KR19990050472A - 승압전압 발생회로 - Google Patents
승압전압 발생회로 Download PDFInfo
- Publication number
- KR19990050472A KR19990050472A KR1019970069599A KR19970069599A KR19990050472A KR 19990050472 A KR19990050472 A KR 19990050472A KR 1019970069599 A KR1019970069599 A KR 1019970069599A KR 19970069599 A KR19970069599 A KR 19970069599A KR 19990050472 A KR19990050472 A KR 19990050472A
- Authority
- KR
- South Korea
- Prior art keywords
- voltage
- level
- output
- pumping enable
- pumping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000005086 pumping Methods 0.000 claims abstract description 39
- 239000003990 capacitor Substances 0.000 claims abstract description 24
- 230000004913 activation Effects 0.000 claims abstract description 15
- 230000003213 activating effect Effects 0.000 claims abstract 3
- 101150061388 LON1 gene Proteins 0.000 description 20
- 238000010586 diagram Methods 0.000 description 5
- 208000019300 CLIPPERS Diseases 0.000 description 3
- 208000021930 chronic lymphocytic inflammation with pontine perivascular enhancement responsive to steroids Diseases 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 238000006880 cross-coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 101150004293 lon2 gene Proteins 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Dram (AREA)
Abstract
Description
Claims (5)
- 출력 캐패시터가 연결된 승압전압 출력단과;소정의 전압 범위를 다수개의 전압 레벨 구간으로 분할하여 상기 다수개의 전압 레벨 구간에 대응하는 다수개의 펌핑 인에이블 신호를 발생시키고, 상기 다수개의 펌핑 인에이블 신호가 서로 다른 크기의 활성화 시간을 가지며, 상기 승압전압 출력단의 출력 전압을 검출하여 상기 다수개의 전압 레벨 구간 가운데 상기 출력 전압 레벨이 속하는 전압 레벨 구간에 대응하는 상기 펌핑 인에이블 신호를 활성화시키는 레벨 모니터와;상기 다수 개의 펌핑 인에이블 신호 가운데 적어도 하나의 신호가 활성화되었을때 동작하여 펄스 신호를 발생시키는 펄스 발생기와;상기 활성화된 펌핑 인에이블 신호에 의하여 인에이블되고, 상기 펄스 신호에 의하여 펌핑 동작이 이루어져서 상기 출력 캐패시터에 전하를 공급하는 다수 개의 펌프 회로로 구성된 전하 펌핑단을 포함하는 승압전압 발생회로.
- 청구항 1에 있어서, 상기 펄스 발생기가 상기 다수개의 펌핑 인에이블 신호 가운데 적어도 하나의 신호가 활성화되었을때 펄스 신호를 발생시키는 것이 특징인 승압전압 발생회로.
- 청구항 1에 있어서, 상기 레벨 모니터의 각각의 펌핑 인에이블 신호가 대응되는 상기 다수의 전압 레벨 구간이 모두 균등하게 분할되는 것이 특징인 승압전압 발생회로.
- 청구항 1에 있어서, 상기 레벨 모니터의 각각의 펌핑 인에이블 신호가 대응되는 상기 다수의 전압 레벨 구간이 상기 전압 범위의 최고 레벨에 근접할수록 이웃한 구간 사이의 전압 레벨차가 크고, 최저 레벨에 근접할수록 이웃한 구간 사이의 전압 레벨차가 작은 것이 특징인 승압전압 발생회로.
- 청구항 1에 있어서, 상기 레벨 모니터의 각각의 펌핑 인에이블 신호의 활성화 시간이 상기 전압 범위의 최고 레벨에 근접하는 전압 레벨 구간에 대응하는 펌핑 인에이블 신호일수록 활성화 시간이 길고, 상기 전압 범위의 최저 레벨에 근접하는 전압 레벨 구간에 대응하는 펌핑 인에이블 신호일수록 활성화 시간이 짧은 것이 특징인 승압전압 발생회로.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970069599A KR19990050472A (ko) | 1997-12-17 | 1997-12-17 | 승압전압 발생회로 |
US09/131,384 US6011743A (en) | 1997-12-17 | 1998-08-07 | Charge pump circuit for memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970069599A KR19990050472A (ko) | 1997-12-17 | 1997-12-17 | 승압전압 발생회로 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR19990050472A true KR19990050472A (ko) | 1999-07-05 |
Family
ID=19527602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970069599A Ceased KR19990050472A (ko) | 1997-12-17 | 1997-12-17 | 승압전압 발생회로 |
Country Status (2)
Country | Link |
---|---|
US (1) | US6011743A (ko) |
KR (1) | KR19990050472A (ko) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITTO980077A1 (it) * | 1998-01-30 | 1999-07-30 | Sgs Thomson Microelectronics | Architettura di pompe ad alta tensione per dispositivi elettronici integrati |
KR100300034B1 (ko) * | 1998-02-07 | 2001-09-06 | 김영환 | 반도체소자의기판전압인가회로 |
KR100281693B1 (ko) * | 1998-09-02 | 2001-02-15 | 윤종용 | 고속 삼상 부스터 회로 |
JP2001078437A (ja) * | 1999-06-30 | 2001-03-23 | Toshiba Corp | ポンプ回路 |
JP2002026254A (ja) * | 2000-07-03 | 2002-01-25 | Hitachi Ltd | 半導体集積回路および不揮発性メモリ |
US6538494B2 (en) | 2001-03-14 | 2003-03-25 | Micron Technology, Inc. | Pump circuits using flyback effect from integrated inductance |
KR100401521B1 (ko) | 2001-09-20 | 2003-10-17 | 주식회사 하이닉스반도체 | 고전압 동작용 승압 회로 |
KR100518545B1 (ko) * | 2002-12-10 | 2005-10-04 | 삼성전자주식회사 | 고전압 스트레스를 감소시킬 수 있는 승압전압 발생회로및 승압전압 발생방법 |
US8350616B1 (en) * | 2003-11-12 | 2013-01-08 | Intellectual Ventures Funding Llc | Variable output charge pump circuit |
US7733712B1 (en) * | 2008-05-20 | 2010-06-08 | Siliconsystems, Inc. | Storage subsystem with embedded circuit for protecting against anomalies in power signal from host |
US9947388B2 (en) | 2016-03-16 | 2018-04-17 | Intel Corporation | Reduced swing bit-line apparatus and method |
US10199080B2 (en) | 2017-04-11 | 2019-02-05 | Intel Corporation | Low swing bitline for sensing arrays |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5038325A (en) * | 1990-03-26 | 1991-08-06 | Micron Technology Inc. | High efficiency charge pump circuit |
US5483486A (en) * | 1994-10-19 | 1996-01-09 | Intel Corporation | Charge pump circuit for providing multiple output voltages for flash memory |
KR0172532B1 (ko) * | 1995-10-18 | 1999-03-30 | 김주용 | 플래쉬 메모리 장치 |
KR100273208B1 (ko) * | 1997-04-02 | 2000-12-15 | 김영환 | 반도체메모리장치의고효율전하펌프회로 |
-
1997
- 1997-12-17 KR KR1019970069599A patent/KR19990050472A/ko not_active Ceased
-
1998
- 1998-08-07 US US09/131,384 patent/US6011743A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6011743A (en) | 2000-01-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19971217 |
|
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19971217 Comment text: Request for Examination of Application |
|
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20000426 Patent event code: PE09021S01D |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20001018 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20000426 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |