[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

KR101883199B1 - Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods - Google Patents

Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods Download PDF

Info

Publication number
KR101883199B1
KR101883199B1 KR1020160178906A KR20160178906A KR101883199B1 KR 101883199 B1 KR101883199 B1 KR 101883199B1 KR 1020160178906 A KR1020160178906 A KR 1020160178906A KR 20160178906 A KR20160178906 A KR 20160178906A KR 101883199 B1 KR101883199 B1 KR 101883199B1
Authority
KR
South Korea
Prior art keywords
resistance
value
target
resistor
measuring
Prior art date
Application number
KR1020160178906A
Other languages
Korean (ko)
Other versions
KR20180075734A (en
Inventor
유광민
김완섭
강전홍
이상화
Original Assignee
한국표준과학연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국표준과학연구원 filed Critical 한국표준과학연구원
Priority to KR1020160178906A priority Critical patent/KR101883199B1/en
Priority to PCT/KR2016/015303 priority patent/WO2018124316A1/en
Publication of KR20180075734A publication Critical patent/KR20180075734A/en
Application granted granted Critical
Publication of KR101883199B1 publication Critical patent/KR101883199B1/en

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/12—AC or DC measuring bridges using comparison of currents, e.g. bridges with differential current output
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The present invention relates to a resistance value measuring method and a resistance value measuring method for measuring a resistance value of a target resistance by adjusting a resistance value error of a target resistance through a resistance value of a reference resistance and adjusting an error of a resistance measurement function of the measurement part, The present invention relates to a calibration device for a resistance measuring function of a measuring device and a resistance calibration method using the same, the reference resistance having a reference value as a reference; A pair of target resistors having resistance values corresponding to the reference resistances, gradually increasing and having the same resistance value; A measuring unit connected to both ends of the reference resistor and the target resistor to measure a resistance value of the reference resistor and the target resistor; A comparison unit connected to the measurement unit for comparing the measured value of the reference resistance with the measured value of the reference resistance; A display unit for displaying the reference resistance measurement value and the target resistance measurement value to be compared in the comparison unit, and a storage unit for storing the reference resistance measurement value and the target resistance measurement value displayed on the display unit.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resistance measuring apparatus and a resistance calibration method using the same,

[0001] The present invention relates to a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus, and more particularly, The present invention relates to a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus, and a resistance calibration method using the same.

In general, the resistance measuring method is a method of comparing two resistances with each other, a bridge method, a potential difference method, and an ohmmeter method which directly measures a resistance are used as a measurement principle. The former two methods are widely known as a more accurate measurement method . The potential difference method requires a stable current source and requires a potentiometer or a digital voltmeter to measure a very low voltage.

For that reason, this method is mainly used in the range of about 1 Ω to 100 kΩ. The resistance bridges are widely used such as Wheatstone bridges, Kelvin bridges, and DC current comparator bridges (dcc bridges). Since the two bridges use a standard resistor of several kΩ as a comparator arm Their accuracy depends on various environmental factors and stability of arm resistance.

Therefore, the most accurate one among commercial resistance bridges is a DC current comparator bridge, which is composed of the disadvantages of the above-mentioned potential difference method and the weak points of the commercial resistance bridge. That is, as shown in FIG. 1, the direct current comparator bridge (dcc bridge) is constructed such that the ampere turn balance and the voltage balance are automatically performed in principle and the resulting resistance The ratio is given as the ratio of the two windings of the primary and secondary windings, so it can be used semi-permanently without any change in time unless it is very humid.

With such advantages, the accuracy of the DC current comparator bridge is usually used below sub-ppm. In particular, some recent equipment makers have developed DC current comparator bridges with measurement accuracy of 0.01 ppm (parts per million).

There are two main methods for correcting the ratio of the DC current comparator bridge having such a high accuracy. The first is a direct calibration method using a higher level instrument such as a Cryogenic Current Comparator bridge (CCC Bridge), where two standard resistors with good stability are measured using the instrument The ratio error of the DC current comparator bridge is determined by calculating the difference between the measured value and the measured value using the DC current comparator bridge.

Second, the ratio error is determined by calculating the difference between the ratio transmission standard (Hamon, divider, etc.) that already knows the ratio value and the two values measured by the DC current comparator bridge.

However, in the latter method, the Hamon-type commercial apparatus is not accurate to 0.05 ppm or more, and it is difficult to maintain the accuracy.

On the other hand, using the former method can determine the rate error very accurately, but very professional measurement techniques are needed to the extent that the National Metrology Institute (NMI), which has its CCC bridge globally, Since it operates using a SQUID, it is very sensitive to ambient noise, and operates in a liquid helium state, which is not economical.

In the prior art, a ratio is calculated by comparing a plurality of resistances in a binary manner with a standard resistor in a ratio of 1: 1, and compared with a ratio value obtained by a ratio meter such as a DC current comparator bridge to obtain a ratio error However, since the prior art requires a complicated structure measuring device and the size of the measuring device is large, there is a problem that it can be measured only at a designated place. There is a problem that the size of the equipment is large and the structure is complicated and the price is high.

Prior Patent: Korean Patent Registration No. 10-0862094 (October 09, 2008)

The present invention relates to a resistance value measuring method and a resistance value measuring method for measuring a resistance value of a target resistance by adjusting a resistance value error of a target resistance through a resistance value of a reference resistance and adjusting an error of a resistance measurement function of the measurement part, And a resistance calibration method using the same.

According to another aspect of the present invention, there is provided a resistance value measuring apparatus and a resistance value measuring apparatus using the resistance value measuring apparatus, the resistance value measuring apparatus comprising: a reference resistor having a reference set value; A pair of target resistors having resistance values corresponding to the reference resistances, gradually increasing and having the same resistance value; A measuring unit connected to both ends of the reference resistor and the target resistor to measure a resistance value of the reference resistor and the target resistor; A comparison unit connected to the measurement unit for comparing the measured value of the reference resistance with the measured value of the reference resistance; A display unit for displaying the reference resistance measurement value and the target resistance measurement value to be compared in the comparison unit, and a storage unit for storing the reference resistance measurement value and the target resistance measurement value displayed on the display unit.

Specifically, the object resistors are made up of a pair, and each resistance value can be measured at both ends of each resistance, and each resistance is increased by a multiple of the reference resistance, and the resistance can be changed to a target resistance to be calibrated. do.

An error between the reference resistance and the target resistance is displayed on the display unit by comparing the measured resistance value of the reference resistance with the measured resistance value of the target resistance, and the error of the target resistance is adjusted so as to be similar to the resistance value of the reference resistance .

The measuring unit digitizes and displays the measured resistance value, and is capable of simultaneously or separately measuring the reference resistance and the target resistance.

According to another aspect of the present invention, there is provided a resistance value measuring apparatus for measuring a resistance value of a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus. The resistance value measuring apparatus includes: Measuring a resistance value of a reference resistor connected to the measurement unit and connected to the measurement unit; Measuring a resistance value of a target resistance through a measurement unit by arranging in series a target resistance to be compared with a reference resistance measurement value measured through a step of measuring a resistance value of the reference resistance; Comparing a reference resistance measurement value and a target resistance measurement value measured by the measurement unit in a step of measuring a resistance value of the reference resistance and a resistance value of the target resistance in a comparison unit; The comparison unit compares the reference resistance measurement value, the target resistance measurement value, the reference resistance measurement value, and the target resistance measurement value, and displays the error value on the display unit. Based on the error value of the target resistance, Adjusting a resistance value; Storing the reference resistance measurement value, the target resistance measurement value, the reference resistance measurement value, and the error value for the target resistance measurement value displayed through the step of adjusting the resistance value according to the error value in a storage unit; A step of measuring a resistance value of a target resistance by changing a target resistance, a step of comparing in a comparing section, a step of adjusting a resistance value, and a step of storing in a storing section are repeatedly performed so that the resistance value of the target resistance is matched with the reference resistance And repeatedly calibrating.

The comparing unit compares the reference resistance measurement value with the target resistance measurement value to calculate an error value for the target resistance measurement value according to the reference resistance measurement value and transmits the calculated error value to the display unit for display .

Wherein the step of adjusting the resistance value comprises comparing the resistance value of the reference resistance with the resistance value of the target resistance by comparing the resistance value of the target resistance with the resistance value of the target resistance, To be close to each other.

The measuring unit measuring the resistance value of the reference resistance and measuring the resistance value of the target resistance may check whether the measured value of the measuring unit itself is normal through the resistance value of the reference resistance which is confirmed in advance So that the measurement error of the measuring unit can be adjusted.

According to the present invention, the resistance value of the target resistance can be adjusted through the reference resistance resistance value measured through the measurement unit, and the resistance measurement function of the measurement unit can be checked and adjusted through the reference resistance.

In addition, since the measuring unit can be replaced with a low-cost measuring instrument, the object resistance can be calibrated at low cost.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a diagram showing the entire configuration of a resistance value measuring apparatus and resistance measuring function correcting apparatus using a binary drain resistance increase according to an embodiment of the present invention. FIG.
FIG. 2 is a view showing a procedure of a resistance value measuring method using a resistance increase measuring device according to the present invention and a resistance calibration method using the resistance measuring function correcting device.

Hereinafter, embodiments of the present invention will be described with reference to the drawings. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are not intended to limit the invention to the particular forms disclosed. And shall not interpret it.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing the entire configuration of a resistance value measuring apparatus resistance measuring function correcting apparatus using a binary drain resistance increase according to an embodiment of the present invention, which includes a reference resistor 10 having a reference resistance value, The resistance value of which is gradually increased and is connected to a pair of target resistors 20, reference resistors 10 and target resistors 20 having the same resistance value as the resistors 10, A comparator 40 for comparing the resistance value of the reference resistor 10 and the resistance value of the target resistor 20, a display unit 50 for displaying the compared resistance values, an error display unit 50, And a storage unit 60 for storing a value.

The reference resistor 10 is a resistor having a resistance value that serves as a reference for adjusting the error between the target resistor 20 and the measuring unit 30. [

The reference resistor 10 may have a value ranging from 1? To 1 G?, And a user may select and use a resistance value to be adjusted.

The target resistance 20 can be adjusted by increasing the resistance from the resistance having the same resistance value as that of the reference resistance 10 and increasing or decreasing the resistance from the resistance having twice the value of the reference resistance 10 to a multiple.

A pair of the target resistors 20 are connected in series, and a resistance value can be measured at both ends of each target resistor 20 and at both ends of the two target resistors 20.

The target resistor 20 is a resistor whose resistance value can be adjusted. The target resistor 20 has a value in the range of 1? To 1 G?, Selects a resistance value to be adjusted by the user and connects the same resistance value in series, ) Is gradually increased and the resistance value of the reference resistance 10 is gradually increased to gradually increase or decrease the resistance value of the reference resistance 10.

The measuring unit 30 is connected to both ends of the reference resistor 10 and the target resistor 20 to measure resistance values of the reference resistor 10 and the target resistor 20. [

The measurement unit 30 digitizes and displays the measured resistance value and can measure the reference resistance 10 and the target resistance 20 simultaneously or separately.

The measuring unit 30 may be a universal digital multimeter that is easy to use, or may be a separate measuring instrument.

The measuring unit 30 may measure the resistance of the reference resistor 10 and check the measurement error of the measuring unit 30 through the resistance of the reference resistor 10 to adjust the error of the measuring unit 30. [ have.

The measurement unit 30 measures the resistance value of the target resistance 20 and transmits the measured resistance value to the comparison unit 40.

The measuring unit 30 may be a separate external device, and thus the measuring unit 30 can be replaced, so that expensive measuring equipment can be avoided, and a measuring device easily used by the user can be connected and used.

The resistance value of the reference resistor 10 and the resistance of the target resistor 20 measured by the measuring unit 30 are transmitted or received by the comparing unit 40 and the resistance of the target resistor 20 And the error between the reference resistor 10 and the target resistor 20 is calculated.

The comparator 40 is connected to the input unit, and when the resistance values measured by the measuring unit 30 are transmitted and can not be inputted, manual input is possible.

The error of the resistance values of the reference resistance 10 and the target resistance 20 and the measured values of the reference resistance 10 and the target resistance 20 are compared with each other by the display unit 50 And displayed.

The user can adjust the error value of the target resistor 20 which is different from the resistance value of the reference resistor 10 so as to be close to or equal to the resistance value of the reference resistor 10. [

The storage unit 60 stores the resistance values of the reference resistor 10 and the target resistor 20 measured in the display unit 50 and the resistance error values of the reference resistor 10 and the target resistor 20.

The storage unit 60 may be formed of one module including the display unit 50 and the comparison unit 40 or may be connected to the display unit 50 as a separate storage unit.

At this time, the storage unit 60 may be connected to the display unit 50 through USB, serial communication, LAN, or wireless communication.

The target resistor 20, the reference resistor 10, the comparator 40, the display unit 50, and the storage unit 60 may be formed of a single module, The reference resistor 10 is formed to be replaceable, and the measuring unit 30 can be separately detachably coupled to be replaceable.

A method for calibrating the resistance measurement function of the target resistance 20 or the measurement unit 30 through such a configuration is as follows.

Measuring a resistance value of the reference resistor 10 connected to the measuring unit 30 by selecting the reference resistor 10 corresponding to the resistance value of the target resistor 20 to be calibrated and connecting the measuring resistor 30 to the measuring unit 30, The target resistors 20 to be calibrated to be compared with the measured value of the reference resistor 10 measured through the step of measuring the resistance value of the reference resistor 10 are arranged in series and the measurement unit 30 A step S20 of measuring the resistance value of the target resistor 20 through the step S20 of measuring the resistance value of the target resistor 20 and a step S20 of measuring the resistance value of the target resistor 20, (S30) of comparing the measured value of the reference resistance 10 measured by the measuring unit 30 with the measured value of the target resistance 20 at the comparator 40 at the comparator 40, The measured value of the reference resistance 10 and the measured value of the reference resistance 10 and the measured value of the target resistance 20 are displayed on the display unit 50 (Step S40) of adjusting the resistance value in accordance with the error value of the target resistance 20 and comparing the measured value of the reference resistance 10 and the measured value of the target resistance 20 displayed through the step of displaying on the display unit 50 A step S50 of storing the measured value of the reference resistance 10 and an error value of the measured value of the target resistance 20 in the storage unit 60 and a step of changing the target resistance 20 to be corrected, The resistance value is measured (S20), the comparison unit 40 performs a comparison (S30), the resistance value is adjusted (S40), and the storage unit 60 stores (S50) And repeatedly calibrating the resistance value of the resistor 20 to fit the reference resistor 10 (S60).

The step S10 of measuring the resistance value of the reference resistor 10 is a step S10 of measuring the resistance value of the reference resistor 10 through the measuring unit 30 connected to the reference resistor 10.

In this case, the resistance value of the reference resistor 10 is a reference and does not have to be measured through the measuring unit 30, and may be measured using a resistance value of the reference resistor 10 measured by the measuring unit 30 It is possible to check whether the measurement function is abnormal according to the error of the value.

When the reference resistance 10 is measured through the step of measuring the resistance value of the reference resistance 10, the resistance value of the target resistance 20 is measured (S20) Are arranged in series and the resistance value of the target resistor 20 is measured through the measuring unit 30. [

The resistance value of the reference resistor 10 measured through the step of measuring the resistance value of the reference resistor 10 and the step of measuring the resistance value of the target resistor 20 and the resistance value of the target resistor 20 Is compared with the resistance value of the reference resistor 10 through the comparison step S30 in the comparison unit 40 to calculate the resistance value error of the target resistor 20 which is different from the resistance value of the reference resistor 10. [

When comparing the reference resistance 10 and the target resistance 20 in the comparator 40, the resistance value of the pair of the target resistors 20 connected in series is added to the value of the reference resistance 10, China will seek an error.

If the error of the resistance values of the reference resistor 10 and the target resistor 20 is found through the comparing step S30 in the comparing unit 40, a step S40 of adjusting the resistance value according to the error value is performed The resistance value of the target resistance 20 is adjusted to be close to or equal to the resistance value of the reference resistance 10 by adjusting the resistance value of the target resistance 20. [

When the resistance value of the target resistor 20 is adjusted, the target resistor 20 is manually adjusted according to the error value.

When the target resistor 20 is formed so as to be automatically adjusted, it can be adjusted through an automatic adjustment device such as an adjustment device.

If the error value is adjusted through the step S40 of adjusting the resistance value according to the error value, the reference resistance 10 and the target resistance 20 are stored through the step S50 of storing the error value in the storage unit 60, And the error values of the reference resistor 10 and the target resistor 20 are stored in the storage unit 60. [

The measured resistance values of the reference resistor 10 and the target resistor 20 and the error values of the reference resistor 10 and the target resistor 20 are stored in the storage unit 60 (S20) of measuring the resistance value of the target resistance (20) by changing the target resistance (20) to be calibrated through the repeated calibration step (S60), the comparison unit (40) The resistance value of the target resistor 20 is set to be equal to the resistance value of the reference resistor 10 by repeating the step S30, .

According to the present invention configured as described above, the resistance value of the target resistance can be adjusted through the reference resistance value measured through the measurement unit, and the resistance measurement function of the measurement unit can be checked and adjusted through the reference resistance.

In addition, since the measuring unit can be replaced with a low-cost measuring instrument, the object resistance can be calibrated at low cost.

The resistance value and the resistance value measuring device resistance measuring function using the above-described resistance increase and the resistance of the drain resistance are not limited to the configuration and the operation manner of the embodiments described above. The embodiments may be configured so that all or some of the embodiments may be selectively combined so that various modifications may be made.

10: Reference resistance 20: Target resistance
30: measuring section 40: comparing section
50: display section 60: storage section

Claims (8)

Resistance Value and Measuring Device Resistance Measuring Function Using Binary Drain Resistance Increase Resistance calibration method using a calibration device is a method of measuring resistance,
Measuring a resistance value of the reference resistor 10 connected to the measuring unit 30 by selecting the reference resistor 10 corresponding to the resistance value of the target resistor 20 to be calibrated and connecting the measuring resistor 30 to the measuring unit 30, (S10);
The target resistors 20 to be calibrated to be compared with the measured values of the reference resistors 10 measured through the step of measuring the resistance value of the reference resistor 10 are arranged in series and are connected to the measuring unit 30 Measuring a resistance value of the target resistor 20 (S20);
The measured value of the reference resistor 10 measured through the measuring unit 30 in step S 10 of measuring the resistance value of the reference resistor 10 and measuring the resistance value of the target resistor 20 Comparing the measurement values of the target resistance 20 in the comparison unit 40 (S30);
The comparator 40 compares the measured value of the reference resistor 10 with the measured value of the target resistor 20 and the measured value of the reference resistor 10 and the measured value of the target resistor 20 through the comparison step S30 (S40) of displaying the calculated error value on the display unit (50) and adjusting the resistance value according to the error value of the target resistance (20);
The measured value of the reference resistor 10, the measured value of the target resistor 20, the measured value of the reference resistor 10, and the measured value of the target resistor 20, which are displayed through the step of adjusting the resistance value according to the error value, (S50) of storing the error value in the storage unit 60 and
A step S30 of comparing and comparing the resistance value of the target resistance 20 with a comparison of the target resistance 20 to be calibrated, a step S40 of adjusting the resistance value, And a step (S50) of storing the resistance value of the target resistance (20) in the storage unit (60), so as to repeatedly calibrate the resistance value of the target resistance (20)
The comparison step S30 in the comparison unit 40 compares the measurement value of the reference resistance 10 with the measurement value of the target resistance 20 and compares the measured value of the target resistance 20 with the measurement value of the reference resistance 10, Calculates the error value, transmits the calculated error value to the display unit 50 and displays it,
The step of adjusting the resistance value S40 may include comparing the resistance value of the reference resistor 10 with the resistance value of the target resistor 20 and comparing the resistance value of the target resistor 20 with the resistance value of the reference resistor 10, The resistance value of the target resistor 20 is adjusted to be close to the resistance value of the reference resistor 10,
The measuring unit 30 for measuring the resistance value in the step of measuring the resistance value of the reference resistor 10 and the step of measuring the resistance value of the target resistor 20 may be performed by using a reference resistor The resistance value of the measuring unit 30 can be adjusted by checking whether the measured value of the measuring unit 30 itself is normal or not by using the resistance value of the measuring unit 30, Resistance calibration method using resistance measuring function calibration device.
The method according to claim 1,
The resistance value measuring device resistance measuring function correcting device comprises:
A reference resistor (10) having a reference set value;
A pair of target resistors 20 having a resistance value corresponding to the reference resistance 10, gradually increasing and having the same resistance value;
A measuring unit 30 connected to both ends of the reference resistor 10 and the target resistor 20 to measure resistance values of the reference resistor 10 and the target resistor 20;
A comparing unit 40 connected to the measuring unit 30 for comparing the measurement value of the reference resistance 10 measured with the reference resistance 10 and the measured value of the target resistance 20;
A display unit 50 for displaying the measured value of the reference resistance 10 and the measured value of the target resistance 20 compared by the comparator 40,
And a storage unit (60) for storing a measured value of the reference resistance (10) and a measured value of the target resistance (20) displayed on the display unit (50)
The target resistors 20 are formed of a pair, and each resistance value can be measured at both ends of each resistance, and each resistance is increased by a multiple of the reference resistance 10, Changeable,
An error between the reference resistor 10 and the target resistor 20 is displayed through the display unit 50 by comparing the measured resistance value of the reference resistor 10 with the measured resistance value of the target resistor 20, Adjusts the error of the reference resistor (20) so as to be similar to the resistance of the reference resistor (10)
The measurement unit 30 digitizes and displays the measured resistance value and can measure the reference resistance 10 and the target resistance 20 simultaneously or individually,
The target resistor 20, the reference resistor 10, the comparator 40, the display unit 50, and the storage unit 60 may be formed of a single module, Wherein the reference resistor is formed to be replaceable and the measuring unit is separately formed so as to be detachably coupled with the resistor. Resistance calibration method using calibration device. delete delete delete delete delete delete
KR1020160178906A 2016-12-26 2016-12-26 Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods KR101883199B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020160178906A KR101883199B1 (en) 2016-12-26 2016-12-26 Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods
PCT/KR2016/015303 WO2018124316A1 (en) 2016-12-26 2016-12-27 Calibration device for resistance value and measurement device resistance measuring function using binary-multiple resistance increase, and resistance calibration method using same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160178906A KR101883199B1 (en) 2016-12-26 2016-12-26 Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods

Publications (2)

Publication Number Publication Date
KR20180075734A KR20180075734A (en) 2018-07-05
KR101883199B1 true KR101883199B1 (en) 2018-07-31

Family

ID=62709827

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160178906A KR101883199B1 (en) 2016-12-26 2016-12-26 Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods

Country Status (2)

Country Link
KR (1) KR101883199B1 (en)
WO (1) WO2018124316A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109975737A (en) * 2019-03-05 2019-07-05 国网浙江省电力有限公司电力科学研究院 Direct current calibrating installation based on the high steady power source of measuring resistance method adjustment
CN116125183B (en) * 2023-04-20 2023-06-30 南京先正科技有限公司 Resistor on-line fault diagnosis method and system based on safe production

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015509605A (en) * 2012-03-27 2015-03-30 エルジー・ケム・リミテッド Insulation resistance measuring device with self-fault diagnostic function and self-fault diagnostic method using the same

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6466003B1 (en) * 1998-06-30 2002-10-15 Fluke Corporation Microamp measurement for two-terminal digital meter
KR100862094B1 (en) * 2006-10-11 2008-10-09 한국표준과학연구원 Rate error measurement a method and rate error measurement a equipment for binary scale rate increase
CN102955070A (en) * 2011-08-17 2013-03-06 鸿富锦精密工业（深圳）有限公司 Resistance measuring circuit
KR101363453B1 (en) * 2012-12-27 2014-02-17 주식회사 루셈 Apparatus and method for measuring r-on resistance
EP2966454B1 (en) * 2014-07-07 2017-08-30 EM Microelectronic-Marin SA Method for measuring a physical parameter, and electronic circuit for implementing same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015509605A (en) * 2012-03-27 2015-03-30 エルジー・ケム・リミテッド Insulation resistance measuring device with self-fault diagnostic function and self-fault diagnostic method using the same

Also Published As

Publication number Publication date
KR20180075734A (en) 2018-07-05
WO2018124316A1 (en) 2018-07-05

Similar Documents

Publication Publication Date Title
US9696403B1 (en) Replaceable internal open-short-load (OSL) calibrator and power monitor
EP1443335B1 (en) Sensor apparatus, measuring system and method of calibration
Henderson A new technique for the automatic measurement of high value resistors
CN101937066B (en) Self-calibrating method of internal reference resistors of multi-range digital electronic measuring instrument
US7483795B2 (en) Pressure and temperature compensation algorithm for use with a piezo-resistive strain gauge type pressure sensor
US11644295B2 (en) Metrology device with automated compensation and/or alert for orientation errors
CN104977557A (en) Device and method for calibrating contact resistance tester
KR101883199B1 (en) Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods
JPH04248472A (en) Method of measuring resistance value
Pogliano et al. Characterization of resistive dividers for a wideband power analyzer
US20040183519A1 (en) Power measurement apparatus and method therefor
US6803776B2 (en) Current-comparator-based four-terminal resistance bridge for power frequencies
KR20220109891A (en) Current and voltage measurement error correction system
US7191072B2 (en) Pressure and temperature measurement of a piezo-resistive device using differential channel of a ratiometric analog to digital converter
CN109620200A (en) A kind of device and method of intracranial pressure, encephalic temperature testing calibration
US7091796B2 (en) Method and system for calibration of a voltage controlled oscillator (VCO)
Starkloff et al. The AC quantum voltmeter used for AC current calibrations
CN115016437A (en) Servo system product position calibration device and method
KR100666314B1 (en) Method for calibrating the ratio accuracy of resistance bridges by triangular comparison method
JPH09119853A (en) Method and apparatus for correction of output value of sensor
US8810256B1 (en) Impedance meter calibration
KR100862094B1 (en) Rate error measurement a method and rate error measurement a equipment for binary scale rate increase
JP3716308B2 (en) High resistance measuring method and high resistance measuring apparatus
JPS6314784B2 (en)
CN108445290B (en) Closed-loop resistor resistance value measuring method

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant