KR101656702B1 - Apparatus and method for evaluating integrating sphere system - Google Patents
Apparatus and method for evaluating integrating sphere system Download PDFInfo
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- KR101656702B1 KR101656702B1 KR1020150071083A KR20150071083A KR101656702B1 KR 101656702 B1 KR101656702 B1 KR 101656702B1 KR 1020150071083 A KR1020150071083 A KR 1020150071083A KR 20150071083 A KR20150071083 A KR 20150071083A KR 101656702 B1 KR101656702 B1 KR 101656702B1
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- optical sensor
- photometer
- light source
- output
- temperature
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- 238000000034 method Methods 0.000 title claims description 11
- 230000003287 optical effect Effects 0.000 claims abstract description 81
- 238000011156 evaluation Methods 0.000 claims abstract description 33
- 238000012795 verification Methods 0.000 claims abstract description 20
- 238000005259 measurement Methods 0.000 description 16
- 230000004907 flux Effects 0.000 description 7
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 4
- 238000009529 body temperature measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 2
- 238000012854 evaluation process Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
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- Spectroscopy & Molecular Physics (AREA)
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Abstract
An integral sphere system reliability evaluation apparatus and an integral sphere system reliability evaluation method are disclosed. The disclosed invention includes: an integrating sphere for diffusing and reflecting light emitted from a light source; an optical sensor for receiving light reflected and diffused by the integrating sphere; a photometer for measuring the intensity of light using the current value output from the optical sensor; An integrated sphere system reliability evaluation apparatus for verifying reliability of an integrating sphere system including a cable for transmitting a current outputted from an optical sensor to a photometer, comprising: a power supply unit for supplying power to a light source; An optical sensor measuring unit for measuring a current value output from the optical sensor; And a verification module for controlling the operation of the power supply to adjust the output value of the light source and verifying the reliability of the integrating sphere system using the output value of the light source and the measured values measured by the optical sensor measuring unit and the photometer, do.
Description
The present invention relates to an integrated sphere system reliability evaluating apparatus and an integrating sphere system reliability evaluating method. More particularly, the present invention relates to an integrating sphere system reliability evaluating apparatus for evaluating the reliability of an integrating sphere system used for analyzing characteristics of a light source, And an old system reliability evaluation method.
Recently, the development of new light sources such as LED (Light Emitting Diode) and EL (Electro Luminescence) is rapidly proceeding.
As an indicator for evaluating such a light source, an indicator such as a total luminous flux (light flux) of a light source or a light color is used.
Particularly, the total flux of the light source is an important index for obtaining the lamp efficiency as well as the output of the light source.
As such a method of measuring the total flux of the light source, an integrating sphere obtained by applying a diffusion material such as barium sulfate to the inner wall of a hollow sphere is generally used.
The integrating sphere is a device for measuring the light emission characteristics of the light source in the integrating sphere by providing a light source inside the sphere. The integrating sphere uniformizes the light emitted from the light source illuminated at the center of the integrating sphere and calculates the total light flux based on the illuminance of the uniformized light can do.
That is, when light is emitted radially from a light source provided in the integrating sphere, the emitted light is multiply diffused and reflected by the diffusion material applied to the integrating sphere. When the diffused and reflected light is incident on the photodetector, Can be guided to the light intensity meter to measure the total flux of the emitted light.
In this way, the output of the light source, the lamp efficiency, etc. can be obtained through the total flux of the light source calculated using the integrating sphere system using the integrating sphere. However, when the reliability of the value measured by the integrating sphere system is low, It is required to develop an evaluation apparatus and an evaluation method for verifying the measurement reliability of the integral sphere system.
The background art of the present invention is disclosed in Korean Registered Patent No. 10-1287311 (Registered Jul. 1, 2013, entitled "Light Emitting Device Inspection Apparatus").
An object of the present invention is to provide an integral sphere system reliability evaluation apparatus and an integral sphere system reliability evaluation method which can effectively verify the measurement reliability of the integral sphere system and can provide highly reliable verification results.
According to an aspect of the present invention, there is provided an apparatus for evaluating the accuracy of an integrating sphere system, comprising: an integrating sphere for diffusing and reflecting light emitted from a light source; an optical sensor for receiving light diffused and reflected from the integrating sphere; 1. An integrated sphere reliability evaluation apparatus for verifying the reliability of an integrating sphere system including a photometer for measuring the intensity of light using a current value and a cable for transmitting a current outputted from the optical sensor to the photometer, A power supply unit for supplying power to the light source; An optical sensor measuring unit measuring a current value output from the optical sensor; And controlling the operation of the power supply unit so that the output value of the light source is controlled. The reliability of the integrating sphere system is measured using the output value of the light source, the measured value measured by the optical sensor measuring unit, and the measured value output from the photometer, And a verification module for verifying.
The verification module may further include: a control unit for controlling an operation of the power supply unit so that an output value of the light source is adjusted; A calculating unit for calculating the intensity of light incident on the optical sensor using the current value measured by the optical sensor measuring unit; And a verifying unit for calculating a difference value between the calculated value calculated by the calculating unit and the measured value output from the photometer and verifying the reliability of the measured value output from the photometer.
Further, the present invention may further comprise a temperature measuring unit for measuring a temperature around the integrating sphere system, a temperature of the light source, a temperature of the integrating sphere, and a temperature of the optical sensor; Wherein the verifying unit corrects the calculated value calculated by the calculating unit and the measured value output from the photometer using the information about the temperature measured by the temperature measuring unit, It is preferable to verify the reliability of the measurement value output from the measurement apparatus.
The apparatus may further include a storage unit that stores information about the output value of the light source, the temperature measured by the temperature measuring unit, the calculated value calculated by the calculating unit, and the measured values output from the photometer, in a time series.
The optical sensor measuring unit may be connected to the optical sensor through the cable, and may be connected to the optical sensor in parallel.
According to another aspect of the present invention, there is provided a reliability evaluation method of an integral sphere system, including: an integrating sphere for diffusing and reflecting light emitted from a light source; an optical sensor for receiving light diffused and reflected from the integrating sphere; And a cable for transmitting the current outputted from the photosensor to the photometer, the reliability of the integral sphere system being verified with the reliability of the integral sphere system, Adjusting an output of the light source; Measuring a current value output from the optical sensor; Calculating the intensity of light incident on the optical sensor using the measured current value; And verifying the reliability of the measured value output from the photometer by calculating a difference between the calculated value of the intensity of the light incident on the optical sensor and the measured value output from the photometer.
Measuring a temperature of the integrating sphere system, a temperature of the light source, a temperature of the integrating sphere, and a temperature of the optical sensor; And correcting the measured value output from the photometer and the calculated value incident on the optical sensor using information on the measured temperature.
The method may further include storing information about the output value of the light source, the temperature measured by the temperature measuring unit, the calculated value calculated by the calculating unit, and the measured value output from the photometer, in a time series.
According to the integral sphere system reliability evaluation apparatus and the integral sphere system reliability evaluation method of the present invention, it is possible to construct an automatic evaluation system that can effectively verify the measurement reliability of the integral sphere system, However, it has the effect of storing and outputting general information about the reliability evaluation of the integral spherical system so that the user can grasp it.
1 is a block diagram showing the configuration of an integral sphere system reliability evaluation apparatus according to an embodiment of the present invention.
2 is a block diagram showing a control flow of an integral sphere system reliability evaluation apparatus according to an embodiment of the present invention.
FIG. 3 is a flowchart illustrating an integral sphere system reliability evaluation process according to an embodiment of the present invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of an integrating sphere system reliability evaluating apparatus and an integrating sphere system reliability evaluating method according to the present invention will be described with reference to the accompanying drawings. For convenience of explanation, the thicknesses of the lines and the sizes of the components shown in the drawings may be exaggerated for clarity and convenience of explanation. In addition, the terms described below are defined in consideration of the functions of the present invention, which may vary depending on the intention or custom of the user, the operator. Therefore, definitions of these terms should be made based on the contents throughout this specification.
1 is a block diagram showing the configuration of an integral sphere system reliability evaluation apparatus according to an embodiment of the present invention.
Referring to FIG. 1, an apparatus 10 for evaluating reliability of an
The integrating sphere system may be provided in a form including the
The integrating
A
Thus, when the light uniformly distributed by the
The
The integrated spherical system
The
The optical
The optical
The optical
The
In this embodiment, the
The
The
The
The control of the operation of the
The
The calculating
The verifying
That is, the verifying
On the other hand, the
That is, the
The
The verifying
The verifying
In addition, the
FIG. 2 is a block diagram showing a control flow of an integral sphere system reliability evaluation apparatus according to an embodiment of the present invention, and FIG. 3 is a flowchart illustrating an integration sphere system reliability evaluation process according to an embodiment of the present invention.
Hereinafter, an integral sphere system reliability evaluation method according to the present embodiment will be described with reference to Figs. 2 and 3. Fig.
In order to evaluate the reliability of the integral sphere system using the integral sphere system
The output of the
The operation of the
When light is emitted from the
The measurement of the current value output from the
The information on the current value measured by the optical
The calculating
The temperature of the integrating sphere system, the temperature of the
The verifying
That is, the
The
The
That is, the verifying
For example, when the difference between the two values detected by the
The verifying
The verifying
The output value of the
The information thus stored can be provided to the measurement person to grasp the overall evaluation of the integral sphere system reliability evaluation.
According to the integral sphere system reliability evaluation apparatus and integral sphere system reliability evaluation method of the present embodiment as described above, it is possible to construct an automatic evaluation system that can effectively verify the measurement reliability of the integral sphere system, and to provide a reliable verification result In addition, it is possible to store and output the overall information about the reliability evaluation of the integral spherical system so that the user can grasp the result.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. I will understand. Accordingly, the true scope of protection of the present invention should be defined by the following claims.
1: Light source 11: Integral sphere
13: optical sensor 15: photometer
17: Cable 19: ADC
100: Integral sphere system reliability evaluation apparatus 110: Power supply unit
120: optical sensor measuring unit 130: temperature measuring unit
140: verification module 141:
143: Calculator 145: Verifier
147:
Claims (8)
A power supply unit for supplying power to the light source;
An optical sensor measuring unit measuring a current value output from the optical sensor; And
The operation of the power supply unit is controlled so that the output value of the light source is controlled and the reliability of the integrating sphere system is verified by using the output value of the light source and the measured value measured by the optical sensor measuring unit and the measured value output from the photometer A verification module,
Wherein the verification module comprises:
A control unit for controlling the operation of the power supply unit so that an output value of the light source is adjusted;
A calculating unit for calculating the intensity of light incident on the optical sensor using the current value measured by the optical sensor measuring unit; And
And a verifying unit for calculating a difference value between the calculated value calculated by the calculating unit and the measured value output from the photometer and verifying the reliability of the measured value output from the photometer, .
Further comprising: a temperature measuring unit for measuring a temperature around the integrating sphere system, a temperature of the light source, a temperature of the integrating sphere, and a temperature of the optical sensor;
Wherein the verifying unit corrects the calculated value calculated by the calculating unit and the measured value output from the photometer using the information about the temperature measured by the temperature measuring unit, And the reliability of the measured value output from the integrator is verified.
Further comprising a storage unit for storing information on the output value of the light source, the temperature measured by the temperature measuring unit, the calculated value calculated by the calculating unit, and the measured values output from the photometer, in time series. Reliability evaluation device.
Wherein the optical sensor measuring unit is connected to the optical sensor through the cable, and is connected in parallel with the photometer.
Adjusting an output of the light source;
Measuring a current value output from the optical sensor;
Calculating the intensity of light incident on the optical sensor using the measured current value;
Measuring a temperature around the integrating sphere system, a temperature of the light source, a temperature of the integrating sphere, and a temperature of the optical sensor;
Correcting the measured value input from the photosensor and the measured value output from the photometer using information about the measured temperature; And
And calculating a difference value between a calculated value obtained by calculating the intensity of light incident on the optical sensor and a measured value output from the photometer, and verifying the reliability of the measured value output from the photometer. A system reliability evaluation method.
An optical sensor measuring unit for measuring an output value of the light source, a temperature around the integrating sphere system, a temperature of the light source, a temperature of the integrating sphere, a temperature of the optical sensor, and a current value output from the optical sensor Further comprising the step of storing the calculated value obtained by calculating the intensity of the light incident on the optical sensor using the measured current value and the measured value output from the photometer in a time series.
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990045696A (en) * | 1997-11-28 | 1999-06-25 | 모리시타 요이찌 | Optical sensor device and signal processing circuit used therein |
KR100497813B1 (en) * | 2002-04-06 | 2005-07-01 | (주)아텔스 | A temperature compensated LED Traffic Signal Module Controller maintaining constant luminous intensity |
KR101182822B1 (en) * | 2011-03-29 | 2012-09-13 | 삼성전자주식회사 | Inspection apparatus and method of light emitting device |
KR101192263B1 (en) * | 2010-12-03 | 2012-10-17 | (주) 넥스트칩 | Illumination sensing device and error detecting/correcting method thereof |
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2015
- 2015-05-21 KR KR1020150071083A patent/KR101656702B1/en active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990045696A (en) * | 1997-11-28 | 1999-06-25 | 모리시타 요이찌 | Optical sensor device and signal processing circuit used therein |
KR100497813B1 (en) * | 2002-04-06 | 2005-07-01 | (주)아텔스 | A temperature compensated LED Traffic Signal Module Controller maintaining constant luminous intensity |
KR101192263B1 (en) * | 2010-12-03 | 2012-10-17 | (주) 넥스트칩 | Illumination sensing device and error detecting/correcting method thereof |
KR101182822B1 (en) * | 2011-03-29 | 2012-09-13 | 삼성전자주식회사 | Inspection apparatus and method of light emitting device |
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