KR102534907B1 - 레독스 플로우 전지용 전해질막, 레독스 플로우 전지, 및 전해질막의 제조 방법 - Google Patents
레독스 플로우 전지용 전해질막, 레독스 플로우 전지, 및 전해질막의 제조 방법 Download PDFInfo
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- 125000004436 sodium atom Chemical group 0.000 description 1
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Abstract
Description
도 2 는, 실시예 12 에서 얻어진 탄소 폼의 SEM 화상이다.
도 3 은, 실시예 12 에서 얻어진 탄소 폼의 X 선 CT 해석 화상이다.
도 4 는, 실시예 12 에서 얻어진 탄소 폼의 X 선 CT 해석 화상이다.
도 5 는, 도 3 에 나타내는 탄소 폼의 X 선 CT 해석 화상에 대해, 라인 및 노드 검출을 실시한 화상 처리 후의 화상이다.
Claims (19)
- 이온 교환기를 갖는 퍼플루오로 카본 중합체를 함유하는, 레독스 플로우 전지용 전해질막으로서,
상기 퍼플루오로 카본 중합체가 600 g/eq 이상 2000 g/eq 이하의 이온 교환기의 당량 질량 EW 를 갖고,
상기 전해질막에 있어서의 크레이즈 면적률이 1.5 % 이하이고,
상기 전해질막의, 하기 2 M 황산 수용액 침지에 의한 치수 변화율에 있어서의 X 방향 및 Y 방향 중 적어도 일방의 치수 변화율이 80 % 이상 100 % 미만인, 전해질막.
<2 M 황산 수용액 침지에 의한 치수 변화율>
함수율 1 % 이하의 시험용 전해질막을 조제하고, 상기 시험용 전해질막을 2 M 황산 수용액에, 25 ℃ 에서 30 분간 침지시키고, 상기 시험용 전해질막의 면 상의 X 방향 및 상기 X 방향에 직교하는 Y 방향의 치수 변화율을 하기 식으로 산출한다.
치수 변화율 (%) = {(침지 후의 특정 방향의 치수)/(침지 전의 특정 방향의 치수)} × 100 - 이온 교환기를 갖는 퍼플루오로 카본 중합체를 함유하는, 레독스 플로우 전지용 전해질막으로서,
상기 퍼플루오로 카본 중합체가 600 g/eq 이상 2000 g/eq 이하의 이온 교환기의 당량 질량 EW 를 갖고,
상기 전해질막에 있어서의 크레이즈 면적률이 1.5 % 이하이고,
상기 전해질막의, 하기 증류수 침지에 의한 치수 변화율에 있어서의 X 방향 및 Y 방향 중 적어도 일방의 치수 변화율이 80 % 이상 100 % 미만이고, Z 방향의 치수 변화율이 115 % 이상인, 전해질막.
<증류수 침지에 의한 치수 변화율>
함수율 1 % 이하의 시험용 전해질막을 조제하고, 상기 시험용 전해질막을 증류수에, 25 ℃ 에서 30 분간 침지시키고, 상기 시험용 전해질막의 면 상의 X 방향, 상기 X 방향에 직교하는 Y 방향, 그리고, X 방향 및 Y 방향에 직교하는 Z 방향의 치수 변화율을 산출한다.
치수 변화율 (%) = {(침지 후의 특정 방향의 치수)/(침지 전의 특정 방향의 치수)} × 100 - 제 1 항 또는 제 2 항에 있어서,
상기 퍼플루오로 카본 중합체가 하기 식 (1) 로 나타내는 구조를 포함하는, 전해질막.
-[CF2-CX1X2]a-[CF2-CF(-O-(CF2-CF(CF2X3))b-Oc-(CFR1)d-(CFR2)e-(CF2)f-X4)]g- (1)
(식 (1) 중, X1, X2 및 X3 은, 각각 독립적으로, 할로겐 원자 또는 탄소수 1 ∼ 3 의 퍼플루오로알킬기이고, X4 는, -COOZ 기, -SO3Z 기, -PO3Z2 기 또는 -PO3HZ 기이고, Z 는, 수소 원자, 알칼리 금속 원자, 알칼리 토금속 원자, NH4, NH3R11, NH2R11R12, NHR11R12R13, 또는 NR11R12R13R14 이고, R11, R12, R13, 및 R14 는, 각각 독립적으로, 알킬기 또는 아릴기이고, R1 및 R2 는, 각각 독립적으로, 할로겐 원자, 탄소수 1 ∼ 10 의 퍼플루오로알킬기 또는 탄소수 1 ∼ 10 의 플루오로클로로알킬기이고, a 및 g 는, 0 ≤ a < 1, 0 < g ≤ 1, 및 a + g = 1 을 만족시키는 수이고, b 는, 0 ∼ 8 의 정수이고, c 는, 0 또는 1 이고, d, e 및 f 는, 각각 독립적으로, 0 ∼ 6 의 정수이다. 단, d, e 및 f 는 동시에 0 은 아니다.) - 제 1 항 또는 제 2 항에 있어서,
상기 퍼플루오로 카본 중합체가 하기 식 (2) 로 나타내는 구조를 포함하는, 전해질막.
-[CF2CF2]a-[CF2-CF(-O-(CF2)m-SO3H)]g- (2)
(식 (2) 중, a 및 g 는, 0 ≤ a < 1, 및 0 < g ≤ 1, a + g = 1 을 만족시키는 수이고, m 은, 1 ∼ 6 의 정수이다.) - 제 1 항 또는 제 2 항에 있어서,
상기 전해질막에 있어서의, 소각 X 선 산란으로 측정되는 막면에 수직인 방향의 이온 클러스터경이 3.0 ㎚ 이상인, 전해질막. - 제 1 항 또는 제 2 항에 있어서,
상기 전해질막에 있어서의, 소각 X 선 산란으로 측정되는 결정 길이 주기의 피크 강도가 0.5 이하인, 전해질막. - 제 1 항 또는 제 2 항에 있어서,
상기 전해질막의 적어도 일방의 면이, 아니온 교환성 화합물로 피복되어 있는, 전해질막. - 제 7 항에 있어서,
상기 아니온 교환성 화합물이 3 급 아미노기 또는 4 급 암모늄기를 갖는, 전해질막. - 탄소 전극으로 이루어지는 정극을 포함하는 정극 셀실과, 탄소 전극으로 이루어지는 부극을 포함하는 부극 셀실과, 상기 정극 셀실과 상기 부극 셀실을 격리 분리시키는, 격막으로서의 전해질막을 포함하는 전해조를 구비하고,
상기 정극 셀실이 활물질을 포함하는 정극 전해액을 포함하고,
상기 부극 셀실이 활물질을 포함하는 부극 전해액을 포함하고,
상기 전해질막이, 제 1 항 또는 제 2 항에 기재된 전해질막인, 레독스 플로우 전지. - 제 9 항에 있어서,
상기 정극 전해액 및 상기 부극 전해액이 바나듐 이온을 포함하는, 레독스 플로우 전지. - 제 9 항에 있어서,
상기 탄소 전극이 연속 공극을 갖고,
상기 탄소 전극이 섬유상 탄소를 함유하고,
상기 섬유상 탄소가 0.1 ∼ 5.0 ㎛ 의 평균 섬유경을 갖는, 레독스 플로우 전지. - 제 11 항에 있어서,
상기 탄소 전극이 3 차원적으로 연속된 탄소 구조인, 레독스 플로우 전지. - 제 11 항에 있어서,
상기 탄소 전극이, 선상부와, 상기 선상부를 결합하는 결합부를 갖는 탄소 폼인, 레독스 플로우 전지. - 제 13 항에 있어서,
상기 탄소 폼의 결합부의 수에 대한 선상부의 수의 비율이 1.2 이상 1.7 이하인, 레독스 플로우 전지. - 제 13 항에 있어서,
상기 탄소 폼의 적어도 일부에 있어서, 결합부 밀도가 15,000 개/㎣ 이상인, 레독스 플로우 전지. - 레독스 플로우 전지용 전해질막의 제조 방법으로서,
이온 교환기를 갖는 퍼플루오로 카본 중합체를 함유하는 원료막을 연신하는 공정을 포함하고,
상기 퍼플루오로 카본 중합체가 600 g/eq 이상 2000 g/eq 이하의 이온 교환기의 당량 질량 EW 를 갖고,
상기 전해질막에 있어서의 크레이즈 면적률이 1.5 % 이하이고,
상기 전해질막의, 하기 2 M 황산 수용액 침지에 의한 치수 변화율에 있어서의 X 방향 및 Y 방향 중 적어도 일방의 치수 변화율이 80 % 이상 100 % 미만인, 전해질막의 제조 방법.
<2 M 황산 수용액 침지에 의한 치수 변화율>
함수율 1 % 이하의 시험용 전해질막을 조제하고, 상기 시험용 전해질막을 2 M 황산 수용액에, 25 ℃ 에서 30 분간 침지시키고, 상기 시험용 전해질막의 면 상의 X 방향 및 상기 X 방향에 직교하는 Y 방향의 치수 변화율을 하기 식으로 산출한다.
치수 변화율 (%) = {(침지 후의 특정 방향의 치수)/(침지 전의 특정 방향의 치수)} × 100 - 레독스 플로우 전지용 전해질막의 제조 방법으로서,
이온 교환기를 갖는 퍼플루오로 카본 중합체를 함유하는 원료막을 가열하에서 연신하는 공정을 포함하고,
상기 퍼플루오로 카본 중합체가 600 g/eq 이상 2000 g/eq 이하의 이온 교환기의 당량 질량 EW 를 갖고,
상기 전해질막에 있어서의 크레이즈 면적률이 1.5 % 이하이고,
상기 전해질막의, 하기 증류수 침지에 의한 치수 변화율에 있어서의 X 방향 및 Y 방향 중 적어도 일방의 치수 변화율이 80 % 이상 100 % 미만이고, Z 방향의 치수 변화율이 115 % 이상인, 전해질막의 제조 방법.
<증류수 침지에 의한 치수 변화율>
함수율 1 % 이하의 시험용 전해질막을 조제하고, 상기 시험용 전해질막을 증류수에, 25 ℃ 에서 30 분간 침지시키고, 상기 시험용 전해질막의 면 상의 X 방향, 상기 X 방향에 직교하는 Y 방향, 그리고, X 방향 및 Y 방향에 직교하는 Z 방향의 치수 변화율을 산출한다.
치수 변화율 (%) = {(침지 후의 특정 방향의 치수)/(침지 전의 특정 방향의 치수)} × 100 - 제 16 항 또는 제 17 항에 있어서,
상기 연신하는 공정 후, 냉각 과정에 있어서 완화 처리하는 공정을 추가로 포함하는, 전해질막의 제조 방법. - 제 18 항에 있어서,
상기 완화 처리하는 공정 후, 얻어진 막을 구속한 상태에서, 유리 전이 온도 이상 또한 유리 전이 온도보다 100 ℃ 높은 온도 이하의 조건으로, 1 분 이상 30 분 이하 열처리하는 공정을 추가로 포함하는, 전해질막의 제조 방법.
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