KR102473315B1 - Pushing apparatus of handler for testing electronic devices - Google Patents

Abstract

The present invention relates to a pressurizing device for a handler for testing electronic components.
A press device according to the present invention includes a press plate having a pusher for pressurizing an electronic component loaded on a test tray; By advancing the pressure plate toward the tester (meaning that the pressure plate moves toward the tester) and pressing the electronic component loaded on the test tray toward the tester by the pressure plate, the electronic component is electrically connected to the tester, or a first drive source that electrically separates the electronic component from the tester by releasing the pressurization of the electronic component by the pressurizing plate by moving the pressurizing plate backward (meaning that the pressurizing plate moves in a direction away from the tester); a gripping rail gripping the test tray at the test position; and moving the gripping rail backward toward the pressing plate from a normal position so that the electronic component of the test tray held by the gripping rail comes into contact with the pusher, or moving the gripping rail forward to release the contact between the electronic component and the pusher. 2 drive source; includes
According to the present invention, there is an effect of increasing the operation rate of equipment because there is no need for replacement of parts even when there is a standard change of electronic parts.

Description

Handler press device for testing electronic components {PUSHING APPARATUS OF HANDLER FOR TESTING ELECTRONIC DEVICES}

The present invention relates to a handler supporting testing of manufactured electronic components. In particular, the present invention relates to a pressing device for pressing or supporting an electronic component toward a tester.

A handler for testing electronic components (hereinafter referred to as 'handler') is used to test electronic components manufactured through a predetermined manufacturing process.

The handler electrically connects the electronic component to the tester so that the electronic component can be tested by the tester, and when the test of the electronic component is completed, the electronic component is classified according to the test result. Here, the electronic component may be various, such as a semiconductor device, an SSD, and a module ram. Therefore, handlers must be manufactured in various forms corresponding to the types of electronic components to be tested.

In general, handlers are classified into a type that electrically connects electronic components directly to the tester and a type that electrically connects electronic components loaded on a test tray to the tester. The present invention relates to the latter handler in which a test is performed while electronic components are loaded on a test tray.

As shown in FIG. 1, the test tray (TT) is a handler ( circulates inside the HD).

At the loading position (LP), electronic components are loaded into the test tray (TT), at the test position (TP), the electronic components loaded on the test tray (TT) are electrically connected to the tester, and at the unloading position (UP), the test The electronic components that have been completed are unloaded from the test tray TT.

On the other hand, FIG. 1 shows an example in which the test tray TT cycles while maintaining a horizontal state in a horizontal handler, but a vertical In the case of an expression handler, the test tray must be in a vertical state at the test position. Anyway, whether the horizontal handler or the vertical handler, when the test tray (TT) moving along the circulation path (C) moves to the test position (TP), the movement of the test tray (TT) is guided to the test position (TP). A grip rail (GRa, GRb, named 'tray rail' in the prior art) capable of holding the test tray (TT) is required.

As described in the prior art, the gripping rail) is a pusher of a test socket and a pressurizing plate of a tester (in the prior art, it is divided into an 'installation plate' and a 'pusher', and is also referred to as a 'match plate' in the industry). located between Also, as shown in FIG. 2 , which is an example of a vertical handler, the gripping rails GRa and GRb are fixed to the wall surface W of the handler so as to be able to move forward and backward. When the pressure device 100 operates in the structure shown in FIG. 2 and the pressure plate 110 moves toward the tester side, as shown in FIG. 3, the pusher P contacts the electronic component ED and the pusher ( The base P _B of P is in contact with the insert I of the test tray TT, and the support rails SRa and SRb supporting the pressure plate 110 also contact the holding rails GRa and GRb. Therefore, excessive pressing force of the pusher P is prevented from being applied to the electronic component ED.

In the state of FIG. 3, when the pressure plate 110 moves further toward the tester (TESTER), the spring (S) elastically supporting the gripping rails (GRa, GRb) is compressed, and the gripping rails (GRa, GRb) are also moved along with the tester (TESTER). By moving to the side, as shown in FIG. 4 , the electronic component ED loaded on the test tray TT is electrically connected to the test socket TS of the tester TESTER. Of course, when the test is finished and the pressure plate 110 moves backward, the support rails GRa and GRb also retreat and return to their original positions due to the elastic repulsive force of the spring S.

As mentioned, in the prior art, in order to prevent excessive pressurization of the pusher P, the base P _B of the pusher P contacts the insert I, and the support rails SRa and SRb also have gripping rails GRa , GRb) has a mechanical configuration in contact with However, if the thickness of the electronic component ED (thickness in the direction in which the pressure plate moves) becomes thicker, even if the pusher P contacts the electronic component ED, the base P _B and the insert I ) is not made, and no contact is made between the support rails (SRa, SRb) and the gripping rails (GRa. GRb). In this case, there is a problem in that the electronic component ED is damaged because excessive pressing force of the pusher P is applied to the electronic component ED. Due to this problem, when the thickness of the electronic component ED to be tested is changed, the pressure plate 110 and the support rails SRa and SRb must be replaced. Therefore, the replacement of the heavy pressurizing plate 110 is accompanied by the inconvenience and reduced operation rate.

An object of the present invention is to provide a technology that does not require replacement of a pressure plate even when the thickness or length of an electronic component to be tested changes.

To achieve the above object, a pressurizing apparatus of a handler for testing electronic parts according to the present invention includes a pressurizing plate having a pusher for pressurizing electronic parts loaded on a test tray; By advancing the pressure plate toward the tester (meaning that the pressure plate moves toward the tester) and pressing the electronic component loaded on the test tray toward the tester by the pressure plate, the electronic component is electrically connected to the tester, or a first drive source that electrically separates the electronic component from the tester by releasing the pressurization of the electronic component by the pressurizing plate by moving the pressurizing plate backward (meaning that the pressurizing plate moves in a direction away from the tester); a gripping rail gripping the test tray at the test position; and moving the gripping rail backward toward the pressure plate from a normal position so that the electronic component of the test tray held by the gripping rail comes into contact with the pusher, or moving the gripping rail forward to release the contact between the electronic component and the pusher. 2 drive source; includes

The second driving source is coupled to the side of the pressure plate so that it can move forward and backward together in conjunction with the forward and backward movement of the pressure plate.

It further includes an installation frame fixed to the pressure plate and moved forward and backward together with the pressure plate, and the second driving source is coupled to the installation frame.

When the second driving source moves the gripping rail backward toward the pressure plate, the first driving source advances the pressure plate toward the tester to electrically connect the electronic component and the tester, and the first driving source moves the pressure plate toward the tester. When the electrical connection between the electronic component and the tester is disconnected by moving backward, the second driving source moves the gripping rail forward to widen the gap between the test tray and the pressure plate.

When the pressure plate advances toward the tester by the operation of the first driving source, the grip rail advances together while maintaining a distance between the grip rail and the pressure plate.

The backward movement distance of the gripping rail by the second driving source is determined by a thickness or length of an electronic component in a direction in which the gripping rail moves.

The forward distance of the pressure plate by the first driving source is determined by the thickness or length of the electronic component in the direction in which the pressure plate moves.

According to the present invention as described above, the gripping rail first moves to the pressure plate side, and the electronic component and the pusher come into contact, and then the pressure plate and the gripping rail advance toward the tester side while maintaining the distance between the gripping rail and the pressure plate, so that the electronic component moves to the tester side. An electrically connected method may be taken. Therefore, even if the thickness or length of the electronic component to be tested (meaning the thickness or length in the direction in which the pressure plate moves forward and backward) is changed, it is sufficient to set the backward distance of the gripping rail and the forward distance of the pressure plate, so the pressure plate can be replaced. There is no need, and it has the effect of increasing the operation rate of the equipment.

1 is a conceptual plan view for explaining a cycle path of a test tray in a horizontal handler.
2 is a reference diagram for explaining a structure in which a gripping rail is installed in a conventional handler.
3 and 4 are reference views for explaining forward and backward movement of the gripping rail in the handler of FIG. 2 .
5 is a schematic diagram of a pressurizing device of a handler for testing electronic parts having a basic configuration necessary to achieve the present invention.
6 and 7 are step-by-step operation state diagrams for explaining the operation of the pressurizing device of FIG.
FIG. 8 is a schematic view of a pressurizing apparatus in which the pressurizing apparatus of FIG. 5 is applied to pressurize electronic components of different types.
9 is a perspective view of a pressing device according to a specific application example to which two pressing plates are applied.

Hereinafter, preferred embodiments according to the present invention as described above will be described with reference to the accompanying drawings, but redundant descriptions are omitted or compressed as much as possible for conciseness of description.

<Description of basic configuration>

5 is a schematic diagram of a pressurizing device (500, hereinafter abbreviated as 'pressing apparatus') of a handler for testing electronic components having a basic configuration required to achieve the present invention.

The pressure device 500 includes a pressure plate 510, a first driving source 520, gripping rails 530a and 530b, a second driving source 540, a moving frame 550 and an installation frame 560.

The pressure plate 510 has pushers P that press the electronic components (ED, for example, semiconductor devices) loaded on the test tray TT. Of course, the pushers P may be provided in a form elastically supported by a spring so that the pressure plate 510 can move forward and backward at a predetermined interval in the forward and backward direction, as in Korean Patent Publication No. 10-2015-0014357.

The first driving source 520 advances the pressure plate 510 toward the tester side or moves backward toward the opposite direction. Accordingly, when the pressure plate 510 moves forward toward the tester side, the pusher P of the pressure plate 510 presses the electronic component ED toward the tester side so that the electronic component ED moves toward the tester side. ) is electrically connected to the test socket (TS), and when the pressure plate 510 moves backward, the pressurization of the electronic component (ED) by the pressure plate 510 is released, and the electronic component (ED) is electrically connected to the tester (TESTER). separated by Here, forward movement means that the pressure plate 510 moves toward the tester TESTER, and backward means that the pressure plate 510 moves away from the tester TESTER. Accordingly, the forward and backward directions may be any one of up and down directions, forward and backward directions, and left and right directions according to the structure (horizontal or vertical structure) or direction definition of the handler to which the pressing device 500 is applied. It may be considered preferable that the first driving source 520 is provided as a servo motor so as to adjust the forward and backward distance of the pressure plate 510 .

The gripping rails 530a and 530b are provided in pairs corresponding to each other, and grip both ends of the test tray TT moved to the test position on the circulation path.

The second drive source 540 moves the gripping rails 530a and 530b backward from the normal position (P ₁ ) toward the pressure plate 510, and the electronic component ED of the test tray TT held by the gripping rails 530a and 530b ) is brought into contact with the pusher P or the gripping rails 530a and 530b are moved forward to release the contact between the electronic component ED and the pusher P. It may be considered preferable that the second driving source 540 is also provided as a server motor to adjust the forward and backward distance. And the second driving source 540 is coupled to the side of the pressure plate 510 so that it can move forward and backward together in conjunction with the forward and backward movement of the pressure plate 510 .

The moving frame 550 moves forward and backward according to the operation of the second driving source 540, and is fixedly coupled with the gripping rails 530a and 530b by the coupling table JR. The moving frame 550, together with the plurality of coupling units JR, allows the driving force of the second driving source 540 to be transmitted to the gripping rails 530a and 530b in a balanced manner.

The installation frame 560 is provided to install the second driving source 540 . That is, the second driving source 560 is fixed to the installation frame 560 . And the installation frame 560 is fixed to the pressure plate 510 by a coupling rod (JB) so that it moves forward and backward together with the pressure plate 510. Therefore, the second driving source 540 is coupled to the pressure plate 510 by interposing the installation frame 560 so that it can move forward and backward in conjunction with the pressure plate 510 .

Subsequently, the operation of the pressurizing device 500 as above will be described.

As shown in FIG. 5 , when the test tray TT on which the electronic component ED to be tested is loaded is gripped by the gripping rails 530a and 530b, the _second driving source 540 operates to The gripping rails 530a and 530b are moved backward toward the pressure plate 510. Accordingly, as shown in FIG. 6 , the gripping rails 530a and 530b move backward to the contact position P ₂ , so that the electronic component ED of the test tray TT is supported in contact with the pusher P.

In the state of FIG. 6 , the first driving source 520 operates to advance the pressure plate 510 toward the tester TESSTER. Accordingly, the installation frame 560 coupled to the pressure plate 510, the second driving source 540, the moving frame 550, and the gripping rails 530a and 530b move forward together in conjunction with each other. Naturally, the test tray TT held by the gripping rails 530a and 530b also moves forward, thereby electrically connecting the electronic component ED to the test socket TS of the tester TESTER as shown in FIG. 7 . Naturally, the gripping rails 530a and 530b advance while maintaining the distance D with the pressure plate 510 as shown in FIG. 6 .

When the test on the electronic component (ED) is finished in the state shown in FIG. 7, the first driving source 520 moves the pressure plate 510 backward to release the electrical connection between the electronic component (ED) and the tester (TESTER). 6, the second driving source 540 advances the gripping rails 530a and 530b to increase the distance between the test tray TT and the pressure plate 510. As a result, the gripping rails 530a and 530b return to the proper position P ₁ that can properly guide the movement of the test tray TT moving on the circulation path.

On the other hand, when the thickness of the electronic component (ED) to be tested (meaning the thickness in the direction in which the pressure plate moves) becomes thicker, the forward and backward distance of the gripping rails 530a and 530b and the forward and backward movement of the pressure plate 510 The distance must also be adjusted to be as short as the thickened length of the electronic component. Therefore, the administrator can set the forward and backward distances of the gripping rails 530a and 530b and the forward and backward distances of the pressing plate 510 by inputting the thickness of the electronic component (ED) using an input device of a handler (not shown). . Of course, depending on implementation, a control device (not shown) automatically detects the load of the second driving source 540 according to the backward movement of the gripping rails 530a and 530b at the time of initial operation, and automatically moves the back and forth of the gripping rails 530a and 530b. It may be implemented to set the forward and backward distance of the forward and backward distance and the pressing plate 510 . Accordingly, the pressing force applied to the electronic component ED by the pusher P can always be maintained constant regardless of the thickness of the electronic component ED.

In the pressure device 500 as described above, the installation position of the first driving source 520 or the second driving source 510, whether the moving frame 550 or the installation frame 560 is provided or not, and the structure thereof correspond to various types of handlers. It can be modified in various ways. In addition, in the example of _FIG . 5, the driving force of the first driving source ₅₂₀ or the second driving source _{540 is} applied to the installation frame 550 or Although the power transmission structure is configured to be transmitted to the moving frame 550, the driving force transmission structure may be modified in various forms according to implementation.

<Reference example>

8 is a pressurization device (500A) that can be used when electrically connecting electronic components (ED', for example, SSD or module RAM) loaded in the vertical direction on the test tray (TT) to the tester (TESTER) below. A reference example is shown.

The pressure device 500A of FIG. 8 also includes a pressure plate 510A, a first driving source 520A, gripping rails 530Aa and 530Ab, a second driving source 540A, a moving frame 550A, and an installation frame 560A. And, it operates in the same way as the pressing device 500 of FIG.

<Specific Application Examples>

FIG. 9 shows a pressurizing device 500B actually applied to a handler for supporting tests of electronic components such as SSD or modular RAM.

In FIG. 9 , two press plates 510B ₁ and 510B ₂ are provided to test the electronic components loaded on the two test trays TT ₁ and TT ₂ at one time. In addition, the pressure plate (510B ₁ , 510B ₂ ), the first driving source (520B), the gripping rail (530Ba ₁ , 530Bb 1 , 530Bb ₁ , 530Ba ₂ , 530Bb ₂ ), the second driving source 540B, the moving frames 550B ₁ and 550B ₂ , and the installation frame 560B are provided by being deformed. For reference, the first driving source 520B is coupled to the fixed wall W constituting the skeleton of the handler.

Even in the case of the pressurization device 500B of FIG. 9, the only difference is that the _two pressurization plates _510B1 and 510B2 move up and down in conjunction with the pressurization device 500 of FIG. 5 or the pressurization device 500A of FIG. works the same as

Symbols G, which are not described, are guide devices for guiding proper forward and backward movement of the gripping rails 530Ba ₁ , 530Bb ₁ , 530Ba ₂ , and 530Bb ₂ and the moving frames 550B ₁ , 550B ₂ .

For reference, FIG. 9 shows a state in which the gripping rails 530Ba ₁ and 530Bb ₁ are reversed toward the pressing plate of 510B ₁ , so that they can be compared with each other, and the gripping rails 530Ba ₂ and 530Bb ₂ are in the right position. position is shown. Of course, in the actual operation process, all the gripping rails ( _{530Ba 1} , 530Bb ₁ , 530Ba ₂ , 530Bb ₂ ) will be implemented to move forward and backward together, but depending on the implementation, as shown in FIG. ₁ /530Ba ₂ , 530Bb ₂ ) may be implemented to move forward and backward independently.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described with the preferred examples of the present invention, the present invention is limited to the above embodiments. It should not be understood as being, and the scope of the present invention should be understood as the following claims and equivalent concepts thereof.

500: pressurization device of handler for electronic component test
510: press plate
P: Pusher
520: first driving source
530: grip rail
540: second drive source
560: installation frame

Claims (7)

a pressure plate having a pusher for pressing the electronic components loaded on the test tray;
By advancing the pressure plate toward the tester (meaning that the pressure plate moves toward the tester) and pressing the electronic component loaded on the test tray toward the tester by the pressure plate, the electronic component is electrically connected to the tester, or a first driving source that electrically separates the electronic component from the tester by releasing the pressurization of the electronic component by the pressurizing plate by moving the pressurizing plate backward (meaning that the pressurizing plate moves in a direction away from the tester);
a gripping rail gripping the test tray at the test position; and
A second step of moving the gripping rail backward toward the pressing plate from the original position so that the electronic component of the test tray held by the gripping rail comes into contact with the pusher, or moving the gripping rail forward to release the contact between the electronic component and the pusher. driving source; containing
The pressurization device of the handler for testing electronic components. According to claim 1,
The second driving source is coupled to the side of the pressure plate so that it can move forward and backward together in conjunction with the forward and backward movement of the pressure plate.
The pressurization device of the handler for testing electronic components. According to claim 2,
Further comprising an installation frame fixed to the pressure plate and moved forward and backward together with the pressure plate,
The second driving source is coupled to the installation frame
The pressurization device of the handler for testing electronic components. According to claim 2,
When the second driving source moves the gripping rail backward toward the pressure plate, the first driving source advances the pressure plate toward the tester to electrically connect the electronic component and the tester;
When the first driving source reverses the pressure plate to release the electrical connection between the electronic component and the tester, the second driving source advances the gripping rail to widen the gap between the test tray and the pressure plate
The pressurization device of the handler for testing electronic components. According to claim 4,
When the pressure plate advances toward the tester by the operation of the first drive source, the grip rail also advances with the distance maintained between the grip rail and the pressure plate.
The pressurization device of the handler for testing electronic components. According to claim 1,
Characterized in that the backward distance of the gripping rail by the second driving source is determined by the thickness or length of the electronic component in the direction in which the gripping rail moves.
The pressurization device of the handler for testing electronic components. According to claim 1,
Characterized in that the advancement distance of the pressure plate by the first driving source is determined by the thickness or length of the electronic component in the direction in which the pressure plate moves
The pressurization device of the handler for testing electronic components.

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