the probe of the probe assembly to the pad electrode of the flat panel display device. The process is in progress.

The test of the flat panel display device is performed by using a probing apparatus having a probe assembly, and the probe assembly of the probing apparatus includes a needle type, a blade type, a film type, and a MEMS. It is developed and used in various forms such as (MEMS) type.

However, recently, as the flat panel display device is highly integrated, the line width of the pattern of the flat panel display device is extremely small, and a probe assembly having a repeatable reproducibility and reliability is required to manage the production yield. Accordingly, there is an urgent need to develop a probe assembly capable of coping with fine pitch of a flat panel display device, and having excellent reproducibility, reliability, and productivity. In the prior art, since the needle type is used after aligning the needle to a predetermined length and then fixing the needle using an adhesive such as epoxy, it takes a long time to increase production and requires a lot of labor. In addition, the blade type requires a lot of skilled assembly personnel required for material cost burden and fine alignment by using a lot of finely processed parts. The film type and the MEMS type have a problem in that a poor contact due to a foreign material often occurs and a test preparation time takes a lot due to a problem in which the probe is not visible in the test preparation work. There is an urgent need for products that compensate for these problems. These problems are due to a limitation in the one-to-one correspondence between the probe of the probe block 15 and the pad 18 of the driving IC while being finely pitched. In particular, the one-to-one correspondence is difficult because the probe block and the TCP block are aligned and fixed to each of the alignment pins 12 and 13 of the adjuster 11 of the probe block assembly. First, the TCP block 19 is aligned and fixed to the alignment pin 20 of the regulator and the probe block (15) to the alignment pin 12 of the regulator relative to the alignment hole (14). do. This alignment method is suitable when the alignment pins 12 and 13 of the adjuster are machined and assembled in the correct position without tolerances. And assembling by fine tolerance cannot always be one-to-one matching assembly during disassembly and assembly. This leads to difficulties in test preparation, and this also requires a lot of time and effort. In the prior art, since all probe block assemblies are composed of individual alignment pins and holes, there is a problem in realizing fine pitching.

Disclosure of Invention An object of the present invention is to provide a probe for inspecting a flat panel display device capable of actively responding to a fine pitch of a flat panel display device pattern by using a fine processing and a fine alignment process, and a probe assembly having the same.

Another object of the present invention is to provide a probe for inspecting a flat panel display device having excellent reproducibility and productivity by using a microfabrication technique and a fine alignment technique, and a probe assembly having the same.

Another object of the present invention is to reduce the cost of work by reducing the time required by minimizing the final alignment inspection process in the test equipment by eliminating the conventional complex components and constructing an integrated probe assembly by a simple structure, and also the conventional complex components The purpose of this is to reduce the cost of the probe assembly and shorten the test preparation time.

One side of the probe and probe assembly of the present invention is fixed at a specific interval by exposing only a predetermined length to the fixture 36, which maintains a predetermined interval of the micro-contact probe 37 of about 10-100 microns. On the other side, it is configured to be exposed to a predetermined length and connected to a fixture 38 having a predetermined interval for connecting with the driver IC 40. The probe block composed of the micro probes on both sides is composed of one assembly in a one-to-one correspondence with the TCP block including the driving IC (1). (Fig. 4)

As described above, the integrated probe block (1) and the TCP block (3) are assembled to the probe assembly regulator (2, 41) to test the flat panel display device.

The following description is a detailed embodiment of the present invention.

(Example 1)

The probe block assembly of the present invention slices the alignment slits 36,38 to a predetermined depth in accordance with the pad pitch of the flat panel display element to be inspected. The sliced alignment slits are aligned with the contact plate-shaped probe 37 having a predetermined length in accordance with the number of pads of the device to be inspected. The contact probe 37 may fix the needle to a predetermined length, or may be used by processing a plate having a predetermined thickness to be a probe.

The opposite side of one side in contact with the inspection panel is configured to be connected to the driving IC 40 and connected to the PCB. The driver IC 40 is aligned one-to-one with one pin 37 of the probe assembly and then fixed to the TCP block 30 with a fixing bolt 32. The probe assembly 45 configured as described above is configured as a structure by matching the alignment holes 44 formed at the same position as the TCP block 46 including the driving IC. This one-piece assembly of probe blocks (45, 46) secures the height step to the regulator (41) that secures the compensating buffer (41), and connects the flexible printed circuit board (47) to the drive PCB to The panel is inspected by driving the panel by applying a probe to the panel to be inspected by applying an electrical signal corresponding to the image signal. In the adjuster 41 for fixing and adjusting the probe block assembly, the fixing pin 44 is configured to be assembled in an alignment hole configured at the same position of the probe block 45 and the TCP block 46. It consists of at least two, and the alignment pins other than the two alignment pins, which are the reference, have larger fixing holes than the fixing pins so that the alignment pins do not become a reference for the alignment of the probe block and the TCP block. Can be reduced. In addition, the assembly in which the plurality of probes are fixed at predetermined intervals may be configured as one assembly by using a TCP block and a fixing bolt by assembling a fixed block by forming a probe by etching or plating. .

 The probe and probe assembly of the present invention can be applied to the quantitative test of flat display devices which are gradually fine pitched, and shorten the test preparation time and manufacturing cost by simplifying the manufacturing process and components, and the defect of the probe and the driving IC. According to the present invention, it is possible to repair various devices.

Claims (3)

Probe assembly for inspection of flat panel display, characterized in that the assembly including a plurality of probes fixed at predetermined intervals and the assembly including the drive IC as a single assembly using two or more fixing bolts The probe assembly of claim 1, wherein the assembly in which the plurality of probes are fixed at predetermined intervals is assembled to the alignment structure at which the plate-shaped probes are maintained at predetermined intervals. The probe assembly of claim 1, wherein the assembly in which a plurality of probes are fixed at predetermined intervals is assembled with a fixing block of the probe by etching or plating.

Images