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KR101722403B1 - the pin block with adjustable pitch control - Google Patents

the pin block with adjustable pitch control Download PDF

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Publication number
KR101722403B1
KR101722403B1 KR1020170018144A KR20170018144A KR101722403B1 KR 101722403 B1 KR101722403 B1 KR 101722403B1 KR 1020170018144 A KR1020170018144 A KR 1020170018144A KR 20170018144 A KR20170018144 A KR 20170018144A KR 101722403 B1 KR101722403 B1 KR 101722403B1
Authority
KR
South Korea
Prior art keywords
pin
module
block
support
pin module
Prior art date
Application number
KR1020170018144A
Other languages
Korean (ko)
Inventor
김문성
곽창훈
Original Assignee
위드시스템 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 위드시스템 주식회사 filed Critical 위드시스템 주식회사
Priority to KR1020170018144A priority Critical patent/KR101722403B1/en
Application granted granted Critical
Publication of KR101722403B1 publication Critical patent/KR101722403B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to a pin block capable of adjusting a pitch interval, and more particularly, to a pin block capable of adjusting a pitch interval, comprising: a plurality of pin modules having pins formed therein to contact with connectors of a test subject; And a jig which is formed with an insertion groove for the insertion of the pin module and the support block and is moved toward the connector of the test subject.

Description

[0001] The present invention relates to a pin block with adjustable pitch control,

[0001] The present invention relates to a pin block capable of adjusting a pitch interval, and more particularly, to a pin block capable of adjusting a pitch interval by adjusting a position of a pin formed on a pin module with a connector of a test object, To an adjustable pin block.

Generally, a printed circuit board or an object to be inspected having a plurality of electronic parts mounted thereon may be short-circuited or short-circuited in the process of mounting the electronic parts, or may fail to break the mounted electronic parts.

Accordingly, the inspection is carried out to check whether the inspection object is defective during the process of mounting the electronic component or after the completion of the mounting.

A short circuit or a broken wire could be inspected using a method of confirming the operation by visual inspection or power supply to check the defect of the inspection object. However, when the electronic component is not completely broken in the process of mounting, There has been a problem that it is impossible to confirm defects due to quality.

Korean Patent Registration No. 10-1148669 for solving such a problem relates to a substrate inspecting apparatus, which comprises a clamp for supporting a printed circuit board, a plurality of chips for attaching to each point of a chip mounted on a printed circuit board, And a metal tag which is attached to the clamp and is in contact with the lower surface of the printed circuit board supported by the clamp, and is electrically connected to the printed circuit through the metal tag attached to the clamp, It is possible to detect the defective current supply portion due to the foreign matter on the surface of the substrate directly under the chip in a simple manner by applying a current to the lower surface of the substrate without any modification of the equipment.

However, in the case of the above-described conventional art, when the pin to which the current is applied is different from the shape corresponding to the connector of the object to be inspected, there is a problem in that contact is impossible and inspection is impossible.

In addition, in the above-described conventional technique, since the pin arrangement must be made in accordance with the connector shape of the object to be inspected, there has been a problem that the inspection apparatus must be manufactured separately according to the connector type of the object to be inspected.

In addition, since the pin module can be used only for a specific connector in the related art as described above, there is a problem that the manufacturing cost is increased and the usability is lowered.

Korean Patent Registration No. 10-1148669

SUMMARY OF THE INVENTION It is an object of the present invention to solve the above problems and provide a pin block that can be used commonly regardless of the shape of a connector of a test object to reduce a manufacturing cost and adjust a pitch interval .

It is another object of the present invention to provide a pin block capable of adjusting a pitch interval by which a position of a pin module can be aligned with a connector of a test subject by adjusting the interval between the pin modules using a plurality of pin modules.

It is a further object of the present invention to provide a method of adjusting a pitch interval at which a preliminary pin module can be directly used regardless of the shape of a connector of a test object when any one of the pin modules is broken, Pin block.

According to an aspect of the present invention, there is provided a pin block capable of adjusting a pitch interval, comprising: a plurality of pin modules each having pins formed therein to contact a connector of an object to be tested; And a jig which is formed with an insertion groove for inserting the pin module and the support block and is moved toward the connector of the test subject.

Further, the pin module of the pin block capable of adjusting the pitch interval of the present invention has protruding ends formed on both sides of the pin module and projecting to the outside, and support grooves formed on the inner surface of the support block and corresponding to the protruding ends And the position of the pin module can be fixed when the protruding end is inserted into the support groove.

Further, the pin module of the pin block capable of adjusting the pitch interval of the present invention is coupled to a plurality of support grooves formed in the support block, and the pitch interval of the pin module can be adjusted according to the position to be coupled to the support groove .

Further, the pins formed in the pin module of the pin block capable of adjusting the pitch interval of the present invention are formed of a probe type or a blade type.

The pins of the pin block, which are capable of adjusting the pitch interval of the pin block according to the present invention, are attached to the lower portion of the jig in close contact with the connector of the test object. Further comprising:

In addition, an inspection module formed of a PCB is mounted on an upper portion of the jig of the pin block capable of adjusting the pitch interval of the present invention, and is contacted with and connected to the upper surface of the pin formed on the pin module.

Further, the pin module of the pin block capable of adjusting the pitch interval according to the present invention has pins arranged at predetermined intervals in one row, and by adjusting the positions of the plurality of pin modules, .

As described above, according to the pin block capable of adjusting the pitch interval according to the present invention, the pin module can be commonly used irrespective of the connector shape of the object to be inspected, thereby reducing manufacturing cost and improving usability.

In addition, according to the pin block capable of adjusting pitch intervals according to the present invention, it is possible to align the pin module with the connector of the test object by adjusting the interval between the pin modules using a plurality of pin modules.

Further, according to the pin block capable of adjusting the pitch interval according to the present invention, since the pin module has the same size, when one of the pin modules is broken, the spare pin module is immediately replaced and used regardless of the shape of the connector of the test object There is an effect that can be.

1 is a perspective view showing a pin module of a pin block capable of adjusting a pitch interval according to the present invention when coupled to a testing device.
FIG. 2 is a perspective view illustrating a pin module of a pin block capable of adjusting a pitch interval according to the present invention. FIG.
3 is a perspective view showing a jig of a pin block capable of adjusting a pitch interval according to the present invention.
FIG. 4 is a perspective view illustrating a pin module of a pin block capable of adjusting a pitch interval according to the present invention to be coupled to a support block. FIG.
5 is a side view and a cross-sectional view showing a pin module inserted into a pin block capable of adjusting a pitch interval according to the present invention;
FIG. 6 is a plan view showing a state in which an interval between pin modules of a pin block capable of adjusting a pitch interval according to the present invention is adjusted. FIG.

Specific features and advantages of the present invention will be described in detail below with reference to the accompanying drawings. The detailed description of the functions and configurations of the present invention will be omitted if it is determined that the gist of the present invention may be unnecessarily blurred.

[0001] The present invention relates to a pin block capable of adjusting a pitch interval, and more particularly, to a pin block capable of adjusting a pitch interval by adjusting a position of a pin formed on a pin module with a connector of a test object, To an adjustable pin block.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a perspective view showing a pin module 500 coupled to a testing device in a pin block capable of adjusting a pitch interval according to the present invention.

As shown in FIG. 1, the pin block capable of adjusting the pitch interval according to the present invention includes a plurality of pin modules 500 having pins formed so as to be in contact with the connectors of the test subject, A support block 400 formed to be able to control the distance between the pin modules 500 and an insertion groove 310 for inserting the pin module 500 and the support block 400, And a jig 300 that is moved toward the connector of the connector.

The supporting body 100 supports the apparatus 100 mounted on the upper surface of the lower surface of the supporting body 100 so that the lower surface of the supporting body 100 can be mounted on a floor or a table. And a pivoting body (200) rotating in the direction of the axis.

The lower surface of the support body 100 is formed as a flat surface and can be fixed to the floor or table using a bolt or fixed to a separate fixing device.

Both sides of the supporting body 100 are protruded, and after the rotary body 200 is inserted between the protrusions, the supporting body 100 is coupled by the rotary shaft 110.

The pivotal body 200 axially coupled by the pivotal shaft 110 can be pivoted about the pivotal axis 110 toward the front surface or the rear surface of the supporting body 100 and an elastic member Not shown) is formed between the support body 100 and the rotary body 200 so that the rear face of the rotary body 200 is pressed upward so that the front face of the rotary body 200 is rotated to the front face of the support body 100 State.

The jig 300 is inserted into an elevation shaft 320 formed on both sides of the front surface of the support 100 and is configured to be able to be transferred upward or downward along the elevation shaft 320, (Not shown) protruding from the front surface of the moving body 200 are formed.

When the rear surface of the rotary body 200 is pressed, the front surface of the rotary body 200 is rotated upward about the rotary shaft 110. At this time, the pressing rod formed on the front surface of the rotary body 200, And presses the jig 300 in the upward direction.

Since the pressurized jig 300 is restrained by the lifting shaft 320 formed on both sides of the support 100, the pressurized jig 300 is lifted vertically and the connector of the test object can be positioned below the jig 300.

If a load is not applied to the rear surface of the rotary body 200, the elastic member formed between the rear surface of the rotary body 200 and the rear surface of the support body 100 is restored and presses the rotary body 200 in the upward direction, The front surface of the support member 200 can be rotated in the lower direction of the support body 100.

At this time, the lowering base 210 formed on both sides of the front surface of the rotary body 200 presses the upper portion of the jig 300 to lower the jig 300 in the direction of the support 100, So that it can be brought into close contact with the connector.

The pin module 500 having the metal pins is inserted into the jig 300 so as to be in contact with the connector of the object to be supplied with electric current or to transmit a signal and to fix the interval between the pin modules 500 Support blocks 400 are formed on both sides to fix the respective pin modules 500.

FIG. 2 is a perspective view showing a pin module 500 of a pin block capable of adjusting a pitch interval according to the present invention.

2, the pins of the pin module 500 are tightly coupled to the connector of the test object, and the pin of the pin block is connected to the connector of the subject body And a coupling plate (600) having a plurality of holes formed therein for contact therewith.

The coupling plate 600 is coupled to the lower surface of the jig 300 and has a coupling groove 610 formed at the center thereof to be closely attached to the lower surface of the protruded jig 300. The coupling plate 600 Are directly brought into tight contact with the connector of the object to be inspected, the shape of the coupling plate 600 preferably has a shape corresponding to the connector structure of the object to be inspected.

It is preferable that a plurality of holes are formed in the coupling groove 610 of the coupling plate 600 so that the pins formed on the pin module 500 can penetrate the coupling plate 600 and come into contact with the connector of the subject.

An insertion groove 310 is formed in the upper surface of the jig 300 so that the support block 400 and the pin module 500 can be inserted into the jig 300. The insertion groove 310 is formed in a multi- And the pin module 500 are prevented from falling down through the insertion groove 310.

The plurality of pin modules 500 are positioned between the support blocks 400 located on both sides and fixed by the support block 400 so that the pitch interval between the pin modules 500 is fixed by the support block 400 .

3 is a perspective view showing a jig 300 of a pin block capable of adjusting a pitch interval according to the present invention.

3, the insertion groove 310 formed in the jig 300 of the pin block capable of adjusting the pitch interval according to the present invention is inserted into the insertion groove 310 (FIG. 3) such that the support block 400 of FIG. The pin module 500 of FIG. 2, which is formed between the first step 311 and the gap is fixed by the support block 400 of FIG. 2, And a second step (312) formed so as not to fall into the first step (312).

When the support block 400 of FIG. 2 and the pin module 500 of FIG. 2 are inserted into the insertion groove 310, the first step 311 and the second step 312 are formed at different levels. The support block 400 and the upper surface of the pin module 500 of FIG. 2 are configured not to protrude above the jig 300.

The first step 311 has a width corresponding to the size of the support block 400 of FIG. 2, the second step 312 has a width corresponding to the size of the pin module 500 of FIG. 2, The second step 312 is preferably formed on the front surface and the rear surface of the insertion groove 310 and is open at the center so that the protruded lower portion of the pin module 500 of FIG. 2 can be inserted.

4 is a perspective view showing a pin module 500 of a pin block capable of adjusting a pitch interval according to the present invention to be coupled to the support block 400. FIG.

4, the pin module 500 of the pin block capable of adjusting pitch intervals according to the present invention includes protruding ends 510 protruding outwardly and formed on both sides of the pin block 500, The pin module 500 further includes a support groove 410 formed on the side surface and corresponding to the protrusion 510. When the protrusion 510 is inserted into the support groove 410, .

Protruding ends 510 protruding outward are formed on both sides of the pin module 500 and protruding ends 510 can be inserted and fixed in the supporting grooves 410, .

That is, the plurality of pin modules 500 are inserted into the support grooves 410 of the support block 400 located at both sides and are fixed in position, and each pin module 500 inserted into the support block 400 is supported by the support grooves 410, The pitch interval between the pin modules 500 can be adjusted according to the size of the connector of the object to be inspected.

At this time, it is preferable that the pin module 500 has a plurality of pins inserted in one row so that the pitch interval can be adjusted.

In addition, since the pitch interval can be adjusted, it is not necessary to match the pin module 500 to the connector standard of the object to be inspected, the manufacturing cost can be reduced, and the pin module 500 can be easily replaced, Since the pin module 500 can be temporarily used by replacing the pin module 500, the usability can be improved.

The support groove 410 formed in the support block 400 is formed in a shape corresponding to the protruding end 510 formed on the pin module 500 and the pitch interval is adjusted so that the pitch interval can be adjusted according to the connector standard of the test subject The support block 400 can be replaced and used depending on the object to be inspected.

Further, by forming a plurality of the support grooves 410 formed in the support block 400, when the pitch interval is adjusted according to the connector standard of the object to be inspected, the protruding ends 510 of the pin blocks are moved to the object side The pitch interval can be adjusted by inserting it into the support groove 410 conforming to the specification of FIG.

The upper part of the pin module 500 is formed thicker than the lower part so that the protruding end 510 can be formed and the lower part is formed thinner than the upper part so that the second step 312 of FIG. And the lower portion is configured to pass through the jig 300 of FIG.

Further, the pin formed in the pin module 500 may be a probe 520 type or a blade 530 type.

A plurality of pins made of metal are formed on the pin module 500 in order to apply a current or transmit an electric signal in contact with the connector of the subject. A pin of the probe 520 type is mounted as shown in FIG. 4A Or may be fitted with pins of the blade 530 type as shown in FIG. 4-B.

5 is a side view and a cross-sectional view showing a state in which a pin module 500 is inserted into a pin block capable of adjusting a pitch interval according to the present invention.

5, an inspection module (not shown) formed of a PCB is mounted on the jig 300 of the pin block capable of adjusting the pitch interval according to the present invention, And is connected in contact with the surface.

An inspection module (not shown) is mounted on the upper part of the jig 300 in which the pin module 500 is inserted and the inspection module is brought into contact with the pins of the probe 520 type protruded to the upper portion of the pin module 500, .

At this time, the pin of the probe 520 protruding from the lower portion of the pin module 500 is protruded through the coupling plate 600 coupled with the connector of the object to be inspected, and is in contact with the terminal of the connector. Cadavers can be connected to each other.

The pin module 500 is supported by the second step 312 of FIG. 3 formed on the jig 300 and the support block 400 is supported by the first step 311 of FIG.

Since the pin module 500 and the support block 400 are formed differently in height from each other, the pin module 500 and the support block 400 protrude from the upper surface of the jig 300 after being inserted into the jig 300 The height of the first step 311 and the second step 312 of FIG. 3 is preferably adjusted.

It is preferable that holes are formed in the coupling plate 600 in accordance with the size and quantity of the probes 520 so that only the pins of the probe 520 type of the pin module 500 can be projected to the outside.

6 is a plan view showing a state in which the interval between the pin modules 500 of the pin block capable of adjusting the pitch interval according to the present invention is adjusted.

6, a pin module 500 of a pin block capable of adjusting a pitch interval according to the present invention is coupled to a plurality of support grooves 410 formed in a support block 400, And the pitch interval of the pin module 500 can be adjusted according to the position to which the pin module 500 is coupled.

In addition, the pin module 500 is formed with one row of pins arranged at predetermined intervals, and can be commonly used in conformity with the connector of the test object by adjusting the positions of the plurality of pin modules 500.

A plurality of pins are arranged in one row in one pin module 500 and by inserting the protruding ends 510 formed on both sides of the pin module 500 into the support grooves 410 formed in the support block 400, The position of the module 500 can be adjusted.

The distance between the pin module 500 inserted into the support groove 410 and the pin module 500 can be adjusted by varying the intervals of the support grooves 410 formed in the support block 400, 500 can be adjusted so that the pitch distance between the pin and the pin can be adjusted.

That is, the pitch interval between the pins and the pins can be differently implemented by using the two pin modules 500, and instead of the pin module 500 having a long manufacturing time, the support block 400, which is simple in structure, The position of the pin module 500 can be adjusted according to the connectors of the object to be inspected.

As described above, according to the pin block capable of adjusting the pitch interval according to the present invention, the pin module can be commonly used irrespective of the connector shape of the object to be inspected, so that the manufacturing cost can be reduced and the usability can be improved. The position of the pin module can be aligned with the connector of the subject by adjusting the interval between the respective pin modules using the module, and since the specification of the pin module is the same, if any one of the pin modules is broken, It is possible to directly replace the spare pin module regardless of the shape of the connector.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is clearly understood that the same is by way of illustration and example only and is not to be taken as a limitation of the scope of the present invention. Or modify it. The scope of the invention should, therefore, be construed in light of the claims set forth to cover many of such variations.

100: Support body 110:
200: rotator 210:
300: jig 310: insertion groove
311: first step 312: second step
320: lifting shaft 400: supporting block
410: support groove 500: pin module
510: protruding end 520: probe
530: blade 600: engaging plate
610: Coupling groove

Claims (7)

In the pin block capable of adjusting the pitch interval,
A plurality of pin modules formed with pins so as to be in contact with the connectors of the object to be inspected;
A support block coupled to both sides of the pin module, the support block being adjustable in spacing between the pin modules;
And a jig having an insertion groove formed therein for allowing the pin module and the support block to be inserted and being moved toward the connector of the test subject.
Pin block with adjustable pitch spacing.
The method according to claim 1,
The pin module includes projecting ends formed on both sides of the pin module and protruding outwardly;
And a support groove formed on an inner surface of the support block and having a shape corresponding to the protruding end,
And the position of the pin module can be fixed when the protruding end is inserted into the support groove.
Pin block with adjustable pitch spacing.
The method according to claim 1,
Wherein the pin module is coupled to a plurality of support grooves formed in the support block and the pitch interval of the pin module can be adjusted according to a position coupled to the support groove
Pin block with adjustable pitch spacing.
The method according to claim 1,
Characterized in that the pins formed on the pin module are of a probe type or a blade type
Pin block with adjustable pitch spacing.
The method according to claim 1,
And an engaging plate having a plurality of holes formed in a lower portion of the jig so as to be in tight contact with the connector of the subject and to contact the pins of the pin module with the connector of the subject.
Pin block with adjustable pitch spacing.
The method according to claim 1,
And an inspection module formed of a PCB is mounted on the jig and is connected to the upper surface of the pin formed on the pin module.
Pin block with adjustable pitch spacing.
The method according to claim 1,
Wherein the pin modules are formed in one row at predetermined intervals and can be commonly used in conformity with the connectors of the test object by adjusting the positions of the plurality of pin modules
Pin block with adjustable pitch spacing.
KR1020170018144A 2017-02-09 2017-02-09 the pin block with adjustable pitch control KR101722403B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020170018144A KR101722403B1 (en) 2017-02-09 2017-02-09 the pin block with adjustable pitch control

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020170018144A KR101722403B1 (en) 2017-02-09 2017-02-09 the pin block with adjustable pitch control

Publications (1)

Publication Number Publication Date
KR101722403B1 true KR101722403B1 (en) 2017-04-03

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KR1020170018144A KR101722403B1 (en) 2017-02-09 2017-02-09 the pin block with adjustable pitch control

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190112235A (en) 2018-03-23 2019-10-04 화인인스트루먼트 (주) Probe Block for Display Module Test
KR102042923B1 (en) 2018-05-14 2019-11-11 화인인스트루먼트 (주) Probe Block for Vision Alignment of Display Module Test
WO2021093330A1 (en) * 2019-11-12 2021-05-20 苏州华兴源创科技股份有限公司 Probe module

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006329992A (en) * 2005-05-27 2006-12-07 Tektronix Inc Differential measuring probe
KR20120031628A (en) * 2010-09-27 2012-04-04 주식회사 에스디에이 Needle module and probe card having the same
KR101148669B1 (en) 2010-10-18 2012-05-25 삼성전기주식회사 The apparatus for testing the substrate
KR20120080773A (en) * 2011-01-10 2012-07-18 세크론 주식회사 Probe card for inspecting light emitting device and method of adjusting pitch thereof
JP2015194459A (en) * 2014-03-25 2015-11-05 シャープ株式会社 Substrate inspection probe unit and substrate inspection method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006329992A (en) * 2005-05-27 2006-12-07 Tektronix Inc Differential measuring probe
KR20120031628A (en) * 2010-09-27 2012-04-04 주식회사 에스디에이 Needle module and probe card having the same
KR101148669B1 (en) 2010-10-18 2012-05-25 삼성전기주식회사 The apparatus for testing the substrate
KR20120080773A (en) * 2011-01-10 2012-07-18 세크론 주식회사 Probe card for inspecting light emitting device and method of adjusting pitch thereof
JP2015194459A (en) * 2014-03-25 2015-11-05 シャープ株式会社 Substrate inspection probe unit and substrate inspection method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190112235A (en) 2018-03-23 2019-10-04 화인인스트루먼트 (주) Probe Block for Display Module Test
KR102042923B1 (en) 2018-05-14 2019-11-11 화인인스트루먼트 (주) Probe Block for Vision Alignment of Display Module Test
WO2021093330A1 (en) * 2019-11-12 2021-05-20 苏州华兴源创科技股份有限公司 Probe module
KR20210124365A (en) * 2019-11-12 2021-10-14 쑤저우 에이치와이씨 테크놀로지 코포레이션 리미티드 probe module
KR102615603B1 (en) 2019-11-12 2023-12-19 쑤저우 에이치와이씨 테크놀로지 코포레이션 리미티드 probe module
US11860191B2 (en) 2019-11-12 2024-01-02 Suzhou Hyc Technology Co., Ltd. Probe module

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