KR101762123B1 - Manufacturing method for hollow SiC structure - Google Patents
Manufacturing method for hollow SiC structure Download PDFInfo
- Publication number
- KR101762123B1 KR101762123B1 KR1020150051597A KR20150051597A KR101762123B1 KR 101762123 B1 KR101762123 B1 KR 101762123B1 KR 1020150051597 A KR1020150051597 A KR 1020150051597A KR 20150051597 A KR20150051597 A KR 20150051597A KR 101762123 B1 KR101762123 B1 KR 101762123B1
- Authority
- KR
- South Korea
- Prior art keywords
- sic
- hollow
- upper structure
- manufacturing
- grooves
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract description 20
- 238000000151 deposition Methods 0.000 claims abstract description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 13
- 229910002804 graphite Inorganic materials 0.000 claims description 12
- 239000010439 graphite Substances 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 8
- 238000005520 cutting process Methods 0.000 description 2
- 238000000576 coating method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 239000007770 graphite material Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02529—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Products (AREA)
Abstract
The present invention relates to a method of manufacturing a hollow SiC structure, comprising the steps of: a) preparing an upper structure and a lower structure having grooves formed on at least one side thereof; b) stacking the upper structure and the lower structure, And c) depositing SiC on the resultant product of step b) to form a bonding structure for bonding the upper structure and the lower structure to each other, . The SiC structure divided into the upper part and the lower part based on the hollow part is manufactured and the divided SiC structure is placed in contact with the SiC structure and then the SiC structure is deposited again to bond the upper and lower SiC structures to each other. Can be produced.
Description
The present invention relates to a method of manufacturing a hollow SiC structure, and more particularly, to a method of manufacturing a hollow SiC structure that can easily form a structure having a hole therein.
In general, the use of graphite materials used in conventional semiconductor manufacturing processes has been limited to meet the limited requirements of the LED manufacturing process.
In order to meet these requirements, coatings of SiC, TaC, etc. on the surface of existing graphite parts have been improved to improve chemical resistance and to prevent the generation of foreign matter even at high temperatures.
As an example of such an example, SiC is deposited on the entire surface of a graphite disk in the registered patent No. 10-1178184 (Registered on August 23, 2012, a focus ring of a dry etching apparatus and a manufacturing method thereof) of the applicant of the present invention, Discloses a method of cutting a periphery of a SiC layer so as to expose a side surface thereof, cutting the exposed gpparite original plate in a transverse direction, and then removing a graphite original plate to obtain a pair of SiC original plates.
In this way, it is possible to easily obtain a plate-like or ring-shaped SiC structure, but it is very difficult to make a hollow structure using SiC.
This is because the mechanical strength of SiC is high and it takes a long time to process. Hollow structures may need to form holes with a certain diameter and length in the center of the structure. However, There is a problem that it is not very easy to process solid SiC.
As a result of the investigation of the inventors' prior art in connection with the present invention, the SiC hollow structure could not be found, and it is now known that SiC is coated on the graphite base in the above registered patent, and the graphite base is partially exposed, The hollow structure can be formed by leaving only the coated SiC.
However, in the case where the hollow portion of the hollow SiC structure is a fine or complex structure, there is a limit in forming the hollow SiC structure by the above method.
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and it is an object of the present invention to provide a method of manufacturing a hollow SiC structure capable of easily manufacturing a SiC structure having a hollow structure with a minute or complex structure.
According to an aspect of the present invention, there is provided a method of manufacturing an upper structure, comprising the steps of: a) preparing an upper structure and a lower structure having grooves formed on at least one side thereof; b) stacking the upper structure and the lower structure, Forming a hollow structure between the lower structures; and c) depositing SiC on the resultant structure of step b) to form a bonding structure for bonding the upper structure and the lower structure to each other.
The upper structure and the lower structure in the step a) may be grooves formed by mechanically processing the SiC masses, or SiC may be deposited on the graphite base, and the grooves may be formed by removing the graphite base.
The width of the lower structure is larger than the width of the upper structure and the bonding structure can be formed on the upper portion of the upper structure and the lower structure exposed on the lower side of the upper structure.
The lower structure may further include a seating surface on which a lower portion of the upper structure is inserted.
A method of manufacturing a hollow SiC structure according to the present invention comprises the steps of: preparing a SiC structure divided into upper and lower portions based on a hollow portion; depositing SiC on the divided SiC structure in contact with the SiC structure; The SiC structure can be manufactured regardless of the shape of the hollow portion.
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a flowchart of a manufacturing process of a hollow SiC structure according to a preferred embodiment of the present invention. FIG.
FIGS. 2 to 5 are cross-sectional views illustrating a manufacturing process of a hollow SiC structure manufactured according to a preferred embodiment of the present invention.
Hereinafter, a method of manufacturing a hollow SiC structure according to the present invention will be described in detail with reference to the accompanying drawings.
FIG. 1 is a flow chart of a manufacturing process of a hollow SiC structure according to a preferred embodiment of the present invention, and FIGS. 2 to 5 are cross-sectional views illustrating a manufacturing process of a hollow SiC structure according to the present invention.
1 to 5, a method of manufacturing a hollow SiC according to a preferred embodiment of the present invention includes a step S1 of forming an
Hereinafter, a method of manufacturing a hollow SiC structure according to a preferred embodiment of the present invention will be described in detail.
First, in step S1 (FIG. 2), the
In particular, the
Next, in step S2 (FIG. 3), a
The manufacturing method can be manufactured by using a mechanical working or a graphite base as in the manufacture of the
In particular, in the case of the
That is, a wall surface is vertically provided between the
4), the
Such a coupling state does not cause a clearance between the
Then, in step S4 (FIG. 5), the resultant of step S3 is charged into the deposition furnace, and SiC is deposited. At this time, SiC is deposited on the upper part of the
As described above, SiC is deposited to a predetermined thickness or more to form a
As described above, since the SiC does not flow into the
As described above, since the structure having the
That is, according to the present invention, a groove is formed without forming a hollow portion directly in the SiC structure, so that it is easier to process and a finer hollow portion can be formed.
The
The
It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit and scope of the invention will be.
10: superstructure 11: groove
20: Substructure 21: Home
22: seat surface 30: hollow portion
40: bonding structure
Claims (4)
b) stacking the upper structure and the lower structure such that hollows are formed between the upper structure and the lower structure by the grooves; And
c) depositing SiC on top of the result of step b) to form a bonded structure where the upper structure and the lower structure are bonded to each other,
Wherein a width of the lower structure is larger than a width of the upper structure,
Wherein the bonding structure is formed on an upper portion of the lower structure exposed on the upper portion of the upper structure and the lower side of the upper structure.
The upper structure and the lower structure in step a)
Wherein a groove is formed by mechanically processing the SiC mass, or after the SiC is deposited on the graphite base, the graphite base is removed to form a groove.
The substructure may comprise:
And a seating surface on which a lower portion of the upper structure is inserted and seated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150051597A KR101762123B1 (en) | 2015-04-13 | 2015-04-13 | Manufacturing method for hollow SiC structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150051597A KR101762123B1 (en) | 2015-04-13 | 2015-04-13 | Manufacturing method for hollow SiC structure |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20160121854A KR20160121854A (en) | 2016-10-21 |
KR101762123B1 true KR101762123B1 (en) | 2017-08-01 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020150051597A KR101762123B1 (en) | 2015-04-13 | 2015-04-13 | Manufacturing method for hollow SiC structure |
Country Status (1)
Country | Link |
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KR (1) | KR101762123B1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102012068B1 (en) * | 2016-12-20 | 2019-08-19 | 주식회사 티씨케이 | MANUFACTORING METHOD OF SiC FOCUS RING WITH THIN FILM FOR SEPARATING AND SLIT FURROW AND BASE MATERIAL THEREOF |
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2015
- 2015-04-13 KR KR1020150051597A patent/KR101762123B1/en active IP Right Grant
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KR20160121854A (en) | 2016-10-21 |
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