KR102358295B1 - 정전 척 및 기판 고정 장치 - Google Patents
정전 척 및 기판 고정 장치 Download PDFInfo
- Publication number
- KR102358295B1 KR102358295B1 KR1020170123164A KR20170123164A KR102358295B1 KR 102358295 B1 KR102358295 B1 KR 102358295B1 KR 1020170123164 A KR1020170123164 A KR 1020170123164A KR 20170123164 A KR20170123164 A KR 20170123164A KR 102358295 B1 KR102358295 B1 KR 102358295B1
- Authority
- KR
- South Korea
- Prior art keywords
- electrostatic chuck
- hole
- heating element
- base
- buried
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000758 substrate Substances 0.000 title claims description 41
- 239000000463 material Substances 0.000 claims abstract description 16
- 238000010438 heat treatment Methods 0.000 claims description 49
- 238000000034 method Methods 0.000 claims description 32
- 229920005989 resin Polymers 0.000 description 44
- 239000011347 resin Substances 0.000 description 44
- 239000010410 layer Substances 0.000 description 43
- 239000010408 film Substances 0.000 description 32
- 238000001179 sorption measurement Methods 0.000 description 26
- 235000012431 wafers Nutrition 0.000 description 14
- 239000012790 adhesive layer Substances 0.000 description 11
- 239000000498 cooling water Substances 0.000 description 9
- 239000011888 foil Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 238000005530 etching Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 238000007788 roughening Methods 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 229910000914 Mn alloy Inorganic materials 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 2
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 2
- 229910001006 Constantan Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 description 2
- 239000002826 coolant Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000007822 coupling agent Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 229910001120 nichrome Inorganic materials 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 229920003192 poly(bis maleimide) Polymers 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910000640 Fe alloy Inorganic materials 0.000 description 1
- 229910000896 Manganin Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
본 발명의 정전 척은, 발열부와, 상기 발열부 상에 구비되는 기체를 포함하는 정전 척으로서, 상기 기체는, 흡착 대상물이 흡착 유지되는 제1 면과, 상기 제1 면의 반대쪽에 위치하며 상기 발열부에 접하는 제2 면과, 상기 제2 면에서 개구되어 있으며 암나사가 형성된 내벽면을 가지는 구멍을 포함하고, 상기 정전 척은, 상기 구멍의 바닥면에 구비되는 온도 센서와, 상기 기체와 동일한 재료로 이루어지고, 측면에 수나사가 형성되어 있으며, 상기 구멍 안에 매설되어 상기 측면이 상기 암나사가 형성된 내벽면과 나사 결합되는 매설부를 더 포함한다.
Description
도 2a 내지 도 2h는 본 실시형태에 따른 기판 고정 장치의 제조 공정을 예시하는 도면이다.
도 3은 비교예에 따른 기판 고정 장치를 간략화하여 예시하는 단면도이다.
10 베이스 플레이트
15 수로
15a 냉각수 도입부
15b 냉각수 배출부
20 접착층
21 제1층
22 제2층
30 발열부
31 절연층
32 발열체
40 흡착 유지부
41 기체
41a 제1 면
41b 제2 면
41x 구멍
42 정전 전극
50 온도 센서
60 매설부
70 정전 척
311 절연 수지 필름
Claims (11)
- 발열체를 포함하는 발열부와, 상기 발열부 상에 구비되는 기체(substrate)를 포함하는 정전 척으로서,
상기 기체는,
흡착 대상물이 흡착 유지되는 제1 면과,
상기 제1 면의 반대쪽에 위치하며 상기 발열부에 접하는 제2 면과,
상기 제2 면에서 개구되어 있으며 암나사가 형성된 내벽면을 가지는 구멍을 포함하고,
상기 정전 척은,
상기 구멍의 바닥면에 구비되는 온도 센서와,
상기 기체와 동일한 재료로 이루어지고, 측면에 수나사가 형성되어 있으며, 상기 구멍 안에 매설되어 상기 측면이 상기 암나사가 형성된 내벽면과 나사 결합되는 매설부를 더 포함하고,
상기 매설부가 상기 발열부와 직접 접합되고,
상기 발열체는 기체의 두께 방향에서 보았을 때 상기 매설부와 중복되게 배치되어 있는 정전 척. - 제1항에 있어서,
상기 발열체는 적어도 하나의 조화면(粗化面)을 포함하고,
상기 발열부는, 상기 발열체를 피복하며 상기 기체에 직접 접합되는 절연층을 더 포함하는 것인 정전 척. - 베이스 플레이트와,
상기 베이스 플레이트 상에 탑재된, 제1항에 기재된 정전 척을 포함하는 기판 고정 장치. - 발열체를 포함하는 발열부와, 상기 발열부 상에 구비되는 기체를 포함하는 정전 척으로서,
상기 기체는,
정전 전극과,
흡착 대상물이 흡착 유지되는 제1 면과,
상기 제1 면의 반대쪽에 위치하며 상기 발열부에 접하는 제2 면과,
상기 제2 면에서 개구되어 있으며 암나사가 형성된 내벽면을 가지는 구멍을 포함하고,
상기 정전 척은,
상기 구멍의 바닥면에 구비되는 온도 센서와,
상기 기체와 동일한 재료로 이루어지고, 측면에 수나사가 형성되어 있으며, 상기 구멍 안에 매설되어 상기 측면이 상기 암나사가 형성된 내벽면과 나사 결합되는 매설부를 더 포함하고,
상기 구멍의 바닥면은 상기 정전 전극보다 상기 기체의 제1 면에 가깝게 구비되어 있고,
상기 발열체는 기체의 두께 방향에서 보았을 때 상기 매설부와 중복되게 배치되어 있는 정전 척. - 제4항에 있어서,
상기 구멍의 바닥면은 상기 기체의 제2 면보다 상기 기체의 제1 면에 가깝게 구비되어 있는 정전 척. - 베이스 플레이트와,
상기 베이스 플레이트 상에 탑재된, 제4항에 기재된 정전 척을 포함하는 기판 고정 장치. - 제1항에 있어서,
상기 온도 센서와 상기 매설부 사이에 공간이 형성되어 있는 정전 척. - 삭제
- 삭제
- 삭제
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2016-195064 | 2016-09-30 | ||
JP2016195064A JP6697997B2 (ja) | 2016-09-30 | 2016-09-30 | 静電チャック、基板固定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180036553A KR20180036553A (ko) | 2018-04-09 |
KR102358295B1 true KR102358295B1 (ko) | 2022-02-07 |
Family
ID=61757184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020170123164A Active KR102358295B1 (ko) | 2016-09-30 | 2017-09-25 | 정전 척 및 기판 고정 장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10886154B2 (ko) |
JP (1) | JP6697997B2 (ko) |
KR (1) | KR102358295B1 (ko) |
TW (1) | TWI749066B (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10186437B2 (en) * | 2015-10-05 | 2019-01-22 | Lam Research Corporation | Substrate holder having integrated temperature measurement electrical devices |
CN110911332B (zh) * | 2018-09-14 | 2022-11-25 | 北京北方华创微电子装备有限公司 | 静电卡盘 |
WO2021072200A1 (en) | 2019-10-12 | 2021-04-15 | Applied Materials, Inc. | Wafer heater with backside and integrated bevel purge |
JP7516147B2 (ja) * | 2020-07-27 | 2024-07-16 | 日本特殊陶業株式会社 | 保持装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003100422A (ja) | 2001-09-25 | 2003-04-04 | Toshiba Ceramics Co Ltd | 箔状の抵抗発熱素子及び面状セラミックスヒーター |
JP2010533863A (ja) | 2007-07-19 | 2010-10-28 | ラム リサーチ コーポレーション | 熱的に分離されたチップを有する温度プローブ |
JP2014132702A (ja) | 2013-01-04 | 2014-07-17 | Kyocera Corp | 防水構造を有する電子機器 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4259123A (en) * | 1977-04-04 | 1981-03-31 | John Tymkewicz | Thermocouple probe-construction and mounting |
JPH06170670A (ja) * | 1992-12-08 | 1994-06-21 | Fuji Electric Co Ltd | 静電チャック装置およびその運転方法 |
JP4040814B2 (ja) * | 1998-11-30 | 2008-01-30 | 株式会社小松製作所 | 円盤状ヒータ及び温度制御装置 |
US6490146B2 (en) * | 1999-05-07 | 2002-12-03 | Applied Materials Inc. | Electrostatic chuck bonded to base with a bond layer and method |
WO2002043441A1 (fr) * | 2000-11-24 | 2002-05-30 | Ibiden Co., Ltd. | Element chauffant en ceramique et procede de production |
JP3671951B2 (ja) * | 2002-10-08 | 2005-07-13 | 住友電気工業株式会社 | 測温装置及びそれを用いたセラミックスヒータ |
JP4569077B2 (ja) * | 2003-06-05 | 2010-10-27 | 住友電気工業株式会社 | 半導体あるいは液晶製造装置用保持体およびそれを搭載した半導体あるいは液晶製造装置 |
JP4450106B1 (ja) * | 2008-03-11 | 2010-04-14 | 東京エレクトロン株式会社 | 載置台構造及び処理装置 |
JP5250408B2 (ja) * | 2008-12-24 | 2013-07-31 | 新光電気工業株式会社 | 基板温調固定装置 |
JP5618638B2 (ja) * | 2010-06-07 | 2014-11-05 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置または試料載置台 |
JP6342769B2 (ja) * | 2014-09-30 | 2018-06-13 | 日本特殊陶業株式会社 | 静電チャック |
-
2016
- 2016-09-30 JP JP2016195064A patent/JP6697997B2/ja active Active
-
2017
- 2017-09-13 US US15/703,328 patent/US10886154B2/en active Active
- 2017-09-19 TW TW106132084A patent/TWI749066B/zh active
- 2017-09-25 KR KR1020170123164A patent/KR102358295B1/ko active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003100422A (ja) | 2001-09-25 | 2003-04-04 | Toshiba Ceramics Co Ltd | 箔状の抵抗発熱素子及び面状セラミックスヒーター |
JP2010533863A (ja) | 2007-07-19 | 2010-10-28 | ラム リサーチ コーポレーション | 熱的に分離されたチップを有する温度プローブ |
JP2014132702A (ja) | 2013-01-04 | 2014-07-17 | Kyocera Corp | 防水構造を有する電子機器 |
Also Published As
Publication number | Publication date |
---|---|
KR20180036553A (ko) | 2018-04-09 |
US10886154B2 (en) | 2021-01-05 |
TWI749066B (zh) | 2021-12-11 |
TW201814825A (zh) | 2018-04-16 |
US20180096870A1 (en) | 2018-04-05 |
JP6697997B2 (ja) | 2020-05-27 |
JP2018060834A (ja) | 2018-04-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102345253B1 (ko) | 정전 척 및 기판 고정 장치 | |
TWI717542B (zh) | 基板保持裝置 | |
US11631598B2 (en) | Substrate fixing device | |
KR102358295B1 (ko) | 정전 척 및 기판 고정 장치 | |
KR102283385B1 (ko) | 기판 고정 장치 및 그 제조방법 | |
TW202232650A (zh) | 靜電夾盤、其製造方法及基板固定裝置 | |
US12340991B2 (en) | Substrate fixing device | |
KR102833081B1 (ko) | 기판 고정 장치 | |
US12230527B2 (en) | Electrostatic chuck and substrate fixing device | |
KR20240134762A (ko) | 기판 고정 장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20170925 |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20200826 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20170925 Comment text: Patent Application |
|
E701 | Decision to grant or registration of patent right | ||
PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20220114 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20220127 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20220128 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20241216 Start annual number: 4 End annual number: 4 |