KR101810857B1 - Method of diagnosing potential induced degradation in photovoltaic module - Google Patents
Method of diagnosing potential induced degradation in photovoltaic module Download PDFInfo
- Publication number
- KR101810857B1 KR101810857B1 KR1020150140227A KR20150140227A KR101810857B1 KR 101810857 B1 KR101810857 B1 KR 101810857B1 KR 1020150140227 A KR1020150140227 A KR 1020150140227A KR 20150140227 A KR20150140227 A KR 20150140227A KR 101810857 B1 KR101810857 B1 KR 101810857B1
- Authority
- KR
- South Korea
- Prior art keywords
- solar cell
- cell module
- voltage
- pid
- cell array
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 28
- 230000015556 catabolic process Effects 0.000 title description 4
- 238000006731 degradation reaction Methods 0.000 title description 4
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 238000002405 diagnostic procedure Methods 0.000 claims abstract description 5
- 238000003491 array Methods 0.000 claims description 11
- 230000005855 radiation Effects 0.000 claims description 9
- 230000002441 reversible effect Effects 0.000 claims description 4
- 230000003111 delayed effect Effects 0.000 claims description 3
- 230000006866 deterioration Effects 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000007423 decrease Effects 0.000 abstract description 6
- 238000011179 visual inspection Methods 0.000 abstract 1
- 238000012360 testing method Methods 0.000 description 9
- 238000012216 screening Methods 0.000 description 4
- 239000011888 foil Substances 0.000 description 3
- 238000010248 power generation Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 230000003442 weekly effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- G01R31/3658—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S40/00—Components or accessories in combination with PV modules, not provided for in groups H02S10/00 - H02S30/00
- H02S40/30—Electrical components
- H02S40/32—Electrical components comprising DC/AC inverter means associated with the PV module itself, e.g. AC modules
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S40/00—Components or accessories in combination with PV modules, not provided for in groups H02S10/00 - H02S30/00
- H02S40/30—Electrical components
- H02S40/34—Electrical components comprising specially adapted electrical connection means to be structurally associated with the PV module, e.g. junction boxes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention relates to a method for diagnosing a solar cell module in which a PID phenomenon occurs in which the output of the solar cell module decreases in accordance with a decrease in electrical characteristics of the cell. The diagnostic method according to the present invention includes the steps of: measuring the voltage output of the solar cell module under an environment with no irradiation dose; selecting a solar cell module to which a voltage resulting from the measurement of the voltage output is not output, . According to the present invention, when a PID phenomenon occurs in a solar cell module, the PID phenomenon can be distinguished from the cause of shading, snowfall, pollution and other causes without directly visual inspection, so that appropriate measures can be taken in a timely manner have.
Description
The present invention relates to a method of diagnosing a solar cell module, and more particularly, to a method of diagnosing a solar cell module in which a PID (Potential Induced Degradation) phenomenon occurs by measuring a voltage.
There are various reasons for the decrease in output of solar cells. It may be due to shading in the solar cell, or because the solar cell is blocked from the sunlight due to snowfall in winter. In addition, the surface of the solar cell may be contaminated with foreign matter such as various dusts and bird shots. In addition to these external factors, it may be caused by deterioration of the solar cell itself. In particular, PID (Potential Induced Degradation) phenomenon, which is a phenomenon of deterioration of electrical characteristics due to high voltage stress, can be caused even in a solar cell whose operating time is not long.
In solar cells, high voltage, high humidity, and high temperature can cause leakage current between solar cell and frame. This leakage current causes electrical charge (polarization), and polarizations interfere with the photoelectric effect of the solar cell, so that the characteristics of the solar cell deteriorate over time. As a result, the phenomenon that the total output of the module decreases with time is called PID.
Generally, in a photovoltaic power generation system, the potential of the solar cell frame becomes 0V, and the potential of the solar cell changes depending on the ground position (?) Or (+). At this time, electrons are emitted from the material used for the module due to the voltage between the solar cell and the frame, and the discharge is generated through the grounded frame, so that the output of the entire module is lowered.
In a solar cell module in which a PID phenomenon occurs, the amount of electricity produced is reduced, thereby reducing reliability and causing economic loss. Therefore, it is necessary to selectively recover and replace the solar cell module that generates the PID phenomenon, but it is difficult to visually judge whether the PID phenomenon occurs or not, and a method that can be remotely determined without depending on the method of photographing with special equipment It is hard to find at present.
A conventional technique for remotely selecting a solar cell module in which a problem occurs is disclosed in
However, as described above, the cause of the abnormality in the solar cell module may be many causes other than the PID phenomenon. Therefore, it is difficult to confirm the abnormal type of the specific solar cell module by the above-described conventional technology, There is a problem that can not be solved at all.
Patent Registration No. 10-1051496 (Registration date: 2011. 07. 18)
It is therefore an object of the present invention to provide a method of diagnosing a solar cell module capable of easily selecting a solar cell module in which a PID phenomenon occurs as monitoring data without visual confirmation .
In order to accomplish the above object, the present invention provides a method of selecting a solar cell module in which a PID phenomenon occurs in which the output of the solar cell module decreases in accordance with a decrease in electrical characteristics of the solar cell module, Measuring a voltage output of the solar cell module; and selecting the solar cell module to which the PID phenomenon has occurred, the solar cell module to which the measurement result voltage of the voltage output is not output.
Preferably, the voltage output is measured for each solar cell array in which a plurality of solar cell modules are electrically connected to one another. Further, the solar cell array connects solar cell arrays of a plurality of rows so as to be connected in parallel to one serial connection half, and connects an inverter into which the current outputted from the series connection half flows, to the serial connection half. In addition, the voltage output measurement of the solar cell module is carried out in the series connection panel or the inverter.
Preferably, the open-circuit voltage is measured for each solar cell array selected as the occurrence of the PID phenomenon in the sorting step, and a value obtained by subtracting the open-circuit voltage measurement value of the selected solar cell array from the open- Calculating a delta voltage of the photovoltaic array; determining whether the delta voltage value of any one of the selected photovoltaic arrays is smaller than a predetermined value for a predetermined period of time; And when the delta voltage value of any one of the solar cell arrays is measured to be greater than a certain ratio of a certain value for a predetermined time, the one of the solar cell arrays is classified as a solar cell array in which the PID phenomenon is generated . The method further includes restoring the solar cell array to a normal solar cell array by applying a reverse voltage to the solar cell array recognized as a solar cell module having a PID phenomenon. If the time point at which the open-circuit voltage is measured by irradiating sunlight to the selected solar cell module as the occurrence of the PID occurrence is delayed for a certain time or more than the open-circuit voltage measurement time at the normal solar cell module, The module further includes a step of recognizing that the PID generation phenomenon has occurred.
Advantageously, said specific value is a constant value between 30% and 60% of the open circuit voltage of a normal solar cell array, said predetermined time being at least 30 seconds. The predetermined time is between 5 minutes and 6 hours.
According to the diagnostic method of the PID generating solar cell module according to the present invention, when a PID phenomenon occurs in the solar cell module, the PID phenomenon can be distinguished from the cause of shading, snowfall, The timely, timely and appropriate action of the modules can save time, money and effort on maintenance of the photovoltaic system. Further, according to the present invention, it is possible to prevent further damage due to the long-term disposal of the PID phenomenon, thereby enhancing the durability of the solar power generation system.
1 is a block diagram showing a conventional technique.
Fig. 2 is a test photograph for artificial induction of PID phenomenon.
3 is a graph illustrating a power output reduction of a solar cell module due to the occurrence of a PID phenomenon.
4 is an electro luminescent (EL) image photograph before and after the PID phenomenon occurs.
5 is a graph showing current generation with time of a normal solar cell module and a PID generating solar cell module.
6 is a graph showing voltage output of a normal solar cell module and a PID generating solar cell module with respect to time in comparison with a solar radiation amount.
FIG. 7 is a graph showing the voltage output over time over several days by applying a larger time variable in the graph of FIG.
8 is a graph showing a difference between the open-circuit voltage of the normal solar cell module and the open-circuit voltage of the PID-generating solar cell module over time.
9 is an array configuration diagram for testing a solar cell module in an embodiment of the present invention.
10 is a flowchart showing a sorting method according to an embodiment of the present invention.
The specific structure or functional description presented in the embodiment of the present invention is merely illustrative for the purpose of illustrating an embodiment according to the concept of the present invention, and embodiments according to the concept of the present invention can be implemented in various forms. And should not be construed as limited to the embodiments described herein, but should be understood to include all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.
In the present invention, in order to test the characteristics of a solar cell module in which a PID is generated, a PID phenomenon is artificially caused on a part of a normal solar cell to compare the electrical characteristics of a solar cell module having a PID phenomenon with a normal solar cell module Based on the results of several tests over a long period of time, a diagnostic method for the PID generating solar cell module was derived through comparison of the first hypothesis and data analysis according to the test.
The test method will be briefly described with reference to FIG. 2, and then a screening method according to the present invention will be described with reference to the drawings.
In the present invention, as shown in FIG. 2, in order to artificially generate a PID phenomenon in a normal
FIG. 4 shows a comparative photograph of the PID-induced solar cell module and the normal solar cell module in the same manner as described above. The power output difference between the PID-induced solar cell module and the normal solar cell module is shown in FIG. Are shown in the graph.
As shown in FIG. 3, in the solar cell module in which the PID phenomenon occurs, the power output is reduced by 42.2% as compared with the normal solar cell module. Therefore, when the PID- It can be seen that damage may also occur to the module.
As a result of conducting a test for about 10 days for the field demonstration of the PID generating solar cell module and the normal solar cell module caused by the method shown in FIG. 2, the electrical characteristics over time are shown in the graphs of FIGS. 5 to 8 have.
For reference, 250W micro inverter was used in this test, and normal solar cell module and PID generated solar cell module were connected to grid system and operated.
The temperature, irradiation, and ambient temperature / humidity measurement sensors were installed on the back side of the normal solar cell module and the PID generated solar cell module, and the average data per 5 seconds was continuously stored for 7 days with 5 seconds as the unit time.
5 and 6 show the results of the daytime current generation test of the day with a good solar radiation amount.
FIG. 5 is a graph showing a comparison of a direct current generation amount of a normal solar cell module and a PID generating solar cell module with a solar radiation amount over time during a day. Here, an enlarged view at the start of the solar radiation is shown in the lower end of Fig. In the case of a solar cell installed at the same angle of incidence angle, when the solar radiation start time is examined in detail, in the case of a normal solar cell module, current is generated at the same time as the solar radiation starts. However, It can be seen that the current is generated from 18 to 20 minutes. This result provides an additional method of selecting a PID-generating solar cell module to be described later and will be described later.
6 is a graph comparing voltage characteristics of a PID-generating solar cell module and a normal solar cell module during a daytime.
In the morning and evening when the solar radiation is small in the daytime, the voltage output of the PID generating solar cell module differs from the normal solar cell module in the morning and the normal solar cell module also generates heat As a result, the voltage difference between the solar cell module and the PID generating solar cell module is smaller than that in the morning and evening.
FIG. 7 is a graph of voltage characteristics similar to FIG. Fig. 6 is a graph based on the irradiation amount during one day, whereas Fig. 7 is a graph recorded over nine days.
In FIG. 7, the high-rising part shows the weekly time zone, and the part near the bottom shows the night time zone. Particularly noteworthy is that the residual voltage is present in the normal solar cell module at nighttime, but the residual voltage is not measured in the PID generating solar cell module.
In FIG. 7, a portion between the raised portions, that is, a portion indicated by an elliptical circle is a portion indicating the residual voltage of the normal solar cell module. In Fig. 7, the voltage outputted from the normal solar cell module in the dark time period where there is no solar radiation at night or dawn is approximately 1 Vdc. At this time, more than 20Vdc voltage will be generated in commercial solar cell above 3kW class.
The diagnostic method of the PID generating solar cell module using the test results described above will be described.
A method of diagnosing a PID generating solar cell module according to the present invention is a method of diagnosing a PID generating solar cell module in which a voltage output of a solar cell module is measured under an environment where there is no irradiation dose, (Hereinafter, referred to as a 'residual voltage measuring step (I)'), which is recognized as being a PID generating solar cell array. That is, even in a dark situation such as a night time or early morning before sunrise, if the residual voltage is measured, it is recognized as a normal solar cell module, and when the residual voltage is 0, it is classified as a solar cell module in which a PID phenomenon occurs.
In this case, as shown in FIG. 9, the voltage output measurement is conveniently performed by arranging a plurality of
However, even in the case of the initially selected PID generating solar cell array in the residual voltage measuring step (I), normal solar cell arrays may be mixed. Additional screening procedures may therefore be required. The delta voltage can be used as a means for further screening. The delta voltage is a value obtained by subtracting the open-circuit voltage of the solar cell module from the open-circuit voltage of the normal solar cell module, which has been confirmed to have generated the PID phenomenon finally. That is, the delta voltage is the difference between the open-circuit voltage of the normal solar cell module and the open-circuit voltage of the solar cell module in which the PID is generated.
FIG. 8 is a graph showing a change in the delta voltage value over time. As shown in FIG. 8, the normal solar cell module and the solar cell module in which the PID is generated are different from each other at the time when the open-circuit voltage is generated. Min. By utilizing the characteristics of these delta voltages, a method for additional PID sorting can be provided.
First, the step (II) of measuring the delta voltage value of the first screening PID generating solar cell module in the residual voltage measuring step (I) for a predetermined period of time may be preceded. And the delta voltage value of the first selective PID generating solar cell array measured for a certain period of time in the step II continuously exceeds 30% of the specific value of the open voltage of the normal
Meanwhile, the selection method according to the present invention includes a step (IV) of connecting the secondary selection PID generating solar cell array to a recovery system for applying a reverse voltage to the solar cell array and applying a reverse voltage to recover the normal secondary solar cell array .
Further, although not shown in FIG. 10, additional steps may be further set to more accurately determine whether a PID phenomenon has occurred. In this additional step, solar light is irradiated on the solar cell module selected in the step (I) for selecting the solar cell module in which the PID generation phenomenon has occurred, and the time when the open voltage is measured from the selected solar cell module is normal solar In the case where the open-circuit voltage of the battery module is delayed for a certain period of time or longer than the measurement time, the selected solar cell module is recognized as a solar cell module in which the PID generation phenomenon has occurred. At this time, the predetermined time may be several minutes in short time and 6 hours in long time. However, the V stage does not follow the IV stage in time, but may be a stage preceding the stage II or a stage performed after the stage III.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the inventions. It will be apparent to those of ordinary skill in the art.
1: solar cell module 2: foil
10: solar cell array 11: solar cell module
20: serial connection board 30: inverter
Claims (9)
Measuring a voltage output of the solar cell module under an environment where there is no solar radiation;
Selecting a solar cell module to which a voltage resulting from the measurement of the voltage output is not output as a solar cell module having a PID phenomenon; And
If the time point at which the open-circuit voltage is measured by irradiating sunlight to the solar cell module selected as the occurrence of the PID phenomenon is delayed for a certain time or more than the time of measuring the open-circuit voltage at the normal solar cell module, And recognizing that a phenomenon has occurred. The method for diagnosing a PID generating solar cell module according to claim 1,
Wherein the voltage output is measured by a plurality of solar cell arrays each comprising a single row, the plurality of solar cell modules being electrically connected to each other.
Wherein the solar cell array connects a plurality of solar cell arrays in parallel so as to be connected to one serial connection half and connects an inverter into which the current outputted from the series connection half flows to the serial connection half. Diagnostic method of solar cell module.
Wherein the voltage output measurement of the solar cell module is performed in a serial connection panel or an inverter.
The open voltage is measured for each selected solar cell array in which the PID phenomenon has occurred in the sorting step and the delta voltage which is a value obtained by subtracting the open-circuit voltage measurement value of the selected solar cell array from the open- , ≪ / RTI &
Wherein when the delta voltage value of any of the selected solar cell arrays is measured to be smaller than a certain value for a predetermined time, the one of the solar cell arrays is classified as a normal solar cell array, If the value of the delta voltage of the array is measured to be larger than a certain ratio of a certain specific value for a predetermined time, the step of sorting the one solar cell array as a solar cell array in which the PID phenomenon has occurred
Wherein the method further comprises the steps of:
Wherein the specific value is a constant value between 30% and 60% of the open circuit voltage of a normal solar cell array, and the predetermined time is at least 30 seconds.
And recovering the normal solar cell array by applying a reverse voltage to the solar cell array recognized as a solar cell module having a PID phenomenon.
Wherein the predetermined time is between 5 minutes and 6 hours.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150140227A KR101810857B1 (en) | 2015-10-06 | 2015-10-06 | Method of diagnosing potential induced degradation in photovoltaic module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150140227A KR101810857B1 (en) | 2015-10-06 | 2015-10-06 | Method of diagnosing potential induced degradation in photovoltaic module |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20170041304A KR20170041304A (en) | 2017-04-17 |
| KR101810857B1 true KR101810857B1 (en) | 2017-12-21 |
Family
ID=58703161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150140227A KR101810857B1 (en) | 2015-10-06 | 2015-10-06 | Method of diagnosing potential induced degradation in photovoltaic module |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR101810857B1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220153762A (en) | 2021-05-12 | 2022-11-21 | (주)선진환경 | Solar Cell Module in Contact with Bypass Pin and Its Process Method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102159768B1 (en) * | 2018-07-11 | 2020-09-28 | 한국에너지기술연구원 | Apparatus and method for diagnosing hot spot of photovoltaic array |
| KR102159764B1 (en) * | 2018-07-11 | 2020-09-28 | 한국에너지기술연구원 | Apparatus and method for diagnosing pid of photovoltaic array |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100930132B1 (en) * | 2009-03-10 | 2009-12-08 | ㈜코리아에너텍 | The controlling and monitoring apparatus for photovoltaic power system |
-
2015
- 2015-10-06 KR KR1020150140227A patent/KR101810857B1/en not_active Application Discontinuation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100930132B1 (en) * | 2009-03-10 | 2009-12-08 | ㈜코리아에너텍 | The controlling and monitoring apparatus for photovoltaic power system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220153762A (en) | 2021-05-12 | 2022-11-21 | (주)선진환경 | Solar Cell Module in Contact with Bypass Pin and Its Process Method |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20170041304A (en) | 2017-04-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Høiaas et al. | Inspection and condition monitoring of large-scale photovoltaic power plants: A review of imaging technologies | |
| JP5584622B2 (en) | Fault detection method for photovoltaic system | |
| US10615741B2 (en) | Method and apparatus for detecting, regenerating and/or preventing defects in a solar panel installation | |
| US9876468B2 (en) | Method, system and program product for photovoltaic cell monitoring via current-voltage measurements | |
| JP5888724B2 (en) | SOLAR CELL ARRAY DIAGNOSIS DEVICE, POWER CONDITIONER, SOLAR CELL ARRAY DIAGNOSIS METHOD, AND PROGRAM | |
| JP6093465B1 (en) | Power generation diagnosis method and power generation diagnosis apparatus for solar power generation system | |
| US9541598B2 (en) | Smart junction box for photovoltaic systems | |
| JP2014514582A (en) | Method for fault diagnosis on solar modules | |
| CN105790711A (en) | Detection method and system for silicon-based module defects of photovoltaic power station | |
| KR101810857B1 (en) | Method of diagnosing potential induced degradation in photovoltaic module | |
| Chattopadhyay et al. | All India survey of photovoltaic module degradation 2014: Survey methodology and statistics | |
| KR101870300B1 (en) | Solar power system and diagnosis method of solar power system failure | |
| US20190103832A1 (en) | Method of inspecting solar cell module | |
| Du et al. | Modeling, imaging and resistance analysis for crystalline silicon photovoltaic modules failure on thermal cycle test | |
| Kaplani | Degradation in field-aged crystalline silicon photovoltaic modules and diagnosis using electroluminescence imaging | |
| Buerhop-Lutz et al. | Insulation resistance in relation to distribution of backsheet types in strings and inverters | |
| Zahraoui et al. | System‐level condition monitoring approach for fault detection in photovoltaic systems | |
| TEVI et al. | Solar photovoltaic panels failures causing power losses: a review | |
| Karim | Fault analysis and detection techniques of solar cells and PV modules | |
| Khan et al. | Detection of defects in solar panels using thermal imaging by PCA and ICA method | |
| Kherici et al. | Failure modes of standard photovoltaic modules in Sahara Desert | |
| Shukor et al. | Acceptance ratio analysis: An early fault indicator for grid-connected photovoltaic system | |
| KR20200100898A (en) | Fault Diagnosis Method and system for Solar Panel | |
| Wohlgemuth | Reliability of PV systems | |
| JP2010245410A (en) | Method and device of inspecting solar cell module |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| E902 | Notification of reason for refusal |