KR102278163B1 - 이미지센서와 이를 사용한 영상 시스템 - Google Patents
이미지센서와 이를 사용한 영상 시스템 Download PDFInfo
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- KR102278163B1 KR102278163B1 KR1020140122205A KR20140122205A KR102278163B1 KR 102278163 B1 KR102278163 B1 KR 102278163B1 KR 1020140122205 A KR1020140122205 A KR 1020140122205A KR 20140122205 A KR20140122205 A KR 20140122205A KR 102278163 B1 KR102278163 B1 KR 102278163B1
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- 238000003384 imaging method Methods 0.000 title description 10
- 238000003702 image correction Methods 0.000 claims abstract description 79
- 238000006243 chemical reaction Methods 0.000 claims abstract description 21
- 238000005452 bending Methods 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims abstract description 8
- 230000002093 peripheral effect Effects 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 7
- 238000003672 processing method Methods 0.000 description 4
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 206010061549 Sensation of foreign body Diseases 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 210000000214 mouth Anatomy 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/80—Camera processing pipelines; Components thereof
- H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/50—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment specially adapted for specific body parts; specially adapted for specific clinical applications
- A61B6/51—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment specially adapted for specific body parts; specially adapted for specific clinical applications for dentistry
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/672—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction between adjacent sensors or output registers for reading a single image
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
- H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
- H10F77/1698—Thin semiconductor films on metallic or insulating substrates the metallic or insulating substrates being flexible
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
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- Animal Behavior & Ethology (AREA)
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- Oral & Maxillofacial Surgery (AREA)
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- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
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Abstract
Description
도 2는 본 발명의 실시예에 따른 이미지센서를 개략적으로 도시한 도면.
도 3 내지 5는 본 발명의 실시예에 따른 이미지센서의 영상보정패턴이 형성된 시트의 여러 예를 개략적으로 도시한 도면.
도 6은 본 발명의 실시예에 따른 이미지센서의 영상보정패턴이 형성된 이미지센서패널을 개략적으로 도시한 도면.
도 7은 본 발명의 실시예에 따라 획득된 영상에 표시된 영상보정패턴과 실제 영상보정패턴을 매칭하여 영상 보정을 수행하는 과정을 개략적으로 도시한 도면.
도 8은 본 발명의 실시예에 따른 영상 처리 방법을 개략적으로 도시한 흐름도.
130: 전송배선 150: 시트
160: 영상보정패턴
Claims (12)
- 휘는 특성을 갖는 이미지센서에 있어서,
광전변환소자가 구비된 다수의 화소를 포함하는 이미지센서패널과;
광이 입사되는 입사면 방향으로 상기 광전변환소자 전방에 위치하며, 상기 광을 차폐하는 물질로 이루어진 영상보정패턴을 포함하고,
상기 영상보정패턴은, 상기 이미지센서패널 상에 형성되어 상기 이미지센서의 휨에 따라 위치 또는 간격이 변동되는 이미지센서.
- 제 1 항에 있어서,
상기 이미지센서패널은, 상기 광이 입사되는 액티브 영역과 상기 액티브 영역 주변의 주변영역을 포함하고,
상기 영상보정패턴은, 상기 주변영역에 배치되는
이미지센서.
- 제 1 항에 있어서,
상기 영상보정패턴은, 상기 이미지센서패널에 직접 형성되는
이미지센서.
- 제 1 항에 있어서,
상기 영상보정패턴은, 상기 이미지센서패널의 전방 상에 부착되는 시트에 형성된
이미지센서.
- 제 1 항에 있어서,
상기 화소는 횡방향과 열방향을 따라 배열되고,
상기 영상보정패턴은, 상기 횡방향과 열방향 중 적어도 하나의 방향을 따라 배열되는 이미지센서.
- 제1항, 제2항, 제5항 중 어느 하나의 항에 기재된 이미지센서를 포함하는 영상시스템으로서,
상기 이미지센서와;
상기 영상보정패턴의 위치와 간격 중 적어도 하나와 상기 이미지센서를 통해 획득된 영상에 표시된 영상보정패턴의 위치와 간격 중 적어도 하나를 비교해서 상기 영상을 보정하는 이미지 프로세서를 포함하는
영상 시스템.
- 삭제
- 삭제
- 삭제
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140122205A KR102278163B1 (ko) | 2014-09-15 | 2014-09-15 | 이미지센서와 이를 사용한 영상 시스템 |
PCT/KR2015/009673 WO2016043498A2 (ko) | 2014-09-15 | 2015-09-15 | 이미지센서와 이를 사용한 영상 시스템 및 영상 처리 방법 |
US15/511,633 US10044951B2 (en) | 2014-09-15 | 2015-09-15 | Image system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140122205A KR102278163B1 (ko) | 2014-09-15 | 2014-09-15 | 이미지센서와 이를 사용한 영상 시스템 |
Publications (2)
Publication Number | Publication Date |
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KR20160031876A KR20160031876A (ko) | 2016-03-23 |
KR102278163B1 true KR102278163B1 (ko) | 2021-07-19 |
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KR1020140122205A Active KR102278163B1 (ko) | 2014-09-15 | 2014-09-15 | 이미지센서와 이를 사용한 영상 시스템 |
Country Status (3)
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US (1) | US10044951B2 (ko) |
KR (1) | KR102278163B1 (ko) |
WO (1) | WO2016043498A2 (ko) |
Families Citing this family (1)
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US10825855B2 (en) * | 2018-12-13 | 2020-11-03 | Palo Alto Research Center Incorporated | Flexible x-ray sensor with integrated strain sensor |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH1023334A (ja) * | 1996-06-30 | 1998-01-23 | Shimadzu Corp | X線映像装置 |
DE19856537A1 (de) | 1998-12-08 | 2000-06-15 | Philips Corp Intellectual Pty | Verfahren zur intraoperativen Kalibration von C-Bogen Röntgenanordnungen |
DE10136756C2 (de) * | 2001-07-27 | 2003-07-31 | Siemens Ag | Röntgendiagnostikeinrichtung mit einem flexiblen Festkörper-Röntgendetektor |
JP4496354B2 (ja) * | 2004-06-18 | 2010-07-07 | 独立行政法人 宇宙航空研究開発機構 | カメラ校正のための透過型校正器具とその校正法 |
US20060044463A1 (en) * | 2004-08-30 | 2006-03-02 | Micheal Talley | Method and thin image sensor with strain deformation |
GB0504415D0 (en) * | 2005-03-03 | 2005-04-06 | E2V Tech Uk Ltd | Non-planar x-ray sensor |
US7297926B2 (en) * | 2005-08-18 | 2007-11-20 | Em4, Inc. | Compound eye image sensor design |
US7521685B2 (en) * | 2006-01-18 | 2009-04-21 | General Electric Company | Structured scintillator and systems employing structured scintillators |
KR100809351B1 (ko) | 2006-04-03 | 2008-03-05 | 삼성전자주식회사 | 투사 영상을 보정하는 방법 및 장치 |
JP2007295375A (ja) * | 2006-04-26 | 2007-11-08 | Nippon Telegr & Teleph Corp <Ntt> | 投影映像補正装置及び投影映像補正プログラム |
JP2009213673A (ja) * | 2008-03-11 | 2009-09-24 | Fujinon Corp | 内視鏡システム及び内視鏡の検査方法 |
CN101576707B (zh) * | 2008-05-06 | 2012-07-18 | 鸿富锦精密工业(深圳)有限公司 | 镜头长度量测系统及量测方法 |
JP2010078415A (ja) * | 2008-09-25 | 2010-04-08 | Fujifilm Corp | 放射線検出装置及び放射線画像撮影システム |
KR20120098544A (ko) | 2011-02-28 | 2012-09-05 | 김숙향 | 디스플레이 장치 |
KR101420250B1 (ko) * | 2012-11-26 | 2014-07-17 | 한국전기연구원 | 플렉서블 엑스레이 디텍터의 제조 방법 및 플렉서블 엑스레이 디텍터를 갖는 방사선 검출 장치 |
WO2014168974A1 (en) * | 2013-04-08 | 2014-10-16 | Omnivision Technologies, Inc. | Systems and methods for calibration of a 360 degree camera system |
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2014
- 2014-09-15 KR KR1020140122205A patent/KR102278163B1/ko active Active
-
2015
- 2015-09-15 WO PCT/KR2015/009673 patent/WO2016043498A2/ko active Application Filing
- 2015-09-15 US US15/511,633 patent/US10044951B2/en active Active
Also Published As
Publication number | Publication date |
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WO2016043498A2 (ko) | 2016-03-24 |
KR20160031876A (ko) | 2016-03-23 |
US10044951B2 (en) | 2018-08-07 |
WO2016043498A3 (ko) | 2016-05-06 |
US20170264837A1 (en) | 2017-09-14 |
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