KR200345500Y1 - a probe - Google Patents

Abstract

The present invention relates to a probe for inspection, the probe portion 10 formed in a columnar shape having a plurality of protrusions on one side end; An upper outer cylinder portion 20 formed integrally connected to the lower portion of the probe portion 10 and extending outward of the probe portion 10 and formed in a cylindrical shape having a lower portion opened downward; An elastic outer cylinder portion 30 which is integrally connected to the upper outer cylinder portion 20 and formed in a compression spring shape spirally wound in the same outer diameter as the upper outer cylinder portion 20 and elastically flows up and down; The lower outer cylinder portion 40 is formed integrally connected to the lower portion of the elastic outer cylinder portion 30, the inside has a cylindrical shape that is open up and down, and is configured to include, one that can elastically support the compression force to the up and down With the technical gist of the contact terminal, the inspection accuracy is not affected by the accuracy of the surface of the probe parts, the coupling between the components, and the assemblability according to the contact structure. The present invention relates to an inspection probe device that can improve life by having an elastic structure that effectively attenuates and cancels the impact force transmitted from the upper and lower ends during an inspection test, and can improve productivity by realizing an improved structure with a minimum number of parts. .

Description

Inspection probes {a probe}

The present invention relates to an inspection probe device, and more specifically, as a part of a cylindrical outer cylinder having an open bottom portion is elastically fluidized up and down, the upper and lower portions are integrally connected to each other to elastically support the compressive force upward and downward. It relates to a test probe device having a structure that can improve the assembly and productivity while maintaining the test reliability and lifespan made of a single contact terminal.

In general, a plurality of chips are mounted in an electronic product, and these chips play an important role in determining the performance of the electronic product. Chips are integrated circuits that perform various functions due to logic elements formed on the surface of thin and small pieces of semiconductors, and electrical signals transmitted from circuit boards are transmitted through a bus to accomplish this function.

A printed circuit board (PCB) is a thin board made of epoxy or bakelite resin, which is an insulator, and is formed by applying copper as a conductor to form circuit wiring. It is attached to this printed circuit board by soldering on circuit wiring.

Micro-chip is a chip made by high density integration of electronic circuits of such circuit boards, and it is essential to check the process by an inspection device to check whether the chip is in a normal state before it is assembled and completed. It goes through. In this test method, there is a method of performing a test by mounting a chip to a test socket device, and a test probe device is used to check the chip without damaging the chip in the socket device.

The inspection socket is mounted on the inspection circuit board so that the microchip, which is the object to be inspected, is placed on the inspection circuit to be inspected. The test socket is equipped with a plurality of test probes to contact the microchip, and the contact pins of the probe body and the bottom of the probe are connected from the upper end of the probe where the current is in contact with various points of the microchip to be tested. By flowing to the circuit board side, the inspection target chip is inspected.

1 is a longitudinal cross-sectional view showing an inspection probe 105 for a conventionally used, the outer cylinder 111 is formed with a bent portion that is open at both ends and bent inwardly; A pair of contact pins 117 that are received at both ends of the outer cylinder 111 and are moved up and down in contact with the inner wall surface of the outer cylinder 111; And an elastic spring 121 inserted into the outer cylinder 111 to be in contact with each end of the pair of contact pins 117 to elastically support the contact pins 117.

Figure 2 shows a partial cross-sectional view showing an elastic connector having a tubular spring of US Patent No. 5,982,187, the general of the above consisting of an outer cylinder 143, a pair of contact pins (145, 147), elastic spring 141 The basic components are the same as the prior art, but the elastic spring 141 is limited to a tubular spring having a tubular shape instead of the coil spring.

The conventional inspection probe device having the above structure has a large contact resistance depending on the shape accuracy of the contact portion such as the inner wall of the outer cylinder and the outer surface of the contact pin, and an interconnected coupling installation structure according to the contact of the contact pin and the elastic spring. There is a problem in that the manufacturing cost is high because the precision is required during the manufacturing and assembly of parts, and the assembly is cumbersome, resulting in low productivity.

In addition, by using contact pins with low elasticity and restoring force as contact terminals in contact with chip terminals or PCB boards, the life span of the entire inspection probe device depends on the life of the contact pins. There was a problem that the life is sharply lowered by the impact applied.

The present invention devised to solve the above problems, test probes having an equal contact resistance without being affected by the degree of inspection by the precision of the surface of the probe parts, the assembly between the components and the contact structure, etc. It is an object to provide a device.

In addition, another object of the present invention is to provide an inspection probe device having an elastic structure that effectively attenuates and cancels the impact force transmitted from the upper and lower ends during the inspection test, thereby improving the service life.

Another object of the present invention is to provide an inspection probe having a structure capable of improving productivity by realizing an improved structure in which the number of parts is minimized.

1-a longitudinal sectional view showing a conventional inspection probe.

Figure 2 is a main cross-sectional view showing a conventional inspection probe.

3 is a front view showing the inspection probe device according to a first embodiment of the present invention.

4-3 are longitudinal cross-sectional views.

Figure 5-Longitudinal cross-sectional view showing a test probe device according to a second embodiment of the present invention.

<Description of Major Symbols Used in Drawings>

10: probe 20: upper outer tube

21: protrusion 30: elastic outer cylinder

40: lower outer cylinder

The present invention for achieving the above object, the probe portion 10 formed in a cylindrical shape having a plurality of protrusions on one side end; An upper outer cylinder portion 20 formed integrally connected to the lower portion of the probe portion 10 and extending outward of the probe portion 10 and formed in a cylindrical shape having a lower portion opened downward; An elastic outer cylinder portion 30 which is integrally connected to the upper outer cylinder portion 20 and formed in a compression spring shape spirally wound in the same outer diameter as the upper outer cylinder portion 20 and elastically flows up and down; The lower outer cylinder portion 40 is formed integrally connected to the lower portion of the elastic outer cylinder portion 30, the inside has a cylindrical shape that is open up and down, and is configured to include, one that can elastically support the compression force to the up and down Inspection probes consisting of contact terminals shall be technically essential.

Here, on the outer circumferential surface of the upper outer cylinder portion 20, it is preferable to include an embodiment provided with a protrusion 21 is formed a locking step coupled to and mounted on the socket.

Therefore, there is an advantage that the inspection reliability is improved by having an equal contact resistance without being affected by the accuracy of the probe surface of the component parts, assembling between the components and assembling according to the contact structure.

In addition, there is another advantage that can improve the life by having an elastic structure that effectively attenuates and cancels the impact force transmitted from the upper and lower ends during the inspection test.

In addition, there is another advantage of improving productivity by realizing an improved structure with a minimum number of parts.

The present invention having the configuration as described above will be described in detail with reference to the following drawings. 3 is a front view showing the inspection probe according to a first embodiment of the present invention, Figure 4 is a longitudinal cross-sectional view of Figure 3, Figure 5 is a longitudinal cross-sectional view showing a test probe according to a second embodiment of the present invention It is also.

First, the structure of the inspection probe device according to the present invention for the first embodiment will be described.

The inspection probe device according to the present invention is formed by forming the individual independent components of the probe, the outer cylinder, the coil spring integrally from the upper side of the probe 10, the upper outer cylinder 20, the elastic outer cylinder 30, the lower outer cylinder By constructing a communication body connected to (40), the improved structure with the minimum number of parts is realized.

The probe unit 10 is a component directly contacting the inspection object as formed on the uppermost portion of the inspection probe device according to the present invention, and has an circumferential shape filled with the inside thereof, and has an upper end to ensure contact with the inspection object. It is provided with a plurality of pointed protrusions on the surface to expand the contact area with the inspection contact surface of the inspection object.

The upper outer cylinder portion 20 is integrally connected to the lower side of the probe portion 10, and the upper outer cylinder portion 20 is extended outward to have a larger outer diameter than the probe portion 10 to be mounted inside the socket device. The locking jaw is formed between the probe and the probe 10.

The upper outer cylinder portion 20 is formed integrally with the lower end of the probe 10, the upper portion and the middle portion has a cylindrical shape filled inside, but the lower portion is formed into a cylindrical shape hollowed out and opened downward to be described below. In the elastic outer cylinder portion 30 to effectively attenuate the transmission of the fatigue generated by the rapid deformation or impact of the structure to the upper side.

An elastic outer cylinder portion 30 is integrally formed and connected to the lower side of the upper outer cylinder portion 20, and the elastic outer cylinder portion 30 has a compression spring spirally wound while maintaining an outer diameter equal to the outer diameter formed by the upper outer cylinder portion 20. Formed in the same shape, when the compressive force is transmitted from the upper and lower during the inspection test, the upper component and the lower component is elastically supported as it is stably elastically moved up and down at the center of the inspection probe device according to the present invention.

Conventionally, in order to add elastic force, the compression spring is an essential component, but the contact area with the compression spring formed by winding a thin wire is not stable, so that a plurality of probe devices having the same structure have different current flow rates. Although it was difficult to assure reliability, in the present invention, by forming the elastic outer cylinder portion 30 integrally connected to the lower end of the upper outer cylinder portion 20 to effectively attenuate and cancel the impact force transmitted from the upper and lower ends during the inspection test, as well as the contact area. To ensure the stability.

The lower outer cylinder portion 40 is integrally connected to the lower side of the elastic outer cylinder portion 30, and the lower outer cylinder portion 40 maintains the same outer diameter as the upper outer cylinder portion 20 and the elastic outer cylinder portion 30 while the inside is up and down. Is formed in an open cylindrical shape, to effectively attenuate that the fatigue generated by the impact generated in the elastic outer cylinder portion 30 is transmitted to the lower side.

It describes a process in which the electrical connection is made through the inspection probe device according to the present invention configured as described above.

The pressurizing part installed in the socket presses the test object seated on the upper part of the socket downward so that the test contact surface of the test object is in contact with the top of the probe part 10 formed on the top of the probe device according to the present invention. Accordingly, the upper outer cylinder portion 20, the elastic outer cylinder portion 30, the lower outer cylinder portion 40 is moved downward to the surface of the circuit board to contact the lower circuit board, in this state the current from the test object to the probe portion 10, the upper outer cylinder portion 20, the elastic outer cylinder portion 30, the lower outer cylinder portion 40 flows in sequence to the PCB substrate, the current flow from the PCB substrate to the inspection object to be made simultaneously according to the logic structure of the inspection object. do.

In this process, the probe device according to the present invention, in the initial state as shown in Fig. 3 and 4 (a), the elastic outer cylinder portion 30 to the lower and lower outer cylinder portion 40 of the upper outer cylinder portion 20 It has a shape as shown in (b) of FIG. 4 compressed to be close to the communicating cylindrical shape.

As described above, the inspection object can be necrosized through the current flow of the inspection object and the PCB, and after the inspection is completed, the pressure port of the socket releases the inspection object to press the probe 10 and the lower outer cylinder 40. Is removed from the inspection object and the PCB and the elastic outer cylinder part 30 is returned to the position before the inspection by the elastic restoring force.

In the second embodiment shown in FIG. 5, the protrusion 21 is provided on the outer circumferential surface of the upper outer cylinder portion 20, and the protrusion 21 has a circumferential direction on the outer circumferential surface of the upper outer cylinder portion 20. Therefore, it protrudes outward.

In the first embodiment has a cylindrical shape having the same outer periphery except for the step difference formed between the probe portion 10 and the upper outer cylinder 20 in the entire inspection socket device to the upper side when inserted into the inspection socket device It has a structure that is easy to limit the movement of.

The protrusion 21 provided in the second embodiment forms a latching jaw that is coupled to and mounted on the inspection socket device. When the protrusion 21 is fitted to the mounting portion of the probe device formed on the socket device, the protrusion 21 is moved upward and downward. By limiting the movement to ensure that the mounting to the socket device is made more robust to the inspection reliability.

In the inspection probe device according to the present invention, when the upper and lower ends corresponding to the probe portion 10 and the lower outer cylinder portion 40 are in contact with the inspection object and the PCB circuit board, the current flows through the probe portion 10, the upper outer cylinder portion 20, Constant and rapid flow through the elastic outer cylinder portion 30 and the lower outer cylinder portion 40, so that it is not affected by the precision of the surface of the probe parts, the coupling between the components and the contact structure, etc. Inspection reliability according to the stability of the current path This is improved.

The present invention by the above-described configuration improves inspection reliability by having an equal contact resistance without being affected by the inspection accuracy due to the accuracy of the surface of the probe device, the coupling between the components, and the assemblability according to the contact structure. It works.

In addition, there is another effect that can improve the life by having an elastic structure that effectively attenuates and cancels the impact force transmitted from the upper and lower ends during the inspection test.

In addition, there is another effect of improving productivity by realizing an improved structure with a minimum number of parts.

Claims (2)

A probe part 10 having a plurality of protrusions formed on the upper end thereof in contact with the contact terminal of the inspection object; An upper outer cylinder portion 20 formed integrally connected to the lower portion of the probe portion 10 and extending outward of the probe portion 10 and formed in a cylindrical shape having a lower portion opened downward; An elastic outer cylinder portion 30 which is integrally connected to the upper outer cylinder portion 20 and formed in a compression spring shape spirally wound in the same outer diameter as the upper outer cylinder portion 20 and elastically flows up and down; The lower outer cylinder portion 40 is formed integrally connected to the lower portion of the elastic outer cylinder portion 30, the inside has a cylindrical shape that is open up and down, and is configured to include, one that can elastically support the compression force to the up and down Inspection probe device, characterized in that consisting of contact terminals. According to claim 1, On the outer circumferential surface of the upper outer cylinder portion 20, Probe for inspection, characterized in that provided with a protrusion (21) having a locking step coupled to and mounted on the socket.